WO2016067852A1 - 診断ジョブ生成システム、診断ジョブ生成方法及び診断ジョブ生成表示方法 - Google Patents

診断ジョブ生成システム、診断ジョブ生成方法及び診断ジョブ生成表示方法 Download PDF

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Publication number
WO2016067852A1
WO2016067852A1 PCT/JP2015/078323 JP2015078323W WO2016067852A1 WO 2016067852 A1 WO2016067852 A1 WO 2016067852A1 JP 2015078323 W JP2015078323 W JP 2015078323W WO 2016067852 A1 WO2016067852 A1 WO 2016067852A1
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WIPO (PCT)
Prior art keywords
diagnostic
unit
condition
learning
model
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Ceased
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PCT/JP2015/078323
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English (en)
French (fr)
Japanese (ja)
Inventor
崎村　茂寿
内田　貴之
響子 石田
新　吉高
藤城　孝宏
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Hitachi Ltd
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Hitachi Ltd
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Publication of WO2016067852A1 publication Critical patent/WO2016067852A1/ja
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Ceased legal-status Critical Current

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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring

Definitions

  • the diagnostic job template Mda shown in FIG. 11A is judged to have the best diagnostic performance in the cube 400 as shown in FIG. 10, and the selected diagnostic processing unit Sw3 (Sw), common condition Pc3 (Pc ), The learning unit St2 (St) and the learning condition Pt2 (Pt) are deleted.
  • the diagnosis processing unit Sw3 from which the learning unit St3 has been deleted is referred to as a diagnosis processing unit Sw3a (Swa)
  • the common condition Pc3 from which the learning condition Pt3 has been deleted is referred to as a common condition Pc3a (Pca).

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Testing And Monitoring For Control Systems (AREA)
PCT/JP2015/078323 2014-10-29 2015-10-06 診断ジョブ生成システム、診断ジョブ生成方法及び診断ジョブ生成表示方法 Ceased WO2016067852A1 (ja)

Applications Claiming Priority (2)

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JP2014-220499 2014-10-29
JP2014220499A JP6475469B2 (ja) 2014-10-29 2014-10-29 診断ジョブ生成システム、診断ジョブ生成方法及び診断ジョブ生成表示方法

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WO2016067852A1 true WO2016067852A1 (ja) 2016-05-06

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JP (1) JP6475469B2 (enExample)
WO (1) WO2016067852A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2018163375A1 (ja) * 2017-03-09 2018-09-13 株式会社日立製作所 制御装置、制御システム及びサーバー

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6735473B2 (ja) * 2016-11-22 2020-08-05 パナソニックＩｐマネジメント株式会社 診断方法、診断装置及び表示装置
JP6453504B1 (ja) * 2018-02-22 2019-01-16 エヌ・ティ・ティ・コミュニケーションズ株式会社 異常監視装置、異常監視方法および異常監視プログラム
WO2020037608A1 (zh) 2018-08-23 2020-02-27 西门子股份公司 人工智能计算设备、控制方法及装置、工程师站及工业自动化系统
JP6712630B2 (ja) * 2018-12-12 2020-06-24 エヌ・ティ・ティ・コミュニケーションズ株式会社 異常監視装置、異常監視方法および異常監視プログラム
JP2025008176A (ja) * 2023-07-04 2025-01-20 カナデビア株式会社 情報処理装置、情報処理システム、モデル決定方法、およびモデル決定プログラム

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5297272B2 (ja) * 2009-06-11 2013-09-25 株式会社日立製作所 装置異常監視方法及びシステム
JP2014026327A (ja) * 2012-07-24 2014-02-06 Azbil Corp 実稼働データによる機器の状態診断装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5297272B2 (ja) * 2009-06-11 2013-09-25 株式会社日立製作所 装置異常監視方法及びシステム
JP2014026327A (ja) * 2012-07-24 2014-02-06 Azbil Corp 実稼働データによる機器の状態診断装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2018163375A1 (ja) * 2017-03-09 2018-09-13 株式会社日立製作所 制御装置、制御システム及びサーバー

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JP2016091043A (ja) 2016-05-23
JP6475469B2 (ja) 2019-02-27

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