WO2016013833A1 - Procédé de production de produits découpés et système de découpe - Google Patents

Procédé de production de produits découpés et système de découpe Download PDF

Info

Publication number
WO2016013833A1
WO2016013833A1 PCT/KR2015/007518 KR2015007518W WO2016013833A1 WO 2016013833 A1 WO2016013833 A1 WO 2016013833A1 KR 2015007518 W KR2015007518 W KR 2015007518W WO 2016013833 A1 WO2016013833 A1 WO 2016013833A1
Authority
WO
WIPO (PCT)
Prior art keywords
fabric
defect
cutting
distribution map
defect distribution
Prior art date
Application number
PCT/KR2015/007518
Other languages
English (en)
Korean (ko)
Inventor
이규황
이호경
Original Assignee
주식회사 엘지화학
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from KR1020150102557A external-priority patent/KR101717846B1/ko
Application filed by 주식회사 엘지화학 filed Critical 주식회사 엘지화학
Priority to CN201580033872.0A priority Critical patent/CN106458495B/zh
Publication of WO2016013833A1 publication Critical patent/WO2016013833A1/fr

Links

Images

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H26/00—Warning or safety devices, e.g. automatic fault detectors, stop-motions, for web-advancing mechanisms
    • B65H26/02—Warning or safety devices, e.g. automatic fault detectors, stop-motions, for web-advancing mechanisms responsive to presence of irregularities in running webs
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H35/00—Delivering articles from cutting or line-perforating machines; Article or web delivery apparatus incorporating cutting or line-perforating devices, e.g. adhesive tape dispensers
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H37/00—Article or web delivery apparatus incorporating devices for performing specified auxiliary operations
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H43/00—Use of control, checking, or safety devices, e.g. automatic devices comprising an element for sensing a variable
    • B65H43/04—Use of control, checking, or safety devices, e.g. automatic devices comprising an element for sensing a variable detecting, or responding to, presence of faulty articles

Definitions

  • the present invention relates to a method for producing a cutting product and a cutting system.
  • the product on the film (or sheet) is made in the form of a fabric of size larger than the size of the product to be actually used.
  • optical members such as a polarizing plate, retardation plate, etc. used for a display apparatus etc. are like this.
  • the polarizer supplier is a fabric having a length and width larger than the actual product used in manufacturing the polarizer in consideration of various factors such as the efficiency of the manufacturing process and fluctuations in demand for the product. Manufacture.
  • the fabric is manufactured in a band shape through a continuous process, and the fabric is fabricated and stored in a roll. Thereafter, the fabric wound on the roll is taken out and cut into unit products of a predetermined size.
  • a method of cutting so that a plurality of unit products can be obtained at the same time in one cutting process is used a lot.
  • a cutting frame equipped with a plurality of cutters is used.
  • the yield of the cut unit product varies depending on how the cutting is performed. Low cutting efficiency increases the amount of scrap that is discarded after cutting, ie waste, which ultimately increases the manufacturing cost of the product.
  • defects are considered for the quality (quality) of the fabric when cutting.
  • a fault is formed in a manufacturing process of a raw material, a winding process, etc.
  • the polarizing plate used for display apparatuses is manufactured through the process of (1) obtaining a polarizer, (2) laminating a polarizer protective layer, and (3) laminating a protective film or a release film. do.
  • a polyvinyl alcohol (PVA) film is mainly dyed and stretched and a polarizer is obtained.
  • PVA polyvinyl alcohol
  • TAC triacetyl cellulose
  • the polarizing plate may be wound on a roll in the process of proceeding each process, at least the product having the above (3) process is wound on the roll and stored.
  • handling property etc. are advantageous in the ease of storage, cutting process, etc. as well as the transportability to each process.
  • the defect of the original fabric is mainly generated in the stretching or winding process.
  • both ends of the fabric are fixed to the stretching apparatus, where defects may occur in the fixing portion.
  • a fault may arise in the edge part fixed to a roll.
  • periodic defects may occur at the site of contact with the roll due to the characteristics of the rotating roll. If defects are found in the cut unit product, the loss of the product is high.
  • the cutting of the fabric during the inspection process for inspecting the location (distribution) of the defect, the yield calculation process for calculating the yield of the unit product when the virtual cutting based on the inspected defect information, the yield calculation process On the basis of the calculated value, it is progressing through a cutting process for cutting to have a yield higher than a predetermined value (highest yield).
  • Republic of Korea Patent Publication No. 10-2008-0033863 Republic of Korea Patent No. 10-1179071, Republic of Korea Patent No. 10-1315102, etc. discloses a technology related to the above.
  • the yield is an area yield, which is calculated by dividing the total area of the unit product obtained after cutting by the total area of the fabric before cutting, and is usually expressed as a percentage (%).
  • the fabric may continue to change left and right while repeating the unwinding and winding after the defect inspection.
  • the present invention is to solve the problem to provide a production method and a cutting system of a cutting product that can continuously match the defect information of the initial fabric to the processed fabric through a number of processes.
  • an object of the present invention is to provide a method for producing a cutting product and a cutting system that can easily distinguish the left / right and the starting point / end point of each of the initial fabric and the processed fabric.
  • generating a defect distribution map of the fabric based on the defect information of the fabric (a); And (b) generating a plurality of defect distribution maps corresponding to respective regions of the cut fabric by dividing the defect distribution map of the fabric along the cut line of the fabric.
  • a defect distribution map can be generated based on the x-y coordinate of the defect with respect to the reference point.
  • each defect distribution map may be generated based on the x-y coordinate of the defect with respect to the changed reference point.
  • the fabric may be formed with one or more markings to distinguish the left and the right.
  • the marking portion may be formed along at least one end of the left end and the right end of the fabric along the longitudinal direction of the fabric.
  • the marking portion may include at least one of a printing portion formed by printing, a notch portion formed by a thickness step, and a drilling portion formed by perforation.
  • the marking portion may be formed continuously or discontinuously along the longitudinal direction of the fabric.
  • the marking portion may be formed on the fabric before step (b).
  • the step of generating a defect distribution map of the fabric based on the defect information of the fabric and when cutting the fabric into a plurality of strips along the cutting line, the defect distribution map of the fabric along the cutting line There is provided a method for producing a cut product comprising generating a defect distribution map of each strip by dividing.
  • the production method of the cut product may further include cutting the strip into a plurality of unit products based on the defect distribution map of the strip.
  • the fabric may be formed with one or more markings to distinguish the left and the right.
  • the marking portion may be formed along at least one end of the left end and the right end of the fabric along the longitudinal direction of the fabric.
  • the marking unit may be provided on one surface of the fabric to distinguish the starting point and the end point of the fabric.
  • the defect distribution map of the far-end may be generated based on the x-y coordinate of the defect with respect to the reference point.
  • a defect distribution map of each strip may be generated based on the x-y coordinate of the defect with respect to the modified reference point.
  • a cutting system including a mode for generating a defect distribution map of the fabric based on the defect information of the fabric, splitting the defect distribution map of the fabric along the cutting line of the fabric and storing each; Is provided.
  • the cutting system may further include a mode of forming a marking portion on at least one of the left side and the right side of the far end.
  • the cutting system may further include a stretching mode, a coating mode, and a slitting cutting mode.
  • the defect distribution map of the far-end may be generated based on the x-y coordinate of the defect with respect to the reference point.
  • each of the divided defect distribution maps may be generated based on the x-y coordinate of the defect with respect to the changed reference point.
  • the defect distribution map of the fabric may be generated based on the defect information of the initial fabric. In addition, it can be used continuously by matching the defect distribution map to the processed fabric or the final fabric.
  • the defect information of the initial fabric can be consistently matched to the fabric processed over a number of processes.
  • FIG. 1 is a plan view of a fabric associated with the present invention.
  • FIG. 2 is a plan view illustrating a fabric and a strip according to the present invention.
  • 3 is a plan view for explaining the far-end and defect distribution map associated with the present invention.
  • Figure 4 is a plan view for explaining the fabric and marking portion related to the present invention.
  • 5 and 6 are flow charts for explaining a method for producing a cutting product associated with an embodiment of the present invention.
  • FIG. 7 is a configuration diagram showing a cutting system related to an embodiment of the present invention.
  • each component member may be exaggerated or reduced. Can be.
  • FIG. 1 is a plan view of the fabric 10 according to the present invention
  • Figure 2 is a plan view for explaining the fabric 10 and strips (11, 12, 13) related to the present invention
  • Figure 3 is a fabric associated with the present invention It is a top view for demonstrating 10 and the fault distribution map 30.
  • FIG. 1 is a plan view of the fabric 10 according to the present invention
  • Figure 2 is a plan view for explaining the fabric 10 and strips (11, 12, 13) related to the present invention
  • Figure 3 is a fabric associated with the present invention It is a top view for demonstrating 10 and the fault distribution map 30.
  • the method for producing a cut product according to an embodiment of the present invention includes the step (a) of generating a defect distribution map of the fabric based on defect information of the fabric.
  • the production method of the cut product includes the step (b) of generating a plurality of defect distribution map corresponding to each area of the cut fabric by dividing the defect distribution map of the fabric along the cutting line of the fabric.
  • the "fabric" to be cut is a base material on a film (or sheet), which is included here as long as it has a relatively larger size than before cutting.
  • the type or laminated structure of the fabric 10 is not particularly limited.
  • the fabric 10 may be selected from, for example, an optical member, a protective member, or the like on a film (or sheet) applied to an electric or electronic product.
  • the fabric 10 may be selected from an optical member applied to a display device such as a TV or a monitor.
  • the fabric 10 includes a monolayer and / or a laminate.
  • the far end 10 may be selected from a polarizer.
  • the polarizing plate may have a laminated structure including a polarizer and a polarizer protective layer formed on the polarizer.
  • the polarizer may be selected from, for example, dyed and stretched polyvinyl alcohol (PVA) films and the like.
  • the polarizer protective layer may be selected from, for example, a triacetyl cellulose (TAC) film and the like, and may be attached to both surfaces of the polarizer through an adhesive.
  • the polarizing plate may have a laminated structure further including a protective film and / or a release film formed on the polarizer protective layer.
  • the fabric 10 may be taken out in a state of being wound on a roll, for example, in a strip shape.
  • the width X and the length Y of the fabric 10 are not limited.
  • the fabric 10 may have, for example, a width X of 40 mm to 2,500 mm and a length Y of 1,000 cm to 3,000 m.
  • the fabric 10 to be cut includes those in which defects (d, defects) exist and / or defects (d) do not exist.
  • Defect (d) is an undesirable defect as a product, which may be formed in the manufacturing process and / or winding process of the fabric (10).
  • the drawbacks include, for example, foreign matter, contamination, torsion, scratches and / or bubbles.
  • “foundation” may be used to mean one or more selected from “slitting foundation” and “unit cutting”.
  • the "slit cutting” means to cut the fabric 10 in the length (Y) direction to be cut into strip-shaped semi-finished products
  • the “unit cutting” is the length of the fabric 10 It means cutting to the unit product by cutting in the (Y) direction and the width (X) direction.
  • the strip-shaped semi-finished product obtained through the slitting cutting is referred to as 'strip'
  • the cutting product obtained through the unit cutting is referred to as 'single item' or 'unit product'.
  • the single piece is a single piece of end product having a length and width smaller than that of the fabric 10, which may have, for example, a rectangular shape.
  • the strips 11, 12 and 13 are strip-shaped semi-finished products having a width smaller than that of the fabric 10, which can be cut into single pieces through unit cutting. have.
  • FIG. 2 illustrates a state for slitting and cutting the fabric 10 into the first strip 11, the second strip 12, and the third strip 13.
  • each strip 11-13 may be cut along the cutting line 20 on the fabric 10.
  • the width X-Z of the cutting line 20 may be determined to be smaller than the width X of the fabric.
  • the width X-Z of the cutting line 20 may be substantially equal to the sum of the widths of the respective strips 11 to 13.
  • the cutting method is not particularly limited.
  • the cutting method may be any one capable of dividing the original fabric 10 into at least one piece of article and / or strips 11, 12, 13. Cutting may be carried out, for example, through a metal knife, a jet water knife and / or a light source, and the like, for example, a laser beam or the like.
  • area yield means calculated by dividing the total area of the cut product obtained after cutting by the total area of the fabric 10 before cutting. Area yield can be expressed as a percentage, as usual.
  • the cut product is then selected from a single piece and / or strip 11, 12, 13.
  • the total area of the foundation product is calculated as the area of one foundation product x the number of foundation products produced.
  • size may mean one or more selected from the width, length, area, and diagonal length of the fabric 10 or the cut product (single and / or strip).
  • FIG. 4 is a plan view illustrating a fabric and a marking part related to the present invention
  • FIGS. 5 and 6 are flowcharts illustrating a method of manufacturing a cutting product according to an embodiment of the present invention.
  • 4A is a plan view of the original fabric in the stretching process
  • FIG. 4B is a plan view of the original fabric in the coating process
  • FIG. 4C is a plan view of the original fabric in the slitting process.
  • the fabric marked defects in the coating process is slitting in the subsequent process is transferred to the cutting process.
  • a process of inferring defect information of the strip based on the defect information of the first fabric is required. Therefore, through a software approach such as a program, it is necessary to continuously infer the defect distribution map in the final fabric state in consideration of the work characteristics of the subsequent process based on the defect distribution map of the existing fabric.
  • a method of manufacturing a cut product includes generating a defect distribution map 30 of a fabric based on defect information of the fabric (S101) and cutting the fabric along the cutting line 20 of the fabric 10. Dividing the defect distribution map 30.
  • the defect d of the distal end 10 can be inspected by an inspector or a defect inspection device constituting a cutting system.
  • the defect d may be inspected by a defect inspection unit, and the defect inspection unit may include a defect inspection apparatus for inspecting the defect d by an automatic scanning method through an image.
  • the defect inspection unit 100 may further include a display unit. The defect information of the fabric 10 inspected by the defect inspection apparatus may be displayed on the screen through the display unit.
  • the determination information includes a position (distribution), a type, a size and / or a number of defects d, and in the case of a position (distribution) of the defects d, it may be displayed on the display unit in x-y coordinates.
  • the defect distribution map may be generated based on a rectangular coordinate system.
  • a defect distribution map may be generated based on the x-y coordinate of the defect with respect to the reference point.
  • each defect distribution map may be generated based on the x-y coordinate of the defect with respect to the changed reference point.
  • the inspection method, the marking method, etc. of the fault (d) are not specifically limited, These can be performed, for example by a conventional method. In this way, a defect distribution map of the fabric 10 is generated based on the determination information of the fabric. Generation of the defect distribution map of the far end 10 may be performed through the control unit 200 (see FIG. 7) constituting the cutting system.
  • controller 200 divides the defect distribution map 30 of the fabric 10 along the cutting line 20 of the fabric 10 and stores the divided defect distribution maps.
  • the segmented defect distribution map can be used continuously over subsequent processes (or subsequent modes).
  • the method for producing a cutting product is to produce a defect distribution map 30 of the fabric based on the defect information of the fabric (10) (S201) and the fabric along the cutting line (20) 10) cutting the defect distribution map 30 of the far end 10 along the cutting line 20 to generate the defect distribution map of each strip when cutting 10) into a plurality of strips 11 to 13. do.
  • the method for producing the cut product may further include cutting the strips 11 to 13 into a plurality of unit products by reflecting a defect distribution map of the strips 11 to 13. That is, the crystal distribution map 30 of the fabric may be continuously used until the process of cutting the final unit product, and a separate defect inspection step may be omitted for each process.
  • the fabric 10 may include a marking part 15. Specifically, at least one marking portion 15 may be formed on the fabric 10 to distinguish the left side and the right side.
  • the marking unit 15 may be provided to distinguish the direction of the fabric (10).
  • the marking part 15 is preferably provided to distinguish at least the left side and the right side of the fabric 10.
  • the marking unit 15 may be provided on one surface of the fabric 10 so as to distinguish the start point and the end point of the fabric.
  • the marking part 15 may be formed along a length (Y) direction of the fabric 10 at at least one of the left end DS and the right end OS of the fabric 10.
  • each end (OS) (DS) means the edge of the fabric 10, which may mean, for example, a width within 2cm from the end of the left or right of the fabric (10).
  • the width of the marking portion 15 is not limited.
  • the marking part 15 may have a width of 0.01 mm to 2 cm, 0.02 mm to 1.5 cm, 0.1 to 1 cm, or 0.5 mm to 0.5 cm.
  • the marking part 15 may be formed continuously or discontinuously along the length (Y) direction of the fabric (10). 3 shows an embodiment in which the marking part 15 is continuously formed in a straight line along the length (Y) direction of the fabric 10.
  • the marking part 15 may be formed in a relatively large area of the left and right of the fabric.
  • the marking unit 15 is not limited as long as it can be recognized by the naked eye and / or the identification device.
  • the marking portion 15 may include, for example, at least one of a printing portion formed by printing, a notch portion formed by a thickness step, and a drilling portion formed by perforation.
  • the printing unit may be provided by printing color material.
  • the notch is not limited as long as it has a thickness step, which may be selected from an oscillation processing portion formed by pressing or a half cutting portion formed by half-cutting.
  • the perforations may be formed discontinuously.
  • the marking part 15 may be formed before the defect inspection of the fabric 10 or after the defect inspection of the fabric 10 is performed. In one embodiment, the marking unit 15 may be formed after the defect inspection of the fabric (10). In addition, the marking portion 15 may be formed on the fabric before step (b) described above.
  • the marking portion 15 improves at least cutting productivity of the fabric 10.
  • the fabric 10 may be changed left and right while repeating the unwinding and winding after the defect inspection is made.
  • the marking unit 15 may distinguish the direction of the fabric 10 even when the left and right sides are changed by repetition of unwinding and winding.
  • the marking portion 15 when the marking portion 15 is formed at the right end OS of the fabric 10, the surface on which the marking portion 15 is formed is a divided surface (front surface), The side on which the marking portion 15 is formed is the right side. The upper side is the starting point of the fabric 10 based on the divided surface. Therefore, the marking part 15 may distinguish the starting point and the end point of the fabric 10 as well as the left / right sides of the fabric 10.
  • the marking unit 15 may be an index for determining the position and direction of the defect distribution map of each strip in which the defect distribution map 30 of the fabric and the defect distribution map 30 of the fabric are divided.
  • the defect distribution map of the far end may be generated based on the x-y coordinate of the defect with respect to the reference point, and the defect distribution map of each strip may be generated based on the x-y coordinate of the defect with respect to the changed reference point.
  • the defect distribution map of the far end may be generated based on the x-y coordinate of the defect based on the E point.
  • a defect distribution map of each strip 25 and 26 may be generated based on the x-y coordinate of the defect based on the changed reference point D.
  • the marking unit 15 may be usefully used to distinguish the defect distribution direction in, for example, a subsequent process such as a cutting process.
  • a subsequent process such as a cutting process.
  • the defects d formed in the fabric 10 are irregular and have different distributions in the entire region of the fabric 10.
  • the defect distribution direction of the fabric 10 may be easily distinguished by the marking unit 15 so that the inspected defect information and the defect distribution direction of the actual fabric 10 may be matched 1: 1. Accordingly, productivity of the cutting product may be improved by the marking part 15.
  • FIG. 7 is a configuration diagram showing a cutting system related to an embodiment of the present invention.
  • the cutting system includes a mode for generating a defect distribution map of the fabric based on defect information of the fabric, and dividing and storing the defect distribution map of the fabric along the cutting line of the fabric.
  • the cutting system may further include a mode of forming a marking portion on at least one of the left side and the right side of the fabric.
  • the cutting system may further include a stretching mode, a coating mode, and a slitting cutting mode.
  • the cutting system includes a control unit 200 for performing each mode.
  • the cutting system may include a product information input unit 110, a far-end information input unit 120, and a cutting unit 300.
  • Product information is input to the product information input unit 110 and stored.
  • the information of the product includes the size of each product.
  • the product information input unit 110 stores and stores sizes for each of the five strip products.
  • the fabric information input unit 120 is input to the fabric information for the fabric (10).
  • the fabric information input unit 120 includes, as fabric information, for example, a production cost of the fabric 10, a price of the fabric 10, and / or an up date (and / or a production date, etc.) of the fabric 10. Can be stored.
  • the production cost includes at least the manufacturing cost of the fabric (10).
  • at least the fabrication cost of the fabric 10 may be input and stored in the fabric information input unit 120.
  • the cutting information input unit 120 may be input to the cutting cost expected to be generated in the cutting of the fabric (10).
  • the fabric information input unit 120 may input, for example, the fabric size of the fabric 10 as fabric information. In detail, at least one selected from the width X and the length Y of the fabric 10 may be input to the fabric information input unit 120.
  • the stock information input unit 120 may be additionally inputted the date and the production date of the fabric 10 and / or the like.
  • the controller 200 may include an area yield calculator.
  • the area yield calculation unit calculates the number of strips 11, 12, 13 and the widths of the strips 11, 12, 13 to maximize the area yield when the fabric 10 is virtually cut.
  • the area yield calculator may calculate the number of strips and the width of the strip to maximize the area yield based on the information of the product information input unit 110 and / or the far-end information input unit 120.
  • the cutting unit 300 may cut the fabric 10 in a cutting form having a maximum area yield based on the result calculated by the area yield calculating unit.
  • the cutting part 300 may have a width (number of lines) and / or a width of the strips 11, 12 and 13 calculated by the area yield calculator.
  • the fabric 10 can be cut.
  • the cutting system may include a defect information storage unit 400 and the good value calculation unit 500.
  • the defect information storage unit 400 is inputted and stored the defect information of the far-end (10).
  • the defect information may include, for example, a distribution (position) of the defect (d) and / or the kind of the defect (d) existing in the far-end 10.
  • the defect information may be inspected by a defect inspection apparatus (not shown) and input to the defect information storage unit 400.
  • the defect information may be displayed on the x-y coordinates through a monitor (not shown).
  • the yield calculation unit 500 calculates an area yield according to the yield ratio, that is, the distribution of the defects d, based on the distribution of defects d stored in the defect information storage unit 400.
  • the yield calculation unit 500 calculates a yield ratio in consideration of such a cut shape and a defect (d) distribution when a cutting shape having a maximum area yield is calculated in the area yield calculation unit.
  • the cutting unit 300 may cut the fabric 10 in an array of strips having the highest yield ratio.
  • control unit 200 is provided to generate a defect distribution map of the far-end based on the x-y coordinate of the defect with respect to the reference point.
  • controller 200 may be configured to generate respective defect distribution maps divided based on the x-y coordinates of the defect with respect to the changed reference point.
  • the cutting system may include a defect inspection unit.
  • the cutting system may include a cutting portion for cutting the fabric 10 along the cutting line (20).
  • the cutting system generates a defect distribution map of the fabric based on the defect information of the fabric, and when the fabric is cut into a plurality of strips along the cutting line, the defect distribution of the fabric along the cutting line By dividing the map, a mode for generating a defect distribution map of each strip is included.
  • the cutting system may cut the fabric 10 by dividing the direction of the fabric 10 based on the marking part 15. That is, the left and right sides of the fabric 10 may be divided and cut through the marking unit 15.
  • the cutting system may also cut the fabric 10 or each strip based on the crystal distribution map 30 of the fabric and the defect distribution map of each strip. That is, it can be cut so as to have the maximum area yield based on the defect information of the fabric 10. More specifically, the cutting system may calculate the maximum area yield based on defect information inspected through the defect inspection. In addition, the cutting system may match the defect information inspected with the defect distribution map of the actual fabric 10 and the direction of the defect distribution map of each strip through the marking unit 15. Thereafter, the cutting system may cut the fabric to have the maximum area yield according to the calculated result.
  • the aforementioned cutting part may be provided to perform the cutting as described above.
  • the cutting part cuts out the original fabric 10 from a roll, for example, so that it may have maximum area yield.
  • the cutting portion includes at least a cutting device.
  • the cutting device may include, for example, support means for supporting the fabric 10 and cutting means for cutting the fabric 10.
  • the support means may comprise one or more selected from, for example, a transfer conveyor, a transfer roll, a support plate, and the like.
  • the cutting means may have a structure including one or more selected from, for example, a metal knife, a jet water knife and a light source (laser beam irradiator, etc.).
  • the cutting part 300 includes a first cutting part which slits the fabric 10 in the longitudinal direction to obtain a plurality of strips 11, 12, 13.
  • the cutting part 300 may include a second cutting part which cuts the obtained strips 11, 12, 13 in the width direction to obtain a single product.
  • the defect distribution map of the fabric may be generated based on the defect information of the original fabric, and the defect information of the initial fabric may be continuously used by matching the defect distribution map to the processed fabric or the final fabric.

Landscapes

  • Treatment Of Fiber Materials (AREA)

Abstract

La présente invention concerne un procédé de production de produits découpés et un système de découpe, et concerne, selon un aspect de la présente invention, un procédé de production de produits découpés comportant les étapes consistant à: produire une carte de répartition de défauts d'un matériau d'après des informations de défauts sur le matériau; et diviser la carte de répartition de défauts d'un matériau suivant une ligne de découpe du matériau de façon à générer une pluralité de cartes de répartition de défauts correspondant à des régions respectives du matériau découpé.
PCT/KR2015/007518 2014-07-22 2015-07-21 Procédé de production de produits découpés et système de découpe WO2016013833A1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201580033872.0A CN106458495B (zh) 2014-07-22 2015-07-21 裁剪产品的生产方法及裁剪系统

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
KR20140092629 2014-07-22
KR10-2014-0092629 2014-07-22
KR10-2014-0139778 2014-10-16
KR20140139778 2014-10-16
KR1020150102557A KR101717846B1 (ko) 2014-07-22 2015-07-20 재단 제품의 생산방법 및 재단 시스템
KR10-2015-0102557 2015-07-20

Publications (1)

Publication Number Publication Date
WO2016013833A1 true WO2016013833A1 (fr) 2016-01-28

Family

ID=55163312

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2015/007518 WO2016013833A1 (fr) 2014-07-22 2015-07-21 Procédé de production de produits découpés et système de découpe

Country Status (1)

Country Link
WO (1) WO2016013833A1 (fr)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20080033863A (ko) * 2006-10-11 2008-04-17 닛토덴코 가부시키가이샤 광학 필름을 갖는 시트상 제품의 결점 검사 장치, 그 검사데이터 처리 장치, 그 절단 장치 및 그 제조 시스템
KR100863163B1 (ko) * 2001-04-03 2008-10-13 다이니폰 인사츠 가부시키가이샤 시트형상 제품의 결함 마킹방법 및 장치
KR100991258B1 (ko) * 2008-04-15 2010-11-03 닛토덴코 가부시키가이샤 광학필름의 적층체 롤 및 그 제조방법 및 장치
KR101179071B1 (ko) * 2009-03-10 2012-09-03 주식회사 엘지화학 사각형 단위체의 제조방법
KR101315102B1 (ko) * 2011-07-25 2013-10-07 동우 화인켐 주식회사 필름의 수율 예측 시스템 및 방법

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100863163B1 (ko) * 2001-04-03 2008-10-13 다이니폰 인사츠 가부시키가이샤 시트형상 제품의 결함 마킹방법 및 장치
KR20080033863A (ko) * 2006-10-11 2008-04-17 닛토덴코 가부시키가이샤 광학 필름을 갖는 시트상 제품의 결점 검사 장치, 그 검사데이터 처리 장치, 그 절단 장치 및 그 제조 시스템
KR100991258B1 (ko) * 2008-04-15 2010-11-03 닛토덴코 가부시키가이샤 광학필름의 적층체 롤 및 그 제조방법 및 장치
KR101179071B1 (ko) * 2009-03-10 2012-09-03 주식회사 엘지화학 사각형 단위체의 제조방법
KR101315102B1 (ko) * 2011-07-25 2013-10-07 동우 화인켐 주식회사 필름의 수율 예측 시스템 및 방법

Similar Documents

Publication Publication Date Title
JP4377965B1 (ja) 連続ウェブ形態の切込線入り光学フィルム積層体の連続ロール並びにその製造方法及び製造装置
KR101011455B1 (ko) 액정 표시 소자의 연속 제조 방법 및 장치
JP4307510B1 (ja) 光学表示装置の製造システム及び製造方法
TWI494562B (zh) A method for manufacturing the optical display unit, a method of manufacturing the optical display unit, a polarizing plate, and a polarizing plate material, and a method of manufacturing the same,
CN102043277B (zh) 信息存储读出运算系统及其制造方法
CN102043280B (zh) 信息存储读出系统及制造该系统的方法和装置
WO2010104330A2 (fr) Procédé pour produire des unités carrées
JP2011085632A (ja) 連続ウェブ形態の切込線入り光学フィルム積層体の連続ロール並びにその製造方法及び製造装置
KR20050016094A (ko) 연속적으로 생산되는 유리 시트로부터 유리 패인을절단하는 방법 및 장치
CN108535259B (zh) 缺陷标注方法及装置、卷料和片的制造方法及卷料和片
WO2018105489A1 (fr) Procédé d'inspection de la qualité d'un film de verre de type ruban et rouleau de verre
TW201211621A (en) Method and system for producing liquid crystal panel
JP2009294645A (ja) 光学表示装置製造システムに適用される製造管理システム及び製造管理方法
WO2016013833A1 (fr) Procédé de production de produits découpés et système de découpe
WO2019177379A1 (fr) Procédé de fabrication d'unité d'affichage
WO2016072759A1 (fr) Procédé et système de production d'un produit coupé
JP2011065174A (ja) 液晶表示素子の製造方法
JP4707055B2 (ja) 枚葉フィルム断裁配置評価装置及び枚葉フィルム断裁配置決定方法
JP6069842B2 (ja) 光学フィルムチップの切り出し装置、光学フィルムチップの製造システム及び光学フィルムチップの切り出し方法
WO2016064135A1 (fr) Procédé et système de production de produit de coupe
KR101380204B1 (ko) 편광판의 결함 제거방법 및 그 방법이 구현된 시스템
WO2017039205A1 (fr) Procédé de fabrication d'un produit découpé et système de planification de fabrication d'un produit découpé
KR20160046301A (ko) 재단 제품의 생산방법 및 생산 시스템
KR101746294B1 (ko) 재단 제품의 생산방법 및 생산 시스템
KR101717846B1 (ko) 재단 제품의 생산방법 및 재단 시스템

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 15825083

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 15825083

Country of ref document: EP

Kind code of ref document: A1