WO2015180201A1 - 检测系统的修复方法 - Google Patents

检测系统的修复方法 Download PDF

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Publication number
WO2015180201A1
WO2015180201A1 PCT/CN2014/079431 CN2014079431W WO2015180201A1 WO 2015180201 A1 WO2015180201 A1 WO 2015180201A1 CN 2014079431 W CN2014079431 W CN 2014079431W WO 2015180201 A1 WO2015180201 A1 WO 2015180201A1
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Prior art keywords
area
line
region
signal line
repair
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English (en)
French (fr)
Inventor
高冬子
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TCL China Star Optoelectronics Technology Co Ltd
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Shenzhen China Star Optoelectronics Technology Co Ltd
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    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells

Definitions

  • the present invention relates to the field of display panel technologies, and in particular, to a method for repairing a detection system.
  • Liquid crystal display device has many advantages such as thin body, power saving, no radiation, etc., and has been widely used.
  • Most of the liquid crystal display devices on the market are backlight type liquid crystal displays, which include a liquid crystal display panel and a backlight module (backlight) Module).
  • the working principle of the liquid crystal display panel is to place liquid crystal molecules in two parallel glass substrates, control the liquid crystal molecules to change direction by energizing the circuit of the glass substrate, and refract the light of the backlight module to produce a picture.
  • the liquid crystal display panel Before assembling the liquid crystal display panel into a liquid crystal display device, the liquid crystal display panel needs to use a shorting bar (Shorting) Bar) Technology performs yield detection to detect defects in the LCD panel such as MURA or DOT/LINE.
  • the Data side will pass the red, green and blue (R/G/B) signal line through indium tin oxide (ITO, Indium). Tin oxide) is connected to the corresponding test line, as shown in Figure 1a; Gate The side will connect the odd line and the even line (Even/Odd) scan line to the corresponding test line through ITO, as shown in Figure 1b. After that, the test line is externally connected and connected to the corresponding probe for good performance. Rate detection.
  • a repairing method for a detection system comprising a red, green and blue signal line, three test lines and a probe, the signal line being electrically connected to a corresponding test line, the test line being connected to a corresponding probe a pin for detecting a corresponding signal line, wherein the signal line includes an electrostatic damage position, the signal line includes a first region, a second region and a third region, which are sequentially connected, and the electrostatic damage position Located in the second area;
  • the electrostatic damage location is located in a crossover region of the signal line and the test line electrically connected to the signal line, the second region including the crossover region; wherein the signal line is non-electrical A projection of the connected test line on the signal line plane intersects the signal line, the signal line plane including the signal line;
  • the repair method of the detection system includes:
  • the first area and the third area are connected by a repair line.
  • the step of blocking the first area and the second area, the second area, and the third area includes:
  • the first region and the second region, the second region, and the third region are partitioned by a laser.
  • the step of connecting the first area and the third area by using a repair line includes:
  • a repair line is separately fabricated on both sides of the third region of the signal line, and the first region and the third region are connected by the repair line in the direction of the trace of the original signal line.
  • a repairing method for a detection system comprising a red, green and blue signal line, three test lines and a probe, the signal line being electrically connected to a corresponding test line, the test line being connected to a corresponding probe a pin for detecting a corresponding signal line, wherein the signal line includes an electrostatic damage position, the signal line includes a first region, a second region and a third region, which are sequentially connected, and the electrostatic damage position Located in the second area; the repairing method of the detection system includes:
  • the first area and the third area are connected by a repair line.
  • the electrostatic damage location is located in a cross-line area of a signal line and a test line non-electrically connected to the signal line, and the second area includes the over-line area.
  • the step of blocking the first area and the second area, the second area, and the third area includes:
  • the first region and the second region, the second region, and the third region are partitioned by a laser.
  • the step of connecting the first area and the third area by using a repair line includes:
  • a repair line is separately fabricated on both sides of the third region of the signal line, and the first region and the third region are connected by the repair line in the direction of the trace of the original signal line.
  • a repair method for a detection system comprising a scan line, two test lines and a probe, the scan line comprising an odd line scan line and an even line scan line, the scan line being connected to a corresponding test line Together, the test line is connected to a corresponding probe for detecting a corresponding scan line, wherein the scan line includes an electrostatic damage location, the scan line includes a first region, a second region, which are sequentially connected And a third area, the electrostatic damage location is located in the second area; wherein the repairing method of the detection system comprises:
  • the first area and the third area are connected by a repair line.
  • the electrostatic damage location is located in a cross-line area of a scan line and a test line non-electrically connected to the scan line, and the second area includes the cross-line area.
  • the step of blocking the first area and the second area, the second area, and the third area includes:
  • the first region and the second region, the second region, and the third region are partitioned by a laser.
  • the step of connecting the first area and the third area by using a repair line includes:
  • a repair line is separately fabricated on both sides of the third area of the scan line, and the first area and the third area are connected by the repair line in the direction of the trace of the original scan line.
  • the repairing method of the detecting system Compared with the prior art, the repairing method of the detecting system provided by the present invention cuts off the position of the electrostatic damage on the signal line or the scanning line in the detecting system, and then uses the repair line to correspond to the signal line or the scanning line that is blocked.
  • the test leads are connected to repair the defects caused by the detection system on the display panel and reduce the production cost.
  • FIG. 1a and 1b are schematic structural diagrams of a detection system in the prior art
  • Figure 1c is a cross-sectional view of the detection system A-A of Figure 1a;
  • FIG. 2 is a schematic flow chart of a method for repairing a detection system according to the present invention
  • FIG. 3 is a schematic diagram of repairing a detection system provided by the present invention.
  • FIG. 4 is a schematic flow chart of another method for repairing a detection system according to the present invention.
  • FIG. 5 is a schematic diagram of repair of another detection system provided by the present invention.
  • FIG. 1a is a schematic structural diagram of a detection system that needs to be repaired.
  • the detection system includes a red, green and blue signal line, three test lines and a probe, and the signal line is electrically connected to a corresponding test line. Together, the test line is connected to a corresponding probe for detecting a corresponding signal line, wherein the signal line includes an electrostatic damage location, the signal line includes a first region sequentially connected, and a second The area and the third area, the electrostatic damage location is located in the second area.
  • 11 is the R signal line
  • 12 is the G signal line
  • 13 is the B signal line
  • 14 is the test line
  • 15 is the electrostatic impact (ie ESD) position
  • the contact hole passes the ITO signal line and test. Lines correspond to connections where the position of the probe is not shown in the figure.
  • the liquid crystal display panel needs to adopt Shorting before assembling the liquid crystal display panel into the liquid crystal display device.
  • Bar technology performs yield detection.
  • the detection system adopts Shorting Bar technology detects whether the LCD panel has defects such as dead pixels or bright spots.
  • the red, green and blue (R/G/B) signal lines are passed through indium tin oxide (ITO, Indium tin). The oxide is connected to the corresponding test line. After the connection, the test line is externally led and connected to the corresponding probe for yield detection.
  • ITO indium tin oxide
  • the present invention provides a repairing method based on the detecting system shown in FIG. 1a.
  • FIG. 2 is a schematic flowchart of a repairing method of the detecting system according to the present invention.
  • the repairing method includes:
  • Step S201 providing a break point on the signal line, and blocking the first area and the second area, the second area, and the third area.
  • Step S202 connecting the first area and the third area by using a repair line.
  • FIG. 3 is a schematic diagram of the repair of the detection system shown in FIG. 1a.
  • the first area and the second area, the second area and The third region is partitioned to block a position at which an electrostatic discharge occurs on the signal line.
  • the electrostatic damage location is located in a cross-line area of the signal line and the test line electrically connected to the signal line, and the second area includes the cross-line area.
  • FIG. 1a For the cross-sectional view in the AA direction, please refer to Figure 1a together.
  • the G signal line 12 and the test line 14 electrically connected to the G signal line 12 have a region Q overlapping, and the overlap region Q is a G signal line 12 and a test line electrically connected to the G signal line 12 14 cross-line area.
  • the electrostatic damage location 15 is located in the crossover region Q of the G signal line 12 and the test line 14, wherein the G signal line 12 is non-electrically connected to the test line 14, using a laser
  • the G signal line 12 is cut off on the G signal line 12 and on both sides of the crossover area Q, that is, the break point is disposed on the G signal line 12 and on both sides of the crossover area Q, and FIG.
  • the thick horizontal line indicates the position where the break point is set on the G signal line 12, so that the first area, the second area, and the third area of the G signal line 12 can be determined.
  • the blocking point in the embodiment of the present invention may be disposed at a position farther from the spanning area, and thus the position of the area divided by the signal line will also change, and FIG. 3 is only an example, and does not constitute The invention is defined.
  • the break point can be set on the B signal line 13 and at the electrostatic breakdown position 15 Side, the first region and the second region, the second region, and the third region are partitioned.
  • connecting the first area and the third area by using the repair line may be specifically: manufacturing repair lines on both sides of the third area of the signal line, and using the repair line to press the original signal
  • the trace direction of the line connects the first area and the third area.
  • 16 is a repair line, that is, the signal line that is blocked is electrically connected to the original test line by using the repair line 16
  • the original test line is a test line connected to the signal line before repair.
  • laser chemical vapor deposition (laser) is used in the embodiment of the present invention.
  • CVD method to manufacture repair lines, that is, using the energy of the laser to deposit metal ions on the surface of the object to be repaired (ie, the cut signal line), and reconnecting according to the designed traces along the original line, because Shorting The position of the Bar that causes the ESD can be repaired via the repair line 16.
  • the number of repair lines 16 in the embodiment of the present invention can be set to two. In some more precise or conditionally allowed, the number of repair lines 16 can be set to one or three or other, not used here.
  • ESD is generated on the B signal line 13 or the R signal line 11, and the repair may be performed by referring to the above repair method.
  • the repair method of the detection system shown in FIG. 3 does not constitute a limitation of the present invention.
  • the repairing method of the detecting system provided by the present invention cuts off the signal line at the position of the electrostatic damage in the detecting system, and then connects the blocked signal line with the original test line by using the repairing line 16 to Repair the defects caused by the detection system on the display panel and reduce the production cost.
  • FIG. 1b is a schematic structural diagram of a detecting system that needs to be repaired, wherein the detecting system includes a scan line, two test lines and a probe.
  • the scan line includes an odd line scan line and an even line scan line, the scan line is connected to a corresponding test line, and the test line is connected to a corresponding probe to detect the corresponding scan line, wherein
  • the scan line includes an electrostatic damage location, and the scan line includes a first region, a second region, and a third region that are sequentially connected, and the electrostatic damage location is located in the second region.
  • the detecting system includes a scan line, two test lines and a probe.
  • the scan line includes an odd line scan line and an even line scan line, the scan line is connected to a corresponding test line, and the test line is connected to a corresponding probe to detect the corresponding scan line, wherein
  • the scan line includes an electrostatic damage location, and the scan line includes a first region, a second region, and a third region that are sequential
  • 21 is an odd-line scan line
  • 22 is an even-line scan line
  • 23 is a test line
  • 24 is an electrostatic shock (ie, an ESD occurs) position
  • the contact hole is connected to the test line through the ITO. The position of the probe therein is not shown in the figure.
  • the detecting system adopts Shorting Bar technology detects whether the LCD panel has defects such as dead pixels or bright spots. Among them in Gate On the side, the odd line and the even line (Even/Odd) scan line are connected to the corresponding test line through the ITO. After the connection, the test line is externally led and connected to the corresponding probe for yield detection.
  • Shorting Bar technology detects whether the LCD panel has defects such as dead pixels or bright spots.
  • the odd line and the even line (Even/Odd) scan line are connected to the corresponding test line through the ITO. After the connection, the test line is externally led and connected to the corresponding probe for yield detection.
  • FIG. 4 is a schematic flowchart of a repairing method of the detecting system according to the present invention.
  • the repairing method includes:
  • Step S401 providing a break point on the scan line, and blocking the first area and the second area, the second area, and the third area.
  • Step S402 connecting the first area and the third area by using a repair line.
  • FIG. 5 is a schematic diagram of the repair of the detection system shown in FIG. 1b.
  • the first region and the second region, the second region, and The third region is partitioned to block a position at which an electrostatic discharge occurs on the scan line.
  • the electrostatic damage location is located in a cross-line area of a scan line and a test line non-electrically connected to the scan line, and the second area includes the cross-line area.
  • the electrostatic damage location 24 is located in the crossover region of the odd-line scan line 21 and the test line 23, wherein the odd-line scan line 21 is non-electrically connected to the test line 23, using a laser
  • the odd-line scan lines 21 are cut on the odd-line scan lines 21 and on both sides of the jumper region, that is, the break points are disposed on the odd-line scan lines 21 and on both sides of the jumper region, FIG.
  • the position where the break point is set on the odd-line scan line 21 is indicated by a thick vertical line, so that the first area, the second area, and the third area of the odd-line scan line 21 can be determined.
  • FIG. 5 is only an example, and does not constitute The invention is defined.
  • the break point can be placed on the even line scan line 22 and at the electrostatic impact location 24 On both sides, the first region and the second region, the second region, and the third region are partitioned.
  • connecting the first area and the third area by using the repair line may be specifically: manufacturing repair lines on both sides of the third area of the scan line, and using the repair line to perform the original scan
  • the trace direction of the line connects the first area and the third area.
  • 25 is a repair line, that is, the scan line 25 is electrically connected to the original test line by using the repair line 25, and the original test line is a test line connected to the scan line before repair. .
  • the repair line is manufactured by using laser chemical vapor deposition, that is, the energy of the laser is used to deposit metal ions on the surface of the object to be repaired (ie, the cut scan line), and then re-pressed along the original line.
  • the design traces are connected, as this is because of Shorting The position of the Bar that causes the ESD can be repaired via the repair line 25.
  • the number of the repair lines 25 in the embodiment of the present invention can be set to two. In some cases where the accuracy or the conditions permit, the number of the repair lines 25 can be set to one or three or the other.
  • the ESD is generated on the even-line scan line 22 in the detection system, and the repair may be performed by referring to the above-mentioned repair method.
  • the repair method of the detection system shown in FIG. 5 does not constitute a limitation of the present invention.
  • the repair method of the detection system provided by the present invention cuts off the scan line where the electrostatic damage position in the detection system is located, and then connects the blocked scan line with the original test line by using the repair line 25, Repair the defects caused by the detection system on the display panel and reduce the production cost.

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  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
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  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)

Abstract

一种检测系统的修复方法，其中，该检测系统的修复方法包括：在信号线(11,12,13)或扫描线(21,22)上设置隔断点，对第一区域和第二区域、第二区域和第三区域进行隔断；以及利用修复线(16,25)连接第一区域和第三区域，将被隔断的信号线(11,12,13)或扫描线(21,22)对应和原测试线(14,23)进行连接，以修复检测系统对显示面板造成的缺陷，降低生产成本。

Description

检测系统的修复方法 技术领域
本发明涉及显示面板技术领域，特别涉及一种检测系统的修复方法。
 背景技术
液晶显示装置（LCD，Liquid Crystal Display）具有机身薄、省电、无辐射等众多优点，得到了广泛的应用。现有市场上的液晶显示装置大部分为背光型液晶显示器，其包括液晶显示面板及背光模组（backlight module）。液晶显示面板的工作原理是在两片平行的玻璃基板中放置液晶分子，通过给玻璃基板的电路通电来控制液晶分子改变方向，将背光模组的光线折射出来产生画面。
现有技术中，在将所述液晶显示面板组装成液晶显示装置前，液晶显示面板需要采用短路棒（Shorting Bar）技术进行良率检测，以检测液晶显示面板是否有坏点（MURA）或亮点（DOT/LINE）等缺陷。其中，Data侧会将红绿蓝（R/G/B）信号线通过氧化铟锡（ITO，Indium tin oxide）与对应的测试线连接在一起，可如图1a所示；Gate 侧会将奇数线和偶数线（Even/Odd）扫描线通过ITO分别与对应的测试线连接在一起，可如图1b所示，之后，将测试线外引并连接至对应的探针进行良率检测。
可是在实践中，发明人发现现有的设计在跨线的位置Q容易产生静电释放（ESD，Electro-Static discharge），从而对显示面板造成缺陷，无法投入使用而丢弃，增加生产成本。
 技术问题
本发明的目的在于提供一种检测系统的修复方法，修复检测系统对显示面板造成的缺陷，降低生产成本。
 技术解决方案
一种检测系统的修复方法，所述检测系统包括红绿蓝信号线、三条测试线及探针，所述信号线与相应的测试线电性连接在一起，所述测试线连接至相应的探针，以对相应的信号线进行检测，其中所述信号线上包括有静电击伤位置，所述信号线包括依次连接的第一区域，第二区域和第三区域，所述静电击伤位置位于所述第二区域内；
所述静电击伤位置位于信号线和与该信号线非电性连接的测试线的跨线区域内，所述第二区域包括所述跨线区域；其中，所述与该信号线非电性连接的测试线在信号线平面上的投影与所述信号线相交，所述信号线平面包括所述信号线；
所述检测系统的修复方法包括：
在所述信号线上设置隔断点，对所述第一区域和所述第二区域、所述第二区域和所述第三区域进行隔断；以及
利用修复线连接所述第一区域和所述第三区域。
在上述检测系统的修复方法中，所述对所述第一区域和所述第二区域、所述第二区域和所述第三区域进行隔断的步骤，包括：
利用激光对所述第一区域和所述第二区域、所述第二区域和所述第三区域进行隔断。
在上述检测系统的修复方法中，所述利用修复线连接所述第一区域和所述第三区域的步骤，包括：
在信号线的第三区域两侧分别制造修复线，并利用所述修复线按原信号线的走线方向连接所述第一区域和所述第三区域。
为解决上述问题，本发明实施例的技术方案如下：
一种检测系统的修复方法，所述检测系统包括红绿蓝信号线、三条测试线及探针，所述信号线与相应的测试线电性连接在一起，所述测试线连接至相应的探针，以对相应的信号线进行检测，其中所述信号线上包括有静电击伤位置，所述信号线包括依次连接的第一区域，第二区域和第三区域，所述静电击伤位置位于所述第二区域内；所述检测系统的修复方法包括：
在所述信号线上设置隔断点，对所述第一区域和所述第二区域、所述第二区域和所述第三区域进行隔断；以及
利用修复线连接所述第一区域和所述第三区域。
在上述检测系统的修复方法中，所述静电击伤位置位于信号线和与该信号线非电性连接的测试线的跨线区域内，所述第二区域包括所述跨线区域。
在上述检测系统的修复方法中，所述对所述第一区域和所述第二区域、所述第二区域和所述第三区域进行隔断的步骤，包括：
利用激光对所述第一区域和所述第二区域、所述第二区域和所述第三区域进行隔断。
在上述检测系统的修复方法中，所述利用修复线连接所述第一区域和所述第三区域的步骤，包括：
在信号线的第三区域两侧分别制造修复线，并利用所述修复线按原信号线的走线方向连接所述第一区域和所述第三区域。
为解决上述问题，本发明实施例的技术方案如下：
一种检测系统的修复方法，所述检测系统包括扫描线，两条测试线及探针，所述扫描线包括奇数线扫描线和偶数线扫描线，所述扫描线与相应的测试线连接在一起，所述测试线连接至相应的探针，以对相应的扫描线进行检测，其中所述扫描线上包括有静电击伤位置，所述扫描线包括依次连接的第一区域，第二区域和第三区域，所述静电击伤位置位于所述第二区域内；其中所述检测系统的修复方法包括：
在所述扫描线上设置隔断点，对所述第一区域和所述第二区域、所述第二区域和所述第三区域进行隔断；以及
利用修复线连接所述第一区域和所述第三区域。
在上述检测系统的修复方法中，所述静电击伤位置位于扫描线和与该扫描线非电性连接的测试线的跨线区域内，所述第二区域包括所述跨线区域。
在上述检测系统的修复方法中，所述对所述第一区域和所述第二区域、所述第二区域和所述第三区域进行隔断的步骤，包括：
利用激光对所述第一区域和所述第二区域、所述第二区域和所述第三区域进行隔断。
在上述检测系统的修复方法中，所述利用修复线连接所述第一区域和所述第三区域的步骤，包括：
在扫描线的第三区域两侧分别制造修复线，并利用所述修复线按原扫描线的走线方向连接所述第一区域和所述第三区域。
 有益效果
相对现有技术，本发明提供的检测系统的修复方法，将检测系统中信号线或扫描线上的静电击伤位置进行隔断，其后利用修复线将被隔断的信号线或扫描线对应和原测试线进行连接，以修复检测系统对显示面板造成的缺陷，降低生产成本。
 附图说明
图1a和图1b均为现有技术中检测系统的结构示意图；
图1c为图1a所示检测系统A-A方向上的截面图；
图2为本发明提供的一种检测系统的修复方法的流程示意图；
图3为本发明提供的一种检测系统的修复示意图；
图4为本发明提供的另一种检测系统的修复方法的流程示意图；
图5为本发明提供的另一种检测系统的修复示意图。
 本发明的最佳实施方式
请参照图式，其中相同的组件符号代表相同的组件，本发明的原理是以实施在一适当的运算环境中来举例说明。以下的说明是基于所例示的本发明具体实施例，其不应被视为限制本发明未在此详述的其它具体实施例。
请参考图1a，图1a为需要进行修复的检测系统的结构示意图，其中，所述检测系统包括红绿蓝信号线、三条测试线及探针，所述信号线与相应的测试线电性连接在一起，所述测试线连接至相应的探针，以对相应的信号线进行检测，其中所述信号线上包括有静电击伤位置，所述信号线包括依次连接的第一区域，第二区域和第三区域，所述静电击伤位置位于所述第二区域内。如图1a所示，11为R信号线、12为G信号线、13为B信号线、14为测试线、15为静电击伤（即发生ESD）位置，接触孔通过ITO将信号线和测试线对应连接，其中探针的位置未在图中示出。
可以理解的是，在将液晶显示面板组装成液晶显示装置前，液晶显示面板需要采用Shorting Bar技术进行良率检测，本发明实施例中，所述检测系统为采用Shorting Bar技术检测液晶显示面板是否有坏点或亮点等缺陷的系统。其中在Data侧，将红绿蓝（R/G/B）信号线通过氧化铟锡（ITO，Indium tin oxide）与对应的测试线连接在一起，连接后，将测试线外引并连接对应的探针进行良率检测。
基于如图1a所示的检测系统，本发明实施例提出一种修复方法，请参考图2，图2为本发明提供的一种检测系统的修复方法的流程示意图，所述修复方法包括：
步骤S201、在所述信号线上设置隔断点，对所述第一区域和所述第二区域、所述第二区域和所述第三区域进行隔断。
步骤S202、利用修复线连接所述第一区域和所述第三区域。
请一并参考图3，图3为图1a所示的检测系统的修复示意图，在某些实施方式中，可以利用激光对所述第一区域和所述第二区域、所述第二区域和所述第三区域进行隔断，以隔断信号线上发生静电释放的位置。
优选的，本发明实施例中，所述静电击伤位置位于信号线和与该信号线非电性连接的测试线的跨线区域内，所述第二区域包括所述跨线区域。其中，与该信号线非电性连接的测试线在信号线平面上的投影与所述信号线相交，所述信号线平面包括所述信号线，可参考图1c，图1c为图1a所示A-A方向上的截面图，请一并参考图1a， G信号线12和与该G信号线12非电性连接的测试线14有重叠的区域Q，该重叠的区域Q即为G信号线12和与该G信号线12非电性连接的测试线14的跨线区域。
如图3所示，例如，静电击伤位置15位于G信号线12与测试线14的跨线区域Q内，其中，所述G信号线12与该测试线14非电性连接，利用激光在该G信号线12上且在所述跨线区域Q的两侧将G信号线12切断，即隔断点设置在G信号线12上且在所述跨线区域Q的两侧，图3用加粗横线表示G信号线12上隔断点设置的位置，从而可以确定出所述G信号线12的第一区域、第二区域和第三区域。
容易想到的是，本发明实施例中所述隔断点可以设置在离所述跨线区域更远的位置，由此信号线划分的区域位置也会随之改变，图3仅为举例，不构成对本发明的限定。
在某些实施方式中，若检测系统中在B信号线13上发生ESD，该情形下不存在跨线区域，则可以将隔断点设置在B信号线13上且在静电击伤位置15的两侧，将所述第一区域和所述第二区域、所述第二区域和所述第三区域进行隔断。
进一步的，利用修复线连接所述第一区域和所述第三区域（即步骤S202）可以具体为：在信号线的第三区域两侧分别制造修复线，并利用所述修复线按原信号线的走线方向连接所述第一区域和所述第三区域。如图3所示，16为修复线，即利用所述修复线16将被隔断的信号线与原测试线进行电性连接，所述原测试线为修复前与该信号线相连接的测试线。
也就是说，本发明实施例中使用激光化学气相沉积（laser CVD）法制造修复线，也就是利用激光的能量将金属离子沉积到待修复物件（即切断的信号线）的表面，在原来的线路旁边重新按照设计的走线连接起来，这样因为Shorting Bar导致ESD的位置就可以经过修复线16进行修复。
容易想到的是，本发明实施例中修复线16的数量可以设置为两条，在某些更为精确或条件允许的场合，修复线16的数量可以设置为一条或三条或其他，此处不作具体限定；另外，检测系统中在B信号线13上或者R信号线11上发生ESD，也可以参照上述修复方法进行修复，图3所示对检测系统的修复方式不构成对本发明的限定。
有上述可知，本发明提供的检测系统的修复方法，将检测系统中静电击伤位置所处的信号线进行隔断，其后利用修复线16将被隔断的信号线和原测试线进行连接，以修复检测系统对显示面板造成的缺陷，降低生产成本。
本发明实施例还提供另一检测系统的修复方法，请参考图1b，图1b为需要进行修复的检测系统的结构示意图，其中，所述检测系统包括扫描线，两条测试线及探针，所述扫描线包括奇数线扫描线和偶数线扫描线，所述扫描线与相应的测试线连接在一起，所述测试线连接至相应的探针，以对相应的扫描线进行检测，其中所述扫描线上包括有静电击伤位置，所述扫描线包括依次连接的第一区域，第二区域和第三区域，所述静电击伤位置位于所述第二区域内。如图1b所示，21为奇数线扫描线、22为偶数线扫描线、23为测试线、24为静电击伤（即发生ESD）位置，接触孔通过ITO将扫描线和测试线对应连接，其中探针的位置未在图中示出。
可以理解的是，本发明实施例中，所述检测系统为采用Shorting Bar技术检测液晶显示面板是否有坏点或亮点等缺陷的系统。其中在Gate 侧，将奇数线和偶数线（Even/Odd）扫描线通过ITO与对应的测试线连接在一起，连接后，将测试线外引并连接对应的探针进行良率检测。
基于如图1b所示的检测系统，本发明实施例提出一种修复方法，请参考图4，图4为本发明提供的一种检测系统的修复方法的流程示意图，所述修复方法包括：
步骤S401、在所述扫描线上设置隔断点，对所述第一区域和所述第二区域、所述第二区域和所述第三区域进行隔断。
步骤S402、利用修复线连接所述第一区域和所述第三区域。
请一并参考图5，图5为图1b所示的检测系统的修复示意图，在某些实施方式中，可以利用激光对所述第一区域和所述第二区域、所述第二区域和所述第三区域进行隔断，以隔断扫描线上发生静电释放的位置。
优选的，本发明实施例中，所述静电击伤位置位于扫描线和与该扫描线非电性连接的测试线的跨线区域内，所述第二区域包括所述跨线区域。其中，与该扫描线非电性连接的测试线在扫描线平面上的投影与所述扫描线相交，所述扫描线平面包括所述扫描线，请一并图1b，Q为奇数线扫描线21和与该奇数线扫描线21非电性连接的测试线23的跨线区域。
如图5所示，例如，静电击伤位置24位于奇数线扫描线21与测试线23的跨线区域内，其中，所述奇数线扫描线21与该测试线23非电性连接，利用激光在该奇数线扫描线21上且在所述跨线区域的两侧将奇数线扫描线21切断，即隔断点设置在奇数线扫描线21上且在所述跨线区域的两侧，图5用加粗竖线表示奇数线扫描线21上隔断点设置的位置，从而可以确定出所述奇数线扫描线21的第一区域、第二区域和第三区域。
容易想到的是，本发明实施例中所述隔断点可以设置在离所述跨线区域更远的位置，由此扫描线划分的区域位置也会随之改变，图5仅为举例，不构成对本发明的限定。
在某些实施方式中，若检测系统中在偶数线扫描线22上发生ESD，该情形下不存在跨线区域，则可以将隔断点设置在偶数线扫描线22上且在静电击伤位置24的两侧，将所述第一区域和所述第二区域、所述第二区域和所述第三区域进行隔断。
进一步的，利用修复线连接所述第一区域和所述第三区域（即步骤S402）可以具体为：在扫描线的第三区域两侧分别制造修复线，并利用所述修复线按原扫描线的走线方向连接所述第一区域和所述第三区域。如图5所示，25为修复线，即利用所述修复线25将被隔断的扫描线与原测试线进行电性连接，所述原测试线为修复前与该扫描线相连接的测试线。
也就是说，本发明实施例中使用激光化学气相沉积法制造修复线，也就是利用激光的能量将金属离子沉积到待修复物件（即切断的扫描线）的表面，在原来的线路旁边重新按照设计的走线连接起来，这样因为Shorting Bar导致ESD的位置就可以经过修复线25进行修复。
容易想到的是，本发明实施例中修复线25的数量可以设置为两条，在某些更为精确或条件允许的场合，修复线25的数量可以设置为一条或三条或其他，此处不作具体限定；另外，检测系统中在偶数线扫描线22上发生ESD，也可以参照上述修复方法进行修复，图5所示对检测系统的修复方式不构成对本发明的限定。
有上述可知，本发明提供的检测系统的修复方法，将检测系统中静电击伤位置所处的扫描线进行隔断，其后利用修复线25将被隔断的扫描线和原测试线进行连接，以修复检测系统对显示面板造成的缺陷，降低生产成本。
在上述实施例中，对各个实施例的描述都各有侧重，某个实施例中没有详述的部分，可以参见上文相关的详细描述，此处不再赘述。
本领域技术人员将认识到，本文所使用的词语“优选的”意指用作实例、示例或例证。奉文描述为“优选的”任意方面或设计不必被解释为比其他方面或设计更有利。相反，词语“优选的”的使用旨在以具体方式提出概念。如本申请中所使用的术语“或”旨在意指包含的“或”而非排除的“或”。即，除非另外指定或从上下文中清楚，“X使用101或102”意指自然包括排列的任意一个。即，如果X使用101；X使用102;或X使用101和102二者，则“X使用101或102”在前述任一示例中得到满足。
而且，尽管已经相对于一个或多个实现方式示出并描述了本公开，但是本领域技术人员基于对本说明书和附图的阅读和理解将会想到等价变型和修改。本公开包括所有这样的修改和变型，并且仅由所附权利要求的范围限制。特别地关于由上述组件（例如元件、资源等）执行的各种功能，用于描述这样的组件的术语旨在对应于执行所述组件的指定功能（例如其在功能上是等价的）的任意组件（除非另外指示），即使在结构上与执行本文所示的本公开的示范性实现方式中的功能的公开结构不等同。此外，尽管本公开的特定特征已经相对于若干实现方式中的仅一个被公开，但是这种特征可以与如可以对给定或特定应用而言是期望和有利的其他实现方式的一个或多个其他特征组合。而且，就术语“包括”、“具有”、“含有”或其变形被用在具体实施方式或权利要求中而言，这样的术语旨在以与术语“包含”相似的方式包括。
综上所述，虽然本发明已以优选实施例揭露如上，但上述优选实施例并非用以限制本发明，本领域的普通技术人员，在不脱离本发明的精神和范围内，均可作各种更动与润饰，因此本发明的保护范围以权利要求界定的范围为准。

Claims (11)

  1. 一种检测系统的修复方法，所述检测系统包括红绿蓝信号线、三条测试线及探针，所述信号线与相应的测试线电性连接在一起，所述测试线连接至相应的探针，以对相应的信号线进行检测，其中所述信号线上包括有静电击伤位置，所述信号线包括依次连接的第一区域，第二区域和第三区域，所述静电击伤位置位于所述第二区域内；
    其中所述静电击伤位置位于信号线和与该信号线非电性连接的测试线的跨线区域内，所述第二区域包括所述跨线区域；其中，所述与该信号线非电性连接的测试线在信号线平面上的投影与所述信号线相交，所述信号线平面包括所述信号线；
    所述检测系统的修复方法包括：
    在所述信号线上设置隔断点，对所述第一区域和所述第二区域、所述第二区域和所述第三区域进行隔断；以及
    利用修复线连接所述第一区域和所述第三区域。
  2. 根据权利要求1所述的检测系统的修复方法，其中所述对所述第一区域和所述第二区域、所述第二区域和所述第三区域进行隔断的步骤，包括：
    利用激光对所述第一区域和所述第二区域、所述第二区域和所述第三区域进行隔断。
  3. 根据权利要求1所述的检测系统的修复方法，其中所述利用修复线连接所述第一区域和所述第三区域的步骤，包括：
    在信号线的第三区域两侧分别制造修复线，并利用所述修复线按原信号线的走线方向连接所述第一区域和所述第三区域。
  4. 一种检测系统的修复方法，所述检测系统包括红绿蓝信号线、三条测试线及探针，所述信号线与相应的测试线电性连接在一起，所述测试线连接至相应的探针，以对相应的信号线进行检测，其中所述信号线上包括有静电击伤位置，所述信号线包括依次连接的第一区域，第二区域和第三区域，所述静电击伤位置位于所述第二区域内；其中所述检测系统的修复方法包括：
    在所述信号线上设置隔断点，对所述第一区域和所述第二区域、所述第二区域和所述第三区域进行隔断；以及
    利用修复线连接所述第一区域和所述第三区域。
  5. 根据权利要求4所述的检测系统的修复方法，其中所述静电击伤位置位于信号线和与该信号线非电性连接的测试线的跨线区域内，所述第二区域包括所述跨线区域。
  6. 根据权利要求4所述的检测系统的修复方法，其中所述对所述第一区域和所述第二区域、所述第二区域和所述第三区域进行隔断的步骤，包括：
    利用激光对所述第一区域和所述第二区域、所述第二区域和所述第三区域进行隔断。
  7. 根据权利要求4所述的检测系统的修复方法，其中所述利用修复线连接所述第一区域和所述第三区域的步骤，包括：
    在信号线的第三区域两侧分别制造修复线，并利用所述修复线按原信号线的走线方向连接所述第一区域和所述第三区域。
  8. 一种检测系统的修复方法，所述检测系统包括扫描线，两条测试线及探针，所述扫描线包括奇数线扫描线和偶数线扫描线，所述扫描线与相应的测试线连接在一起，所述测试线连接至相应的探针，以对相应的扫描线进行检测，其中所述扫描线上包括有静电击伤位置，所述扫描线包括依次连接的第一区域，第二区域和第三区域，所述静电击伤位置位于所述第二区域内；其中所述检测系统的修复方法包括：
    在所述扫描线上设置隔断点，对所述第一区域和所述第二区域、所述第二区域和所述第三区域进行隔断；以及
    利用修复线连接所述第一区域和所述第三区域。
  9. 根据权利要求8所述的检测系统的修复方法，其中所述静电击伤位置位于扫描线和与该扫描线非电性连接的测试线的跨线区域内，所述第二区域包括所述跨线区域。
  10. 根据权利要求8所述的检测系统的修复方法，其中所述对所述第一区域和所述第二区域、所述第二区域和所述第三区域进行隔断的步骤，包括：
    利用激光对所述第一区域和所述第二区域、所述第二区域和所述第三区域进行隔断。
  11. 根据权利要求8所述的检测系统的修复方法，其中所述利用修复线连接所述第一区域和所述第三区域的步骤，包括：
    在扫描线的第三区域两侧分别制造修复线，并利用所述修复线按原扫描线的走线方向连接所述第一区域和所述第三区域。
PCT/CN2014/079431 2014-05-31 2014-06-07 检测系统的修复方法 Ceased WO2015180201A1 (zh)

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