WO2015180201A1 - Procédé de réparation de système de détection - Google Patents

Procédé de réparation de système de détection Download PDF

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Publication number
WO2015180201A1
WO2015180201A1 PCT/CN2014/079431 CN2014079431W WO2015180201A1 WO 2015180201 A1 WO2015180201 A1 WO 2015180201A1 CN 2014079431 W CN2014079431 W CN 2014079431W WO 2015180201 A1 WO2015180201 A1 WO 2015180201A1
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WO
WIPO (PCT)
Prior art keywords
area
line
region
signal line
repair
Prior art date
Application number
PCT/CN2014/079431
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English (en)
Chinese (zh)
Inventor
高冬子
Original Assignee
深圳市华星光电技术有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 深圳市华星光电技术有限公司 filed Critical 深圳市华星光电技术有限公司
Publication of WO2015180201A1 publication Critical patent/WO2015180201A1/fr

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Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells

Definitions

  • the present invention relates to the field of display panel technologies, and in particular, to a method for repairing a detection system.
  • Liquid crystal display device has many advantages such as thin body, power saving, no radiation, etc., and has been widely used.
  • Most of the liquid crystal display devices on the market are backlight type liquid crystal displays, which include a liquid crystal display panel and a backlight module (backlight) Module).
  • the working principle of the liquid crystal display panel is to place liquid crystal molecules in two parallel glass substrates, control the liquid crystal molecules to change direction by energizing the circuit of the glass substrate, and refract the light of the backlight module to produce a picture.
  • the liquid crystal display panel Before assembling the liquid crystal display panel into a liquid crystal display device, the liquid crystal display panel needs to use a shorting bar (Shorting) Bar) Technology performs yield detection to detect defects in the LCD panel such as MURA or DOT/LINE.
  • the Data side will pass the red, green and blue (R/G/B) signal line through indium tin oxide (ITO, Indium). Tin oxide) is connected to the corresponding test line, as shown in Figure 1a; Gate The side will connect the odd line and the even line (Even/Odd) scan line to the corresponding test line through ITO, as shown in Figure 1b. After that, the test line is externally connected and connected to the corresponding probe for good performance. Rate detection.
  • a repairing method for a detection system comprising a red, green and blue signal line, three test lines and a probe, the signal line being electrically connected to a corresponding test line, the test line being connected to a corresponding probe a pin for detecting a corresponding signal line, wherein the signal line includes an electrostatic damage position, the signal line includes a first region, a second region and a third region, which are sequentially connected, and the electrostatic damage position Located in the second area;
  • the electrostatic damage location is located in a crossover region of the signal line and the test line electrically connected to the signal line, the second region including the crossover region; wherein the signal line is non-electrical A projection of the connected test line on the signal line plane intersects the signal line, the signal line plane including the signal line;
  • the repair method of the detection system includes:
  • the first area and the third area are connected by a repair line.
  • the step of blocking the first area and the second area, the second area, and the third area includes:
  • the first region and the second region, the second region, and the third region are partitioned by a laser.
  • the step of connecting the first area and the third area by using a repair line includes:
  • a repair line is separately fabricated on both sides of the third region of the signal line, and the first region and the third region are connected by the repair line in the direction of the trace of the original signal line.
  • a repairing method for a detection system comprising a red, green and blue signal line, three test lines and a probe, the signal line being electrically connected to a corresponding test line, the test line being connected to a corresponding probe a pin for detecting a corresponding signal line, wherein the signal line includes an electrostatic damage position, the signal line includes a first region, a second region and a third region, which are sequentially connected, and the electrostatic damage position Located in the second area; the repairing method of the detection system includes:
  • the first area and the third area are connected by a repair line.
  • the electrostatic damage location is located in a cross-line area of a signal line and a test line non-electrically connected to the signal line, and the second area includes the over-line area.
  • the step of blocking the first area and the second area, the second area, and the third area includes:
  • the first region and the second region, the second region, and the third region are partitioned by a laser.
  • the step of connecting the first area and the third area by using a repair line includes:
  • a repair line is separately fabricated on both sides of the third region of the signal line, and the first region and the third region are connected by the repair line in the direction of the trace of the original signal line.
  • a repair method for a detection system comprising a scan line, two test lines and a probe, the scan line comprising an odd line scan line and an even line scan line, the scan line being connected to a corresponding test line Together, the test line is connected to a corresponding probe for detecting a corresponding scan line, wherein the scan line includes an electrostatic damage location, the scan line includes a first region, a second region, which are sequentially connected And a third area, the electrostatic damage location is located in the second area; wherein the repairing method of the detection system comprises:
  • the first area and the third area are connected by a repair line.
  • the electrostatic damage location is located in a cross-line area of a scan line and a test line non-electrically connected to the scan line, and the second area includes the cross-line area.
  • the step of blocking the first area and the second area, the second area, and the third area includes:
  • the first region and the second region, the second region, and the third region are partitioned by a laser.
  • the step of connecting the first area and the third area by using a repair line includes:
  • a repair line is separately fabricated on both sides of the third area of the scan line, and the first area and the third area are connected by the repair line in the direction of the trace of the original scan line.
  • the repairing method of the detecting system Compared with the prior art, the repairing method of the detecting system provided by the present invention cuts off the position of the electrostatic damage on the signal line or the scanning line in the detecting system, and then uses the repair line to correspond to the signal line or the scanning line that is blocked.
  • the test leads are connected to repair the defects caused by the detection system on the display panel and reduce the production cost.
  • FIG. 1a and 1b are schematic structural diagrams of a detection system in the prior art
  • Figure 1c is a cross-sectional view of the detection system A-A of Figure 1a;
  • FIG. 2 is a schematic flow chart of a method for repairing a detection system according to the present invention
  • FIG. 3 is a schematic diagram of repairing a detection system provided by the present invention.
  • FIG. 4 is a schematic flow chart of another method for repairing a detection system according to the present invention.
  • FIG. 5 is a schematic diagram of repair of another detection system provided by the present invention.
  • FIG. 1a is a schematic structural diagram of a detection system that needs to be repaired.
  • the detection system includes a red, green and blue signal line, three test lines and a probe, and the signal line is electrically connected to a corresponding test line. Together, the test line is connected to a corresponding probe for detecting a corresponding signal line, wherein the signal line includes an electrostatic damage location, the signal line includes a first region sequentially connected, and a second The area and the third area, the electrostatic damage location is located in the second area.
  • 11 is the R signal line
  • 12 is the G signal line
  • 13 is the B signal line
  • 14 is the test line
  • 15 is the electrostatic impact (ie ESD) position
  • the contact hole passes the ITO signal line and test. Lines correspond to connections where the position of the probe is not shown in the figure.
  • the liquid crystal display panel needs to adopt Shorting before assembling the liquid crystal display panel into the liquid crystal display device.
  • Bar technology performs yield detection.
  • the detection system adopts Shorting Bar technology detects whether the LCD panel has defects such as dead pixels or bright spots.
  • the red, green and blue (R/G/B) signal lines are passed through indium tin oxide (ITO, Indium tin). The oxide is connected to the corresponding test line. After the connection, the test line is externally led and connected to the corresponding probe for yield detection.
  • ITO indium tin oxide
  • the present invention provides a repairing method based on the detecting system shown in FIG. 1a.
  • FIG. 2 is a schematic flowchart of a repairing method of the detecting system according to the present invention.
  • the repairing method includes:
  • Step S201 providing a break point on the signal line, and blocking the first area and the second area, the second area, and the third area.
  • Step S202 connecting the first area and the third area by using a repair line.
  • FIG. 3 is a schematic diagram of the repair of the detection system shown in FIG. 1a.
  • the first area and the second area, the second area and The third region is partitioned to block a position at which an electrostatic discharge occurs on the signal line.
  • the electrostatic damage location is located in a cross-line area of the signal line and the test line electrically connected to the signal line, and the second area includes the cross-line area.
  • FIG. 1a For the cross-sectional view in the AA direction, please refer to Figure 1a together.
  • the G signal line 12 and the test line 14 electrically connected to the G signal line 12 have a region Q overlapping, and the overlap region Q is a G signal line 12 and a test line electrically connected to the G signal line 12 14 cross-line area.
  • the electrostatic damage location 15 is located in the crossover region Q of the G signal line 12 and the test line 14, wherein the G signal line 12 is non-electrically connected to the test line 14, using a laser
  • the G signal line 12 is cut off on the G signal line 12 and on both sides of the crossover area Q, that is, the break point is disposed on the G signal line 12 and on both sides of the crossover area Q, and FIG.
  • the thick horizontal line indicates the position where the break point is set on the G signal line 12, so that the first area, the second area, and the third area of the G signal line 12 can be determined.
  • the blocking point in the embodiment of the present invention may be disposed at a position farther from the spanning area, and thus the position of the area divided by the signal line will also change, and FIG. 3 is only an example, and does not constitute The invention is defined.
  • the break point can be set on the B signal line 13 and at the electrostatic breakdown position 15 Side, the first region and the second region, the second region, and the third region are partitioned.
  • connecting the first area and the third area by using the repair line may be specifically: manufacturing repair lines on both sides of the third area of the signal line, and using the repair line to press the original signal
  • the trace direction of the line connects the first area and the third area.
  • 16 is a repair line, that is, the signal line that is blocked is electrically connected to the original test line by using the repair line 16
  • the original test line is a test line connected to the signal line before repair.
  • laser chemical vapor deposition (laser) is used in the embodiment of the present invention.
  • CVD method to manufacture repair lines, that is, using the energy of the laser to deposit metal ions on the surface of the object to be repaired (ie, the cut signal line), and reconnecting according to the designed traces along the original line, because Shorting The position of the Bar that causes the ESD can be repaired via the repair line 16.
  • the number of repair lines 16 in the embodiment of the present invention can be set to two. In some more precise or conditionally allowed, the number of repair lines 16 can be set to one or three or other, not used here.
  • ESD is generated on the B signal line 13 or the R signal line 11, and the repair may be performed by referring to the above repair method.
  • the repair method of the detection system shown in FIG. 3 does not constitute a limitation of the present invention.
  • the repairing method of the detecting system provided by the present invention cuts off the signal line at the position of the electrostatic damage in the detecting system, and then connects the blocked signal line with the original test line by using the repairing line 16 to Repair the defects caused by the detection system on the display panel and reduce the production cost.
  • FIG. 1b is a schematic structural diagram of a detecting system that needs to be repaired, wherein the detecting system includes a scan line, two test lines and a probe.
  • the scan line includes an odd line scan line and an even line scan line, the scan line is connected to a corresponding test line, and the test line is connected to a corresponding probe to detect the corresponding scan line, wherein
  • the scan line includes an electrostatic damage location, and the scan line includes a first region, a second region, and a third region that are sequentially connected, and the electrostatic damage location is located in the second region.
  • the detecting system includes a scan line, two test lines and a probe.
  • the scan line includes an odd line scan line and an even line scan line, the scan line is connected to a corresponding test line, and the test line is connected to a corresponding probe to detect the corresponding scan line, wherein
  • the scan line includes an electrostatic damage location, and the scan line includes a first region, a second region, and a third region that are sequential
  • 21 is an odd-line scan line
  • 22 is an even-line scan line
  • 23 is a test line
  • 24 is an electrostatic shock (ie, an ESD occurs) position
  • the contact hole is connected to the test line through the ITO. The position of the probe therein is not shown in the figure.
  • the detecting system adopts Shorting Bar technology detects whether the LCD panel has defects such as dead pixels or bright spots. Among them in Gate On the side, the odd line and the even line (Even/Odd) scan line are connected to the corresponding test line through the ITO. After the connection, the test line is externally led and connected to the corresponding probe for yield detection.
  • Shorting Bar technology detects whether the LCD panel has defects such as dead pixels or bright spots.
  • the odd line and the even line (Even/Odd) scan line are connected to the corresponding test line through the ITO. After the connection, the test line is externally led and connected to the corresponding probe for yield detection.
  • FIG. 4 is a schematic flowchart of a repairing method of the detecting system according to the present invention.
  • the repairing method includes:
  • Step S401 providing a break point on the scan line, and blocking the first area and the second area, the second area, and the third area.
  • Step S402 connecting the first area and the third area by using a repair line.
  • FIG. 5 is a schematic diagram of the repair of the detection system shown in FIG. 1b.
  • the first region and the second region, the second region, and The third region is partitioned to block a position at which an electrostatic discharge occurs on the scan line.
  • the electrostatic damage location is located in a cross-line area of a scan line and a test line non-electrically connected to the scan line, and the second area includes the cross-line area.
  • the electrostatic damage location 24 is located in the crossover region of the odd-line scan line 21 and the test line 23, wherein the odd-line scan line 21 is non-electrically connected to the test line 23, using a laser
  • the odd-line scan lines 21 are cut on the odd-line scan lines 21 and on both sides of the jumper region, that is, the break points are disposed on the odd-line scan lines 21 and on both sides of the jumper region, FIG.
  • the position where the break point is set on the odd-line scan line 21 is indicated by a thick vertical line, so that the first area, the second area, and the third area of the odd-line scan line 21 can be determined.
  • FIG. 5 is only an example, and does not constitute The invention is defined.
  • the break point can be placed on the even line scan line 22 and at the electrostatic impact location 24 On both sides, the first region and the second region, the second region, and the third region are partitioned.
  • connecting the first area and the third area by using the repair line may be specifically: manufacturing repair lines on both sides of the third area of the scan line, and using the repair line to perform the original scan
  • the trace direction of the line connects the first area and the third area.
  • 25 is a repair line, that is, the scan line 25 is electrically connected to the original test line by using the repair line 25, and the original test line is a test line connected to the scan line before repair. .
  • the repair line is manufactured by using laser chemical vapor deposition, that is, the energy of the laser is used to deposit metal ions on the surface of the object to be repaired (ie, the cut scan line), and then re-pressed along the original line.
  • the design traces are connected, as this is because of Shorting The position of the Bar that causes the ESD can be repaired via the repair line 25.
  • the number of the repair lines 25 in the embodiment of the present invention can be set to two. In some cases where the accuracy or the conditions permit, the number of the repair lines 25 can be set to one or three or the other.
  • the ESD is generated on the even-line scan line 22 in the detection system, and the repair may be performed by referring to the above-mentioned repair method.
  • the repair method of the detection system shown in FIG. 5 does not constitute a limitation of the present invention.
  • the repair method of the detection system provided by the present invention cuts off the scan line where the electrostatic damage position in the detection system is located, and then connects the blocked scan line with the original test line by using the repair line 25, Repair the defects caused by the detection system on the display panel and reduce the production cost.

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  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Liquid Crystal (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)

Abstract

La présente invention a trait à un procédé de réparation de système de détection, qui consiste : à déterminer des points de division sur des lignes de signal (11, 12, 13) ou des lignes de balayage (21, 22) afin de séparer la première zone de la deuxième zone, et la deuxième zone de la troisième zone ; et à utiliser des lignes de réparation (16, 25) pour relier la première zone à la troisième zone, et pour relier par conséquent les lignes de signal (11, 12, 13) séparées ou les lignes de balayage (21, 22) à des lignes d'essai originales (14, 23), ce qui permet de réparer les défauts d'un panneau d'affichage provoqués par un système de détection, et de réduire les coûts de production.
PCT/CN2014/079431 2014-05-31 2014-06-07 Procédé de réparation de système de détection WO2015180201A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201410242166.4 2014-05-31
CN201410242166.4A CN103984133A (zh) 2014-05-31 2014-05-31 检测系统的修复方法

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WO2015180201A1 true WO2015180201A1 (fr) 2015-12-03

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WO (1) WO2015180201A1 (fr)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107894682A (zh) 2017-11-03 2018-04-10 惠科股份有限公司 一种显示面板及制造方法
CN111710301A (zh) * 2020-07-13 2020-09-25 京东方科技集团股份有限公司 一种显示面板及其制备方法和修复方法、显示装置
CN112669737B (zh) * 2020-12-22 2023-07-14 武汉天马微电子有限公司 显示面板及其裂纹检测方法、显示装置
CN113486623B (zh) * 2021-06-29 2023-08-08 合肥维信诺科技有限公司 信号线的断点检测系统及方法、电子设备

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CN101299124A (zh) * 2008-06-25 2008-11-05 昆山龙腾光电有限公司 液晶显示装置的阵列基板
US20100188594A1 (en) * 2009-01-23 2010-07-29 Tpo Displays Corp. Liquid crystal display device and related repairing methods
US20100265424A1 (en) * 2009-04-17 2010-10-21 Chuei-Lin Chiu Display panel having repair structure and method of repairing display panel
US20120287366A1 (en) * 2010-01-28 2012-11-15 Sharp Kabushiki Kaisha Method for correcting defect in display device, display device and method for manufacturing display device
CN103149713A (zh) * 2013-03-05 2013-06-12 深圳市华星光电技术有限公司 阵列面板检测电路结构
CN103163668A (zh) * 2011-12-15 2013-06-19 武汉天马微电子有限公司 液晶显示装置的检测装置

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101299124A (zh) * 2008-06-25 2008-11-05 昆山龙腾光电有限公司 液晶显示装置的阵列基板
US20100188594A1 (en) * 2009-01-23 2010-07-29 Tpo Displays Corp. Liquid crystal display device and related repairing methods
US20100265424A1 (en) * 2009-04-17 2010-10-21 Chuei-Lin Chiu Display panel having repair structure and method of repairing display panel
US20120287366A1 (en) * 2010-01-28 2012-11-15 Sharp Kabushiki Kaisha Method for correcting defect in display device, display device and method for manufacturing display device
CN103163668A (zh) * 2011-12-15 2013-06-19 武汉天马微电子有限公司 液晶显示装置的检测装置
CN103149713A (zh) * 2013-03-05 2013-06-12 深圳市华星光电技术有限公司 阵列面板检测电路结构

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