WO2015099227A1 - 백색도 및 부착량 동시측정장치 - Google Patents
백색도 및 부착량 동시측정장치 Download PDFInfo
- Publication number
- WO2015099227A1 WO2015099227A1 PCT/KR2013/012187 KR2013012187W WO2015099227A1 WO 2015099227 A1 WO2015099227 A1 WO 2015099227A1 KR 2013012187 W KR2013012187 W KR 2013012187W WO 2015099227 A1 WO2015099227 A1 WO 2015099227A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- light
- specimen
- whiteness
- infrared
- visible light
- Prior art date
Links
- 239000011248 coating agent Substances 0.000 title abstract 5
- 238000000576 coating method Methods 0.000 title abstract 5
- 238000001514 detection method Methods 0.000 claims abstract description 13
- 230000001678 irradiating effect Effects 0.000 claims abstract 2
- 238000000034 method Methods 0.000 claims description 10
- 229910000831 Steel Inorganic materials 0.000 description 24
- 239000010959 steel Substances 0.000 description 24
- 239000011347 resin Substances 0.000 description 7
- 229920005989 resin Polymers 0.000 description 7
- 239000011247 coating layer Substances 0.000 description 2
- 238000005260 corrosion Methods 0.000 description 2
- 230000007797 corrosion Effects 0.000 description 2
- 230000014509 gene expression Effects 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000010410 layer Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8422—Investigating thin films, e.g. matrix isolation method
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C22/00—Chemical surface treatment of metallic material by reaction of the surface with a reactive liquid, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals
- C23C22/73—Chemical surface treatment of metallic material by reaction of the surface with a reactive liquid, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals characterised by the process
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8422—Investigating thin films, e.g. matrix isolation method
- G01N2021/8427—Coatings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/063—Illuminating optical parts
- G01N2201/0636—Reflectors
Definitions
- the present invention relates to a device for simultaneously measuring the whiteness and adhesion amount, and more particularly, to a whiteness and adhesion amount measurement apparatus capable of simultaneously measuring the whiteness of the steel sheet and the adhesion amount of the coating layer.
- the resin coated on the steel sheet has the advantage of ensuring not only the corrosion resistance of the steel sheet, but also fingerprint resistance and insulation. Therefore, it is necessary to accurately measure and manage the adhesion amount of the resin.
- the method mainly used for measuring the adhesion amount of such a resin uses a method of injecting infrared rays into a steel sheet, measuring the amount of infrared rays absorbed from the resin layer, and converting them.
- the whiteness is an important factor in evaluating the quality of the steel sheet surface, a product that has excellent whiteness is increasingly required. Therefore, it is necessary to accurately measure and manage whiteness.
- the method mainly used to measure the whiteness uses a method of injecting visible light into a steel sheet and measuring the amount of light reflected from the steel sheet and converting it.
- the device for measuring the adhesion amount of the whiteness and the resin is installed separately, each occupy a double space, there is a problem that the work efficiency is lowered.
- each device since each device is expensive, there is a problem that the investment cost increases.
- the present invention has been made in an effort to provide a device for simultaneously measuring whiteness and adhesion amount which simultaneously measures whiteness and adhesion amount.
- the light emitting unit is disposed at a predetermined interval from the specimen and irradiates light on the specimen;
- a filter unit disposed between the light emitting unit and the specimen and selectively transmitting either infrared light or visible light;
- a detector disposed at a predetermined distance from the specimen and detecting any one of infrared rays and visible rays reflected from the specimen;
- a calculation unit connected to the detection unit, calculating an adhesion amount according to the amount of infrared light detected by the detection unit, and calculating a whiteness according to the amount of visible light detected by the detection unit.
- a device for simultaneously measuring whiteness and adhesion amount is provided.
- the filter unit includes at least one infrared filter for transmitting light in the infrared wavelength region; And at least one visible light filter configured to transmit light in the visible light wavelength range. It may include.
- the filter unit may be rotatably disposed, and the filter unit may be rotated such that any one of the infrared filter and the visible light filter is positioned in a path of light emitted from the light emitting unit.
- the filter unit may include a plurality of visible light filters for transmitting light of different wavelength bands in the visible light wavelength region.
- the detector includes an infrared detector for detecting the infrared ray; And a visible light detector for detecting the visible light. It may include.
- the detector may further include a half mirror, and the half mirror may pass a part of the light reflected from the specimen to either the infrared detector or the visible light detector and reflect the other part to the other.
- the whiteness and adhesion amount measuring apparatus is disposed between the filter portion and the specimen, the first mirror for reflecting the light transmitted from the filter portion to the specimen; And a second mirror disposed between the specimen and the detector and reflecting the light reflected from the specimen to the half mirror. It may further include.
- the whiteness and the adhesion amount of the steel sheet can be simultaneously measured, not only the facility space is secured but also the work efficiency can be improved.
- the device that can measure the whiteness and adhesion amount of the steel sheet at the same time since the device that can measure the whiteness and adhesion amount of the steel sheet at the same time is provided, there is no need to install a separate device. Therefore, the investment cost can be reduced.
- FIG. 1 is a view showing a whiteness and adhesion amount measuring apparatus according to an embodiment of the present invention
- FIG. 2 is a view showing a filter unit according to an embodiment of the present invention.
- FIG. 3 is a view showing a whiteness and adhesion amount measuring apparatus according to another embodiment of the present invention.
- ordinal numbers such as second and first
- first and second components may be used to describe various components, but the components are not limited by the terms. The terms are used only for the purpose of distinguishing one component from another.
- second component may be referred to as the first component, and similarly, the first component may also be referred to as the second component.
- FIG. 1 is a view showing a whiteness and adhesion amount measuring apparatus according to an embodiment of the present invention
- Figure 2 is a view showing a filter unit according to an embodiment of the present invention.
- the apparatus 100 for measuring whiteness and adhesion amount includes a light emitting unit 110, a filter unit 120, a detector 130, and a calculation unit 150. do.
- the light emitting unit 110 is disposed at a predetermined interval from the specimen 10 to irradiate light onto the specimen 10.
- the specimen 10 (hereinafter, steel sheet) may be, for example, steel sheet 10.
- the light emitting unit 110 may include a light source for emitting light of a predetermined wavelength region.
- the predetermined wavelength region may include wavelength regions of infrared rays and visible light.
- the filter unit 120 is disposed between the light emitting unit 110 and the steel plate 10, and selectively transmits either infrared or visible light.
- the filter unit 120 may selectively transmit light having a wavelength range of either infrared light or visible light from the light of the predetermined wavelength region irradiated from the light emitting unit 110.
- the filter unit 120 may include an infrared filter 121 for transmitting the light in the infrared wavelength region and a visible light filter 122 for transmitting the light in the visible wavelength region.
- the filter unit 120 is rotatably disposed, as shown in FIG. 2, so that either the infrared filter 121 or the visible light filter 122 is positioned in the path of the light emitted from the light emitting unit 110. Can be rotated to
- the filter unit 120 divides the wavelength range of the visible light into three sections, and as shown in FIG. 2, three visible light filters 122a and 122b for transmitting visible light in the wavelength range corresponding to each section. 122c).
- the present invention is not limited thereto, and the filter unit 120 may include a plurality of visible light filters 122 that transmit visible light of different wavelengths within the visible light wavelength range.
- the detector 130 is disposed at a predetermined interval from the steel sheet 10, and may detect any one of infrared rays and visible rays reflected from the steel sheet 10. To this end, the detector 130 may include an infrared detector 131 for detecting infrared light and a visible light detector 132 for detecting visible light.
- the detector 130 may further include a half mirror 133.
- the half mirror 133 may transmit a part of incident light and reflect the rest of the incident light.
- the half mirror 133 may transmit a part of the light reflected from the steel sheet 10 to the infrared detector 131, and reflect the rest of the light to the visible light detector 132.
- the calculator 150 is connected to the detector 130, calculates an amount of adhesion according to the amount of infrared light detected by the detector 130, and calculates a whiteness according to the amount of visible light detected by the detector 130.
- the calculation unit 150 may calculate the adhesion amount of the resin 11 coated on the steel sheet 10 according to the amount of infrared light detected by the infrared detector 131.
- the calculator 150 may calculate the whiteness of the steel sheet 10 according to the amount of visible light detected by the visible light detector 132.
- Figure 3 is a view showing a whiteness and adhesion amount measuring apparatus 100 according to another embodiment of the present invention.
- the apparatus 100 for measuring whiteness and adhesion amount may further include a first mirror 140 and a second mirror 141.
- the first mirror 140 is disposed between the filter unit 120 and the steel plate 10 and reflects the light transmitted from the filter unit 120 to the steel plate 10.
- the second mirror 141 is disposed between the steel sheet 10 and the detector 130, and reflects the light reflected from the steel sheet 10 to the half mirror 133.
- the apparatus 100 for measuring whiteness and adhesion amount includes the first mirror 140 and the second mirror 141, the path of the light may be adjusted. It can be made compact. Therefore, the installation space can be secured.
- filter unit 121 infrared filter
- infrared detector 132 visible light detector
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- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Mathematical Physics (AREA)
- General Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Abstract
Description
Claims (7)
- 시편과 소정 간격을 두고 배치되며, 상기 시편에 광을 조사하는 발광부;상기 발광부와 상기 시편의 사이에 배치되며, 적외선 또는 가시광선 중 어느 하나를 선택적으로 투과시키는 필터부;상기 시편과 소정 간격을 두고 배치되며, 상기 시편으로부터 반사되는 적외선 또는 가시광선 중 어느 하나를 검출하는 검출부; 및상기 검출부와 연결되며, 상기 검출부로부터 검출된 적외선의 광량에 따라 부착량을 산출하고, 상기 검출부로부터 검출된 가시광선의 광량에 따라 백색도를 산출하는 연산부; 를 포함하는 백색도 및 부착량 동시측정장치.
- 제 1항에 있어서, 상기 필터부는,적외선 파장영역의 광을 투과시키는 적어도 하나의 적외선 필터; 및가시광선 파장영역의 광을 투과시키는 적어도 하나의 가시광선 필터; 를 포함하는 백색도 및 부착량 동시측정장치.
- 제 2항에 있어서,상기 필터부는 회전이 가능하게 배치되며,상기 필터부는 상기 적외선 필터 또는 상기 가시광선 필터 중 어느 하나가 상기 발광부로부터 조사되는 광의 경로에 위치하도록 회전되는 백색도 및 부착량 동시측정장치.
- 제 2항에 있어서,상기 필터부는 가시광선 파장영역 내에서 서로 다른 파장역역의 광을 투과시키는 복수의 가시광선 필터를 포함하는 백색도 및 부착량 동시측정장치.
- 제 1항에 있어서, 상기 검출부는,상기 적외선을 검출하는 적외선 검출기; 및상기 가시광선을 검출하는 가시광선 검출기; 를 포함하는 백색도 및 부착량 동시측정장치.
- 제 5항에 있어서,상기 검출부는 하프미러를 더 포함하고,상기 하프미러는 상기 시편으로부터 반사되는 광의 일부를 상기 적외선 검출기 또는 상기 가시광선 검출기 중 어느 하나로 통과시키고, 다른 일부를 나머지 하나로 반사시키는 백색도 및 부착량 동시측정장치.
- 제 1항에 있어서,상기 필터부와 상기 시편 사이에 배치되며, 상기 필터부로부터 투과되는 광을 상기 시편으로 반사시키는 제1거울; 및상기 시편과 상기 검출부 사이에 배치되며, 상기 시편으로부터 반사되는 광을 상기 하프미러로 반사시키는 제2거울; 을 더 포함하는 백색도 및 부착량 동시측정장치.
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP13900105.1A EP3088868A4 (en) | 2013-12-26 | 2013-12-26 | DEVICE FOR SIMULTANEOUS MEASUREMENT OF A WHITE GRADE AND A COATING VOLUME |
JP2016542251A JP2017500576A (ja) | 2013-12-26 | 2013-12-26 | 白色度及び付着量の同時測定装置 |
CN201380081681.2A CN105980834A (zh) | 2013-12-26 | 2013-12-26 | 用于同时测量白度和涂覆量的装置 |
US15/107,910 US20160320310A1 (en) | 2013-12-26 | 2013-12-26 | Apparatus for simultaneously measuring whiteness and coating amount |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020130163494A KR101614866B1 (ko) | 2013-12-26 | 2013-12-26 | 백색도 및 부착량 동시측정장치 |
KR10-2013-0163494 | 2013-12-26 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2015099227A1 true WO2015099227A1 (ko) | 2015-07-02 |
Family
ID=53479058
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/KR2013/012187 WO2015099227A1 (ko) | 2013-12-26 | 2013-12-26 | 백색도 및 부착량 동시측정장치 |
Country Status (6)
Country | Link |
---|---|
US (1) | US20160320310A1 (ko) |
EP (1) | EP3088868A4 (ko) |
JP (1) | JP2017500576A (ko) |
KR (1) | KR101614866B1 (ko) |
CN (1) | CN105980834A (ko) |
WO (1) | WO2015099227A1 (ko) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
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KR102175836B1 (ko) * | 2018-10-10 | 2020-11-06 | 주식회사 포스코 | 소둔라인 후처리 설비 및 이의 제어 방법 |
Citations (5)
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JP2002022652A (ja) * | 2000-07-10 | 2002-01-23 | Horiba Ltd | 波長分析型赤外画像および可視画像解析装置 |
JP2006153633A (ja) * | 2004-11-29 | 2006-06-15 | Mitsubishi Electric Engineering Co Ltd | 被検査物体の欠陥判定装置 |
JP2008089486A (ja) * | 2006-10-04 | 2008-04-17 | Jfe Steel Kk | 被膜付着量測定方法 |
JP2011123019A (ja) * | 2009-12-14 | 2011-06-23 | Olympus Corp | 画像検査装置 |
KR20120075173A (ko) * | 2010-12-28 | 2012-07-06 | 주식회사 포스코 | 백색도 측정 장치 및 이를 이용한 백색도 측정 방법 |
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JPS56108940A (en) * | 1980-02-04 | 1981-08-28 | Itouman Kk | Measuring device utilizing near infrared ray absorption |
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JP2004264077A (ja) * | 2003-02-28 | 2004-09-24 | Jfe Steel Kk | 被膜付着量測定方法及び被膜付着量測定装置、並びに反射赤外線吸収分析装置 |
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JP2007294604A (ja) * | 2006-04-24 | 2007-11-08 | Tokyo Seimitsu Co Ltd | 外観検査装置及び外観検査方法 |
DE102010014744B4 (de) * | 2010-04-13 | 2013-07-11 | Siemens Aktiengesellschaft | Vorrichtung und Verfahren zum Projiezieren von Information auf ein Objekt bei Thermographie-Untersuchungen |
EP2530442A1 (en) * | 2011-05-30 | 2012-12-05 | Axis AB | Methods and apparatus for thermographic measurements. |
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2013
- 2013-12-26 JP JP2016542251A patent/JP2017500576A/ja active Pending
- 2013-12-26 EP EP13900105.1A patent/EP3088868A4/en not_active Withdrawn
- 2013-12-26 KR KR1020130163494A patent/KR101614866B1/ko active IP Right Grant
- 2013-12-26 US US15/107,910 patent/US20160320310A1/en not_active Abandoned
- 2013-12-26 CN CN201380081681.2A patent/CN105980834A/zh active Pending
- 2013-12-26 WO PCT/KR2013/012187 patent/WO2015099227A1/ko active Application Filing
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2002022652A (ja) * | 2000-07-10 | 2002-01-23 | Horiba Ltd | 波長分析型赤外画像および可視画像解析装置 |
JP2006153633A (ja) * | 2004-11-29 | 2006-06-15 | Mitsubishi Electric Engineering Co Ltd | 被検査物体の欠陥判定装置 |
JP2008089486A (ja) * | 2006-10-04 | 2008-04-17 | Jfe Steel Kk | 被膜付着量測定方法 |
JP2011123019A (ja) * | 2009-12-14 | 2011-06-23 | Olympus Corp | 画像検査装置 |
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KR20150076283A (ko) | 2015-07-07 |
JP2017500576A (ja) | 2017-01-05 |
KR101614866B1 (ko) | 2016-04-25 |
US20160320310A1 (en) | 2016-11-03 |
EP3088868A1 (en) | 2016-11-02 |
EP3088868A4 (en) | 2016-12-14 |
CN105980834A (zh) | 2016-09-28 |
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