WO2015093219A1 - Procédé de diagnostic de panne de bougie à incandescence et appareil de diagnostic de panne de bougie à incandescence - Google Patents

Procédé de diagnostic de panne de bougie à incandescence et appareil de diagnostic de panne de bougie à incandescence Download PDF

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Publication number
WO2015093219A1
WO2015093219A1 PCT/JP2014/080608 JP2014080608W WO2015093219A1 WO 2015093219 A1 WO2015093219 A1 WO 2015093219A1 JP 2014080608 W JP2014080608 W JP 2014080608W WO 2015093219 A1 WO2015093219 A1 WO 2015093219A1
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WO
WIPO (PCT)
Prior art keywords
glow plug
temperature
voltage
shunt
shunt resistor
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Application number
PCT/JP2014/080608
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English (en)
Japanese (ja)
Inventor
友洋 中村
須田　敬久
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ボッシュ株式会社
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Publication date
Application filed by ボッシュ株式会社 filed Critical ボッシュ株式会社
Priority to JP2015553439A priority Critical patent/JP6188170B2/ja
Publication of WO2015093219A1 publication Critical patent/WO2015093219A1/fr

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    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F02—COMBUSTION ENGINES; HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
    • F02P—IGNITION, OTHER THAN COMPRESSION IGNITION, FOR INTERNAL-COMBUSTION ENGINES; TESTING OF IGNITION TIMING IN COMPRESSION-IGNITION ENGINES
    • F02P19/00—Incandescent ignition, e.g. during starting of internal combustion engines; Combination of incandescent and spark ignition
    • F02P19/02—Incandescent ignition, e.g. during starting of internal combustion engines; Combination of incandescent and spark ignition electric, e.g. layout of circuits of apparatus having glowing plugs
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F02—COMBUSTION ENGINES; HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
    • F02P—IGNITION, OTHER THAN COMPRESSION IGNITION, FOR INTERNAL-COMBUSTION ENGINES; TESTING OF IGNITION TIMING IN COMPRESSION-IGNITION ENGINES
    • F02P17/00—Testing of ignition installations, e.g. in combination with adjusting; Testing of ignition timing in compression-ignition engines
    • F02P17/12—Testing characteristics of the spark, ignition voltage or current
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F02—COMBUSTION ENGINES; HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
    • F02P—IGNITION, OTHER THAN COMPRESSION IGNITION, FOR INTERNAL-COMBUSTION ENGINES; TESTING OF IGNITION TIMING IN COMPRESSION-IGNITION ENGINES
    • F02P19/00—Incandescent ignition, e.g. during starting of internal combustion engines; Combination of incandescent and spark ignition
    • F02P19/02—Incandescent ignition, e.g. during starting of internal combustion engines; Combination of incandescent and spark ignition electric, e.g. layout of circuits of apparatus having glowing plugs
    • F02P19/025—Incandescent ignition, e.g. during starting of internal combustion engines; Combination of incandescent and spark ignition electric, e.g. layout of circuits of apparatus having glowing plugs with means for determining glow plug temperature or glow plug resistance

Definitions

  • the present invention relates to a glow plug failure diagnosis method and a glow plug failure diagnosis device used in an internal combustion engine, and more particularly to a device that improves the reliability and accuracy of failure diagnosis.
  • JP 2010-180812 (page 7-13, FIG. 1 to FIG. 3)
  • the conventional glow plug fault diagnosis as described above has a problem that it is difficult to obtain satisfactory reliability as described below. That is, the conventional glow plug failure determination described above is performed based on whether or not the current of the glow plug exceeds a threshold at which a glow plug failure can be determined. In consideration of the temperature range in which the glow plug control device is used, for example, ⁇ 40 ° C. to 105 ° C., one suitable value is set based on the test result and simulation result.
  • the present invention has been made in view of the above circumstances, and is a glow plug that enables highly reliable failure diagnosis of a glow plug without being affected by variations in the temperature characteristics of the glow plug and the temperature characteristics of the control circuit.
  • a failure diagnosis method and a glow plug failure diagnosis apparatus are provided.
  • a fault diagnosis method for a glow plug includes: A glow plug is provided in series with a current control semiconductor element and a shunt resistor between the battery and the ground, and the operation of the current control semiconductor element to enable current control of the glow plug.
  • An arithmetic control unit configured to be controllable and a measurement circuit configured to be able to supply the voltage of the shunt resistor to the arithmetic control unit are provided in the same casing together with the shunt resistor,
  • a glow plug fault diagnostic method in a glow plug fault diagnostic apparatus configured to be used for recognizing the voltage and current of the glow plug by the arithmetic control unit, the voltage across the shunt resistor, The voltage of the shunt resistor obtained through the measurement circuit is corrected based on the temperature in the casing to obtain a shunt correction voltage, and a predetermined standard value of the shunt resistor is set to the temperature in the casing.
  • a glow plug failure diagnosis apparatus comprises: A glow plug is provided in series with a current control semiconductor element and a shunt resistor between the battery and the ground, and the operation of the current control semiconductor element to enable current control of the glow plug.
  • An arithmetic control unit configured to be controllable and a measurement circuit configured to be able to supply the voltage of the shunt resistor to the arithmetic control unit are provided in the same casing together with the shunt resistor,
  • a glow plug fault diagnosis device configured such that the voltage across the shunt resistor is used for recognition of the voltage and current of the glow plug by the arithmetic control unit,
  • the arithmetic control unit is The voltage of the shunt resistor obtained through the measurement circuit is corrected based on the temperature in the casing and calculated as a shunt correction voltage, and a predetermined standard value of the shunt resistor is calculated in the casing.
  • the shunt correction voltage is divided by the shunt correction resistance value, and the division result is a glow current that is the current of the glow plug, When the glow current exceeds a predetermined threshold, it is determined that the glow plug has failed.
  • the glow current corrected in accordance with the temperature inside the housing provided with the glow plug drive circuit and the like is obtained, the temperature characteristics of the glow plug and the temperature characteristics of the control circuit are varied. Therefore, it is possible to diagnose a failure of the glow plug with high reliability without being influenced by the above, and to provide an apparatus with high reliability.
  • FIG. 1 It is a block diagram which shows the structural example of the glow plug failure diagnostic apparatus in embodiment of this invention. It is a subroutine flowchart which shows the procedure of the glow plug fault diagnostic process performed in the glow plug fault diagnostic apparatus shown by FIG.
  • the glow plug failure diagnosis device according to the embodiment of the present invention is realized by a glow plug drive control device, and FIG. 1 shows an example of the configuration of the glow plug drive control device.
  • a glow plug drive control device hereinafter referred to as “GCU” 100 that realizes a glow plug failure diagnosis device according to an embodiment of the present invention will be described with reference to FIG.
  • the GCU 100 is roughly divided into an energization drive circuit 51, a measurement circuit 52, and an arithmetic control unit (indicated as “CPU” in FIG. 1) 53. .
  • the energization drive circuit 51, the measurement circuit 52, and the calculation control unit 53 are housed in an appropriate housing (not shown).
  • the energization drive circuit 51 is configured such that energization control of the glow plug 1 is possible with the energization control semiconductor element 2 and the shunt resistor 3 as main components. That is, first, for example, a MOS FET or the like is used for the energization control semiconductor element 2, the drain is on the positive side of the vehicle battery 4, and the source is on the positive side of the glow plug 1 via the shunt resistor 3. The negative side of the glow plug 1 is connected to ground. In addition, a control signal from the arithmetic control unit 53 is applied to the gate of the energization control semiconductor element 2 so that conduction and non-conduction of the energization control semiconductor element 2 can be controlled.
  • a MOS FET or the like is used for the energization control semiconductor element 2
  • the drain is on the positive side of the vehicle battery 4
  • the source is on the positive side of the glow plug 1 via the shunt resistor 3.
  • the negative side of the glow plug 1 is connected
  • the measurement circuit 52 includes the operational amplifier 5, the analog / digital converter (indicated as "A / D" in FIG. 1) 6, and the temperature detection element 7 as main components, and the voltage in the shunt resistor 3 is measured.
  • the descent is configured to be supplied to the arithmetic control unit 53 as a digital signal. That is, first, a voltage across the shunt resistor 3 is input to the operational amplifier 5, and the input voltage is amplified to a voltage suitable for the input of the analog / digital converter 6 in the next stage. Is output. The output voltage of the operational amplifier 5 is inputted to the arithmetic control unit 53 as a digital value by the analog / digital converter 6.
  • the temperature detecting element 7 is exposed to the temperature in the GCU 100 (in other words, in the casing), in other words, the electronic components in the GCU 100 such as the shunt resistor 3, the operational amplifier 5, and the analog / digital converter 6.
  • the electronic components in the GCU 100 such as the shunt resistor 3, the operational amplifier 5, and the analog / digital converter 6.
  • NTC negative temperature coefficient
  • the output signal of the temperature detection element 7 is input to the arithmetic control unit 53, converted into a digital signal by the arithmetic control unit 53, and used for a later-described glow plug failure diagnosis process executed by the arithmetic control unit 53. It is like that.
  • the arithmetic control unit 53 includes, for example, a storage element (not shown) such as a RAM or a ROM centering on a microcomputer (not shown) or an ASIC (Application Specific Integrated Circuit) having a known or well-known configuration. And an interface circuit (not shown) for outputting a control signal for the energization control semiconductor element 2 as a main component.
  • a storage element such as a RAM or a ROM centering on a microcomputer (not shown) or an ASIC (Application Specific Integrated Circuit) having a known or well-known configuration.
  • an interface circuit (not shown) for outputting a control signal for the energization control semiconductor element 2 as a main component.
  • the glow plug 1 in the embodiment of the present invention is driven and controlled by so-called closed loop control. Specifically, first, the arithmetic control unit 53 determines the shunt resistor 3 from the magnitude of the voltage drop of the shunt resistor 3 input by the measurement circuit 52 and the resistance value of the shunt resistor 3 that has been grasped in advance. The flowing current is calculated as the current flowing through the glow plug 1. Then, the actual resistance value of the glow plug 1 is obtained by dividing the actual applied voltage of the glow plug 1 by the calculated current value.
  • the voltage applied to the glow plug 1 is obtained by subtracting the voltage drop in the energization control semiconductor element 2 and the voltage drop in the shunt resistor 3 from the voltage value of the vehicle battery 4.
  • the voltage drop of the energization control semiconductor element 2 is grasped in advance and set as a constant.
  • the arithmetic control unit 53 stores the correlation between the resistance value of the glow plug 1 and the temperature of the glow plug 1 (glow plug temperature), for example, as a resistance / temperature correlation map, and is obtained as described above.
  • the glow plug temperature with respect to the resistance value of the glow plug 1 is obtained from the resistance-temperature correlation map.
  • the arithmetic control unit 53 is instructed by the engine control electronic control unit (indicated as “ECU” in FIG. 1) 200 to set the temperature of the glow plug 1 and the voltage applied to the base glow plug 1. It has become. This set temperature is determined in accordance with the operating state of the engine in the electronic control unit 200 for engine control.
  • the glow plug applied voltage as a base is based on the electrical characteristics of the glow plug 1 that are grasped in advance in the electronic control unit 200 for engine control in accordance with each glow plug set temperature and the operating state of the engine. It is determined using a set arithmetic expression, a map, or the like.
  • the engine control electronic control unit 200 is calculated from the correlation between the glow plug set temperature input from the engine control electronic control unit 200 and the glow plug temperature obtained as described above.
  • a correction voltage for the glow plug applied voltage which is the base input from, is obtained.
  • the glow plug applied voltage as a base is corrected by the correction voltage, and the final applied voltage of the glow plug 1 is obtained.
  • drive control of the energization control semiconductor element 2 by the arithmetic control unit 53 is performed by PWM control.
  • the voltage applied to the glow plug 1 is corrected as described above.
  • the duty of the PWM signal applied to the energization control semiconductor element 2 is calculated by an arithmetic process so that the required voltage is obtained, and is applied to the energization control semiconductor element 2 so that conduction or non-conduction is achieved. To be controlled.
  • the glow plug failure diagnosis process executed by the arithmetic control unit 53 will be described with reference to the subroutine flowchart shown in FIG.
  • the subroutine flowchart shown in FIG. 2 is one of various subroutine processes executed in the arithmetic control unit 53 together with the energization drive control of the glow plug 1 executed in the arithmetic control unit 53 as in the prior art. It is.
  • a voltage (shunt voltage) between both terminals of the shunt resistor 3 is read (see step S102 in FIG. 2). That is, the voltage of the shunt resistor 3 is taken into the arithmetic control unit 53 as a digital value via the operational amplifier 5 and the analog / digital converter 6 and stored and held in an appropriate storage area.
  • the temperature in the GCU 100 (the temperature in the housing) is read (see step S104 in FIG. 2). That is, the output signal of the temperature detection element 7 is taken into the arithmetic control unit 53 and stored and held in an appropriate storage area as the temperature in the casing.
  • the resistance correction coefficient Kr and the amplification / conversion correction coefficient Kd are calculated (see step S106 in FIG. 2).
  • the resistance correction coefficient Kr is a correction coefficient used when calculating and calculating the actual resistance value of the shunt resistor 3 considering the temperature change in the casing as will be described later
  • the amplification / conversion correction coefficient Kd is the casing. This is a correction coefficient used when calculating and calculating a correct output value of the analog / digital converter 6 in consideration of changes in internal temperature, as will be described later.
  • the amplification / conversion correction coefficient Kd includes fluctuations in the output signal of the operational amplifier 5 due to temperature changes in the housing.
  • the resistance value of the shunt resistor 3 used for calculating the actual resistance value of the glow plug 1 and the output values of the operational amplifier 5 and the analog / digital converter 6 are In view of the change depending on the temperature, the standard resistance value of the shunt resistor 3 and the standard value of the output value of the analog / digital converter 6 are corrected according to the temperature in the housing, and the temperature in the housing is taken into consideration. In other words, the resistance value of the shunt resistor 3 and the output value of the analog / digital converter 6 corresponding to the temperature in the housing are obtained and used for calculating the actual resistance value of the glow plug 1. Thus, the actual resistance value of the glow plug 1 can be calculated accurately.
  • the resistance value (shunt correction resistance value) Rs of the shunt resistor 3 in consideration of the temperature in the housing can be obtained by the following formula 1 according to the general characteristic of the resistance element with respect to the temperature change.
  • Rc is a resistance value (standard resistance value) of the shunt resistor 3 at a standard temperature (for example, 24 ° C.).
  • TCR is a resistance correction coefficient Kr.
  • ⁇ T is a difference between the above-described standard temperature and the temperature inside the casing obtained in step S104.
  • the sign ⁇ in the above equation 1 is alternatively selected depending on whether the temperature coefficient of the shunt resistor 3 is a negative temperature coefficient or a positive temperature coefficient.
  • the resistance correction coefficient Kr changes depending on the temperature in the casing.
  • the resistance correction coefficient Kr corresponds to the temperature in the casing acquired in the previous step S104 by the resistance correction coefficient map or the resistance correction coefficient calculation formula.
  • a resistance correction coefficient Kr is obtained. That is, the resistance correction coefficient map is configured in advance so that the resistance correction coefficient Kr with respect to various in-chassis temperatures can be read out using the in-chassis temperature as an input parameter based on tests and simulation results. These are stored in advance in appropriate storage areas.
  • the resistance correction coefficient calculation expression is an expression set in advance so that the resistance correction coefficient Kr can be calculated based on a test or simulation result using the temperature in the housing as an argument.
  • the output signal of the analog / digital converter 6 in consideration of the temperature in the housing includes the change in the amplification factor and the input / output offset accompanying the temperature change in the housing of the operational amplifier 5 and is obtained by the following equation 2.
  • the amplification factor including both the operational amplifier 5 and the analog / digital converter 6 is set to 1. Therefore, the voltage value obtained by the following equation 2 is the voltage across the shunt resistor 3 via the operational amplifier 5 and the analog / digital converter 6.
  • VVT f (Tu) ⁇ Vs ... Equation 2
  • VT is an analog voltage value (shunt correction voltage) corresponding to the digital output value of the analog / digital converter 6 in consideration of the temperature in the housing.
  • Vs is the voltage across the shunt resistor 3 read in step S102.
  • f (Tu) is the voltage across the shunt resistor 3 even if the digital output value of the analog-to-digital converter 6 including the characteristic fluctuation of the operational amplifier 5 due to the change in the temperature inside the casing occurs.
  • the amplification / conversion correction coefficient Kd is set based on the test result and the simulation result so that the temperature inside the casing is an input parameter so that the original correct value can be obtained.
  • the shunt correction resistance value and the shunt are obtained using the resistance correction coefficient Kr and the amplification / conversion correction coefficient Kd.
  • the correction voltage is calculated (see step S108 in FIG. 2). That is, first, the shunt correction resistance value Rs is obtained by the above equation 1. Next, the shunt correction voltage VT is obtained by the above equation 2.
  • the current flowing through the glow plug 1 is calculated (see step S110 in FIG. 2). That is, the current (glow current) Ig that flows through the glow plug 1 is also a current that flows through the shunt resistor 3, and thus can be obtained by the following equation (3).
  • VT is the shunt correction voltage obtained in step S108
  • Rs is the shunt correction resistance value obtained in step S108.
  • failure determination of the glow plug is performed based on the above-described glow current Ig. That is, it is determined whether or not the glow current Ig exceeds a predetermined threshold value K. When it is determined that the glow current Ig does not exceed the predetermined threshold value (in the case of NO), it is determined to be normal (step of FIG. 2). S114), a series of processing is completed, the process returns to the main routine (not shown), and energization control of the glow plug 1 is continued.
  • step S112 when it is determined in step S112 that the glow current Ig exceeds the predetermined threshold K (in the case of YES), it is determined that the glow plug 1 is in failure (see step S116 in FIG. 2), and the main not shown.
  • an alarm process such as an alarm display, or a process of stopping energization control to the glow plug 1 is executed as necessary.
  • the threshold value K in step S112 is the most suitable value based on test results and simulation results in consideration of the temperature range in which the glow plug drive control device 100 is used, for example, ⁇ 40 ° C. to 105 ° C. Is set as.
  • the glow current Ig is corrected by the voltage VT and the resistance value Rs across the shunt resistor 3 corrected in accordance with the casing temperature of the glow plug drive control device 100. Therefore, unlike the conventional case, it is reliably avoided that the threshold value K itself is not appropriate as a criterion for determining the suitability of the glow current Ig.
  • the determination in step S112 is the same as the conventional case. In contrast, it is highly accurate and reliable.

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  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Combustion & Propulsion (AREA)
  • Mechanical Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

L'invention a pour objet de diagnostiquer de manière extrêmement fiable des pannes de bougies à incandescence sans être affecté par la variation de caractéristiques de température des bougies à incandescence et par la variation de caractéristiques de température de circuits de commande. Une tension de résistance de dérivation (3) obtenue au moyen d'un circuit de mesure (52) est corrigée pour obtenir une tension de dérivation corrigée sur la base d'une température à l'intérieur d'un GCU (100), une valeur de référence prédéterminée de la résistance de dérivation (3) est corrigée pour devenir une valeur de résistance de dérivation corrigée sur la base d'une température du CGU (100), la tension de dérivation corrigée est divisée par la valeur de résistance de dérivation corrigée et le résultat de la division est défini comme un courant d'incandescence, à savoir un courant d'une bougie à incandescence (1), et lorsque le résultat dépasse une valeur seuil prédéterminée, il est déterminé que la bougie à incandescence (1) présente une panne.
PCT/JP2014/080608 2013-12-20 2014-11-19 Procédé de diagnostic de panne de bougie à incandescence et appareil de diagnostic de panne de bougie à incandescence WO2015093219A1 (fr)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105842577A (zh) * 2016-03-23 2016-08-10 华中科技大学 一种交流变频调速系统中功率变换器开路故障诊断方法
CN111997757A (zh) * 2020-07-31 2020-11-27 东风商用车有限公司 一种发动机进气预热器失效诊断方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009099638A (ja) * 2007-10-15 2009-05-07 Denso Corp 半導体装置
JP2010180812A (ja) * 2009-02-06 2010-08-19 Ngk Spark Plug Co Ltd グロープラグ故障診断装置
JP2011125130A (ja) * 2009-12-10 2011-06-23 Panasonic Corp インバータ駆動装置
JP2012233661A (ja) * 2011-05-09 2012-11-29 Denso Corp 制御部一体型グロープラグ
WO2013000621A1 (fr) * 2011-06-29 2013-01-03 Robert Bosch Gmbh Procédé et système d'étalonnage d'une résistance de shunt

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009099638A (ja) * 2007-10-15 2009-05-07 Denso Corp 半導体装置
JP2010180812A (ja) * 2009-02-06 2010-08-19 Ngk Spark Plug Co Ltd グロープラグ故障診断装置
JP2011125130A (ja) * 2009-12-10 2011-06-23 Panasonic Corp インバータ駆動装置
JP2012233661A (ja) * 2011-05-09 2012-11-29 Denso Corp 制御部一体型グロープラグ
WO2013000621A1 (fr) * 2011-06-29 2013-01-03 Robert Bosch Gmbh Procédé et système d'étalonnage d'une résistance de shunt

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105842577A (zh) * 2016-03-23 2016-08-10 华中科技大学 一种交流变频调速系统中功率变换器开路故障诊断方法
CN111997757A (zh) * 2020-07-31 2020-11-27 东风商用车有限公司 一种发动机进气预热器失效诊断方法

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