WO2015089878A1 - Display device and test line repair method therefor - Google Patents

Display device and test line repair method therefor Download PDF

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Publication number
WO2015089878A1
WO2015089878A1 PCT/CN2013/090821 CN2013090821W WO2015089878A1 WO 2015089878 A1 WO2015089878 A1 WO 2015089878A1 CN 2013090821 W CN2013090821 W CN 2013090821W WO 2015089878 A1 WO2015089878 A1 WO 2015089878A1
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WO
WIPO (PCT)
Prior art keywords
segment
line
thin film
film transistor
display device
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Application number
PCT/CN2013/090821
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French (fr)
Chinese (zh)
Inventor
杜鹏
施明宏
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深圳市华星光电技术有限公司
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Application filed by 深圳市华星光电技术有限公司 filed Critical 深圳市华星光电技术有限公司
Priority to KR1020167010222A priority Critical patent/KR101894523B1/en
Priority to EA201690996A priority patent/EA031911B1/en
Priority to US14/234,419 priority patent/US9000435B1/en
Priority to GB1604875.3A priority patent/GB2534317B/en
Priority to JP2016526832A priority patent/JP2016538590A/en
Publication of WO2015089878A1 publication Critical patent/WO2015089878A1/en

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    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
    • H01L22/22—Connection or disconnection of sub-entities or redundant parts of a device in response to a measurement
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
    • H01L22/32—Additional lead-in metallisation on a device or substrate, e.g. additional pads or pad portions, lines in the scribe line, sacrificed conductors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/481—Internal lead connections, e.g. via connections, feedthrough structures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42—Wire connectors; Manufacturing methods related thereto
    • H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L24/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • H01L27/10—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a repetitive configuration
    • H01L27/105—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a repetitive configuration including field-effect components
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
    • H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
    • H01L27/124—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or layout of the wiring layers specially adapted to the circuit arrangement, e.g. scanning lines in LCD pixel circuits
    • H01L27/1244—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or layout of the wiring layers specially adapted to the circuit arrangement, e.g. scanning lines in LCD pixel circuits for preventing breakage, peeling or short circuiting
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/80—Constructional details
    • H10K59/88—Dummy elements, i.e. elements having non-functional features
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
    • G09G2330/08—Fault-tolerant or redundant circuits, or circuits in which repair of defects is prepared
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
    • G09G2330/10—Dealing with defective pixels
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • H01L2224/8319—Arrangement of the layer connectors prior to mounting
    • H01L2224/83191—Arrangement of the layer connectors prior to mounting wherein the layer connectors are disposed only on the semiconductor or solid-state body

Definitions

  • the present invention relates to the field of flat panel display technologies, and in particular, to a display device and a test line repair method thereof.
  • Transistor 100 comes as a switch.
  • the drain 102 of the thin film transistor 100 is connected to a detection signal source, and the source 103 of the thin film transistor 100 and the gate line in the display panel (Gate)
  • a line/data line is connected, and a gate 101 of the thin film transistor 100 is connected to a control signal source.
  • the control signal source outputs a high level signal (high potential signal) to the gate 101, thereby turning on the switch 100, that is, causing the source 103 and the drain 102 to be turned on.
  • the control signal source outputs a low level signal (low potential signal) to the gate 101, thereby turning off the switch 100, that is, cutting off between the test signal source and the gate line/data line. Connection.
  • a short circuit may occur between the source 103 and the drain 102 of the thin film transistor 100 due to the presence of particles.
  • a short circuit occurs at the region 104.
  • the conventional repair solution is:
  • the laser beam is cut at the cutting portion 105.
  • the width-to-length ratio (W/L, Width/Length) of the thin film transistor 100 is made. A change occurs.
  • the screen When the display panel is turned on, the screen may be abnormal due to the difference in line impedance, or the line may be defective. Defect), which leads to misjudgment and unnecessary waste loss.
  • PSVA Polymer Stabilized Vertical
  • the above short circuit occurs between the source 103 and the drain 102 of the thin film transistor 100, the above conventionality is not repaired or used.
  • the repair is done in a way, it may cause a permanent line defect in the display panel.
  • a display device includes: a display panel; wherein the display panel includes: a first thin film transistor array, the first thin film transistor array includes at least one first thin film transistor; and a second thin film transistor array, The second thin film transistor array includes at least one second thin film transistor; and at least one first backup line; wherein the first thin film transistor is adjacent to the second thin film transistor, the second thin film transistor and the test signal input line Connected to the first backup line; in a case where the first thin film transistor is short-circuited, the first input end of the first thin film transistor is used to be disconnected from the test signal input line by laser cutting a first connection, the first output end of the first thin film transistor is configured to be disconnected from the test signal output line by the laser cutting mode, the first backup line being used for laser welding Connected to the test signal output line; the display panel further includes: a control signal line array, the control signal line array including at least a control signal line; a first control end of the first thin film transistor and a second control end of the second thin film transistor are both connected to
  • the second control terminal is configured to turn on or off a switch corresponding to the second thin film transistor according to the control signal.
  • the second input terminal of the second thin film transistor is connected to the test signal input line, and the second output terminal of the second thin film transistor is connected to the first standby line.
  • the first spare line includes a first segment, a second segment, and a third segment; the second segment is located between the first segment and the third segment The second segment is connected to the second output end; in a case where the first thin film transistor is short-circuited, the second segment is used to pass the laser welding method and the test signal output line Connected, the first segment is for disconnecting a third connection with the second segment by the laser cutting mode, and the third segment is used for disconnecting and stopping by the laser cutting mode A fourth connection between the second segments.
  • the first backup line includes a first end and a second end, the first end is connected to the second output end, and the second end is disposed on the test signal output line opposite to The other side of the first end; in the case where the first thin film transistor is short-circuited, the first standby line is connected to the test signal output line by the laser welding.
  • the display panel further includes: at least one second spare line, the second backup line includes a fourth segment, a fifth segment, and a sixth segment; the fifth segment is located at the Between the fourth segment and the sixth segment, the fifth segment is connected to the second input; in the case where the first thin film transistor is short-circuited, the fifth segment is used Connected to the test signal input line by the laser welding method, the fourth segment is used to disconnect a fifth connection with the fifth segment by the laser cutting mode, the sixth The segment is used to break the sixth connection with the fifth segment by the laser cutting mode.
  • a display device includes: a display panel; the display panel includes: a first thin film transistor array, the first thin film transistor array includes at least one first thin film transistor; a second thin film transistor array, the second The thin film transistor array includes at least one second thin film transistor; and at least one first backup line; wherein the first thin film transistor is adjacent to the second thin film transistor, the second thin film transistor is connected to a test signal input line
  • the first standby line is connected; in a case where the first thin film transistor is short-circuited, the first input end of the first thin film transistor is used to disconnect between the test signal input line by laser cutting a first output end of the first thin film transistor for disconnecting a second connection with the test signal output line by the laser cutting mode, the first spare line being used for laser welding
  • the test signal output lines are connected.
  • the display panel further includes: a control signal line array, the control signal line array includes at least one control signal line; a first control end of the first thin film transistor and the second thin film transistor The second control end is connected to the control signal line, and in the case that the first thin film transistor is short-circuited, the second control end is configured to receive a control signal through the control signal line.
  • the second control terminal is configured to turn on or off a switch corresponding to the second thin film transistor according to the control signal.
  • the second input terminal of the second thin film transistor is connected to the test signal input line, and the second output terminal of the second thin film transistor is connected to the first standby line.
  • the first spare line includes a first segment, a second segment, and a third segment; the second segment is located between the first segment and the third segment The second segment is connected to the second output end; in a case where the first thin film transistor is short-circuited, the second segment is used to pass the laser welding method and the test signal output line Connected, the first segment is for disconnecting a third connection with the second segment by the laser cutting mode, and the third segment is used for disconnecting and stopping by the laser cutting mode A fourth connection between the second segments.
  • the first backup line includes a first end and a second end, the first end is connected to the second output end, and the second end is disposed on the test signal output line opposite to The other side of the first end; in the case where the first thin film transistor is short-circuited, the first standby line is connected to the test signal output line by the laser welding.
  • the display panel further includes: at least one second spare line, the second backup line includes a fourth segment, a fifth segment, and a sixth segment; the fifth segment is located at the Between the fourth segment and the sixth segment, the fifth segment is connected to the second input; in the case where the first thin film transistor is short-circuited, the fifth segment is used Connected to the test signal input line by the laser welding method, the fourth segment is used to disconnect a fifth connection with the fifth segment by the laser cutting mode, the sixth The segment is used to break the sixth connection with the fifth segment by the laser cutting mode.
  • the first input terminal is a source/drain of the first thin film transistor
  • the first output terminal is a drain/source of the first thin film transistor
  • a test circuit repairing method for a display device comprising: A, disconnecting a first connection and a second connection by a laser cutting method, wherein the first connection is a first input end of a first thin film transistor of the display device a connection between the first output end of the first thin film transistor and the test signal output line; B, the first of the display devices by laser welding An alternate line is connected to the test signal output line, wherein a second input end of the second thin film transistor in the display device is connected to the test signal input line, and a second output end of the second thin film transistor is The first spare line is connected.
  • the step B includes: B1, connecting the second segment of the first spare line to the test signal output line by the laser welding method;
  • the method includes: C. disconnecting the third connection and the fourth connection by the laser cutting mode, wherein the third connection is a connection between the first segment and the second segment of the first backup line
  • the fourth connection is a connection between the third segment of the first backup line and the second segment; wherein the second output is connected to the second segment, the Two segments are located between the first segment and the third segment.
  • the method further includes: D, connecting the first standby line to the test signal output line by the laser welding method; wherein the first backup line includes a first end and a second end, the first end being connected to the second output, the second end being disposed on the other side of the test signal output line opposite the first end.
  • the method further includes: E, disconnecting the fifth connection and the sixth connection by the laser cutting mode, wherein the fifth connection is the second of the display device a connection between a fourth segment of the spare line and a fifth segment, the sixth connection being a connection between a sixth segment of the second spare line of the display device and the fifth segment; And connecting, by the laser welding method, the fifth segment to the test signal input line; wherein the fifth segment is located between the fourth segment and the sixth segment, A fifth segment is coupled to the second input.
  • the first input terminal is a source/drain of the first thin film transistor
  • the first output terminal is a drain/source of the first thin film transistor
  • the method further includes: G, the second control terminal of the second thin film transistor receives a control signal through a control signal line in the display device, according to the The control signal turns on or off the switch corresponding to the second thin film transistor.
  • the embodiment of the present invention can make the aspect ratio of the display device not change, so that the display abnormality does not occur during the lighting detection, the misjudgment does not occur, and the display panel can be reduced during the curing process.
  • the phenomenon of poor line that is, is beneficial to improve the yield of the display panel.
  • FIG. 1 is a schematic diagram of a technical solution for detecting a display panel in the prior art
  • FIG. 2 is a schematic diagram of a repairing scheme of the thin film transistor of FIG. 1 in the event of a short circuit
  • 3A is a schematic view of a first embodiment of a display device of the present invention.
  • FIG. 3B is a schematic view of the repairing manner in FIG. 3A;
  • FIG. 4A is a schematic view showing a second embodiment of the display device of the present invention.
  • FIG. 4B is a schematic view of the repairing manner in FIG. 4A;
  • 5A is a schematic view showing a third embodiment of the display device of the present invention.
  • FIG. 5B is a schematic diagram of the repairing manner in FIG. 5A.
  • FIG. 3A is a schematic view of a first embodiment of the display device of the present invention
  • FIG. 3B is a schematic view of the repairing manner of FIG. 3A. Dot in Figure 3B Corresponding to the position of the laser welding, and the intersection Corresponding to the position of the laser cut.
  • the display device of this embodiment includes a display panel 300, wherein the display panel 300 includes a first thin film transistor array, a second thin film transistor array, and at least one first spare line (Dummy Line) 306.
  • the first thin film transistor array includes at least one first thin film transistor 303
  • the second thin film transistor array includes at least one second thin film transistor 304.
  • the second thin film transistor 304 is a backup thin film transistor of the first thin film transistor 303 (Dummy Thin Film Transistor) is used to repair the display device/display panel 300 in the event that a short circuit occurs in the first thin film transistor 303.
  • the first thin film transistor 303 is adjacent to the second thin film transistor 304, and the second thin film transistor 304 is connected to the test signal input line 301 and the first backup line 306.
  • the first input end of the first thin film transistor 303 is used to disconnect the first connection with the test signal input line 301 by laser cutting.
  • the test signal output line 307 is connected.
  • the first input end is a source/drain of the first thin film transistor 303.
  • the first output end is a drain/source of the first thin film transistor 303.
  • the display panel 300 further includes a control signal line array, and the control signal line array includes at least one control signal line 302.
  • the first control terminal of the first thin film transistor 303 and the second control terminal of the second thin film transistor 304 are both connected to the control signal line 302.
  • the second control terminal is configured to receive a control signal through the control signal line 302 to turn on or off a switch corresponding to the second thin film transistor 304 according to the control signal.
  • the second input end of the second thin film transistor 304 is connected to the test signal input line 301, and the second output end of the second thin film transistor 304 is connected to the first backup line 306.
  • the first spare line 306 includes a first segment 3061, a second segment 3062, and a third segment 3063.
  • the second segment 3062 is located between the first segment 3061 and the third segment 3063, and the second segment 3062 is connected to the second output terminal.
  • the second segment 3062 is used to connect to the test signal output line 307 by the laser welding method, and the first segment 3061 is used to pass the The laser cutting mode disconnects a third connection with the second segment 3062, and the third segment 3063 is configured to be disconnected from the second segment 3062 by the laser cutting mode.
  • the display device is repaired by cutting off the problematic thin film transistor (for example, the first thin film transistor 303 where the short circuit occurs) and the test signal line 301 and the data line/gate line (corresponding to the test signal output).
  • the connection of the line 307) causes the test signal in the test signal line 301 to pass through the standby thin film transistor (the second thin film transistor 304) into the display area inside the display panel 300, and finally the first standby Line 306 is severed.
  • the path of the test signal conduction is as shown by the arrow in Figure 3B.
  • the manner in which the display device is repaired in this embodiment requires a total of four laser cuts and one laser weld.
  • FIG. 4A is a schematic view of a second embodiment of the display device of the present invention
  • FIG. 4B is a schematic view of the repairing manner of FIG. 4A.
  • This embodiment is similar to the first embodiment described above, except that:
  • the first backup line 306 includes a first end and a second end, the first end is connected to the second output end, and the second end is disposed on the test signal output line 307. Opposite the other side of the first end.
  • the first backup line 306 is connected to the test signal output line 307 by the laser welding method.
  • the manner in which the display device is repaired in this embodiment requires a total of two laser cuts and one laser weld.
  • FIG. 5A is a schematic view of a third embodiment of the display device of the present invention
  • FIG. 5B is a schematic view of the repairing manner of FIG. 5A.
  • This embodiment is similar to the first or second embodiment described above, except that:
  • the display panel 300 further includes at least one second backup line 305, and the second backup line 305 includes a fourth segment 3051, a fifth segment 3052, and a sixth segment 3053.
  • the fifth segment 3052 is located between the fourth segment 3051 and the sixth segment 3053, and the fifth segment 3052 is connected to the second input end.
  • the fifth segment 3052 is used to connect to the test signal input line 301 by the laser welding method, and the fourth segment 3051 is used to pass the The laser cutting mode disconnects a fifth connection with the fifth segment 3052, and the sixth segment 3053 is configured to be disconnected from the fifth segment 3052 by the laser cutting mode.
  • the manner in which the display device is repaired in this embodiment requires a total of six laser cuts and two laser welds.
  • the second thin film transistor 304 is identical to the first thin film transistor 303, that is, the second thin film transistor 304 and the first A thin film transistor 303 is identical or substantially similar in size, properties, and the like. Therefore, after the display device is repaired using the above technical solution, the impedance of the entire line of the display device does not change.
  • the aspect ratio of the display device can be prevented from being changed, so that the lighting detection is not performed.
  • the display abnormality occurs, the erroneous determination does not occur, and the occurrence of line defects during the curing of the display panel 300 is reduced, that is, the yield of the display panel 300 is improved.
  • FIGS. 3A and 3B are schematic views of a first embodiment of a repair method of a display device of the present invention. Dot in Figure 3B Corresponding to the position of the laser welding, and the intersection Corresponding to the position of the laser cut.
  • the test line repairing method of the display device of this embodiment includes:
  • the first backup line 306 in the display device is connected to the test signal output line 307 by laser welding, wherein the second input end of the second thin film transistor 304 in the display device and the test Signal input lines 301 are connected, and a second output terminal of the second thin film transistor 304 is connected to the first backup line 306.
  • the step B includes:
  • the second segment 3062 of the first backup line 306 is connected to the test signal output line 307 by the laser welding method.
  • the method further includes:
  • the fourth connection is a connection between the third segment 3063 of the first spare line 306 and the second segment 3062.
  • the second output is connected to the second segment 3062, and the second segment 3062 is located between the first segment 3061 and the third segment 3063.
  • the second input end of the second thin film transistor 304 is connected to the test signal input line 301, and the second output end of the second thin film transistor 304 passes through the second segment 3062 and the first spare line 306. Connected.
  • the first input end is a source/drain of the first thin film transistor 303.
  • the first output end is a drain/source of the first thin film transistor 303.
  • the second control end of the second thin film transistor 304 receives a control signal through the control signal line 302 in the display device, according to the The control signal turns on or off the switch corresponding to the second thin film transistor 304.
  • the second thin film transistor 304 is a standby thin film transistor as the first thin film transistor 303, and the second thin film transistor 304 is used in the case where the first thin film transistor 303 is short-circuited.
  • the display device/display panel 300 performs repair.
  • the display device is repaired by cutting off the problematic thin film transistor (for example, the first thin film transistor 303 where the short circuit occurs) and the test signal line 301 and the data line/gate line (corresponding to the test signal output).
  • the connection of the line 307) causes the test signal in the test signal line 301 to pass through the standby thin film transistor (the second thin film transistor 304) into the display area inside the display panel 300, and finally the first standby Line 306 is severed.
  • the path of the test signal conduction is as shown by the arrow in Figure 3B.
  • the manner in which the display device is repaired in this embodiment requires a total of four laser cuts and one laser weld.
  • the execution of the steps is not prioritized, that is, the steps may be performed in any order.
  • FIG. 4A and 4B are schematic diagrams showing a second embodiment of a repair method of a display device of the present invention. This embodiment is similar to the first embodiment described above, except that:
  • the method further includes:
  • the first backup line 306 is connected to the test signal output line 307 by the laser welding method.
  • the first backup line 306 includes a first end and a second end, the first end is connected to the second output end, and the second end is disposed on the test signal output line 307 opposite to the first The other side of one end.
  • the manner in which the display device is repaired in this embodiment requires a total of two laser cuts and one laser weld.
  • the execution of the steps is not prioritized, that is, the steps may be performed in any order.
  • FIG. 5A and 5B are schematic views of a third embodiment of a repair method of a display device of the present invention. This embodiment is similar to the first or second embodiment described above, except that:
  • the method further includes:
  • the sixth connection is a connection between the sixth segment 3053 of the second spare line 305 of the display device and the fifth segment 3052.
  • the fifth segment 3052 is connected to the test signal input line 301 by the laser welding method.
  • the fifth segment 3052 is located between the fourth segment 3051 and the sixth segment 3053, and the fifth segment 3052 is connected to the second input end.
  • the manner in which the display device is repaired in this embodiment requires a total of six laser cuts and two laser welds.
  • the execution of the steps is not prioritized, that is, the steps may be performed in any order.
  • the second thin film transistor 304 is identical to the first thin film transistor 303, that is, the second thin film transistor 304 and the first A thin film transistor 303 is identical or substantially similar in size, properties, and the like. Therefore, after the display device is repaired using the above technical solution, the impedance of the entire line of the display device does not change.
  • the aspect ratio of the display device can be prevented from being changed, so that the lighting detection is not performed.
  • the display abnormality occurs, the erroneous determination does not occur, and the occurrence of line defects during the curing of the display panel 300 is reduced, that is, the yield of the display panel 300 is improved.

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Abstract

A display device and a test line repair method therefor. The method comprises: respectively disconnecting a first input end and a first output end of a first thin-film transistor from a test signal input line (301) in a laser cutting manner; and connecting a first spare line (306) to a test signal output line (307) in a laser welding manner. The device and method therefor enable the width to length ratio of a display device not to be changed, so that no display exception will occur during lighting detection.

Description

显示装置及其测试线路修复方法 Display device and test circuit repair method thereof 技术领域Technical field
本发明涉及平板显示技术领域，特别涉及一种显示装置及其测试线路修复方法。The present invention relates to the field of flat panel display technologies, and in particular, to a display device and a test line repair method thereof.
背景技术Background technique
传统的显示面板检测技术一般为：Traditional display panel inspection techniques are generally:
如图1所示，使用一薄膜晶体管（TFT，Thin Film Transistor）100来作为开关。其中，该薄膜晶体管100的漏极（Drain）102与检测信号源连接，该薄膜晶体管100的源极（Source）103与显示面板内的栅极线（Gate Line）/数据线（Data Line）连接，而该薄膜晶体管100的栅极（Gate）101则与控制信号源连接。As shown in Figure 1, a thin film transistor (TFT, Thin Film) is used. Transistor) 100 comes as a switch. The drain 102 of the thin film transistor 100 is connected to a detection signal source, and the source 103 of the thin film transistor 100 and the gate line in the display panel (Gate) A line/data line is connected, and a gate 101 of the thin film transistor 100 is connected to a control signal source.
在检测/测试过程中，该控制信号源向该栅极101输出高电平信号（高电位信号），从而打开该开关100，即，使得该源极103和该漏极102导通。在检测/测试结束后，该控制信号源向该栅极101输出低电平信号（低电位信号），从而关闭该开关100，即，切断该测试信号源与该栅极线/数据线之间的连接。During the detection/testing process, the control signal source outputs a high level signal (high potential signal) to the gate 101, thereby turning on the switch 100, that is, causing the source 103 and the drain 102 to be turned on. After the detection/test is completed, the control signal source outputs a low level signal (low potential signal) to the gate 101, thereby turning off the switch 100, that is, cutting off between the test signal source and the gate line/data line. Connection.
在制程中，由于颗粒（Particle）的存在，上述薄膜晶体管100的源极103和漏极102之间可能发生短路，例如，如图2所示，在区域104处发生短路。对于上述技术方案，在发生短路的情况下，传统的修复方案为：In the process, a short circuit may occur between the source 103 and the drain 102 of the thin film transistor 100 due to the presence of particles. For example, as shown in FIG. 2, a short circuit occurs at the region 104. For the above technical solution, in the case of a short circuit, the conventional repair solution is:
使用激光在切断部105处切断。The laser beam is cut at the cutting portion 105.
在实践中，发明人发现现有技术至少存在以下问题：In practice, the inventors have found that the prior art has at least the following problems:
一、如果不对上述发生短路的线路（Circuit）进行修复，或者采用传统的方式来对上述发生短路的线路进行修复，则会使得该薄膜晶体管100的宽长比（W/L，Width/Length）发生改变，在对显示面板进行点灯检测时可能会由于线路阻抗的差异造成画面异常，或者会在出现线不良（Line Defect）的现象，从而导致误判，造成不必要的报废损失。1. If the circuit that is short-circuited is not repaired, or the circuit that is short-circuited is repaired in a conventional manner, the width-to-length ratio (W/L, Width/Length) of the thin film transistor 100 is made. A change occurs. When the display panel is turned on, the screen may be abnormal due to the difference in line impedance, or the line may be defective. Defect), which leads to misjudgment and unnecessary waste loss.
二、对诸如PSVA（Polymer Stabilized Vertical Alignment，聚合物稳定化垂直配向）模式的显示面板进行固化（Curing）的过程中，如果上述薄膜晶体管100的源极103和漏极102之间出现上述短路的情况，在不修复或者使用上述传统的方式进行修复时，可能会造成显示面板永久性的线不良。Second, for example such as PSVA (Polymer Stabilized Vertical In the process of curing of the Alignment, polymer stabilized vertical alignment mode display panel, if the above short circuit occurs between the source 103 and the drain 102 of the thin film transistor 100, the above conventionality is not repaired or used. When the repair is done in a way, it may cause a permanent line defect in the display panel.
故，有必要提出一种新的技术方案，以解决上述技术问题。Therefore, it is necessary to propose a new technical solution to solve the above technical problems.
技术问题technical problem
本发明的目的在于提供一种显示装置及其测试线路修复方法，其能使得显示装置的宽长比不会发生改变，从而不会在点灯检测时发生显示异常率。 It is an object of the present invention to provide a display device and a test line repairing method thereof that can make the aspect ratio of the display device not change, so that the display abnormality rate does not occur at the time of lighting detection.
技术解决方案Technical solution
一种显示装置，包括：一显示面板；其中，所述显示面板包括：一第一薄膜晶体管阵列，所述第一薄膜晶体管阵列包括至少一第一薄膜晶体管；一第二薄膜晶体管阵列，所述第二薄膜晶体管阵列包括至少一第二薄膜晶体管；以及至少一第一备用线；其中，所述第一薄膜晶体管与所述第二薄膜晶体管相邻，所述第二薄膜晶体管与测试信号输入线和所述第一备用线相连；在所述第一薄膜晶体管发生短路的情况下，所述第一薄膜晶体管的第一输入端用于通过激光切断方式断开与所述测试信号输入线之间的第一连接，所述第一薄膜晶体管的第一输出端用于通过所述激光切断方式断开与测试信号输出线之间的第二连接，所述第一备用线用于通过激光焊接方式与所述测试信号输出线相连；所述显示面板还包括：一控制信号线阵列，所述控制信号线阵列包括至少一控制信号线；所述第一薄膜晶体管的第一控制端和所述第二薄膜晶体管的第二控制端均与所述控制信号线连接，在所述第一薄膜晶体管发生短路的情况下，所述第二控制端用于通过所述控制信号线接收控制信号；所述第一输入端为所述第一薄膜晶体管的源极/漏极，所述第一输出端为所述第一薄膜晶体管的漏极/源极。A display device includes: a display panel; wherein the display panel includes: a first thin film transistor array, the first thin film transistor array includes at least one first thin film transistor; and a second thin film transistor array, The second thin film transistor array includes at least one second thin film transistor; and at least one first backup line; wherein the first thin film transistor is adjacent to the second thin film transistor, the second thin film transistor and the test signal input line Connected to the first backup line; in a case where the first thin film transistor is short-circuited, the first input end of the first thin film transistor is used to be disconnected from the test signal input line by laser cutting a first connection, the first output end of the first thin film transistor is configured to be disconnected from the test signal output line by the laser cutting mode, the first backup line being used for laser welding Connected to the test signal output line; the display panel further includes: a control signal line array, the control signal line array including at least a control signal line; a first control end of the first thin film transistor and a second control end of the second thin film transistor are both connected to the control signal line, and in a case where the first thin film transistor is short-circuited, The second control terminal is configured to receive a control signal through the control signal line; the first input end is a source/drain of the first thin film transistor, and the first output end is the first thin film transistor Drain/source.
在上述显示装置中，所述第二控制端用于根据所述控制信号打开或关闭第二薄膜晶体管所对应的开关。In the above display device, the second control terminal is configured to turn on or off a switch corresponding to the second thin film transistor according to the control signal.
在上述显示装置中，所述第二薄膜晶体管的第二输入端与所述测试信号输入线相连，所述第二薄膜晶体管的第二输出端与所述第一备用线相连。In the above display device, the second input terminal of the second thin film transistor is connected to the test signal input line, and the second output terminal of the second thin film transistor is connected to the first standby line.
在上述显示装置中，所述第一备用线包括第一分段、第二分段和第三分段；所述第二分段位于所述第一分段和所述第三分段之间，所述第二分段与所述第二输出端相连；在所述第一薄膜晶体管发生短路的情况下，所述第二分段用于通过所述激光焊接方式与所述测试信号输出线相连，所述第一分段用于通过所述激光切断方式断开与所述第二分段之间的第三连接，所述第三分段用于通过所述激光切断方式断开与所述第二分段之间的第四连接。In the above display device, the first spare line includes a first segment, a second segment, and a third segment; the second segment is located between the first segment and the third segment The second segment is connected to the second output end; in a case where the first thin film transistor is short-circuited, the second segment is used to pass the laser welding method and the test signal output line Connected, the first segment is for disconnecting a third connection with the second segment by the laser cutting mode, and the third segment is used for disconnecting and stopping by the laser cutting mode A fourth connection between the second segments.
在上述显示装置中，所述第一备用线包括第一末端和第二末端，所述第一末端与所述第二输出端相连，所述第二末端设置于所述测试信号输出线相对所述第一末端的另一侧；在所述第一薄膜晶体管发生短路的情况下，所述第一备用线通过所述激光焊接方式与所述测试信号输出线相连。In the above display device, the first backup line includes a first end and a second end, the first end is connected to the second output end, and the second end is disposed on the test signal output line opposite to The other side of the first end; in the case where the first thin film transistor is short-circuited, the first standby line is connected to the test signal output line by the laser welding.
在上述显示装置中，所述显示面板还包括：至少一第二备用线，所述第二备用线包括第四分段、第五分段和第六分段；所述第五分段位于所述第四分段和所述第六分段之间，所述第五分段与所述第二输入端相连；在所述第一薄膜晶体管发生短路的情况下，所述第五分段用于通过所述激光焊接方式与所述测试信号输入线相连，所述第四分段用于通过所述激光切断方式断开与所述第五分段之间的第五连接，所述第六分段用于通过所述激光切断方式断开与所述第五分段之间的第六连接。In the above display device, the display panel further includes: at least one second spare line, the second backup line includes a fourth segment, a fifth segment, and a sixth segment; the fifth segment is located at the Between the fourth segment and the sixth segment, the fifth segment is connected to the second input; in the case where the first thin film transistor is short-circuited, the fifth segment is used Connected to the test signal input line by the laser welding method, the fourth segment is used to disconnect a fifth connection with the fifth segment by the laser cutting mode, the sixth The segment is used to break the sixth connection with the fifth segment by the laser cutting mode.
一种显示装置，包括：一显示面板；所述显示面板包括：一第一薄膜晶体管阵列，所述第一薄膜晶体管阵列包括至少一第一薄膜晶体管；一第二薄膜晶体管阵列，所述第二薄膜晶体管阵列包括至少一第二薄膜晶体管；以及至少一第一备用线；其中，所述第一薄膜晶体管与所述第二薄膜晶体管相邻，所述第二薄膜晶体管与测试信号输入线和所述第一备用线相连；在所述第一薄膜晶体管发生短路的情况下，所述第一薄膜晶体管的第一输入端用于通过激光切断方式断开与所述测试信号输入线之间的第一连接，所述第一薄膜晶体管的第一输出端用于通过所述激光切断方式断开与测试信号输出线之间的第二连接，所述第一备用线用于通过激光焊接方式与所述测试信号输出线相连。A display device includes: a display panel; the display panel includes: a first thin film transistor array, the first thin film transistor array includes at least one first thin film transistor; a second thin film transistor array, the second The thin film transistor array includes at least one second thin film transistor; and at least one first backup line; wherein the first thin film transistor is adjacent to the second thin film transistor, the second thin film transistor is connected to a test signal input line The first standby line is connected; in a case where the first thin film transistor is short-circuited, the first input end of the first thin film transistor is used to disconnect between the test signal input line by laser cutting a first output end of the first thin film transistor for disconnecting a second connection with the test signal output line by the laser cutting mode, the first spare line being used for laser welding The test signal output lines are connected.
在上述显示装置中，所述显示面板还包括：一控制信号线阵列，所述控制信号线阵列包括至少一控制信号线；所述第一薄膜晶体管的第一控制端和所述第二薄膜晶体管的第二控制端均与所述控制信号线连接，在所述第一薄膜晶体管发生短路的情况下，所述第二控制端用于通过所述控制信号线接收控制信号。In the above display device, the display panel further includes: a control signal line array, the control signal line array includes at least one control signal line; a first control end of the first thin film transistor and the second thin film transistor The second control end is connected to the control signal line, and in the case that the first thin film transistor is short-circuited, the second control end is configured to receive a control signal through the control signal line.
在上述显示装置中，所述第二控制端用于根据所述控制信号打开或关闭第二薄膜晶体管所对应的开关。In the above display device, the second control terminal is configured to turn on or off a switch corresponding to the second thin film transistor according to the control signal.
在上述显示装置中，所述第二薄膜晶体管的第二输入端与所述测试信号输入线相连，所述第二薄膜晶体管的第二输出端与所述第一备用线相连。 In the above display device, the second input terminal of the second thin film transistor is connected to the test signal input line, and the second output terminal of the second thin film transistor is connected to the first standby line.
在上述显示装置中，所述第一备用线包括第一分段、第二分段和第三分段；所述第二分段位于所述第一分段和所述第三分段之间，所述第二分段与所述第二输出端相连；在所述第一薄膜晶体管发生短路的情况下，所述第二分段用于通过所述激光焊接方式与所述测试信号输出线相连，所述第一分段用于通过所述激光切断方式断开与所述第二分段之间的第三连接，所述第三分段用于通过所述激光切断方式断开与所述第二分段之间的第四连接。In the above display device, the first spare line includes a first segment, a second segment, and a third segment; the second segment is located between the first segment and the third segment The second segment is connected to the second output end; in a case where the first thin film transistor is short-circuited, the second segment is used to pass the laser welding method and the test signal output line Connected, the first segment is for disconnecting a third connection with the second segment by the laser cutting mode, and the third segment is used for disconnecting and stopping by the laser cutting mode A fourth connection between the second segments.
在上述显示装置中，所述第一备用线包括第一末端和第二末端，所述第一末端与所述第二输出端相连，所述第二末端设置于所述测试信号输出线相对所述第一末端的另一侧；在所述第一薄膜晶体管发生短路的情况下，所述第一备用线通过所述激光焊接方式与所述测试信号输出线相连。 In the above display device, the first backup line includes a first end and a second end, the first end is connected to the second output end, and the second end is disposed on the test signal output line opposite to The other side of the first end; in the case where the first thin film transistor is short-circuited, the first standby line is connected to the test signal output line by the laser welding.
在上述显示装置中，所述显示面板还包括：至少一第二备用线，所述第二备用线包括第四分段、第五分段和第六分段；所述第五分段位于所述第四分段和所述第六分段之间，所述第五分段与所述第二输入端相连；在所述第一薄膜晶体管发生短路的情况下，所述第五分段用于通过所述激光焊接方式与所述测试信号输入线相连，所述第四分段用于通过所述激光切断方式断开与所述第五分段之间的第五连接，所述第六分段用于通过所述激光切断方式断开与所述第五分段之间的第六连接。 In the above display device, the display panel further includes: at least one second spare line, the second backup line includes a fourth segment, a fifth segment, and a sixth segment; the fifth segment is located at the Between the fourth segment and the sixth segment, the fifth segment is connected to the second input; in the case where the first thin film transistor is short-circuited, the fifth segment is used Connected to the test signal input line by the laser welding method, the fourth segment is used to disconnect a fifth connection with the fifth segment by the laser cutting mode, the sixth The segment is used to break the sixth connection with the fifth segment by the laser cutting mode.
在上述显示装置中，所述第一输入端为所述第一薄膜晶体管的源极/漏极，所述第一输出端为所述第一薄膜晶体管的漏极/源极。 In the above display device, the first input terminal is a source/drain of the first thin film transistor, and the first output terminal is a drain/source of the first thin film transistor.
一种显示装置的测试线路修复方法，包括：A、通过激光切断方式断开第一连接和第二连接，其中，所述第一连接为所述显示装置的第一薄膜晶体管的第一输入端与测试信号输入线之间的连接，所述第二连接为所述第一薄膜晶体管的第一输出端与测试信号输出线之间连接；B、通过激光焊接方式将所述显示装置中的第一备用线与所述测试信号输出线相连，其中，所述显示装置中的第二薄膜晶体管的第二输入端与所述测试信号输入线相连，所述第二薄膜晶体管的第二输出端与所述第一备用线相连。 A test circuit repairing method for a display device, comprising: A, disconnecting a first connection and a second connection by a laser cutting method, wherein the first connection is a first input end of a first thin film transistor of the display device a connection between the first output end of the first thin film transistor and the test signal output line; B, the first of the display devices by laser welding An alternate line is connected to the test signal output line, wherein a second input end of the second thin film transistor in the display device is connected to the test signal input line, and a second output end of the second thin film transistor is The first spare line is connected.
在上述显示装置的测试线路修复方法中，所述步骤B包括：B1、通过所述激光焊接方式将所述第一备用线的第二分段与所述测试信号输出线相连；所述方法还包括：C、通过所述激光切断方式断开第三连接和第四连接，其中，所述第三连接为所述第一备用线的第一分段和所述第二分段之间的连接，所述第四连接为所述第一备用线的第三分段和所述第二分段之间的连接；其中，所述第二输出端与所述第二分段相连，所述第二分段位于所述第一分段和所述第三分段之间。 In the test circuit repairing method of the above display device, the step B includes: B1, connecting the second segment of the first spare line to the test signal output line by the laser welding method; The method includes: C. disconnecting the third connection and the fourth connection by the laser cutting mode, wherein the third connection is a connection between the first segment and the second segment of the first backup line The fourth connection is a connection between the third segment of the first backup line and the second segment; wherein the second output is connected to the second segment, the Two segments are located between the first segment and the third segment.
在上述显示装置的测试线路修复方法中，所述方法还包括：D、通过所述激光焊接方式将所述第一备用线与所述测试信号输出线相连；其中，所述第一备用线包括第一末端和第二末端，所述第一末端与所述第二输出端相连，所述第二末端设置于所述测试信号输出线相对所述第一末端的另一侧。 In the test circuit repairing method of the above display device, the method further includes: D, connecting the first standby line to the test signal output line by the laser welding method; wherein the first backup line includes a first end and a second end, the first end being connected to the second output, the second end being disposed on the other side of the test signal output line opposite the first end.
在上述显示装置的测试线路修复方法中，所述方法还包括：E、通过所述激光切断方式断开第五连接和第六连接，其中，所述第五连接为所述显示装置的第二备用线的第四分段与第五分段之间的连接，所述第六连接为所述显示装置的第二备用线的第六分段与所述第五分段之间的连接；F、通过所述激光焊接方式将所述第五分段与所述测试信号输入线相连；其中，所述第五分段位于所述第四分段和所述第六分段之间，所述第五分段与所述第二输入端相连。 In the test line repairing method of the above display device, the method further includes: E, disconnecting the fifth connection and the sixth connection by the laser cutting mode, wherein the fifth connection is the second of the display device a connection between a fourth segment of the spare line and a fifth segment, the sixth connection being a connection between a sixth segment of the second spare line of the display device and the fifth segment; And connecting, by the laser welding method, the fifth segment to the test signal input line; wherein the fifth segment is located between the fourth segment and the sixth segment, A fifth segment is coupled to the second input.
在上述显示装置的测试线路修复方法中，所述第一输入端为所述第一薄膜晶体管的源极/漏极，所述第一输出端为所述第一薄膜晶体管的漏极/源极。 In the test circuit repair method of the above display device, the first input terminal is a source/drain of the first thin film transistor, and the first output terminal is a drain/source of the first thin film transistor .
在上述显示装置的测试线路修复方法中，所述方法还包括：G、所述第二薄膜晶体管的所述第二控制端通过所述显示装置中的控制信号线接收控制信号，以根据所述控制信号打开或关闭第二薄膜晶体管所对应的开关。 In the test circuit repair method of the above display device, the method further includes: G, the second control terminal of the second thin film transistor receives a control signal through a control signal line in the display device, according to the The control signal turns on or off the switch corresponding to the second thin film transistor.
有益效果 Beneficial effect
相对现有技术，本发明实施例能够使得显示装置的宽长比不会发生改变，从而不会在点灯检测时发生显示异常，不会发生误判，同时能够减少在显示面板固化的过程中出现线不良的现象，即，有利于提高显示面板的良率。Compared with the prior art, the embodiment of the present invention can make the aspect ratio of the display device not change, so that the display abnormality does not occur during the lighting detection, the misjudgment does not occur, and the display panel can be reduced during the curing process. The phenomenon of poor line, that is, is beneficial to improve the yield of the display panel.
附图说明DRAWINGS
图1为现有技术中对显示面板进行检测的技术方案的示意图；1 is a schematic diagram of a technical solution for detecting a display panel in the prior art;
图2为图1中的薄膜晶体管在发生短路时的修复方案的示意图；2 is a schematic diagram of a repairing scheme of the thin film transistor of FIG. 1 in the event of a short circuit;
图3A为本发明的显示装置的第一实施例的示意图；3A is a schematic view of a first embodiment of a display device of the present invention;
图3B为图3A中修复方式的示意图；3B is a schematic view of the repairing manner in FIG. 3A;
图4A为本发明的显示装置的第二实施例的示意图；4A is a schematic view showing a second embodiment of the display device of the present invention;
图4B为图4A中修复方式的示意图；4B is a schematic view of the repairing manner in FIG. 4A;
图5A为本发明的显示装置的第三实施例的示意图；5A is a schematic view showing a third embodiment of the display device of the present invention;
图5B为图5A中修复方式的示意图。FIG. 5B is a schematic diagram of the repairing manner in FIG. 5A.
本发明的最佳实施方式BEST MODE FOR CARRYING OUT THE INVENTION
以下各实施例的说明是参考附加的图式，用以例示本发明可用以实施的特定实施例。本发明所提到的方向用语，例如“上”、“下”、“前”、“后”、“左”、“右”、“内”、“外”、“侧面”等，仅是参考附加图式的方向。因此，使用的方向用语是用以说明及理解本发明，而非用以限制本发明。The following description of the various embodiments is provided to illustrate the specific embodiments of the invention. Directional terms mentioned in the present invention, such as "upper", "lower", "front", "back", "left", "right", "inside", "outside", "side", etc., are merely references. Attach the direction of the drawing. Therefore, the directional terminology used is for the purpose of illustration and understanding of the invention.
在图中，结构相似的单元是以相同标号表示。In the figures, structurally similar elements are denoted by the same reference numerals.
参考图3A和图3B，图3A为本发明的显示装置的第一实施例的示意图，图3B为图3A中修复方式的示意图。图3B中圆点
Figure PCTCN2013090821-appb-I000002
对应的是激光焊接的位置，而交叉
Figure PCTCN2013090821-appb-I000003
对应的是激光切断的位置。3A and 3B, FIG. 3A is a schematic view of a first embodiment of the display device of the present invention, and FIG. 3B is a schematic view of the repairing manner of FIG. 3A. Dot in Figure 3B
Figure PCTCN2013090821-appb-I000002
Corresponding to the position of the laser welding, and the intersection
Figure PCTCN2013090821-appb-I000003
Corresponding to the position of the laser cut.
本实施例的显示装置包括显示面板300，其中，所述显示面板300包括第一薄膜晶体管阵列、第二薄膜晶体管阵列以及至少一第一备用线（Dummy Line）306。所述第一薄膜晶体管阵列包括至少一第一薄膜晶体管303，所述第二薄膜晶体管阵列包括至少一第二薄膜晶体管304。所述第二薄膜晶体管304是所述第一薄膜晶体管303的备用薄膜晶体管（Dummy Thin Film Transistor），所述第二薄膜晶体管304用于在所述第一薄膜晶体管303出现短路的情况下对显示装置/显示面板300进行修复。The display device of this embodiment includes a display panel 300, wherein the display panel 300 includes a first thin film transistor array, a second thin film transistor array, and at least one first spare line (Dummy Line) 306. The first thin film transistor array includes at least one first thin film transistor 303, and the second thin film transistor array includes at least one second thin film transistor 304. The second thin film transistor 304 is a backup thin film transistor of the first thin film transistor 303 (Dummy Thin Film Transistor) is used to repair the display device/display panel 300 in the event that a short circuit occurs in the first thin film transistor 303.
其中，所述第一薄膜晶体管303与所述第二薄膜晶体管304相邻，所述第二薄膜晶体管304与测试信号输入线301和所述第一备用线306相连。The first thin film transistor 303 is adjacent to the second thin film transistor 304, and the second thin film transistor 304 is connected to the test signal input line 301 and the first backup line 306.
在所述第一薄膜晶体管303发生短路的情况下，所述第一薄膜晶体管303的第一输入端用于通过激光切断方式断开与所述测试信号输入线301之间的第一连接，所述第一薄膜晶体管303的第一输出端用于通过所述激光切断方式断开与测试信号输出线307之间的第二连接，所述第一备用线306用于通过激光焊接方式与所述测试信号输出线307相连。其中，所述第一输入端为所述第一薄膜晶体管303的源极/漏极，相对应地，所述第一输出端为所述第一薄膜晶体管303的漏极/源极。In a case where the first thin film transistor 303 is short-circuited, the first input end of the first thin film transistor 303 is used to disconnect the first connection with the test signal input line 301 by laser cutting. a first output end of the first thin film transistor 303 for disconnecting a second connection with the test signal output line 307 by the laser cutting mode, the first backup line 306 being used for laser welding The test signal output line 307 is connected. The first input end is a source/drain of the first thin film transistor 303. Correspondingly, the first output end is a drain/source of the first thin film transistor 303.
所述显示面板300还包括控制信号线阵列，所述控制信号线阵列包括至少一控制信号线302。The display panel 300 further includes a control signal line array, and the control signal line array includes at least one control signal line 302.
所述第一薄膜晶体管303的第一控制端和所述第二薄膜晶体管304的第二控制端均与所述控制信号线302连接，在所述第一薄膜晶体管303发生短路的情况下，所述第二控制端用于通过所述控制信号线302接收控制信号，以根据所述控制信号打开或关闭第二薄膜晶体管304所对应的开关。所述第二薄膜晶体管304的第二输入端与所述测试信号输入线301相连，所述第二薄膜晶体管304的第二输出端与所述第一备用线306相连。The first control terminal of the first thin film transistor 303 and the second control terminal of the second thin film transistor 304 are both connected to the control signal line 302. In the case where the first thin film transistor 303 is short-circuited, The second control terminal is configured to receive a control signal through the control signal line 302 to turn on or off a switch corresponding to the second thin film transistor 304 according to the control signal. The second input end of the second thin film transistor 304 is connected to the test signal input line 301, and the second output end of the second thin film transistor 304 is connected to the first backup line 306.
在本实施例中，所述第一备用线306包括第一分段3061、第二分段3062和第三分段3063。其中，所述第二分段3062位于所述第一分段3061和所述第三分段3063之间，所述第二分段3062与所述第二输出端相连。In the present embodiment, the first spare line 306 includes a first segment 3061, a second segment 3062, and a third segment 3063. The second segment 3062 is located between the first segment 3061 and the third segment 3063, and the second segment 3062 is connected to the second output terminal.
在所述第一薄膜晶体管303发生短路的情况下，所述第二分段3062用于通过所述激光焊接方式与所述测试信号输出线307相连，所述第一分段3061用于通过所述激光切断方式断开与所述第二分段3062之间的第三连接，所述第三分段3063用于通过所述激光切断方式断开与所述第二分段3062之间的第四连接。In the case where the first thin film transistor 303 is short-circuited, the second segment 3062 is used to connect to the test signal output line 307 by the laser welding method, and the first segment 3061 is used to pass the The laser cutting mode disconnects a third connection with the second segment 3062, and the third segment 3063 is configured to be disconnected from the second segment 3062 by the laser cutting mode. Four connections.
在本实施例中，对显示装置进行修复的方式是：切断出现问题的薄膜晶体管（例如，发生短路的第一薄膜晶体管303）与测试信号线301以及数据线/栅极线（对应测试信号输出线307）的连接（第一连接和第二连接），让测试信号线301中的测试信号经过备用的薄膜晶体管（第二薄膜晶体管304）进入显示面板300内部的显示区，最后将第一备用线306切断。经过修复后，测试信号导通的路径如图3B中箭头所示。In this embodiment, the display device is repaired by cutting off the problematic thin film transistor (for example, the first thin film transistor 303 where the short circuit occurs) and the test signal line 301 and the data line/gate line (corresponding to the test signal output). The connection of the line 307) (the first connection and the second connection) causes the test signal in the test signal line 301 to pass through the standby thin film transistor (the second thin film transistor 304) into the display area inside the display panel 300, and finally the first standby Line 306 is severed. After repair, the path of the test signal conduction is as shown by the arrow in Figure 3B.
本实施例对显示装置进行修复的方式总共需要进行四次激光切断和一次激光焊接。The manner in which the display device is repaired in this embodiment requires a total of four laser cuts and one laser weld.
参考图4A和图4B，图4A为本发明的显示装置的第二实施例的示意图，图4B为图4A中修复方式的示意图。本实施例与上述第一实施例相似，不同之处在于：4A and 4B, FIG. 4A is a schematic view of a second embodiment of the display device of the present invention, and FIG. 4B is a schematic view of the repairing manner of FIG. 4A. This embodiment is similar to the first embodiment described above, except that:
在本实施例中，所述第一备用线306包括第一末端和第二末端，所述第一末端与所述第二输出端相连，所述第二末端设置于所述测试信号输出线307相对所述第一末端的另一侧。In this embodiment, the first backup line 306 includes a first end and a second end, the first end is connected to the second output end, and the second end is disposed on the test signal output line 307. Opposite the other side of the first end.
在所述第一薄膜晶体管303发生短路的情况下，所述第一备用线306通过所述激光焊接方式与所述测试信号输出线307相连。In the case where the first thin film transistor 303 is short-circuited, the first backup line 306 is connected to the test signal output line 307 by the laser welding method.
本实施例对显示装置进行修复的方式总共需要进行两次激光切断和一次激光焊接。The manner in which the display device is repaired in this embodiment requires a total of two laser cuts and one laser weld.
参考图5A和图5B，图5A为本发明的显示装置的第三实施例的示意图，图5B为图5A中修复方式的示意图。本实施例与上述第一或第二实施例相似，不同之处在于：5A and 5B, FIG. 5A is a schematic view of a third embodiment of the display device of the present invention, and FIG. 5B is a schematic view of the repairing manner of FIG. 5A. This embodiment is similar to the first or second embodiment described above, except that:
在本实施例中，所述显示面板300还包括至少一第二备用线305，所述第二备用线305包括第四分段3051、第五分段3052和第六分段3053。其中，所述第五分段3052位于所述第四分段3051和所述第六分段3053之间，所述第五分段3052与所述第二输入端相连。In the embodiment, the display panel 300 further includes at least one second backup line 305, and the second backup line 305 includes a fourth segment 3051, a fifth segment 3052, and a sixth segment 3053. The fifth segment 3052 is located between the fourth segment 3051 and the sixth segment 3053, and the fifth segment 3052 is connected to the second input end.
在所述第一薄膜晶体管303发生短路的情况下，所述第五分段3052用于通过所述激光焊接方式与所述测试信号输入线301相连，所述第四分段3051用于通过所述激光切断方式断开与所述第五分段3052之间的第五连接，所述第六分段3053用于通过所述激光切断方式断开与所述第五分段3052之间的第六连接。In the case where the first thin film transistor 303 is short-circuited, the fifth segment 3052 is used to connect to the test signal input line 301 by the laser welding method, and the fourth segment 3051 is used to pass the The laser cutting mode disconnects a fifth connection with the fifth segment 3052, and the sixth segment 3053 is configured to be disconnected from the fifth segment 3052 by the laser cutting mode. Six connections.
本实施例对显示装置进行修复的方式总共需要进行六次激光切断和两次激光焊接。The manner in which the display device is repaired in this embodiment requires a total of six laser cuts and two laser welds.
在上述第一至第三实施例中的任意一个实施例中，优选地，所述第二薄膜晶体管304与所述第一薄膜晶体管303完全相同，即所述第二薄膜晶体管304与所述第一薄膜晶体管303在尺寸、属性等方面均相同或大致相似。因此，在使用上述技术方案对显示装置进行修复后，显示装置的整个线路的阻抗不会发生变化。In any one of the foregoing first to third embodiments, preferably, the second thin film transistor 304 is identical to the first thin film transistor 303, that is, the second thin film transistor 304 and the first A thin film transistor 303 is identical or substantially similar in size, properties, and the like. Therefore, after the display device is repaired using the above technical solution, the impedance of the entire line of the display device does not change.
在上述任意一个实施例中，由于使用所述第二薄膜晶体管304（备用的薄膜晶体管）来对显示装置进行修复，因此能够使得显示装置的宽长比不会发生改变，从而不会在点灯检测时发生显示异常，不会发生误判，同时减少了在显示面板300固化的过程中出现线不良的现象，即，有利于提高显示面板300的良率。In any of the above embodiments, since the display device is repaired by using the second thin film transistor 304 (the standby thin film transistor), the aspect ratio of the display device can be prevented from being changed, so that the lighting detection is not performed. When the display abnormality occurs, the erroneous determination does not occur, and the occurrence of line defects during the curing of the display panel 300 is reduced, that is, the yield of the display panel 300 is improved.
参考图3A和图3B，图3A和图3B为本发明的显示装置的修复方法的第一实施例的示意图。图3B中圆点
Figure PCTCN2013090821-appb-I000002
对应的是激光焊接的位置，而交叉
Figure PCTCN2013090821-appb-I000003
对应的是激光切断的位置。本实施例的显示装置的测试线路修复方法包括：3A and 3B, FIGS. 3A and 3B are schematic views of a first embodiment of a repair method of a display device of the present invention. Dot in Figure 3B
Figure PCTCN2013090821-appb-I000002
Corresponding to the position of the laser welding, and the intersection
Figure PCTCN2013090821-appb-I000003
Corresponding to the position of the laser cut. The test line repairing method of the display device of this embodiment includes:
A、通过激光切断方式断开第一连接和第二连接，其中，所述第一连接为所述显示装置的第一薄膜晶体管303的第一输入端与测试信号输入线301之间的连接，所述第二连接为所述第一薄膜晶体管303的第一输出端与测试信号输出线307之间连接。A. disconnecting the first connection and the second connection by a laser cutting method, wherein the first connection is a connection between the first input end of the first thin film transistor 303 of the display device and the test signal input line 301, The second connection is connected between the first output end of the first thin film transistor 303 and the test signal output line 307.
B、通过激光焊接方式将所述显示装置中的第一备用线306与所述测试信号输出线307相连，其中，所述显示装置中的第二薄膜晶体管304的第二输入端与所述测试信号输入线301相连，所述第二薄膜晶体管304的第二输出端与所述第一备用线306相连。B. The first backup line 306 in the display device is connected to the test signal output line 307 by laser welding, wherein the second input end of the second thin film transistor 304 in the display device and the test Signal input lines 301 are connected, and a second output terminal of the second thin film transistor 304 is connected to the first backup line 306.
在本实施例中，所述步骤B包括：In this embodiment, the step B includes:
B1、通过所述激光焊接方式将所述第一备用线306的第二分段3062与所述测试信号输出线307相连。 B1. The second segment 3062 of the first backup line 306 is connected to the test signal output line 307 by the laser welding method.
在本实施例中，所述方法还包括：In this embodiment, the method further includes:
C、通过所述激光切断方式断开第三连接和第四连接，其中，所述第三连接为所述第一备用线306的第一分段3061和所述第二分段3062之间的连接，所述第四连接为所述第一备用线306的第三分段3063和所述第二分段3062之间的连接。C. Disconnecting the third connection and the fourth connection by the laser cutting mode, wherein the third connection is between the first segment 3061 and the second segment 3062 of the first backup line 306 Connected, the fourth connection is a connection between the third segment 3063 of the first spare line 306 and the second segment 3062.
其中，所述第二输出端与所述第二分段3062相连，所述第二分段3062位于所述第一分段3061和所述第三分段3063之间。所述第二薄膜晶体管304的第二输入端与所述测试信号输入线301相连，所述第二薄膜晶体管304的第二输出端通过所述第二分段3062与所述第一备用线306相连。所述第一输入端为所述第一薄膜晶体管303的源极/漏极，相对应地，所述第一输出端为所述第一薄膜晶体管303的漏极/源极。The second output is connected to the second segment 3062, and the second segment 3062 is located between the first segment 3061 and the third segment 3063. The second input end of the second thin film transistor 304 is connected to the test signal input line 301, and the second output end of the second thin film transistor 304 passes through the second segment 3062 and the first spare line 306. Connected. The first input end is a source/drain of the first thin film transistor 303. Correspondingly, the first output end is a drain/source of the first thin film transistor 303.
在本实施例中，在所述第一薄膜晶体管303发生短路的情况下，所述第二薄膜晶体管304的第二控制端通过所述显示装置中的控制信号线302接收控制信号，以根据所述控制信号打开或关闭第二薄膜晶体管304所对应的开关。In this embodiment, in a case where the first thin film transistor 303 is short-circuited, the second control end of the second thin film transistor 304 receives a control signal through the control signal line 302 in the display device, according to the The control signal turns on or off the switch corresponding to the second thin film transistor 304.
在本实施例中，所述第二薄膜晶体管304是作为所述第一薄膜晶体管303的备用薄膜晶体管，所述第二薄膜晶体管304用于在所述第一薄膜晶体管303出现短路的情况下对显示装置/显示面板300进行修复。In this embodiment, the second thin film transistor 304 is a standby thin film transistor as the first thin film transistor 303, and the second thin film transistor 304 is used in the case where the first thin film transistor 303 is short-circuited. The display device/display panel 300 performs repair.
在本实施例中，对显示装置进行修复的方式是：切断出现问题的薄膜晶体管（例如，发生短路的第一薄膜晶体管303）与测试信号线301以及数据线/栅极线（对应测试信号输出线307）的连接（第一连接和第二连接），让测试信号线301中的测试信号经过备用的薄膜晶体管（第二薄膜晶体管304）进入显示面板300内部的显示区，最后将第一备用线306切断。经过修复后，测试信号导通的路径如图3B中箭头所示。In this embodiment, the display device is repaired by cutting off the problematic thin film transistor (for example, the first thin film transistor 303 where the short circuit occurs) and the test signal line 301 and the data line/gate line (corresponding to the test signal output). The connection of the line 307) (the first connection and the second connection) causes the test signal in the test signal line 301 to pass through the standby thin film transistor (the second thin film transistor 304) into the display area inside the display panel 300, and finally the first standby Line 306 is severed. After repair, the path of the test signal conduction is as shown by the arrow in Figure 3B.
本实施例对显示装置进行修复的方式总共需要进行四次激光切断和一次激光焊接。The manner in which the display device is repaired in this embodiment requires a total of four laser cuts and one laser weld.
在本实施例中，各步骤的执行不区分先后次序，即，各步骤可以按照任意次序来执行。In the present embodiment, the execution of the steps is not prioritized, that is, the steps may be performed in any order.
参考图4A和图4B，图4A和图4B为本发明的显示装置的修复方法的第二实施例的示意图。本实施例与上述第一实施例相似，不同之处在于：4A and 4B, FIG. 4A and FIG. 4B are schematic diagrams showing a second embodiment of a repair method of a display device of the present invention. This embodiment is similar to the first embodiment described above, except that:
在本实施例中，所述方法还包括：In this embodiment, the method further includes:
D、通过所述激光焊接方式将所述第一备用线306与所述测试信号输出线307相连。D. The first backup line 306 is connected to the test signal output line 307 by the laser welding method.
其中，所述第一备用线306包括第一末端和第二末端，所述第一末端与所述第二输出端相连，所述第二末端设置于所述测试信号输出线307相对所述第一末端的另一侧。The first backup line 306 includes a first end and a second end, the first end is connected to the second output end, and the second end is disposed on the test signal output line 307 opposite to the first The other side of one end.
本实施例对显示装置进行修复的方式总共需要进行两次激光切断和一次激光焊接。The manner in which the display device is repaired in this embodiment requires a total of two laser cuts and one laser weld.
在本实施例中，各步骤的执行不区分先后次序，即，各步骤可以按照任意次序来执行。In the present embodiment, the execution of the steps is not prioritized, that is, the steps may be performed in any order.
参考图5A和图5B，图5A和图5B为本发明的显示装置的修复方法的第三实施例的示意图。本实施例与上述第一或第二实施例相似，不同之处在于：5A and 5B, FIG. 5A and FIG. 5B are schematic views of a third embodiment of a repair method of a display device of the present invention. This embodiment is similar to the first or second embodiment described above, except that:
在本实施例中，所述方法还包括：In this embodiment, the method further includes:
E、通过所述激光切断方式断开第五连接和第六连接，其中，所述第五连接为所述显示装置的第二备用线305的第四分段3051与第五分段3052之间的连接，所述第六连接为所述显示装置的第二备用线305的第六分段3053与所述第五分段3052之间的连接。E. Disconnecting the fifth connection and the sixth connection by the laser cutting mode, wherein the fifth connection is between the fourth segment 3051 and the fifth segment 3052 of the second backup line 305 of the display device The sixth connection is a connection between the sixth segment 3053 of the second spare line 305 of the display device and the fifth segment 3052.
F、通过所述激光焊接方式将所述第五分段3052与所述测试信号输入线301相连。F. The fifth segment 3052 is connected to the test signal input line 301 by the laser welding method.
其中，所述第五分段3052位于所述第四分段3051和所述第六分段3053之间，所述第五分段3052与所述第二输入端相连。The fifth segment 3052 is located between the fourth segment 3051 and the sixth segment 3053, and the fifth segment 3052 is connected to the second input end.
本实施例对显示装置进行修复的方式总共需要进行六次激光切断和两次激光焊接。The manner in which the display device is repaired in this embodiment requires a total of six laser cuts and two laser welds.
在本实施例中，各步骤的执行不区分先后次序，即，各步骤可以按照任意次序来执行。In the present embodiment, the execution of the steps is not prioritized, that is, the steps may be performed in any order.
在上述第一至第三实施例中的任意一个实施例中，优选地，所述第二薄膜晶体管304与所述第一薄膜晶体管303完全相同，即所述第二薄膜晶体管304与所述第一薄膜晶体管303在尺寸、属性等方面均相同或大致相似。因此，在使用上述技术方案对显示装置进行修复后，显示装置的整个线路的阻抗不会发生变化。 In any one of the foregoing first to third embodiments, preferably, the second thin film transistor 304 is identical to the first thin film transistor 303, that is, the second thin film transistor 304 and the first A thin film transistor 303 is identical or substantially similar in size, properties, and the like. Therefore, after the display device is repaired using the above technical solution, the impedance of the entire line of the display device does not change.
在上述任意一个实施例中，由于使用所述第二薄膜晶体管304（备用的薄膜晶体管）来对显示装置进行修复，因此能够使得显示装置的宽长比不会发生改变，从而不会在点灯检测时发生显示异常，不会发生误判，同时减少了在显示面板300固化的过程中出现线不良的现象，即，有利于提高显示面板300的良率。 In any of the above embodiments, since the display device is repaired by using the second thin film transistor 304 (the standby thin film transistor), the aspect ratio of the display device can be prevented from being changed, so that the lighting detection is not performed. When the display abnormality occurs, the erroneous determination does not occur, and the occurrence of line defects during the curing of the display panel 300 is reduced, that is, the yield of the display panel 300 is improved.
尽管已经相对于一个或多个实现方式示出并描述了本发明，但是本领域技术人员基于对本说明书和附图的阅读和理解将会想到等价变型和修改。本发明包括所有这样的修改和变型，并且仅由所附权利要求的范围限制。此外，尽管本说明书的特定特征已经相对于若干实现方式中的仅一个被公开，但是这种特征可以与如可以对给定或特定应用而言是期望和有利的其他实现方式的一个或多个其他特征组合。而且，就术语“包括”、“具有”、“含有”或其变形被用在具体实施方式或权利要求中而言，这样的术语旨在以与术语“包含”相似的方式包括。 Although the present invention has been shown and described with respect to the embodiments of the invention, The invention includes all such modifications and variations, and is only limited by the scope of the appended claims. Moreover, although specific features of the specification have been disclosed with respect to only one of several implementations, such features may be combined with one or more other implementations as may be desired and advantageous for a given or particular application. Other feature combinations. Furthermore, the terms "comprising,""having,""having," or "include" or "comprising" are used in the particular embodiments or claims, and such terms are intended to be encompassed in a manner similar to the term "comprising."
综上所述，虽然本发明已以优选实施例揭露如上，但上述优选实施例并非用以限制本发明，本领域的普通技术人员，在不脱离本发明的精神和范围内，均可作各种更动与润饰，因此本发明的保护范围以权利要求界定的范围为准。 In the above, the present invention has been disclosed in the above preferred embodiments, but the preferred embodiments are not intended to limit the present invention, and those skilled in the art can make various modifications without departing from the spirit and scope of the invention. The invention is modified and retouched, and the scope of the invention is defined by the scope defined by the claims.
本发明的实施方式Embodiments of the invention
工业实用性Industrial applicability
序列表自由内容Sequence table free content

Claims (20)

  1. 一种显示装置，包括：A display device comprising:
    一显示面板；a display panel;
    其中，所述显示面板包括：Wherein, the display panel comprises:
    一第一薄膜晶体管阵列，所述第一薄膜晶体管阵列包括至少一第一薄膜晶体管；a first thin film transistor array, the first thin film transistor array including at least one first thin film transistor;
    一第二薄膜晶体管阵列，所述第二薄膜晶体管阵列包括至少一第二薄膜晶体管；以及a second thin film transistor array, the second thin film transistor array including at least one second thin film transistor;
    至少一第一备用线；At least one first spare line;
    其中，所述第一薄膜晶体管与所述第二薄膜晶体管相邻，所述第二薄膜晶体管与测试信号输入线和所述第一备用线相连；Wherein the first thin film transistor is adjacent to the second thin film transistor, and the second thin film transistor is connected to the test signal input line and the first standby line;
    在所述第一薄膜晶体管发生短路的情况下，所述第一薄膜晶体管的第一输入端用于通过激光切断方式断开与所述测试信号输入线之间的第一连接，所述第一薄膜晶体管的第一输出端用于通过所述激光切断方式断开与测试信号输出线之间的第二连接，所述第一备用线用于通过激光焊接方式与所述测试信号输出线相连；In a case where the first thin film transistor is short-circuited, the first input end of the first thin film transistor is used to disconnect the first connection with the test signal input line by a laser cutting method, the first a first output end of the thin film transistor is configured to be disconnected from the test signal output line by the laser cutting mode, and the first standby line is connected to the test signal output line by laser welding;
    所述显示面板还包括：The display panel further includes:
    一控制信号线阵列，所述控制信号线阵列包括至少一控制信号线；a control signal line array, the control signal line array comprising at least one control signal line;
    所述第一薄膜晶体管的第一控制端和所述第二薄膜晶体管的第二控制端均与所述控制信号线连接，在所述第一薄膜晶体管发生短路的情况下，所述第二控制端用于通过所述控制信号线接收控制信号；a first control end of the first thin film transistor and a second control end of the second thin film transistor are both connected to the control signal line, and in a case where the first thin film transistor is short-circuited, the second control End for receiving a control signal through the control signal line;
    所述第一输入端为所述第一薄膜晶体管的源极/漏极，所述第一输出端为所述第一薄膜晶体管的漏极/源极。 The first input end is a source/drain of the first thin film transistor, and the first output end is a drain/source of the first thin film transistor.
  2. 根据权利要求1所述的显示装置，其中The display device according to claim 1, wherein
    所述第二控制端用于根据所述控制信号打开或关闭第二薄膜晶体管所对应的开关。The second control terminal is configured to turn on or off a switch corresponding to the second thin film transistor according to the control signal.
  3. 根据权利要求1所述的显示装置，其中The display device according to claim 1, wherein
    所述第二薄膜晶体管的第二输入端与所述测试信号输入线相连，所述第二薄膜晶体管的第二输出端与所述第一备用线相连。The second input end of the second thin film transistor is connected to the test signal input line, and the second output end of the second thin film transistor is connected to the first standby line.
  4. 根据权利要求3所述的显示装置，其中The display device according to claim 3, wherein
    所述第一备用线包括第一分段、第二分段和第三分段；The first backup line includes a first segment, a second segment, and a third segment;
    所述第二分段位于所述第一分段和所述第三分段之间，所述第二分段与所述第二输出端相连；The second segment is located between the first segment and the third segment, and the second segment is connected to the second output;
    在所述第一薄膜晶体管发生短路的情况下，所述第二分段用于通过所述激光焊接方式与所述测试信号输出线相连，所述第一分段用于通过所述激光切断方式断开与所述第二分段之间的第三连接，所述第三分段用于通过所述激光切断方式断开与所述第二分段之间的第四连接。 In a case where the first thin film transistor is short-circuited, the second segment is connected to the test signal output line by the laser welding method, and the first segment is used to pass the laser cutting mode Disconnecting a third connection with the second segment, the third segment being used to break a fourth connection with the second segment by the laser cutting mode.
  5. 根据权利要求3所述的显示装置，其中The display device according to claim 3, wherein
    所述第一备用线包括第一末端和第二末端，所述第一末端与所述第二输出端相连，所述第二末端设置于所述测试信号输出线相对所述第一末端的另一侧；The first backup line includes a first end and a second end, the first end is connected to the second output end, and the second end is disposed on the test signal output line opposite to the first end One side
    在所述第一薄膜晶体管发生短路的情况下，所述第一备用线通过所述激光焊接方式与所述测试信号输出线相连。In the case where the first thin film transistor is short-circuited, the first backup line is connected to the test signal output line by the laser welding method.
  6. 根据权利要求4所述的显示装置，其中The display device according to claim 4, wherein
    所述显示面板还包括：The display panel further includes:
    至少一第二备用线，所述第二备用线包括第四分段、第五分段和第六分段；At least one second spare line, the second spare line including a fourth segment, a fifth segment, and a sixth segment;
    所述第五分段位于所述第四分段和所述第六分段之间，所述第五分段与所述第二输入端相连；The fifth segment is located between the fourth segment and the sixth segment, and the fifth segment is connected to the second input end;
    在所述第一薄膜晶体管发生短路的情况下，所述第五分段用于通过所述激光焊接方式与所述测试信号输入线相连，所述第四分段用于通过所述激光切断方式断开与所述第五分段之间的第五连接，所述第六分段用于通过所述激光切断方式断开与所述第五分段之间的第六连接。In a case where the first thin film transistor is short-circuited, the fifth segment is connected to the test signal input line by the laser welding method, and the fourth segment is used to pass the laser cutting mode Disconnecting a fifth connection with the fifth segment, the sixth segment being used to break a sixth connection with the fifth segment by the laser cutting mode.
  7. 一种显示装置，包括：A display device comprising:
    一显示面板；a display panel;
    其中，所述显示面板包括：Wherein, the display panel comprises:
    一第一薄膜晶体管阵列，所述第一薄膜晶体管阵列包括至少一第一薄膜晶体管；a first thin film transistor array, the first thin film transistor array including at least one first thin film transistor;
    一第二薄膜晶体管阵列，所述第二薄膜晶体管阵列包括至少一第二薄膜晶体管；以及a second thin film transistor array, the second thin film transistor array including at least one second thin film transistor;
    至少一第一备用线；At least one first spare line;
    其中，所述第一薄膜晶体管与所述第二薄膜晶体管相邻，所述第二薄膜晶体管与测试信号输入线和所述第一备用线相连；Wherein the first thin film transistor is adjacent to the second thin film transistor, and the second thin film transistor is connected to the test signal input line and the first standby line;
    在所述第一薄膜晶体管发生短路的情况下，所述第一薄膜晶体管的第一输入端用于通过激光切断方式断开与所述测试信号输入线之间的第一连接，所述第一薄膜晶体管的第一输出端用于通过所述激光切断方式断开与测试信号输出线之间的第二连接，所述第一备用线用于通过激光焊接方式与所述测试信号输出线相连。In a case where the first thin film transistor is short-circuited, the first input end of the first thin film transistor is used to disconnect the first connection with the test signal input line by a laser cutting method, the first A first output end of the thin film transistor is used to disconnect a second connection with the test signal output line by the laser cutting mode, and the first backup line is connected to the test signal output line by laser welding.
  8. 根据权利要求7所述的显示装置，其中The display device according to claim 7, wherein
    所述显示面板还包括：The display panel further includes:
    一控制信号线阵列，所述控制信号线阵列包括至少一控制信号线；a control signal line array, the control signal line array comprising at least one control signal line;
    所述第一薄膜晶体管的第一控制端和所述第二薄膜晶体管的第二控制端均与所述控制信号线连接，在所述第一薄膜晶体管发生短路的情况下，所述第二控制端用于通过所述控制信号线接收控制信号。a first control end of the first thin film transistor and a second control end of the second thin film transistor are both connected to the control signal line, and in a case where the first thin film transistor is short-circuited, the second control The terminal is configured to receive a control signal through the control signal line.
  9. 根据权利要求8所述的显示装置，其中The display device according to claim 8, wherein
    所述第二控制端用于根据所述控制信号打开或关闭第二薄膜晶体管所对应的开关。 The second control terminal is configured to turn on or off a switch corresponding to the second thin film transistor according to the control signal.
  10. 根据权利要求8所述的显示装置，其中The display device according to claim 8, wherein
    所述第二薄膜晶体管的第二输入端与所述测试信号输入线相连，所述第二薄膜晶体管的第二输出端与所述第一备用线相连。The second input end of the second thin film transistor is connected to the test signal input line, and the second output end of the second thin film transistor is connected to the first standby line.
  11. 根据权利要求10所述的显示装置，其中The display device according to claim 10, wherein
    所述第一备用线包括第一分段、第二分段和第三分段；The first backup line includes a first segment, a second segment, and a third segment;
    所述第二分段位于所述第一分段和所述第三分段之间，所述第二分段与所述第二输出端相连；The second segment is located between the first segment and the third segment, and the second segment is connected to the second output;
    在所述第一薄膜晶体管发生短路的情况下，所述第二分段用于通过所述激光焊接方式与所述测试信号输出线相连，所述第一分段用于通过所述激光切断方式断开与所述第二分段之间的第三连接，所述第三分段用于通过所述激光切断方式断开与所述第二分段之间的第四连接。 In a case where the first thin film transistor is short-circuited, the second segment is connected to the test signal output line by the laser welding method, and the first segment is used to pass the laser cutting mode Disconnecting a third connection with the second segment, the third segment being used to break a fourth connection with the second segment by the laser cutting mode.
  12. 根据权利要求10所述的显示装置，其中The display device according to claim 10, wherein
    所述第一备用线包括第一末端和第二末端，所述第一末端与所述第二输出端相连，所述第二末端设置于所述测试信号输出线相对所述第一末端的另一侧；The first backup line includes a first end and a second end, the first end is connected to the second output end, and the second end is disposed on the test signal output line opposite to the first end One side
    在所述第一薄膜晶体管发生短路的情况下，所述第一备用线通过所述激光焊接方式与所述测试信号输出线相连。 In the case where the first thin film transistor is short-circuited, the first backup line is connected to the test signal output line by the laser welding method.
  13. 根据权利要求10所述的显示装置，其中The display device according to claim 10, wherein
    所述显示面板还包括：The display panel further includes:
    至少一第二备用线，所述第二备用线包括第四分段、第五分段和第六分段；At least one second spare line, the second spare line including a fourth segment, a fifth segment, and a sixth segment;
    所述第五分段位于所述第四分段和所述第六分段之间，所述第五分段与所述第二输入端相连；The fifth segment is located between the fourth segment and the sixth segment, and the fifth segment is connected to the second input end;
    在所述第一薄膜晶体管发生短路的情况下，所述第五分段用于通过所述激光焊接方式与所述测试信号输入线相连，所述第四分段用于通过所述激光切断方式断开与所述第五分段之间的第五连接，所述第六分段用于通过所述激光切断方式断开与所述第五分段之间的第六连接。 In a case where the first thin film transistor is short-circuited, the fifth segment is connected to the test signal input line by the laser welding method, and the fourth segment is used to pass the laser cutting mode Disconnecting a fifth connection with the fifth segment, the sixth segment being used to break a sixth connection with the fifth segment by the laser cutting mode.
  14. 根据权利要求7所述的显示装置，其中The display device according to claim 7, wherein
    所述第一输入端为所述第一薄膜晶体管的源极/漏极，所述第一输出端为所述第一薄膜晶体管的漏极/源极。The first input end is a source/drain of the first thin film transistor, and the first output end is a drain/source of the first thin film transistor.
  15. 一种如权利要求7所述的显示装置的测试线路修复方法，其包括：A test line repairing method for a display device according to claim 7, comprising:
    A、通过激光切断方式断开第一连接和第二连接，其中，所述第一连接为所述显示装置的第一薄膜晶体管的第一输入端与测试信号输入线之间的连接，所述第二连接为所述第一薄膜晶体管的第一输出端与测试信号输出线之间连接；A. disconnecting the first connection and the second connection by a laser cutting method, wherein the first connection is a connection between a first input end of the first thin film transistor of the display device and a test signal input line, The second connection is a connection between the first output end of the first thin film transistor and the test signal output line;
    B、通过激光焊接方式将所述显示装置中的第一备用线与所述测试信号输出线相连，其中，所述显示装置中的第二薄膜晶体管的第二输入端与所述测试信号输入线相连，所述第二薄膜晶体管的第二输出端与所述第一备用线相连。 B. The first backup line in the display device is connected to the test signal output line by laser welding, wherein the second input end of the second thin film transistor in the display device and the test signal input line Connected, the second output end of the second thin film transistor is connected to the first standby line.
  16. 根据权利要求15所述的显示装置的测试线路修复方法，其中A test line repairing method for a display device according to claim 15, wherein
    所述步骤B包括：The step B includes:
    B1、通过所述激光焊接方式将所述第一备用线的第二分段与所述测试信号输出线相连；B1, the second segment of the first spare line is connected to the test signal output line by the laser welding method;
    所述方法还包括：The method further includes:
    C、通过所述激光切断方式断开第三连接和第四连接，其中，所述第三连接为所述第一备用线的第一分段和所述第二分段之间的连接，所述第四连接为所述第一备用线的第三分段和所述第二分段之间的连接；C. Disconnecting the third connection and the fourth connection by the laser cutting mode, wherein the third connection is a connection between the first segment and the second segment of the first backup line, The fourth connection is a connection between the third segment of the first backup line and the second segment;
    其中，所述第二输出端与所述第二分段相连，所述第二分段位于所述第一分段和所述第三分段之间。 The second output is connected to the second segment, and the second segment is located between the first segment and the third segment.
  17. 根据权利要求15所述的显示装置的测试线路修复方法，其中A test line repairing method for a display device according to claim 15, wherein
    所述方法还包括：The method further includes:
    D、通过所述激光焊接方式将所述第一备用线与所述测试信号输出线相连；D. connecting the first backup line to the test signal output line by the laser welding method;
    其中，所述第一备用线包括第一末端和第二末端，所述第一末端与所述第二输出端相连，所述第二末端设置于所述测试信号输出线相对所述第一末端的另一侧。 The first backup line includes a first end and a second end, the first end is connected to the second output end, and the second end is disposed on the test signal output line opposite to the first end The other side.
  18. 根据权利要求15所述的显示装置的测试线路修复方法，其中A test line repairing method for a display device according to claim 15, wherein
    所述方法还包括：The method further includes:
    E、通过所述激光切断方式断开第五连接和第六连接，其中，所述第五连接为所述显示装置的第二备用线的第四分段与第五分段之间的连接，所述第六连接为所述显示装置的第二备用线的第六分段与所述第五分段之间的连接；E. disconnecting the fifth connection and the sixth connection by the laser cutting mode, wherein the fifth connection is a connection between the fourth segment and the fifth segment of the second spare line of the display device, The sixth connection is a connection between a sixth segment of the second spare line of the display device and the fifth segment;
    F、通过所述激光焊接方式将所述第五分段与所述测试信号输入线相连；F. connecting the fifth segment to the test signal input line by the laser welding method;
    其中，所述第五分段位于所述第四分段和所述第六分段之间，所述第五分段与所述第二输入端相连。The fifth segment is located between the fourth segment and the sixth segment, and the fifth segment is connected to the second input.
  19. 根据权利要求15所述的显示装置的测试线路修复方法，其中A test line repairing method for a display device according to claim 15, wherein
    所述第一输入端为所述第一薄膜晶体管的源极/漏极，所述第一输出端为所述第一薄膜晶体管的漏极/源极。The first input end is a source/drain of the first thin film transistor, and the first output end is a drain/source of the first thin film transistor.
  20. 根据权利要求15所述的显示装置的测试线路修复方法，其中A test line repairing method for a display device according to claim 15, wherein
    所述方法还包括：The method further includes:
    G、所述第二薄膜晶体管的所述第二控制端通过所述显示装置中的控制信号线接收控制信号，以根据所述控制信号打开或关闭第二薄膜晶体管所对应的开关。 G. The second control end of the second thin film transistor receives a control signal through a control signal line in the display device to turn on or off a switch corresponding to the second thin film transistor according to the control signal.
PCT/CN2013/090821 2013-12-17 2013-12-30 Display device and test line repair method therefor WO2015089878A1 (en)

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US14/234,419 US9000435B1 (en) 2013-12-30 2013-12-30 Display device and testing line repairing method thereof
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