CN109741699B - Detection device for display panel - Google Patents
Detection device for display panel Download PDFInfo
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- CN109741699B CN109741699B CN201910057573.0A CN201910057573A CN109741699B CN 109741699 B CN109741699 B CN 109741699B CN 201910057573 A CN201910057573 A CN 201910057573A CN 109741699 B CN109741699 B CN 109741699B
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- 238000001514 detection method Methods 0.000 title claims abstract description 22
- 238000012360 testing method Methods 0.000 claims abstract description 33
- 238000007689 inspection Methods 0.000 claims description 17
- 239000000523 sample Substances 0.000 claims description 12
- 230000002159 abnormal effect Effects 0.000 claims description 7
- 239000000758 substrate Substances 0.000 claims description 3
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 claims description 2
- 239000010409 thin film Substances 0.000 description 7
- 238000005259 measurement Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 238000012986 modification Methods 0.000 description 4
- 230000004048 modification Effects 0.000 description 4
- 230000004075 alteration Effects 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 238000012795 verification Methods 0.000 description 2
- 230000005856 abnormality Effects 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 238000012790 confirmation Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000008439 repair process Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
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Abstract
The present disclosure provides a detection apparatus for a display panel. The detection equipment for the display panel comprises a test device group, an oscilloscope, a lighting machine and a laser machine. The oscilloscope is connected with the test device group. The lighting machine is configured for connection to a display panel. The laser machine is arranged on one side of the test device group. The present disclosure can improve detection accuracy and detection function for a display panel.
Description
[ technical field ] A method for producing a semiconductor device
The present disclosure relates to the field of display technologies, and in particular, to a detection apparatus for a display panel.
[ background of the invention ]
The existing test device group (TEG) may be used to measure the resistance, capacitance, and current-voltage characteristics of a Thin Film Transistor (TFT) of a display panel, but the existing test device group has a large measurement error, which makes it difficult to distinguish the abnormality of the display panel from the measurement result of the existing test device group.
Therefore, it is desirable to provide a detecting apparatus for a display panel to solve the problems of the prior art.
[ summary of the invention ]
In order to solve the above technical problem, an object of the present disclosure is to provide a detection apparatus for a display panel, which can improve detection accuracy and detection function for the display panel.
To achieve the above objective, the present disclosure provides an inspection apparatus for a display panel. The detection equipment for the display panel comprises a test device group, an oscilloscope, a lighting machine and a laser machine. The oscilloscope is connected with the test device group. The lighting machine is configured for connection to a display panel. The laser machine is arranged on one side of the test device group.
In one embodiment of the present disclosure, the lighting engine is configured as a circuit board interface for connecting the display panel.
In one embodiment of the present disclosure, the testing device group includes at least a base and a probe disposed on the base.
In one embodiment of the present disclosure, the probe is configured to connect to the display panel.
In an embodiment of the disclosure, the detection apparatus for a display panel further includes a patch cord, and the oscilloscope is connected to the at least one base through the patch cord.
In one embodiment of the present disclosure, the laser machine includes a microscope and a laser probe disposed adjacent to each other.
In an embodiment of the disclosure, the lighting device includes at least one connection line, and the at least one connection line is used for connecting a circuit board interface of the display panel.
In one embodiment of the present disclosure, the test device group and the lighting machine are configured to be controlled independently.
In one embodiment of the present disclosure, the laser machine is configured to dot on the display panel.
In one embodiment of the present disclosure, the laser machine is configured to cut a line on the display panel.
Since the detection device for the display panel in the embodiment of the present disclosure includes the test device group, the oscilloscope, the lighting machine, and the laser machine, the oscilloscope is connected to the test device group, the lighting machine is configured to be connected to the display panel, and the laser machine is disposed on one side of the test device group, the detection accuracy and the detection function for the display panel can be improved.
In order to make the aforementioned and other aspects of the present disclosure more comprehensible, preferred embodiments accompanied with figures are described in detail below:
[ description of the drawings ]
FIG. 1 is a schematic diagram of an inspection apparatus for a display panel according to an embodiment of the present disclosure;
FIG. 2 is a schematic diagram illustrating an exemplary method for inspecting a display panel using an inspection apparatus according to an embodiment of the disclosure;
FIG. 3 is a schematic diagram illustrating an exemplary method for inspecting a display panel using an inspection apparatus according to an embodiment of the disclosure; and
FIG. 4 is a schematic diagram illustrating an exemplary method for inspecting a display panel using an inspection apparatus according to an embodiment of the disclosure.
[ detailed description ] embodiments
In order to make the aforementioned and other objects, features and advantages of the present disclosure comprehensible, preferred embodiments accompanied with figures are described in detail below. Furthermore, directional phrases used in this disclosure, such as, for example, upper, lower, top, bottom, front, rear, left, right, inner, outer, lateral, peripheral, central, horizontal, lateral, vertical, longitudinal, axial, radial, uppermost or lowermost, etc., refer only to the orientation of the attached drawings. Accordingly, the directional terms used are used for the purpose of illustration and understanding of the present disclosure, and are not used to limit the present disclosure.
In the drawings, elements having similar structures are denoted by the same reference numerals.
Referring to fig. 1, an embodiment of the present disclosure provides an inspection apparatus 10 for a display panel 20. The inspection apparatus 10 includes a Test Element Group (TEG) 100, an oscilloscope 200, a lighting unit 300, and a laser unit 400. The oscilloscope 200 is connected to the test device group 100. The lighting machine 300 is configured to be connected to the display panel 20. The laser machine 400 is disposed at one side of the test device group 100. The embodiment of the disclosure can improve the detection accuracy and the detection function for the display panel 20.
The inspection apparatus 10 may be used, for example, to measure a thin film transistor liquid crystal display (TFT LCD) or an Organic Light Emitting Diode (OLED) display.
In one embodiment of the present disclosure, the testing device group 100 may be used to measure the current-voltage characteristics of the resistance, capacitance and Thin Film Transistor (TFT) of the display panel 20. The testing device group 100 includes at least a base 110 and a probe 120 disposed on the base 110. The probe 120 is configured to be connected to the display panel 20.
In one embodiment of the present disclosure, the detection apparatus 10 further includes a patch cord 500, and the oscilloscope 200 is connected to the at least one base 110 through the patch cord 500. The oscilloscope 200 can be used to observe the waveform curve of the amplitude of various different electrical signals of the display panel 20 with time, and the performance of the display panel 20 can be detected by the electrical parameters such as the voltage, the period, the frequency, the phase difference, the amplitude and the rise time displayed by the oscilloscope 200.
In one embodiment of the present disclosure, the display panel 20 includes a Chip On Film (COF) 22 and a Printed Circuit Board (PCB) 24 connected to each other. The lighting engine 300 is configured as a circuit board interface 26 for connecting the display panel 20. That is, the lighting unit 300 is configured as a circuit board interface 26 for connecting the printed circuit board 24. The lighting device 300 includes at least one connection line 310, and the at least one connection line 310 is used for connecting the circuit board interface 26 of the display panel 20. The test device group 100 and the lighting machine 300 are configured to be controlled independently, so that flexible control is facilitated. The lighting device 300 is used for displaying a screen, and the lighting device 300 may display different screens after applying a signal to the display panel 20.
In one embodiment of the present disclosure, the laser machine 400 includes a microscope 410 and a laser probe 420 disposed adjacent to each other. The laser machine 400 is configured to dot on the display panel 20. The laser machine 400 is configured to cut lines on the display panel 20. Laser tangent and laser dotting are performed on the display panel 20 through the laser machine 400, and the electrical property defect of the display panel 20 is subjected to auxiliary analysis.
In one embodiment of the present disclosure, a laser probe 420 with laser function is installed near the microscope 410, so that the inspection apparatus 10 has laser function. The oscilloscope 200 is connected to the at least one base 110 through the patch cord 500, so that the detection device 10 has an oscillography function. The lighting device 300 is configured to be connected to the circuit board interface 26 of the printed circuit board 24, and to enable the display panel 20 to display different screens after applying a signal to the display panel 20.
Referring to fig. 1 and 2, in an embodiment of the disclosure, the laser machine 400 is combined with the lighting machine 300 to perform laser verification on the bright spot 28 of the display panel 20 in a dark spot manner, the bright spot 28 of the display panel 20 is darkened by directly adjusting the laser energy and the lighting position of the laser machine 400 when the display panel 20 is lit, and the processes of laser, lighting confirmation and laser … repetition are not needed, so that the time for repair and verification is saved. The laser machine 400 is also applied to locking other dot-line type abnormal positions of the display panel 20 in combination with the lighting machine 300.
Referring to fig. 1 and 3, in an embodiment of the present disclosure, the laser machine 400 may facilitate measurement of the thin film transistor 32 in a gate driver on array (GOA) area 30 of the display panel 20. When the laser machine 400 performs laser, all the connecting lines except the three-terminal test via holes (for example, the source 34, the drain 36 and the gate 38) of the thin film transistor 32 are laser cut, and the current-voltage characteristics of the thin film transistor 32 in the gate driver circuit substrate area 30 can be measured through the other via holes connected to the thin film transistor 32 to be measured. The laser machine 400 in combination with the test device cluster 100 may eliminate interference with the peripheral circuitry of the display panel 20 to improve accurate measurements of the impedance, capacitance, and current-voltage curves of other particular devices of the display panel 20.
Referring to fig. 1 and 4, in one embodiment of the present disclosure, the testing device group 100 may be used to measure the resistance, capacitance and TFT characteristics of micron-scale devices. The oscilloscope 200 is connected to the at least one base 110 of the test device group 100 through the patch cord 500, so that the detection apparatus 10 has an oscillography function. When the test device group 100 is used to detect whether the deep hole 42 and the shallow hole 44 of the gate driving circuit substrate area 30 are abnormal, the probe 120 detects the impedance of Indium Tin Oxide (ITO) of the deep hole 42 and the shallow hole 44 to determine, and the display panel 20 is powered by the lighting program of the lighting machine 300, and the deep hole 42 and the shallow hole 44 are determined whether abnormal by the output waveform of the oscilloscope 200.
The embodiment of the invention integrates the test device group, the oscilloscope, the lighting machine and the laser machine together to form a detection device with high measurement precision and large measurement function. Different pictures of the display panel can be displayed after signals are applied to the display panel, the abnormal position can be positioned according to poor display of the display panel, namely, the abnormal position can be detected by measuring the resistance, the capacitance, the inductance and the current-voltage curve of the display panel through a test device group, micron-sized devices in the display panel can also be detected through the waveform characteristics of an oscilloscope, and the interference of specific devices of the display panel and other devices of the display panel can be measured by laser hitting and cutting lines of a laser machine.
Although the disclosure has been shown and described with respect to one or more implementations, equivalent alterations and modifications will occur to others skilled in the art based upon a reading and understanding of this specification and the annexed drawings. The present disclosure includes all such modifications and alterations, and is limited only by the scope of the appended claims. In particular regard to the various functions performed by the above described components, the terms used to describe such components are intended to correspond, unless otherwise indicated, to any component which performs the specified function of the described component (e.g., that is functionally equivalent), even though not structurally equivalent to the disclosed structure which performs the function in the herein illustrated exemplary implementations of the specification. In addition, while a particular feature of the specification may have been disclosed with respect to only one of several implementations, such feature may be combined with one or more other features of the other implementations as may be desired and advantageous for a given or particular application. Furthermore, to the extent that the terms "includes," has, "" contains, "or variants thereof are used in either the detailed description or the claims, such terms are intended to be inclusive in a manner similar to the term" comprising.
The foregoing is merely a preferred embodiment of the present disclosure, and it should be noted that modifications and refinements may be made by those skilled in the art without departing from the principle of the present disclosure, and these modifications and refinements should also be construed as the protection scope of the present disclosure.
Claims (8)
1. An inspection apparatus for a display panel, comprising:
the test device group comprises at least one base and a probe arranged on the at least one base;
the oscilloscope is connected with the test device group;
a lighting machine configured to connect the display panel;
the laser machine is arranged on one side of the test device group; and
a patch cord;
the oscilloscope is connected with the at least one base of the test device group through the patch cord to enable the detection equipment to have an oscillography function, the test device group is used for detecting whether the deep holes and the shallow holes in the grid drive circuit substrate area of the display panel are abnormal or not, the probe is used for judging through detecting the impedance of indium tin oxide of the deep holes and the shallow holes, the display panel is powered up through a lighting program of the lighting machine, and whether the deep holes and the shallow holes are abnormal or not is judged through the output waveform of the oscilloscope.
2. The inspection apparatus for a display panel of claim 1, wherein the light engine is configured as a circuit board interface for connecting the display panel.
3. The inspection apparatus for a display panel of claim 1, wherein the probe is configured to connect to the display panel.
4. The inspection apparatus for display panels of claim 1 wherein said laser machine comprises a microscope and a laser probe positioned adjacent each other.
5. The inspection apparatus for a display panel according to claim 1, wherein the lighting machine includes at least one connection line for connecting a circuit board interface of the display panel.
6. The inspection apparatus for a display panel according to claim 1, wherein the test device group and the lighting machine are configured to be controlled independently of each other.
7. The inspection apparatus for display panels of claim 1, wherein said laser machine is configured for dotting on said display panel.
8. The inspection apparatus for display panels of claim 1, wherein said laser machine is configured to cut a line on said display panel.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910057573.0A CN109741699B (en) | 2019-01-22 | 2019-01-22 | Detection device for display panel |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910057573.0A CN109741699B (en) | 2019-01-22 | 2019-01-22 | Detection device for display panel |
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| Publication Number | Publication Date |
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| CN109741699A CN109741699A (en) | 2019-05-10 |
| CN109741699B true CN109741699B (en) | 2022-03-08 |
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| CN201910057573.0A Active CN109741699B (en) | 2019-01-22 | 2019-01-22 | Detection device for display panel |
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN86200405U (en) * | 1986-01-27 | 1987-01-14 | 马鸿章 | Fault finder for electronic equipment |
| KR100831848B1 (en) * | 2007-10-18 | 2008-05-22 | 옥순봉 | Apparatus and method for testing lcd control board |
| CN108831360A (en) * | 2018-06-22 | 2018-11-16 | 京东方科技集团股份有限公司 | Gate drive signal detection circuit, method and display device |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3943919B2 (en) * | 2001-12-04 | 2007-07-11 | 株式会社アドバンスト・ディスプレイ | Liquid crystal display device and inspection method thereof |
| TWI391649B (en) * | 2008-09-16 | 2013-04-01 | Au Optronics Corp | Light-on tester for panel defect and light-on test method for panel defect |
| JP6078870B2 (en) * | 2012-06-28 | 2017-02-15 | 株式会社Ｓｃｒｅｅｎホールディングス | Inspection apparatus and inspection method |
| CN103680370A (en) * | 2013-12-17 | 2014-03-26 | 深圳市华星光电技术有限公司 | Display device and test circuit repairing method thereof |
| CN205539358U (en) * | 2016-01-29 | 2016-08-31 | 苏州市科林源电子有限公司 | Radium -shine lamp tool of circuit board test |
| TWM552604U (en) * | 2017-08-07 | 2017-12-01 | 晟耀有限公司 | Laser repair machine |
| CN107329296B (en) * | 2017-08-25 | 2020-05-29 | 深圳市华星光电技术有限公司 | Liquid crystal panel dark spot repairing method and array substrate structure |
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2019
- 2019-01-22 CN CN201910057573.0A patent/CN109741699B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN86200405U (en) * | 1986-01-27 | 1987-01-14 | 马鸿章 | Fault finder for electronic equipment |
| KR100831848B1 (en) * | 2007-10-18 | 2008-05-22 | 옥순봉 | Apparatus and method for testing lcd control board |
| CN108831360A (en) * | 2018-06-22 | 2018-11-16 | 京东方科技集团股份有限公司 | Gate drive signal detection circuit, method and display device |
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| CN109741699A (en) | 2019-05-10 |
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Address after: 9-2 Tangming Avenue, Guangming New District, Shenzhen City, Guangdong Province Applicant after: TCL China Star Optoelectronics Technology Co.,Ltd. Address before: 9-2 Tangming Avenue, Guangming New District, Shenzhen City, Guangdong Province Applicant before: Shenzhen China Star Optoelectronics Technology Co.,Ltd. |
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| PE01 | Entry into force of the registration of the contract for pledge of patent right |
Denomination of invention: Detection equipment for display panels Effective date of registration: 20231113 Granted publication date: 20220308 Pledgee: Industrial and Commercial Bank of China Limited Shenzhen Guangming Sub branch Pledgor: TCL China Star Optoelectronics Technology Co.,Ltd. Registration number: Y2023980065368 |
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