GB2534317B - Display device and testing line repairing method thereof - Google Patents
Display device and testing line repairing method thereof Download PDFInfo
- Publication number
- GB2534317B GB2534317B GB1604875.3A GB201604875A GB2534317B GB 2534317 B GB2534317 B GB 2534317B GB 201604875 A GB201604875 A GB 201604875A GB 2534317 B GB2534317 B GB 2534317B
- Authority
- GB
- United Kingdom
- Prior art keywords
- display device
- repairing method
- testing line
- line repairing
- testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
- H01L22/22—Connection or disconnection of sub-entities or redundant parts of a device in response to a measurement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
- H01L22/32—Additional lead-in metallisation on a device or substrate, e.g. additional pads or pad portions, lines in the scribe line, sacrificed conductors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/481—Internal lead connections, e.g. via connections, feedthrough structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body
- H01L27/10—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including a plurality of individual components in a repetitive configuration
- H01L27/105—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including a plurality of individual components in a repetitive configuration including field-effect components
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/124—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or layout of the wiring layers specially adapted to the circuit arrangement, e.g. scanning lines in LCD pixel circuits
- H01L27/1244—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or layout of the wiring layers specially adapted to the circuit arrangement, e.g. scanning lines in LCD pixel circuits for preventing breakage, peeling or short circuiting
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/80—Constructional details
- H10K59/88—Dummy elements, i.e. elements having non-functional features
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
- G09G2330/08—Fault-tolerant or redundant circuits, or circuits in which repair of defects is prepared
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
- G09G2330/10—Dealing with defective pixels
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/8319—Arrangement of the layer connectors prior to mounting
- H01L2224/83191—Arrangement of the layer connectors prior to mounting wherein the layer connectors are disposed only on the semiconductor or solid-state body
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201310693323.9A CN103680370A (en) | 2013-12-17 | 2013-12-17 | Display device and test circuit repairing method thereof |
PCT/CN2013/090821 WO2015089878A1 (en) | 2013-12-17 | 2013-12-30 | Display device and test line repair method therefor |
Publications (3)
Publication Number | Publication Date |
---|---|
GB201604875D0 GB201604875D0 (en) | 2016-05-04 |
GB2534317A GB2534317A (en) | 2016-07-20 |
GB2534317B true GB2534317B (en) | 2020-12-09 |
Family
ID=50317762
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB1604875.3A Expired - Fee Related GB2534317B (en) | 2013-12-17 | 2013-12-30 | Display device and testing line repairing method thereof |
Country Status (6)
Country | Link |
---|---|
JP (1) | JP2016538590A (en) |
KR (1) | KR101894523B1 (en) |
CN (1) | CN103680370A (en) |
EA (1) | EA031911B1 (en) |
GB (1) | GB2534317B (en) |
WO (1) | WO2015089878A1 (en) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107884693A (en) * | 2017-11-06 | 2018-04-06 | 武汉华星光电半导体显示技术有限公司 | Electrical characteristics test method |
US10565912B2 (en) | 2017-11-06 | 2020-02-18 | Wuhan China Star Optoelectronics Semiconductor Display Technology Co., Ltd. | Electrical characteristics inspection method |
CN109741699B (en) * | 2019-01-22 | 2022-03-08 | Tcl华星光电技术有限公司 | Detection device for display panel |
CN111798779B (en) * | 2019-07-26 | 2022-07-29 | 友达光电股份有限公司 | Spare circuit system for flexible display panel and automatic switching method thereof |
CN111203631A (en) * | 2020-03-12 | 2020-05-29 | 苏州晶振智能科技有限公司 | Intelligent detection laser repair method for display screen |
CN114360439B (en) | 2020-09-30 | 2022-12-20 | 荣耀终端有限公司 | Display device, driving chip and electronic equipment |
CN112289836B (en) * | 2020-10-26 | 2023-05-02 | 武汉天马微电子有限公司 | Display panel and display device |
CN113516917B (en) * | 2021-05-26 | 2023-05-12 | 京东方科技集团股份有限公司 | Display panel, display device and broken line repairing method |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5102361A (en) * | 1989-01-23 | 1992-04-07 | Sharp Kabushiki Kaisha | Method for the manufacture of active matrix display apparatuses |
CN101059636A (en) * | 2006-04-21 | 2007-10-24 | 株式会社日立显示器 | Liquid crystal display device |
JP2007292878A (en) * | 2006-04-21 | 2007-11-08 | Hitachi Displays Ltd | Liquid crystal display device and method for manufacturing the same |
CN101191964A (en) * | 2006-11-27 | 2008-06-04 | 中华映管股份有限公司 | Pixel structure and its repairing method |
CN101382709A (en) * | 2007-09-04 | 2009-03-11 | 上海广电Nec液晶显示器有限公司 | Thin film transistor structure for liquid crystal display device |
CN102692774A (en) * | 2012-05-23 | 2012-09-26 | 深圳市华星光电技术有限公司 | Liquid crystal display panel |
EP2535888A1 (en) * | 2010-02-08 | 2012-12-19 | Sharp Kabushiki Kaisha | Display device |
CN103345093A (en) * | 2013-06-28 | 2013-10-09 | 京东方科技集团股份有限公司 | Pixel unit, array substrate, manufacturing and restoring method of array substrate and display device |
-
2013
- 2013-12-17 CN CN201310693323.9A patent/CN103680370A/en active Pending
- 2013-12-30 EA EA201690996A patent/EA031911B1/en not_active IP Right Cessation
- 2013-12-30 KR KR1020167010222A patent/KR101894523B1/en active IP Right Grant
- 2013-12-30 GB GB1604875.3A patent/GB2534317B/en not_active Expired - Fee Related
- 2013-12-30 WO PCT/CN2013/090821 patent/WO2015089878A1/en active Application Filing
- 2013-12-30 JP JP2016526832A patent/JP2016538590A/en active Pending
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5102361A (en) * | 1989-01-23 | 1992-04-07 | Sharp Kabushiki Kaisha | Method for the manufacture of active matrix display apparatuses |
CN101059636A (en) * | 2006-04-21 | 2007-10-24 | 株式会社日立显示器 | Liquid crystal display device |
JP2007292878A (en) * | 2006-04-21 | 2007-11-08 | Hitachi Displays Ltd | Liquid crystal display device and method for manufacturing the same |
CN101191964A (en) * | 2006-11-27 | 2008-06-04 | 中华映管股份有限公司 | Pixel structure and its repairing method |
CN101382709A (en) * | 2007-09-04 | 2009-03-11 | 上海广电Nec液晶显示器有限公司 | Thin film transistor structure for liquid crystal display device |
EP2535888A1 (en) * | 2010-02-08 | 2012-12-19 | Sharp Kabushiki Kaisha | Display device |
CN102692774A (en) * | 2012-05-23 | 2012-09-26 | 深圳市华星光电技术有限公司 | Liquid crystal display panel |
CN103345093A (en) * | 2013-06-28 | 2013-10-09 | 京东方科技集团股份有限公司 | Pixel unit, array substrate, manufacturing and restoring method of array substrate and display device |
Also Published As
Publication number | Publication date |
---|---|
KR20160060106A (en) | 2016-05-27 |
GB2534317A (en) | 2016-07-20 |
WO2015089878A1 (en) | 2015-06-25 |
EA201690996A1 (en) | 2016-10-31 |
EA031911B1 (en) | 2019-03-29 |
GB201604875D0 (en) | 2016-05-04 |
JP2016538590A (en) | 2016-12-08 |
CN103680370A (en) | 2014-03-26 |
KR101894523B1 (en) | 2018-09-04 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
HK1200546A1 (en) | Test apparatus and test method based on dfdau dfdau | |
HK1201359A1 (en) | Multi-version testing method and device thereof | |
AU2014330913B2 (en) | Improved pregnancy test device and method | |
TWI563641B (en) | Display device and manufacturing method thereof | |
SG10201800838XA (en) | Method and apparatus for displaying application | |
EP2989526A4 (en) | Method for displaying and electronic device thereof | |
PL2676606T3 (en) | Quick test device and method | |
EP3013042A4 (en) | Image display device and image display method | |
PL3431196T3 (en) | Endoscope leak testing device and method | |
EP2979154A4 (en) | Display device and control method thereof | |
EP2958001A4 (en) | Application software displaying method and device | |
EP2948851A4 (en) | Method and apparatus for testing browser compatibility | |
EP3059667A4 (en) | Theme display method and related device | |
EP2980558A4 (en) | Measurement device and measurement method | |
EP2975509A4 (en) | Desktop display method and device | |
EP2990940A4 (en) | Icon display method and apparatus | |
EP2953116A4 (en) | Display apparatus and device | |
DK2969633T3 (en) | ANTI-BIRTH APPARATUS AND PROCEDURES FOR USE IN SOVEREIGN TEST | |
GB2534317B (en) | Display device and testing line repairing method thereof | |
EP3032421A4 (en) | Device and method for testing randomness | |
EP3051807A4 (en) | Predicted-route presentation device and predicted-route presentation method | |
EP3070705A4 (en) | Display device and display method | |
EP2910997A4 (en) | Display device apparatus and manufacturing method thereof | |
EP3040708A4 (en) | Optical-characteristics measurement device and optical-characteristics measurement method | |
EP2975451A4 (en) | Display device and method for manufacturing same |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
789A | Request for publication of translation (sect. 89(a)/1977) |
Ref document number: 2015089878 Country of ref document: WO |
|
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 20221230 |