WO2015076513A1 - Appareil d'inspection de transmittance de motif imprimé pour capteur ir - Google Patents

Appareil d'inspection de transmittance de motif imprimé pour capteur ir Download PDF

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Publication number
WO2015076513A1
WO2015076513A1 PCT/KR2014/010617 KR2014010617W WO2015076513A1 WO 2015076513 A1 WO2015076513 A1 WO 2015076513A1 KR 2014010617 W KR2014010617 W KR 2014010617W WO 2015076513 A1 WO2015076513 A1 WO 2015076513A1
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WO
WIPO (PCT)
Prior art keywords
sensor
transmittance
luminance
pattern
rgb color
Prior art date
Application number
PCT/KR2014/010617
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English (en)
Korean (ko)
Inventor
천정미
박일우
Original Assignee
동우화인켐 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by 동우화인켐 주식회사 filed Critical 동우화인켐 주식회사
Publication of WO2015076513A1 publication Critical patent/WO2015076513A1/fr

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/59—Transmissivity
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/16—Inspection; Monitoring; Aligning
    • H05K2203/162—Testing a finished product, e.g. heat cycle testing of solder joints

Definitions

  • the present invention relates to an apparatus for inspecting transmittance of a printing pattern for an IR sensor.
  • a proximity sensor used in a portable communication device is designed to prevent touch screen touch input from being caused by unintentional physical contact when a person's body approaches a certain distance or more when a touch screen panel is applied. This function turns off the touch screen display.
  • the proximity sensor has a feature that the cover body and the main body are separated from each other and installed in a dual state.
  • the cover body and the TSP are positioned twice on the main body.
  • the cover body and the touch panel are double-covered and the wavelength value changes, the light receiving part of the main body may not operate normally. Therefore, the cover body of the proximity sensor is removed and the outermost window substrate of the touch screen panel is removed.
  • the printing pattern for the infrared ray (IR) sensor was formed to be divided into the main body and the touch panel to be separated from each other.
  • Korean Patent No. 10-1242295 has a transmittance including an infrared lamp that emits IR light, an optical cable, a control board that directly receives light transmitted through a printing pattern for an IR sensor, and directly measures transmittance.
  • a meter has been disclosed, there is still a problem in that the configuration of the device is not simple and a device for directly measuring the IR transmittance is used, which is inadequate for continuous measurement.
  • Patent Document 1 Korean Registered Patent No. 10-1242295
  • the present invention provides an apparatus and method capable of simply and quickly inspecting whether an IR print pattern has a poor transmittance.
  • the present invention provides an apparatus and method capable of continuously inspecting the transmittance of the IR printed pattern in the manufacturing process.
  • a substrate transfer unit for transferring a substrate having a printed pattern for the IR sensor;
  • a light source unit positioned at one side of the substrate transfer unit and irradiating inspection light to the IR sensor print pattern;
  • An RGB color photographing apparatus positioned on the other side of the substrate transfer part and acquiring an image by receiving the inspection light transmitted through the IR sensor print pattern; And an image obtained by photographing the luminance of the obtained image by using a transmittance measuring device with respect to the print pattern for calibration IR sensor and the inspection light transmitted through the print pattern for calibration 1st IR sensor with an RGB color photographing apparatus.
  • a control unit which calculates a corresponding transmittance by substituting the calibration curve obtained by making the luminance correspond to the luminance.
  • the transmittance inspection device of the printing pattern for the IR sensor is a light having a wavelength acceptable in the white light or RGB color imaging device.
  • the transmittance inspection device of the printing pattern for the IR sensor In the above 2, wherein the acceptable wavelength is 400 to 500nm, 500 to 600nm, 600 to 700nm, or a combination thereof, the transmittance inspection device of the printing pattern for the IR sensor.
  • the luminance of the obtained image is a luminance represented by a gray level.
  • the calibration curve is obtained by matching the transmittance obtained by the transmittance measuring device with respect to the printed pattern for calibration IR sensor and the luminance of an image taken by the RGB color imaging apparatus for the inspection light transmitted through the print pattern for calibration IR sensor. step; And obtaining a corresponding transmittance by substituting the luminance of an image photographed by an RGB color photographing device with inspection light transmitted through an IR sensor print pattern into the calibration curve, and obtaining a corresponding transmittance.
  • inspection light is white light or light having an acceptable wavelength in an RGB color photographing apparatus.
  • the luminance of the obtained image is a luminance represented by a gray level.
  • the apparatus and method for inspecting the transmittance of the IR sensor print pattern of the present invention does not directly measure the transmittance of the IR sensor print pattern, but secures a calibration curve corresponding to luminance and transmittance in advance and prints the IR sensor print pattern with an imaging device. By taking only the luminance of and measuring the corresponding transmittance, the transmittance can be measured very simply and quickly.
  • the transmittance can be measured as long as the luminance can be measured, the limitation of the light source can be reduced and the configuration of the equipment for inspection can be simplified.
  • Such a device and method for testing transmittance of the present invention is suitable for continuous production processes.
  • FIG. 1 is a view schematically showing an embodiment of a transmittance inspection device of a printing pattern for an IR sensor of the present invention.
  • FIG. 2 is a graph showing a calibration curve obtained in Example 1.
  • FIG. 3 is a graph showing a calibration curve obtained in Example 2.
  • the present invention provides a substrate transfer unit for transferring a substrate having a printed pattern for the IR sensor; A light source unit positioned at one side of the substrate transfer unit and irradiating inspection light to the IR sensor print pattern; An RGB color photographing apparatus positioned on the other side of the substrate transfer part and acquiring an image by receiving the inspection light transmitted through the IR sensor print pattern; And an image obtained by photographing the luminance of the obtained image by using a transmittance measuring device with respect to the print pattern for calibration IR sensor and the inspection light transmitted through the print pattern for calibration 1st IR sensor with an RGB color photographing apparatus. And a control unit which calculates a corresponding transmittance by substituting the calibration curve obtained by making the luminance correspond to the luminance.
  • the present invention relates to an inspection apparatus capable of measuring the transmittance of a printing pattern for an IR sensor simply and quickly.
  • Figure 1 schematically shows an embodiment of the transmittance inspection apparatus of the printing pattern for the IR sensor of the present invention.
  • An apparatus for inspecting transmittance of a print pattern for an IR sensor according to the present invention includes a substrate transfer unit 100, a light source unit 200, an RGB color photographing apparatus 300, and a controller 400.
  • the substrate transfer unit 100 transfers the substrate 10 on which the IR sensor print pattern 20 is formed and places the substrate 10 at a position where inspection is possible.
  • the substrate transfer unit 100 may be a device in which the individual substrates 10 are disposed one by one in the inspection position, or may be a continuous transfer device such as a roller, for example, to be directly applied to the production line of the substrate 10. In the case of a continuous transfer device, the substrate 10 may be temporarily stopped at the inspection position.
  • the light source unit 200 is located at one side of the substrate transfer unit 100 to irradiate light used for inspection of the IR sensor print pattern 20.
  • the inspection light is white light or light having a wavelength acceptable to the RGB color imaging apparatus 300.
  • Acceptable wavelengths in the RGB color photographing apparatus 300 are wavelengths of light representing red, green, and blue, and may be, for example, 600 to 700 nm, 500 to 600 nm, and 400 to 500 nm, respectively, preferably 630 to 500 nm, respectively. 670 nm, 530 to 570 nm, 430 to 470 nm.
  • the light may be used alone or in combination of two or more.
  • the RGB color photographing apparatus 300 is positioned on the other side of the substrate transfer unit 100 to receive the inspection light irradiated from the light source unit 200 and passed through the IR sensor print pattern 20 of the substrate 10. Acquire.
  • the RGB color photographing apparatus 300 usable in the present invention is a photographing apparatus which recognizes only light having a wavelength of red (R), green (G), and blue (B), and can be used without particular limitation. have. For example, when white light is used in the light source unit 200, only white light having a wavelength of red (R), green (G), and blue (B) is photographed. The image photographed by the RGB color photographing apparatus 300 is transmitted to the controller 400.
  • the controller 400 calculates transmittance by measuring the luminance of the IR sensor print pattern 20 in the image captured by the RGB color photographing apparatus 300.
  • the calibration curve can be obtained by the following method.
  • a calibration IR sensor print pattern formed of the same material as the IR sensor print pattern 20 is formed on the same substrate as the substrate 10, and then the transmittance of the calibration pattern for the calibration IR sensor is measured.
  • a plurality of print patterns having different transmittances are formed while varying the thickness and the like of the print pattern for calibration IR sensor, and all transmittances are measured.
  • the light source unit 200 is positioned on one side of the plurality of calibration IR sensor print patterns and irradiated with inspection light, and the RGB color photographing apparatus disposed on the other side of the plurality of calibration IR sensor print patterns ( 300 to receive the inspection light to obtain an image.
  • the luminance of the print pattern for calibration IR sensor is measured in the obtained image and matched with the transmittance of the print pattern for calibration IR sensor.
  • a calibration curve can be obtained by matching the brightness of the IR sensor print pattern with the x-axis value and the transmittance as the y-axis value.
  • a calibration curve which is a linear regression line can be obtained.
  • the controller 400 After obtaining the calibration curve as described above, the controller 400 substitutes the luminance of the IR sensor print pattern 20 obtained from the captured image into the calibration curve, and calculates a transmittance corresponding thereto.
  • the luminance of the IR sensor print pattern 20 may be, for example, gray level, but is not limited thereto.
  • the printing pattern transmittance inspection device for the IR sensor of the present invention does not directly measure the transmittance of the print pattern by using a transmittance meter, but only the luminance of the print pattern can be measured and the transmittance can be obtained therefrom. Can be measured.
  • the present invention provides a method for inspecting transmittance of a printing pattern for an IR sensor.
  • One embodiment of the method for inspecting the transmittance of the print pattern for an IR sensor according to the present invention includes a light transmittance obtained by a transmittance measuring device with respect to a print pattern for a calibration IR sensor and an inspection light that has passed through the print pattern for a calibration IR sensor. Acquiring calibration curves by matching luminance of an image captured by the RGB color photographing apparatus with each other; And
  • the specific method of obtaining the calibration curve is as described above, and the inspection light used, the RGB color photographing apparatus, the luminance, and the like are also described above.
  • One side of the glass substrate on which the printed pattern was formed was irradiated with LED with white light, and the other side of the glass substrate was measured with a detector (Otsuka Electronics Co., Ltd.) capable of calculating the transmittance of a specific wavelength band with a multi-channel photo diode (MCPD). Images were taken with a CCD sensor (Falcon 1M 120HG, manufactured by DALSA) of an RGB color camera.
  • the color camera may extract not only a luminance signal but also a chroma signal decomposed into three primary colors.
  • the luminance signal of the green (G, 550nm) wavelength band can be extracted through a dichroic mirror capable of passing green and reflecting blue and red.
  • the luminance of the print pattern for the IR sensor was measured at a gray level, matched with the transmittance of the print pattern, and the obtained data were analyzed by a regression linear equation.
  • Print pattern for IR sensor was carried out in the same manner as in Example 1 except that the luminance signal of the red (R, 650 nm) wavelength band was extracted using a dichroic mirror capable of passing red and reflecting blue and green in a color camera. The luminance of was measured at the gray level, matched with the transmittance of the print pattern, and the obtained data were analyzed by a regression linear equation.
  • substrate 20 printing pattern for IR sensor
  • substrate transfer portion 200 light source portion
  • RGB color imaging device 400 control unit

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  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Spectrometry And Color Measurement (AREA)

Abstract

La présente invention concerne un appareil d'inspection comprenant : une partie de transfert de substrat pour transférer un substrat ayant un motif imprimé pour un capteur IR ; une unité de source de lumière située à un côté de la partie de transfert de substrat et irradiant le motif imprimé pour le capteur IR avec une lumière d'inspection ; un dispositif de photographie couleur RVB situé à l'autre côté de la partie de transfert de substrat et obtenant une image par réception de la lumière d'inspection qui pénètre dans le dessin imprimé pour le capteur IR ; et une unité de commande pour calculer une transmittance correspondante par substitution de la luminance de l'image obtenue sur une courbe d'étalonnage, qui est obtenue en amenant la transmittance du motif imprimé pour un capteur IR d'essai obtenue par un dispositif de mesure de transmittance à correspondre à la luminance de l'image obtenue par photographie de la lumière d'inspection pénétrant le motif imprimé pour le premier capteur IR d'essai au moyen du dispositif de photographie couleur RVB, de manière à mesurer simplement et rapidement la transmittance du motif imprimé pour le capteur IR.
PCT/KR2014/010617 2013-11-19 2014-11-06 Appareil d'inspection de transmittance de motif imprimé pour capteur ir WO2015076513A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1020130140356A KR20150057255A (ko) 2013-11-19 2013-11-19 Ir 센서용 인쇄 패턴의 투과율 검사 장치
KR10-2013-0140356 2013-11-19

Publications (1)

Publication Number Publication Date
WO2015076513A1 true WO2015076513A1 (fr) 2015-05-28

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TW (1) TW201520533A (fr)
WO (1) WO2015076513A1 (fr)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101627074B1 (ko) 2015-11-25 2016-06-02 주식회사 케이엔케이 아이콘 인쇄 패턴의 투과율 검사 장치
KR101637857B1 (ko) 2015-12-07 2016-07-07 주식회사 케이엔케이 센서 홀 투과율 검사 장치
KR102194289B1 (ko) * 2019-03-18 2020-12-22 주식회사 유니온커뮤니티 청색 또는 보라색 광을 차단하는 차단 성능을 검사하는 검사장치 및 그 검사방법

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11337454A (ja) * 1998-05-27 1999-12-10 Optrex Corp 配線パターン検査方法およびその装置
WO2010140856A2 (fr) * 2009-06-05 2010-12-09 Lee Heon Young Écran d'affichage utilisant la souplesse d'une configuration à film métallique mince et son procédé de fabrication
JP2011089939A (ja) * 2009-10-24 2011-05-06 Djtech Co Ltd 外観検査装置及び印刷半田検査装置
WO2012134001A1 (fr) * 2011-03-30 2012-10-04 주식회사 앤비젼 Procédé permettant de tester des motifs, dispositif permettant de tester des motifs pour substrat par dessus lequel est formée une couche de motifs
WO2013129828A1 (fr) * 2012-02-27 2013-09-06 주식회사 고영테크놀러지 Procédé d'inspection de substrats

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11337454A (ja) * 1998-05-27 1999-12-10 Optrex Corp 配線パターン検査方法およびその装置
WO2010140856A2 (fr) * 2009-06-05 2010-12-09 Lee Heon Young Écran d'affichage utilisant la souplesse d'une configuration à film métallique mince et son procédé de fabrication
JP2011089939A (ja) * 2009-10-24 2011-05-06 Djtech Co Ltd 外観検査装置及び印刷半田検査装置
WO2012134001A1 (fr) * 2011-03-30 2012-10-04 주식회사 앤비젼 Procédé permettant de tester des motifs, dispositif permettant de tester des motifs pour substrat par dessus lequel est formée une couche de motifs
WO2013129828A1 (fr) * 2012-02-27 2013-09-06 주식회사 고영테크놀러지 Procédé d'inspection de substrats

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TW201520533A (zh) 2015-06-01
KR20150057255A (ko) 2015-05-28

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