WO2015064704A1 - 表面プラズモン共鳴蛍光分析方法および表面プラズモン共鳴蛍光分析装置 - Google Patents
表面プラズモン共鳴蛍光分析方法および表面プラズモン共鳴蛍光分析装置 Download PDFInfo
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- WO2015064704A1 WO2015064704A1 PCT/JP2014/078932 JP2014078932W WO2015064704A1 WO 2015064704 A1 WO2015064704 A1 WO 2015064704A1 JP 2014078932 W JP2014078932 W JP 2014078932W WO 2015064704 A1 WO2015064704 A1 WO 2015064704A1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/552—Attenuated total reflection
- G01N21/553—Attenuated total reflection and using surface plasmons
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/13—Moving of cuvettes or solid samples to or from the investigating station
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/648—Specially adapted constructive features of fluorimeters using evanescent coupling or surface plasmon coupling for the excitation of fluorescence
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/13—Moving of cuvettes or solid samples to or from the investigating station
- G01N2021/135—Sample holder displaceable
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N2021/845—Objects on a conveyor
- G01N2021/8455—Objects on a conveyor and using position detectors
Definitions
- the present invention relates to a surface plasmon resonance fluorescence analysis method and a surface plasmon resonance fluorescence analysis apparatus for detecting a substance to be detected contained in a sample liquid using surface plasmon resonance (SPR).
- SPR surface plasmon resonance
- SPFS uses a prism in which a metal film is arranged on a predetermined surface. Then, when the metal film is irradiated with excitation light through the prism at an angle at which surface plasmon resonance occurs, localized field light (enhanced electric field) can be generated on the surface of the metal film. This localized field light excites a fluorescent substance that labels the target substance captured on the metal film, so that the presence or amount of the target substance can be determined by detecting the fluorescence emitted from the fluorescent substance. Can be detected.
- Patent Document 1 discloses that two detection holes are formed in an analysis chip (flow cell) in detection using the SPR method. The user can adjust the position of the analysis chip by using the position confirmation hole.
- Patent Document 2 in detection using a fluorescent substance, an analysis chip (biochip) is irradiated with illumination light having a wavelength different from that of excitation light, and reflected light or transmitted light of the illumination light is detected and analyzed. It is disclosed to specify the position of the chip. By using illumination light having a wavelength different from that of the excitation light, the position of the analysis chip can be specified while preventing fading of the fluorescent material.
- Patent Document 1 The alignment method described in Patent Document 1 has a problem that the manufacturing cost of the analysis chip increases because two position confirmation holes must be formed. In addition, there is a problem that usability is poor because the user must perform alignment.
- Patent Document 2 has a problem that the manufacturing cost of the analyzer increases because a light source different from the excitation light source, a wavelength limiting filter, and the like must be added.
- An object of the present invention is to provide a surface plasmon resonance fluorescence analysis method and a surface plasmon resonance fluorescence analysis apparatus capable of aligning an analysis chip with high accuracy while preventing an increase in manufacturing costs of the analysis chip and the analysis device. is there.
- a surface plasmon resonance fluorescence analysis method is a method in which a fluorescent substance that labels a target substance is emitted by being excited by localized field light based on surface plasmon resonance.
- Is a surface plasmon resonance fluorescence analysis method for detecting the presence or amount of the substance to be detected comprising: a prism having an incident surface and a film formation surface; and a metal film disposed on the film formation surface; A step of installing an analysis chip including a capturing body fixed on the metal film on a chip holder fixed to a transfer stage; and irradiating the analysis chip installed on the chip holder with excitation light A step of detecting reflected light or transmitted light of excitation light to obtain position information of the analysis chip; and the chip holder is moved by the transfer stage based on the position information. Moving the analysis chip to the measurement position, and irradiating the analysis chip arranged at the measurement position with excitation light and labeling the substance to be detected captured by the capture body Detecting the fluorescence emitted from.
- the surface plasmon resonance fluorescence analyzer emits a fluorescent substance that labels a substance to be detected by being excited by localized field light based on surface plasmon resonance.
- a surface plasmon resonance fluorescence analyzer that detects the presence or amount of the substance to be detected by detecting the detected fluorescence, a prism having an incident surface and a film formation surface, and a metal disposed on the film formation surface
- a chip holder for detachably holding an analysis chip including a membrane and a capturing body fixed on the metal film, a transfer stage for moving the chip holder, and the analysis held by the chip holder
- An excitation light irradiation unit that irradiates the chip with excitation light
- an excitation light detection unit that detects excitation light reflected by the analysis chip or excitation light transmitted through the analysis chip
- high-precision alignment of the analysis chip can be realized by adding an inexpensive light receiving sensor without bothering the user. Therefore, according to the present invention, highly sensitive and highly accurate detection of a substance to be detected can be realized while preventing an increase in manufacturing cost and a decrease in usability.
- FIG. 1 is a diagram schematically showing a configuration of an SPFS apparatus according to an embodiment of the present invention.
- FIG. 2 is a flowchart showing an example of an operation procedure of the SPFS apparatus shown in FIG.
- FIG. 3 is a flowchart showing the steps in the position adjustment step (S140) shown in FIG. 4A to 4C are schematic diagrams for explaining the step (S141) of obtaining the position information of the analysis chip.
- 5A and 5B are graphs showing examples of detection results of reflected light by the light receiving sensor.
- 6A to 6C are schematic diagrams for explaining the step (S141) of obtaining the position information of the analysis chip.
- FIG. 7 is a cross-sectional view showing another example of the analysis chip.
- FIG. 8 is a schematic diagram for explaining the step (S141) of obtaining the position information of the analysis chip.
- FIG. 9 is a schematic diagram for explaining the step (S142) of placing the analysis chip at the measurement position.
- FIG. 10 is a schematic diagram for explaining the step (S142) of placing the analysis chip at the measurement position.
- FIG. 11 is a flowchart showing another example of the operation procedure of the SPFS apparatus shown in FIG.
- FIG. 1 is a schematic diagram showing a configuration of a surface plasmon resonance fluorescence analyzer (SPFS apparatus) 100 according to an embodiment of the present invention.
- the SPFS device 100 includes an excitation light irradiation unit 110, an excitation light detection unit 120, a fluorescence detection unit 130, a liquid feeding unit 140, a transport unit 150, and a control unit 160.
- the SPFS apparatus 100 is used with the analysis chip 10 mounted on the chip holder 154 of the transport unit 150. Therefore, the analysis chip 10 will be described first, and then each component of the SPFS device 100 will be described.
- the analysis chip 10 includes a prism 20 having an incident surface 21, a film formation surface 22 and an emission surface 23, a metal film 30 formed on the film formation surface 22, and a flow disposed on the film formation surface 22 or the metal film 30. And a road lid 40.
- the analysis chip 10 is replaced for each analysis.
- the analysis chip 10 is preferably a structure in which each piece has a length of several millimeters to several centimeters, but may be a smaller structure or a larger structure not included in the category of “chip”. .
- the prism 20 is made of a dielectric that is transparent to the excitation light ⁇ .
- the prism 20 has an incident surface 21, a film forming surface 22, and an exit surface 23.
- the incident surface 21 causes the excitation light ⁇ from the excitation light irradiation unit 110 to enter the prism 20.
- a metal film 30 is disposed on the film formation surface 22.
- the excitation light ⁇ incident on the inside of the prism 20 is reflected on the back surface of the metal film 30. More specifically, the excitation light ⁇ is reflected at the interface (deposition surface 22) between the prism 20 and the metal film 30.
- the emission surface 23 emits the excitation light ⁇ reflected by the metal film 30 to the outside of the prism 20.
- the shape of the prism 20 is not particularly limited.
- the shape of the prism 20 is a column having a trapezoidal bottom surface.
- the surface corresponding to one base of the trapezoid is the film formation surface 22, the surface corresponding to one leg is the incident surface 21, and the surface corresponding to the other leg is the emission surface 23.
- the trapezoid serving as the bottom surface is preferably an isosceles trapezoid. Thereby, the entrance surface 21 and the exit surface 23 are symmetric, and the S wave component of the excitation light ⁇ is less likely to stay in the prism 20.
- the incident surface 21 is formed so that the excitation light ⁇ does not return to the excitation light irradiation unit 110.
- the light source of the excitation light ⁇ is a laser diode (hereinafter also referred to as “LD”)
- LD laser diode
- the angle of the incident surface 21 is set so that the excitation light ⁇ does not enter the incident surface 21 perpendicularly in the scanning range centered on the ideal enhancement angle.
- the angle between the incident surface 21 and the film formation surface 22 and the angle between the film formation surface 22 and the emission surface 23 are both about 80 °.
- the resonance angle (and the enhancement angle near the pole) is generally determined by the design of the analysis chip 10.
- the design factors are the refractive index of the prism 20, the refractive index of the metal film 30, the film thickness of the metal film 30, the extinction coefficient of the metal film 30, the wavelength of the excitation light ⁇ , and the like.
- the resonance angle and the enhancement angle are shifted by the detection target substance immobilized on the metal film 30, but the amount is less than several degrees.
- the prism 20 has a considerable amount of birefringence.
- Examples of the material of the prism 20 include resin and glass.
- the material of the prism 20 is preferably a resin having a refractive index of 1.4 to 1.6 and a small birefringence.
- the metal film 30 is disposed on the film formation surface 22 of the prism 20.
- an interaction (surface plasmon resonance) occurs between the photon of the excitation light ⁇ incident on the film formation surface 22 under the total reflection condition and free electrons in the metal film 30, and is locally on the surface of the metal film 30. In-situ light can be generated.
- a capturing body for capturing a substance to be detected is immobilized on the surface of the metal film 30 that does not face the prism 20 (the surface of the metal film 30). By immobilizing the capturing body, it becomes possible to selectively detect the substance to be detected.
- the capturing body is uniformly fixed in a predetermined region (reaction field) on the metal film 30.
- the type of capturing body is not particularly limited as long as it can capture the substance to be detected.
- the capturing body is an antibody specific to the substance to be detected or a fragment thereof.
- the flow path lid 40 is disposed on the metal film 30.
- the flow path lid 40 may be disposed on the film formation surface 22.
- a channel groove is formed on the back surface of the channel lid 40, and the channel lid 40 forms a channel 41 through which a liquid flows together with the metal film 30 (and the prism 20).
- the liquid include a sample solution containing a substance to be detected, a labeled solution containing an antibody labeled with a fluorescent material, and a washing solution.
- the capturing body fixed to the metal film 30 is exposed in the flow path 41. Both ends of the channel 41 are respectively connected to an inlet and an outlet (not shown) formed on the upper surface of the channel lid 40.
- the channel lid 40 is preferably made of a material transparent to the fluorescent ⁇ emitted from the metal film 30.
- An example of the material of the flow path lid 40 includes a resin. If the portion from which the fluorescence ⁇ is extracted is transparent to the fluorescence ⁇ , the other portion of the channel lid 40 may be formed of an opaque material.
- the flow path lid 40 is bonded to the metal film 30 or the prism 20 by, for example, adhesion using a double-sided tape or an adhesive, laser welding, ultrasonic welding, or pressure bonding using a clamp member.
- the excitation light ⁇ enters the prism 20 from the incident surface 21. At this time, a part of the excitation light ⁇ is reflected by the incident surface 21 to become reflected light ⁇ .
- the excitation light ⁇ incident on the prism 20 is incident on the metal film 30 at a total reflection angle (an angle at which surface plasmon resonance occurs).
- localized field light (generally also referred to as “evanescent light” or “near field light”) is applied to the metal film 30. Can be generated.
- This localized field light excites a fluorescent substance that labels the substance to be detected present on the metal film 30, and emits fluorescence ⁇ .
- the SPFS device 100 detects the presence or amount of the substance to be detected by detecting the amount of fluorescent ⁇ emitted from the fluorescent substance.
- the SPFS apparatus 100 includes the excitation light irradiation unit 110, the excitation light detection unit 120, the fluorescence detection unit 130, the liquid feeding unit 140, the transport unit 150, and the control unit 160.
- the excitation light irradiation unit 110 emits excitation light ⁇ to the analysis chip 10 held by the chip holder 154.
- the excitation light irradiation unit 110 emits only the P wave toward the incident surface 21 so that the incident angle with respect to the metal film 30 is an angle that causes surface plasmon resonance.
- the “excitation light” is light that directly or indirectly excites the fluorescent material.
- the excitation light ⁇ is light that generates localized field light on the surface of the metal film 30 that excites the fluorescent material when the metal film 30 is irradiated through the prism 20 at an angle at which surface plasmon resonance occurs. is there.
- the excitation light ⁇ is also used for positioning the analysis chip 10.
- the excitation light irradiation unit 110 includes a configuration for emitting the excitation light ⁇ toward the prism 20 and a configuration for scanning the incident angle of the excitation light ⁇ with respect to the back surface of the metal film 30.
- the excitation light irradiation unit 110 includes a light source unit 111, an angle adjustment mechanism 112, and a light source control unit 113.
- the light source unit 111 emits the collimated excitation light ⁇ having a constant wavelength and light amount so that the shape of the irradiation spot on the back surface of the metal film 30 is substantially circular.
- the light source unit 111 includes, for example, a light source of excitation light ⁇ , a beam shaping optical system, an APC mechanism, and a temperature adjustment mechanism (all not shown).
- the type of the light source is not particularly limited, and is, for example, a laser diode (LD).
- Other examples of light sources include light emitting diodes, mercury lamps, and other laser light sources.
- the light emitted from the light source is not a beam, the light emitted from the light source is converted into a beam by a lens, a mirror, a slit, or the like.
- the light emitted from the light source is not monochromatic light, the light emitted from the light source is converted into monochromatic light by a diffraction grating or the like.
- the light emitted from the light source is not linearly polarized light, the light emitted from the light source is converted into linearly polarized light by a polarizer or the like.
- the beam shaping optical system includes, for example, a collimator, a band pass filter, a linear polarization filter, a half-wave plate, a slit, and a zoom means.
- the beam shaping optical system may include all of these or a part thereof.
- the collimator collimates the excitation light ⁇ emitted from the light source.
- the band-pass filter turns the excitation light ⁇ emitted from the light source into narrowband light having only the center wavelength. This is because the excitation light ⁇ from the light source has a slight wavelength distribution width.
- the linear polarization filter turns the excitation light ⁇ emitted from the light source into completely linearly polarized light.
- the half-wave plate adjusts the polarization direction of the excitation light ⁇ so that the P-wave component is incident on the metal film 30.
- the slit and zoom means adjust the beam diameter, contour shape, and the like of the excitation light ⁇ so that the shape of the irradiation spot on the back surface of the metal film 30 is a circle having a predetermined size.
- the temperature adjustment mechanism is, for example, a heater or a Peltier element.
- the wavelength and energy of the light emitted from the light source may vary depending on the temperature. For this reason, the wavelength and energy of the light emitted from the light source are controlled to be constant by keeping the temperature of the light source constant by the temperature adjusting mechanism.
- the angle at which the maximum amount of plasmon scattered light can be obtained is the enhancement angle.
- the basic incident condition of the excitation light ⁇ is determined by the material and shape of the prism 20 of the analysis chip 10, the film thickness of the metal film 30, the refractive index of the liquid in the flow path, and the like.
- the optimum incident condition varies slightly depending on the type and amount of the light and the shape error of the prism 20. For this reason, it is preferable to obtain an optimal enhancement angle for each measurement.
- a suitable emission angle of the excitation light ⁇ with respect to the normal line of the metal film 30 is about 70 °.
- the light source control unit 113 controls various devices included in the light source unit 111 to control the emission of the emitted light (excitation light ⁇ ) of the light source unit 111.
- the light source control unit 113 includes, for example, a known computer or microcomputer including an arithmetic device, a control device, a storage device, an input device, and an output device.
- the excitation light detection unit 120 detects the reflected light ⁇ of the excitation light ⁇ .
- the excitation light detection unit 120 includes a light receiving sensor 121 and a sensor control unit 122.
- the light receiving sensor 121 detects the reflected light ⁇ of the excitation light ⁇ .
- the type of the light receiving sensor 121 is not particularly limited as long as the reflected light or transmitted light of the excitation light ⁇ can be detected.
- the light receiving sensor 121 is a photodiode (PD).
- the size of the light receiving surface of the light receiving sensor 121 is preferably larger than the beam diameter of the excitation light ⁇ .
- the length of one side of the light receiving surface of the light receiving sensor 121 is preferably 3 mm or more.
- the sensor control unit 122 controls detection of the output value of the light receiving sensor 121, management of sensitivity of the light receiving sensor 121 based on the detected output value, change of sensitivity of the light receiving sensor 121 for obtaining an appropriate output value, and the like.
- the sensor control unit 122 includes, for example, a known computer or microcomputer including an arithmetic device, a control device, a storage device, an input device, and an output device.
- the fluorescence detection unit 130 detects the fluorescence ⁇ generated by irradiating the metal film 30 with the excitation light ⁇ . If necessary, the fluorescence detection unit 130 also detects plasmon scattered light generated by the irradiation of the excitation light ⁇ to the metal film 30.
- the fluorescence detection unit 130 includes, for example, a light receiving unit 131, a position switching mechanism 132, and a sensor control unit 133.
- the light receiving unit 131 is arranged in the normal direction of the metal film 30 of the analysis chip 10 (z-axis direction in FIG. 1).
- the light receiving unit 131 includes a first lens 134, an optical filter 135, a second lens 136, and a light receiving sensor 137.
- the first lens 134 is, for example, a condensing lens, and condenses light emitted from the metal film 30.
- the second lens 136 is an imaging lens, for example, and forms an image of the light collected by the first lens 134 on the light receiving surface of the light receiving sensor 137.
- the optical path between both lenses is a substantially parallel optical path.
- the optical filter 135 is disposed between both lenses.
- the light receiving sensor 137 detects fluorescence ⁇ .
- the light receiving sensor 137 has high sensitivity capable of detecting weak fluorescence ⁇ from a minute amount of a substance to be detected.
- the light receiving sensor 137 is, for example, a photomultiplier tube (PMT) or an avalanche photodiode (APD).
- the position switching mechanism 132 switches the position of the optical filter 135 on or off the optical path in the light receiving unit 131. Specifically, when the light receiving sensor 137 detects fluorescence ⁇ , the optical filter 135 is disposed on the optical path of the light receiving unit 131, and when the light receiving sensor 137 detects plasmon scattered light, the optical filter 135 is attached to the light receiving unit 131. Place outside the optical path.
- the position switching mechanism 132 includes, for example, a rotation driving unit and a known mechanism (such as a turntable or a rack and pinion) that moves the optical filter 135 in the horizontal direction by using a rotational motion.
- the syringe pump 142 includes a syringe 144 and a plunger 145 that can reciprocate inside the syringe 144.
- the plunger 145 By the reciprocating motion of the plunger 145, the liquid is sucked and discharged quantitatively. If the syringe 144 can be replaced, the syringe 144 need not be cleaned. For this reason, it is preferable from the viewpoint of preventing contamination of impurities.
- the syringe 144 is not configured to be replaceable, it is possible to use the syringe 144 without replacing it by adding a configuration for cleaning the inside of the syringe 144.
- the moving device of the syringe pump 142 freely moves the syringe pump 142 in two directions, ie, an axial direction (for example, a vertical direction) of the syringe 144 and a direction crossing the axial direction (for example, a horizontal direction).
- the moving device of the syringe pump 142 is configured by, for example, a robot arm, a two-axis stage, or a turntable that can move up and down.
- the liquid feeding unit 140 determines the position of the tip of the syringe 144. It is preferable to further have a device for detecting.
- the liquid in the channel 41 is again sucked by the syringe pump 142 and discharged to the chemical liquid chip 141 and the like.
- reaction with various liquids, washing, and the like can be performed, and a target substance labeled with a fluorescent substance can be placed in the reaction field in the flow path 41.
- the transport unit 150 transports and fixes the analysis chip 10 to the measurement position or the liquid feeding position.
- the “measurement position” is a position where the excitation light irradiation unit 110 irradiates the analysis chip 10 with the excitation light ⁇ , and the fluorescence detection unit 130 detects the fluorescence ⁇ generated therewith.
- the “liquid feeding position” is a position where the liquid feeding unit 140 supplies a liquid into the flow channel 41 of the analysis chip 10 or removes the liquid in the flow channel 41 of the analysis chip 10.
- the transfer unit 150 includes a transfer stage 152 and a chip holder 154. The chip holder 154 is fixed to the transfer stage 152 and holds the analysis chip 10 in a detachable manner.
- FIG. 2 is a flowchart illustrating an example of an operation procedure of the SPFS apparatus 100.
- FIG. 3 is a flowchart showing the steps in the position adjustment step (S140) shown in FIG.
- the analysis chip 10 is installed in the chip holder 154 of the SPFS device 100 (step S100).
- control unit 160 operates the liquid feeding unit 140 to introduce the sample liquid in the chemical liquid chip 141 into the flow path 41 of the analysis chip 10 (step S120).
- the substance to be detected is captured on the metal film 30 by the antigen-antibody reaction (primary reaction).
- the sample liquid in the flow path 41 is removed, and the flow path 41 is cleaned with a cleaning liquid.
- the humectant is washed by washing the flow channel 41 before introducing the sample solution so that the capturing body can appropriately capture the substance to be detected. Remove.
- the reflected light ⁇ from the analysis chip 10 does not enter the light receiving sensor 121 when the movement distance of the analysis chip 10 is 0 to about 1000 ⁇ m. This is because the excitation light ⁇ is reflected by the flow path lid 40 and travels downward (on the conveyance stage 152 side) (see FIG. 4A).
- the amount of reflected light ⁇ incident on the light receiving sensor 121 gradually increases while the moving distance of the analysis chip 10 is about 1000 to about 2000 ⁇ m. This is because a part of the excitation light ⁇ is reflected by the incident surface 21 and enters the light receiving sensor 121 (see FIG. 4B).
- the first horizontal portion (movement distance: 0 to about 1000 ⁇ m), the slope portion (movement distance: about 1000 to about 2000 ⁇ m), and the second half horizontal portion (movement distance: more than about 2000 ⁇ m) are linearly approximated.
- Point A in the graph is an intersection of the approximate straight line of the horizontal portion and the approximate straight line of the inclined portion in the first half.
- Point B is an intersection of the approximate straight line of the inclined portion and the approximate straight line of the second horizontal portion.
- Point C is the midpoint between points A and B.
- Point A corresponds to the minimum value of the amount of reflected light ⁇ .
- Point B corresponds to the maximum value of the amount of reflected light ⁇ .
- Point C corresponds to an intermediate value of the amount of reflected light ⁇ .
- any one of the points A to C may be used.
- Point A and point B indicate points where the edge of the beam of excitation light ⁇ has reached the edge. Therefore, if the beam diameter of the excitation light ⁇ is taken into consideration, the position of the edge portion can be specified, and as a result, the position of the analysis chip 10 can be specified.
- a point C indicates a point where the center of the beam of the excitation light ⁇ has reached the edge part. When the point C is used, the position of the edge portion can be specified without considering the beam diameter of the excitation light ⁇ , and as a result, the position of the analysis chip 10 can be specified.
- the position of the analysis chip 10 using the intermediate value of the light amount of the reflected light ⁇ (or the transmitted light ⁇ ′) of the excitation light ⁇ . preferable.
- the position of the analysis chip 10 can be specified by irradiating the analysis chip 10 with the excitation light ⁇ and detecting the reflected light ⁇ of the excitation light ⁇ .
- the position of the analysis chip 10 may be specified by irradiating one surface of the analysis chip 10 (the incident surface 21 in FIG. 6A) with the excitation light ⁇ .
- the light receiving surface of the light receiving sensor 121 is small, and the position of the incident surface 21 can be specified by whether or not the reflected light ⁇ is incident on the light receiving sensor 121.
- the position of the incident surface 21 is particularly important, when the excitation light ⁇ is irradiated onto two surfaces adjacent to each other of the analysis chip 10, the surfaces adjacent to the incident surface 21 and the incident surface 21 of the analysis chip 10. (In this embodiment, it is preferable to irradiate the back surface of the channel lid 40 with the excitation light ⁇ . In this case, as shown in FIG. 6C, the excitation light ⁇ may be applied to the incident surface 21 of the prism 20 and the lower surface of the prism 20. However, in the example shown in FIG. 6C, when the position of the analysis chip 10 is specified (step S141), the analysis chip 10 comes closer to the light source unit 111 than the measurement position.
- the spacer 42 is very thin (for example, 100 ⁇ m) compared to the beam diameter (for example, 1 to 1.5 mm) of the excitation light ⁇ , the incident surface 21 and the lower surface of the channel lid 40 are substantially adjacent to each other. It is thought that. Therefore, in this case, the reflected light ⁇ from the substantially adjacent incident surface 21 and the lower surface of the flow path lid 40 is detected to detect the edge portion. Similarly, a bonding member such as an adhesive or a double-sided tape or the metal film 30 can be ignored.
- the thickness of the member (for example, the spacer 42) that can be ignored when detecting the reflected light ⁇ is 1/5 or less of the beam diameter of the excitation light ⁇ , and preferably 1/10 or less.
- the excitation light ⁇ is irradiated on a region including the spacer 42 having a thickness of 1/5 or less or 1/10 or less of the beam diameter of the excitation light ⁇
- most of the reflected light ⁇ from the analysis chip 10 4/5 or more or 9/10 or more) is the reflected light ⁇ from the incident surface 21 or the lower surface of the flow path lid 40 and can be used for position detection. Therefore, the position of the analysis chip 10 can be specified without being affected by the spacer 42.
- the position of the analysis chip 10 can be specified by detecting the transmitted light ⁇ ′ of the excitation light ⁇ instead of the reflected light ⁇ of the excitation light ⁇ .
- transmitted light ⁇ ′ is generated.
- the excitation light ⁇ is incident on the incident surface 21, total reflection occurs on the film formation surface 22 of the prism 20, and thus no transmitted light ⁇ ′ is generated. Therefore, when the light receiving sensor 121 detects the transmitted light ⁇ ′, the position of the edge portion can be specified, and as a result, the position of the analysis chip 10 can be specified.
- FIG. 9 is a schematic diagram for explaining the step of placing the analysis chip 10 at an appropriate measurement position (step S142).
- step S142 First, as shown in FIG. 9A, it is assumed that the position of the edge portion is specified. In this case, since the distance between the position of the edge portion and the region to be irradiated with the excitation light ⁇ on the back surface of the metal film 30 (the region on the back side of the reaction field) is determined, as shown in FIG.
- the analysis chip 10 can be placed at an appropriate measurement position by moving the chip holder 154 by a predetermined distance.
- the analysis chip 10 when the analysis chip 10 is arranged so as to be shifted in the height direction (z-axis direction) (for example, when dust is sandwiched between the analysis chip 10 and the chip holder 154). ), The analysis chip 10 can be arranged at an appropriate measurement position. That is, as shown in FIG. 10A, it is assumed that the position of the edge portion is specified. In this case, the position of the analysis chip 10 in the x-axis direction is shifted as compared to the case where the analysis chip 10 is not shifted in the z-axis direction (indicated by a broken line in the figure). However, even in this case, as shown in FIG. 10B, the analysis chip 10 is moved to an appropriate measurement position by moving the chip holder 154 to the transport stage 152 by a predetermined distance based on the position of the edge portion. Can be arranged.
- control unit 160 operates the position switching mechanism 132 to arrange the optical filter 135 outside the optical path of the light receiving unit 131. And the control part 160 determines the incident angle of the excitation light (alpha) when the light quantity of plasmon scattered light is the maximum as an enhancement angle.
- control unit 160 operates the excitation light irradiation unit 110 and the fluorescence detection unit 130 to irradiate the analysis chip 10 disposed at an appropriate measurement position with the excitation light ⁇ and to output the optical sensor 137 (optical). (Blank value) is recorded (step S160). At this time, the control unit 160 operates the angle adjustment mechanism 112 to set the incident angle of the excitation light ⁇ to the enhancement angle. Further, the control unit 160 controls the position switching mechanism 132 to arrange the optical filter 135 in the optical path of the light receiving unit 131.
- control unit 160 operates the transport stage 152 to move the analysis chip 10 to the liquid feeding position (step S170).
- the controller 160 operates the liquid feeding unit 140 to introduce a liquid (labeled liquid) containing a secondary antibody labeled with a fluorescent substance into the flow channel 41 of the analysis chip 10 (step S180).
- a liquid labeled liquid
- the detection target substance captured on the metal film 30 is labeled with a fluorescent substance by an antigen-antibody reaction (secondary reaction).
- secondary reaction antigen-antibody reaction
- control unit 160 operates the transfer stage 152 to move the analysis chip 10 to the appropriate measurement position determined in step S140 (step S190).
- control unit 160 operates the excitation light irradiation unit 110 and the fluorescence detection unit 130 to irradiate the analysis chip 10 arranged at an appropriate measurement position with the excitation light ⁇ and to be captured by the capturing body.
- the fluorescence ⁇ emitted from the fluorescent substance that labels the detection substance is detected (step S200).
- the control unit 160 subtracts the optical blank value from the detection value, and calculates the fluorescence intensity that correlates with the amount of the substance to be detected.
- the detected fluorescence intensity is converted into the amount and concentration of the substance to be detected as necessary.
- the detection of the enhancement angle may be performed before the primary reaction (step S120).
- determination of the measurement position of the analysis chip 10 is also performed before the primary reaction (step S110 and step S120).
- the process which moves the analysis chip 10 performed between the primary reaction (process S120) and the secondary reaction (process S180) in the flowchart shown in FIG. 2 to the liquid feeding position (process S170). Can be omitted.
- the positional accuracy in the step (step S110) of moving the analysis chip 10 before the primary reaction (step S120) to the liquid feeding position is increased, and in the primary reaction (step S120) and the secondary reaction (step S180).
- the tip of the syringe 144 of the liquid feeding unit 140 can be more reliably inserted into the analysis chip 10. For this reason, the positional accuracy of the analysis chip 10 required in the step of installing the analysis chip 10 on the chip holder 154 (step S100) is loosened, and usability is improved.
- the detection of the enhancement angle may be omitted. Also in this case, determination of the measurement position of the analysis chip 10 (step S130 and step S140) is performed before measurement of the optical blank value (step S160). As described above, the determination of the measurement position of the analysis chip 10 (step S130 and step S140) is performed before the first optical measurement (detection of an enhancement angle, measurement of an optical blank value, or detection of fluorescence). preferable.
- the step of labeling the target substance with the fluorescent substance is performed after the step of reacting the target substance with the capturing body (primary reaction, step S120).
- the timing for labeling the substance to be detected with a fluorescent substance is not particularly limited.
- a labeling solution may be added to the sample solution to label the target substance with a fluorescent substance in advance.
- the sample solution and the labeling solution may be simultaneously injected into the flow path of the analysis chip 10. In the former case, by injecting the sample solution into the flow channel of the analysis chip 10, the target substance labeled with the fluorescent substance is captured by the capturing body.
- both the primary reaction and the secondary reaction can be completed by introducing the sample solution into the flow path of the analysis chip 10 (one-step method).
- the detection of the enhancement angle is performed before the antigen-antibody reaction (step S150), and further before that, the measurement position of the analysis chip 10 is determined (step S130 and step S140). Is implemented.
- the SPFS device has been described.
- the analysis chip alignment method according to the present invention can be applied to an analysis device other than the SPFS device such as an SPR device. *
- the surface plasmon resonance fluorescence analysis method and the surface plasmon resonance fluorescence analyzer according to the present invention can detect a substance to be detected with high reliability, and are useful for clinical examinations, for example.
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Abstract
Description
20 プリズム
21 入射面
22 成膜面
23 出射面
30 金属膜
40 流路蓋
41 流路
42 スペーサー
100 SPFS装置
110 励起光照射ユニット
111 光源ユニット
112 角度調整機構
113 光源制御部
120 励起光検出ユニット
121 受光センサー
122 センサー制御部
130 蛍光検出ユニット
131 受光ユニット
132 位置切り替え機構
133 センサー制御部
134 第1レンズ
135 光学フィルター
136 第2レンズ
137 受光センサー
140 送液ユニット
141 薬液チップ
142 シリンジポンプ
143 送液ポンプ駆動機構
144 シリンジ
145 プランジャー
150 搬送ユニット
152 搬送ステージ
154 チップホルダー
160 制御部
α 励起光
β 励起光の反射光
β’ 励起光の透過光
γ 蛍光
Claims (8)
- 被検出物質を標識する蛍光物質が、表面プラズモン共鳴に基づく局在場光により励起されて発した蛍光を検出して、前記被検出物質の存在またはその量を検出する表面プラズモン共鳴蛍光分析方法であって、
入射面および成膜面を有するプリズムと、前記成膜面上に配置された金属膜と、前記金属膜上に固定化された捕捉体とを含む分析チップを、搬送ステージに固定されたチップホルダーに設置する工程と、
前記チップホルダーに設置された前記分析チップに励起光を照射するとともに、励起光の反射光または透過光を検出して、前記分析チップの位置情報を得る工程と、
前記位置情報に基づいて前記搬送ステージにより前記チップホルダーを移動させて、前記分析チップを測定位置に移動させる工程と、
前記測定位置に配置された前記分析チップに励起光を照射するとともに、前記捕捉体に捕捉されている被検出物質を標識する蛍光物質から放出された蛍光を検出する工程と、
を含む、表面プラズモン共鳴蛍光分析方法。 - 前記分析チップの位置情報を得る工程では、前記分析チップの互いに隣接する2つの面に励起光を照射する、請求項1に記載の表面プラズモン共鳴蛍光分析方法。
- 前記分析チップの位置情報を得る工程では、前記分析チップの前記入射面と前記入射面に隣接する面とに励起光を照射する、請求項2に記載の表面プラズモン共鳴蛍光分析方法。
- 前記分析チップの位置情報を得る工程では、前記励起光の反射光または透過光の光量の中間値を用いて、前記分析チップの位置を特定する、請求項2または請求項3に記載の表面プラズモン共鳴蛍光分析方法。
- 前記分析チップの位置情報を得る工程では、前記搬送ステージによる前記チップホルダーの移動方向に対して平行および垂直ではない方向に励起光を照射する、請求項1~4のいずれか一項に記載の表面プラズモン共鳴蛍光分析方法。
- 前記分析チップの位置情報を得る工程では、前記入射面からの反射光を検出する、請求項1~5のいずれか一項に記載の表面プラズモン共鳴蛍光分析方法。
- 前記分析チップの位置情報を得る工程および前記分析チップを測定位置に移動させる工程では、前記搬送ステージにより前記チップホルダーを励起光の光源に近づく方向にのみ移動させる、請求項1~6のいずれか一項に記載の表面プラズモン共鳴蛍光分析方法。
- 被検出物質を標識する蛍光物質が、表面プラズモン共鳴に基づく局在場光により励起されて発した蛍光を検出して、前記被検出物質の存在またはその量を検出する表面プラズモン共鳴蛍光分析装置であって、
入射面および成膜面を有するプリズムと、前記成膜面上に配置された金属膜と、前記金属膜上に固定化された捕捉体とを含む分析チップを着脱可能に保持するためのチップホルダーと、
前記チップホルダーを移動させる搬送ステージと、
前記チップホルダーに保持された前記分析チップに励起光を照射する励起光照射部と、
前記分析チップで反射された励起光または前記分析チップを透過した励起光を検出する励起光検出部と、
前記励起光検出部の検出結果に基づいて、前記チップホルダーに保持された前記分析チップの位置を特定するとともに、前記搬送ステージにより前記チップホルダーを移動させて、前記分析チップを測定位置に移動させる位置調整部と、
前記捕捉体に捕捉されている被検出物質を標識する蛍光物質から放出された蛍光を検出する蛍光検出部と、
を有する、表面プラズモン共鳴蛍光分析装置。
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