WO2015029673A1

WO2015029673A1 - Collection device and detection device

Info

Publication number: WO2015029673A1
Application number: PCT/JP2014/069888
Authority: WO
Inventors: 克佳高橋; 藤岡　一志; 伸佳石野; 恵美肱黒; 大樹奥野
Original assignee: シャープ株式会社
Priority date: 2013-08-30
Filing date: 2014-07-29
Publication date: 2015-03-05

Abstract

A collection device (100) collects particles in a fluid introduced into a housing (1) on the surface of a collection plate (200) set inside the housing. A nozzle plate (2) is placed on the upper surface of the housing, and the driving of a fan (3) causes outside air to be introduced into the housing at a prescribed flow rate through nozzles (2A) formed by cutting holes in the nozzle plate. A driving unit (5) causes the collection plate to move, through an opening (1A), between a first position that is outside the housing and a second position that is inside the housing and directly in front of the direction in which the nozzles have been formed through the cutting of holes. The collection device is provided with a fixing tool (61) for causing the resistance to the fluid passing through the opening to be greater than the resistance to the fluid passing through the nozzle when the collection plate is in the second position.

Description

Collection device and detection device

The present invention relates to a collection device and a detection device, and more particularly to a collection device and a detection device for collecting and detecting particles in a fluid.

As an apparatus for collecting particles in the atmosphere, for example, as disclosed in Japanese Patent Application Laid-Open No. 2000-300466 (hereinafter referred to as Patent Document 1), an apparatus for collecting particles in the atmosphere on a medium in a petri dish, A so-called air sampler is usually used. Patent document 1 is disclosing the airborne microbe sampler which collects the airborne microbe on the petri dish which accommodates a culture medium through the nozzle plate which has a some hole. The air sampler separates particles from air flowing into the aircraft using an inertial collision method and collects the particles on a petri dish.

Japanese Patent Application Laid-Open No. 2000-3000246

The air sampler as disclosed in Patent Document 1 has the following problems.
(1) At the time of collection, airtightness of parts other than the nozzle substrate is required. Therefore, it has a complicated structure for ensuring hermeticity, such as a lock by rotation, and it is difficult to easily replace or remove the petri dish easily or automatically.

(2) Particles collected on the medium, such as microorganisms, need to be cultured in a thermostatic chamber or the like before counting. Therefore, there is a possibility that a phenomenon called so-called contamination, in which microorganisms other than those collected by the air sampler adhere, may occur during or before the culture. In addition, culture requires a long period of time, for example, about a week, and results cannot be obtained in real time or in a short period.

(3) In place of culturing, there is a method of counting microorganisms based on fluorescence from particles collected on the medium, that is, autofluorescence, but the measurement accuracy is low. Furthermore, this method requires an expensive detector such as a photomultiplier tube.

(4) Although there is a method of detecting after staining a microorganism with a fluorescent reagent, it is difficult to automate the staining process, and the staining process is troublesome. Also, the dyeing process has a high running cost.

The present invention has been made in view of such problems, and has utilized a collection device that facilitates handling of a collection substrate while ensuring the ability to collect particles in a fluid, and the collection device. The object is to provide a detection device.

In order to achieve the above object, according to one aspect of the present invention, the collection device is a device for collecting particles in the fluid introduced into the enclosure on the surface of the collection substrate set in the enclosure. A nozzle substrate that is installed on at least one surface of the housing and has a nozzle drilled therein, an introduction means for introducing a fluid outside the housing into the housing through the nozzle at a predetermined flow rate, and a collection substrate, Driving means for moving between a first position outside the housing and a second position inside the housing, the surface of which is the front in the direction of nozzle drilling, through an opening provided in the housing And a resistance means for making the resistance to the fluid passing through the opening of the housing larger than the resistance to the fluid passing through the nozzle when the collection substrate is in the second position.

Preferably, the resistance means is a fixing portion that covers a portion other than the drive means of the opening in a state where the drive means exists in the opening of the housing when the collection substrate is in the second position.

More preferably, a member for increasing the resistance to the fluid is installed at a position where the fixed portion and the opening are in contact with each other.

Preferably, when the collection substrate is in the second position, the driving means is located outside the housing, and the resistance means is a lid that covers the opening of the housing.

According to another aspect of the present invention, a detection device includes the above-described collection device and a detector for detecting particles collected on the surface of the collection substrate, and the driving means includes the collection substrate. Move to the detector.

Preferably, the detector includes a light source for irradiating excitation light and a light receiving element for receiving fluorescence, and the driving means sets the surface of the collection substrate after the collection substrate is set to the second position. It moves to the 3rd position where excitation light is irradiated from a light source.

More preferably, the detection device further includes a heater, and the driving means moves the collection substrate to the third position after a predetermined time.

According to the present invention, the collection substrate can be easily handled while securing the ability to collect particles in the fluid in the collection device. Further, by using the collection device, it is possible to detect particles in the fluid with high accuracy by the detection device and easy handling of the collection substrate.

It is the schematic which shows the specific example of a structure of the collection apparatus concerning 1st Embodiment. It is the schematic which shows the specific example of a structure of the collection apparatus concerning 1st Embodiment. It is a figure showing the specific example of the external appearance of the drive part and holding | maintenance part of a collection apparatus. It is a figure showing the specific example of the external appearance of the holding | maintenance part of a collection apparatus. It is the figure showing the other example of the drive part of a collection apparatus. It is a figure showing the specific example of the external appearance of the housing and fan of a collection device. It is a figure which shows the specific example of the nozzle substrate of a collection apparatus. It is the figure (A) showing the mode of setting of the collection board | substrate to a housing, and the figure (B) showing typically the state of the opening part when a collection board | substrate becomes a 2nd position. It is the schematic for demonstrating the collection principle in a collection apparatus. It is the figure which represented typically the air flow in the housing of a collection device. It is a figure for demonstrating a resistance mechanism. It is a figure for demonstrating a resistance mechanism. It is a figure for demonstrating a resistance mechanism. It is a figure for demonstrating a resistance mechanism. It is a figure for demonstrating a resistance mechanism. It is a figure for demonstrating the other example of a fixing tool. It is a figure for demonstrating the other example of a drive part. It is the schematic which shows the specific example of a structure of the detection apparatus concerning 2nd Embodiment. It is the schematic which shows the specific example of a structure of the detector of a detection apparatus. It is the particle | grain image image | photographed with the detection apparatus when the air which mixed the polystyrene particle was made into the test substance. It is the particle | grain image image | photographed with the detection apparatus when the air which mixed mold | fungi microbe was made into the test substance. It is the schematic which shows the specific example of a structure of the detection apparatus concerning 3rd Embodiment. It is a measurement result of the fluorescence spectrum before and behind heat processing when Escherichia coli is heat-processed for 5 minutes at 200 degreeC. It is a fluorescence-microscope photograph before and behind heat processing when colon_bacillus | E._coli is heat-processed at 200 degreeC for 5 minute (s). It is a measurement result of the fluorescence spectrum before and behind heat processing when Bacillus bacteria are heat-processed at 200 degreeC for 5 minute (s). It is a fluorescence-microscope photograph before and behind heat processing when Bacillus bacteria are heat-processed for 5 minutes at 200 degreeC. It is a measurement result of the fluorescence spectrum before and behind heat processing when mold bacteria are heat-processed at 200 degreeC for 5 minute (s). It is a fluorescence-microscope photograph before and behind heat processing when mold bacteria are heat-processed at 200 degreeC for 5 minute (s). It is a measurement result of the fluorescence spectrum before and behind heat processing when the dust which emits fluorescence is heat-processed for 5 minutes at 200 degreeC. It is a fluorescence microscope photograph when the dust which emits fluorescence is heat-processed at 200 degreeC for 5 minute (s).

Hereinafter, embodiments of the present invention will be described with reference to the drawings. In the following description, the same parts and components are denoted by the same reference numerals. Their names and functions are also the same. Therefore, these descriptions will not be repeated.

[First Embodiment]
<Overall configuration of device>
The collection device according to the first embodiment collects particles in a fluid such as air introduced into the enclosure on the surface of a collection substrate set in the enclosure.

FIG. 1 and FIG. 2 are schematic views showing a specific example of the configuration of the collection device 100 according to the first embodiment. With reference to FIGS. 1 and 2, the collection device 100 includes a nozzle substrate 2 installed on one surface (upper surface in FIGS. 1 and 2) of the housing 1 and a nozzle 2 A drilled in the nozzle substrate 2. The fan 3 which is an example of an introduction mechanism for introducing air, which is a fluid outside the casing 1, into the casing 1 at a predetermined flow rate via the first position and the casing 1 outside the casing 1. The collection substrate 200 is moved via the opening 1A provided in the housing 1 between the second position where the surface of the collection substrate 200 is in front of the nozzle 2A in the drilling direction. The nozzle 5 and the resistance to the air that passes through the opening 1A of the housing 1 when the collection substrate 200 is in the second position. And a fixture 61 as an example of a resistance mechanism for increasing the resistance to air passing through 2A.

The collection device 100 further includes a control device 10 having a CPU (Central Processing Unit) 10A. The control device 10 is electrically connected to the drive unit 5 and the fan 3 to control their drive.

The fan 3 is provided on the surface opposite to the surface on which the nozzle substrate 2 of the housing 1 is provided (the lower surface in FIGS. 1 and 2). The fan 3 rotates under the control of the control device 10 to generate a negative pressure in the housing 1, thereby introducing outside air into the housing 1 through the nozzle 2 A. The control device 10 rotates the fan 3 by a specified rotation amount by driving the fan 3 by a predetermined control amount. Thereby, outside air is introduced into the housing 1 at a predetermined flow rate. The introduction mechanism is not limited to a fan, and may be a pump or the like.

Preferably, the collection device 100 further includes a holding unit 4 for holding the collection substrate 200. The collection substrate 200 may be held by being mounted on the holding unit 4 or may be fixed with screws or the like. FIG. 1 shows a state in which the collection substrate 200 is in the first position, and FIG. 2 shows a state in which the collection substrate 200 is in the second position. 1 and 2 show the drive unit 5. The drive unit 5 supports the holding unit 4 with an arm, and moves the collection substrate 200 held by the holding unit 4 between the first position and the second position via the opening 1A. .

The fixture 61 which is a fixing portion covers a portion other than the arm of the opening 1A in a state where the arm of the driving unit 5 exists in the opening 1A when the collection substrate 200 is in the second position. That is, the fixture 61 has a surface wider than the opening 1A. An example will be described with reference to FIG. The fixture 61 is provided at an end portion of the holding portion 4 far from the opening 1A, and is fixed when inserted into the housing 1 so that the collection substrate 200 held by the holding portion 4 is set to the second position. A tool 61 covers the opening 1A. In accordance with a control signal from the control device 10, the drive unit 5 maintains the pressure in a direction for pressing the fixture 61 against the opening 1A for a specified time.

The collection substrate 200 may be a resin, glass, metal, silicon substrate, or a thin plate such as polydimethylsiloxane (PDMS) formed on a substrate such as silicon or resin. Moreover, the culture medium hold | maintained at support | carriers, such as a petri dish, may be sufficient. Even if it is any form, the holding | maintenance part 4 is comprised so that the collection board | substrate 200 can be hold | maintained.

<Configuration of drive unit and holding unit>
FIG. 3 is a diagram illustrating a specific example of the external appearance of the drive unit 5 and the holding unit 4. The drive unit 5 has an arm extending in the horizontal or substantially horizontal direction, and the holding unit 4 is supported by the arm. The drive unit 5 is configured to be movable in the support direction of the holding unit 4.

FIG. 4 is a diagram showing a specific example of the appearance of the holding unit 4. The holding unit 4 has a surface for holding the collection substrate 200, and the collection substrate 200 is mounted on the surface or fixed with screws or the like.

A fixture 61 is provided at an end portion of the holding portion 4 far from the opening portion 1A in parallel or substantially in parallel with the opening portion 1A of the housing 1. An O-ring 62 is installed as an example of a member for increasing the resistance to air at a position where the fixture 61 is in contact with the opening. As an example of a member for increasing the resistance to air, the O-ring 62 may be provided on the opening 1A side.

FIG. 5 is a diagram showing another example of the drive unit 5. The drive unit 5 is not limited to one that is movable only in the one-axis direction shown in FIG. 3, and may be movable in three-axis directions as shown in FIG.

<Structure of chassis and fan>
FIG. 6 is a diagram illustrating a specific example of the appearance of the housing 1 and the fan 3. FIG. 6 shows an example, and the housing 1 has a box shape. The nozzle substrate 2 is fitted on the upper surface of the housing 1, and has an opening on the side surface (opening 1A). A fan 3 is installed on the bottom surface.

FIG. 7 is a diagram showing a specific example of the nozzle substrate 2. The nozzle substrate 2 is obtained by forming one or more nozzles 2A on a metal substrate such as stainless steel or aluminum. The material of the nozzle substrate 2 is not limited to a specific material. For example, stainless steel, resin, glass, and other metals are preferably used. Preferably, the diameter of the nozzle (hole) 2A is about 0.01 mm to 10 mm, and the nozzle length (that is, the thickness of the nozzle substrate 2) is about 0.1 mm to 50 mm. The distance from the nozzle substrate 2 to the collection substrate 200 is preferably about 0.01 mm to 10 mm. The shape of the nozzle 2A is not limited. The shape of the nozzle 2A may be, for example, a circle as shown in FIG. 7 or a slit shape. In addition, a taper shape etc. may be sufficient. Also, the number is not limited and may be about 1 to 1000. As shown in FIG. 7, the one or more nozzles 2A are preferably drilled in a predetermined range. Thereby, particles can be collected in a predetermined range on the collection substrate 200, and the efficiency is high in the detection described later.

FIG. 8A is a diagram showing a state of setting the collection substrate 200 to the housing 1. Referring to FIG. 8A, the collection substrate 200 is supported by the arm of the drive unit 5 while being held horizontally or substantially horizontally by the holding unit 4, and is horizontally or substantially horizontal to the opening 1 A of the housing 1. Is inserted into the first position, which is outside the casing 1 in the first state, and moves from the first position in the casing 1 to the second position where the surface is the front in the direction of drilling the nozzle 2A. To do. At this time, the opening 1A is perpendicular or substantially perpendicular to the insertion direction, and the fixture 61 formed in parallel with the opening 1A covers the opening 1A. Since the drive unit 5 is a drive type as shown in FIG. 3 or FIG. 5, the collection substrate 200 can be accurately positioned with respect to the nozzle substrate 2.

FIG. 8B is a diagram schematically showing the state of the opening 1A when the collection substrate 200 is in the second position. At this time, the fixture 61 covers the opening 1 A of the housing 1, and the fixture 61 is pressed against the opening 1 A by the pressing force of the drive unit 5. An O-ring 62 is sandwiched between the fixture 61 and the opening 1A. Thereby, the opening 1A is sealed.

<Collection principle>
FIG. 9 is a schematic diagram for explaining the collection principle of the collection device 100. The collection device 100 collects particles in the air on the surface of the collection substrate 200 using an inertial collision method. The collection substrate 200 is set so as to be parallel or substantially parallel to the nozzle substrate 2. By driving the fan 3 by the control device 10, the pressure in the housing 1 is controlled. As shown in FIG. 9, the fan 3 may be one that takes outside air into the housing 1 by exhausting the air inside the housing 1, or directly introduces outside air into the housing 1. There may be. In the former case, as shown in FIG. 9, the collection substrate 200 is disposed between the fan 3 and the nozzle substrate 2 on the suction side of the fan 3. Although not shown, in the latter case, the nozzle substrate 2 is disposed between the fan 3 and the collection substrate 200 on the exhaust side of the fan 3. In the following description, it is assumed that the fan 3 is the former one.

When the fan 3, which is a pressure control device, is operated, an air flow as shown by a dotted arrow in FIG. That is, outside air is introduced to the collection substrate 200 via the nozzle 2 A of the nozzle substrate 2, and is exhausted out of the housing 1 around the collection substrate 200. The particles in the outside air collide with the surface of the collection substrate 200 due to the inertial force caused by the air current and are collected.

By controlling the pressure in the housing 1 by the fan 3, more specimen (air) can be guided onto the collection substrate 200 than when it is naturally dropped and collected. For example, when a suction fan of 100 L / min is used, 1000 L (1 m ³ ) specimen (air) can be introduced by suction for 10 minutes.

<Relationship of fluid resistance>
In order to collect particles on the surface of the collection substrate 200 using the inertial collision method via the nozzle 2A, the air flow from the nozzle substrate 2 toward the collection substrate 200 while being covered with the fixture 61 However, it is preferable that it is dominant with respect to the airflow which goes to the collection board | substrate 200 from the opening part 1A. That is, if the coefficient R satisfying the relational expression ΔP = Q · R between the pressure difference ΔP and the flow rate Q is defined as the fluid resistance, the fluid resistance R _N of the nozzle substrate 2 and the state covered with the fixture 61 a fluid resistance R _a of the opening 1A of preferably satisfies the R _N «R _a.

FIG. 10 is a diagram schematically showing the air flow in the housing. When the fan 3 is driven with the collection substrate 200 set at the second position and the opening 1A covered with the fixture 61, the outside air at the flow rate Q _N is introduced into the housing 1 via the nozzle 2A. Then, the outside air of the flow rate Q _A is introduced into the housing 1 through the opening 1A covered with the fixture 61. In order to collect particles contained in the air passing through the nozzle 2A on the surface of the collection substrate 200, the flow rate Q _N passing through the nozzle 2A in the flow rate Q _s on the surface of the collection substrate 200 needs to be dominant. is there. That is, the ratio T (= Q _N / Q _s ) of the flow rate Q _N passing through the nozzle 2A to the flow rate Q _s on the surface of the collection substrate 200 is at least larger than 0.5. The ratio T is preferably greater than 0.9, more preferably greater than 0.99.

Here, the flow rate Q _{s on the} surface of the collection substrate 200 is the sum of the flow rate Q _N passing through the nozzle 2A and the flow rate Q _A passing through the opening 1A covered with the fixture 61 (Q _s = Q _N + Q _A ). Therefore, the ratio T is expressed as T = Q _N / (Q _N + Q _A ). When this equation is transformed, the relational expression (1) of Q _N / Q _A = T / (1-T) is obtained.

As described above, the relational expression ΔP = Q · R is established between the pressure difference ΔP and the flow rate Q with the fluid resistance R as a coefficient, and the pressure difference generated in each of the opening 1A of the housing 1 and the nozzle 2A. △ since P is the pressure difference △ P _F resulting from the driving of the fan 3 either, denoted _{_{△ P F = Q N · R}} N = Q a · R a. By transforming this equation, the relational expression (2) between the flow rate Q and the fluid resistance R is obtained as Q _N / Q _A = R _A / R _N.

Therefore, from the relational expressions (1) and (2), the ratio (= R _A / R _N ) of the fluid resistance R _A of the opening 1A in the state covered with the fixture 61 to the fluid resistance R _N of the nozzle substrate 2 is The condition is that T / (1-T) at a ratio T greater than 0.5 (R _A / R _N = T / (1-T), T> 0.5).

In addition, since the collection apparatus 100 collects using the inertial collision method, the laminar flow has arisen in the housing 1. In the case of laminar flow, the Reynolds number Re defined by the ratio between the inertial force and the viscous force satisfies Re <2300. The fluid resistance R is calculated using the Hagen-Poiseuille equation. That is, when the nozzle 2A is a circular tube with a radius r, the flow rate Q is given by assuming that the nozzle length (same as the thickness of the nozzle substrate 2) is L, the pressure difference between both ends of the nozzle is ΔP, and the air viscosity is μ. Q = π · r ⁴ · ΔP / (8 μ · L). Therefore, by substituting the relational expression ΔP = Q · R into the relational expression (3), the fluid resistance R is derived from the relational expression (4) of R = 8 μ · L / (π · r ⁴ ). I understand. This shows that the fluid resistance R of the nozzle substrate 2 is proportional to the nozzle length L and inversely proportional to the nozzle diameter r (the fourth power). When a plurality (number n) of nozzles 2A are drilled in the nozzle substrate 2, the fluid resistance R ′ per nozzle 2A has a relationship of 1 / R = n / R ′ with the total resistance R. Therefore, the overall fluid resistance R is R = R ′ / n.

From the above, the resistance mechanism for making the fluid resistance of the opening 1A larger than the fluid resistance of the nozzle 2A in the state covered with the fixture 61 in the collection device 100 is the fluid resistance R _N of the nozzle substrate 2 described above. And the fluid resistance R _A of the opening 1A is a mechanism that satisfies (R _A / R _N = T / (1-T), T> 0.5). For example, the following four methods can be adopted as the resistance mechanism.

Method 1) The flow passage cross-sectional area (or flow passage diameter) in the opening 1 A covered with the fixture 61 is made smaller (thinner) than the cross-sectional area of the nozzle 2 A of the nozzle substrate 2.
Method 2) Lengthening the flow path in the opening 1 A covered with the fixture 61.
Method 3) Increasing the contact area between the air and the wall surface in the flow path in the opening 1A covered with the fixture 61 (folding, providing unevenness, etc.)
Method 4) Sites that are rapidly expanded and contracted are provided in the flow path in the opening 1A covered with the fixture 61.

As a first example of the resistance mechanism employing the method 1, the fluid cross-sectional area (or the channel diameter) of the air introduced into the opening 1A via the gap between the fixture 61 and the housing 1 is reduced (thinned). For this reason, the control device 10 performs a predetermined period after the collection substrate 200 is set to the second position during the collection period, with respect to the fixture 61 provided at the end of the holding unit 4 by the drive unit 5. Then, the drive unit 5 is controlled so as to continuously apply a pressing force in the direction from the outside to the inside of the housing 1 and press it against the housing 1. Further, as a second example of the resistance mechanism employing the method 1, a rubber-like member is provided at the contact portion between the opening 1A and the fixture 61, and the control device 10 is held by the drive unit 5 during the collection period. The drive unit 5 is controlled so as to press the fixture 61 provided at the end of the unit 4 against the housing 1 until the rubber member is deformed.

FIG. 11 is a diagram for explaining a resistance mechanism employing the method 2 described above. As a first example of the resistance mechanism employing the method 2, FIG. A thick line arrow in the figure is a flow path of air introduced into the opening 1A through a gap between the fixture 61 and the housing 1. In order to lengthen this flow path, the fixture 61 is configured to have a large surface area facing the housing 1. Further, FIG. 11B is given as a second example of the resistance mechanism employing the method 2. Thick line arrows in the figure are air flow paths that pass through the opening 1A and are introduced into the housing 1. In order to lengthen this flow path, the housing 1 is configured such that at least the wall thickness of the opening 1A is thick.

FIGS. 12 to 14 are diagrams for explaining a resistance mechanism adopting the method 3 described above. As a first example of the resistance mechanism employing the method 3, FIG. A thick line arrow in the figure is a flow path of air introduced into the opening 1A through a gap between the fixture 61 and the housing 1. In order to increase the wall surface friction by increasing the contact area between the air and the wall surface in the flow path, each of the portions where the fixture 61 and the housing 1 face each other has an uneven structure. When the collection substrate 200 is set in the housing 1 by the drive unit 5, the flow path in which the fixture 61 and the housing 1 are engaged and bent is formed by the above-described uneven structure. Note that, as shown in FIG. 12B, a comb-shaped mechanism may be used. Further, as shown in FIGS. 13A and 13B, the size and direction of the concavo-convex structure may vary. Furthermore, as shown in FIG. 13C, in combination with the method 2, the flow path may be lengthened and the contact area may be increased. As a second example of the resistance mechanism employing the method 3, as shown in FIG. 14, fine irregularities may be formed in each of the portions where the fixture 61 and the housing 1 face each other.

FIG. 15 is a view for explaining a resistance mechanism adopting the method 4 described above. As a first example, FIG. A thick line arrow in the figure is a flow path of air introduced into the opening 1A through a gap between the fixture 61 and the housing 1. In order to provide a portion where the flow path cross-sectional area is rapidly increased or decreased, a protrusion is provided on each of the portions where the fixture 61 and the housing 1 face each other. As a result, the flow path cross-sectional area rapidly decreases at the protruding portion and rapidly increases at the portion other than the protrusion. In addition, as shown in FIG. 15B, the positions of the protrusions may be such that the housing 1 side is on the outside and the fixture 61 side is on the inside.

<Other examples of fixtures>
In the above description, the fixture 61 as an example of the resistance mechanism is provided at the end of the holding unit 4, and the collection substrate 200 is set to the second position in the housing 1 to automatically In particular, the opening 1A is covered. As another example, a fixture may be provided on the housing 1 side.

FIG. 16 is a diagram for explaining another example of the fixture. FIG. 16A shows the case where the collection substrate 200 is in the first position, and FIG. 16B shows the case where the collection substrate 200 is in the second position. As shown in FIG. 16, in the vicinity of the opening 1 A of the housing 1, a fixture 63 that is a lid that covers the opening 1 A is provided. The fixture 63 is a movable type capable of opening and closing the opening 1A, and a mechanical shutter such as an electronic shutter is preferably used. Although not shown, the driving mechanism of the fixture 63 is electrically connected to the control device 10, and its opening / closing is controlled by the control device 10. An example in which the fixture 63 is set above the opening 1A is shown in FIG. The control device 10 controls the drive unit 5 to set the collection substrate 200 at the second position. At this time, the arm of the drive unit 5 comes into contact with the lower end of the opening 1 A and inserts the collection substrate 200 into the housing 1. The control device 10 slides the fixture 63 downward from above the opening 1A when the collection substrate 200 is in the second position, and covers the opening 1A with the arm of the drive unit 5 interposed therebetween. Furthermore, the control device 10 can increase the fluid resistance of the opening 1A due to the negative pressure generated in the housing 1 by driving the fan 3 in this state. Preferably, rubber-like members are provided at the end of the opening 1 A in contact with the arm of the drive unit 5 and the end of the fixture 63. Thereby, the fluid resistance of the opening 1A can be further increased.

<Other examples of drive unit>
In the above description, the fixing tool 61 or the fixing tool 63 covers the opening 1 A in a state where the arm of the driving unit 5 supports the holding unit 4 and the holding unit 4 holds the collection substrate 200. As another example, after the drive unit 5 sets the collection substrate 200 to the second position, the arm of the drive unit 5 may return to the outside of the housing 1.

FIG. 17 is a diagram for explaining another example of the drive unit 5. FIG. 17A shows a state in which the collection substrate 200 is in the first position, FIG. 17B shows a state in which the collection substrate 200 is in the second position, and FIG. 17C shows the drive unit. 5 represents a state in which only the holding portion 4A is moved out of the housing 1 with the collection substrate 200 in the second position. In this case, the collection substrate 200 is detachable from the holding unit 4A, and the holding unit 4A is also detachable from the drive unit 5. In addition, a mounting table 4B for setting the collection substrate 200 is provided in the housing 1.

As a configuration for making the collection substrate 200 detachable from the holding portion 4A, a sandwiching mechanism, a vacuum suction mechanism, an electromagnet mechanism, or the like is preferably used. The holding unit 4 A is electrically connected to the control device 10, and attachment / detachment of the collection substrate 200 is controlled by a control signal from the control device 10.

<Effect of the first embodiment>
Since the collection device 100 according to the first embodiment has the above-described configuration, the collection substrate 200 is placed while securing a mechanism for collecting particles in the air using the inertial collision method. It can be easily carried in and out of the body 1.

[Second Embodiment]
<Overall configuration of device>
The detection device according to the second embodiment includes the collection device 100 according to the first embodiment, and detects particles in the air collected on the surface of the collection substrate 200.

FIG. 18 is a schematic diagram illustrating a specific example of the configuration of the detection apparatus 500 according to the second embodiment. The detection device 500 includes the collection device 100 according to the first embodiment and a detector 300 for detecting particles collected on the surface of the collection substrate 200. The collection device 100, the drive unit 5, and the detector 300 are all electrically connected to the control device 10 and controlled by the control device 10. The drive unit 5 controls the control device 10 so that the collection substrate 200 is set to the second position in the housing 1 of the collection device 100 and then the third position which is a predetermined position in the detector 300. Move to position.

An example will be shown assuming that the drive unit 5 is movable in the three-axis directions shown in FIG. The direction of the arm supporting the collection substrate 200 is defined as a first axis direction, the direction in which the arm is moved up and down is defined as a second axis direction, and the direction in which the arm is moved back and forth is defined as a third axis direction. The collection device 100 and the detector 300 are arranged side by side in the third axis direction. The housing 1 and the detector 300 of the collection device 100 each have an opening in the first axial direction. The second axial direction is used for positioning the collection substrate 200 in the housing 1 and the detector 300 of the collection device 100.

<Configuration of detector>
The detection method of the detector 300 is not limited to a specific method, and a method of detecting scattered light derived from particles, a method of detecting fluorescence derived from particles, or acquiring a particle image and performing the image recognition processing. Detection by the above can be suitably employed.

FIG. 19 is a schematic diagram showing a specific example of the configuration of the detector 300. Regardless of the detection method, the detector 300 includes a light source 31 for irradiating the surface of the collection substrate 200 and a light receiving element 32 for receiving light from the surface of the collection substrate 200. The light receiving element 32 is electrically connected to the control device 10 and inputs a detection signal indicating the amount of received light to the control device 10. The control device 10 calculates the particle amount based on the received light amount.

In the case of a method of detecting scattered light, the light receiving element 32 corresponds to a photodiode or a photomultiplier tube for measuring scattered light from particles on the surface of the collection substrate 200. The light receiving element 32 may be arranged at any angle with respect to the irradiation direction of the light source 31. The light receiving element 32 detects forward scatter, side scatter, back scatter, and the like according to the arranged position. The control device 10 that has received the detection signal from the light receiving element 32 calculates the particle diameter, the complexity of the configuration within the particle, and the like, and compares it with a reference value that is stored in advance, so that the target particle (for example, biological origin) Particles). Or the control apparatus 10 should just count the signal pulse of scattered light, when confirming the presence or absence and number of particle | grains.

In the case of a method for detecting fluorescence, the light source 31 corresponds to one that can irradiate light as excitation light, and the light receiving element 32 is a photodiode, a photomultiplier tube, a CCD (Charge Coupled Device) for measuring fluorescence from particles. ) Image sensors such as image sensors and CMOS (Complementary Metal Oxide Semiconductor) image sensors are applicable. As shown in FIG. 19A, the detector 300 may be provided with a fluorescence detection lens 34 and a fluorescence detection filter 35 such as a band pass filter and a long pass filter as necessary. In addition, a light source lens 33 for adjusting the irradiation direction may be disposed in front of the irradiation direction of the light source 31. As shown in FIG. 19B, a mirror 36 for adjusting an optical path such as a dichroic mirror may be arranged depending on the angle at which the light receiving element 32 is arranged.

When performing image recognition processing, the light receiving element 32 corresponds to an image sensor such as a CCD image sensor or a CMOS image sensor for measuring (photographing) a particle image on the surface of the collection substrate 200. The control device 10 that has received the particle image from the light receiving element 32 detects the target particle (for example, biological particles) and the presence / absence of the particle by comparing with a previously stored particle image.

The control device 10 controls the drive unit 5 to drive the fan 3 for a predetermined time as the second position in the housing 1 of the collection device 100 to perform the collection operation, and then performs the collection operation. Then, the drive unit 5 is controlled to move the collection substrate 200 to the detector 300. When the detector 300 has a configuration as shown in FIG. 19, the control device 10 controls the drive unit 5 so that the irradiation range of the light source 31 in the detector 300 and the light receiving element 32 The collection substrate 200 is moved to the third position that is the light receiving range. In this state, the control device 10 emits light from the light source 31 and detects particles on the collection substrate 200 based on a detection signal from the light receiving element 32.

<Effects of Second Embodiment>
Since the detection device 500 according to the second embodiment has the above-described configuration, the collection operation and the detection operation can be performed as a series of operations by one device. Moreover, since the drive part 5 which is a drive means is controlled by the control apparatus 10, as a result, the movement of the collection board | substrate 200 can be controlled, a series of operation | movement can be automated easily. Further, by integrating the collection device 100 and the detector 300, it is possible to prevent foreign matter from adhering to the surface of the collection substrate 200 after collection, so-called contamination, and detection with high accuracy is possible. It becomes.

FIG. 20 is a particle image photographed by the detection apparatus 500 when air mixed with polystyrene particles is used as a specimen, and FIG. 21 is photographed by the detection apparatus 500 when air mixed with fungi is used as a specimen. Particle image. In any operation for detecting any specimen, first, the collection substrate 200 is set in the housing 1 of the collection apparatus 100 to collect particles in the specimen on the surface, and then the drive unit 5 The collection substrate 200 is conveyed to the detector 300, and a particle image is taken by the detector 300. The number of particles can be calculated by performing image analysis or the like in the control device 10 on the particle image obtained by the detector 300. As shown in these drawings, the detection apparatus 500 according to the present embodiment can detect particles in a fluid with high accuracy.

[Third Embodiment]
<Overall configuration of device>
FIG. 22 is a schematic diagram illustrating a specific example of the configuration of the detection apparatus 500 according to the third embodiment. A detection device 500 according to the third embodiment includes the collection device 100 according to the first embodiment, the detector 300 described in the second embodiment, and a heater 400. . The collection device 100, the drive unit 5, the detector 300, and the heater 400 are all electrically connected to the control device 10 and controlled by the control device 10. The drive unit 5 moves the collection substrate 200 to the second position in the housing 1 of the collection device 100 by the control of the control device 10, passes through the heater 400, and at a predetermined position in the detector 300. Move to a third position.

<Detection principle>
Some non-living particles, such as chemical fiber dust floating in the air, emit fluorescent light when irradiated with ultraviolet light or blue light, similar to biological particles. However, the fluorescence intensity of biological particles increases by heating, whereas the fluorescence intensity of non-biological particles such as chemical fiber dust does not change by heating. The detection apparatus 500 concerning 3rd Embodiment detects the particle | grains derived from the organism in the air using this property. Hereinafter, this principle will be described in detail.

FIG. 23 shows the measurement results of the fluorescence spectrum of E. coli, which is a biological particle. A curve 71 represents a spectrum before the heat treatment, and a curve 72 is a spectrum after the heat treatment at 200 ° C. for 5 minutes. FIG. 24A is a fluorescence micrograph before the heat treatment, and FIG. 24B is a fluorescence micrograph after the heat treatment. From the measurement results shown in FIG. 23 and the comparison between (A) and (B) in FIG. 24, it can be seen that the fluorescence intensity from E. coli is greatly increased by the heat treatment.

Similarly, FIG. 25 shows the measurement results of the fluorescence spectrum of Bacillus bacteria, which are biologically derived particles. A curve 73 represents a spectrum before the heat treatment, and a curve 73 is a spectrum after the heat treatment at 200 ° C. for 5 minutes. FIG. 26A is a fluorescence micrograph before heat treatment, and FIG. 26B is a fluorescence micrograph after heat treatment. From the measurement results shown in FIG. 25 and the comparison between (A) and (B) in FIG. 26, it can be seen that the fluorescence intensity from Bacillus bacteria is greatly increased by the heat treatment.

Similarly, FIG. 27 shows the measurement results of the fluorescence spectrum of mold fungi, which are biologically derived particles. A curve 75 represents a spectrum before the heat treatment, and a curve 76 is a spectrum after the heat treatment at 200 ° C. for 5 minutes. FIG. 28A is a fluorescence micrograph before heat treatment, and FIG. 28B is a fluorescence micrograph after heat treatment. From the measurement results shown in FIG. 27 and a comparison between (A) and (B) in FIG. 28, it can be seen that the fluorescence intensity from the mold is significantly increased by the heat treatment.

On the other hand, FIG. 29 shows the measurement result of the fluorescence spectrum of the dust that emits fluorescence. A curve 77 represents a spectrum before the heat treatment, and a curve 78 is a spectrum after the heat treatment at 200 ° C. for 5 minutes. FIG. 30A is a fluorescence micrograph before heat treatment, and FIG. 30B is a fluorescence micrograph after heat treatment. In FIG. 29, the curve 77 and the curve 78 substantially overlap. That is, the comparison in FIG. 29 and the comparison between FIGS. 30A and 30B show that the fluorescence intensity from dust does not change before and after the heat treatment.

In this way, the control device 10 collects particles with the collection device 100, heats the collection substrate 200 with the heater 400 for a predetermined time, and heats the surface of the collection substrate 200 after being heated with the detector 300. Measure particles (take a particle image). Therefore, the control apparatus 10 can detect the particle | grains whose fluorescence intensity from the collection board | substrate 200 after a heating is more than the threshold value memorize | stored beforehand as a biological particle.

As another example, the following method may be used. The control device 10 collects particles with the collection device 100, moves the collection substrate 200 to the detector 300, and measures particles (takes a particle image) on the surface of the collection substrate 200 before heating. Thereafter, the collection substrate 200 is moved to the heater 400, and the collection substrate 200 is heated by the heater 400 for a predetermined time. Then, the collection board | substrate 200 is moved to the detector 300, and the particle | grains on the collection board | substrate 200 surface after a heating are measured (a particle image is image | photographed). Thereby, the control apparatus 10 can detect the particle | grains more than the threshold value which memorize | stored the difference of the fluorescence intensity from the collection board | substrate 200 before and behind a heating beforehand as a biological particle.

<Effect of the third embodiment>
Since the detection apparatus 500 according to the third embodiment has the above-described configuration, it does not require treatment with a fluorescent staining reagent or the like depending on the fluorescence intensity after heating or the difference in fluorescence intensity before and after heating. Particles can be separated from non-living particles and detected with high accuracy. In addition, since the control unit 10 controls the driving unit 5 which is driving means, and as a result, the movement of the collection substrate 200 can be controlled, a series of operations of collection, heating, and detection can be easily automated. be able to.

The embodiment disclosed this time should be considered as illustrative in all points and not restrictive. The scope of the present invention is defined by the terms of the claims, rather than the description above, and is intended to include any modifications within the scope and meaning equivalent to the terms of the claims.

1 housing, 1A opening, 2 nozzle substrate, 2A nozzle, 3 fan, 4 holding unit, 4B mounting table, 5 drive unit, 10 control device, 31 light source, 32 light receiving element, 33 light source lens, 34 lens, 35 Filter, 36 mirror, 61, 63 fixture, 62 O-ring, 100 collection device, 200 collection substrate, 300 detector, 400 heater, 500 detection device.

Claims

A device for collecting particles in a fluid introduced into the enclosure at the surface of a collection substrate set in the enclosure,
A nozzle substrate that is installed on at least one surface of the housing and has a nozzle drilled;
Introducing means for introducing the fluid outside the housing into the housing through the nozzle at a predetermined flow rate;
The collection substrate is provided in the housing between a first position outside the housing and a second position in the housing where the surface is a front surface in the direction of drilling the nozzle. Drive means for moving through the formed opening;
Resistance means for making the resistance to the fluid passing through the opening of the housing larger than the resistance to the fluid passing through the nozzle when the collection substrate is in the second position. And a collection device.
The resistance means covers a portion of the opening other than the driving means in a state where the driving means exists in the opening of the housing when the collection substrate is in the second position. The collection device according to claim 1, wherein the collection device is a fixed portion.
The collection device according to claim 2, wherein a member for increasing resistance to the fluid is installed at a position where the fixed portion and the opening are in contact with each other.
The said drive means is located outside the said housing when the said collection board | substrate becomes the said 2nd position, The said resistance means is a lid | cover which covers the said opening part of the said housing. Collection device.
The collecting device according to any one of claims 1 to 4,
A detector for detecting the particles collected on the surface of the collection substrate;
The said drive means is a detection apparatus which moves the said collection board | substrate to the said detector.
The detector includes a light source for irradiating excitation light and a light receiving element for receiving fluorescence,
The said drive means moves the said collection board | substrate to the 3rd position where the said surface of the said collection board | substrate is irradiated with the said excitation light from the said light source, after setting it as the said 2nd position. Detection device.
Further comprising a heater,
The detection device according to claim 6, wherein the driving unit moves the collection substrate to the third position after a predetermined time.