WO2014104753A1 - 플라즈마 반응기 및 이를 이용한 플라즈마 점화 방법 - Google Patents
플라즈마 반응기 및 이를 이용한 플라즈마 점화 방법 Download PDFInfo
- Publication number
- WO2014104753A1 WO2014104753A1 PCT/KR2013/012200 KR2013012200W WO2014104753A1 WO 2014104753 A1 WO2014104753 A1 WO 2014104753A1 KR 2013012200 W KR2013012200 W KR 2013012200W WO 2014104753 A1 WO2014104753 A1 WO 2014104753A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- plasma
- chamber
- floating
- magnetic core
- reactor
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/321—Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32458—Vessel
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32458—Vessel
- H01J37/32467—Material
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
- H05H1/24—Generating plasma
- H05H1/46—Generating plasma using applied electromagnetic fields, e.g. high frequency or microwave energy
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/32—Processing objects by plasma generation
- H01J2237/327—Arrangements for generating the plasma
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
- H05H1/24—Generating plasma
- H05H1/46—Generating plasma using applied electromagnetic fields, e.g. high frequency or microwave energy
- H05H1/4645—Radiofrequency discharges
- H05H1/4652—Radiofrequency discharges using inductive coupling means, e.g. coils
Definitions
- the present invention relates to a plasma reaction device and a plasma ignition method using the same, and more particularly, in the case of supplying a relatively low voltage in comparison with the conventional TCP, ICP coupled plasma source method (inductively coupled plasma source).
- ICP coupled plasma source method inductively coupled plasma source.
- the plasma discharge condition is relaxed compared to the conventional method, and also relates to a plasma half-unggi, which is advantageous for maintaining or continuing the plasma after the start of the plasma discharge, and a plasma ignition method using the same.
- Plasma refers to a gaseous state separated by electrons with negative charges and positively charged ions at very high temperatures. In this case, the charge separation is quite high and the number of negative and positive charges is the same as the whole.
- Polazuma is often called the fourth material state. This is because when energy is applied to a solid, it becomes a liquid and a gas, and when high energy is applied to this gas state, the gas is separated into electrons and atomic nuclei into a plasma state at tens of thousands of degrees Celsius.
- Plasma discharge is used for gas excitation to generate an active gas containing ions, free radicals, atoms, and molecules.
- Active gases are widely used in various fields and are typically used in semiconductor manufacturing processes such as etching, deposition, cleaning and ashing. It is used in various ways.
- remote plasma is known to be very useful in the semiconductor manufacturing process using plasma. For example, they are usefully used in cleaning process chambers and in etch processes for photoresist strips.
- Remote plasma reactors also referred to as remote full plasma generators use transformer-coupled plasma sources (TCPS) and inductively coupled plasma sources (ICPS).
- TCPS transformer-coupled plasma sources
- ICPS inductively coupled plasma sources
- the remote plasma reactor using a transformer cou led lasma source has a magnetic core with a primary winding coil in the toroidal reactor body.
- FIG. 1 is a view showing the configuration of a plasma processing apparatus.
- the plasma processing apparatus is composed of a remote plasma reactor and a process chamber 5.
- the remote plasma reactor is for supplying AC power to the toroidal plasma chamber 4, the magnetic core 3 installed in the plasma chamber 4, and the primary winding 2 wound on the magnetic core 3; It consists of an AC power supply source (1).
- Remote plasma When the evaporator enters the gas into the plasma chamber 4 and the AC power supplied from the power supply 1 is supplied to the primary winding 2 of the transformer and the primary winding is driven, the plasma chamber 4 Induced electromotive force is transferred to the inside and the reactor discharge loop 6 for plasma discharge is induced inside the plasma chamber 4 to generate plasma.
- the plasma chamber 4 is connected to the process chamber 5 through an adapter 9, and the plasma generated in the plasma chamber 4 is supplied to the process chamber 5, and the substrate to be processed in the process chamber 5 is provided. 2 and 3 show a conventional remote plasma generator.
- the remote plasma reactor has a primary winding 2 wound on the magnetic core 3 to receive AC power from an AC power supply 1.
- the plasma chamber 4 is discharged into a plasma state by discharging the gas in the plasma chamber 4 by the reactor discharge loop 6 formed therein.
- the plasma chamber 4 can be connected to ground 8.
- This conventional plasma chamber 4 is composed of a dielectric region (insulation section, 7) for preventing short circuit of the plasma chamber 4.
- the plasma chamber 4 is an annular structure formed of a conductor, all of the induced electromotive force to be induced into the plasma chamber 4 if the dielectric insulating region is not present in the plasma chamber 4 is entirely in the plasma chamber 4. Exhausted so that induced electromotive force is not induced into the plasma chamber 4.
- the plasma chamber 4 is provided with a dielectric region so that induced electromotive force can be induced into the plasma chamber 4.
- This dielectric region 7 may be made of a dielectric material such as ceramic.
- This conventional remote plasma reactor ignites the plasma by applying a high voltage of alternating current power.
- the ignition failure rate is about 2 to 3 times per 1000 times. In the case of such an ignition failure, a process for re-ignition is required, so that the process is delayed and a lot of costs are required for re-ignition.
- damage inside the plasma chamber 4 is generated by arc discharge.
- the plasma insulator 7 has a problem that the plasma is not easily damaged or damaged by the plasma generated inside the plasma chamber 4.
- An object of the present invention is to separate a floating area and a magnetic core installed area in a transformer coupled plasma source method or an inductively coupled plasma source method, and by using a large voltage difference that is deep in the potential difference of AC power. It is an object of the present invention to provide a plasma reaction device capable of plasma discharge even at a low voltage and a plasma ignition method using the same.
- Another object of the present invention is to provide a plasma reactor and a plasma ignition method using the same, which can easily generate a plasma discharge and easily maintain the generated plasma when the same voltage is supplied.
- Another object of the present invention is to supply a low-cost product, since the plasma discharge is possible even when the plasma is generated by supplying a relatively low voltage compared to the prior art, it is possible to minimize the damage of the plasma reaction by arc discharge Plasma van It is an object to provide a manhole and a plasma ignition method using the same. It is still another object of the present invention to provide a plasma reaction device and a plasma ignition method using the same, in which a gas flow rate is low and a ignition for plasma discharge can be easily performed even under a low pressure when supplying the same voltage as compared with the related art. There is a purpose.
- Still another object of the present invention is to provide a plasma reaction device and a plasma ignition method using the same, which can facilitate ignition for plasma discharge even at low temperature when supplying the same voltage as compared with the related art.
- the plasma reaction vessel of the present invention includes a magnetic core having a transformer primary winding; An AC power supply source for supplying AC power to a transformer primary winding wound on the magnetic core; A plasma chamber body in which the magnetic core is installed and induces induced electromotive force by directing a voltage directly through the magnetic core; And a floating chamber connected to the plasma chamber main body through an insulating region and transferring the induced electromotive force between the plasma chamber main body and the floating chamber according to a phase change of the AC power supplied from the AC power supply.
- the plasma chamber body and the floating chamber have a discharge path therein in a straight shape.
- the plasma reactor includes a plurality of full-lasma chamber bodies each of which the magnetic core is installed.
- the plasma chamber body and the floating chamber have a loop-shaped discharge path therein in a loop shape.
- the plasma reactor includes a plurality of plasma chamber bodies in which four or more magnetic cores are installed to form a symmetrical structure on a loop-shaped discharge path.
- the plasma chamber body and the floating chamber are made of the same material.
- the same material is aluminum.
- the same material is either a conductor or a dielectric.
- the dielectric is also ceramic.
- the plasma chamber body and the floating chamber are formed of a dielectric, and a conductor layer is formed on an outer circumferential surface of the plasma chamber body or the floating chamber.
- the insulation region is formed of a dielectric material, and the insulation region includes rubber for vacuum insulation.
- the dielectric is ceramic.
- the width of the insulation region is determined according to the voltage intensity of the AC power supplied from the AC power supply source. ⁇
- the floating chamber includes a resistor for discharging the charged charge after the plasma process; And the resistance and the flow after the plasma process is supplied to the process additive.
- a switching circuit for connecting the casting chamber.
- the plasma reactor of the present invention comprises a magnetic core having a transformer primary winding; An AC power supply source for supplying AC power to a transformer primary winding wound on the magnetic core; A plasma chamber body in which the magnetic core is installed and induces induced electromotive force by inducing a direct voltage through the magnetic core; And a plurality of floating chambers connected to the plasma chamber main body through an insulating area and to which the induced electromotive force is transmitted, wherein the plurality of floating chambers are connected through an insulating area and supplied from the AC power supply.
- the plasma reactor includes a plurality of plasma chamber bodies each of which the magnetic core is installed.
- the plasma chamber body and the floating additive have a loop-shaped discharge path therein in a loop shape.
- the plasma reactor includes a plurality of plasma chamber bodies in which four or more magnetic cores are installed to form a symmetrical structure on a loop-shaped discharge path.
- the plasma chamber body and the floating chamber are made of the same material.
- the same material is aluminum.
- the same material is either a conductor or a dielectric.
- the dielectric is also ceramic.
- the plasma chamber body and the floating chamber are formed of a dielectric, and a conductor layer is formed on an outer circumferential surface of the plasma chamber body or the floating chamber.
- the insulation region is also formed of a dielectric and the insulation region comprises rubber for vacuum insulation.
- the dielectric is ceramic.
- the width of the insulation region is determined according to the voltage intensity of the AC power supplied from the AC power supply source.
- the floating additive comprises a resistor for discharging the charged charge after the plasma process; And a switching circuit for connecting the resistor and the floating chamber after the plasma process is supplied to the process chamber.
- the insulation region is further formed at the gas inlet and the gas outlet of the plasma reactor.
- the insulating region is formed at a position crossing the plasma chamber body in which the magnetic core is installed.
- the insulating region is further formed in the gas inlet of the plasma reactor.
- the insulating region is further formed at the gas outlet of the plasma reactor.
- any one of the plurality of floating chambers is connected to ground.
- Plasma ignition method using the plasma reaction device of the present invention comprises the steps of receiving gas through the gas inlet, the primary winding wound on the magnetic core is supplied with AC power from the AC power supply; Inducing induced electromotive force directly to the plasma chamber main body in which the magnetic core is installed; Inducing electromotive force induced in the plasma chamber body to be transferred to a plurality of floating chambers to induce plasma discharge in the reaction chamber body; The discharged plasma is supplied to the process chamber through a gas outlet; And the floating chamber and a step which is connected to the resistor in order to discharge the charged electric charge which was after the plasma discharge is induced.
- the floating chamber is connected to the high resistance through a switching circuit.
- Plasma reaction device of the present invention and a plasma ignition method using the same have the following effects.
- FIG. 1 is a view for explaining the TCP / ICP combined plasma reactor according to the prior art.
- FIGS. 2 and 3 are views for explaining the ignition of the TCP / ICP combined plasma reaction reactor according to the prior art.
- FIG. 4 is a diagram for explaining a TCP / ICP combined plasma reactor according to a first embodiment of the present invention.
- FIG. 5 is a diagram illustrating a TCP / ICP combined plasma reactor according to a second embodiment of the present invention.
- FIG. 6 is a diagram illustrating a TCP / ICP combined plasma reactor according to a third embodiment of the present invention.
- FIG. 7 is a diagram for explaining a TCP / ICP combined plasma reactor according to a fourth embodiment of the present invention.
- FIG 8 is a view for explaining a TCP / ICP coupled plasma reactor according to a fifth embodiment of the present invention.
- FIG. 9 is a diagram illustrating a TCP / ICP combined plasma reactor according to a sixth embodiment of the present invention.
- FIG. 10 is a diagram for explaining a TCP / ICP combined plasma reactor according to a seventh embodiment of the present invention.
- FIG. 11 is a diagram illustrating a TCP / ICP combined plasma reactor according to an eighth embodiment of the present invention.
- FIG. 12 is a diagram for explaining a TCP / ICP combined plasma reactor according to a ninth embodiment of the present invention.
- FIG. 13 is a diagram illustrating a TCP / ICP combined plasma reactor according to a tenth embodiment of the present invention.
- FIG. 14 is a diagram illustrating a TCP / ICP combined plasma reactor according to an eleventh embodiment of the present invention.
- FIG. 15 is a diagram illustrating a TCP / ICP combined plasma reactor according to a twelfth embodiment of the present invention.
- FIG. 16 is a diagram illustrating a TCP / ICP combined plasma reactor according to a thirteenth embodiment of the present invention.
- FIG. 17 is a diagram illustrating a TCP / ICP combined plasma reactor according to a fourteenth embodiment of the present invention.
- FIG. 18 is a diagram illustrating a TCP / ICP combined plasma reactor according to a fifteenth embodiment of the present invention.
- FIG. 19 is a diagram to describe a TCP / ICP combined plasma reactor according to a sixteenth embodiment of the present invention.
- FIG. 20 is a diagram illustrating a TCP / ICP combined plasma reactor in accordance with a seventeenth embodiment of the present invention.
- FIG. 21 is a diagram illustrating a TCP / ICP combined plasma reactor in accordance with an eighteenth embodiment of the present invention. It is a figure for illustration.
- the plasma reaction vessel 10 includes a plasma chamber main body 14a, first and second floating chambers 14b and 14c, a magnetic core 13, and an alternating current power source 11.
- the plasma reactor 14 in the present invention is a remote plasma generator of a transformer coupled plasma generation method.
- the plasma reactor 10 has a discharge space for plasma discharge therein.
- the plasma reactor 10 is provided with a gas inlet 16a and a gas outlet 16b.
- the gas main inlet 16a is connected with a gas supply source for supplying a process gas for plasma discharge,
- the process gas supplied from the gas source is introduced into the reaction body 14 through the gas inlet 16b.
- the gas outlet 16b is connected to a process chamber (not shown), and the plasma generated in the plasma reaction vessel 10 is supplied to the process chamber (not shown) through the gas outlet 16b.
- the plasma reactor 10 has a loop-shaped discharge path and includes a plasma chamber body 14a, first and second floating chambers 14b and 14c, and an insulating region 19.
- the magnetic core 13 is installed in the plasma chamber main body Wa, and induced voltage is induced by directing the voltage.
- the first and second floating chambers 14b and 14c are connected through the insulating region 19 about the plasma chamber body 14a.
- the first and second floating chambers 14b and 14c are floated so that the induced electromotive force induced in the plasma chamber body 14a can be indirectly transferred.
- An insulating region 19 is provided between the plasma chamber body 14 and the floating chamber 14a to insulate the plasma chamber body 14 and the floating chamber 14a.
- the insulating region 19 can adjust the width according to the voltage intensity of the AC power supplied from the AC power source 11. When the voltage of the AC power is a high voltage, it can be relatively wider than the low voltage. In other words, the insulating region 9 can be used to adjust the distance between the plasma chamber body 14 and the floating chamber 14a. For example, when the voltage of the AC power supplied from the AC power source 11 is a high voltage, the plasma chamber body 14a and the first and second floating chambers 14b and 14c are relatively higher than when the low voltage is supplied. The insulating region 19 is formed so that the space
- the plasma chamber body 14a and the first and second floating chambers 14b and 14c may be formed of a conductor such as aluminum or a dielectric such as ceramic.
- Plasma chamber body 14a When the first and second following chambers 14c and 14c are formed of a conductor such as aluminum, the insulation region 19 may be formed of a dielectric, and in particular, may be formed of a ceramic.
- the insulating region 19 may comprise rubber for vacuum insulation of the plasma reaction vessel 10.
- a conductor layer can be formed on the outer circumferential surface.
- the plasma reaction vessel 10 is formed in a toroidal shape or linear.
- the magnetic core 13 is made of ferrite material and installed in the plasma chamber body 14a of the plasma reactor 10.
- the magnetic core 13 is wound around the primary winding 12 which is the primary winding of the transformer.
- the AC power source 11 supplies AC power to the primary winding 12 wound on the magnetic core 13.
- the AC power supply 11 supplies the AC power of the inverted phase to the primary winding 12 according to the set frequency (Hz).
- the AC power source 11 may include a control circuit for impedance matching, and may supply power to the primary winding 12 through a separate impedance matcher.
- Each of the magnetic cores 13 may be wound around the primary windings 12 to receive AC power from different AC power supply sources 11, and one primary winding 12 may be wound together to form one AC power supply. AC power may be supplied from the source 11.
- Reactor discharge induced in the plasma reaction vessel 10 when gas flows into the gas inlet 16a of the plasma reaction vessel 10 and AC power is supplied from the AC power supply source 11 to drive the primary winding 12.
- Plasma is generated in the plasma discharge space by the loop 15.
- the plasma generated in the plasma reactor 10 is supplied to a process chamber (not shown) for processing the substrate.
- the plasma chamber body provided with the magnetic core 13 Direct induced electromotive force is induced at 14a.
- the first and second floating chambers 14b and 14c are insulated from the plasma chamber main body 14a by the insulating region 19 so that induced electromotive force induced directly in the plasma chamber main body Ma through the insulating region 19 is reduced. Indirectly delivered.
- the insulating region 19 is configured to be adjacent to the magnetic core 13 so that a large voltage difference is generated between the plasma chamber body 14a and the first and second floating chambers 14b and 14c. At this time, the first and second floating chambers 14b and 14c do not directly react to the voltage induced in the plasma chamber body 14 by the insulating region 19, as shown in FIG. I want to maintain state.
- the AC power source 11 supplies the AC power of the inverted phase in accordance with the set frequency, a large voltage difference occurs between the plasma chamber main body 14a and the first and second floating chambers 14b and 14c. Therefore, the plasma discharge can be made even at a low voltage by maximizing the voltage difference generated between the plasma chamber body 14a and the first and second floating chambers 14b and 14c.
- the independent first and second floating chambers 14b and 14c have phases opposite to each other. Therefore, when the supply voltage is reduced to 1/2, the same or similar effect can be obtained when the plasma is ignited. In such a case, the plasma chamber body 14a or the first and second floating chambers 14b by arc discharge can be seen. , 14c) damage can be reduced. In addition, if the supply voltage is maintained at 500V, the effect is the same as applying a voltage of about 950V. It can be seen that the effect of the plasma discharge is about 2 times smoother.
- the first and second floating chambers 14b and 14c may be formed with regions that are wholly or partially floated. In addition, the first and second floating chambers 14b and 14c may be connected to the high resistance 20 by the switching circuit 22.
- the induced electromotive force is induced directly to the plasma chamber body 14a in which the magnetic core 13 is installed. do.
- the induced electromotive force induced in the plasma chamber main body 14a is transferred to the first and second plasma chambers 14b and 14c, thereby causing plasma discharge in the plasma reaction device 10.
- the generated plasma is supplied to the process chamber.
- FIG. 5 is a diagram illustrating a TCP / ICP combined plasma reactor according to a second embodiment of the present invention.
- the plasma reaction vessel 10a is composed of a plasma chamber body 14a on which a magnetic core 13 is installed and a plurality of floating chambers 14b, 14c, 14d, We, 14f, and 14g. do.
- the plurality of floating burs 141 (14c, 14d, 14e, 14f, 14g) are insulated from the plasma chamber body 14a and the floating chamber through the insulating region 19.
- the voltage induced directly to the plasma chamber body 14a through the magnetic core 13 is 3, 4, 5, 6 flow. It is indirectly transferred to the wooting chambers 14d, 14e, 14f, 14g, and the transferred voltage is transferred back to the first and second floating chambers 14b, 14c.
- FIG. 6 is a diagram illustrating a TCP / ICP coupled plasma reactor according to a third embodiment of the present invention.
- FIG. 7 is a diagram illustrating a TCP / ICP coupled plasma reactor according to a fourth embodiment of the present invention. Is a view for explaining a TCP / ICP combined plasma reactor according to a fifth embodiment of the present invention.
- the plasma reaction vessel 10b has a loop shape, and an insulator 19a is formed at the gas injection hole 16a of the plasma reactor 10b.
- the plurality of insulating regions 19 are formed between the plasma chamber main body 14a and the first and second floating chambers 14b and 14c, and an insulator 19a is formed in the gas injection hole 16a so that the gas injection hole is provided. Make sure 16a is insulated.
- the insulator 19a is formed in the gas outlet 16b of the plasma reaction vessel 10c.
- the plurality of insulating regions 19 are formed between the plasma chamber main body 14a and the first and second following chambers 14b and 14c, and an insulator 19a is formed at the gas outlet 16b so that the gas Allow outlet 16b to be insulated.
- the insulator 19a is formed in the gas inlet 16a and the gas outlet 16b of the plasma resonator 10d.
- the plurality of insulating regions 19 are formed between the plasma chamber main body 14a and the first and second floating chambers 14b and 14c, and each of the gas inlet 16a and the gas outlet 16b has an insulator ( 19a) is formed so that the gas inlet 16a
- the gas outlet 16b is insulated.
- 9 is a view for explaining a TCP / ICP combined plasma reactor according to a sixth embodiment of the present invention.
- a plurality of insulating regions 19 are formed symmetrically in the reaction vessel body 14, and separate the plasma chamber body 14a and the plurality of floating chambers.
- the plasma chamber body 14a, the first and second floating chambers 14b and 14c, the plasma chamber body 14a, and the third and fifth following floating chambers 14d and 14f provided with the magnetic core 13 are It is connected via an insulating region 19.
- the sixth floating chamber 14g at the position intersecting with the plasma chamber body 14a is connected to the second and fifth floating chambers 14c and 14f through the insulating region 19, and the fourth floating chamber. 14e is connected to the first and third floating chambers 14b and 14d through the insulating region 19.
- FIG. 10 is a diagram illustrating a TCP / ICP combined plasma reactor according to a seventh embodiment of the present invention.
- the plasma reaction vessel 10f may include a plasma chamber body 14a and first to sixth floating chambers 14b, 14c, 14d, 14e, 14f, and 14g as a dielectric.
- the conductor layer 16 may be formed in the plasma chamber body 14a and the first through sixth floating chambers 14b, 14c, 14d, 14e, 14f, and 14g.
- the conductor insect 16 is formed on the outer circumferential surface of the plasma chamber body 14a by way of example.
- Conductor layer 16 Including the plasma reactor may be equally applicable to all the embodiments described above.
- FIG. 11 is a view for explaining a TCP / ICP combined plasma reaction device according to an eighth embodiment of the present invention
- FIG. 12 is a view for explaining a TCP / ICP combined plasma reaction device according to a ninth embodiment of the present invention. .
- the plasma reaction vessel 30 includes a gas inlet 36a and a gas outlet 36b, and the plasma chamber body 34a and the first and second floating chambers 34b and 34c are straight. (Linear) is formed.
- the first and second floating chambers 34b and 34c around the plasma chamber body 34a are insulated from the plasma chamber body 34a through the insulating region 19.
- the plasma chamber main body 34a in which the magnetic core 13 is installed is directly induced with voltage, and the first and second floating chambers 34b and 34c are indirectly transferred with voltage through the insulating region 19. Referring to FIG.
- the plasma reaction vessel 30a includes the plasma chamber main body 34a and the first, second, third and fourth floating chambers 34b, 34c, 34d, and 34e through the plurality of insulating regions 19. ) Is insulated.
- FIG. 13 is a view for explaining a TCP / ICP combined plasma reaction device according to a tenth embodiment of the present invention.
- FIG. 14 is a view for explaining a TCP / ICP combined plasma reaction device according to an eleventh embodiment of the present invention.
- FIG. 15 is a view for explaining a TCP / ICP coupled plasma reactor according to a twelfth embodiment of the present invention.
- a plurality of plasma reactors 40, 40a, 40b are installed. Shows a state in which the primary windings 12 wound on the magnetic core 13 are connected in series, in parallel, and in series and parallel mixed form.
- the plasma reactor 40 includes a linear semi-aerator body 44 including a gas inlet 46a and a gas outlet 46b.
- the plasma reaction vessel 40 is formed in a linear shape and has one discharge path therein.
- the plasma reaction machine 40 is provided with a plurality of magnetic cores 13.
- the plasma reaction vessel 40 is composed of a plasma chamber body 44a on which the magnetic core 13 is installed and a plurality of floating chambers 44b and 44c.
- the plasma chamber body 44a is connected to the plurality of floating chambers 44b and 44c through the insulating region 19.
- the plasma chamber body 44a and the first and second floating chambers 44b and 44c are alternately arranged to form a plasma reaction vessel 40.
- the plurality of magnetic cores 13 are wound and connected to each other using one primary winding 12, and the primary winding 12 may receive AC power from one AC power supply 11.
- the plasma reaction vessel 40a has the same configuration as the plasma reaction vessel 40 of FIG. 13, and the primary windings 12 are wound around the plurality of magnetic cores 13, respectively.
- the primary winding of 12 may receive AC power from different AC power supply (11). Different AC power sources 11 may supply AC power of the same frequency or supply AC power of different frequencies.
- the plasma reaction vessel 40b has the same configuration as that of the plasma reactor 40 of FIG. 13, and the plurality of magnetic cores 13 use one primary winding 12 at a time.
- the primary winding 12 can be wound, and can receive AC power from one AC power supply 11.
- multiple magnetic cores in various ways The primary winding 12 can be wound at (13).
- FIG. 16 is a diagram illustrating a TCP / ICP combined plasma reactor according to a thirteenth embodiment of the present invention.
- the plasma reaction vessel 50 includes a gas inlet 56a and a gas outlet 56b, and includes a square-shaped reaction body 54 having a discharge path in a loop shape therein.
- the plasma reactor 50 is provided with a plurality of magnetic cores 13, the plurality of magnetic cores 13 are installed on the path facing each other on the discharge path of the loop form.
- the plasma chamber main body 54a in which the magnetic core 13 is installed is a region in which direct induced electromotive force is induced, and the first, second, third, and fourth are connected between the plasma chamber main bodies 54a through an insulating region 19.
- the floating chambers 54b, 54c, 54d, 54e are regions in which induced electromotive force is induced indirectly from the plasma chamber body 54a.
- FIG. 17 illustrates a TCP / ICP coupled plasma reactor according to a fourteenth embodiment of the present invention.
- the plasma reactor 50a includes a rectangular plasma reactor 50a having a loop-shaped discharge path therein in the same configuration as the plasma reactor 50 shown in FIG. 16.
- the plurality of magnetic cores 13 are installed in a symmetrical position on the loop-shaped discharge path.
- four magnetic cores 13 may be symmetrically installed in the plasma reactor 50a which forms each side of the square-shaped plasma reactor 50a.
- one each of each side of the plasma reaction machine (50a) The above magnetic core 13 may be installed.
- the plasma chamber body 54a provided with the magnetic core 13 is connected to the first, second, third and fourth floating chambers 54b, 54c, 54d and 54e through the insulating region 19.
- FIG. 18 is a diagram illustrating a TCP / ICP combined plasma reactor according to a fifteenth embodiment of the present invention.
- the plasma reactor 60 includes a circular plasma reactor 60 having a gas inlet 66a and a gas outlet 66b and having a discharge path in a loop shape therein.
- the plurality of magnetic cores 13 are installed along the circular plasma reaction vessel 60.
- the plasma chamber main body 64a provided with the magnetic core 13 is connected to the first, second, third and fourth floating chambers 64b, 64c, 64d and 64e through the insulating region 19.
- FIGS. 17 and 18 are exemplary and may be modified into various shapes of plasma reactors having a loop-shaped discharge path.
- 19 is a diagram illustrating a TCP / ICP coupled plasma reactor according to a sixteenth embodiment of the present invention.
- the plasma reaction vessel 70 has a loop shape, and the gas inlet 76a and the gas outlet 76b are located in the center of the first and second floating chambers 74b and 74c in a straight line, respectively. .
- the first and second floating chambers 74b and 74c are connected to the plasma chamber body 74a through the insulating region 19.
- the plurality of magnetic cores 13 are shown in FIGS. 16 and 17. As shown, it may be installed in the plasma reaction device 70 so as to face each other or symmetrically located on the discharge path.
- 20 is a diagram for describing a TCP / ICP combined plasma reactor according to a seventeenth embodiment of the present invention.
- the plasma reaction vessel 70a has the same configuration as the plasma reaction vessel 70 shown in FIG. 19, and further includes an insulator 19a at the gas inlet 76a and the gas outlet 76b, respectively. do.
- the insulator 19a electrically insulates the gas inlet 76a and the gas outlet 76b, respectively.
- the insulator 19a may be provided only at the gas inlet 76a or may be provided only at the gas outlet 76b.
- 21 is a diagram illustrating a TCP / ICP combined plasma reactor according to an eighteenth embodiment of the present invention.
- the plasma reaction vessel 70b has the same configuration as the plasma reaction vessel 70 shown in FIG. 19, and the second pulling chamber 74c including the gas outlet 76b is connected to ground. Connected. Therefore, the first floating chamber 74b and the third and fourth floating chambers 74d and 74e including the gas injection hole 76a are then connected to the high resistance 20 through the plasma circuit through the switching circuit 22. . Although not shown in the present invention, any one of the plurality of floating chambers may be connected to ground.
- the plasma reactor of the present invention described above and the plasma ignition using the same The embodiment of the method is merely exemplary, and it will be appreciated by those skilled in the art that various modifications and equivalent other embodiments are possible.
- Magnetic core 4 Plasma chamber
- Insulation area 19a Insulator : High resistance 22: Switching circuit
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electromagnetism (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Plasma Technology (AREA)
- Chemical Vapour Deposition (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Abstract
Description
Claims
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP13867632.5A EP2844042A4 (en) | 2012-12-28 | 2013-12-26 | PLASMA REACTOR AND PLASMA IGNITION METHOD THEREOF |
JP2014554679A JP5962773B2 (ja) | 2012-12-28 | 2013-12-26 | プラズマ反応器及びこれを用いたプラズマ点火方法 |
US14/402,610 US20150303031A1 (en) | 2012-12-28 | 2013-12-26 | Plasma reactor and plasma ignition method using the same |
CN201380004082.0A CN104025720B (zh) | 2012-12-28 | 2013-12-26 | 等离子体反应器及利用该反应器的等离子体点火方法 |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2012-0156816 | 2012-12-28 | ||
KR1020120156816A KR101468726B1 (ko) | 2012-12-28 | 2012-12-28 | 플라즈마 반응기 |
KR10-2013-0163632 | 2013-12-26 | ||
KR1020130163632A KR101468404B1 (ko) | 2013-12-26 | 2013-12-26 | 플라즈마 반응기 및 이를 이용한 플라즈마 점화 방법 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2014104753A1 true WO2014104753A1 (ko) | 2014-07-03 |
Family
ID=51021708
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/KR2013/012200 WO2014104753A1 (ko) | 2012-12-28 | 2013-12-26 | 플라즈마 반응기 및 이를 이용한 플라즈마 점화 방법 |
Country Status (4)
Country | Link |
---|---|
US (1) | US20150303031A1 (ko) |
JP (1) | JP5962773B2 (ko) |
CN (1) | CN104025720B (ko) |
WO (1) | WO2014104753A1 (ko) |
Families Citing this family (65)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9132436B2 (en) | 2012-09-21 | 2015-09-15 | Applied Materials, Inc. | Chemical control features in wafer process equipment |
US10256079B2 (en) | 2013-02-08 | 2019-04-09 | Applied Materials, Inc. | Semiconductor processing systems having multiple plasma configurations |
US9355922B2 (en) | 2014-10-14 | 2016-05-31 | Applied Materials, Inc. | Systems and methods for internal surface conditioning in plasma processing equipment |
US9966240B2 (en) | 2014-10-14 | 2018-05-08 | Applied Materials, Inc. | Systems and methods for internal surface conditioning assessment in plasma processing equipment |
US11637002B2 (en) | 2014-11-26 | 2023-04-25 | Applied Materials, Inc. | Methods and systems to enhance process uniformity |
US10573496B2 (en) | 2014-12-09 | 2020-02-25 | Applied Materials, Inc. | Direct outlet toroidal plasma source |
US9728437B2 (en) | 2015-02-03 | 2017-08-08 | Applied Materials, Inc. | High temperature chuck for plasma processing systems |
US20160225652A1 (en) | 2015-02-03 | 2016-08-04 | Applied Materials, Inc. | Low temperature chuck for plasma processing systems |
US9741593B2 (en) | 2015-08-06 | 2017-08-22 | Applied Materials, Inc. | Thermal management systems and methods for wafer processing systems |
US9691645B2 (en) | 2015-08-06 | 2017-06-27 | Applied Materials, Inc. | Bolted wafer chuck thermal management systems and methods for wafer processing systems |
US9349605B1 (en) | 2015-08-07 | 2016-05-24 | Applied Materials, Inc. | Oxide etch selectivity systems and methods |
US10504700B2 (en) | 2015-08-27 | 2019-12-10 | Applied Materials, Inc. | Plasma etching systems and methods with secondary plasma injection |
JP6548991B2 (ja) * | 2015-08-28 | 2019-07-24 | 株式会社ダイヘン | プラズマ生成装置 |
US10522371B2 (en) | 2016-05-19 | 2019-12-31 | Applied Materials, Inc. | Systems and methods for improved semiconductor etching and component protection |
US10504754B2 (en) | 2016-05-19 | 2019-12-10 | Applied Materials, Inc. | Systems and methods for improved semiconductor etching and component protection |
US9865484B1 (en) | 2016-06-29 | 2018-01-09 | Applied Materials, Inc. | Selective etch using material modification and RF pulsing |
US10629473B2 (en) | 2016-09-09 | 2020-04-21 | Applied Materials, Inc. | Footing removal for nitride spacer |
JP6746865B2 (ja) * | 2016-09-23 | 2020-08-26 | 株式会社ダイヘン | プラズマ生成装置 |
US10546729B2 (en) | 2016-10-04 | 2020-01-28 | Applied Materials, Inc. | Dual-channel showerhead with improved profile |
US9934942B1 (en) | 2016-10-04 | 2018-04-03 | Applied Materials, Inc. | Chamber with flow-through source |
US10163696B2 (en) | 2016-11-11 | 2018-12-25 | Applied Materials, Inc. | Selective cobalt removal for bottom up gapfill |
US10026621B2 (en) | 2016-11-14 | 2018-07-17 | Applied Materials, Inc. | SiN spacer profile patterning |
US10431429B2 (en) | 2017-02-03 | 2019-10-01 | Applied Materials, Inc. | Systems and methods for radial and azimuthal control of plasma uniformity |
US10319739B2 (en) | 2017-02-08 | 2019-06-11 | Applied Materials, Inc. | Accommodating imperfectly aligned memory holes |
US10943834B2 (en) | 2017-03-13 | 2021-03-09 | Applied Materials, Inc. | Replacement contact process |
US11276590B2 (en) | 2017-05-17 | 2022-03-15 | Applied Materials, Inc. | Multi-zone semiconductor substrate supports |
US11276559B2 (en) | 2017-05-17 | 2022-03-15 | Applied Materials, Inc. | Semiconductor processing chamber for multiple precursor flow |
US10497579B2 (en) | 2017-05-31 | 2019-12-03 | Applied Materials, Inc. | Water-free etching methods |
US10920320B2 (en) | 2017-06-16 | 2021-02-16 | Applied Materials, Inc. | Plasma health determination in semiconductor substrate processing reactors |
US10541246B2 (en) | 2017-06-26 | 2020-01-21 | Applied Materials, Inc. | 3D flash memory cells which discourage cross-cell electrical tunneling |
US10727080B2 (en) | 2017-07-07 | 2020-07-28 | Applied Materials, Inc. | Tantalum-containing material removal |
US10541184B2 (en) | 2017-07-11 | 2020-01-21 | Applied Materials, Inc. | Optical emission spectroscopic techniques for monitoring etching |
US10043674B1 (en) | 2017-08-04 | 2018-08-07 | Applied Materials, Inc. | Germanium etching systems and methods |
US10297458B2 (en) | 2017-08-07 | 2019-05-21 | Applied Materials, Inc. | Process window widening using coated parts in plasma etch processes |
KR101960073B1 (ko) * | 2017-10-27 | 2019-03-20 | 주식회사 뉴파워 프라즈마 | 반도체 공정용 기판 처리 시스템 |
KR102014887B1 (ko) * | 2017-10-27 | 2019-08-28 | 주식회사 뉴파워 프라즈마 | 선택적으로 라디칼을 공급하는 라디칼 발생기 |
US10903054B2 (en) | 2017-12-19 | 2021-01-26 | Applied Materials, Inc. | Multi-zone gas distribution systems and methods |
US11328909B2 (en) | 2017-12-22 | 2022-05-10 | Applied Materials, Inc. | Chamber conditioning and removal processes |
US10854426B2 (en) | 2018-01-08 | 2020-12-01 | Applied Materials, Inc. | Metal recess for semiconductor structures |
US10964512B2 (en) | 2018-02-15 | 2021-03-30 | Applied Materials, Inc. | Semiconductor processing chamber multistage mixing apparatus and methods |
US10679870B2 (en) | 2018-02-15 | 2020-06-09 | Applied Materials, Inc. | Semiconductor processing chamber multistage mixing apparatus |
TWI766433B (zh) | 2018-02-28 | 2022-06-01 | 美商應用材料股份有限公司 | 形成氣隙的系統及方法 |
US10593560B2 (en) * | 2018-03-01 | 2020-03-17 | Applied Materials, Inc. | Magnetic induction plasma source for semiconductor processes and equipment |
US10319600B1 (en) | 2018-03-12 | 2019-06-11 | Applied Materials, Inc. | Thermal silicon etch |
US10497573B2 (en) | 2018-03-13 | 2019-12-03 | Applied Materials, Inc. | Selective atomic layer etching of semiconductor materials |
US10573527B2 (en) | 2018-04-06 | 2020-02-25 | Applied Materials, Inc. | Gas-phase selective etching systems and methods |
US10490406B2 (en) | 2018-04-10 | 2019-11-26 | Appled Materials, Inc. | Systems and methods for material breakthrough |
US10699879B2 (en) | 2018-04-17 | 2020-06-30 | Applied Materials, Inc. | Two piece electrode assembly with gap for plasma control |
US10886137B2 (en) | 2018-04-30 | 2021-01-05 | Applied Materials, Inc. | Selective nitride removal |
KR102113294B1 (ko) * | 2018-05-31 | 2020-06-16 | (주) 엔피홀딩스 | 절연구간이 개선된 플라즈마 발생기 |
US10755941B2 (en) | 2018-07-06 | 2020-08-25 | Applied Materials, Inc. | Self-limiting selective etching systems and methods |
US10872778B2 (en) | 2018-07-06 | 2020-12-22 | Applied Materials, Inc. | Systems and methods utilizing solid-phase etchants |
US10672642B2 (en) | 2018-07-24 | 2020-06-02 | Applied Materials, Inc. | Systems and methods for pedestal configuration |
US11049755B2 (en) | 2018-09-14 | 2021-06-29 | Applied Materials, Inc. | Semiconductor substrate supports with embedded RF shield |
US10892198B2 (en) | 2018-09-14 | 2021-01-12 | Applied Materials, Inc. | Systems and methods for improved performance in semiconductor processing |
US11062887B2 (en) | 2018-09-17 | 2021-07-13 | Applied Materials, Inc. | High temperature RF heater pedestals |
US11417534B2 (en) | 2018-09-21 | 2022-08-16 | Applied Materials, Inc. | Selective material removal |
US11682560B2 (en) | 2018-10-11 | 2023-06-20 | Applied Materials, Inc. | Systems and methods for hafnium-containing film removal |
US11121002B2 (en) | 2018-10-24 | 2021-09-14 | Applied Materials, Inc. | Systems and methods for etching metals and metal derivatives |
US11437242B2 (en) | 2018-11-27 | 2022-09-06 | Applied Materials, Inc. | Selective removal of silicon-containing materials |
US11721527B2 (en) | 2019-01-07 | 2023-08-08 | Applied Materials, Inc. | Processing chamber mixing systems |
US10920319B2 (en) | 2019-01-11 | 2021-02-16 | Applied Materials, Inc. | Ceramic showerheads with conductive electrodes |
KR102339549B1 (ko) * | 2020-03-03 | 2021-12-14 | 김철식 | 다중 정합코일을 구비한 플라즈마 처리장치 |
WO2022002382A1 (en) * | 2020-07-01 | 2022-01-06 | Applied Materials, Inc. | Method for operating a chamber, apparatus for processing a substrate, and substrate processing system |
CN114501765A (zh) * | 2022-01-26 | 2022-05-13 | 江苏神州半导体科技有限公司 | 基于多线圈耦合的气体解离电路及气体解离系统 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100500852B1 (ko) * | 2002-10-10 | 2005-07-12 | 최대규 | 원격 플라즈마 발생기 |
KR20050092277A (ko) * | 2004-03-15 | 2005-09-21 | 주식회사 뉴파워 프라즈마 | 다중 배열된 진공 챔버를 구비한 플라즈마 반응 챔버 |
KR20050103183A (ko) * | 2003-04-16 | 2005-10-27 | 엠케이에스 인스트루먼츠, 인코포레이티드 | 절연성 진공 용기를 갖는 토로이드형 로필드 반응성 가스와 플라즈마 소스 |
KR20100010568A (ko) * | 2008-07-23 | 2010-02-02 | 주식회사 뉴파워 프라즈마 | 내부 보호막의 손상 상태를 감지할 수 있는 플라즈마반응기 및 그 제어 방법 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE59202116D1 (de) * | 1991-04-23 | 1995-06-14 | Balzers Hochvakuum | Verfahren zur Abtragung von Material von einer Oberfläche in einer Vakuumkammer. |
JP3365511B2 (ja) * | 1993-04-05 | 2003-01-14 | セイコーエプソン株式会社 | ろう材による接合方法及び装置 |
US5607542A (en) * | 1994-11-01 | 1997-03-04 | Applied Materials Inc. | Inductively enhanced reactive ion etching |
US6114809A (en) * | 1998-02-02 | 2000-09-05 | Winsor Corporation | Planar fluorescent lamp with starter and heater circuit |
DE19835883A1 (de) * | 1998-08-07 | 2000-02-17 | Siemens Ag | Herstellungsverfahren für einen elektrischen Isolator |
FR2817444B1 (fr) * | 2000-11-27 | 2003-04-25 | Physiques Ecp Et Chimiques | Generateurs et circuits electriques pour alimenter des decharges instables de haute tension |
US7396582B2 (en) * | 2001-04-06 | 2008-07-08 | Advanced Cardiovascular Systems, Inc. | Medical device chemically modified by plasma polymerization |
US6724148B1 (en) * | 2003-01-31 | 2004-04-20 | Advanced Energy Industries, Inc. | Mechanism for minimizing ion bombardment energy in a plasma chamber |
JP4460940B2 (ja) * | 2003-05-07 | 2010-05-12 | 株式会社ニューパワープラズマ | 多重放電管ブリッジを備えた誘導プラズマチャンバ |
FR2950133B1 (fr) * | 2009-09-14 | 2011-12-09 | Commissariat Energie Atomique | Dispositif d'echange thermique a efficacite amelioree |
US9035553B2 (en) * | 2011-11-09 | 2015-05-19 | Dae-Kyu Choi | Hybrid plasma reactor |
-
2013
- 2013-12-26 WO PCT/KR2013/012200 patent/WO2014104753A1/ko active Application Filing
- 2013-12-26 US US14/402,610 patent/US20150303031A1/en not_active Abandoned
- 2013-12-26 CN CN201380004082.0A patent/CN104025720B/zh not_active Expired - Fee Related
- 2013-12-26 JP JP2014554679A patent/JP5962773B2/ja not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100500852B1 (ko) * | 2002-10-10 | 2005-07-12 | 최대규 | 원격 플라즈마 발생기 |
KR20050103183A (ko) * | 2003-04-16 | 2005-10-27 | 엠케이에스 인스트루먼츠, 인코포레이티드 | 절연성 진공 용기를 갖는 토로이드형 로필드 반응성 가스와 플라즈마 소스 |
KR20050092277A (ko) * | 2004-03-15 | 2005-09-21 | 주식회사 뉴파워 프라즈마 | 다중 배열된 진공 챔버를 구비한 플라즈마 반응 챔버 |
KR20100010568A (ko) * | 2008-07-23 | 2010-02-02 | 주식회사 뉴파워 프라즈마 | 내부 보호막의 손상 상태를 감지할 수 있는 플라즈마반응기 및 그 제어 방법 |
Also Published As
Publication number | Publication date |
---|---|
CN104025720A (zh) | 2014-09-03 |
JP5962773B2 (ja) | 2016-08-03 |
JP2015512117A (ja) | 2015-04-23 |
US20150303031A1 (en) | 2015-10-22 |
CN104025720B (zh) | 2016-08-24 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
WO2014104753A1 (ko) | 플라즈마 반응기 및 이를 이용한 플라즈마 점화 방법 | |
JP7530666B2 (ja) | 誘導コイル構造体及び誘導結合プラズマ発生装置 | |
JP5257917B2 (ja) | 多重マグネチックコアが結合された誘導結合プラズマ反応器 | |
US8343309B2 (en) | Substrate processing apparatus | |
US10541114B2 (en) | Inductive coil structure and inductively coupled plasma generation system | |
US8404080B2 (en) | Apparatus to treat a substrate | |
KR100803794B1 (ko) | 마그네틱 코어 블록에 매설된 플라즈마 방전 튜브를 구비한유도 결합 플라즈마 소스 | |
KR100805557B1 (ko) | 다중 마그네틱 코어가 결합된 유도 결합 플라즈마 소스 | |
US20240162004A1 (en) | Inductive coil structure and inductively coupled plasma generation system | |
KR101812743B1 (ko) | 유도 코일 및 유도 결합 플라즈마 발생 장치 | |
KR100742659B1 (ko) | 자성코어를 이용한 유도결합 플라즈마 발생장치 | |
KR101468404B1 (ko) | 플라즈마 반응기 및 이를 이용한 플라즈마 점화 방법 | |
KR100743842B1 (ko) | 자속 채널에 결합된 플라즈마 챔버를 구비한 플라즈마반응기 | |
KR101468726B1 (ko) | 플라즈마 반응기 | |
KR20200096459A (ko) | 대기압 플라즈마 발생 장치 | |
KR20160049635A (ko) | 점화 및 플라즈마 유지를 위한 일차 권선을 갖는 변압기 결합 플라즈마 발생기 | |
KR100805558B1 (ko) | 마그네틱 코어에 결합된 다중 방전 튜브를 구비한 유도 결합 플라즈마 소스 | |
KR100464809B1 (ko) | 원격 플라즈마 발생기 | |
KR100772447B1 (ko) | 내장 마그네틱 코어를 갖는 유도 결합 플라즈마 소스 | |
KR102142867B1 (ko) | 대기압 플라즈마 발생 장치 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
ENP | Entry into the national phase |
Ref document number: 2014554679 Country of ref document: JP Kind code of ref document: A |
|
121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 13867632 Country of ref document: EP Kind code of ref document: A1 |
|
WWE | Wipo information: entry into national phase |
Ref document number: 14402610 Country of ref document: US |
|
REEP | Request for entry into the european phase |
Ref document number: 2013867632 Country of ref document: EP |
|
WWE | Wipo information: entry into national phase |
Ref document number: 2013867632 Country of ref document: EP |
|
NENP | Non-entry into the national phase |
Ref country code: DE |