WO2014096218A1 - Dispositif et procede de limitation de force - Google Patents
Dispositif et procede de limitation de force Download PDFInfo
- Publication number
- WO2014096218A1 WO2014096218A1 PCT/EP2013/077437 EP2013077437W WO2014096218A1 WO 2014096218 A1 WO2014096218 A1 WO 2014096218A1 EP 2013077437 W EP2013077437 W EP 2013077437W WO 2014096218 A1 WO2014096218 A1 WO 2014096218A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- gripper
- rod
- spring
- actuator
- electrical contact
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
- G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2891—Features relating to contacting the IC under test, e.g. probe heads; chucks related to sensing or controlling of force, position, temperature
Definitions
- the present invention relates to a device and a method for limiting the pressure applied to an electronic component being tested.
- test machines in which the components being manufactured or manipulated are tested.
- Many test machines include a rotating turret with multiple grippers that grip the components for transport between multiple test, marking or handling stations.
- the grippers may for example be pipettes that hold the components by vacuum to lift and transport from one station to the next.
- test nest that is to say a housing that allows to center it perfectly above the test contacts of the station during the test.
- the vertical force applied by the gripper on the component must be sufficient to accelerate very quickly the component, to ensure a high rate.
- Some test stations also require a gripper that continues to press the component for the duration of the test, to ensure quality electrical contact.
- the vertical force applied by known grippers is typically of the order of 10 Newtons, or more. It sometimes happens that the electronic component to be tested is poorly centered on the end of the gripper. For example, in the case where the gripper comprises a pipette which holds the electronic component by vacuum, it happens that the electronic component is held by the edge, instead of being centered on the pointed end of the pipette.
- WO03071288 discloses a force limitation system adapted to the testing of electronic components.
- An object of the present invention is to solve the problems mentioned above which may be caused by the lowering of a poorly centered electrical component on a test nest for example.
- a force limitation device for limiting the force applied by a linear actuator on an electronic component gripper, comprising:
- a first element arranged to be fixed to said actuator so as to be able to move linearly under the action of said actuator
- a second element arranged to be connected to said gripper, so as to linearly move said gripper
- an elastically compressible spring for transmitting and limiting the force applied by the first member to the second member.
- the elastic coupling by means of a spring between the first element connected to the linear actuator and the second element connected to the gripper, for example by the pipette, limits the maximum force applicable by the actuator on the gripper. .
- the device may comprise an electrical contact in a first state when the spring imposes a limitation of the force applied to the second element, and in a second state when the spring does not impose a limitation of the force applied to the second element.
- a threshold value for example in the case of collision between the manipulated component and a portion of the test station, for example when the component is poorly centered relative to a nest of the test station. It is then possible to detect such a collision by checking the state of the contact, for example by checking whether a current flows through this contact, to quickly raise the component in the event of a collision in order to prevent it from breaking, and to eject it to a next sorting station.
- the first element may comprise an axial rod and a bearing surface against which rests an end of the spring.
- the second element may comprise a sleeve capable of sliding along this axial rod.
- the spring can be compressed when the compressive force between the sleeve and the bearing surface of the first element exceeds a threshold.
- the end of the axial rod facing the gripper may be connected to a first electrical contact surface.
- the socket can
- the first electrical contact surface and the second electrical contact surface are pressed against each other when the spring is relaxed, and are spaced from each other when the spring is compressed, when the gripper exerts a force of reaction exceeding a threshold.
- the first and second electrical contact surfaces may be frustoconical and concentric.
- the first contact surface may belong to a contact piece around the end of the rod facing the second member and / or to the gripper.
- the second contact surface may belong to an opening traversed by the rod in the second element.
- the first element may comprise a first bushing mounted around the rod and in electrical contact with the rod.
- the second element may comprise a second bushing mounted around the rod and which is electrical contact with the rod only when the spring is relaxed.
- the second element may comprise a third bushing of insulating material mounted around the rod and for guiding the rod as it moves relative to the second element.
- the present invention also relates to a machine for testing electronic components, comprising a turret with a plurality of grippers for gripping electronic components around the turret, at least one linear actuator for vertically moving a said gripper relative to said turret , so as to lower or raise said component, and a limiter as described above to limit the vertical force applied to the gripper by the actuator.
- the present invention also relates to a method for limiting the force applied by a linear actuator on an electronic component gripper, comprising:
- Figure 1 illustrates a longitudinal sectional view of a force limiting device according to the invention when the spring is relaxed.
- Figure 2 illustrates a longitudinal sectional view of a force limiting device according to the invention when the spring is compressed.
- the torque limiting device 1 illustrated in the figures is intended to be mounted between a linear actuator not shown and a not shown gripper.
- the limitation device is fixed by non-detailed fixing means to the linear actuator at the top; for example, the circular casing 2 of the device 1 can be screwed, fixed by a pin or by a bayonet, to a linear actuator which would be mounted above the device 1.
- the linear actuator may be constituted for example by a linear motor, for example a linear jack, a stepper motor, a voice coil motor etc.
- the device 1 comprises a second element consisting of the components 5, 50, 6, 23 to be fixed by means not detailed to a gripper, for example a vacuum gripper.
- the component 5 of the device 1 can be screwed, fixed by a pin or a bayonet, to a gripper, for example a pipette, which would be mounted under the device 1.
- the device 1 comprises a first element comprising the elements 4, 40, 41 and 7, and the housing 2. This first element is rigidly connected to the actuator, so it follows the vertical movements.
- Component 4 is a rod of electrically conductive material.
- the element 40 is pierced with an opening for the rod 4.
- the element 41 is a first sleeve of electrically conductive material which is traversed by the rod 4 and in electrical contact with this rod; an electrical connector 20 makes it possible to inject a current into this socket and into the axis 4.
- the lower face of the element 41 further defines a contact surface 410 against which the spring 3 bears.
- the end of the rod 7 facing the gripper (bottom of the figure) is equipped with a contact piece 70 of electrically conductive material. This contact piece comprises in the example a cone portion shape thus defining a frustoconical contact surface 71.
- a second element is rigidly connected to the gripper mounted under the device 1.
- This second element comprises the fixing stud 5, the bushing 50, the second bushing 6 and the third bushing 23.
- the gripper is mounted under the stud 5 integral with the bushing 50.
- the bushing 50 has a blind opening in which the bushing contact 7 connected to the rod 4 can slide, as shown in Figure 2.
- the second bushing 6 has an opening for passing the contact rod 4, without contact.
- the distal end of this opening widens as a cone portion, thereby defining a female contact surface 71 corresponding to the male contact portion 70 of the contact piece 7.
- the third bushing 23 is insulating material and guides the rod 4 in the center of the sleeve 6; it furthermore provides a bearing surface for the distal end of the spring 3.
- the spring 3 In the position illustrated in FIG. 1, the spring 3 is relaxed and pushes the second element 5, 6, 23, 50 downwards. , until the second contact surface 71 comes into contact with the first contact surface 70 of the part 7.
- the actuator not shown
- the spring 3 transmits this force to the second element and therefore to the gripper not shown.
- the contact surfaces 70, 71 therefore tend to separate from one another, which can be detected by the interruption of the current injected on the terminal 20 which no longer reaches the terminal 21 connected to the second socket 6.
- An electronic control circuit not shown can then detect this interruption of current to decide to immediately go up the actuator, thus raise the gripper, and mark the component carried by this gripper as "not tested” and / or off-center, in order to reject it or refocus it in a subsequent treatment station.
- the spring 3 therefore limits the maximum force that can be exerted on the gripper and the component.
- the force threshold from which the spring 3 begins to compress sufficiently for the surfaces 70, 71 to separate from one another is between 8 and 20 Newtons, preferably between 10 and 15 Newtons.
- a rod 4 connected to the actuator slides in a sleeve 6 connected to the gripper. It would also be possible to reverse this arrangement and to provide a rod connected to the gripper and sliding in a socket connected to the actuator. It is also possible to provide systems comprising several rods, or systems without rods in which the cylindrical housing 2 transmits forces between the first and the second element.
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- General Engineering & Computer Science (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Power Engineering (AREA)
- Manipulator (AREA)
- Measuring Leads Or Probes (AREA)
- General Electrical Machinery Utilizing Piezoelectricity, Electrostriction Or Magnetostriction (AREA)
- Environmental & Geological Engineering (AREA)
- Linear Motors (AREA)
Abstract
Description
Claims
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020157016285A KR20150097535A (ko) | 2012-12-19 | 2013-12-19 | 힘을 제한하는 장치 및 방법 |
MYPI2015001485A MY192591A (en) | 2012-12-19 | 2013-12-19 | Device and method for limiting force |
EP13821091.9A EP2936176A1 (fr) | 2012-12-19 | 2013-12-19 | Dispositif et procede de limitation de force |
CN201380066542.2A CN105008941B (zh) | 2012-12-19 | 2013-12-19 | 用于限制力的装置和方法 |
PH12015501241A PH12015501241A1 (en) | 2012-12-19 | 2015-06-02 | Device and method for limiting force |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CH28742012 | 2012-12-19 | ||
CH2874/12 | 2012-12-19 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2014096218A1 true WO2014096218A1 (fr) | 2014-06-26 |
Family
ID=49956136
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/EP2013/077437 WO2014096218A1 (fr) | 2012-12-19 | 2013-12-19 | Dispositif et procede de limitation de force |
Country Status (6)
Country | Link |
---|---|
EP (1) | EP2936176A1 (fr) |
KR (1) | KR20150097535A (fr) |
CN (1) | CN105008941B (fr) |
MY (1) | MY192591A (fr) |
PH (1) | PH12015501241A1 (fr) |
WO (1) | WO2014096218A1 (fr) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2020260087A1 (fr) * | 2019-06-26 | 2020-12-30 | Etel S.A. | Procédé et système de mouvement automatisé de commande d'un manipulateur de composant |
TWI749076B (zh) * | 2016-10-19 | 2021-12-11 | 荷蘭商荷蘭Tno自然科學組織公司 | 高精確性線性致動器 |
US12030198B2 (en) | 2019-06-26 | 2024-07-09 | Etel S.A. | Method and automated motion system for controlling a component handler |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4163970A (en) * | 1975-05-23 | 1979-08-07 | Allinquant F M | Pneumatic springs and other telescopic systems |
US5422554A (en) * | 1993-03-05 | 1995-06-06 | Motorola, Inc. | Vacuum nozzle capable of adjustable placing force |
US5685589A (en) * | 1995-07-27 | 1997-11-11 | Kabushiki Kaisha Shinkawa | Lead frame suction holding device |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2003071288A1 (fr) * | 2002-02-20 | 2003-08-28 | Ismeca Semiconductor Holding Sa | Actionneur de contacts avec contrôle de la force de contact |
US7583100B2 (en) * | 2006-11-30 | 2009-09-01 | Sts Instruments, Inc. | Test head for testing electrical components |
US7839138B2 (en) * | 2007-01-29 | 2010-11-23 | Electro Scientific Industries, Inc. | Adjustable force electrical contactor |
TWI497084B (zh) * | 2010-09-30 | 2015-08-21 | Ismeca Semiconductor Holding | 電性接點及測試平台 |
CN103229610B (zh) * | 2010-11-30 | 2016-01-20 | 上野精机株式会社 | 电子零件的保持装置、检查装置以及分类装置 |
-
2013
- 2013-12-19 MY MYPI2015001485A patent/MY192591A/en unknown
- 2013-12-19 EP EP13821091.9A patent/EP2936176A1/fr not_active Withdrawn
- 2013-12-19 WO PCT/EP2013/077437 patent/WO2014096218A1/fr active Application Filing
- 2013-12-19 KR KR1020157016285A patent/KR20150097535A/ko not_active Application Discontinuation
- 2013-12-19 CN CN201380066542.2A patent/CN105008941B/zh not_active Expired - Fee Related
-
2015
- 2015-06-02 PH PH12015501241A patent/PH12015501241A1/en unknown
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4163970A (en) * | 1975-05-23 | 1979-08-07 | Allinquant F M | Pneumatic springs and other telescopic systems |
US5422554A (en) * | 1993-03-05 | 1995-06-06 | Motorola, Inc. | Vacuum nozzle capable of adjustable placing force |
US5685589A (en) * | 1995-07-27 | 1997-11-11 | Kabushiki Kaisha Shinkawa | Lead frame suction holding device |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI749076B (zh) * | 2016-10-19 | 2021-12-11 | 荷蘭商荷蘭Tno自然科學組織公司 | 高精確性線性致動器 |
US11458581B2 (en) | 2016-10-19 | 2022-10-04 | Nederlandse Organisatie Voor Toegepast-Natuurwetenschappelijk Onderzoek Tno | High-precision linear actuator |
WO2020260087A1 (fr) * | 2019-06-26 | 2020-12-30 | Etel S.A. | Procédé et système de mouvement automatisé de commande d'un manipulateur de composant |
EP3757586A1 (fr) * | 2019-06-26 | 2020-12-30 | Etel S. A.. | Procédé et système de mouvement automatique pour commander un dispositif de manipulation de composants |
US12030198B2 (en) | 2019-06-26 | 2024-07-09 | Etel S.A. | Method and automated motion system for controlling a component handler |
Also Published As
Publication number | Publication date |
---|---|
PH12015501241A1 (en) | 2015-08-17 |
KR20150097535A (ko) | 2015-08-26 |
CN105008941A (zh) | 2015-10-28 |
CN105008941B (zh) | 2018-12-04 |
MY192591A (en) | 2022-08-29 |
EP2936176A1 (fr) | 2015-10-28 |
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