WO2014049880A1 - Matériau de blocage de rayonnement et son procédé de préparation - Google Patents
Matériau de blocage de rayonnement et son procédé de préparation Download PDFInfo
- Publication number
- WO2014049880A1 WO2014049880A1 PCT/JP2012/075261 JP2012075261W WO2014049880A1 WO 2014049880 A1 WO2014049880 A1 WO 2014049880A1 JP 2012075261 W JP2012075261 W JP 2012075261W WO 2014049880 A1 WO2014049880 A1 WO 2014049880A1
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- WIPO (PCT)
- Prior art keywords
- mass
- shielding material
- radiation shielding
- compound
- silicon
- Prior art date
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- 239000000463 material Substances 0.000 title claims abstract description 45
- 230000005855 radiation Effects 0.000 title claims abstract description 43
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 15
- 238000000034 method Methods 0.000 title claims abstract description 10
- 230000000903 blocking effect Effects 0.000 title abstract 5
- 229910052693 Europium Inorganic materials 0.000 claims abstract description 10
- 239000011777 magnesium Substances 0.000 claims abstract description 10
- 229910052692 Dysprosium Inorganic materials 0.000 claims abstract description 9
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 claims abstract description 9
- KBQHZAAAGSGFKK-UHFFFAOYSA-N dysprosium atom Chemical compound [Dy] KBQHZAAAGSGFKK-UHFFFAOYSA-N 0.000 claims abstract description 9
- OGPBJKLSAFTDLK-UHFFFAOYSA-N europium atom Chemical compound [Eu] OGPBJKLSAFTDLK-UHFFFAOYSA-N 0.000 claims abstract description 9
- 229910052749 magnesium Inorganic materials 0.000 claims abstract description 9
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 9
- 239000010703 silicon Substances 0.000 claims abstract description 9
- 229910052712 strontium Inorganic materials 0.000 claims abstract description 9
- CIOAGBVUUVVLOB-UHFFFAOYSA-N strontium atom Chemical compound [Sr] CIOAGBVUUVVLOB-UHFFFAOYSA-N 0.000 claims abstract description 9
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims abstract description 8
- 238000010304 firing Methods 0.000 claims description 17
- 238000005245 sintering Methods 0.000 claims description 13
- 238000002156 mixing Methods 0.000 claims description 8
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 7
- CPLXHLVBOLITMK-UHFFFAOYSA-N magnesium oxide Inorganic materials [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 claims description 6
- 239000000395 magnesium oxide Substances 0.000 claims description 6
- AXZKOIWUVFPNLO-UHFFFAOYSA-N magnesium;oxygen(2-) Chemical compound [O-2].[Mg+2] AXZKOIWUVFPNLO-UHFFFAOYSA-N 0.000 claims description 6
- 229910052814 silicon oxide Inorganic materials 0.000 claims description 5
- KGBXLFKZBHKPEV-UHFFFAOYSA-N boric acid Chemical compound OB(O)O KGBXLFKZBHKPEV-UHFFFAOYSA-N 0.000 claims description 4
- 150000001875 compounds Chemical class 0.000 claims description 4
- 229910003440 dysprosium oxide Inorganic materials 0.000 claims description 4
- NLQFUUYNQFMIJW-UHFFFAOYSA-N dysprosium(iii) oxide Chemical compound O=[Dy]O[Dy]=O NLQFUUYNQFMIJW-UHFFFAOYSA-N 0.000 claims description 4
- 229910001940 europium oxide Inorganic materials 0.000 claims description 4
- AEBZCFFCDTZXHP-UHFFFAOYSA-N europium(3+);oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[Eu+3].[Eu+3] AEBZCFFCDTZXHP-UHFFFAOYSA-N 0.000 claims description 4
- BDAGIHXWWSANSR-NJFSPNSNSA-N hydroxyformaldehyde Chemical compound O[14CH]=O BDAGIHXWWSANSR-NJFSPNSNSA-N 0.000 claims description 4
- 229910000018 strontium carbonate Inorganic materials 0.000 claims description 4
- 239000004327 boric acid Substances 0.000 claims description 3
- 150000002038 dysprosium compounds Chemical class 0.000 claims description 3
- 150000002178 europium compounds Chemical class 0.000 claims description 3
- 150000002681 magnesium compounds Chemical class 0.000 claims description 3
- 150000003377 silicon compounds Chemical class 0.000 claims description 3
- 150000003438 strontium compounds Chemical class 0.000 claims description 3
- 239000000203 mixture Substances 0.000 claims description 2
- 238000002834 transmittance Methods 0.000 description 9
- 239000000126 substance Substances 0.000 description 8
- 230000000052 comparative effect Effects 0.000 description 6
- 238000010521 absorption reaction Methods 0.000 description 5
- 238000005259 measurement Methods 0.000 description 5
- 230000005484 gravity Effects 0.000 description 4
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical compound [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 description 4
- 229910004298 SiO 2 Inorganic materials 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 3
- 239000008188 pellet Substances 0.000 description 3
- 239000002994 raw material Substances 0.000 description 3
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 2
- 125000004429 atom Chemical group 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 239000002537 cosmetic Substances 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 239000000843 powder Substances 0.000 description 2
- 230000001681 protective effect Effects 0.000 description 2
- 230000000475 sunscreen effect Effects 0.000 description 2
- 239000000516 sunscreening agent Substances 0.000 description 2
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical group [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 1
- 229910052691 Erbium Inorganic materials 0.000 description 1
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 1
- 229910017639 MgSi Inorganic materials 0.000 description 1
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- -1 and therefore Substances 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 239000011230 binding agent Substances 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- 150000001639 boron compounds Chemical class 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 239000006071 cream Substances 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- IJKVHSBPTUYDLN-UHFFFAOYSA-N dihydroxy(oxo)silane Chemical group O[Si](O)=O IJKVHSBPTUYDLN-UHFFFAOYSA-N 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- UYAHIZSMUZPPFV-UHFFFAOYSA-N erbium Chemical compound [Er] UYAHIZSMUZPPFV-UHFFFAOYSA-N 0.000 description 1
- 230000001815 facial effect Effects 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 239000010954 inorganic particle Substances 0.000 description 1
- 229910052747 lanthanoid Inorganic materials 0.000 description 1
- 150000002602 lanthanoids Chemical class 0.000 description 1
- 238000009607 mammography Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 239000011146 organic particle Substances 0.000 description 1
- 239000003960 organic solvent Substances 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 125000004430 oxygen atom Chemical group O* 0.000 description 1
- 238000010298 pulverizing process Methods 0.000 description 1
- 238000004451 qualitative analysis Methods 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 230000027756 respiratory electron transport chain Effects 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 239000004094 surface-active agent Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 150000003609 titanium compounds Chemical class 0.000 description 1
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 1
- 238000000870 ultraviolet spectroscopy Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 238000004876 x-ray fluorescence Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21F—PROTECTION AGAINST X-RADIATION, GAMMA RADIATION, CORPUSCULAR RADIATION OR PARTICLE BOMBARDMENT; TREATING RADIOACTIVELY CONTAMINATED MATERIAL; DECONTAMINATION ARRANGEMENTS THEREFOR
- G21F1/00—Shielding characterised by the composition of the materials
- G21F1/02—Selection of uniform shielding materials
- G21F1/08—Metals; Alloys; Cermets, i.e. sintered mixtures of ceramics and metals
-
- A—HUMAN NECESSITIES
- A41—WEARING APPAREL
- A41D—OUTERWEAR; PROTECTIVE GARMENTS; ACCESSORIES
- A41D13/00—Professional, industrial or sporting protective garments, e.g. surgeons' gowns or garments protecting against blows or punches
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21F—PROTECTION AGAINST X-RADIATION, GAMMA RADIATION, CORPUSCULAR RADIATION OR PARTICLE BOMBARDMENT; TREATING RADIOACTIVELY CONTAMINATED MATERIAL; DECONTAMINATION ARRANGEMENTS THEREFOR
- G21F3/00—Shielding characterised by its physical form, e.g. granules, or shape of the material
- G21F3/02—Clothing
Definitions
- the present invention relates to a radiation shielding material and a manufacturing method thereof.
- Radiation refers to a general term for ⁇ rays, ⁇ rays, ⁇ rays, X rays, neutron rays, and the like. Among them, ⁇ rays and ⁇ rays can be easily shielded by a thin film such as aluminum. On the other hand, ⁇ -rays, X-rays, and neutron rays have a high property of transmitting substances, and therefore, substances that shield these substances have been researched and developed (for example, Patent Document 1). *
- lead is known as a substance having a particularly high ability to shield X-rays and ⁇ -rays among commercially available products.
- lead is harmful to the human body and there are concerns about adverse effects on the natural environment, lead-free radiation shielding materials are required.
- the present inventors have made extensive studies. As a result, it has been found that by using a material containing a specific element as a raw material, a substance capable of shielding X-rays can be obtained.
- the present invention relates to the following radiation shielding materials and methods for producing the same.
- Item 1 A radiation shielding material comprising at least silicon, strontium, magnesium, europium and dysprosium as essential elements.
- Item 2. Item 1 characterized by containing 5-30% by mass of silicon, 30-60% by mass of strontium, 1-20% by mass of magnesium, 0.1-5% by mass of europium, and 0.1-5% by mass of dysprosium.
- the radiation shielding material described in 1. Item 3.
- Item 3. The radiation shielding material according to Item 1 or 2, which is obtained by firing at least silicon oxide, strontium carbonate, magnesium oxide, europium oxide, and dysprosium oxide.
- Item 4. Item 4. The radiation shielding material according to Item 3, which is obtained by further plasma sintering after firing.
- a method for producing a radiation shielding material having at least silicon, strontium, magnesium, europium and dysprosium as essential elements comprising a firing step of mixing and firing a silicon compound, a strontium compound, a magnesium compound, a europium compound and a dysprosium compound
- the manufacturing method of a radiation shielding material comprising a firing step of mixing and firing a silicon compound, a strontium compound, a magnesium compound, a europium compound and a dysprosium compound.
- the radiation shielding material of the present invention can shield X-rays.
- ultraviolet rays can be shielded.
- FIG. 1 shows an example of a flowchart of the manufacturing method of the present invention.
- FIG. 2 is an image of the radiation shielding material obtained in Example 1 of the present invention.
- Radiation shielding material The radiation shielding material of the present invention is characterized by having at least silicon, strontium, magnesium, europium and dysprosium as essential elements. By combining these elements, X-rays can be shielded at a practical level. It can also absorb ultraviolet rays. Furthermore, since it is a silicate-based compound, it has a lighter specific gravity than lead and is excellent in workability. *
- the content of silicon (Si) is preferably 5 to 30% by mass, more preferably 10 to 20% by mass. *
- the content of strontium (Sr) is preferably 30 to 60% by mass, more preferably 40 to 50% by mass. *
- the magnesium (Mg) content is preferably 1 to 20% by mass, more preferably 5 to 10% by mass. *
- the content of europium (Eu) is preferably 0.1 to 5% by mass, more preferably 0.5 to 3% by mass.
- the content of dysprosium (Dy) is preferably 0.1 to 5% by mass, more preferably 0.5 to 3% by mass.
- the radiation shielding material of the present invention may contain oxygen atoms (preferably 10 to 50% by mass, more preferably 20 to 40% by mass) in addition to the above essential elements. Further, it may contain a boron atom, a radiation absorbing atom other than the above (for example, a lanthanoid element such as erbium) or the like, and may further contain impurities inevitable in production.
- oxygen atoms preferably 10 to 50% by mass, more preferably 20 to 40% by mass
- it may contain a boron atom, a radiation absorbing atom other than the above (for example, a lanthanoid element such as erbium) or the like, and may further contain impurities inevitable in production.
- lead element is not included substantially from a harmful viewpoint.
- it is 5% by mass or less, preferably 1% by mass or less.
- the shape of the radiation shielding material of the present invention may be appropriately determined according to the method of using the shielding material, and examples thereof include granular (powder), pellet shape, lump shape, film shape, plate shape and the like.
- the shielding material of the present invention can be powder-processed and mixed with other organic substances (powder, fibers) or the like and used for various shielding applications. *
- the average particle diameter may be 0.1 ⁇ m to 1000 ⁇ m, preferably 1 ⁇ m to 100 ⁇ m.
- the radiation shielding material of the present invention may be used alone as a compound containing the above essential elements, for example, water, an organic solvent (alcohol, ether, etc.), a surfactant, a resin binder, inorganic particles, You may use together with additives, such as organic particles and a radiation shielding material other than this invention.
- a titanium compound such as titanium or titanium oxide in combination.
- the ultraviolet shielding property can be further improved.
- the radiation shielding material of the present invention can be used in various forms for the purpose of shielding (protecting) radiation.
- it can be used for protective apron, medical apron, protective suit, space suit, wallpaper, exterior wall surface, roofing material, cosmetics, sunscreen, facial cream, medical equipment (mammography, etc.) and the like.
- X-rays not only X-rays but also ultraviolet rays can be shielded, which is suitable for cosmetics, sunscreens and the like.
- a suitable method for producing the radiation shielding material of the present invention comprises a firing step of mixing and firing a silicon compound, a strontium compound, a magnesium compound, a europium compound and a dysprosium compound. Specifically, for example, a step of mixing and sintering silicon oxide, strontium carbonate (SrCO 3 ), magnesium oxide (MgO), europium oxide (Eu 2 O 3 ), and dysprosium oxide (Dy 2 O 3 ). It can manufacture by passing.
- silicon oxide any of silicon dioxide (SiO 2 ), silicon monoxide (SiO) and the like may be used, but in the present invention, SiO 2 is preferably used.
- the blending ratio is not limited, for example, silicon oxide 20 to 60% by mass, preferably 30 to 50% by mass, strontium carbonate 20 to 60% by mass, preferably 30 to 50% by mass, magnesium oxide 5 to 40% by mass , Preferably 10-30% by weight, europium oxide 0.1-5% by weight, preferably 0.2-1% by weight and dysprosium oxide 0.1-5% by weight, preferably 0.2-1% by weight, do it. *
- a boron compound such as boric acid may be further added.
- a boron compound such as boric acid (H 3 BO 3 ) may be further added.
- the amount of boric acid is not limited, but is preferably 0.1 to 5% by mass, more preferably 0.5 to 3% by mass.
- the raw material may be pulverized by a pulverizer such as a ball mill or a rod mill, or may not be pulverized, but in the present invention, pulverization is preferable.
- a pulverizer such as a ball mill or a rod mill
- the firing temperature may be, for example, 500 to 2000 ° C., preferably 1000 to 1500 ° C. in an electric furnace. *
- the firing atmosphere may be either an air atmosphere or an inert gas atmosphere, but is preferably an air atmosphere.
- the firing time may be appropriately determined according to the firing temperature, firing atmosphere, and the like.
- the firing time may be 10 minutes to 10 hours, preferably 30 minutes to 5 hours.
- Plasma sintering may be performed according to a conventional method. For example, it may be performed at 500 to 2000 ° C. (preferably 700 to 1500 ° C.) with a plasma sintering machine.
- the sintering time may be appropriately determined according to the sintering temperature. For example, the sintering time may be 5 minutes to 2 hours, preferably 10 minutes to 1 hour.
- Example 1 SiO 2 (manufactured by Iwai Chemical Co., Ltd.) 40 wt%, SrCO 3 (manufactured by Honjo Chemical Corporation) 38.2 wt%, MgO (manufactured by Ube Materials Co., Ltd.) 20 mass%, Eu 2 O 3 (Neomagu 0.4% by mass), 0.4% by mass of Dy 2 O 3 (manufactured by Neomag) and 1% by mass of H 3 BO 3 (manufactured by Iwai Chemicals) were placed in a ball mill mixer and mixed for 1 hour. Next, it was put in an electric furnace and baked under conditions of 1300 ° C. and 2 hours in an air atmosphere. After firing, it was naturally cooled to room temperature and pulverized with a ball mill mixer until the average particle size became 7 ⁇ m (FIG. 1). This obtained the radiation shielding material of Example 1 (FIG. 2).
- Example 1 was Sr 2 MgSi 2 O 7 .Eu 3+ , Dy 3+ .
- Example 2 The radiation shielding material obtained in Example 1 was further sintered at 1000 ° C. for about 30 minutes with a plasma sintering machine (product name “SPS-1030” manufactured by SPS Shintec Co., Ltd.). After sintering, it was naturally cooled to room temperature to obtain the radiation shielding material of Example 2 (pellet shape, thickness 3 mm).
- a plasma sintering machine product name “SPS-1030” manufactured by SPS Shintec Co., Ltd.
- Example 1 ⁇ X-ray shielding performance (X-ray transmittance measurement)>
- the radiation shielding material of Example 1 was further processed into a pellet (thickness 3.95 mm) by a press machine.
- the X-ray transmittances of the samples of Examples 1 and 2 and Comparative Examples 1 and 2 were measured under the condition of a measurement energy of 50 keV, and the linear absorption coefficient was calculated from the transmittance.
- the linear absorption coefficient is calculated by dividing the natural logarithm of transmittance by the thickness (cm) of the sample.
- Table 1 The obtained measurement results are shown in Table 1. *
- UV ray transmission measurement> The ultraviolet ray transmittance of Example 1 was measured with an ultraviolet-visible spectrophotometer (UV2400PC, manufactured by Shimadzu Corporation). As a result, the transmittance was 20% or less in the wavelength range of 250 nm to 400 nm. *
- Examples 1 and 2 of the present invention have practical thicknesses, although they are not as good as lead as the X-ray shielding material of Comparative Example 1. Sufficiently low transmittance can be obtained and it has a good linear absorption coefficient. In particular, when compared with the aluminum of Comparative Example 2, it can be seen that it has a sufficiently good linear absorption coefficient. *
- Example 1 of the present invention has good ultraviolet shielding performance because of its low ultraviolet transmittance. Furthermore, it is also effective for electron beams. *
- the radiation shielding material of the present invention has a specific gravity that is significantly lighter than the specific gravity of lead (11.34), can be easily deformed into a granular or plate shape, and is excellent in workability. Therefore, it turns out that it can be used for various uses and forms.
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- Engineering & Computer Science (AREA)
- Ceramic Engineering (AREA)
- Metallurgy (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- Luminescent Compositions (AREA)
Abstract
La présente invention concerne un matériau de blocage de rayonnement capable de bloquer les rayons X. Le matériau de blocage de rayonnement selon l'invention contient, comme éléments essentiels, au moins du silicium, du strontium, du magnésium, de l'europium et du dysprosium. L'invention concerne également un procédé de préparation de ce matériau de blocage de rayonnement.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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PCT/JP2012/075261 WO2014049880A1 (fr) | 2012-09-28 | 2012-09-28 | Matériau de blocage de rayonnement et son procédé de préparation |
Applications Claiming Priority (1)
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PCT/JP2012/075261 WO2014049880A1 (fr) | 2012-09-28 | 2012-09-28 | Matériau de blocage de rayonnement et son procédé de préparation |
Publications (1)
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WO2014049880A1 true WO2014049880A1 (fr) | 2014-04-03 |
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PCT/JP2012/075261 WO2014049880A1 (fr) | 2012-09-28 | 2012-09-28 | Matériau de blocage de rayonnement et son procédé de préparation |
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Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006510919A (ja) * | 2002-12-17 | 2006-03-30 | ランクセス・ドイチユラント・ゲゼルシヤフト・ミツト・ベシユレンクテル・ハフツング | 放射線防護用添加剤として使用する無鉛混合物 |
WO2007043280A1 (fr) * | 2005-10-13 | 2007-04-19 | Ohara Inc. | Verre antiradiation |
JP2009096662A (ja) * | 2007-10-16 | 2009-05-07 | Ohara Inc | ガラス組成物 |
-
2012
- 2012-09-28 WO PCT/JP2012/075261 patent/WO2014049880A1/fr active Application Filing
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006510919A (ja) * | 2002-12-17 | 2006-03-30 | ランクセス・ドイチユラント・ゲゼルシヤフト・ミツト・ベシユレンクテル・ハフツング | 放射線防護用添加剤として使用する無鉛混合物 |
WO2007043280A1 (fr) * | 2005-10-13 | 2007-04-19 | Ohara Inc. | Verre antiradiation |
JP2009096662A (ja) * | 2007-10-16 | 2009-05-07 | Ohara Inc | ガラス組成物 |
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