WO2014032744A1 - Vorrichtung zum inspizieren von gegenständen - Google Patents
Vorrichtung zum inspizieren von gegenständen Download PDFInfo
- Publication number
- WO2014032744A1 WO2014032744A1 PCT/EP2013/000837 EP2013000837W WO2014032744A1 WO 2014032744 A1 WO2014032744 A1 WO 2014032744A1 EP 2013000837 W EP2013000837 W EP 2013000837W WO 2014032744 A1 WO2014032744 A1 WO 2014032744A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- mirror
- camera system
- test
- recording position
- plane
- Prior art date
Links
- 230000003287 optical effect Effects 0.000 claims abstract description 62
- 238000012360 testing method Methods 0.000 claims abstract description 27
- 238000003384 imaging method Methods 0.000 claims abstract description 9
- 238000007493 shaping process Methods 0.000 abstract description 3
- 238000007689 inspection Methods 0.000 description 11
- 238000013461 design Methods 0.000 description 6
- 238000004806 packaging method and process Methods 0.000 description 5
- 230000005855 radiation Effects 0.000 description 5
- 230000000712 assembly Effects 0.000 description 4
- 238000000429 assembly Methods 0.000 description 4
- 238000005286 illumination Methods 0.000 description 3
- 238000011156 evaluation Methods 0.000 description 2
- 230000004075 alteration Effects 0.000 description 1
- 235000013361 beverage Nutrition 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000011888 foil Substances 0.000 description 1
- 238000001459 lithography Methods 0.000 description 1
- 238000013507 mapping Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000002985 plastic film Substances 0.000 description 1
- 229920006255 plastic film Polymers 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000012549 training Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
- G01N21/9036—Investigating the presence of flaws or contamination in a container or its contents using arrays of emitters or receivers
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/02—Catoptric systems, e.g. image erecting and reversing system
- G02B17/06—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror
- G02B17/0605—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using two curved mirrors
- G02B17/0621—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using two curved mirrors off-axis or unobscured systems in which not all of the mirrors share a common axis of rotational symmetry, e.g. at least one of the mirrors is warped, tilted or decentered with respect to the other elements
Definitions
- the invention relates to a device according to the preamble of claim 1 and to a device according to the preamble of claim 9.
- An essential component of optical inspection devices is, for example, an optical arrangement, e.g. at least one electronic camera system for imaging the object moved past a test and recording position and in the beam path between the camera system and the object a Strahlumlenkoptik having a plurality of plan deflecting mirrors, u.a. to achieve a required optical distance between the respective object and the camera system in a compact design of the optical arrangement.
- an optical arrangement e.g. at least one electronic camera system for imaging the object moved past a test and recording position and in the beam path between the camera system and the object a Strahlumschoptik having a plurality of plan deflecting mirrors, u.a. to achieve a required optical distance between the respective object and the camera system in a compact design of the optical arrangement.
- Disturbing in the evaluation of the images generated by the camera system especially in an automatic evaluation with an image processing system are often edge distortions in the image generated in each case.
- Strahlumsch- and Umformoptiken in which instead of plane mirrors for beam deflection mirrors are used whose concave mirror surface are curved only by one or more parallel to each other extending axes of curvature, for example in their training as parabolic or ellipsoidal mirror and for use in Large-screen TV screens for projection of a small-scale image onto a large screen (US 5,477,394), or for lithography (US 5,440,423) for controlled illumination, or for use in film projectors (US 2,819,649) for simplifying the projection system or for use with aerial photography cameras (DE 199 04 687 A1) to increase the field of view.
- the object of the invention is to provide a device for inspecting objects, with an improved beam deflection and forming optics available that allows a camera system to work with a significantly reduced opening angle, so that in a further compact design better use of the area For example, a camera chips when using a digital camera system results.
- the invention is based on the finding that surprisingly by the inventive design of Strahlumsch- and forming optics, d. H. the succession of an ellipsoidal mirror in the beam path from the test and recording position to the camera system on a parabolic mirror a reduction of the width of the incident on the lens of the camera system beam in the axial direction is achieved perpendicular to the axes of curvature of the ellipsoidal mirror, so for the camera system, a lens with reduced Opening angle (aperture) can be used.
- the mirror in the beam path in the direction of the object to be inspected to the camera system following the object and the opening of Strahlumsch- and forming optics forming mirror with the concave mirror surface is a relative to the object inclined parabolic mirror, over which the edges of the article running parallel to the axes of curvature of this mirror are imaged with a parallel view in the camera system.
- the optical arrangement or its Strahlumsch- and Umformoptik in the beam path between the object to be inspected and the camera system in the beam path following each other at least two each having a concave mirror surface forming mirror, wherein on the above-mentioned parabolic mirror an ellipsoidal mirror follows, which is arranged between the parabolic mirror and the camera system.
- the arrangement of a second optical arrangement ie the arrangement of a further device according to the invention could be provided.
- this poses the problem that the camera system would see and focus one optical arrangement in the camera system of the other optical arrangement.
- semitransparent mirrors could be placed in front of the optical units of the optical assemblies. Disadvantage of this design, however, would be that only about 25% of the light would be transmitted through the mirror and also the compact design of the optical arrangement would be lost by installing the semi-transparent mirror.
- the semitransparent mirrors could be dispensed with if the beam paths of the two devices are not superimposed, ie their focal points are shifted relative to one another.
- the optical arrangements of the devices or their Strahlumsch- and Umformoptiken are therefore slightly tilted to each other, so that the focal points of the two devices are shifted from each other.
- no real focus arises on the observed unit more and the beam path or the light rays are guided by means of a Strahlenumlenkelements, which is preferably a plane mirror, to a Beieuchtungselement.
- a Strahlenumlenkelements which is preferably a plane mirror, to a Beieuchtungselement.
- concave mirrors or “mirrors with concave mirror surface” are mirrors whose mirror surface is curved exclusively around one or more axes of curvature extending parallel to one another and extending only in one axial direction.
- packaging means are packagings or containers which are customarily used in particular in the food sector and especially also in the beverage sector, namely containers such as bottles, cans and soft packs, for example those made of cardboard and / or or plastic film and / or metal foil, transport containers, eg crates etc.
- Fig. 1 u. 2 is a simplified schematic representation of a device for inspecting objects, in particular packaging or containers, e.g. Bottles, in two different embodiments of the optical arrangement;
- Fig. 4 u. 5 in a simplified schematic representation of two opposing optical arrangements whose Strahlumsch- and
- Forming optics are tilted towards a test and recording position.
- X, Y, Z respectively indicate three mutually perpendicular spatial axes, of which the Z axis is the vertical axis and the X axis and the Y axis are the horizontal axes, of which the Y -Axis perpendicular to the plane (XZ plane) of Figures 1 and 2 is oriented.
- the optical arrangement indicated generally by 1.1 in FIG. 1 is part of a device 1 for inspecting objects 2, preferably for inspecting packaging means, for example in the form of containers or bottles.
- the optical arrangement 1 .1 comprises, inter alia, an electronic, eg digital camera system 3 with an entocentric objective 4, ie with an objective 4, which correspondingly effects a picture of the entocentric perspective, and an electronic camera chip 5, in the illustrated embodiment with a Camera chip 5, for example in the format 4: 3.
- the objective 4 is arranged with its optical axis in the XZ plane.
- the camera system 3 is arranged such that the greater length of the camera chip 5 corresponds to the horizontal Y-axis perpendicular to the plane of the drawing of FIG. 1 and the shorter length of the camera chip 5 corresponds to the vertical Z-axis.
- the optical arrangement 1 .1 further comprises in the beam path between the object 2 and the camera system 3 and the lens 4 a Strahlumsch- and Umformoptik, which is generally designated 6 in Figure 1 and plan in this embodiment of a parabolic mirror 7 and two , In each case only one beam deflection causing mirror 8 and 9, which may be replaced by other, a pure beam deflection causing optical Strahlumlenkemia, for example by prisms.
- the parabolic mirror 7 and the mirrors 8 and 9 are arranged in the beam path between the object or object 2 to be inspected and the camera system 3 in such a way that, starting from the object 2, the parabolic mirror 7, which faces the object 2 with its concave mirror surface, then the mirror 8 and following this, the mirrors 9 are provided.
- the axes of curvature of the parabolic mirror 7 are exclusively in the horizontal direction (Y-axis), ie oriented perpendicular to the plane of Figure 1 and perpendicular to the XZ plane so that the parabolic mirror 7, the object 2 imaging light rays, for example, the in Figure 1 with S1 - S3 designated parallel and each extending in the direction of the X-axis and each extending in an XZ plane light rays after the deflection at the parabolic mirror 7 continue to run in the same XZ plane.
- the two beam deflecting elements 8 and 9 arranged above the parabolic mirror 7 are likewise designed and arranged such that they are oriented with their plane mirror surfaces perpendicular to the XZ plane and thus only a beam deflection in such a way ie each light beam S1-S3 passes before and after its deflection in the same XZ plane.
- the arrangement is furthermore also made in such a way that the focal line 10, in which parallel light beams S1-S3 oriented perpendicular to the axes of curvature of the parabolic mirror 7 and focused on them, is located in the objective 4 of the camera system 3.
- the object 2 is moved in the direction of the horizontal Y-axis at the opening 6.1 of the optical arrangement 1.1 or at the test and recording position 1.2 there and illuminated for imaging with the camera system 3 by a light source, not shown.
- a light source not shown.
- FIG. 1 For the inspection, the object 2 is moved in the direction of the horizontal Y-axis at the opening 6.1 of the optical arrangement 1.1 or at the test and recording position 1.2 there and illuminated for imaging with the camera system 3 by a light source, not shown.
- three side views generated by each object with the optical arrangement 1 or with the camera system 3 and depicted on the camera chip 5 for this purpose is shown in position a) of FIG.
- FIG. 2 shows, as a further embodiment, a device 1a with an optical arrangement 1a, which in turn contains the camera system 3 with the entocentric objective 4 and with the camera chip 5, for example with the camera chip 5 in the 4: 3 format.
- the optical arrangement comprises 1 a.1 a Strahlumlenk- and forming optics 6a, which differs from the Strahlumlenk- and Umformoptik 6 basically characterized in that instead of the mirror or the Strahlumlenkianos 8 an ellipsoidal mirror 12 is provided, with its axes of curvature exclusively horizontally, ie in the direction of Y. -Axis and thus oriented perpendicular to the plane of Figure 2.
- the optical axis of which is again arranged in the XZ plane, ie starting from the object 2, one after the other, with its axes of curvature horizontal or in the direction of the Y axis.
- the parabolic mirror 7 of Strahlumlenk- and forming optics 6a is formed or curved so that the focus line 10, which extends perpendicular to the plane of Figure 2, ie in the direction of the Y-axis, in the beam path between the Parabolic mirror 7 and the ellipsoidal mirror 12 is located, in the illustrated embodiment immediately in front of the ellipsoidal mirror 12 and its concave mirror surface. 1 a.2, in turn, the test and receiving position is designated in FIG. 2, at which the object 2 is located.
- merging of the light beams impinging thereon for example the light beams S1-S3, is achieved in such a way that these light beams in the objective 4 become a focus line 13 oriented perpendicular to the XZ plane in the illustrated embodiment be focused. Since these light rays continue to impinge on regions of the mirror surface of the ellipsoidal mirror 12 with very different curvature, a merging of the object 2 imaging and reflected at the ellipsoidal mirror 12 beam in the XZ plane takes place.
- FIGS. 4 and 5 show, in a further embodiment, a device 1b with two opposing optical arrangements 15 and 16 for inspecting objects 2.
- the optical arrangements 15 and 16 each have a camera system 3 with an objective 4.
- these can also be digital camera systems that contain a camera chip 5, for example in the 4: 3 format.
- the objectives 4 can, as already described above, be entocentric lenses.
- the optical arrangements 15 and 16 each comprise a beam deflecting and forming optics 17 and 18, which differs from the beam deflecting and forming optics 6 or 6a, as shown in Figure 1 and Figure 2, in that in the beam path of a first mirror 19 and 19a to a second mirror 20 and 20a additionally in the position of the second mirror 20 and 20a is another Strahlumlenkelement 21 and 21 a, which is oriented in the direction of a lighting element 22 and 22a.
- the mirrors 19, 19a, 20 and 20a are, as shown, concave mirrors, with the concave mirror surface of the first mirrors 19 and 19a facing and inclined to a test and pickup position 1 a.2 or to the object 2 to be inspected is, and the concave mirror surface of the second mirror 20 and 20a, a tilting mirror 9, which is disposed between the second mirrors 20 and 20a and the camera system 3, facing, or inclined.
- the focal line 25, which extends perpendicular to the plane of the drawing of Figure 4, ie in the direction of the Y-axis, lies in the beam path between the first concave mirror 19 and the second concave mirror 20, in the illustrated embodiment immediately before the second mirror 20th or its concave mirror surface.
- the second concave mirror 20 which may be, for example, an ellipsoidal mirror 12, the light rays impinging thereon are deflected, via the deflecting element 9, in the direction of the camera system 3.
- the beam path is deflected onto the radiation deflection element 21 a, ie, the optical arrangement 15 relative to the optical arrangement 16 or its beam deflection and shaping optics 17 and 18 are aligned with each other so that their focus points are shifted from each other.
- Figure 4 characterized in that the Strahlumsch- and forming optics 17 and 18 of the two optical assemblies 15 and 16 each other inclined, ie tilted in the direction of the test and recording position 1 a.2 or arranged there and to be inspected object 2.
- the focus line 26 lies in the region of the beam deflection element 21 a or just before its plane mirror surface.
- the beam path is guided in this way via the beam deflection element 21 to a lighting element 22a, which serves to illuminate the object 2.
- FIG. 5 shows the principle shown in FIG. 4 in reverse form, wherein now the beam path in the optical arrangement 15 shown on the left is deflected via the beam deflection element 21 to the illumination element 22 and the object 2 is inspected by the optical arrangement 16. This is achieved by no longer producing a correct focus in the optical arrangement 15, or the focus line 26a lies in the region of the radiation deflecting element 21 or, for example, just before its plane mirror surface.
- the unmirring of the beam path in the optical arrangement 15 also serves to illuminate the object 2.
- the object to be inspected 2 and the camera system 3 and its lens 4 whose optical axis is also arranged for example in the XZ plane, starting from the object 2 consecutively with its horizontal axis of curvature or oriented in the direction of the Y-axis, with its concave side facing the object 2 and the opening 24 of the Strahlumlenk- and Umformoptik 18 forming first mirror 19a, following this, the second concave mirror 20a and following this provided the deflecting element 9, which then the camera system 3 follows.
- the focal line 25a which extends perpendicular to the plane of the drawing of FIG.
- the second mirror 20a which may also be an ellipsoidal mirror here, for example, the light beams impinging on the latter are now deflected via the deflection element 9 in the direction of the camera system 3.
- the Strahlenumlenkelement 21 a which is located in the position of the second mirror 20 a, lies outside the beam path, ie, that upon inspection of the article 2 by the optical assembly 16, the light rays are guided past the Strahlenumlenkelement 21 a.
- the object 2 is moved in the direction of the horizontal Y axis between the openings 23 and 24 of the optical arrangements 15 and 16 or at the test and pickup position 1 a.2 located between the optical arrangements 15 and 16.
- the two optical arrangements 15 and 16, d. H. their Strahlumsch- and Umformoptiken 17 and 18 so inclined to each other, d. H.
- the advantageous for the embodiments shown in Figures 1, 2 and 3 embodiments also apply to the optical assemblies 15 and 16. That is, for example, in the sequence of an ellipsoidal mirror on a parabolic mirror, the camera systems of the optical assemblies 15 and 16 with a significantly reduced opening angle can be performed.
- the image deflection of the respective article 2 which is improved and free of edge distortions, is achieved with the beam deflection and shaping optics 17 and 18, in particular also in such a way that Regarding the Y axis, the principles of entocentric perspective apply, ie near objects are imaged larger than distant objects.
- the beam path is steered so that a parallel view results for this image and thereby, inter alia, distortions in the area of the Z-axis from each other spaced top and bottom are avoided.
- the center or symmetry plane of the inclined parabolic mirror 7 is designated in each case in FIGS. 1 and 2, to which it is mirror-symmetrical with respect to its curvature.
- This midplane ME includes an angle of less than 90 ° with the YZ plane.
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Optics & Photonics (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Studio Devices (AREA)
- Closed-Circuit Television Systems (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
RU2015111169/28A RU2605157C2 (ru) | 2012-08-29 | 2013-03-20 | Устройство для инспектирования предметов |
EP13714203.0A EP2890974A1 (de) | 2012-08-29 | 2013-03-20 | Vorrichtung zum inspizieren von gegenständen |
BR112015004153A BR112015004153A2 (pt) | 2012-08-29 | 2013-03-20 | aparato para inspecionar objetos com pelo menos um sistema de câmera |
MX2015002404A MX340074B (es) | 2012-08-29 | 2013-03-20 | Aparato para inspeccionar objetos. |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102012017049.1 | 2012-08-29 | ||
DE102012017049.1A DE102012017049A1 (de) | 2012-08-29 | 2012-08-29 | Vorrichtung zum Inspizieren von Gegenständen |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2014032744A1 true WO2014032744A1 (de) | 2014-03-06 |
Family
ID=48047966
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/EP2013/000837 WO2014032744A1 (de) | 2012-08-29 | 2013-03-20 | Vorrichtung zum inspizieren von gegenständen |
Country Status (6)
Country | Link |
---|---|
EP (1) | EP2890974A1 (pt) |
BR (1) | BR112015004153A2 (pt) |
DE (1) | DE102012017049A1 (pt) |
MX (1) | MX340074B (pt) |
RU (1) | RU2605157C2 (pt) |
WO (1) | WO2014032744A1 (pt) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP3144671A1 (en) * | 2015-09-16 | 2017-03-22 | The Boeing Company | System and method for measuring thermal degradation of composites |
WO2017196193A1 (en) * | 2016-05-10 | 2017-11-16 | Ksm Vision Sp. Z O.O. | System for control of the external surfaces and geometry of objects manufactured on production lines, utilizing peripheral observation at a full 360° angular range |
US9903809B2 (en) | 2015-09-16 | 2018-02-27 | The Boeing Company | System for measuring thermal degradation of composites and method of making and using |
EP3757553A1 (de) * | 2019-06-26 | 2020-12-30 | Seidenader Maschinenbau GmbH | Vorrichtung zur optischen inspektion von leeren und mit flüssigkeit gefüllten behältern |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2819649A (en) | 1956-02-01 | 1958-01-14 | Eastman Kodak Co | Reflecting condenser system for projectors |
US5440423A (en) | 1993-01-20 | 1995-08-08 | Nec Corporation | Optical illumination instrument |
US5477394A (en) | 1993-06-23 | 1995-12-19 | Sharp Kabushiki Kaisha | Projector |
DE19904687A1 (de) | 1999-02-05 | 2000-08-10 | Zeiss Carl Fa | Richtbare Teleskopanordnung |
US20080013820A1 (en) * | 2006-07-11 | 2008-01-17 | Microview Technology Ptd Ltd | Peripheral inspection system and method |
US20080170311A1 (en) * | 2007-01-16 | 2008-07-17 | Eiji Steven Yafuso | Conic of rotation (CoR) optical surfaces and systems of matched CoRs |
DE102008037727A1 (de) * | 2008-08-14 | 2010-03-04 | Khs Ag | Leerflascheninspektion |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2697379A (en) * | 1953-09-16 | 1954-12-21 | Joseph B Walker | Compound image-forming reflecting mirror optical system |
IL113789A (en) * | 1994-05-23 | 1999-01-26 | Hughes Aircraft Co | A non-focusing device with three hinged mirrors and a corrective mirror |
RU2179329C2 (ru) * | 2000-04-19 | 2002-02-10 | Институт солнечно-земной физики СО РАН | Хромосферный телескоп |
DE102006038365B3 (de) * | 2006-08-16 | 2007-12-20 | Dräger Safety AG & Co. KGaA | Messvorrichtung |
-
2012
- 2012-08-29 DE DE102012017049.1A patent/DE102012017049A1/de not_active Withdrawn
-
2013
- 2013-03-20 MX MX2015002404A patent/MX340074B/es active IP Right Grant
- 2013-03-20 RU RU2015111169/28A patent/RU2605157C2/ru not_active IP Right Cessation
- 2013-03-20 BR BR112015004153A patent/BR112015004153A2/pt not_active Application Discontinuation
- 2013-03-20 EP EP13714203.0A patent/EP2890974A1/de not_active Withdrawn
- 2013-03-20 WO PCT/EP2013/000837 patent/WO2014032744A1/de active Application Filing
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2819649A (en) | 1956-02-01 | 1958-01-14 | Eastman Kodak Co | Reflecting condenser system for projectors |
US5440423A (en) | 1993-01-20 | 1995-08-08 | Nec Corporation | Optical illumination instrument |
US5477394A (en) | 1993-06-23 | 1995-12-19 | Sharp Kabushiki Kaisha | Projector |
DE19904687A1 (de) | 1999-02-05 | 2000-08-10 | Zeiss Carl Fa | Richtbare Teleskopanordnung |
US20080013820A1 (en) * | 2006-07-11 | 2008-01-17 | Microview Technology Ptd Ltd | Peripheral inspection system and method |
US20080170311A1 (en) * | 2007-01-16 | 2008-07-17 | Eiji Steven Yafuso | Conic of rotation (CoR) optical surfaces and systems of matched CoRs |
DE102008037727A1 (de) * | 2008-08-14 | 2010-03-04 | Khs Ag | Leerflascheninspektion |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP3144671A1 (en) * | 2015-09-16 | 2017-03-22 | The Boeing Company | System and method for measuring thermal degradation of composites |
CN106546548A (zh) * | 2015-09-16 | 2017-03-29 | 波音公司 | 用于测量复合材料的热降解的系统和方法 |
US9791365B2 (en) | 2015-09-16 | 2017-10-17 | The Boeing Company | System and method for measuring thermal degradation of composites |
US9903809B2 (en) | 2015-09-16 | 2018-02-27 | The Boeing Company | System for measuring thermal degradation of composites and method of making and using |
CN106546548B (zh) * | 2015-09-16 | 2021-02-12 | 波音公司 | 用于测量复合材料的热降解的系统和方法 |
WO2017196193A1 (en) * | 2016-05-10 | 2017-11-16 | Ksm Vision Sp. Z O.O. | System for control of the external surfaces and geometry of objects manufactured on production lines, utilizing peripheral observation at a full 360° angular range |
EP3757553A1 (de) * | 2019-06-26 | 2020-12-30 | Seidenader Maschinenbau GmbH | Vorrichtung zur optischen inspektion von leeren und mit flüssigkeit gefüllten behältern |
Also Published As
Publication number | Publication date |
---|---|
EP2890974A1 (de) | 2015-07-08 |
MX2015002404A (es) | 2015-06-22 |
BR112015004153A2 (pt) | 2017-07-04 |
MX340074B (es) | 2016-06-24 |
RU2015111169A (ru) | 2016-10-20 |
RU2605157C2 (ru) | 2016-12-20 |
DE102012017049A1 (de) | 2014-03-06 |
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