MX340074B - Aparato para inspeccionar objetos. - Google Patents

Aparato para inspeccionar objetos.

Info

Publication number
MX340074B
MX340074B MX2015002404A MX2015002404A MX340074B MX 340074 B MX340074 B MX 340074B MX 2015002404 A MX2015002404 A MX 2015002404A MX 2015002404 A MX2015002404 A MX 2015002404A MX 340074 B MX340074 B MX 340074B
Authority
MX
Mexico
Prior art keywords
mirror
testing
camera system
holding position
inspecting objects
Prior art date
Application number
MX2015002404A
Other languages
English (en)
Other versions
MX2015002404A (es
Inventor
Schorn Wolfgang
Buchwald Carsten
Original Assignee
Khs Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Khs Gmbh filed Critical Khs Gmbh
Publication of MX2015002404A publication Critical patent/MX2015002404A/es
Publication of MX340074B publication Critical patent/MX340074B/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/9036—Investigating the presence of flaws or contamination in a container or its contents using arrays of emitters or receivers
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B17/00—Systems with reflecting surfaces, with or without refracting elements
    • G02B17/02—Catoptric systems, e.g. image erecting and reversing system
    • G02B17/06—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror
    • G02B17/0605—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using two curved mirrors
    • G02B17/0621—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using two curved mirrors off-axis or unobscured systems in which not all of the mirrors share a common axis of rotational symmetry, e.g. at least one of the mirrors is warped, tilted or decentered with respect to the other elements

Abstract

Un aparato para inspeccionar objetos (2), que tiene al menos un sistema de cámara (3) para proyectar la imagen del objeto respectivo (2) a ser inspeccionado, arreglado en una posición de retención y prueba (1a.2), y que tiene un arreglo óptico entre la posición de retención y prueba y el sistema de cámara, donde el arreglo óptico es formado como dispositivos ópticos de deflexión y formación de haz que tienen al menos dos espejos que tienen superficies de espejo curvas cóncavas y la trayectoria de haz entre la posición de prueba y retención y el sistema de cámara, donde al menos un espejo, es un espejo parabólico (7) y un espejo, es un espejo elipsoidal (12), y donde, en la dirección del haz de la posición de prueba y retención (1a.2) hacia el sistema de cámara (3), el espejo elipsoidal (12) sigue al espejo parabólico (7).
MX2015002404A 2012-08-29 2013-03-20 Aparato para inspeccionar objetos. MX340074B (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102012017049.1A DE102012017049A1 (de) 2012-08-29 2012-08-29 Vorrichtung zum Inspizieren von Gegenständen
PCT/EP2013/000837 WO2014032744A1 (de) 2012-08-29 2013-03-20 Vorrichtung zum inspizieren von gegenständen

Publications (2)

Publication Number Publication Date
MX2015002404A MX2015002404A (es) 2015-06-22
MX340074B true MX340074B (es) 2016-06-24

Family

ID=48047966

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2015002404A MX340074B (es) 2012-08-29 2013-03-20 Aparato para inspeccionar objetos.

Country Status (6)

Country Link
EP (1) EP2890974A1 (es)
BR (1) BR112015004153A2 (es)
DE (1) DE102012017049A1 (es)
MX (1) MX340074B (es)
RU (1) RU2605157C2 (es)
WO (1) WO2014032744A1 (es)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9791365B2 (en) 2015-09-16 2017-10-17 The Boeing Company System and method for measuring thermal degradation of composites
US9903809B2 (en) 2015-09-16 2018-02-27 The Boeing Company System for measuring thermal degradation of composites and method of making and using
PL229618B1 (pl) * 2016-05-10 2018-08-31 Ksm Vision Spolka Z Ograniczona Odpowiedzialnoscia Urządzenie do kontroli powierzchni zewnętrznych i geometrii obiektów na liniach produkcyjnych z wykorzystaniem obserwacji kołowej w pełnym zakresie obwodowym 360°
DE102019117260A1 (de) * 2019-06-26 2020-12-31 Seidenader Maschinenbau Gmbh Vorrichtung zur optischen Inspektion von leeren und mit Flüssigkeit gefüllten Behältern

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2697379A (en) * 1953-09-16 1954-12-21 Joseph B Walker Compound image-forming reflecting mirror optical system
US2819649A (en) 1956-02-01 1958-01-14 Eastman Kodak Co Reflecting condenser system for projectors
JP2655465B2 (ja) 1993-01-20 1997-09-17 日本電気株式会社 反射型ホモジナイザーおよび反射型照明光学装置
JP2786796B2 (ja) 1993-06-23 1998-08-13 シャープ株式会社 プロジェクター
IL113789A (en) * 1994-05-23 1999-01-26 Hughes Aircraft Co A non-focusing device with three hinged mirrors and a corrective mirror
DE19904687A1 (de) 1999-02-05 2000-08-10 Zeiss Carl Fa Richtbare Teleskopanordnung
RU2179329C2 (ru) * 2000-04-19 2002-02-10 Институт солнечно-земной физики СО РАН Хромосферный телескоп
US20080013820A1 (en) * 2006-07-11 2008-01-17 Microview Technology Ptd Ltd Peripheral inspection system and method
DE102006038365B3 (de) * 2006-08-16 2007-12-20 Dräger Safety AG & Co. KGaA Messvorrichtung
US7648248B2 (en) * 2007-01-16 2010-01-19 Eiji Yafuso Optical energy director using conic of rotation (CoR) optical surfaces and systems of matched CoRs in the claims
DE102008037727A1 (de) * 2008-08-14 2010-03-04 Khs Ag Leerflascheninspektion

Also Published As

Publication number Publication date
DE102012017049A1 (de) 2014-03-06
RU2605157C2 (ru) 2016-12-20
MX2015002404A (es) 2015-06-22
EP2890974A1 (de) 2015-07-08
BR112015004153A2 (pt) 2017-07-04
WO2014032744A1 (de) 2014-03-06
RU2015111169A (ru) 2016-10-20

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