WO2013163868A1 - 液晶显示面板的修复方法 - Google Patents

液晶显示面板的修复方法 Download PDF

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Publication number
WO2013163868A1
WO2013163868A1 PCT/CN2012/083779 CN2012083779W WO2013163868A1 WO 2013163868 A1 WO2013163868 A1 WO 2013163868A1 CN 2012083779 W CN2012083779 W CN 2012083779W WO 2013163868 A1 WO2013163868 A1 WO 2013163868A1
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Prior art keywords
liquid crystal
matrix pattern
crystal display
display panel
bright spot
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PCT/CN2012/083779
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English (en)
French (fr)
Inventor
吴涛
钮曼萍
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京东方科技集团股份有限公司
合肥京东方光电科技有限公司
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Publication of WO2013163868A1 publication Critical patent/WO2013163868A1/zh

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    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306Details
    • G02F1/1309Repairing; Testing
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F2201/00Constructional arrangements not provided for in groups G02F1/00 - G02F7/00
    • G02F2201/50Protective arrangements
    • G02F2201/506Repairing, e.g. with redundant arrangement against defective part
    • G02F2201/508Pseudo repairing, e.g. a defective part is brought into a condition in which it does not disturb the functioning of the device

Definitions

  • Embodiments of the present invention relate to a method of repairing a liquid crystal display panel. Background technique
  • TFT-LCD Thin Film Transistor Liquid Crystal Display
  • the liquid crystal display panel is an important component of the liquid crystal display panel, and the liquid crystal display panel is formed by pairing the array substrate and the color filter substrate.
  • Bright Pixel is the most common defect, and the bright spot can occur on the color matrix pattern of the color film substrate.
  • the reasons for the bright spots on the LCD panel may include: foreign matter on the TFT, improper driving of the TFT, or short circuit caused by artificially injected foreign matter when preparing the TFT.
  • the color matrix pattern can only display its own intrinsic color and cannot change the display color as the driving voltage changes.
  • the highlight is turned to a dark spot by continuously applying a high voltage to the liquid crystal display panel to effect repair of the bright spot.
  • foreign matter since foreign matter is likely to be generated inside the liquid crystal display panel, foreign matter may cause a bright spot defect in the liquid crystal display panel.
  • foreign matter generated In the process of continuously applying a high voltage, foreign matter generated may cause a line defect in the liquid crystal display panel, thereby increasing the defect rate of the product and Reduce product availability.
  • Embodiments of the present invention provide a method for repairing a liquid crystal display panel, which is used to reduce the defect rate of the product and increase the product usability.
  • An aspect of the invention provides a method for repairing a liquid crystal display panel, the color film substrate of the liquid crystal display panel comprising a substrate substrate and a black matrix pattern and a color matrix pattern formed on the substrate substrate;
  • the method includes: when the liquid crystal display panel has a bad spot, the initial repair of the bright spot is performed by converting the bright spot into a dark spot; after detecting the initial repair The light parameter of the pixel is determined; if it is determined that the light parameter of a certain pixel is greater than or equal to a specific value, determining that the pixel whose optical parameter is greater than or equal to the specific value is the remaining bright spot, the color of the liquid crystal display panel A region on the film substrate corresponding to the remaining bright spots is carbonized.
  • the light parameter comprises: light transmittance
  • the specific value is 16%; if the color matrix pattern corresponding to the bright point is a green matrix pattern, the specific value is 8% If the color matrix pattern corresponding to the bright spot is a blue matrix graphic, the specific value is 24%.
  • the light parameter comprises: a light transmission area.
  • the specific value is one third of the pixel opening area corresponding to the bright spot.
  • converting the bright point into a dark spot comprises: forming a gap between the color matrix pattern corresponding to the bright substrate by using a laser to illuminate the color matrix pattern corresponding to the bright spot; using laser irradiation a black matrix pattern around the color matrix pattern corresponding to the bright point, granulating a black matrix pattern around the color matrix pattern corresponding to the bright point and diffusing through the slit to cover the bright point, so that the bright point is converted into a dark point.
  • the penetration depth of the black matrix pattern when the laser illuminates the black matrix pattern around the color matrix pattern corresponding to the bright point is determined by the intensity of the laser.
  • the stronger the intensity of the laser light the greater the penetration depth.
  • performing carbonization on an area corresponding to the remaining bright spots on the color filter substrate of the liquid crystal display panel comprising: irradiating the remaining bright spots on the color filter substrate with a laser A region that decomposes the color matrix pattern of the region into carbon and gas compounds to convert the remaining bright spots into dark spots.
  • the reason why the liquid crystal display panel appears bright spots includes one of the following or any combination thereof: a via defect of the thin film transistor TFT, an open gate of the TFT, an inter-pixel short circuit across the gate line, and a pixel Short circuit with data line, data line residual under pixel, a-Si residue under pixel, short circuit between pixels across data line, short circuit between pixel and gate line, high closing current of TFT device, open current of TFT device Small, foreign matter appears in the liquid crystal layer, the contact surface is poor, and the source and drain are open.
  • a method for repairing a liquid crystal display panel includes converting a bright spot into a first repair of a dark spot, and detecting a pixel point after the initial repair; if the detection result indicates that the light is still bright If the dots are not good, the remaining bright spots are carbonized in the corresponding areas on the color matrix pattern; by using the solution provided by the invention, not only the repair rate of the bright spots can be improved, but also the foreign matter generated during the continuous application of the high voltage is avoided.
  • the panel has a bad line, which reduces the defect rate of the product and improves the product usability.
  • FIG. 1 is a flowchart of a method for repairing a liquid crystal display panel according to Embodiment 1 of the present invention
  • FIG. 2 is a schematic diagram of a light-emitting point in the embodiment
  • FIG. 3 is another schematic diagram of inducing a bright spot in the embodiment
  • FIG. 4 is a schematic view of a black matrix pattern irradiated with a laser around a bright spot
  • Figure 5 is a schematic diagram showing the relationship between laser intensity and penetration depth. detailed description
  • FIG. 1 is a flowchart of a method for repairing a liquid crystal display panel according to Embodiment 1 of the present invention. As shown in FIG. 1, the method includes the following steps.
  • Step 101 Determine whether a bright spot appears on the liquid crystal display panel. If it is determined that the liquid crystal display panel is bright, proceed to step 102. If it is determined that no bright spot appears on the liquid crystal display panel, the process ends.
  • the liquid crystal display panel is tested to determine whether a bright spot appears on the liquid crystal display panel.
  • the liquid crystal display panel includes a color film substrate and an array substrate disposed opposite to each other, and the color film substrate includes a substrate substrate and a black matrix pattern and a color matrix pattern formed on the substrate.
  • the color matrix pattern may include a red matrix pattern, a green matrix pattern, and a blue matrix pattern, corresponding to sub-pixels for displaying red, green, and blue, respectively.
  • the reason why the liquid crystal display panel appears bright spots includes one of the following or any combination thereof:
  • FIG. 2 is a schematic diagram of inducing a bright spot in the embodiment.
  • the liquid crystal display panel 100 includes a color film substrate and an array substrate 1 disposed opposite to each other, and the color filter substrate and the array substrate 1 are spaced apart by a spacer and filled with a liquid crystal layer 20.
  • a liquid crystal cell (cell) is sealed at the periphery of the liquid crystal display panel 100 by a sealant (not shown) or the like.
  • the color filter substrate includes a base substrate 21 and a color matrix pattern and a black matrix pattern 22 formed on the base substrate 21.
  • the black matrix pattern 22 is, for example, surrounded around the color matrix pattern.
  • the color matrix pattern includes a red matrix pattern 23, green
  • the matrix pattern 24 and the blue matrix pattern 25 respectively correspond to the liquid crystal display panel 100 for displaying sub-pixels of red, green, and blue.
  • FIG. 2 shows a case where a foreign object 40 appears in the liquid crystal layer 20 to cause a bright spot, The bright spot caused by the foreign matter corresponds to the green matrix pattern 24.
  • the foreign matter 40 is, for example, particles remaining during the preparation of the liquid crystal panel.
  • FIG. 3 is another schematic diagram of inducing a bright spot in the embodiment. As shown in FIG. 3, FIG. 3 shows the missing via of the TFT, the open gate of the TFT, the short circuit between the pixels across the gate line, and the pixel and pixel.
  • Step 102 Convert a bright spot into a dark spot by using a laser to complete the initial repair of the bad spot.
  • the step 102 includes, for example,: using a color matrix pattern corresponding to a bright spot of the laser to form a gap between the base matrix and the color matrix pattern corresponding to the bright spot; and using the laser to illuminate the black matrix pattern around the color matrix pattern corresponding to the bright spot , framing the black matrix pattern around the color matrix pattern corresponding to the bright spot and diffusing through the slit to cover the bright spot, so that the bright spot is converted into a dark spot.
  • Fig. 4 is a schematic view showing a black matrix pattern around a color matrix pattern corresponding to a bright spot by laser irradiation.
  • the liquid crystal display panel 100 includes a color filter substrate including an underlying substrate 21 and a color matrix pattern and a black matrix pattern 22 formed on the base substrate 21, and the color matrix pattern includes red.
  • the highlights correspond, for example, to the green matrix pattern 24.
  • the green matrix pattern 24 corresponding to the bright spot is irradiated with the laser light 50 to form a gap between the base substrate 21 and the green matrix pattern 24 corresponding to the bright spot; the black matrix pattern 22 around the green matrix pattern 24 corresponding to the bright spot is illuminated by the laser, and the black matrix pattern is used. 22 granulates and diffuses through the gap, covering a part of the green matrix pattern corresponding to the bright spot, thereby realizing the coverage of the bright spot and converting the bright spot into a dark spot.
  • Figure 5 is a schematic diagram showing the relationship between laser intensity and penetration depth.
  • the penetration depth of the black matrix pattern around the color matrix pattern corresponding to the bright spot corresponding to the bright spot can be determined by the intensity of the laser, so that the penetration depth can be adjusted by adjusting the intensity of the laser to achieve the purpose of covering the bright spot. .
  • the stronger the intensity of the laser the greater the penetration depth.
  • the intensity of the laser is positively correlated with the depth of penetration.
  • Step 103 Detect light parameters of the pixel after the initial repair.
  • optical parameters of each color matrix pattern on the color filter substrate are detected, wherein the light parameters may include: light transmittance and/or light transmission area.
  • Step 104 Determine whether the optical parameter of a certain pixel is greater than or equal to a specific value. If it is determined that the optical parameter is greater than or equal to the specific value, perform step 105; if it is determined that the optical parameter is small At the specified value, the process ends.
  • the bright point when the bright point is converted into a dark spot by the laser in step 102, there may be a pixel point with a bad repair effect.
  • the pixel after the initial repair can be detected, and the light parameter corresponding to the measured pixel point is obtained, and it is determined whether the light parameter is greater than or equal to a specific value to determine whether the pixel point still has a bright spot defect. If it is determined that the light parameter is greater than or equal to a specific value, it indicates that the initial repair effect of the bright spot corresponding to the color matrix pattern is not good, and there is still a defect. At this time, it is determined that the pixel point whose light transmittance is greater than or equal to a specific value is the remaining bright spot. If it is judged that the optical parameter is smaller than a specific value, it indicates that the color matrix pattern does not correspond to a bright spot or the corresponding bright spot has been converted into a dark point by laser, and no further processing is required.
  • Specific values can be preset as needed. For example, when the light parameter is the light transmittance, if the color matrix pattern corresponding to the bright point is a red matrix pattern, the specific value is 16%; or, if the color matrix pattern corresponding to the bright point is a green matrix pattern, the specific value is 8%; If the color matrix graphic corresponding to the bright spot is a blue matrix graphic, the specific value is 24%.
  • the specific value is one third of the pixel opening area corresponding to the bright spot.
  • Step 105 Determine that the pixel point whose light-out parameter is greater than or equal to the specific value is the remaining bright spot, and carbonize the area corresponding to the remaining bright spot on the color matrix pattern, and the process ends.
  • step 104 when it is determined that the light parameter is greater than or equal to a specific value, it is determined that the color matrix pattern further corresponds to a bright spot that fails to be converted into a dark point by laser, that is, a remaining bright spot. Carbonizing the remaining bright spots on the corresponding areas of the color matrix pattern can repair the optical parameters of the liquid crystal display panel to less than a specific value as much as possible, thereby improving the quality of the liquid crystal display panel.
  • the carbonizing treatment of the remaining bright spots on the corresponding area on the color matrix pattern includes, for example: illuminating a region corresponding to the remaining bright spots on the color matrix pattern with a laser to decompose the region into carbon and a gas compound, thereby realizing the remaining bright spots. Carbonization of the corresponding area on the color matrix pattern.
  • the carbonized area is only a part of the color matrix pattern, which corresponds to the remaining bright spots. This region after carbonization exhibits a honeycomb shape due to the action of the gas compound.
  • the laser light used to illuminate the color matrix pattern of the remaining bright spots has a laser intensity at the carbonization stage greater than the laser intensity of the color matrix pattern irradiated during the initial repair, for example, a relationship of about 1.5 times, so that the color of the bright spot area can be smoothly performed.
  • the matrix pattern is broken down into carbon to form dark spots.
  • the repair method of the liquid crystal display panel provided by the embodiment includes the first time of converting a bright spot into a dark spot. Repairing and detecting the pixels after the initial repair; if the detection result indicates that there is still a bad spot, the remaining bright spots are carbonized in the corresponding area on the color matrix pattern; by using the solution provided by the invention, not only the highlights can be improved.
  • the repair rate, and avoiding the foreign matter generated during the continuous application of the high voltage causes the line to be defective in the liquid crystal display panel, reduces the defective rate of the product, and improves the product utilization, thereby improving the production efficiency.
  • An exemplary embodiment however, the invention is not limited thereto. Various modifications and improvements can be made by those skilled in the art without departing from the spirit and scope of the invention. These modifications and improvements are also considered to be within the scope of the invention.

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  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Liquid Crystal (AREA)

Abstract

一种液晶显示面板(100)的修复方法,包括:在所述液晶显示面板(100)出现亮点不良时,通过将所述亮点转化成暗点来对所述亮点不良进行初次修复;检测初次修复后的像素点的光参数;若判断出某一像素点的光参数大于或者等于特定数值,确定所述光参数大于或者等于所述特定数值的像素点为剩余亮点,对所述液晶显示面板(100)的彩膜基板上与所述剩余亮点对应的区域进行碳化处理。该修复方法降低了产品的不良率以及提高了产品活用度。

Description

液晶显示面板的爹复方法 技术领域
本发明的实施例涉及一种液晶显示面板的修复方法。 背景技术
薄膜晶体管液晶显示器 ( Thin Film Transistor Liquid Crystal Display, TFT-LCD )是常用的平板显示器。
液晶显示面板是液晶显示器的重要部件, 液晶显示面板由阵列基板和彩 膜基板对盒而成。 在液晶显示面板的制造过程中, 亮点 ( Bright Pixel )是最 常见的不良, 亮点可发生于彩膜基板的彩色矩阵图形上。 造成液晶显示面板 出现亮点的原因可能包括: TFT上存在异物、 TFT无法正常驱动或者制备 TFT 时人为注入的异物质引起的短路(short )等。 当彩膜基板的彩色矩阵图形上 出现亮点时, 该彩色矩阵图形仅能显示本身的固有颜色而无法随驱动电压变 化而改变显示颜色。 在将阵列基板和彩膜基板对盒形成液晶显示面板之后, 需要对液晶显示面板进行测试。 当测试出液晶显示面板出现亮点后, 可通过 修复工艺 (cell repair )对液晶显示面板上亮点的修复。
现有技术中, 通过持续向液晶显示面板施加高电压使亮点转为暗点以实 现对亮点的修复。 但是, 由于液晶显示面板内部容易产生异物, 异物会导致 液晶显示面板出现亮点不良, 在持续施加高电压的过程中, 产生的异物会使 液晶显示面板发生线不良,从而增加了产品的不良率以及降低了产品活用度。 发明内容
本发明的实施例提供了一种液晶显示面板的修复方法, 用以降低产品的 不良率以及增加产品活用度。
本发明的一个方面提供了一种液晶显示面板的修复方法, 所述液晶显示 面板的彩膜基板包括衬底基板以及形成于所述衬底基板上的黑矩阵图形和彩 色矩阵图形; 所述修复方法包括: 在所述液晶显示面板出现亮点不良时, 通 过将所述亮点转化成暗点来对所述亮点不良进行初次修复; 检测初次修复后 的像素点的光参数; 若判断出某一像素点的光参数大于或者等于特定数值, 确定所述光参数大于或者等于所述特定数值的像素点为剩余亮点, 对所述液 晶显示面板的彩膜基板上与所述剩余亮点对应的区域进行碳化处理。
在该方法中, 可选地, 所述光参数包括: 光透过率。
在该方法中, 例如, 若所述亮点对应的彩色矩阵图形为红色矩阵图形, 所述特定数值为 16%; 若所述亮点对应的彩色矩阵图形为绿色矩阵图形, 所 述特定数值为 8%; 若所述亮点对应的彩色矩阵图形为蓝色矩阵图形, 所述 特定数值为 24%。
在该方法中, 可选地, 所述光参数包括: 光透过面积。
在该方法中, 例如, 所述特定数值为所述亮点对应的像素开口面积的三 分之一。
在该方法中, 可选地, 所述将所述亮点转化成暗点包括: 利用激光照射 亮点对应的彩色矩阵图形, 使衬底基板与亮点对应的彩色矩阵图形之间形成 缝隙; 利用激光照射所述亮点对应的彩色矩阵图形周边的黑矩阵图形, 使所 述亮点对应的彩色矩阵图形周边的黑矩阵图形颗粒化并通过所述缝隙扩散以 覆盖所述亮点, 以使所述亮点转化成暗点。
在该方法中, 可选地, 激光照射所述亮点对应的彩色矩阵图形周边的黑 矩阵图形时对黑矩阵图形的渗透深度由所述激光的强度决定。
在该方法中, 可选地, 所述激光的强度越强, 所述渗透深度越大。
在该方法中, 可选地, 所述对所述液晶显示面板的彩膜基板上与所述剩 余亮点对应的区域进行碳化处理, 包括: 利用激光照射所述剩余亮点在彩膜 基板上对应的区域, 使该区域的彩色矩阵图形分解为碳和气体化合物, 以使 所述剩余亮点转化成暗点。
在该方法中, 可选地, 所述液晶显示面板出现亮点的原因包括如下之一 或其任意组合: 薄膜晶体管 TFT的过孔缺失、 TFT的栅极开路、跨栅线的像 素间短路、像素与数据线间短路、像素下存在数据线残留物、像素下存在 a-Si 残留物、 跨数据线的像素间短路、 像素与栅线间短路、 TFT器件关闭电流过 高、 TFT器件打开电流过小、 液晶层出现异物、 接触面不良、 源漏极开路。
本发明的实施例提供的液晶显示面板的修复方法包括将亮点转化成暗点 的初次修复, 并对初次修复后的像素点进行检测; 若检测结果表明仍存在亮 点不良, 则对剩余亮点在彩色矩阵图形上对应的区域进行碳化处理; 利用本 发明提供的方案, 不仅可以提高亮点不良的修复率, 而且避免了持续施加高 电压过程中产生的异物使液晶显示面板发生线不良的情况, 从而降低了产品 的不良率以及提高了产品活用度。 附图说明
为了更清楚地说明本发明实施例的技术方案, 下面将对实施例的附图作 简单地介绍,显而易见地,下面描述中的附图仅仅涉及本发明的一些实施例, 而非对本发明的限制。
图 1为本发明实施例一提供的一种液晶显示面板的修复方法的流程图; 图 2为本实施例中引发亮点的一种示意图;
图 3为本实施例中引发亮点的另一种示意图;
图 4为利用激光照射亮点周边的黑矩阵图形的示意图;
图 5为激光强度与渗透深度的关系示意图。 具体实施方式
为使本发明实施例的目的、 技术方案和优点更加清楚, 下面将结合本发 明实施例的附图,对本发明实施例的技术方案进行清楚、 完整地描述。显然, 所描述的实施例是本发明的一部分实施例, 而不是全部的实施例。 基于所描 述的本发明的实施例, 本领域普通技术人员在无需创造性劳动的前提下所获 得的所有其他实施例, 都属于本发明保护的范围。
除非另作定义, 此处使用的技术术语或者科学术语应当为本发明所属领 域内具有一般技能的人士所理解的通常意义。 本发明专利申请说明书以及权 利要求书中使用的 "第一" 、 "第二" 以及类似的词语并不表示任何顺序、 数量或者重要性,而只是用来区分不同的组成部分。同样, "一个 "或者 "一" 等类似词语也不表示数量限制, 而是表示存在至少一个。 "连接" 或者 "相 连" 等类似的词语并非限定于物理的或者机械的连接, 而是可以包括电性的 连接, 不管是直接的还是间接的。 "上" 、 "下" 、 "左" 、 "右" 等仅用 于表示相对位置关系, 当被描述对象的绝对位置改变后, 则该相对位置关系 也相应地改变。 图 1为本发明实施例一提供的一种液晶显示面板的修复方法的流程图, 如图 1所示, 该方法包括如下步骤。
步骤 101、 判断液晶显示面板是否出现亮点, 若判断出液晶显示面板出 现亮点, 则执行步骤 102; 若判断出液晶显示面板未出现亮点, 则流程结束。
在将彩膜基板和阵列基板对盒形成液晶显示面板后, 对液晶显示面板进 行测试, 以判断液晶显示面板是否出现亮点。
本实施例中, 液晶显示面板包括相对设置的彩膜基板和阵列基板, 彩膜 基板包括衬底基板以及形成于衬底基板上的黑矩阵图形和彩色矩阵图形。 彩 色矩阵图形可包括红色矩阵图形、 绿色矩阵图形和蓝色矩阵图形, 分别对应 于用于显示红色、 绿色和蓝色的子像素。
本步骤中, 液晶显示面板出现亮点的原因包括如下之一或其任意组合:
TFT过孔缺失 ( TFT via hole missing ) 、 TFT栅极开路 ( TFT gate open ) 、 跨栅线的像素间短路 ( Pixel-to-pixel short across gate line ) 、 像素与数据线间 短路 ( Pixel-to-data line short ) 、 像素下存在数据线残留物 ( data line residue under pixel ) 、 像素下存在 a-Si残留物( a-Si residue under pixel ) 、 跨数据线 的像素间短路 ( Pixel-to-pixel short across data line ) 、 像素与栅线间短路 ( Pixel-to-gate line short ) 、 TFT器件关闭电流过高( High TFT off-current ) 、 TFT器件打开电流过小( Low TFT on-current )、 液晶层出现异物、 接触面不 良、 源漏极开路(S/D开路)等。 若出现上述之一或其任意组合中出现的情 况, 则会导致液晶显示面板出现亮点。
图 2为本实施例中引发亮点的一种示意图。 如图 2所示, 液晶显示面板 100包括相对设置的彩膜基板和阵列基板 1 ,彩膜基板和阵列基板 1之间通过 隔垫物间隔开, 并且填充有液晶层 20。 在液晶显示面板 100的周边通过封框 胶(未示出)等密封形成液晶盒(cell ) 。 彩膜基板包括衬底基板 21以及形 成于^"底基板 21上的彩色矩阵图形和黑矩阵图形 22。黑矩阵图形 22例如围 绕在彩色矩阵图形的周围。 彩色矩阵图形包括红色矩阵图形 23、 绿色矩阵图 形 24和蓝色矩阵图形 25 , 分别对应于液晶显示面板 100用于显示红色、 绿 色和蓝色的子像素。 图 2中给出了由液晶层 20出现异物 40而引发亮点的情 况, 由异物引发的亮点对应于绿色矩阵图形 24。 异物 40例如是在液晶面板 的制备期间残留的颗粒。 图 3为本实施例中引发亮点的另一种示意图, 如图 3所示, 图 3中给出 了由 TFT的过孔缺失、 TFT的栅极开路、 跨栅线的像素间短路、 像素与数据 线间短路、 像素下存在数据线残留物、 像素下存在 a-Si残留物、 跨数据线的 像素间短路、像素与栅线间短路、 TFT器件关闭电流过高以及 TFT器件打开 电流过小而引发亮点。
步骤 102、 通过激光将亮点转化成暗点, 以完成对亮点不良的初次修复。 本实施例中, 步骤 102例如包括: 利用激光照射亮点对应的彩色矩阵图 形, 使衬底基板与亮点对应的彩色矩阵图形之间形成缝隙; 利用激光照射亮 点对应的彩色矩阵图形周边的黑矩阵图形, 使亮点对应的彩色矩阵图形周边 的黑矩阵图形颗粒化并通过缝隙扩散以覆盖亮点, 以使亮点转化成暗点。
图 4为利用激光照射亮点对应的彩色矩阵图形周边的黑矩阵图形的示意 图。
如图 4所示, 液晶显示面板 100包括彩膜基板和阵列基板 1 , 彩膜基板 包括衬底基板 21 以及形成于衬底基板 21 上的彩色矩阵图形和黑矩阵图形 22, 彩色矩阵图形包括红色矩阵图形 23、 绿色矩阵图形 24和蓝色矩阵图形 25。 亮点例如对应于绿色矩阵图形 24。 利用激光 50照射亮点对应的绿色矩 阵图形 24, 使衬底基板 21与亮点对应的绿色矩阵图形 24之间形成缝隙; 利 用激光照射亮点对应的绿色矩阵图形 24周边的黑矩阵图形 22, 黑矩阵图形 22颗粒化并通过缝隙扩散, 覆盖了亮点对应的绿色矩阵图形的一部分, 从而 实现了将亮点覆盖, 将亮点转换为暗点。
图 5为激光强度与渗透深度的关系示意图。 如图 5所示, 激光照射亮点 对应的彩色矩阵图形周边的黑矩阵图形时对黑矩阵图形的渗透深度可由激光 的强度决定, 因此可通过调节激光的强度调节渗透深度, 以达到覆盖亮点的 目的。 其中, 激光的强度越强, 渗透深度越大。 例如, 如图 5所示, 激光的 强度和渗透深度呈正相关关系。
步骤 103、 检测初次修复后的像素点的光参数。
本实施例中, 检测出彩膜基板上每个彩色矩阵图形的光参数, 其中, 光 参数可包括: 光透过率和 /或光透过面积。
步骤 104、 判断某一像素点的光参数是否大于或等于特定数值, 若判断 出光参数大于或者等于所述特定数值, 则执行步骤 105; 若判断出光参数小 于所述特定数值, 则流程结束。
本实施例中, 步骤 102中通过激光将亮点转化成暗点时, 有可能存在修 复效果不好的像素点。 此时, 可对初次修复后的像素点进行检测, 得出被测 像素点对应的光参数, 并通过判断所述光参数是否大于或等于特定数值, 来 确定该像素点是否仍存在亮点不良。若判断出光参数大于或者等于特定数值, 则表明该彩色矩阵图形对应的亮点的初次修复效果不好、 仍存在不良, 此时 可确定光透过率大于或者等于特定数值的像素点为剩余亮点。 若判断出光参 数小于特定数值, 则表明该彩色矩阵图形未对应亮点或者对应的亮点已通过 激光转换为暗点, 无需进行进一步处理。
特定数值可根据需要预先设定。 例如, 光参数为光透过率时, 若亮点对 应的彩色矩阵图形为红色矩阵图形, 特定数值为 16%; 或者, 若亮点对应的 彩色矩阵图形为绿色矩阵图形, 特定数值为 8%; 或者, 若亮点对应的彩色 矩阵图形为蓝色矩阵图形, 特定数值为 24%。
如果光参数为光透过面积, 则特定数值为亮点对应的像素开口面积的三 分之一。
步骤 105、 确定出光参数大于或者等于特定数值的像素点为剩余亮点, 并对剩余亮点在该彩色矩阵图形上对应的区域进行碳化处理, 流程结束。
在步骤 104中, 当判断出光参数大于或者等于特定数值时, 确定出该彩 色矩阵图形还对应于未能通过激光转换为暗点的亮点, 即剩余亮点。 对剩余 亮点在该彩色矩阵图形上对应的区域进行碳化处理, 可以尽量将液晶显示面 板的光参数维修至小于特定数值的情形, 从而提高液晶显示面板的质量。
对剩余亮点在该彩色矩阵图形上对应的区域进行碳化处理例如包括: 利 用激光照射剩余亮点在该彩色矩阵图形上对应的区域, 使该区域分解为碳和 气体化合物, 从而实现对剩余亮点在该彩色矩阵图形上对应的区域的碳化处 理。被碳化处理的区域仅为彩色矩阵图形的一部分,该部分对应于剩余亮点。 由于气体化合物的作用, 碳化后的该区域呈现蜂窝状。
用于照射剩余亮点的彩色矩阵图形的激光, 在碳化处理阶段的激光强度 要大于其在初次修复时照射彩色矩阵图形的激光强度, 例如约为 1.5倍的关 系, 这样可顺利将亮点区域的彩色矩阵图形分解成碳以形成暗点。
本实施例提供的液晶显示面板的修复方法包括将亮点转化成暗点的初次 修复,并对初次修复后的像素点进行检测;若检测结果表明仍存在亮点不良, 则对剩余亮点在彩色矩阵图形上对应的区域进行碳化处理; 利用本发明提供 的方案, 不仅可以提高亮点不良的修复率, 而且避免了持续施加高电压过程 中产生的异物使液晶显示面板发生线不良的情况, 降低了产品的不良率以及 提高了产品活用度, 从而提高了生产效率。 例性实施方式, 然而本发明并不局限于此。 对于本领域内的普通技术人员而 言, 在不脱离本发明的精神和实质的情况下, 可以做出各种变型和改进, 这 些变型和改进也视为本发明的保护范围。

Claims

权利要求书
1、一种液晶显示面板的修复方法,所述液晶显示面板的彩膜基板包括衬 底基板以及形成于所述衬底基板上的黑矩阵图形和彩色矩阵图形, 所述修复 方法包括:
在所述液晶显示面板出现亮点不良时, 通过将所述亮点转化成暗点来对 所述亮点不良进行初次修复;
检测初次修复后的像素点的光参数;
若判断出某一像素点的光参数大于或者等于特定数值, 确定所述光参数 大于或者等于所述特定数值的像素点为剩余亮点, 对所述液晶显示面板的彩 膜基板上与所述剩余亮点对应的区域进行碳化处理。
2、根据权利要求 1所述的液晶显示面板的修复方法, 其中, 所述将所述 亮点转化成暗点包括:
利用激光照射所述亮点对应的彩色矩阵图形, 使衬底基板与亮点对应的 彩色矩阵图形之间形成缝隙;
利用激光照射所述亮点对应的彩色矩阵图形周边的黑矩阵图形, 使所述 亮点对应的彩色矩阵图形周边的黑矩阵图形颗粒化并通过所述缝隙扩散以覆 盖所述亮点, 以使所述亮点转化成暗点。
3、根据权利要求 2所述的液晶显示面板的修复方法, 其中, 激光照射所 述亮点对应的彩色矩阵图形周边的黑矩阵图形时对黑矩阵图形的渗透深度由 所述激光的强度决定。
4、根据权利要求 3所述的液晶显示面板的修复方法, 其中, 所述激光的 强度越强, 所述渗透深度越大。
5、 根据权利要求 1-4任一所述的液晶显示面板的修复方法, 其中, 所述 对所述液晶显示面板的彩膜基板上与所述剩余亮点对应的区域进行碳化处 理, 包括:
利用激光照射所述剩余亮点在彩膜基板上对应的区域, 使该区域的彩色 矩阵图形分解为碳和气体化合物, 以使所述剩余亮点转化成暗点。
6、 根据权利要求 1-5任一所述的液晶显示面板的修复方法, 其中, 所述 光参数包括光透过率。
7、 根据权利要求 6所述的液晶显示面板的修复方法, 其中, 若所述亮点对应的彩色矩阵图形为红色矩阵图形,所述特定数值为 16%; 若所述亮点对应的彩色矩阵图形为绿色矩阵图形, 所述特定数值为 8%; 若所述亮点对应的彩色矩阵图形为蓝色矩阵图形,所述特定数值为 24%。
8、 根据权利要求 1-5任一所述的液晶显示面板的修复方法, 其中, 所述 光参数包括光透过面积。
9、根据权利要求 8所述的液晶显示面板的修复方法, 其中, 所述特定数 值为所述亮点对应的像素开口面积的三分之一。
10、 根据权利要求 1至 9任一所述的液晶显示面板的修复方法, 其中, 所述液晶显示面板出现亮点的原因包括如下之一或其任意组合: 薄膜晶体管 TFT的过孔缺失、 TFT的栅极开路、 跨栅线的像素间短路、 像素与数据线间 短路、 像素下存在数据线残留物、 像素下存在 a-Si残留物、 跨数据线的像素 间短路、 像素与栅线间短路、 TFT器件关闭电流过高、 TFT器件打开电流过 小、 液晶层出现异物、 接触面不良、 源漏极开路。
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