WO2013122763A1 - X-ray inspection using wavelength-shifting fiber-coupled scintillation detectors - Google Patents
X-ray inspection using wavelength-shifting fiber-coupled scintillation detectors Download PDFInfo
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- WO2013122763A1 WO2013122763A1 PCT/US2013/024585 US2013024585W WO2013122763A1 WO 2013122763 A1 WO2013122763 A1 WO 2013122763A1 US 2013024585 W US2013024585 W US 2013024585W WO 2013122763 A1 WO2013122763 A1 WO 2013122763A1
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- Prior art keywords
- detector
- scintillation
- scintillator
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- fiber
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- 238000007689 inspection Methods 0.000 title claims description 64
- 239000000835 fiber Substances 0.000 title claims description 61
- 230000005855 radiation Effects 0.000 claims abstract description 44
- 238000001514 detection method Methods 0.000 claims abstract description 35
- 239000000463 material Substances 0.000 claims abstract description 31
- 230000003287 optical effect Effects 0.000 claims abstract description 25
- 238000000034 method Methods 0.000 claims abstract description 24
- 230000000149 penetrating effect Effects 0.000 claims abstract description 12
- 239000013307 optical fiber Substances 0.000 claims abstract description 10
- 238000000605 extraction Methods 0.000 claims abstract description 7
- 238000003384 imaging method Methods 0.000 claims description 15
- 238000005253 cladding Methods 0.000 claims description 11
- 239000004033 plastic Substances 0.000 claims description 9
- 229920003023 plastic Polymers 0.000 claims description 9
- 238000004519 manufacturing process Methods 0.000 claims description 8
- 230000035945 sensitivity Effects 0.000 claims description 5
- ZZUPSSRPSMHYJA-UHFFFAOYSA-N [Ba].ClF Chemical compound [Ba].ClF ZZUPSSRPSMHYJA-UHFFFAOYSA-N 0.000 claims description 4
- 229910052788 barium Inorganic materials 0.000 claims description 3
- DSAJWYNOEDNPEQ-UHFFFAOYSA-N barium atom Chemical compound [Ba] DSAJWYNOEDNPEQ-UHFFFAOYSA-N 0.000 claims description 3
- 150000004820 halides Chemical class 0.000 claims description 3
- 230000003595 spectral effect Effects 0.000 claims description 3
- 238000012545 processing Methods 0.000 claims description 2
- 230000005540 biological transmission Effects 0.000 abstract description 18
- 230000010354 integration Effects 0.000 abstract description 3
- 230000002123 temporal effect Effects 0.000 abstract 1
- 239000010410 layer Substances 0.000 description 39
- 238000001125 extrusion Methods 0.000 description 11
- 239000002131 composite material Substances 0.000 description 9
- 229920000642 polymer Polymers 0.000 description 8
- 239000011162 core material Substances 0.000 description 7
- 230000008878 coupling Effects 0.000 description 5
- 238000010168 coupling process Methods 0.000 description 5
- 238000005859 coupling reaction Methods 0.000 description 5
- 239000006096 absorbing agent Substances 0.000 description 4
- 238000010521 absorption reaction Methods 0.000 description 4
- 230000008901 benefit Effects 0.000 description 4
- 239000002245 particle Substances 0.000 description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- 239000013078 crystal Substances 0.000 description 3
- 238000009826 distribution Methods 0.000 description 3
- 230000004907 flux Effects 0.000 description 3
- 239000011159 matrix material Substances 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 108010000722 Excitatory Amino Acid Transporter 1 Proteins 0.000 description 2
- 102100031563 Excitatory amino acid transporter 1 Human genes 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 230000009977 dual effect Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 239000011888 foil Substances 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 230000006872 improvement Effects 0.000 description 2
- 238000001746 injection moulding Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- MYWUZJCMWCOHBA-VIFPVBQESA-N methamphetamine Chemical compound CN[C@@H](C)CC1=CC=CC=C1 MYWUZJCMWCOHBA-VIFPVBQESA-N 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 239000011368 organic material Substances 0.000 description 2
- 239000000049 pigment Substances 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 238000003860 storage Methods 0.000 description 2
- 239000013598 vector Substances 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 239000004593 Epoxy Substances 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- 239000004698 Polyethylene Substances 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- MCVAAHQLXUXWLC-UHFFFAOYSA-N [O-2].[O-2].[S-2].[Gd+3].[Gd+3] Chemical compound [O-2].[O-2].[S-2].[Gd+3].[Gd+3] MCVAAHQLXUXWLC-UHFFFAOYSA-N 0.000 description 1
- 239000011358 absorbing material Substances 0.000 description 1
- 238000000862 absorption spectrum Methods 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 238000009412 basement excavation Methods 0.000 description 1
- JJWKPURADFRFRB-UHFFFAOYSA-N carbonyl sulfide Chemical compound O=C=S JJWKPURADFRFRB-UHFFFAOYSA-N 0.000 description 1
- 239000000969 carrier Substances 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000001186 cumulative effect Effects 0.000 description 1
- 238000004512 die casting Methods 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 238000000295 emission spectrum Methods 0.000 description 1
- 239000002657 fibrous material Substances 0.000 description 1
- 239000004519 grease Substances 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 239000013308 plastic optical fiber Substances 0.000 description 1
- 229920000728 polyester Polymers 0.000 description 1
- -1 polyethylene Polymers 0.000 description 1
- 229920000573 polyethylene Polymers 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000000644 propagated effect Effects 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 239000011241 protective layer Substances 0.000 description 1
- 229910052761 rare earth metal Inorganic materials 0.000 description 1
- 238000009877 rendering Methods 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 238000007493 shaping process Methods 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 230000000153 supplemental effect Effects 0.000 description 1
- 238000005303 weighing Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2008—Measuring radiation intensity with scintillation detectors using a combination of different types of scintillation detectors, e.g. phoswich
-
- G01V5/22—
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2006—Measuring radiation intensity with scintillation detectors using a combination of a scintillator and photodetector which measures the means radiation intensity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/201—Measuring radiation intensity with scintillation detectors using scintillating fibres
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20181—Stacked detectors, e.g. for measuring energy and positional information
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20185—Coupling means between the photodiode and the scintillator, e.g. optical couplings using adhesives with wavelength-shifting fibres
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T3/00—Measuring neutron radiation
- G01T3/06—Measuring neutron radiation with scintillation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T5/00—Recording of movements or tracks of particles; Processing or analysis of such tracks
- G01T5/08—Scintillation chambers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14643—Photodiode arrays; MOS imagers
- H01L27/14658—X-ray, gamma-ray or corpuscular radiation imagers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T7/00—Details of radiation-measuring instruments
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14643—Photodiode arrays; MOS imagers
Abstract
Description
Claims
Priority Applications (17)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
MX2014009790A MX337476B (en) | 2012-02-14 | 2013-02-04 | X-ray inspection using wavelength-shifting fiber-coupled scintillation detectors. |
KR1020147025181A KR102105727B1 (en) | 2012-02-14 | 2013-02-04 | X-Ray Inspection using Wavelength-Shifting Fiber-Coupled Scintillation Detectors |
KR1020207011502A KR102293638B1 (en) | 2012-02-14 | 2013-02-04 | X-Ray Inspection using Wavelength-Shifting Fiber-Coupled Scintillation Detectors |
CA2864354A CA2864354C (en) | 2012-02-14 | 2013-02-04 | X-ray inspection using wavelength-shifting fiber-coupled scintillation detectors |
CN201380016922.5A CN104204854B (en) | 2012-02-14 | 2013-02-04 | X-ray inspection using wavelength-shifting fiber-coupled scintillation detectors |
ES13749372.2T ES2685971T3 (en) | 2012-02-14 | 2013-02-04 | X-ray inspection using fiber-coupled scintillation detectors with wavelength shift |
KR1020217004548A KR102266814B1 (en) | 2012-02-14 | 2013-02-04 | X-Ray Inspection using Wavelength-Shifting Fiber-Coupled Scintillation Detectors |
JP2014556590A JP2015513075A (en) | 2012-02-14 | 2013-02-04 | X-ray inspection using wavelength-shifted fiber-coupled scintillation detector |
BR112014019517-0A BR112014019517B1 (en) | 2012-02-14 | 2013-02-04 | x-ray radiation detector |
RU2014133352A RU2606698C2 (en) | 2012-02-14 | 2013-02-04 | X-ray examination using fibre scintillation detectors with wavelengths shift |
EP13749372.2A EP2825904B1 (en) | 2012-02-14 | 2013-02-04 | X-ray inspection using wavelength-shifting fiber-coupled scintillation detectors |
KR1020207011500A KR20200044997A (en) | 2012-02-14 | 2013-02-04 | X-Ray Inspection using Wavelength-Shifting Fiber-Coupled Scintillation Detectors |
IL234076A IL234076B (en) | 2012-02-14 | 2014-08-12 | X-ray inspection using wavelength-shifting fiber-coupled scintillation detectors |
HK15103106.8A HK1202633A1 (en) | 2012-02-14 | 2015-03-27 | -ray inspection using wavelength-shifting fiber-coupled scintillation detectors |
HK15104048.7A HK1203632A1 (en) | 2012-02-14 | 2015-04-27 | -ray inspection using wavelength-shifting fiber-coupled scintillation detectors |
IL259730A IL259730A (en) | 2012-02-14 | 2018-05-31 | X-ray inspection using wavelength-shifting fiber-coupled scintillation detectors |
IL259737A IL259737B (en) | 2012-02-14 | 2018-05-31 | X-ray inspection using wavelength-shifting fiber-coupled scintillation detectors |
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201261598521P | 2012-02-14 | 2012-02-14 | |
US201261598576P | 2012-02-14 | 2012-02-14 | |
US61/598,576 | 2012-02-14 | ||
US61/598,521 | 2012-02-14 | ||
US201261607066P | 2012-03-06 | 2012-03-06 | |
US61/607,066 | 2012-03-06 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2013122763A1 true WO2013122763A1 (en) | 2013-08-22 |
Family
ID=48945537
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2013/024585 WO2013122763A1 (en) | 2012-02-14 | 2013-02-04 | X-ray inspection using wavelength-shifting fiber-coupled scintillation detectors |
Country Status (18)
Country | Link |
---|---|
US (4) | US9285488B2 (en) |
EP (1) | EP2825904B1 (en) |
JP (6) | JP2015513075A (en) |
KR (4) | KR20200044997A (en) |
CN (3) | CN107193034A (en) |
BR (1) | BR112014019517B1 (en) |
CA (2) | CA3080221A1 (en) |
CL (1) | CL2014002144U1 (en) |
DE (2) | DE202013012100U1 (en) |
ES (4) | ES1154460Y (en) |
GT (1) | GT201400009U (en) |
HK (3) | HK1202633A1 (en) |
IL (3) | IL234076B (en) |
MX (1) | MX337476B (en) |
PE (1) | PE20150237Z (en) |
PL (2) | PL125062U1 (en) |
RU (1) | RU2606698C2 (en) |
WO (1) | WO2013122763A1 (en) |
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US10067261B2 (en) | 2015-09-15 | 2018-09-04 | Halliburton Energy Services, Inc. | Downhole photon radiation detection using scintillating fibers |
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US11175245B1 (en) | 2020-06-15 | 2021-11-16 | American Science And Engineering, Inc. | Scatter X-ray imaging with adaptive scanning beam intensity |
US11300703B2 (en) | 2015-03-20 | 2022-04-12 | Rapiscan Systems, Inc. | Hand-held portable backscatter inspection system |
US11340361B1 (en) | 2020-11-23 | 2022-05-24 | American Science And Engineering, Inc. | Wireless transmission detector panel for an X-ray scanner |
US11525930B2 (en) | 2018-06-20 | 2022-12-13 | American Science And Engineering, Inc. | Wavelength-shifting sheet-coupled scintillation detectors |
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US11579327B2 (en) | 2012-02-14 | 2023-02-14 | American Science And Engineering, Inc. | Handheld backscatter imaging systems with primary and secondary detector arrays |
DE102015101764A1 (en) * | 2015-02-06 | 2016-08-11 | Thermo Fisher Scientific Messtechnik Gmbh | Apparatus and method for detecting radioactive radiation |
US11300703B2 (en) | 2015-03-20 | 2022-04-12 | Rapiscan Systems, Inc. | Hand-held portable backscatter inspection system |
US11561320B2 (en) | 2015-03-20 | 2023-01-24 | Rapiscan Systems, Inc. | Hand-held portable backscatter inspection system |
US10067261B2 (en) | 2015-09-15 | 2018-09-04 | Halliburton Energy Services, Inc. | Downhole photon radiation detection using scintillating fibers |
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