CN106290427A - Back scattering imaging method and system - Google Patents
Back scattering imaging method and system Download PDFInfo
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- CN106290427A CN106290427A CN201610900969.3A CN201610900969A CN106290427A CN 106290427 A CN106290427 A CN 106290427A CN 201610900969 A CN201610900969 A CN 201610900969A CN 106290427 A CN106290427 A CN 106290427A
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- detector
- sidepiece
- region
- carrying platform
- travel mechanism
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/203—Measuring back scattering
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/10—Different kinds of radiation or particles
- G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
- G01N2223/1016—X-ray
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
- G01N2223/3303—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts object fixed; source and detector move
Abstract
The invention discloses a kind of back scattering imaging method and system.Wherein, scanning means is fixed on carrying platform, and for detection field emission flying spot bundle, one or more detectors are movably disposed on carrying platform, for receiving the scattered ray bundle of the examined object scattering from detection region.Thus, it is possible to the height in the detection region paid close attention to as required, regulate the position of one or more detector, so that the test surface of detector is in the position being suitable to receive the signal of the examined object scattering from detection region.
Description
Technical field
The present invention relates to radiography field, particularly relate to a kind of back scattering imaging method and system.
Background technology
During Non-Destructive Testing and safety check products application, the X-ray collecting detected material volume scattering is utilized to carry out imaging
Technology referred to as scatter imaging technique.When the angle of scattering of X-ray of scattering of systematic collection is between 90 °～180 °, claim
For back scattering imaging technology, utilize the feature of back scattering, low atomic number can be highlighted on the image that system obtains
Material.
The radiating system of (being properly termed as back scattering equipment) of employing back scattering imaging technology and detection system are all same
Side, this makes back scattering imaging technology be widely used in the field such as hidden inspection, mobile inspection, for cracking down on smuggling, anti-terrorism
Provide efficient detection means.
Existing back scattering imaging integration of equipments is in the nacelle closed, and the nacelle of closing is typically integrated in the vehicle of traveling
On, owing to vehicle has certain height so that the detection system in back scattering imaging equipment obtains bottom object to be detected
Information can seldom, and the place of to be emphasis conceal vehicle bottom and chassis contraband, dangerous materials.Therefore this kind of scheme, quilt are used
The footer information of detection object can be lost, and is unfavorable for finding contraband, dangerous materials etc..
It addition, when detecting higher building body, owing to the position of the detection system in existing back scattering imaging equipment is fixed,
Well the top information of object to be detected can not be detected.Such as, detect aircraft time, due to aircraft height relatively
Height, and the position of the detection system of existing back scattering imaging equipment is fixed, then a lot of information at aircraft top cannot be by
Detect.
Thus, it is desirable to a kind of back scattering imaging method and system that can adapt to different detection scene.
Summary of the invention
A kind of back scattering imaging that can adapt to polytype examined object of offer is provided
Method and system.
According to an aspect of the invention, it is provided a kind of back scattering imaging system, including: carrying platform；Scanning means,
It is fixed on carrying platform, for detection field emission flying spot bundle；And one or more detector, set movably
Put on carrying platform, for receiving the scattered ray bundle of the examined object scattering from detection region.
Preferably, one or more detectors may include that sidepiece detector, and sidepiece detector is with sidepiece travel mechanism even
Connecing, under the effect of sidepiece travel mechanism, sidepiece detector can move up and down at the sidepiece of carrying platform.
Preferably, one or more detectors can also include: top detector, and travel mechanism is connected with top, on top
Under the effect of travel mechanism of portion, top detector can move at the top of carrying platform；And/or bottom detector, with bottom
Travel mechanism connects, and under the effect of bottom travel mechanism, bottom detector can move in the bottom of carrying platform.
Preferably, under the effect of top travel mechanism, the test surface of top detector can be in primary importance and second
Moving between position, primary importance is parallel to horizontal plane and is positioned at the top at carrying platform top, the second position and primary importance
It is positioned at the both sides of sidepiece place vertical；And/or under the effect of bottom travel mechanism, the test surface energy of bottom detector
Enough move between the 3rd position and the 4th position, optional position between the 3rd position and the 4th position, the 3rd position can be parked in
Being parallel to horizontal plane and be positioned at the lower section bottom carrying platform, the 4th position and the 3rd position are positioned at the two of sidepiece place vertical
Side.
Preferably, under the effect of top travel mechanism, top detector can be in the case of higher than carrying platform on
Lower movement；And/or under the effect of bottom travel mechanism, bottom detector can be in the case of less than carrying platform on
Lower movement.
Preferably, under the effect of top travel mechanism, top detector can be positioned at primary importance at its test surface
Move up and down in the case of the both sides of sidepiece place vertical；And/or under the effect of bottom travel mechanism, bottomside sounding
Device can move up and down in the case of its test surface and the 3rd position are positioned at the both sides of sidepiece place vertical.
Preferably, sidepiece detector includes that many sub-detectors, many sub-detectors are symmetrically disposed in scanning means
Both sides.
Preferably, scanning means may include that radiation source, is used for producing X-ray；Ray modulation device, for X-ray
It is modulated, to form flying spot bundle.
Preferably, carrying platform can be that moveable platform, scanning means and one or more detector can be along with taking
Carrying platform moves integrally.
Preferably, this back scattering imaging system can also include: type identification device, identifies examined object in advance
Type, in order to according to the type of the examined object identified determine detection region in region-of-interest；And regulation device,
For the height according to region-of-interest, regulate the position of one or more detector, so that the spy of one or more detector
Survey face is suitable to receive the scattered ray bundle of the examined object scattering from region-of-interest.
According to another aspect of the present invention, additionally provide a kind of back scattering imaging method, including: based on examined object
Type, the region-of-interest in predetermined detection region；According to region-of-interest, regulate the position of one or more detector,
So that the test surface of one or more detectors is suitable to receive the scattered ray bundle from region-of-interest scattering；Use scanning means
Flying spot bundle is launched to region-of-interest.
Preferably, the position of one or more detector is regulated so that the test surface of one or more detector is suitable to connect
Receive the step from the scattered ray bundle of region-of-interest scattering and may include that the position regulating one or more detectors, to increase
The test surface of one or more detectors receives the reception solid angle of the scattered ray bundle from region-of-interest scattering.
Preferably, one or more detectors are movably disposed on carrying platform, and it is flat that scanning means is fixed on lift-launch
On platform, one or more detectors include that sidepiece detector, sidepiece detector are connected with sidepiece travel mechanism, in sidepiece moving machine
Under the effect of structure, sidepiece detector can move up and down at the sidepiece of carrying platform, and the method can also include: at region-of-interest
During for detecting the upper area in region, control sidepiece travel mechanism so that sidepiece detector moves up；And/or
When region-of-interest is the lower area in detection region, control sidepiece travel mechanism so that sidepiece detector moves down.
Preferably, one or more detectors also include top detector and/or bottom detector, top detector and top
Travel mechanism of portion connects, and under the effect of top travel mechanism, top detector can move at the top of carrying platform, bottom
Detector is connected with bottom travel mechanism, and under the effect of bottom travel mechanism, bottom detector can be at the end of carrying platform
Portion moves, and the method can also include: region-of-interest be detection region in lower area time, bottom control travel mechanism with
Bottom detector can be moved down in the case of less than carrying platform；Top in region-of-interest is detection region
During region, control top travel mechanism so that top detector can move up in the case of higher than carrying platform.
Preferably, the method can also include: when region-of-interest is to detect the lower area in region, controls top and moves
Motivation structure moves down be positioned at the both sides being positioned at sidepiece place vertical with primary importance at its test surface in the case of, wherein,
Primary importance is parallel to horizontal plane and is positioned at the top of carrying platform；And/or region-of-interest be detection region in upper
During region, portion, bottom control, travel mechanism is positioned at the feelings of the both sides being positioned at sidepiece place vertical with the 3rd position at its test surface
Moving up under condition, wherein, the 3rd is positioned parallel to horizontal plane and is positioned at the lower section of carrying platform.
Preferably, the method can also include: identifies the type of examined object in advance, in order to according to examined object
Type determines region-of-interest.
To sum up, the height in the detection region that the back scattering imaging method and system of the present invention can be paid close attention to as required, adjust
The position of joint detector, is suitable to receive what the examined object from detection region scattered so that the test surface of detector is in
The position of signal.
Accompanying drawing explanation
By combining accompanying drawing, disclosure illustrative embodiments is described in more detail, the disclosure above-mentioned and its
Its purpose, feature and advantage will be apparent from, wherein, in disclosure illustrative embodiments, and identical reference number
Typically represent same parts.
Fig. 1 shows the indicative flowchart of back scattering imaging method according to an embodiment of the invention.
Fig. 2 shows the structural representation of back scattering imaging system according to an embodiment of the invention.
Fig. 3 to Fig. 5 shows setting and the move mode of detector.
Fig. 6, Fig. 7 show the regulative mode of detector under specific works scene.
Detailed description of the invention
It is more fully described the preferred implementation of the disclosure below with reference to accompanying drawings.Although accompanying drawing shows the disclosure
Preferred implementation, however, it is to be appreciated that may be realized in various forms the disclosure and the embodiment party that should not illustrated here
Formula is limited.On the contrary, it is provided that these embodiments are to make the disclosure more thorough and complete, and can be by the disclosure
Scope intactly conveys to those skilled in the art.
One, technical scheme summary
As it was previously stated, when the type difference of examined object, need the position detecting region paid close attention to (the highest
Degree) also different.Such as, when detection object is aircraft, needs the detection region paid close attention to higher, be dilly at detection object
Time, need the height detecting region paid close attention to relatively low.
It is directed to this, we recognize that the height in the detection region that can pay close attention to as required, the position of regulation detector,
So that detector is in the position being suitable to receive the signal of the examined object scattering from detection region.
Based on above-mentioned thinking, the present invention proposes a kind of new back scattering imaging method.Fig. 1 shows that the back of the body of the present invention dissipates
Penetrate the indicative flowchart of formation method.
See Fig. 1, in step S110, type based on examined object, the region-of-interest in predetermined detection region.
When the type difference of examined object, detection needs the region paid close attention to also to be not quite similar in region.Such as,
When detecting object and being the bigger object of the builds such as aircraft, the upper area in detection region is the concern district needing to pay close attention to
Territory, when detecting object and being kart, the lower area in detection region is the region-of-interest needing to pay close attention to.
Thus, before performing step S110, it is also possible to identify the type of examined object in advance, in order to according to be detected
The type of object determines region-of-interest.
Here it is possible to arrange type identification device at the anterior preset distance in the detection region of back scattering imaging system,
Can be such as vision sensor, photoelectric sensor (e.g., light curtain switch), metal sensor (e.g., ground induction coil), pressure sensing
Device and combinations thereof, determine the type of examined object by type identification device.
In step S120, according to region-of-interest, regulate the position of one or more detector, so that one or more spy
The test surface surveying device is suitable to receive the scattered ray bundle from region-of-interest scattering.
For different types of examined object, the position of region-of-interest is not quite similar.Therefore, it can according to step
Region-of-interest determined by S110, the position of the detector (one or more) in regulation back scattering imaging system, so that visiting
The test surface surveying device is in the position being suitable to receive the scattered ray bundle from region-of-interest scattering.
Here it is possible to by the position regulating detector, the test surface increasing detector receives from described region-of-interest scattered
The reception solid angle of the scattered ray bundle penetrated, ensures that the test surface of detector is in suitable position.
After detector is adjusted to suitable position, it is possible to perform step S130, use scanning means to paying close attention to district
Flying spot bundle is launched in territory.
So far, schematically illustrating the back scattering imaging scheme of the present invention in conjunction with Fig. 1, the back scattering imaging scheme of the present invention can
To be embodied as a kind of back scattering imaging system.
Two, the structure of back scattering imaging system
Fig. 2 shows the structural representation of back scattering imaging system according to an embodiment of the invention.Wherein, Fig. 2 illustrates
Be the side view of back scattering imaging system.
As in figure 2 it is shown, the back scattering imaging system of the present embodiment includes carrying platform 10, scanning means 11 and detector
12。
Scanning means 11 can be fixed on carrying platform 10, to detection field emission flying spot bundle.Here, scanning dress
Putting 11 and can be constituted (not shown) by radiation source and ray modulation device, radiation source can launch predetermined beam, example
As launched X-ray fladellum, the fan-ray beam of radiation emission can be modulated by ray modulation device, to be formed
Flying-spot scanner beam.
Detector 12 is movably disposed on carrying platform 10, and the examined object that can receive from detection region dissipates
The scattered ray bundle penetrated.Wherein, Fig. 2 is illustrated that the situation being respectively provided with a detector in the both sides of scanning means 11, should
This is known, it is also possible to arrange one, three or more detectors, and multiple detector can be symmetrical arranged, it is also possible to examine
Consider the asymmetric setting of real space.Wherein, detector 12 can be connected with carrying platform 10, in travel mechanism by travel mechanism
Effect under, detector module can move up and down at the sidepiece of carrying platform 10, thus regulates the high and low position of detector 12.
Here it is possible to be that each detector configures a set of travel mechanism, it is also possible to multiple detectors share a set of travel mechanism, and this is permissible
Depend on the parameters such as the volumetric spaces requirement of detector, weight demands.
It addition, the position of detector can also be arranged on top and/or the bottom of carrying platform 10, the here tool of detector
Body setting means is described below.
As explained above with shown in Fig. 1, can according to determined by the region-of-interest that detects in region detector 12 is moved
Move to suitable position, so that the test surface of detector 12 is suitable to receive dissipating from the examined object scattering detected region
Penetrate beam.
Three, the setting of detector
Seeing Fig. 3, carrying platform 10 can be moveable platform, is arranged on the scanning means on carrying platform 10 (in figure
Not shown) and detector can move integrally along with carrying platform 10.Such as, carrying platform 10 can be vehicle, specifically,
The carrying platform 10 that the compartment of vehicle can be addressed as the present invention, operator can be correlated with in the driver's cabin of vehicle
Operation.
As it is shown on figure 3, one or more detection can be respectively provided with in the top of carrying platform 10, sidepiece and bottom
Device.For the ease of describing, can by being arranged on the top of carrying platform, sidepiece, the detector of bottom are called top detection
Device 12-1, sidepiece detector 12-2, bottom detector 12-3.
Wherein, top detector 12-1, sidepiece detector 12-2, bottom detector 12-3 can move with corresponding respectively
Mechanism (not shown) connects, so that top detector 12-1, sidepiece detector 12-2, bottom detector 12-3 can be
Move on carrying platform 10.
Seeing Fig. 4, top detector 12-1 can be connected with top travel mechanism 13, in the effect of top travel mechanism 13
Under, top detector 12-1 can translate on the horizontal plane at the place, top of carrying platform 10, it is also possible to flat carrying
The top at the top of platform 10 moves up and down.It is to say, top detector 12-1 can be at the work of top travel mechanism 13
Position with the top being moved to the top higher than carrying platform 10 shown in Fig. 4.
Correspondingly, bottom detector 12-3 can be connected with bottom travel mechanism 14, in the effect of bottom travel mechanism 14
Under, bottom detector 12-3 can translate on the horizontal plane at the place, bottom of carrying platform 10, it is also possible to flat carrying
The lower section of the bottom of platform 10 moves up and down.
Wherein, although Fig. 4 is shown without, it should be recognized that sidepiece detector 12-2 can with sidepiece travel mechanism even
Connecing, under the effect of sidepiece travel mechanism, sidepiece detector 12-2 can move up and down at the sidepiece of carrying platform 10.
Furthermore it is possible to realize top detector 12-1, sidepiece detector 12-2, bottom detector by a set of travel mechanism
The movement of 12-3, it is also possible to realized by Duo Tao travel mechanism.Concrete implementation mode can set according to practical situation
Fixed, repeat no more here.
Seeing Fig. 5, the test surface of top detector 12-1 is possible not only to move to be parallel to horizontal plane and is positioned at lift-launch flat
The position (here it is possible to referred to as primary importance) of the top at platform 10 top, it is also possible to move to be positioned at sidepiece institute with primary importance
Position (here it is possible to referred to as second position) in the both sides of vertical.As it is shown in figure 5, top detector 12-1 can move
Dotted line position in Fig. 5.It is to say, top detector 12-1 can be under the effect of top travel mechanism, it is achieved from top
Position, portion is to the conversion of side locations.Here, after top detector 12-1 is moved to side locations, top detector 12-1
Can also be under the effect of top travel mechanism, the sidepiece at carrying platform 10 moves up and down, i.e. top detector 12-1
" sidepiece detector " can be converted into.
It addition, the test surface of top detector 12-1 can move between the first position and the second position.It is to say,
Top detector 12-1 can move to the intersection at carrying platform 10 top and sidepiece, and, top detector 12-1 is permissible
Intersection at carrying platform 10 top with sidepiece rotates, and turning to the test surface of top detector 12-1, to be positioned at lift-launch flat
The outside of platform 10.Wherein, " outside " addressed here refer to the vertical at the sidepiece place with carrying platform 10 as demarcation line, with
Carrying platform 10 lays respectively at marginal both sides.Here it is possible to the intersection at top Yu sidepiece arranges a rotating shaft, work as top
When portion detector 12-1 moves to the intersection of top and sidepiece, can be around this axis of rotation.
Correspondingly, the test surface of bottom detector 12-3 is possible not only to move to be parallel to horizontal plane and be positioned at carrying platform
The position (here it is possible to the referred to as the 3rd position) of the lower section bottom 10, it is also possible to move to be positioned at sidepiece place with the 3rd position
The position (here it is possible to the referred to as the 4th position) of the both sides of vertical.Such as, bottom detector 12-3 can move in Fig. 4
Dotted line position.Further, under the effect of bottom travel mechanism, bottom detector 12-3 can also realize bottom position to sidepiece
The conversion of position.That is, after bottom detector 12-3 is moved to side locations, bottom detector 12-3 can also move in bottom
Under the effect of motivation structure, the sidepiece at carrying platform 10 moves up and down, i.e. bottom detector 12-3 can be converted into " sidepiece
Detector ".
Certainly, for sidepiece detector 12-2, it is possible not only under the effect of sidepiece travel mechanism in lift-launch flat
The sidepiece of platform 10 moves up and down, it is also possible under the effect of sidepiece travel mechanism, moves to the top at the top of carrying platform 10
Position, or the lower position of the bottom of carrying platform 10.It is to say, sidepiece detector 12-2 can be converted into " top
Detector " and/or " bottom detector ".
It addition, for sidepiece detector 12-2, it can include many sub-detectors, these many sub-detectors are permissible
It is symmetrically disposed in the both sides of scanning means.
For top detector 12-1 and/or bottom detector 12-3, it is also possible to correspondingly include that many height detect
Device, the position of many sub-detectors can set as required.
So far, in conjunction with Fig. 4, Fig. 5, the set-up mode of the detector in the present invention and the move mode of detector are done
Describe in detail.
Four, the regulation of detector under specific works scene
Below in conjunction with Fig. 6, Fig. 7 with regard in actual detection in the case of different types of examined object, the movement of detector
Situation is described further.
See Fig. 6, when examined object 20 is relatively low, it may be determined that region-of-interest is the lower area in detection region.By
In the scattered ray bundle scattered from region-of-interest angle of scattering be near 180 ° at most, more the fewest toward two side-scattered radiation bundles.Cause
This, can control sidepiece travel mechanism so that sidepiece detector 12-2 moves down, such as, can move to carrying platform 10
The position of sidepiece lower end.Sidepiece detector 12-2 can be moved to the centre bit of the test surface of sidepiece detector 12-2 here
Put near the position corresponding with region-of-interest.
When sidepiece detector 12-2 is moved down, it is possible to the scattering from the scattering of the top of region-of-interest detected is penetrated
Wire harness can reduce, and now i.e. can move to top detector 12-1 carry by top detector 12-1 " sidepiece "
The sidepiece of platform 10, and the top of sidepiece detector 12-2, to receive the scattered ray bundle from the scattering of the top of region-of-interest.
Wherein, Fig. 6 shows that top detector 12-1 is parallel to the schematic diagram of the sidepiece of carrying platform 10, it should be appreciated that
Top detector 12-1 can also have certain angle of inclination with carrying platform 10.Here it is possible to carry out according to practical situation
Set, as long as the reception solid angle receiving the scattered ray bundle from region-of-interest scattering can be increased.
It addition, when the height of region-of-interest is relatively low, only by sidepiece detector 12-2 is moved down, from region-of-interest
The scattered ray bundle of the bottom of scattering is it is possible to fully can not be received by the test surface of sidepiece detector 12-2.Therefore, it can
Bottom detector 12-3 is moved to the sidepiece of carrying platform 10, is positioned at the lower section of sidepiece detector 12-2.As such, it is possible to increase
Receive the reception solid angle of the scattered ray bundle scattered from region-of-interest.
Thus, according to the height of region-of-interest, can be with the position of comprehensive adjustment detector so that detector be in reception from
The position that the reception solid angle of scattered ray bundle of region-of-interest scattering is bigger.
It addition, when equipment is in transition or off working state, detector can be moved to state shown in Fig. 3, this
Position can be defined as zero-bit.
See Fig. 7, when examined object 20 is higher, it may be determined that region-of-interest is the upper region in detection region.Due to
From the scattered ray bundle of region-of-interest scattering angle of scattering be near 180 ° at most, more the fewest toward two side-scattered radiation bundles.Therefore,
Sidepiece travel mechanism can be controlled so that sidepiece detector 12-2 moves up, move to sidepiece upper of carrying platform 10
Side.Sidepiece detector 12-2 can be moved to center and the region-of-interest phase of the test surface of sidepiece detector 12-2 here
Near corresponding position.
When sidepiece detector 12-2 is moved up, it is possible to the scattering from the scattering of the bottom of region-of-interest detected is penetrated
Wire harness can reduce, and now i.e. can move to bottom detector 12-3 carry by bottom detector 12-3 " sidepiece "
The sidepiece of platform 10, the top of sidepiece detector 12-2, to receive the scattered ray from the scattering of the bottom of region-of-interest.
Wherein, Fig. 7 shows that bottom detector 12-3 is parallel to the schematic diagram of the sidepiece of carrying platform 10, it should be appreciated that
Bottom detector 12-3 can also have certain angle of inclination with carrying platform 10.Here it is possible to carry out according to practical situation
Setting, the premise of setting is the reception solid angle increasing as much as possible and receiving the scattered ray bundle from region-of-interest scattering.
It addition, when the height of region-of-interest is higher, only by sidepiece detector 12-2 is moved up, from region-of-interest
The scattered ray bundle of the top scattering of scattering is it is possible to fully can not be received by the test surface of sidepiece detector 12-2.Therefore,
Top detector 12-1 can be moved to the sidepiece of carrying platform 10, be positioned at the top of sidepiece detector 12-2.As such, it is possible to
Increase the reception solid angle receiving the scattered ray bundle from region-of-interest scattering.
To sum up, the back scattering imaging system of the present invention is mainly according to the height of the region-of-interest in detection region, comprehensively
The position of regulation detector so that it is bigger that detector is in the reception solid angle received from the scattered ray bundle of region-of-interest scattering
Position.
Thus, the back scattering imaging system of the present invention can also include type identification device and regulation device.Type identification
Device can identify the type of examined object in advance, in order to determines detection region according to the type of the examined object identified
In region-of-interest.
Here, type identification device can include vision sensor, photoelectric sensor (e.g., light curtain switch), metal sensor
Device (e.g., ground induction coil), pressure transducer and combinations thereof.In a particular application, type identification device can be arranged on
The anterior position in detection region, is first identified the type of examined object, then according to the knot identified by type identification device
Really, region-of-interest is determined.
After determining region-of-interest, it is possible to by regulation device according to the height of region-of-interest, regulate detector
Position, so that the test surface of detector is suitable to receive the scattered ray bundle of the examined object scattering from region-of-interest.Its
In, concrete control methods can be found in related description.
Above describe the back scattering imaging method and system according to the present invention in detail by reference to accompanying drawing.
Being described above various embodiments of the present invention, described above is exemplary, and non-exclusive, and also
It is not limited to disclosed each embodiment.In the case of the scope and spirit without departing from illustrated each embodiment, for this skill
For the those of ordinary skill in art field, many modifications and changes will be apparent from.The selection of term used herein, purport
Explaining the principle of each embodiment, actual application or the improvement to the technology in market best, or making the art
Other those of ordinary skill is understood that each embodiment disclosed herein.
Claims (16)
1. a back scattering imaging system, it is characterised in that including:
Carrying platform；
Scanning means, is fixed on described carrying platform, for detection field emission flying spot bundle；And
One or more detectors, are movably disposed on described carrying platform, for receiving from described detection region
The scattered ray bundle of examined object scattering.
Back scattering imaging system the most according to claim 1, wherein, the one or more detector includes:
Sidepiece detector, described sidepiece detector is connected with sidepiece travel mechanism, under the effect of described sidepiece travel mechanism, institute
State sidepiece detector to move up and down at the sidepiece of described carrying platform.
Back scattering imaging system the most according to claim 2, it is characterised in that the one or more detector also wraps
Include:
Top detector, travel mechanism is connected with top, under the effect of described top travel mechanism, described top detector energy
Enough move at the top of described carrying platform；And/or
Bottom detector, travel mechanism is connected with bottom, under the effect of described bottom travel mechanism, described bottom detector energy
Enough move in the bottom of described carrying platform.
Back scattering imaging system the most according to claim 3, it is characterised in that
Under the effect of described top travel mechanism, the test surface of described top detector can be in primary importance and the second position
Between move, described primary importance is parallel to horizontal plane and is positioned at the top at described carrying platform top, the described second position with
Described primary importance is positioned at the both sides of described sidepiece place vertical；And/or
Under the effect of described bottom travel mechanism, the test surface of described bottom detector can be in the 3rd position and the 4th position
Between move, the described 3rd is positioned parallel to horizontal plane and is positioned at the lower section bottom described carrying platform, described 4th position with
Described 3rd position is positioned at the both sides of described sidepiece place vertical.
Back scattering imaging system the most according to claim 3, it is characterised in that
Under the effect of described top travel mechanism, described top detector can be in the case of higher than described carrying platform on
Lower movement；And/or
Under the effect of described bottom travel mechanism, described bottom detector can be in the case of less than described carrying platform on
Lower movement.
Back scattering imaging system the most according to claim 4, it is characterised in that
Under the effect of described top travel mechanism, described top detector can be positioned at described primary importance at its test surface
Move up and down in the case of the both sides of described sidepiece place vertical；And/or
Under the effect of described bottom travel mechanism, described bottom detector can be positioned at described 3rd position at its test surface
Move up and down in the case of the both sides of described sidepiece place vertical.
Back scattering imaging system the most according to claim 2, it is characterised in that
Described sidepiece detector includes many sub-detectors, and the plurality of sub-detector is symmetrically disposed in described scanning means
Both sides.
Back scattering imaging system the most according to claim 1, it is characterised in that described scanning means includes:
Radiation source, is used for producing X-ray；
Ray modulation device, for being modulated described X-ray, to form described flying spot bundle.
9. according to the back scattering imaging system in any of the one of claim 1 to 8, wherein,
Described carrying platform is moveable platform, and described scanning means and the one or more detector can be taken along with described
Carrying platform moves integrally.
Back scattering imaging system the most according to claim 9, it is characterised in that also include:
Type identification device, is used for identifying in advance the type of described examined object, in order to according to the examined object identified
Type determine the region-of-interest in described detection region；And
Regulation device, for the height according to described region-of-interest, regulates the position of the one or more detector, so that
The test surface of the one or more detector is suitable to receive the scattering of the examined object scattering from described region-of-interest and penetrates
Wire harness.
11. 1 kinds of back scattering imaging methods, it is characterised in that including:
Type based on examined object, the region-of-interest in predetermined detection region；
According to described region-of-interest, regulate the position of one or more detector, so that the one or more detector
Test surface is suitable to receive the scattered ray bundle scattered from described region-of-interest；
Scanning means is used to launch flying spot bundle to described region-of-interest.
12. according to back scattering imaging method described in claim 11, it is characterised in that the one or more detector of described regulation
Position is so that the test surface of the one or more detector is suitable to receive the scattered ray bundle scattered from described region-of-interest
Step include:
Regulate the position of the one or more detector, to increase the test surface reception of the one or more detector from institute
State the reception solid angle of the scattered ray bundle of region-of-interest scattering.
13. back scattering imaging methods according to claim 11, it is characterised in that the one or more detector can move
Being arranged on carrying platform, described scanning means is fixed on described carrying platform dynamicly, the one or more detector bag
Including sidepiece detector, described sidepiece detector is connected with sidepiece travel mechanism, under the effect of described sidepiece travel mechanism, described
Sidepiece detector can move up and down at the sidepiece of described carrying platform, and the method also includes:
During upper area in described region-of-interest is described detection region, control described sidepiece travel mechanism so that described
Sidepiece detector moves up；And/or
During lower area in described region-of-interest is described detection region, control described sidepiece travel mechanism so that described
Sidepiece detector moves down.
14. back scattering imaging methods according to claim 13, it is characterised in that the one or more detector also wraps
Including top detector and/or bottom detector, described top detector is connected with top travel mechanism, in described top moving machine
Under the effect of structure, described top detector can move at the top of described carrying platform, and described bottom detector moves with bottom
Motivation structure connects, and under the effect of described bottom travel mechanism, described bottom detector can be in the bottom of described carrying platform
Mobile, the method also includes:
During lower area in described region-of-interest is described detection region, control described bottom travel mechanism so that described
Bottom detector can move down in the case of less than described carrying platform；
During upper area in described region-of-interest is described detection region, control described top travel mechanism so that described
Top detector can move up in the case of higher than described carrying platform.
15. back scattering imaging methods according to claim 14, it is characterised in that the method also includes:
During lower area in described region-of-interest is described detection region, control described top travel mechanism at its test surface
It is positioned at be positioned at the both sides of described sidepiece place vertical with primary importance in the case of and moves down, wherein, described primary importance
It is parallel to horizontal plane and is positioned at the top of described carrying platform；And/or
During upper area in described region-of-interest is described detection region, control described bottom travel mechanism at its test surface
It is positioned at be positioned at the both sides of described sidepiece place vertical with the 3rd position in the case of and moves up, wherein, described 3rd position
It is parallel to horizontal plane and is positioned at the lower section of described carrying platform.
16. back scattering imaging methods according to claim 11, also include:
Identify the type of described examined object in advance, in order to determine described concern district according to the type of described examined object
Territory.
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610900969.3A CN106290427A (en) | 2016-10-17 | 2016-10-17 | Back scattering imaging method and system |
| PCT/CN2017/106327 WO2018072668A1 (en) | 2016-10-17 | 2017-10-16 | Image formation method and system utilizing backscattering |
| SA519401566A SA519401566B1 (en) | 2016-10-17 | 2019-04-14 | Backscatter Imaging Method and System |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610900969.3A CN106290427A (en) | 2016-10-17 | 2016-10-17 | Back scattering imaging method and system |
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| Publication Number | Publication Date |
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| CN106290427A true CN106290427A (en) | 2017-01-04 |
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| CN201610900969.3A Pending CN106290427A (en) | 2016-10-17 | 2016-10-17 | Back scattering imaging method and system |
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| Country | Link |
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| CN (1) | CN106290427A (en) |
| SA (1) | SA519401566B1 (en) |
| WO (1) | WO2018072668A1 (en) |
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| SA519401566B1 (en) | 2022-11-23 |
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