WO2020134307A1

WO2020134307A1 - Inspection system and imaging method

Info

Publication number: WO2020134307A1
Application number: PCT/CN2019/109935
Authority: WO
Inventors: 许艳伟; 孙尚民; 喻卫丰; 胡煜; 宗春光
Original assignee: 同方威视技术股份有限公司
Priority date: 2018-12-24
Filing date: 2019-10-08
Publication date: 2020-07-02
Also published as: CN109407162B; CN109407162A

Abstract

An inspection system and an imaging method. The inspection system comprises: an accelerator (10), configured to emit a beam of rays (F); a detector (20), configured to receive the beam of rays (F) emitted by the accelerator (10); and an imaging device (30), which is in signal connection to the detector (20) and is configured to acquire a scanning image of a detected object above the height of a target spot (T) of the accelerator (10). The system is able to improve the imaging quality of scanning images of a detected object.

Description

Inspection system and imaging method

Cross-reference of related applications

This application is based on the application with the CN application number 201811581322.4 and the application date is December 24, 2018, and claims its priority. The disclosure content of the CN application is hereby incorporated into this application as a whole.

Technical field

The present disclosure relates to the field of inspection technology, and particularly to an inspection system and imaging method.

Background technique

In the related art, the installation height of the accelerator target of some scanning devices used for safety inspection is fixed, for example, 500 mm-1000 mm from the ground. When the scanning equipment scans the vehicle to be inspected, the vehicle chassis is often scanned at the same time as the cargo is scanned. The scanned vehicle chassis is also imaged on the scanned image and overlaps with the image of the cargo, which affects the imaging effect of the cargo. If the vehicle chassis is low, the cargo may not be scanned.

In some related technologies, the height of the accelerator target of the scanning device may vary during the retracted state and the deployed working state. In order to adapt to super-high vehicles, some scanning equipment adjust the height of the accelerator target before the scanning starts. For example, the vehicle-mounted inspection system can adjust the height of the accelerator target through the cyclone of the chassis vehicle. For higher vehicles, the cyclone height can be adjusted before the vehicle enters the passage. However, once the scanning operation starts, the height of the accelerator target will be fixed and no longer adjusted.

Summary of the invention

In view of this, the embodiments of the present disclosure provide an inspection system and an imaging method, which can improve the imaging quality of a scanned image of an object to be inspected.

In one aspect of the present disclosure, an inspection system is provided, including:

An accelerator, configured to emit a beam of rays;

A detector configured to receive the beam of radiation from the accelerator; and

The imaging device, which is in signal connection with the detector, is configured to obtain a scanned image of the detected object above the height of the target point of the accelerator.

In some embodiments, the imaging device includes:

An image generation module configured to generate a complete scanned image of the detected object based on the detection signal of the detector; and

The image intercepting module is configured to intercept the scanned image above the target height of the accelerator on the complete scanned image of the detected object.

In some embodiments, the inspection system further includes:

The display, which is in signal connection with the imaging device, is configured to display a scanned image of the detected object above the height of the target point of the accelerator directly or according to an interactive instruction.

In some embodiments, the inspection system further includes:

The first height adjusting device, connected to the accelerator, is configured to adjust the height of the target point of the accelerator.

In some embodiments, the object to be inspected includes an object to be inspected carried by a vehicle, and the inspection system further includes:

A height recognition device configured to recognize the height of the chassis of the vehicle or the lowest height of the object to be inspected, so that the first height adjustment device adjusts the height of the target point of the accelerator according to the recognition result of the height recognition device .

In some embodiments, the height recognition device includes at least one of an area camera, a line camera, a planar laser, and a multi-line laser.

In some embodiments, the height identification device is configured to identify the height of the entire chassis of the vehicle at different cross-sections, or to identify the height of the chassis of the vehicle at different positions on the movement path of the vehicle The first height adjustment device is configured to dynamically adjust the height of the target point of the accelerator during the scanning process according to the recognition result of the height recognition device.

In some embodiments, the first height adjustment device is configured to set the height of the target point of the accelerator to the height of the chassis of the vehicle or the lowest height of the object to be inspected.

In some embodiments, the inspection system further includes:

The collimator adjustment device, connected to the accelerator, is configured to adjust the opening angle range of the beam emitted by the accelerator so that the lower edge of the opening angle range is parallel to the horizontal plane.

In some embodiments, the inspection system further includes:

A second height adjustment device, connected to the detector, is configured to adjust the height of the detector according to the adjustment amount of the height of the target point of the accelerator.

In some embodiments, the inspection system further includes: a manual manipulation mechanism connected to the first height adjustment device or the second height adjustment device, configured to manually drive the first height adjustment device or the The second height adjustment device performs a height adjustment operation.

In one aspect of the present disclosure, an imaging method of an inspection system is provided, including:

Control the accelerator to emit a ray beam to the detected object;

According to the detection signal of the detector, a scanned image of the detected object above the height of the target point of the accelerator is obtained.

In some embodiments, the operation of obtaining a scanned image of the detected object above the height of the accelerator target includes:

Generating a complete scanned image of the detected object according to the detection signal of the detector;

A scan image above the height of the target point of the accelerator is intercepted on the complete scan image of the object to be inspected.

In some embodiments, after obtaining the scanned image of the detected object above the height of the accelerator target, the method further includes:

Display the scanned image of the detected object above the height of the accelerator target directly or according to the interactive instruction.

In some embodiments, the object to be inspected includes an object to be inspected carried by a carrier, and the imaging method further includes:

Identify the height of the chassis of the vehicle or the lowest height of the object to be inspected;

Adjust the height of the target of the accelerator according to the recognition result.

In some embodiments, the operation of identifying the height of the chassis of the vehicle includes:

Identifying the height of the entire chassis of the vehicle at different cross-sections, or identifying the height of the chassis of the vehicle at different positions on the movement path of the vehicle;

The operation of adjusting the height of the target of the accelerator includes:

According to the recognition result, the height of the target point of the accelerator is dynamically adjusted during the scanning process.

In some embodiments, when adjusting the height of the target of the accelerator, the height of the target of the accelerator is set to the height of the chassis of the carrier or the lowest height of the object to be inspected.

In some embodiments, the imaging method further includes:

Adjust the opening angle range of the beam emitted by the accelerator so that the lower edge of the opening angle range is parallel to the horizontal plane.

In some embodiments, the imaging method further includes:

According to the adjustment amount of the height of the target point of the accelerator, the height of the detector is adjusted accordingly.

An accelerator, configured to emit a beam of rays;

The processor is configured to perform the aforementioned imaging method of the inspection system.

In one aspect of the present disclosure, a computer-readable storage medium is provided on which a computer program is stored, which when executed by a processor implements the aforementioned imaging method of the inspection system.

Therefore, according to an embodiment of the present disclosure, when the target height is at a suitable height, the imaging device obtains a scanned image of the detected object below the height of the accelerator target, which can eliminate the imaging of the detected object below the target height as much as possible The effect of the effect, thereby improving the imaging quality of the scanned image of the detected object.

BRIEF DESCRIPTION

The drawings that constitute a part of the description describe embodiments of the present disclosure, and together with the description serve to explain the principles of the present disclosure.

With reference to the drawings, the present disclosure can be more clearly understood from the following detailed description, in which:

FIG. 1 is a schematic diagram of the working principle of some embodiments of an inspection system according to the present disclosure;

2 is a schematic diagram of the working principle of other embodiments of the inspection system according to the present disclosure;

FIG. 3 is a schematic diagram of the working principle of further embodiments of the inspection system according to the present disclosure;

4 is a schematic flowchart of some embodiments of the imaging method of the inspection system according to the present disclosure;

5 is a schematic flowchart of some other embodiments of the imaging method of the inspection system according to the present disclosure;

6 is a schematic flow chart of adjusting the height of a target by height recognition in further embodiments of the imaging method of the inspection system according to the present disclosure;

7 is a schematic structural view of some embodiments of an inspection system according to the present disclosure.

It should be understood that the dimensions of the various parts shown in the drawings are not drawn according to the actual proportional relationship. In addition, the same or similar reference numerals indicate the same or similar components.

detailed description

Various exemplary embodiments of the present disclosure will now be described in detail with reference to the drawings. The description of the exemplary embodiments is merely illustrative, and in no way serves as any limitation to the present disclosure and its application or use. The present disclosure can be implemented in many different forms and is not limited to the embodiments described herein. These examples are provided to make the present disclosure thorough and complete, and to fully express the scope of the present disclosure to those skilled in the art. It should be noted that the relative arrangement of components and steps set forth in these embodiments should be interpreted as exemplary only, and not as limitations, unless specifically stated otherwise.

The terms “first”, “second” and similar words used in this disclosure do not indicate any order, quantity or importance, but are only used to distinguish different parts. Similar words such as "include" or "include" mean that the elements before the word cover the elements listed after the word, and do not exclude the possibility of covering other elements. "Up", "down", "left", "right", etc. are only used to indicate the relative positional relationship. When the absolute position of the described object changes, the relative positional relationship may also change accordingly.

In the present disclosure, when it is described that a specific device is located between the first device and the second device, there may or may not be an intervening device between the specific device and the first device or the second device. When it is described that a specific device is connected to another device, the specific device may be directly connected to the other device without an intervening device, or may be directly connected to the other device without an intervening device.

All terms (including technical or scientific terms) used in the present disclosure have the same meaning as understood by those of ordinary skill in the art to which the present disclosure belongs, unless specifically defined otherwise. It should also be understood that terms defined in, for example, general dictionaries should be interpreted as having meanings consistent with their meanings in the context of related technologies, and should not be interpreted using idealized or extremely formal meanings unless explicitly stated here Define it this way.

Techniques, methods and equipment known to those of ordinary skill in the related art may not be discussed in detail, but where appropriate, the techniques, methods and equipment should be considered as part of the specification.

As shown in FIG. 1, it is a schematic diagram of the working principle of some embodiments of the inspection system according to the present disclosure. Referring to FIG. 1, in some embodiments, the inspection system includes: an accelerator 10, a detector 20 and an imaging device 30. The accelerator 10 is an accelerator ray source, which is used to emit a beam F of radiation. The detector 20 is used to receive the ray beam F emitted by the accelerator 10, where the ray beam F may include the ray beam directly emitted to the detector 20 or the ray beam after transmitting the object to be inspected. The imaging device 30 is in signal connection with the detector 20 and is used to obtain a scanned image of the detected object above the height of the target point T of the accelerator 10.

For some objects to be inspected (for example, goods, parcels, etc.), in order to enable them to pass through the beam surface formed between the accelerator 10 and the detector 20, the object to be inspected often needs to be carried by a carrier. Vehicles may include vehicles such as trains, automobiles, remote or automatic control-based vehicles (such as Automated Guided Vehicles, AGVs) that can drive the movement of objects to be inspected, and may also include stationary vehicles such as shelves and platforms. Considering that the vehicle carrying the object to be inspected may also be scanned and imaged, for example, parts of the vehicle chassis and below generally do not need to be inspected, and these parts may degrade the imaging quality of the scanned image and affect the identification of the object to be inspected. For example, in FIG. 1, the object to be inspected includes two parts, one is the object to be inspected 92, and the other is the carrier 91 carrying the object 92 to be inspected. The height H of the target point T of the accelerator 10 may be the same height as the upper surface of the carrier 91. When scanning at this position, the beam F of the accelerator 10 can cover the object to be inspected 92 and a part of the vehicle 91.

In this embodiment, the imaging device 30 can obtain a scanned image of the detected object above the height of the target point T of the accelerator 10. In this way, the operator can control the height of the target point T to filter out the other parts that do not need to be scanned and imaged under the object to be inspected, thereby improving the imaging quality and obtaining a clearer and more recognizable scanned image.

Referring to FIG. 1, in some embodiments, the imaging device 30 may include an image generation module 31 and an image interception module 32. The image generating module 31 can be used to generate a complete scanned image of the object under inspection based on the detection signal of the detector 20. The image interception module 32 may be used to intercept the scan image above the target point T of the accelerator 10 on the complete scan image of the object to be inspected.

In order to enable the image intercepting module 32 to realize the scanning image interception, the height of the target point T of the accelerator 10 may be notified to the image intercepting module 32 so that the image intercepting module 32 intercepts and marks the complete scanned image. When it is necessary to present the scanned image, the inspection system can also directly display the scanned image of the detected object above the height of the target point T of the accelerator 10 through the display 40 signally connected to the imaging device 30, Or prompt the operator through an interactive command whether to present the complete scanned image. If the operator enters an interactive command to view the scanned image after interception, the height of the target object T at the target point T of the accelerator 10 is displayed according to the interactive command Scanned image above. In this way, the interference of non-objects to be scanned on the scanned image can be effectively shielded.

As shown in FIG. 2, it is a schematic diagram of the working principle of other embodiments of the inspection system according to the present disclosure. Compared with the above embodiments, the inspection system of this embodiment may further include a first height adjustment device 50. The first height adjustment device 50 is connected to the accelerator 10 and is used to adjust the height of the target point T of the accelerator 10. The height here may be a relative height determined relative to the vehicle support surface or a certain reference horizontal plane. The first height adjusting device 50 may be an elevator driven by an electric motor, a cylinder, a hydraulic cylinder, or the like, which fixes the accelerator on the elevator platform, and drives the elevator to perform the lifting movement to drive the accelerator to move up and down.

The height of the target point T of the accelerator 10 can be adjusted adaptively according to the situation of the object to be inspected, so as to meet the scanning imaging requirements of the object with different structures, heights, or types. In FIG. 2, the object to be inspected includes the object to be inspected 92 carried by the carrier 91, for example, the cargo carried by the chassis of the vehicle. The first height adjustment device 50 can be adjusted according to parameters such as the height of the vehicle chassis or the minimum height of the cargo input by the operator.

In order to make the adjustment of the first height adjusting device 50 better adapt to the actual situation of the inspected object, for example, the heights of the two inspected objects are different, or the height of the carrier support surface at different positions of the same inspected object changes, etc. In some embodiments, the inspection system further includes a height identification device 60 for identifying the height of the chassis of the carrier 91 or the lowest height of the object to be inspected 92. Here, both the height of the chassis and the minimum height of the object to be inspected 92 can be determined based on the carrier support surface on which the carrier 91 runs to determine the height value relative to the carrier support surface. The support surface of the vehicle may be the ground, or may be provided on the surface of the platform or the surface of the vehicle. When the height recognition device recognizes the height of the chassis or the lowest height of the object to be inspected 92, it can collect the relative height value of the chassis or the object to be inspected 92 relative to the support surface of the vehicle. In other embodiments, relative height values relative to other reference horizontal planes may also be collected, or absolute height values may be collected.

In this way, the first height adjustment device 50 can dynamically adjust the height of the target point T of the accelerator 10 according to the recognition result of the height recognition device 60, where the height value of the target point and the height recognition device recognize the height The benchmarks used are the same. The height recognition device 60 may include, but is not limited to, at least one of an area camera, a line camera, a planar laser, and a multi-line laser.

Due to structural limitations of some carriers, the surfaces carrying the objects to be inspected are not at the same height. For example, if the chassis has multiple height changes in the front-rear direction, the height recognition device 60 can recognize the height of the entire chassis of the carrier 91 at different cross-sections. For another example, if the height of the carrier support surface as a height reference changes at different positions on the running path of the carrier 91, the height recognition device 60 can also recognize that the chassis of the carrier 91 is on the moving path of the carrier 91 The height of different positions. The first height adjustment device 50 dynamically adjusts the height of the target point T of the accelerator 10 during the scanning process according to the recognition result of the height recognition device 60. When adjusting the height of the target point T, the height of the target point T of the accelerator 10 may be set to the height of the chassis of the carrier 91 or the lowest height of the object to be inspected 92, so that both the object to be inspected The scanning of 92 is complete, and it is possible to avoid overlapping of the chassis and the object to be inspected 92 on the scanned image.

When the height of the target point T of the accelerator 10 is adjusted, the height of the detector 20 may also be adjusted to prevent the opening angle range of the ray beam F from exceeding the detector 20. Correspondingly, referring to FIG. 2, in some embodiments, the inspection system may further include a second height adjustment device 70. The second height adjustment device 70 is connected to the detector 20 and is configured to adjust the height of the detector 20 according to the adjustment amount of the height of the target point T of the accelerator 10. The second height adjusting device 70 may be an elevator driven by an electric motor, a cylinder, a hydraulic cylinder, or the like, fix the accelerator on the elevator platform, and drive the elevator to perform the lifting movement to drive the accelerator up and down.

The first height adjustment device 50 or the second height adjustment device 70 can also be adjusted manually. In some embodiments, the inspection system may also include a manual manipulation mechanism. The manual operating mechanism is connected to the first height adjusting device 50 or the second height adjusting device 70 and is used to manually drive the first height adjusting device 50 or the second height adjusting device 70 to perform a height adjusting operation.

As shown in FIG. 3, it is a schematic diagram of the working principle of further embodiments of the inspection system according to the present disclosure. Referring to FIG. 3, in some embodiments, the inspection system may further include a collimator adjustment device 80. The collimator adjusting device 80 may be connected to the accelerator 10 and used to adjust the opening angle range of the ray beam F emitted by the accelerator 10 so that the lower edge of the opening angle range is parallel to the horizontal plane. By adjusting the opening angle range of the ray beam F, the height of the target point T will not be scanned, so that the scanned image of the height of the target point T of the accelerator 10 can be obtained without intercepting the image. Further, the height of the target point T can be adjusted by the first height adjustment device 50 to obtain a higher-quality scanned image.

As shown in FIG. 4, it is a schematic flowchart of some embodiments of the imaging method of the inspection system according to the present disclosure. Referring to FIG. 4, in some embodiments, the imaging method of the inspection system includes:

Step 100: Control the accelerator 10 to emit the ray beam F to the detected object;

Step 200: Obtain a scanned image of the detected object above the height of the target point T of the accelerator 10 according to the detection signal of the detector 20.

Step 100 may be implemented by a controller or a remote control platform in an inspection system for security inspection or internal inspection of objects. Step 200 may be implemented by the imaging device of the inspection system or the host computer. There can be many ways to obtain the scanned image above the height of the target point T, such as processing the image or adjusting the angle range of the beam.

In this embodiment, when the target point T is at a suitable height, by acquiring a scanned image of the detected object above the height of the target point T of the accelerator 10, other scan-less imaging below the object to be detected can be filtered out Part, so that the imaging quality can be improved, and then a clearer and more recognizable scanned image can be obtained.

As shown in FIG. 5, it is a schematic flowchart of some other embodiments of the imaging method of the inspection system according to the present disclosure. Referring to FIG. 5, compared with the foregoing embodiments of the imaging method, step 200 in this embodiment may specifically include:

Step 210: Generate a complete scanned image of the detected object according to the detection signal of the detector 20;

Step 220: Capture a scan image above the height of the target point T of the accelerator 10 on the complete scan image of the detected object.

After step 220, in some embodiments, the scanned image of the detected object above the height of the target T of the accelerator 10 may be displayed directly or according to an interactive instruction.

As shown in FIG. 6, it is a schematic flowchart of adjusting the height of a target through height recognition in still other embodiments of the imaging method of the inspection system of the present disclosure. Referring to FIG. 6, in some embodiments, the object to be inspected includes the object to be inspected 92 carried by the carrier 91. The imaging method may also include:

Step 300: Identify the height of the chassis of the carrier 91 or the lowest height of the object to be inspected 92;

Step 400: Adjust the height of the target point T of the accelerator 10 according to the recognition result.

In step 300, the operation of identifying the height of the chassis of the carrier 91 may include: identifying the height of the entire chassis of the carrier 91 at different cross-sections, or identifying the chassis of the carrier 91 at the carrier 91 The height of different positions on the movement path. The operation of adjusting the height of the target point T of the accelerator 10 may include: dynamically adjusting the height of the target point T of the accelerator 10 during the scanning process according to the recognition result. Further, when adjusting the height of the target point T of the accelerator 10, the height of the target point T of the accelerator 10 may be set to the height of the chassis of the carrier 91 or the lowest height of the object to be inspected 92.

When adjusting the height of the target point T of the accelerator 10, the height of the detector 20 may be adjusted accordingly according to the adjustment amount of the height of the target point T of the accelerator 10.

In some other embodiments of the imaging method of the present disclosure, the opening angle range of the ray beam F emitted by the accelerator 10 may also be adjusted so that the lower edge of the opening angle range is parallel to the horizontal plane.

Multiple embodiments in this specification are described in a progressive manner, the emphasis of each embodiment is different, and the same or similar parts between the various embodiments may refer to each other. For the method embodiment, since there is a corresponding relationship between the whole and the involved steps and the content in the system embodiment, the description is relatively simple, and the relevant part can be referred to the part description of the system embodiment.

As shown in FIG. 7, it is a schematic structural view of some embodiments of the inspection system according to the present disclosure. Referring to FIG. 7 and the foregoing imaging method embodiment of the inspection system, in some embodiments, the inspection system includes: an accelerator 10, a detector 20, and a processor 30'. The accelerator 10 is used to emit the beam F. The detector 20 is used to receive the beam F emitted by the accelerator 10. The processor 30' is configured to perform the aforementioned embodiment of the imaging method of the inspection system.

The present disclosure also provides a computer-readable storage medium on which a computer program is stored, which when executed by a processor implements the aforementioned imaging method of the inspection system. The storage medium may include, for example, a system memory, a fixed non-volatile storage medium, and the like. The system memory stores, for example, an operating system, application programs, a boot loader (Boot Loader), and other programs.

So far, the embodiments of the present disclosure have been described in detail. In order to avoid obscuring the concept of the present disclosure, some details known in the art are not described. Those skilled in the art can fully understand how to implement the technical solutions disclosed herein based on the above description.

Although some specific embodiments of the present disclosure have been described in detail through examples, those skilled in the art should understand that the above examples are only for illustration, not for limiting the scope of the present disclosure. Those skilled in the art should understand that the above embodiments can be modified or some technical features can be equivalently replaced without departing from the scope and spirit of the present disclosure. The scope of the present disclosure is defined by the appended claims.

Claims

An inspection system, including:

The accelerator (10) is configured to emit a ray beam (F);

A detector (20) configured to receive the beam (F) emitted by the accelerator (10); and

An imaging device (30), which is signally connected to the detector (20), is configured to obtain a scanned image of the detected object above the height of the target point (T) of the accelerator (10).
The inspection system according to claim 1, wherein the imaging device (30) includes:

An image generation module (31) configured to generate a complete scanned image of the object under inspection based on the detection signal of the detector (20); and

The image intercepting module (32) is configured to intercept the scanned image above the height of the target point (T) of the accelerator (10) on the complete scanned image of the detected object.
The inspection system according to claim 1, further comprising:

A display (40), which is in signal connection with the imaging device (30), is configured to display a scanned image of the detected object above the height of the target (T) of the accelerator (10) directly or according to an interactive instruction.
The inspection system according to claim 1, further comprising:

The first height adjusting device (50) is connected to the accelerator (10) and is configured to adjust the height of the target point (T) of the accelerator (10).
The inspection system according to claim 4, wherein the object to be inspected includes an object to be inspected (92) carried by a carrier (91), and the inspection system further includes:

A height recognition device (60) is configured to recognize the height of the chassis of the carrier (91) or the lowest height of the object to be inspected (92), so that the first height adjustment device (50) is based on the height recognition device (50) 60) The recognition result adjusts the height of the target (T) of the accelerator (10).
The inspection system according to claim 5, wherein the height recognition device (60) includes at least one of an area camera, a line camera, a planar laser, and a multi-line laser.
The inspection system according to claim 5, wherein the height identification device (60) is configured to identify the height of the entire chassis of the carrier (91) at different cross-sections, or to identify the height of the carrier (91) The height of the chassis at different positions on the movement path of the carrier (91), the first height adjusting device (50) is configured to dynamically move during the scanning process according to the recognition result of the height recognition device (60) Adjust the height of the target (T) of the accelerator (10).
The inspection system according to claim 5, wherein the first height adjustment device (50) is configured to set the height of the target point (T) of the accelerator (10) to that of the carrier (91) The height of the chassis or the lowest height of the object to be inspected (92).
The inspection system according to claim 1, further comprising:

A collimator adjustment device (80), connected to the accelerator (10), is configured to adjust the opening angle range of the ray beam (F) emitted by the accelerator (10) so that the lower edges of the opening angle range are parallel On the horizontal plane.
The inspection system according to claim 4, further comprising:

A second height adjustment device (70), connected to the detector (20), is configured to adjust the height of the detector (20) according to the amount of adjustment of the height of the target point (T) of the accelerator (10) Make adjustments accordingly.
The inspection system according to claim 10, further comprising:

A manual operating mechanism, connected to the first height adjustment device (50) or the second height adjustment device (70), is configured to manually drive the first height adjustment device (50) or the second height adjustment The device (70) performs the height adjustment operation.
An imaging method for an inspection system, including:

Control the accelerator (10) to emit a ray beam (F) to the object under inspection;

According to the detection signal of the detector (20), a scanned image of the detected object above the height of the target point (T) of the accelerator (10) is obtained.
The imaging method according to claim 12, wherein the operation of obtaining a scanned image of the detected object above the height of the target point (T) of the accelerator (10) includes:

Generating a complete scan image of the detected object according to the detection signal of the detector (20);

The scanned image above the height of the target point (T) of the accelerator (10) is intercepted on the complete scanned image of the object to be inspected.
The imaging method according to claim 12, wherein after obtaining the scanned image of the object under inspection at a height above the target point (T) of the accelerator (10), further comprising:

The scanned image of the detected object above the height of the target point (T) of the accelerator (10) is displayed directly or according to an interactive instruction.
The imaging method according to claim 12, wherein the object to be inspected includes an object to be inspected (92) carried by a carrier (91), and the imaging method further includes:

Identify the height of the chassis of the vehicle (91) or the lowest height of the object to be inspected (92);

The height of the target point (T) of the accelerator (10) is adjusted according to the recognition result.
The imaging method according to claim 15, wherein the operation of identifying the height of the chassis of the carrier (91) includes:

Identify the height of the entire chassis of the carrier (91) at different cross-sections, or identify the height of the chassis of the carrier (91) at different positions on the movement path of the carrier (91);

The operation of adjusting the height of the target (T) of the accelerator (10) includes:

According to the recognition result, the height of the target point (T) of the accelerator (10) is dynamically adjusted during the scanning process.
The imaging method according to claim 15, wherein when the height of the target point (T) of the accelerator (10) is adjusted, the height of the target point (T) of the accelerator (10) is set to the load The height of the chassis of the tool (91) or the lowest height of the object to be inspected (92).
The imaging method according to claim 12, further comprising:

The opening angle range of the ray beam (F) emitted by the accelerator (10) is adjusted so that the lower edge of the opening angle range is parallel to the horizontal plane.
The imaging method according to claim 12, further comprising:

According to the adjustment amount of the height of the target point (T) of the accelerator (10), the height of the detector (20) is adjusted accordingly.
An inspection system, including:

The accelerator (10) is configured to emit a ray beam (F);

A detector (20) configured to receive the beam (F) emitted by the accelerator (10); and a processor (30') configured to perform the inspection system according to any one of claims 12-19 Imaging method.
A computer-readable storage medium on which a computer program is stored, which when executed by a processor implements the imaging method of the inspection system according to any one of claims 12 to 19.