WO2013097018A1 - Dispositif à fibre optique avec élément unidimensionnel pour microscopie et spectroscopie optique en champ proche - Google Patents

Dispositif à fibre optique avec élément unidimensionnel pour microscopie et spectroscopie optique en champ proche Download PDF

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Publication number
WO2013097018A1
WO2013097018A1 PCT/BR2012/000557 BR2012000557W WO2013097018A1 WO 2013097018 A1 WO2013097018 A1 WO 2013097018A1 BR 2012000557 W BR2012000557 W BR 2012000557W WO 2013097018 A1 WO2013097018 A1 WO 2013097018A1
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WO
WIPO (PCT)
Prior art keywords
probe
microscopy
fiber
optical
spectroscopy
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Application number
PCT/BR2012/000557
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English (en)
Portuguese (pt)
Inventor
Ado JÓRIO DE VASCONCELLOS
Original Assignee
Universidade Federal De Minas Gerais - Ufmg
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Application filed by Universidade Federal De Minas Gerais - Ufmg filed Critical Universidade Federal De Minas Gerais - Ufmg
Publication of WO2013097018A1 publication Critical patent/WO2013097018A1/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/18—SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
    • G01Q60/22—Probes, their manufacture, or their related instrumentation, e.g. holders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/08—Probe characteristics
    • G01Q70/10—Shape or taper
    • G01Q70/12—Nanotube tips
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q20/00—Monitoring the movement or position of the probe
    • G01Q20/04—Self-detecting probes, i.e. wherein the probe itself generates a signal representative of its position, e.g. piezoelectric gauge

Definitions

  • the treated matter ( Figure 1) is described by a fiber optic device (1) with at least one one-dimensional element (3) at the end (2) of (1); for near field optical microscopy and spectroscopy.
  • This device comprises a probe and may preferably be applied to microscopy and spectroscopy equipment and techniques, both by probe scanning.
  • the device ( Figure 1) has adequate dimensions to carry the light propagating through the fiber to a surface to be analyzed, but condensing the light at the fiber outlet by coupling the light with the one-dimensional element.
  • the treated matter ( Figure 1) presents robustness during the surface analysis process, being able to analyze with high resolution structures smaller than 10 nm.
  • SPM stands for a family of techniques that differ from each other by the type of probe-material interaction that is monitored in the process. Some examples are: AFM (atomic force microscopy); EFM ⁇ electrical force microscopy; Magnetic force microscopy (MFM); scanning tunneling microscopy (STM); scanning near-field optical microscopy (SNOM) .
  • AFM atomic force microscopy
  • EFM electroscopy
  • MFM Magnetic force microscopy
  • STM scanning tunneling microscopy
  • SNOM scanning near-field optical microscopy
  • SPM family techniques are based on the same principle of operation. All microscope operating SPM techniques have at least one mechanical probe with the specific property required for the technique (electrical, magnetic, optical, etc.), a piezoelectric positioner able to move the probe with subnanometric precision, probe-ammonia monitoring mechanism oyster, preliminary probe positioning system on the sample, specific technique effect measurement system (s) used, and a computer that controls the entire system (Neves, BRA et AL .. Ceramics. vol.44, no. 290, 1998).
  • Microscopy and near field optical spectroscopy are a hybrid of probe scanning microscopy with optical microscopy and spectroscopy (Synge, EH Phil. Mag. V.6, p.356, 1928).
  • the probe in this case, is the agent responsible for locating the optical signal primarily in a nanometric region, thus generating optical microscopy and spectroscopy with higher spatial resolution than given by the diffraction limit of light. In one of its possible designs, this probe is formed of a very thin optical fiber that carries visible light to the surface of the sample.
  • the excited area is of the order of the opening of the optical fiber
  • the current technology it is possible to study the optical properties of materials with spatial resolution of the order of 50 nm (Neves et al. Ceramics, vol.44, n.290, 1998 ).
  • the term "near field” comes from the fact that the electromagnetic field does not propagate through holes smaller than the length of light due to the diffraction effect.
  • the opening of the probe there is a very close “field” intense, which can be used for microscopy and spectroscopy using the SPM technique, which is responsible for bringing the probe close enough to the surface (around 1 nm) so that the near field can be felt by the surface.
  • SNOM Near field optical microscopy
  • the SNOM technique can achieve a spatial resolution of the order of 10 nm, which is well below the resolution of a tunnel or atomic force microscope.
  • SPM hybrid with optical microscopy and spectroscopy which are diverse.
  • main parameters that may be of interest for the investigation of a nanoscale structure in addition to shape and size, are its chemical composition, molecular structure as well as its dynamic and electronic properties, largely measured by various optical properties of the nanoscale. materials.
  • the SNOM principle is relatively simple.
  • the sample to be characterized is scanned by an optical fiber or a metal probe having an opening of the order of ten or tens of nanometers in diameter at its end.
  • Through the fiber passes visible light, which will interact or interacted with the sample, going from it to a detector.
  • the metal probe With the metal probe, the propagating light is condensed in a nanometric region by the resonance effect with the metal surface plasmons.
  • Another possibility is to cover an optical fiber with a metal film, thus taking advantage of the two technologies described above.
  • the optical signal strength detected at each point of the probe scan constitutes a data set that will reproduce an image of the sample surface, with spatial resolution determined by the probe end size currently limited to 10nm (N. Anderson, A. Hartschuh and L. Novotny, J. Am. Chem. Soc. 127, 2533 (2005)).
  • the limitation imposed by the near field effect is that the distance between the probe and the sample has to be a few nanometers. Therefore, the probe is trapped in a system capable of detecting the interaction of the probe with the surface so that the probe is close enough to that surface so that van der Waals interactions can be detected.
  • An example of a system capable of sensing this interaction is the so-called 'tunning forK' ((5), Figure 2), which is a tuning fork-like device with well-defined vibration frequency (K. Karrai and RD Grober, Appl. Lett.
  • one of the major limiters is the amount of light sent and / or collected that passes through this probe.
  • the transmitted power decreases exponentially with the reduction in fiber diameter. For this reason, an accuracy of about 50 to 100 nm is usually generated.
  • this type of probe is limited to the study of intense signals, such as photoluminescence. It is, however, unsuitable for the study of weaker signals, such as Raman spectroscopy, where the signal is on the order of a thousand times lower than luminescence signals, making Raman spectroscopy coupled with nanometric spatial resolution unviable.
  • the material under study is illuminated by an optical microscope.
  • a nanometer-sized metal tip is approached from the sample by the SPM system, condensing the electric field of light around itself.
  • the resolution is in the order of 10 nm. This resolution is limited by the manufacturing technology of the metal probes, which will hardly evolve below 10 nm due to the metallurgical properties of the material used for their manufacture.
  • the nanoanthene axis is perpendicular to the surface.
  • a direction of light propagation which, consequently, will have its polarized electric field normal to the surface, that is, perpendicular to the axis of the antenna.
  • the so-called “doughnut mode” which generates a radially polarized propagating light, has been used (Quabis, S. et al. App. Phys. B: Laser and Optics, v.81, n.5 , p.597-600, 2005).
  • This light when focused by the microscope objective, generates a polarization component perpendicular to the focus surface of the lens, ie parallel to the nanoanthene axis.
  • a probe In all processes used in probe scanning microscopy and spectroscopy, a probe is used that scans a surface for topography, electrical, magnetic, elastic, optical, and other information. For the best possible spatial resolution in this process of collecting surface information or objects on it (eg adsorbed molecules), this probe should have the end that contacts the sample as small as possible, ideally a point , representing, for the surface, a "zero" dimension material. Ideally, this point or "zero-dimensional" probe is effectively a single atom at the end of the probe as a whole, thus generating resolution images. subatomic, common in probe scan tuneing microscopy (STM) experiments.
  • STM probe scan tuneing microscopy
  • a fiber optic device / probe with at least one one-dimensional element where the surface-probe interaction region via near field is substantially "one-dimensional".
  • the system solves the largest limiter of the state of the art, which is to obtain nanometer-order resolutions using a thinly tuned optical fiber, 100 nm in diameter or more. If on the one hand the one-dimensional system loses spatial resolution along one of its dimensions (Figure 1), when compared to one end, mechanical strength and spatial resolution on the other dimension are gained ( Figure 1), which can be reduced below current technological limit of 10 nm.
  • Figure 1 illustrates the device formed by an optical fiber (1) and a one-dimensional element (3) located at the end (2) of (1).
  • Figure 2 illustrates the device ( Figure 1) coupled to a probe-surface interaction sensing system, or a tunning fork (5). It is important to note that the optical fiber (1) can be as long as necessary, with only the end (1) shown in the figure attached to the tunning fork (5).
  • the treated material ( Figure 1) comprises a device formed by an optical fiber (1) and a one-dimensional element (3), which is coupled to the end (2) of the fiber (1).
  • the one-dimensional element (3) is preferably a carbon nanotube or a bundle of carbon nanotubes, an Au or Ag or Cu nanowire or an Au or Ag or Cu nanobastane.
  • This device ( Figure 1) is preferably used in microscopy and spectroscopy equipment and techniques, both by probe scanning.
  • the proposed device ( Figure 1) has adequate dimensions for the propagation of light by the probe (compatible with light wavelength) and the coupling of the electric field of light propagating by the optical fiber with the one-dimensional element ensures the system a high resolution of near field in one dimension (typically but not limiting values from 1 to 20 nanometers).
  • the treated matter (Figure 1) can be coupled to a probe-surface interaction sensing system, preferably a tuning fork or tunning fork, which will preferably be coupled to a SNOM system.
  • Optical fibers can be fabricated using the method proposed by Puygranier (Puygranier, BAF; Dawson, P .; v.85, p.235 (2000)) and one-dimensional element deposition can be performed by chemical method. or by nano-manipulation
  • the cylinder indicated by (1) in Figure 1 represents the end of an optical fiber, tuned to 300 nm in diameter.
  • the final part (2) it contained a one-dimensional metallic material (3) that came into contact with the surface and effectively served as a field probe near the light propagating through the fiber.
  • the resolution of the near field effect was given by the diameter of the one-dimensional material, a single-walled carbon nanotube, 0.8 nm in diameter.
  • the near field of light from the optical fiber was condensed around the one-dimensional system from 300 nm to 1 nm in terms of resolution; either for near field optical microscopy or near field optical spectroscopy, considering a device scan along the dimension perpendicular to the carbon nanotube axis.
  • the carbon nanotube deposition process at the end of the optical fiber consisted of the commercial acquisition of an aqueous solution of isolated carbon nanotubes, selected by chirality. Nanotubes of the type (6,5) with optical transition energy compatible with a photon of wavelength ( ⁇ ) equal to 568 nm were chosen. Another type of nanotube can also be selected as long as its optical excitation is well known or determined. Drops of the isolated nanotube solution were deposited on the tip of the optical fiber, and the fiber was attached to a spinning system, so that the deposition occurred through the so-called spin coating process. This process generated a homogeneous dispersion of material in the probe surface. At each 5-drop deposition, the fiber was removed and the Raman spectrum from the region where the nanotube was deposited was measured.
  • the optical fiber was then fixed to a probe-surface interaction sensing system, preferably a tuning fork or tuning fork, and then a laser beam of SNOM via optical fiber was used as excitation means for SNOM.
  • a probe-surface interaction sensing system preferably a tuning fork or tuning fork
  • a laser beam of SNOM via optical fiber was used as excitation means for SNOM.
  • AFM images were obtained with approximately 300nm resolution, while SNOM images were obtained with approximately 1nm resolution.

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

L'objet traité (Figure 1) consiste en un dispositif à fibre optique (1) comprenant au moins un élément unidimensionnel (3) au niveau de l'extrémité (2) de (1), destiné à la microscopie et à la spectroscopie optique en champ proche. Ce dispositif comprend une sonde pouvant trouver une application, de préférence, dans des équipements et des techniques de microscopie et de spectroscopie, toutes deux par balayage de sonde. Le dispositif (Figure 1) présente des dimensions appropriées pour transporter la lumière qui se propage par la fibre jusqu'à une surface à analyser, mais condensant la lumière à la sortie de la fibre par couplage de la lumière avec l'élément unidimensionnel. L'objet traité (Figure 1) présente une robustesse pendant l'opération d'analyse superficielle, permettant une analyse haute résolution de structures de dimensions inférieures à 10 nm.
PCT/BR2012/000557 2011-12-29 2012-12-27 Dispositif à fibre optique avec élément unidimensionnel pour microscopie et spectroscopie optique en champ proche WO2013097018A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
BRPI1105972A BRPI1105972B1 (pt) 2011-12-29 2011-12-29 dispositivo de fibra óptica com elemento unidimensional para microscopia e espectroscopia óptica de campo próximo
BRPI1105972-9 2011-12-29

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WO2013097018A1 true WO2013097018A1 (fr) 2013-07-04

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Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004279359A (ja) * 2003-03-19 2004-10-07 Konica Minolta Holdings Inc 近接場赤外顕微分光用ナノプローブ
US20070221840A1 (en) * 2006-03-23 2007-09-27 International Business Machines Corporation Monolithic high aspect ratio nano-size scanning probe microscope (SPM) tip formed by nanowire growth
US20090276923A1 (en) * 2008-05-02 2009-11-05 Mikhail Sumetsky Near-field scanning optical microscopy with nanoscale resolution from microscale probes

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004279359A (ja) * 2003-03-19 2004-10-07 Konica Minolta Holdings Inc 近接場赤外顕微分光用ナノプローブ
US20070221840A1 (en) * 2006-03-23 2007-09-27 International Business Machines Corporation Monolithic high aspect ratio nano-size scanning probe microscope (SPM) tip formed by nanowire growth
US20090276923A1 (en) * 2008-05-02 2009-11-05 Mikhail Sumetsky Near-field scanning optical microscopy with nanoscale resolution from microscale probes

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BRPI1105972A2 (pt) 2013-11-12
BRPI1105972B1 (pt) 2020-05-05

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