WO2013071830A1 - Roller way type solar cell silicon wafer sintering furnace - Google Patents

Roller way type solar cell silicon wafer sintering furnace Download PDF

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Publication number
WO2013071830A1
WO2013071830A1 PCT/CN2012/084135 CN2012084135W WO2013071830A1 WO 2013071830 A1 WO2013071830 A1 WO 2013071830A1 CN 2012084135 W CN2012084135 W CN 2012084135W WO 2013071830 A1 WO2013071830 A1 WO 2013071830A1
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WO
WIPO (PCT)
Prior art keywords
roller
sintering furnace
silicon wafer
solar cell
type solar
Prior art date
Application number
PCT/CN2012/084135
Other languages
French (fr)
Chinese (zh)
Inventor
杨桂玲
Original Assignee
Yang Guiling
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Filing date
Publication date
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Publication of WO2013071830A1 publication Critical patent/WO2013071830A1/en

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Classifications

    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F27FURNACES; KILNS; OVENS; RETORTS
    • F27DDETAILS OR ACCESSORIES OF FURNACES, KILNS, OVENS, OR RETORTS, IN SO FAR AS THEY ARE OF KINDS OCCURRING IN MORE THAN ONE KIND OF FURNACE
    • F27D3/00Charging; Discharging; Manipulation of charge
    • F27D3/02Skids or tracks for heavy objects
    • F27D3/026Skids or tracks for heavy objects transport or conveyor rolls for furnaces; roller rails
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67098Apparatus for thermal treatment
    • H01L21/67109Apparatus for thermal treatment mainly by convection
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67155Apparatus for manufacturing or treating in a plurality of work-stations
    • H01L21/67161Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
    • H01L21/67173Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers in-line arrangement
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • H01L21/6776Continuous loading and unloading into and out of a processing chamber, e.g. transporting belts within processing chambers
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F27FURNACES; KILNS; OVENS; RETORTS
    • F27BFURNACES, KILNS, OVENS, OR RETORTS IN GENERAL; OPEN SINTERING OR LIKE APPARATUS
    • F27B17/00Furnaces of a kind not covered by any preceding group
    • F27B17/0016Chamber type furnaces
    • F27B17/0025Especially adapted for treating semiconductor wafers

Definitions

  • the present invention relates to a solar cell wafer sintering furnace, and more particularly to a solar cell wafer sintering furnace using a roller conveyor for transferring silicon wafers. Background technique
  • the sintering process is mainly used for drying the slurry printed on the surface of the silicon wafer, burning off the organic solvent volatilized from the slurry, and simultaneously sintering the front and back surfaces of the silicon wafer of the solar cell, so as to be printed on the slurry on the silicon wafer.
  • the metal electrode forms a good ohmic contact with the silicon wafer, which is beneficial to the current output of the battery and exerts the efficiency that the battery should achieve. If the ohmic contact between the silicon wafer and the electrode is poor, a partial current cannot be output, thereby reducing the energy conversion efficiency of the battery.
  • the sintering process is a crucial step to make the crystalline silicon wafer truly have photoelectric conversion function, and the quality of the sintering directly affects the efficiency of the final solar cell. Therefore, the performance of the sintering equipment directly affects the quality of the battery.
  • solar cell manufacturers at home and abroad mainly use mesh belt tunnel sintering furnaces, and preheating and discharging zones, heating zones, sintering zones and cooling zones are sequentially arranged in the longitudinal direction of the sintering furnace. Heat pipes of different densities are arranged in different areas to control the temperature of each zone.
  • the silicon wafer printed with the electrode is transported through the mesh belt, and sequentially passes through different furnace temperature zones of the sintering furnace to complete the electrode sintering process of preheating, discharging, heating, sintering and cooling.
  • the mesh belt tunnel sintering technology has been relatively mature, the following problems exist: First, the silicon wafer is in direct contact with the metal mesh belt, and the metal is contaminated with the silicon wafer; Second, the ordinary mesh belt tunnel sintering furnace has a lower running speed. Generally, it is only 2000mm/min. At present, the sintering process of the cell sheet can achieve high-speed sintering of 5000mm/min or more. If the mesh belt tunnel sintering furnace is used for high-speed sintering, the running stability of the mesh belt will be deteriorated. The back electrode surface causes the texture, which affects the appearance quality, and even causes fragmentation.
  • the metal mesh belt will accumulate a large amount of heat, and how the high-speed sintering causes the mesh belt to cool down in a short period of time to ensure the discharge temperature of the battery sheet.
  • the sintering furnace cannot be reached in a short period of time.
  • the sintering temperature required by the process is 850 ° C ⁇ 950 ° C. After reaching the sintering temperature, even if it is cooled by water, it can not be cooled quickly. It is difficult to meet the requirement of silicon wafer cooling rate of 70 ° 0/8. The effect also increases the length of the heating section and the cooling section of the furnace.
  • the mesh belt tunnel sintering furnace needs a length of 10 m to 12 m to complete the entire sintering process, thereby increasing the volume and cost of the sintering furnace;
  • the quality is much greater than the quality of the silicon wafer. Therefore, the heat taken away by the heating mesh belt and the cooling mesh belt is much larger than the heat required for the sintering of the silicon wafer, so that the energy consumption of the sintering furnace is greatly improved.
  • Chinese patent CN102032777A proposes a meshless silicon wafer sintering furnace for the problems of high energy consumption, low thermal efficiency and large surface area of the mesh belt sintering furnace.
  • the working principle is that a conveyor consisting of a set of fixed brackets and moving brackets replaces the metal mesh belt, and the lifting, forward moving, descending and retreating actions are periodically performed by the moving bracket, and will be placed on the fixed bracket.
  • the silicon wafer is gradually moved forward.
  • the fixing bracket and the moving bracket support the wafer support legs made of steel wire and provided with a ceramic coating on the outer surface thereof.
  • the reciprocating handling method still has the following problems: First, the silicon wafer cannot be continuously and smoothly conveyed, and the conveying speed is not easy to be improved, and it is difficult to satisfy 5000 mm. /min's conveying requirements; Second, in order to meet the need of the wafer to continuously move up and down during the handling process, it will increase the effective height inside the furnace, because the upper and lower temperature difference of the furnace temperature is greater than the horizontal temperature difference, this will inevitably cause the silicon wafer After the temperature field fluctuates greatly, the sintering temperature is not easy to accurately control.
  • the transmission process of the silicon wafer is intermittently moved by the interaction of the moving bracket and the fixed bracket, and cannot be continuously and smoothly conveyed. Therefore, it cannot be in the furnace.
  • the temperature measuring device following the movement of the silicon wafer is placed to realize the dynamic temperature measurement of the whole process of sintering the silicon wafer;
  • the fourth is that the supporting leg of the supporting silicon wafer is made of steel wire, and the outer surface thereof is provided with a ceramic coating, due to the steel wire and the ceramic The difference in thermal expansion coefficient of the coating is large, and the ceramic coating is likely to fall off at a high temperature of 850 ° C to 950 ° C. Silicon electroluminescent wire in direct contact with the sheet, whereby the effect of preventing the loss of wafer contamination.
  • the applicant developed a roller-type solar cell wafer sintering furnace which effectively solved the shortcomings of the above two transportation methods. Summary of the invention
  • the present invention is directed to the disadvantages of the prior art, and provides a roller-type solar cell wafer sintering furnace in which a carrier for transporting a silicon wafer is a roller conveyor that can be transported in one direction, and the roller runner includes a plurality of rollers Rotatable roller body.
  • the material of the contact portion of the roller table with the silicon wafer is non-metallic; the material of the contact portion of the roller path with the silicon wafer is different from the material for the portion for supporting and driving the roller table.
  • the material of the contact portion of the roller table with the silicon wafer is made of a non-metal material, and the material for supporting and driving the portion of the roller table is made of a metal material.
  • At least a part of the roller bodies constituting the roller table is a flat roller body having a smooth surface or a roller body having a rough surface.
  • the uneven roller body includes: a threaded roller body having a groove on the surface, a roller body having a plurality of dots or linear projections on the surface, and an unequal roller body having a plurality of rings on the surface.
  • at least a portion of the roller bodies constituting the roller table are solid roller bodies or hollow roller bodies. That is to say, the roller bodies constituting the roller table may be solid roller bodies, or may be hollow roller bodies, or may be a roller roller composed of a part of a solid roller body and a part of a hollow roller body.
  • the material of the contact portion of the roller table with the silicon wafer is ceramic, quartz ceramic or quartz glass; or the material of the material of the roller contact portion with the silicon wafer is 810 2 or Si 3 N 4 or SiC, or SiO ⁇ P A1 2 0 3 bonded material.
  • the conveying speed of the roller table is arbitrarily adjustable below 15000 mm/min, or the conveying speed is between 4000 mm/min and 12000 mm/min.
  • a forced air cooling zone is disposed between the sintering zone and the blanking zone of the sintering furnace, and the silicon wafer is directly cooled into the forced air cooling zone after the sintering is completed;
  • the forced air cooling zone may include: leaving the sintering zone a forced air-cooling zone roller path that continues to be forwarded, and a blowing device disposed above and/or below the forced air-cooling zone roller path; the blowing devices disposed above and below the forced air-cooling zone roller path are disposed opposite each other, and the cold air The wafer is simultaneously blown from the upper and lower directions.
  • the cold air blown by the blowing device may be clean air, nitrogen or a mixture of clean air and nitrogen, or the above-mentioned gas which is cooled.
  • the blowing pressure of the blowing device is arbitrarily adjustable below 6000 Pa, and the air volume matched thereto satisfies the cooling rate of the silicon wafer of 80 ° C / S.
  • the furnace body of the sintering furnace is composed of two parts which can be separated from each other, and the upper part of the furnace body can freely rise upward in the vertical direction under the action of mechanical force.
  • the heating mode used in the sintering furnace is a single heat source of infrared radiation heating, microwave heating or electric heating wire heating or any combination of the above three heat sources.
  • the roller-type solar cell wafer sintering furnace provided by the invention has no pollution to the silicon wafer, no netting, no adhesion to the back of the battery, fast conveying speed, small temperature difference, good temperature repeatability and stability, and rapid temperature rise and fall, It does not require water cooling and has a short length, which can greatly reduce energy consumption and improve work efficiency, and can effectively achieve temperature spikes and improve battery sintering quality.
  • Figure 1 is a front elevational view showing one embodiment of a roller-type solar cell wafer sintering furnace according to the present invention
  • Figure 2 is a side view of Figure 1;
  • FIG. 3 is a schematic view showing a structure of a roller body in a silicon wafer sintering furnace for a roller-type solar cell according to the present invention
  • Fig. 4 is a view showing another structure of a roller body in a silicon wafer sintering furnace for a roller-type solar cell according to the present invention.
  • the present invention discloses a solar cell silicon wafer sintering furnace, which is composed of a loading zone, a drying zone, a pre-baking zone, a sintering zone, a forced air cooling zone and a blanking zone.
  • the silicon wafer can be directly cooled into the forced air cooling zone after being sintered.
  • the carrier for transporting the silicon wafer is a roller table 3 which can be transported in one direction, and the silicon wafer 5 is supported by a plurality of rotatable high temperature resistant roller bodies, and the silicon wafer is continuously and smoothly transferred horizontally by continuous operation of the roller body. Drying, pre-firing, sintering and cooling are performed in sequence during the transfer.
  • the outer side of the furnace body may be provided with a furnace body bracket 7 for supporting the furnace body.
  • the furnace body can be divided into an upper furnace body 1 and a lower furnace body 2.
  • the upper furnace body 1 and the lower furnace body 2 can be separated by a drive mechanism for operation or maintenance. This drive mechanism can be a hinge 8.
  • the roller lane 3 exposed to the furnace and in contact with the silicon wafer 5 is a non-metal which is resistant to high temperature and has no pollution to the silicon wafer.
  • Material, materials that can be used are 810 2 or Si 3 N 4 or SiC, or SiO ⁇ P A1 2 0 3 bonded materials.
  • the high-purity fused silica ceramic roll and the quartz glass tube are the preferred materials for the transfer sheet of the silicon wafer 5 because they have no pollution to the silicon wafer 5, high temperature performance and relatively low cost.
  • the roller table 3 which is in contact with the silicon wafer 5 at a high temperature employs a material which does not contaminate the silicon wafer 5, the metal contamination problem caused by the metal mesh belt transmission is effectively eliminated.
  • the present invention designs a metal and non-metal composite roller table 3. That is, the portion exposed to the furnace and supporting and transporting the silicon wafer 5 is a non-metallic material which is resistant to high temperatures and has no contamination to the silicon wafer 5.
  • the materials that support the transmission on the outside of the furnace and at both ends of the roller are made of metal materials with good wear resistance and easy machining, such as stainless steel, heat-resistant steel, and ordinary steel.
  • the member that functions as a support transmission may be a roller table metal support shaft head 10 that is supported by the bearing 11.
  • the non-metallic portion of the roller table 3 of such a structure is inside the furnace body, and the metal portion is outside the furnace body, which can effectively prevent the non-metallic portion and the metal portion from falling off due to the difference in expansion coefficient like the ceramic coating layer;
  • the non-metallic roller table 3 in the furnace can effectively prevent heat from being conducted through the roller body to the metal support and the transmission mechanism outside the furnace body due to the low thermal conductivity.
  • the metal support and the transmission mechanism are prevented from malfunctioning due to temperature rise or the service life is reduced. Therefore, the composite structure not only achieves the purpose of not polluting the silicon wafer 5, but also ensures that the roller table 3 is long-lasting. Run smoothly.
  • the present invention can be designed with a threaded or annular structure or a plurality of dot-like or linear protrusions on the surface of the roller body.
  • the structure of the above-mentioned thread, ring or projection may be sparsely arranged.
  • it is sparse to each wafer to be in contact with only two annular structures to achieve the transfer of the wafer with a minimum of support points, and the wafer forms a number of instantaneous points or lines with the roller path during operation.
  • the contact, heat and support are relatively uniform, effectively solving the adhesion and "mesh" phenomenon on the back of the silicon wafer, and also solving the problem that the conventional static point support is easy to break due to heat and uneven force.
  • the center of the roller body may be a metal roller shaft 14, and a non-metallic ring 13 may be sleeved on the outer side of the metal roller shaft 14.
  • the silicon wafer 5 is only in contact with the non-metallic ring 13.
  • the projection 9 on the roller table is shown in FIG.
  • the silicon wafer 5 is always moved smoothly and continuously in a horizontal direction, without the ups and downs of the movement process, and at the same time, the silicon wafer 5 can be transported at a constant speed, and the silicon wafer 5 is continuously conveyed. Drying, pre-burning, sintering, and cooling are performed by sequentially passing through the respective temperature zones. Therefore, compared with the conveying method of periodically moving back and forth by the moving carriage to move the silicon wafer 5 forward and backward, the roller conveyor does not disturb the airflow in the furnace, and does not cause fluctuations in the furnace temperature.
  • the silicon wafer 5 moves in the horizontal direction without the upper and lower temperature difference, and moves at a uniform speed, so the sintering temperature is more uniform, the sintering process is consistent, and the battery sintering quality is higher.
  • this continuous and horizontal transmission mode can be used to measure the temperature of the silicon wafer 5 during the whole process of sintering the silicon wafer 5 like a mesh belt transmission.
  • the conveying speed of the roller table can be arbitrarily adjusted below 15000mm/min.
  • the normal working speed is 4000mm/min ⁇ 12000mm/min.
  • the cooling rate is as fast as possible, and the cooling rate is preferably greater than 80 ° C / s.
  • the invention provides a forced air cooling zone between the sintering zone and the blanking zone, and the silicon wafer 5 is sintered, directly discharged from the furnace of the sintering furnace, and directly conveyed to the roller table 3 of the forced air cooling zone, and continues to be transported forward. Rapid cooling is achieved during the process to achieve rapid cooling.
  • the manner of achieving forced air cooling may be such that the blowing device 6 is disposed opposite to each other above and below the roller path of the forced air cooling zone.
  • the blowing device 6 can be a wind grille with a plurality of small holes, and the cold air is simultaneously directed from the upper and lower directions to the silicon wafer 5 conveyed on the roller table, so that the silicon wafer 5 is rapidly cooled; usually, the wind turbine is blown toward the silicon wafer 5
  • the cold air pressure can be arbitrarily adjusted below 6000Pa, and the matching air volume should meet the requirement of the silicon wafer cooling rate of 80 °C / S without fragmentation.
  • the silicon wafer 5 is simultaneously blown from the upper and lower directions in order to cause the cold air to simultaneously act on the upper and lower surfaces of the silicon wafer 5.
  • the up and down pressures that the silicon wafer 5 is subjected to upon cooling are as uniform as possible.
  • One is to make the cooling of the silicon wafer 5 more uniform, and the second is to prevent the silicon wafer 5 from being broken due to the inconsistent force. Further, it is possible to prevent the silicon wafer 5 from changing the running direction and the trajectory under the action of the high-pressure high-speed cold air to affect the normal transmission.
  • the windshield with numerous small holes is set to achieve a certain wind pressure and wind speed, which plays a role in concentrating the airflow cooling of the silicon wafer and quickly taking away heat.
  • the use of clean air, nitrogen or a mixture of clean air and nitrogen as a cooling medium, or the above-mentioned gas is cooled by a cooling device in advance, in order to increase the cooling rate as quickly as possible and to improve the cooling effect.
  • the forced cooling process of the silicon wafer 5 is completed outside the furnace of the sintering furnace, and does not have any influence on the sintering section due to factors such as the flow velocity and the flow direction of the cooling air, thereby ensuring the stability of the sintering process.
  • the silicon wafer 5 is transported through the roller table 3
  • the silicon wafer 5 is sintered away from the furnace, only the silicon wafer 5 having a small heat capacity enters the forced cooling zone, unlike the mesh belt tunnel sintering furnace, the silicon wafer 5 is required to have a large heat capacity network.
  • the belt is cooled together, so that the silicon wafer transported by the roller table 3 has a better cooling effect.
  • the cooling rate of the silicon wafer 5 can reach 150 ° C / S or more, and the efficient and rapid cooling of the sintered cell sheet is achieved, the temperature peak effect is achieved, and the sintering quality of the battery is improved.
  • the roller table 3 is always rotated in the fixed position in the sintering furnace, and is rotated by the roller table 3.
  • the roller-type sintering furnace greatly reduces the energy consumption compared with the mesh belt tunnel sintering furnace.
  • hollow roller tables can also be used. The use of hollow roller conveyors can reduce heat storage and reduce energy consumption.
  • the sintering furnace body of the present invention is composed of two parts which can be separated from the upper and lower sides, and is bounded by the center line of the horizontal direction of the roller table, and the upper furnace body 1 can be vertically upward.
  • the lifting process can be done by hydraulic system or hinge system.
  • the heating mode adopted by the present invention is a single heat source of infrared radiation heating, microwave heating or electric heating wire heating or any combination of the above three heat sources, and the heating tube 4 is shown in FIG. .

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Abstract

A roller way type solar cell silicon wafer sintering furnace. A carrier for transferring a silicon wafer (5) is a roller way (3) capable of transferring along one direction. The roller way (3) comprises a plurality of rotatable rollers. The roller in contact with the silicon wafer (5) is made of a non-metallic material. A forced air cooling zone is arranged between a sintering zone and a blanking zone. The roller way type solar cell silicon wafer sintering furnace can avoid the pollution and the occurrence of "reticulated mottles" of the silicon wafer in the transferring process, increase the transferring speed, realize fast heating and cooling, improve the cell sintering quality, shorten the length of the furnace body, and reduce the energy consumption.

Description

一种辊道式太阳电池硅片烧结炉  Roller type solar cell wafer sintering furnace
技术领域 Technical field
本发明涉及一种太阳电池硅片烧结炉, 尤其是涉及一种采用辊道传输硅 片的太阳电池硅片烧结炉。 背景技术  The present invention relates to a solar cell wafer sintering furnace, and more particularly to a solar cell wafer sintering furnace using a roller conveyor for transferring silicon wafers. Background technique
在太阳电池硅片的整个生产工艺流程中, 扩散、 印刷和烧结三道工序是 最主要的。 其中, 烧结工艺主要用于烘干印刷在硅片表面的浆料, 烧掉从浆 料中挥发出的有机溶剂, 同步烧结太阳电池硅片的正反面, 使印刷至硅片上 浆料中的金属电极与硅片形成良好的欧姆接触, 利于电池的电流输出, 把电 池应该达到的效率发挥出来。 如果硅片与电极之间的欧姆接触不良, 则可导 致部分电流无法输出, 从而降低电池片的能量转化效率。 也就是说烧结工序 是使晶体硅片真正具有光电转换功能的至关重要的一步, 烧结质量的好坏直 接影响最终太阳电池片效率的高低。 因此, 烧结设备的性能好坏直接影响着 电池片的质量。  In the entire production process of solar cell wafers, the three processes of diffusion, printing and sintering are the most important. Among them, the sintering process is mainly used for drying the slurry printed on the surface of the silicon wafer, burning off the organic solvent volatilized from the slurry, and simultaneously sintering the front and back surfaces of the silicon wafer of the solar cell, so as to be printed on the slurry on the silicon wafer. The metal electrode forms a good ohmic contact with the silicon wafer, which is beneficial to the current output of the battery and exerts the efficiency that the battery should achieve. If the ohmic contact between the silicon wafer and the electrode is poor, a partial current cannot be output, thereby reducing the energy conversion efficiency of the battery. That is to say, the sintering process is a crucial step to make the crystalline silicon wafer truly have photoelectric conversion function, and the quality of the sintering directly affects the efficiency of the final solar cell. Therefore, the performance of the sintering equipment directly affects the quality of the battery.
目前, 国内外的太阳电池生产制造厂家主要使用网带式隧道烧结炉, 在 烧结炉的纵向上依次设有预热排胶区、 升温区、 烧结区和降温区。 在不同区 域布置不同密度的加热灯管, 以此来控制各区域温度。 印刷有电极的硅片通 过网带传输, 依次经过烧结炉的不同炉温区, 完成预热排胶、 升温、 烧结和 降温的电极烧结过程。 虽然这种网带式隧道烧结技术已经比较成熟, 但存在 如下问题: 一是硅片与金属网带直接接触, 金属对硅片有污染; 二是普通网 带式隧道烧结炉的运行速度较低,一般只有 2000mm/min,而目前电池片烧结 工艺要求能达到 5000mm/min 以上的高速烧结, 如果用网带式隧道烧结炉进 行高速烧结, 会使网带的运行平稳性变差, 在电池片的背电极面造成网紋, 影响外观质量, 甚至会造成破片; 三是金属网带会蓄积大量热量, 高速烧结 如何使网带在很短的时间内降温、 以保证电池片的出炉温度, 也是一个较难 解决的问题; 四是由于网带的蓄热作用, 使烧结炉不能在较短的时间内达到 工艺需要的烧结温度 850°C~950°C, 达到烧结温度后, 即便采用水冷却, 也 不能很快降温, 难以满足硅片冷却速率 70°0/8的要求; 五是网带的蓄热作 用也增加了炉体升温段和降温段的长度, 一般网带式隧道烧结炉需要 10 米 -12米的长度才能完成整个烧结过程, 从而增加了烧结炉的体积和造价; 六 是由于网带的质量要远远大于硅片的质量, 因此, 加热网带和冷却网带带走 的热量要远大于硅片烧结所需要的热量, 从而烧结炉的能耗被大大提高。 At present, solar cell manufacturers at home and abroad mainly use mesh belt tunnel sintering furnaces, and preheating and discharging zones, heating zones, sintering zones and cooling zones are sequentially arranged in the longitudinal direction of the sintering furnace. Heat pipes of different densities are arranged in different areas to control the temperature of each zone. The silicon wafer printed with the electrode is transported through the mesh belt, and sequentially passes through different furnace temperature zones of the sintering furnace to complete the electrode sintering process of preheating, discharging, heating, sintering and cooling. Although the mesh belt tunnel sintering technology has been relatively mature, the following problems exist: First, the silicon wafer is in direct contact with the metal mesh belt, and the metal is contaminated with the silicon wafer; Second, the ordinary mesh belt tunnel sintering furnace has a lower running speed. Generally, it is only 2000mm/min. At present, the sintering process of the cell sheet can achieve high-speed sintering of 5000mm/min or more. If the mesh belt tunnel sintering furnace is used for high-speed sintering, the running stability of the mesh belt will be deteriorated. The back electrode surface causes the texture, which affects the appearance quality, and even causes fragmentation. Third, the metal mesh belt will accumulate a large amount of heat, and how the high-speed sintering causes the mesh belt to cool down in a short period of time to ensure the discharge temperature of the battery sheet. A problem that is more difficult to solve; Fourth, due to the heat storage of the mesh belt, the sintering furnace cannot be reached in a short period of time. The sintering temperature required by the process is 850 ° C ~ 950 ° C. After reaching the sintering temperature, even if it is cooled by water, it can not be cooled quickly. It is difficult to meet the requirement of silicon wafer cooling rate of 70 ° 0/8. The effect also increases the length of the heating section and the cooling section of the furnace. Generally, the mesh belt tunnel sintering furnace needs a length of 10 m to 12 m to complete the entire sintering process, thereby increasing the volume and cost of the sintering furnace; The quality is much greater than the quality of the silicon wafer. Therefore, the heat taken away by the heating mesh belt and the cooling mesh belt is much larger than the heat required for the sintering of the silicon wafer, so that the energy consumption of the sintering furnace is greatly improved.
中国专利 CN102032777A针对网带式烧结炉能耗高、 热效率低、 占地面 积大等问题, 提出了一种无网带硅片烧结炉。 其工作原理是由一组固定托架 和移动托架组成的输送装置代替了金属网带, 通过移动托架周期性地完成上 升、 前移、 下降和后退动作, 将放置在固定托架上的硅片逐步向前搬移。 固 定托架和移动托架支撑硅片的托脚用钢丝制成、 在其外表面设有陶瓷涂层。 该专利虽然从一定程度上解决了网带式传输存在的上述缺点, 但这种往复式 搬运方式, 仍然存在以下问题: 一是硅片不能连续平稳输送, 并且输送速度 不容易提高、 难以满足 5000mm/min的输送要求; 二是为了满足硅片在搬运 过程中不断地上下移动的需要, 就会加大炉膛内部的有效高度, 由于炉温的 上下温差要大于水平温差, 这样势必会造成硅片经过的温场波动较大、 烧结 温度不容易精确控制; 三是硅片的传输过程是通过移动托架和固定托架的交 互动作进行间歇式搬移, 不能连续平稳输送, 因此, 不能在炉膛内放置跟随 硅片运动的测温装置, 实现对硅片烧结全过程的动态测温; 四是其支撑硅片 的托脚用钢丝制成、 在其外表面设有陶瓷涂层, 由于钢丝和陶瓷涂层的热膨 胀系数差异较大, 在 850°C~950°C的高温下容易造成陶瓷涂层脱落, 导致硅 片与钢丝直接接触, 由此丧失防止硅片污染的作用。 为此, 申请人开发了一 种辊道式太阳电池硅片烧结炉, 有效解决了以上二种输送方式存在的不足。 发明内容  Chinese patent CN102032777A proposes a meshless silicon wafer sintering furnace for the problems of high energy consumption, low thermal efficiency and large surface area of the mesh belt sintering furnace. The working principle is that a conveyor consisting of a set of fixed brackets and moving brackets replaces the metal mesh belt, and the lifting, forward moving, descending and retreating actions are periodically performed by the moving bracket, and will be placed on the fixed bracket. The silicon wafer is gradually moved forward. The fixing bracket and the moving bracket support the wafer support legs made of steel wire and provided with a ceramic coating on the outer surface thereof. Although this patent solves the above-mentioned shortcomings of mesh belt transmission to some extent, the reciprocating handling method still has the following problems: First, the silicon wafer cannot be continuously and smoothly conveyed, and the conveying speed is not easy to be improved, and it is difficult to satisfy 5000 mm. /min's conveying requirements; Second, in order to meet the need of the wafer to continuously move up and down during the handling process, it will increase the effective height inside the furnace, because the upper and lower temperature difference of the furnace temperature is greater than the horizontal temperature difference, this will inevitably cause the silicon wafer After the temperature field fluctuates greatly, the sintering temperature is not easy to accurately control. Third, the transmission process of the silicon wafer is intermittently moved by the interaction of the moving bracket and the fixed bracket, and cannot be continuously and smoothly conveyed. Therefore, it cannot be in the furnace. The temperature measuring device following the movement of the silicon wafer is placed to realize the dynamic temperature measurement of the whole process of sintering the silicon wafer; the fourth is that the supporting leg of the supporting silicon wafer is made of steel wire, and the outer surface thereof is provided with a ceramic coating, due to the steel wire and the ceramic The difference in thermal expansion coefficient of the coating is large, and the ceramic coating is likely to fall off at a high temperature of 850 ° C to 950 ° C. Silicon electroluminescent wire in direct contact with the sheet, whereby the effect of preventing the loss of wafer contamination. To this end, the applicant developed a roller-type solar cell wafer sintering furnace, which effectively solved the shortcomings of the above two transportation methods. Summary of the invention
本发明针对现有技术的弊端, 提供一种辊道式太阳电池硅片烧结炉, 在 所述烧结炉中, 传输硅片的载体是可以沿一个方向传输的辊道, 该辊道中包 括多个可旋转的辊体。 优选的是, 辊道的与硅片接触部位的材质是非金属的; 所使用的辊道的 与硅片接触部位的材质不同于用来支撑和传动辊道的部位的材质。 优选的是, 辊道的与硅片接触部位的材质是非金属材质, 而用来支撑和 传动辊道的部分的材质是金属材质。 优选的是, 组成辊道的辊体中的至少一部分为表面光滑的平辊体或表面 凸凹不平的辊体。 表面凸凹不平的辊体包括: 表面带有凹槽的螺紋状辊体、 表面带有若干点状或线状凸起的辊体、表面带有若干圆环状物的不等径辊体。 优选的是, 组成辊道的辊体中的至少一部分为实心辊体或空心辊体。 也 就是说, 组成辊道的辊体可以都是实心辊体, 也可以都是空心辊体, 也可以 是部分实心辊体和部分空心辊体共同组成的辊道。 优选的是, 辊道的与硅片接触部位的材质是陶瓷、石英陶瓷或石英玻璃; 或者辊道的与硅片接触部位的材质的成分是 8102或 Si3N4或 SiC, 或 SiO^P A1203结合的材料。 优选的是, 辊道的传输速度在 15000mm/min以下任意可调, 或者传输速 度在 4000mm/min 〜12000mm/min之间。 优选的是, 在烧结炉的烧结区和下料区之间设置有强制风冷区, 硅片完 成烧结后直接进入强制风冷区快速冷却; 所述强制风冷区可以包括: 离开烧 结区而继续向前传送的强制风冷区辊道, 和设置在强制风冷区辊道上方和 /或 下方的吹风装置; 设置在强制风冷区辊道上方和下方的吹风装置彼此相对设 置, 且冷风从上下二个方向同时吹向硅片。 优选的是, 吹风装置所吹出的冷风可以是洁净空气、 氮气或者洁净空气 与氮气的混合物, 或者是经过冷却处理的上述气体。 优选的是, 所述吹风装置的吹风压力在 6000Pa以下任意可调, 与其匹配 的风量满足硅片冷却速率 80°C/S。 优选的是, 烧结炉的炉体由上下可以分离的二部分组成, 上半部分炉体 可以在机械力的作用下沿垂直方向向上自由升起。 优选的是, 烧结炉使用的加热方式是红外辐射加热、 微波加热或电热丝 加热中的单独一种热源或上述三种热源的任意组合。 本发明提供的辊道式太阳电池硅片烧结炉, 对硅片无污染、 无网紋、 与 电池背面不粘接、 输送速度快、 温差小、 温度重复性和稳定性好、 升温降温 快、 无须水冷却、 长度短, 可大大降低能耗、 提高作业效率, 而且可有效实 现温度尖峰、 提高电池烧结质量。 附图说明 The present invention is directed to the disadvantages of the prior art, and provides a roller-type solar cell wafer sintering furnace in which a carrier for transporting a silicon wafer is a roller conveyor that can be transported in one direction, and the roller runner includes a plurality of rollers Rotatable roller body. Preferably, the material of the contact portion of the roller table with the silicon wafer is non-metallic; the material of the contact portion of the roller path with the silicon wafer is different from the material for the portion for supporting and driving the roller table. Preferably, the material of the contact portion of the roller table with the silicon wafer is made of a non-metal material, and the material for supporting and driving the portion of the roller table is made of a metal material. Preferably, at least a part of the roller bodies constituting the roller table is a flat roller body having a smooth surface or a roller body having a rough surface. The uneven roller body includes: a threaded roller body having a groove on the surface, a roller body having a plurality of dots or linear projections on the surface, and an unequal roller body having a plurality of rings on the surface. Preferably, at least a portion of the roller bodies constituting the roller table are solid roller bodies or hollow roller bodies. That is to say, the roller bodies constituting the roller table may be solid roller bodies, or may be hollow roller bodies, or may be a roller roller composed of a part of a solid roller body and a part of a hollow roller body. Preferably, the material of the contact portion of the roller table with the silicon wafer is ceramic, quartz ceramic or quartz glass; or the material of the material of the roller contact portion with the silicon wafer is 810 2 or Si 3 N 4 or SiC, or SiO ^ P A1 2 0 3 bonded material. Preferably, the conveying speed of the roller table is arbitrarily adjustable below 15000 mm/min, or the conveying speed is between 4000 mm/min and 12000 mm/min. Preferably, a forced air cooling zone is disposed between the sintering zone and the blanking zone of the sintering furnace, and the silicon wafer is directly cooled into the forced air cooling zone after the sintering is completed; the forced air cooling zone may include: leaving the sintering zone a forced air-cooling zone roller path that continues to be forwarded, and a blowing device disposed above and/or below the forced air-cooling zone roller path; the blowing devices disposed above and below the forced air-cooling zone roller path are disposed opposite each other, and the cold air The wafer is simultaneously blown from the upper and lower directions. Preferably, the cold air blown by the blowing device may be clean air, nitrogen or a mixture of clean air and nitrogen, or the above-mentioned gas which is cooled. Preferably, the blowing pressure of the blowing device is arbitrarily adjustable below 6000 Pa, and the air volume matched thereto satisfies the cooling rate of the silicon wafer of 80 ° C / S. Preferably, the furnace body of the sintering furnace is composed of two parts which can be separated from each other, and the upper part of the furnace body can freely rise upward in the vertical direction under the action of mechanical force. Preferably, the heating mode used in the sintering furnace is a single heat source of infrared radiation heating, microwave heating or electric heating wire heating or any combination of the above three heat sources. The roller-type solar cell wafer sintering furnace provided by the invention has no pollution to the silicon wafer, no netting, no adhesion to the back of the battery, fast conveying speed, small temperature difference, good temperature repeatability and stability, and rapid temperature rise and fall, It does not require water cooling and has a short length, which can greatly reduce energy consumption and improve work efficiency, and can effectively achieve temperature spikes and improve battery sintering quality. DRAWINGS
图 1 为本发明所述的辊道式太阳电池硅片烧结炉的一个实施例的主视 图;  Figure 1 is a front elevational view showing one embodiment of a roller-type solar cell wafer sintering furnace according to the present invention;
图 2为图 1的侧视图;  Figure 2 is a side view of Figure 1;
图 3为本发明所述的辊道式太阳电池硅片烧结炉中一种辊体结构的示意 图;  3 is a schematic view showing a structure of a roller body in a silicon wafer sintering furnace for a roller-type solar cell according to the present invention;
图 4为本发明所述的辊道式太阳电池硅片烧结炉中另一种辊体结构的示 意图。  Fig. 4 is a view showing another structure of a roller body in a silicon wafer sintering furnace for a roller-type solar cell according to the present invention.
其中, 附图标记如下:  Among them, the reference numerals are as follows:
1上炉体、 2下炉体、 3辊道、 4加热管、 5硅片、 6吹风装置、 7炉体 支架、 8铰链、 9 辊道上的凸起物、 10 辊道金属支撑轴头、 11轴承、 12辊 道上的螺紋、 13非金属圆环、 14金属辊轴。  1 upper furnace body, 2 lower furnace body, 3 roller table, 4 heating pipe, 5 silicon wafer, 6 blowing device, 7 furnace body bracket, 8 hinges, protrusions on 9 roller table, 10 roller road metal support shaft head, 11 bearings, 12-roller thread, 13 non-metallic rings, 14 metal roller shafts.
具体实施方式 Detailed ways
下面结合附图对本发明做进一步的详细说明, 以令本领域技术人员参照 说明书文字能够据以实施。 如图 1和图 2所示, 本发明公开了一种太阳电池硅片烧结炉, 其炉体由 上料区、 烘干区、 预烧区、 烧结区、 强制风冷区和下料区组成, 没有传统网 带式烧结炉所需的水冷却区, 硅片烧结后可以直接进入强制风冷区冷却。 其 传输硅片的载体是可以沿一个方向传输的辊道 3, 由若干可以旋转的耐高温 辊体承托硅片 5、 通过辊体的连续运转将硅片连续、 平稳、 水平地向前传输, 在传输过程中依次完成烘干、 预烧、 烧结和冷却等操作。 炉体的外侧可以设 置有炉体支架 7, 用于将炉体支撑起来。 并且炉体可以分成上炉体 1和下炉 体 2。 可以通过驱动机构, 将上炉体 1和下炉体 2分开, 以便操作或维修。 这种驱动机构可以是铰链 8。 为了保证在 850°C~950°C的高温下传输硅片 5又不污染硅片, 暴露在炉 膛内、与硅片 5接触部位的辊道 3是耐高温且对硅片没有污染的非金属材质, 可使用的材料有 8102或 Si3N4或 SiC, 或 SiO^P A1203结合的材料等。 其中 高纯度的熔融石英陶瓷辊和石英玻璃管, 由于对硅片 5没有污染、 高温性能 稳定且成本相对较低, 成为硅片 5传输辊道的首选材料。 本发明中, 由于高 温下与硅片 5接触的辊道 3采用了对硅片 5没有污染的材质, 有效地消除了 金属网带传输带来的金属污染问题。 The present invention will be further described in detail below with reference to the accompanying drawings, so that those skilled in the art can refer to the description. As shown in FIG. 1 and FIG. 2, the present invention discloses a solar cell silicon wafer sintering furnace, which is composed of a loading zone, a drying zone, a pre-baking zone, a sintering zone, a forced air cooling zone and a blanking zone. , no traditional network In the water cooling zone required for the belt sintering furnace, the silicon wafer can be directly cooled into the forced air cooling zone after being sintered. The carrier for transporting the silicon wafer is a roller table 3 which can be transported in one direction, and the silicon wafer 5 is supported by a plurality of rotatable high temperature resistant roller bodies, and the silicon wafer is continuously and smoothly transferred horizontally by continuous operation of the roller body. Drying, pre-firing, sintering and cooling are performed in sequence during the transfer. The outer side of the furnace body may be provided with a furnace body bracket 7 for supporting the furnace body. And the furnace body can be divided into an upper furnace body 1 and a lower furnace body 2. The upper furnace body 1 and the lower furnace body 2 can be separated by a drive mechanism for operation or maintenance. This drive mechanism can be a hinge 8. In order to ensure that the silicon wafer 5 is transported at a high temperature of 850 ° C to 950 ° C without contaminating the silicon wafer, the roller lane 3 exposed to the furnace and in contact with the silicon wafer 5 is a non-metal which is resistant to high temperature and has no pollution to the silicon wafer. Material, materials that can be used are 810 2 or Si 3 N 4 or SiC, or SiO^P A1 2 0 3 bonded materials. Among them, the high-purity fused silica ceramic roll and the quartz glass tube are the preferred materials for the transfer sheet of the silicon wafer 5 because they have no pollution to the silicon wafer 5, high temperature performance and relatively low cost. In the present invention, since the roller table 3 which is in contact with the silicon wafer 5 at a high temperature employs a material which does not contaminate the silicon wafer 5, the metal contamination problem caused by the metal mesh belt transmission is effectively eliminated.
为了保证辊道有良好的运转性能, 实现硅片 5平稳传输, 本发明设计了 一种金属和非金属复合的辊道 3。 即暴露在炉膛内、 承托和传输硅片 5 的部 分是耐高温、 对硅片 5没有污染的非金属材质。 在炉膛外部、 辊道两端起支 撑传动作用的部件的材质是耐磨性好、 便于机械加工的金属材质, 譬如不锈 钢、耐热钢、普通钢等。起支撑传动作用的部件可以是辊道金属支撑轴头 10, 而其由轴承 11进行支撑。这种结构的辊道 3非金属部分在炉体内部、 而金属 部分在炉体外部, 可有效防止像陶瓷涂层那样、 因膨胀系数不同导致非金属 部分和金属部分脱落的问题; 同时, 暴露在炉膛内的非金属辊道 3 由于导热 率较低,可有效防止热量通过辊体传导到炉体外部的金属支撑和传动机构上。 避免了金属支撑和传动机构因温度升高而不能正常工作或使用寿命降低。 因 此, 这种复合结构既实现了对硅片 5没有污染的目的, 又保证了辊道 3长久、 平稳地运行。 在通过辊道 3连续运转对硅片 5传输的过程中, 硅片 5与辊体始终是瞬 间接触、 处在相对运动状态。 同时, 为了尽可能地减少硅片 5与支撑物的接 触面积、 减少蓄热, 消除硅片 5大面积与支撑物接触可能出现的粘接和 "网 紋"现象, 如图 3和图 4所示, 本发明可以在辊体表面设计了一种螺紋状或 环状结构、 或者有若干点状或线状突出物的结构。 例如, 图 3中的辊体上的 螺紋 12以及图 4中的非金属圆环 13。 并且, 上述螺紋状、 环状或凸起物的 结构可以稀疏布置。 例如, 稀疏至每一硅片仅仅与两个环状结构接触, 以实 现辊道以最少的支撑点对硅片进行传输, 硅片与运转过程中的辊道形成了若 干个瞬间的点或线接触, 受热和支撑力都比较均匀, 有效解决了硅片背面的 粘连和 "网紋"现象, 同时也解决了传统的静态点支撑因受热和受力不均匀 而容易破片的问题。 在图 4中, 辊体的中心可以采用金属辊轴 14, 而在金属 辊轴 14的外侧套设非金属圆环 13。 硅片 5仅与非金属圆环 13接触。 图 2中 示出了辊道上的突出物 9。 硅片 5通过辊道进行传输的过程中, 始终在一个水平方向平稳连续地向 前移动, 没有上下起伏的运动过程, 同时还可以实现硅片 5匀速地输送, 硅 片 5在连续输送过程中依次通过各温区, 就完成了烘干、 预烧、 烧结和冷却 等操作。 因此, 与通过移动托架周期性地往复上下前后移动、 将硅片 5逐步 向前搬移的输送方式相比, 辊道式传输不会对炉内气流造成扰动, 不会对炉 温带来波动, 硅片 5在水平方向移动不存在上下温差, 并且是匀速移动, 所 以烧结温度更加均匀、 烧结过程一致性好, 从而电池烧结质量更高。 另外, 这种连续、 水平的传输方式, 可以像网带传输那样、 在炉膛内放置跟随硅片 5运动的测温装置, 实现对硅片 5烧结全过程进行动态测温。 为了实现较高的电池烧结质量、较高的作业效率和辊道维护检修等操作, 辊道的传输速度设定在 15000mm/min 以下任意可调, 正常的工作速度是 4000mm/min~ 12000mm/min。 一般来讲, 硅片 5完成烧结后, 降温速度越快越好, 冷却速率最好是大 于 80°C/S。 本发明在烧结区和下料区之间设置了一段强制风冷区, 硅片 5完 成烧结、 从烧结炉炉膛出来后直接输送到强制风冷区的辊道 3上, 在继续向 前传输的过程中完成快速冷却, 以达到快速降温的目的。 实现强制风冷的方 式可以是在强制风冷区辊道的上方和下方彼此相对设置吹风装置 6。 吹风装 置 6可以是带有无数小孔的风栅, 冷风从上下二个方向同时集中定向吹向在 辊道上输送的硅片 5, 使硅片 5快速冷却; 通常通过风栅吹向硅片 5的冷风 压力在 6000Pa以下任意可调,与其匹配的风量要满足硅片冷却速率 80°C/S、 而又不破片的要求。 从上下二个方向同时向硅片 5吹风, 是为了使冷风同时 作用到硅片 5的上下表面。 使硅片 5在冷却时受到的上下压力尽可能一致。 一是可以使硅片 5的冷却更均匀, 二是可以防止硅片 5因受力不一致导致破 裂。 再就是可以防止硅片 5在高压高速冷风的作用下改变运行方向和轨迹而 影响正常传输。 设置带有无数小孔的风栅, 是为了实现一定的风压和风速, 起到对硅片集中定向吹风冷却、 快速带走热量的作用。 采用洁净空气、 氮气 或者洁净空气与氮气的混合物作为冷却介质, 或者将上述气体预先经过一个 冷却装置进行冷却处理, 都是为了尽可能快地提高降温速率, 提高降温效果。 硅片 5的强制冷却过程是在烧结炉炉膛外部完成的, 不会因冷却风的流速和 流向等因素对烧结段带来任何影响, 从而保证了烧结工艺的稳定性。 另外, 通过辊道 3传输, 硅片 5完成烧结离开炉膛时, 只有热容量很小的硅片 5进 入强制冷却区, 不像网带式隧道烧结炉那样硅片 5要随着热容量很大的网带 一起冷却, 所以, 辊道 3传输的硅片冷却效果更好。 通过以上措施, 可以使 硅片 5的冷却速率达到 150°C/S以上, 实现了烧结电池片的高效快速冷却、 达到了较好的温度尖峰效果、 提高了电池烧结质量。 本发明中, 辊道 3始终在烧结炉中的固定位置上原地转动, 靠辊道 3转 动的摩擦力将硅片 5向前传送, 辊道 3在烧结炉的纵向上没有相对移动, 只 有硅片 3纵向穿过烧结炉完成整个烧结过程。 辊道 3在烧结炉内被加热到预 定温度、 达到热平衡后, 几乎不再吸收热量, 与网带式烧结炉相比, 整个烧 结过程只有质量很小的硅片带走热量, 硅片 5的强制冷却过程也是在烧结炉 炉膛外部完成的, 因此, 辊道式烧结炉与网带式隧道烧结炉相比, 大大地降 低了能耗。 再者, 也可以采用空心辊道。 采用空心辊道, 可起到减少蓄热、 降低能耗的作用。 为了方便对炉膛内的辊道和碎片进行清理作业, 本发明的烧结炉炉体由 上下可以分离的二部分组成, 以辊道水平方向的中心线为界、 上炉体 1可以 沿垂直方向向上自由升起, 可以通过液压系统或铰链系统来完成提升过程。 在生产过程中, 当发现碎片、 卡片等异常现象时, 启动提升系统, 迅速将上 炉体 1升起, 完成清理和维修作业。 为了获得较好的加热效果, 本发明采用的加热方式是红外辐射加热、 微 波加热或电热丝加热中的单独一种热源或上述三种热源的任意组合, 在图 1 中示出了加热管 4。 尽管本发明的实施方案已公开如上, 但其并不仅仅限于说明书和实施方 式中所列运用, 它完全可以被适用于各种适合本发明的领域, 对于熟悉本领 域的人员而言, 可容易地实现另外的修改, 因此在不背离权利要求及等同范 围所限定的一般概念下, 本发明并不限于特定的细节和这里示出与描述的图 例。 In order to ensure good running performance of the roller table and to realize smooth transmission of the silicon wafer 5, the present invention designs a metal and non-metal composite roller table 3. That is, the portion exposed to the furnace and supporting and transporting the silicon wafer 5 is a non-metallic material which is resistant to high temperatures and has no contamination to the silicon wafer 5. The materials that support the transmission on the outside of the furnace and at both ends of the roller are made of metal materials with good wear resistance and easy machining, such as stainless steel, heat-resistant steel, and ordinary steel. The member that functions as a support transmission may be a roller table metal support shaft head 10 that is supported by the bearing 11. The non-metallic portion of the roller table 3 of such a structure is inside the furnace body, and the metal portion is outside the furnace body, which can effectively prevent the non-metallic portion and the metal portion from falling off due to the difference in expansion coefficient like the ceramic coating layer; The non-metallic roller table 3 in the furnace can effectively prevent heat from being conducted through the roller body to the metal support and the transmission mechanism outside the furnace body due to the low thermal conductivity. The metal support and the transmission mechanism are prevented from malfunctioning due to temperature rise or the service life is reduced. Therefore, the composite structure not only achieves the purpose of not polluting the silicon wafer 5, but also ensures that the roller table 3 is long-lasting. Run smoothly. During the continuous transfer of the wafer 5 through the roller table 3, the wafer 5 and the roller body are always in instantaneous contact and in a relative motion state. At the same time, in order to reduce the contact area between the silicon wafer 5 and the support as much as possible, and to reduce heat storage, the bonding and "mesh" phenomenon which may occur in contact with the support of the large area of the silicon wafer 5 is eliminated, as shown in FIG. 3 and FIG. It can be seen that the present invention can be designed with a threaded or annular structure or a plurality of dot-like or linear protrusions on the surface of the roller body. For example, the thread 12 on the roller body in Fig. 3 and the non-metallic ring 13 in Fig. 4. Also, the structure of the above-mentioned thread, ring or projection may be sparsely arranged. For example, it is sparse to each wafer to be in contact with only two annular structures to achieve the transfer of the wafer with a minimum of support points, and the wafer forms a number of instantaneous points or lines with the roller path during operation. The contact, heat and support are relatively uniform, effectively solving the adhesion and "mesh" phenomenon on the back of the silicon wafer, and also solving the problem that the conventional static point support is easy to break due to heat and uneven force. In Fig. 4, the center of the roller body may be a metal roller shaft 14, and a non-metallic ring 13 may be sleeved on the outer side of the metal roller shaft 14. The silicon wafer 5 is only in contact with the non-metallic ring 13. The projection 9 on the roller table is shown in FIG. During the transmission of the silicon wafer 5 through the roller table, it is always moved smoothly and continuously in a horizontal direction, without the ups and downs of the movement process, and at the same time, the silicon wafer 5 can be transported at a constant speed, and the silicon wafer 5 is continuously conveyed. Drying, pre-burning, sintering, and cooling are performed by sequentially passing through the respective temperature zones. Therefore, compared with the conveying method of periodically moving back and forth by the moving carriage to move the silicon wafer 5 forward and backward, the roller conveyor does not disturb the airflow in the furnace, and does not cause fluctuations in the furnace temperature. The silicon wafer 5 moves in the horizontal direction without the upper and lower temperature difference, and moves at a uniform speed, so the sintering temperature is more uniform, the sintering process is consistent, and the battery sintering quality is higher. In addition, this continuous and horizontal transmission mode can be used to measure the temperature of the silicon wafer 5 during the whole process of sintering the silicon wafer 5 like a mesh belt transmission. In order to achieve high battery sintering quality, high work efficiency and maintenance of roller table maintenance, the conveying speed of the roller table can be arbitrarily adjusted below 15000mm/min. The normal working speed is 4000mm/min~ 12000mm/min. Generally, after the silicon wafer 5 is sintered, the cooling rate is as fast as possible, and the cooling rate is preferably greater than 80 ° C / s. The invention provides a forced air cooling zone between the sintering zone and the blanking zone, and the silicon wafer 5 is sintered, directly discharged from the furnace of the sintering furnace, and directly conveyed to the roller table 3 of the forced air cooling zone, and continues to be transported forward. Rapid cooling is achieved during the process to achieve rapid cooling. The manner of achieving forced air cooling may be such that the blowing device 6 is disposed opposite to each other above and below the roller path of the forced air cooling zone. The blowing device 6 can be a wind grille with a plurality of small holes, and the cold air is simultaneously directed from the upper and lower directions to the silicon wafer 5 conveyed on the roller table, so that the silicon wafer 5 is rapidly cooled; usually, the wind turbine is blown toward the silicon wafer 5 The cold air pressure can be arbitrarily adjusted below 6000Pa, and the matching air volume should meet the requirement of the silicon wafer cooling rate of 80 °C / S without fragmentation. The silicon wafer 5 is simultaneously blown from the upper and lower directions in order to cause the cold air to simultaneously act on the upper and lower surfaces of the silicon wafer 5. The up and down pressures that the silicon wafer 5 is subjected to upon cooling are as uniform as possible. One is to make the cooling of the silicon wafer 5 more uniform, and the second is to prevent the silicon wafer 5 from being broken due to the inconsistent force. Further, it is possible to prevent the silicon wafer 5 from changing the running direction and the trajectory under the action of the high-pressure high-speed cold air to affect the normal transmission. The windshield with numerous small holes is set to achieve a certain wind pressure and wind speed, which plays a role in concentrating the airflow cooling of the silicon wafer and quickly taking away heat. The use of clean air, nitrogen or a mixture of clean air and nitrogen as a cooling medium, or the above-mentioned gas is cooled by a cooling device in advance, in order to increase the cooling rate as quickly as possible and to improve the cooling effect. The forced cooling process of the silicon wafer 5 is completed outside the furnace of the sintering furnace, and does not have any influence on the sintering section due to factors such as the flow velocity and the flow direction of the cooling air, thereby ensuring the stability of the sintering process. In addition, when the wafer 5 is transported through the roller table 3, when the silicon wafer 5 is sintered away from the furnace, only the silicon wafer 5 having a small heat capacity enters the forced cooling zone, unlike the mesh belt tunnel sintering furnace, the silicon wafer 5 is required to have a large heat capacity network. The belt is cooled together, so that the silicon wafer transported by the roller table 3 has a better cooling effect. Through the above measures, the cooling rate of the silicon wafer 5 can reach 150 ° C / S or more, and the efficient and rapid cooling of the sintered cell sheet is achieved, the temperature peak effect is achieved, and the sintering quality of the battery is improved. In the present invention, the roller table 3 is always rotated in the fixed position in the sintering furnace, and is rotated by the roller table 3. The dynamic friction forces the silicon wafer 5 forward, and the roller table 3 does not move relatively in the longitudinal direction of the sintering furnace, and only the silicon wafer 3 passes through the sintering furnace longitudinally to complete the entire sintering process. After the roller table 3 is heated to a predetermined temperature in the sintering furnace and reaches the heat balance, the heat is hardly absorbed. Compared with the mesh belt sintering furnace, only the silicon wafer with a small mass takes away heat during the entire sintering process, and the silicon wafer 5 The forced cooling process is also performed outside the furnace of the sintering furnace. Therefore, the roller-type sintering furnace greatly reduces the energy consumption compared with the mesh belt tunnel sintering furnace. Furthermore, hollow roller tables can also be used. The use of hollow roller conveyors can reduce heat storage and reduce energy consumption. In order to facilitate the cleaning operation of the roller table and the debris in the furnace, the sintering furnace body of the present invention is composed of two parts which can be separated from the upper and lower sides, and is bounded by the center line of the horizontal direction of the roller table, and the upper furnace body 1 can be vertically upward. Free rise, the lifting process can be done by hydraulic system or hinge system. In the production process, when abnormal phenomena such as chips and cards are found, the lifting system is started, and the upper furnace body 1 is quickly raised to complete the cleaning and maintenance work. In order to obtain a better heating effect, the heating mode adopted by the present invention is a single heat source of infrared radiation heating, microwave heating or electric heating wire heating or any combination of the above three heat sources, and the heating tube 4 is shown in FIG. . Although the embodiments of the present invention have been disclosed as above, they are not limited to the applications listed in the specification and the embodiments, and are fully applicable to various fields suitable for the present invention, and are easily accessible to those skilled in the art. The invention is not limited to the specific details and the details shown and described herein, without departing from the scope of the appended claims.

Claims

权 利 要 求 书 Claim
1. 一种辊道式太阳电池硅片烧结炉, 其特征在于, 在所述烧结炉中, 传 输硅片的载体是可以沿一个方向传输的辊道, 该辊道中包括多个可旋转的辊 体。 A roller-type solar cell wafer sintering furnace, characterized in that, in the sintering furnace, a carrier for transporting a silicon wafer is a roller conveyor that can be transported in one direction, and the roller runner includes a plurality of rotatable rollers body.
2. 根据权利要求 1所述的辊道式太阳电池硅片烧结炉, 其特征在于, 辊 道的与硅片接触部位的材质是非金属的。  2. The roller-type solar cell wafer sintering furnace according to claim 1, wherein the material of the roller contact portion with the silicon wafer is non-metallic.
3. 根据权利要求 2所述的辊道式太阳电池硅片烧结炉, 其特征在于, 所 使用的辊道的与硅片接触部位的材质不同于用来支撑和传动辊道的部位的材 质。  3. A roller-type solar cell wafer sintering furnace according to claim 2, wherein the material of the roller table used at the point of contact with the silicon wafer is different from the material of the portion for supporting and driving the roller table.
4. 根据权利要求 2或 3中任一项所述的辊道式太阳电池硅片烧结炉, 其 特征在于, 辊道的与硅片接触部位的材质是非金属材质, 而用来支撑和传动 辊道的部分的材质是金属材质。  The roller-type solar cell wafer sintering furnace according to any one of claims 2 to 3, wherein the material of the contact portion of the roller table with the silicon wafer is made of a non-metal material for supporting and driving the roller. The material of the track is made of metal.
5. 根据权利要求 1-3中任一项所述的辊道式太阳电池硅片烧结炉, 其特 征在于, 组成辊道的辊体中的至少一部分为表面光滑的平辊体或表面凸凹不 平的辊体。  The roller-type solar cell wafer sintering furnace according to any one of claims 1 to 3, characterized in that at least a part of the roller bodies constituting the roller table is a flat roller body having a smooth surface or a surface unevenness Roll body.
6. 根据权利要求 5所述的辊道式太阳电池硅片烧结炉, 其特征在于, 所 述表面凸凹不平的辊体包括: 表面带有凹槽的螺紋状辊体、 表面带有若干点 状或线状凸起的辊体、 表面带有若干圆环状物的不等径辊体。  6. The roller-type solar cell wafer sintering furnace according to claim 5, wherein the uneven roller body comprises: a threaded roller body having a groove on the surface, and a plurality of dots on the surface Or a linearly convex roller body with an unequal diameter roller body with a plurality of rings on the surface.
7. 根据权利要求 1-3和 6中任一项所述的辊道式太阳电池硅片烧结炉, 其特征在于, 组成辊道的辊体中的至少一部分为实心辊体或空心辊体。  The roller-type solar cell wafer sintering furnace according to any one of claims 1 to 3, wherein at least a part of the roller bodies constituting the roller table is a solid roller body or a hollow roller body.
8. 根据权利要求 1-3和 6中任一项所述的辊道式太阳电池硅片烧结炉, 其特征在于, 辊道的与硅片接触部位的材质是陶瓷、 石英陶瓷或石英玻璃。 The roller-type solar cell wafer sintering furnace according to any one of claims 1 to 3, wherein the material of the contact portion of the roller table with the silicon wafer is ceramic, quartz ceramic or quartz glass.
9. 根据权利要求 1-3和 6中任一项所述的辊道式太阳电池硅片烧结炉, 其特征在于, 辊道的与硅片接触部位的材质是 &02或 Si3N4或 SiC, 或 Si02 和 A1203结合的材料。 The roller-type solar cell wafer sintering furnace according to any one of claims 1 to 3, wherein the material of the contact portion of the roller table with the silicon wafer is &0 2 or Si 3 N 4 or SiC, or a combination of Si0 2 and A1 2 0 3 .
10. 根据权利要求 1-3和 6中任一项所述的辊道式太阳电池硅片烧结炉, 其特征在于, 辊道的传输速度在 15000mm/min以下任意可调, 或者传输速度 在 4000mm/min 〜 12000mm/min之间。 The roller-type solar cell wafer sintering furnace according to any one of claims 1 to 3, wherein the conveying speed of the roller table is arbitrarily adjustable below 15000 mm/min, or the conveying speed is 4000 mm. /min ~ between 12000mm/min.
11 . 根据权利要求 1-3和 6中任一项所述的辊道式太阳电池硅片烧结炉, 其特征在于, 在烧结炉的烧结区和下料区之间设置有强制风冷区, 硅片完成 烧结后直接进入强制风冷区快速冷却。 The roller-type solar cell wafer sintering furnace according to any one of claims 1 to 3, characterized in that a forced air-cooling zone is provided between the sintering zone and the blanking zone of the sintering furnace, After the silicon wafer is sintered, it directly enters the forced air cooling zone for rapid cooling.
12. 根据权利要求 11所述的辊道式太阳电池硅片烧结炉, 其特征在于, 所述强制风冷区包括: 离开烧结区而继续向前传送的强制风冷区辊道, 和设 置在强制风冷区辊道上方和 /或下方的吹风装置。  12. The roller-type solar cell wafer sintering furnace according to claim 11, wherein the forced air cooling zone comprises: a forced air cooling zone roller path that continues to be forwarded away from the sintering zone, and is disposed at A blower above and/or below the roller path in the forced air cooling zone.
13. 根据权利要求 12所述的辊道式太阳电池硅片烧结炉, 其特征在于, 设置在强制风冷区辊道上方和下方的吹风装置彼此相对设置, 且冷风从上下 二个方向同时吹向硅片。  13. The roller-type solar cell wafer sintering furnace according to claim 12, wherein the blowing devices disposed above and below the roller path of the forced air-cooling zone are disposed opposite to each other, and the cold air is simultaneously blown from the upper and lower directions. To the silicon wafer.
14.根据权利要求 12或 13中任一项所述的辊道式太阳电池硅片烧结炉, 其特征在于, 吹风装置所吹出的冷风是洁净空气、 氮气或者洁净空气与氮气 的混合物, 或者是经过冷却处理的上述气体。  The roller-type solar cell wafer sintering furnace according to any one of claims 12 to 13, wherein the cold air blown by the blowing device is clean air, nitrogen or a mixture of clean air and nitrogen, or The above-mentioned gas that has been cooled.
15. 根据权利要求 12或 13中任一项所述的辊道式太阳电池硅片烧结炉, 其特征在于, 所述吹风装置的吹风压力在 6000Pa以下任意可调, 与其匹配的 风量满足硅片冷却速率 80 °C /S。  The roller-type solar cell wafer sintering furnace according to any one of claims 12 to 13, wherein the blowing pressure of the blowing device is arbitrarily adjustable below 6000 Pa, and the matching air volume satisfies the silicon wafer. Cooling rate 80 °C / s.
16. 根据权利要求 1-3和 6中任一项所述的辊道式太阳电池硅片烧结炉, 其特征在于, 所述烧结炉的炉体由上下可以分离的二部分组成, 上半部分炉 体可以在机械力的作用下沿垂直方向向上自由升起。 The roller-type solar cell wafer sintering furnace according to any one of claims 1 to 3, wherein the furnace body of the sintering furnace is composed of two parts which can be separated from each other, the upper part The furnace body can rise freely upward in the vertical direction under the action of mechanical force.
17. 根据权利要求 1-3和 6中任一项所述的辊道式太阳电池硅片烧结炉, 其特征在于, 所述烧结炉使用的加热方式是红外辐射加热、 微波加热或电热 丝加热中的单独一种热源或上述三种热源的任意组合。 The roller-type solar cell wafer sintering furnace according to any one of claims 1 to 3, wherein the sintering furnace uses a heating method of infrared radiation heating, microwave heating or electric heating wire heating. A single heat source or any combination of the above three heat sources.
PCT/CN2012/084135 2011-11-16 2012-11-06 Roller way type solar cell silicon wafer sintering furnace WO2013071830A1 (en)

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