WO2013069767A1 - Substrate for light emitting elements, light emitting module, and method for manufacturing light emitting module - Google Patents
Substrate for light emitting elements, light emitting module, and method for manufacturing light emitting module Download PDFInfo
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- WO2013069767A1 WO2013069767A1 PCT/JP2012/079118 JP2012079118W WO2013069767A1 WO 2013069767 A1 WO2013069767 A1 WO 2013069767A1 JP 2012079118 W JP2012079118 W JP 2012079118W WO 2013069767 A1 WO2013069767 A1 WO 2013069767A1
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Definitions
- the present invention relates to a light emitting element substrate, a light emitting module, and a method for manufacturing a light emitting module, and more particularly to a light emitting element substrate on which a light emitting element is disposed, a light emitting module including the light emitting element substrate, and a method for manufacturing a light emitting module.
- a light emitting element substrate on which a light emitting element is disposed is known.
- Such a light emitting element substrate is disclosed in, for example, Japanese Patent Laid-Open No. 2003-133596.
- a metal substrate (light emitting element substrate), an insulating layer arranged so as to form a recess on the surface of the metal substrate, a surface of the metal substrate, and in the recess
- An LED display device includes an LED (light emitting element) disposed on the substrate, a bonding wire that connects the LED and a circuit pattern on an insulating layer, and a transparent sealing material that fills the recess.
- the metal substrate of this LED display device is configured to release heat to the chassis or the like while securing mechanical strength as a substrate on which the LEDs are arranged by being fixed to the chassis or the like.
- the metal substrate is made of any one of Al, Cu and Fe, a clad material containing two or three kinds of the metal material, or an alloy containing the metal material. Things are illustrated.
- the above Japanese Patent Application Laid-Open No. 2003-133596 discloses a specific configuration in the case where the metal substrate is made of a plurality of metal materials (type, thickness, order of combination, etc. of each metal material (metal layer) constituting the metal substrate). ) Is not disclosed at all.
- the metal substrate of the LED display device is composed of any one of Al, Cu, Fe exemplified in JP-A-2003-133596, or a clad material containing two or three of these metals.
- sufficient heat dissipation performance may not be obtained.
- the heat dissipation performance of the metal substrate is not sufficient, it is considered that the heat of the LED is not sufficiently transmitted to the chassis side through the metal substrate but is accumulated on the metal substrate in the vicinity of the LED. For this reason, it is difficult to transfer heat from the LED to the metal substrate, and the temperature of the LED rises. As a result, there is a problem that the luminance of the LED is lowered and the lifetime of the LED is shortened.
- the mechanical strength of the metal substrate is lowered, the metal substrate is easily damaged during handling, and there is a problem that the manufacture of the LED display device is hindered.
- the present invention has been made to solve the above-described problems, and an object of the present invention is to improve the heat dissipation performance of the substrate for the light-emitting element and to suppress the decrease in luminance caused by the temperature rise of the light-emitting element.
- a light-emitting element substrate capable of ensuring sufficient mechanical strength
- a light-emitting module including the light-emitting element substrate and a method for manufacturing the light-emitting module are provided.
- a substrate for a light-emitting element according to a first aspect of the present invention is disposed on a surface on which a light-emitting element is disposed, and is a first layer made of any one of Cu, Ag, Al, Cu alloy, Ag alloy, or Al alloy. And the second layer made of Fe or Fe alloy, and the second layer sandwiched between the first layer and disposed on the other surface, either Cu, Ag, Al, Cu alloy, Ag alloy or Al alloy And a surface having an arithmetic average roughness (Ra) as an index indicating the surface roughness, while the kurtosis (Rku) as an index indicating the surface roughness is 10.5 or less. ) Is 0.15 ⁇ m or less.
- one surface on which the light emitting element is disposed is made of any one of Cu, Ag, Al, Cu alloy, Ag alloy, or Al alloy.
- the first layer having excellent thermal conductivity compared to Fe or the Fe alloy is disposed on the light emitting element side, so that heat from the light emitting element is transferred to the first layer near the light emitting element. It is possible to diffuse quickly from the portion of the layer toward the portion of the first layer located away from the light emitting element.
- the heat of the first layer can be quickly dissipated to an external heat dissipating member connected to the first layer or the outside air, so that heat is accumulated on the light emitting element substrate with improved heat dissipating performance in the vicinity of the light emitting element. Can be suppressed. As a result, it is possible to suppress the temperature of the light emitting element from rising due to the heat accumulated in the substrate for the light emitting element, thereby suppressing the luminance of the light emitting element from decreasing due to the temperature increase of the light emitting element, In addition, the life of the light emitting element can be extended.
- the light emitting element substrate by providing the second layer made of Fe or Fe alloy, the light emitting element substrate has a larger coefficient of linear expansion than the second layer, such as Cu, Ag, Al.
- the first layer has a smaller linear expansion coefficient than the first layer, and has a mechanical strength particularly under high temperature conditions. Since the light emitting element substrate has a multilayer structure using the second layer having a large thickness, the thermal expansion of the light emitting element substrate can be suppressed and the mechanical strength of the light emitting element substrate can be improved. .
- the second layer is formed between the first layer and the third layer made of any one of Cu, Ag, Al, Cu alloy, Ag alloy, and Al alloy. And the second layer having a smaller linear expansion coefficient than that of the first layer and the third layer are sandwiched between the first layer and the third layer, whereby the substrate for a light emitting element is formed in the first layer. Unlike the case of only the layer and the second layer, it is possible to suppress the light emitting element substrate from being deformed so as to warp either the first layer side or the second layer side.
- the pointed portion of the one surface where the light emitting element is disposed is reduced. can do.
- the one surface so that the arithmetic average roughness (Ra) is 0.15 ⁇ m or less, the difference in height (undulation) of the unevenness on the one surface on which the light emitting element is arranged can be reduced. .
- the third layer is made of the same metal material as the first layer. Therefore, it can suppress more that it deform
- the 0.2% proof stress of the second layer is 250 MPa or more under a temperature condition of 200 ° C. or more and 400 ° C. or less.
- the 0.2% proof stress of the second layer is maintained at 250 MPa or more even after being subjected to a high temperature condition of 200 ° C. or more and 400 ° C. or less. It can suppress reliably that intensity
- the first layer is made of Cu or a Cu alloy, and on the one surface, a plating layer constituting a light reflecting layer capable of reflecting light from the light emitting element. Is formed. If comprised in this way, while the 1st layer which consists of Cu or Cu alloy which does not reflect light easily will be located, the plating layer which comprises a light reflection layer is formed on the one surface where a light emitting element is arrange
- the kurtosis on the one surface is 10.5 or less, the pointed portion on the one surface is small, the arithmetic mean roughness on the one surface is 0.15 ⁇ m or less, and the undulation on the one surface is small, A high-quality plated layer having no defects can be formed thereon.
- the third layer is made of the same metal material as the first layer, and the first layer and the third layer have the same thickness. If comprised in this way, while it consists of the same metal material and the 1st layer and 3rd layer which have the same thickness, the 2nd layer whose linear expansion coefficient is smaller than a 1st layer and a 3rd layer is inserted
- the structure of the light emitting element substrate can be the same on the front and back, the light emitting element substrate can be configured so that it is not necessary to distinguish between the front and the back.
- the first layer, the second layer, and the third layer form a plate-shaped substrate body, and the plate-shaped substrate body is heated in the plate surface direction.
- the conductivity is 150 W / (m ⁇ K) or more, and the thermal conductivity in the plate thickness direction is 100 W / (m ⁇ K) or more. If comprised in this way, while being able to fully diffuse the heat
- the first layer, the second layer, and the third layer form a plate-like substrate body, and the plate-like substrate body has a linear expansion coefficient of 17. ⁇ 10 ⁇ 6 / K or less. If comprised in this way, since the thermal expansion of the light emitting element use substrate can fully be suppressed, the deformation
- the first layer and the third layer are both made of Cu, and the second layer is made of Fe. If comprised in this way, the 1st layer in the position away from the light emitting element from the part of the 1st layer in the vicinity of a light emitting element by the heat
- the second layer is made of an Fe alloy, and the Fe alloy constituting the second layer contains at least one of Ni and Cr, and Ni and It consists of Fe alloy whose sum total with Cr is 10 mass% or less. If comprised in this way, the corrosion resistance of the 2nd layer which consists of Fe alloys can be improved by containing at least any one of Ni and Cr. Moreover, it can suppress that the heat conductivity of a 2nd layer becomes small too much by making the sum total of Ni and Cr of Fe alloy which comprises a 2nd layer into 10 mass% or less.
- the first layer, the second layer, and the third layer form a plate-like substrate body, and the plate-like substrate body is a plate from the other surface side. Is bent so as to cover the surface of a plate-like base that supports the substrate body.
- the light emitting element substrate can be arranged so as to cover the plate-like base, and therefore the surface area of the light emitting element substrate is increased compared to the case where the light emitting element substrate is not bent. Can be secured.
- heat from the light emitting element can be quickly diffused from the first layer portion in the vicinity of the light emitting element toward the first layer portion in a wide range away from the light emitting element, and heat is radiated to the outside air over a wide range. Can be made. As a result, it is possible to further suppress the accumulation of heat on the light emitting element substrate in the vicinity of the light emitting element.
- a light-emitting module is a light-emitting element, and is disposed on one surface on which the light-emitting element is disposed, and is made of any one of Cu, Ag, Al, Cu alloy, Ag alloy, or Al alloy.
- a second layer is sandwiched between one layer, a second layer made of Fe or an Fe alloy, and the first layer, and is disposed on the other surface of Cu, Ag, Al, Cu alloy, Ag alloy, or Al alloy.
- a light emitting element substrate including any one of the third layers, and one surface of the light emitting element substrate has a kurtosis (Rku) as an index indicating the surface roughness of 10.5 or less,
- the arithmetic average roughness (Ra) as an index indicating the surface roughness is formed to be 0.15 ⁇ m or less.
- the light emitting module according to the second aspect of the present invention can achieve the same effects as the light emitting element substrate according to the first aspect.
- a method for manufacturing a light-emitting module wherein the light-emitting element is disposed on one surface and is made of any one of Cu, Ag, Al, Cu alloy, Ag alloy, or Al alloy.
- the second layer is sandwiched between the layer, the second layer made of Fe or Fe alloy, and the first layer, and disposed on the other surface, and any of Cu, Ag, Al, Cu alloy, Ag alloy, or Al alloy And a third layer comprising one of them, while the surface has an arithmetic average roughness (Rku) of 10.5 or less as an index indicating the surface roughness, and an arithmetic average roughness as an index indicating the surface roughness (Rku)
- the second layer made of Fe or Fe alloy. And a step of performing a heat treatment under a high temperature condition of 200 ° C. or more and 400 ° C. or less by a step of forming a substrate for a light emitting element including the step of performing a heat treatment under a temperature condition of 200 ° C. or more and 400 ° C. or less.
- the 0.2% proof stress of the second layer does not decrease, the mechanical strength of the light emitting element substrate can be suppressed from decreasing. Thereby, it becomes possible to prevent the manufacture of the light-emitting module from being difficult due to the difficulty in handling the light-emitting element substrate having a reduced mechanical strength.
- FIG. 6 is a cross-sectional view taken along line 600-600 in FIG.
- FIG. 2 is an enlarged cross-sectional view of a lead frame in the vicinity of an LED element taken along line 600-600 in FIG.
- FIG. 3 is an enlarged cross-sectional view of a lead frame around a connection layer taken along line 600-600 in FIG.
- It is a perspective view for demonstrating the manufacturing process of the LED module by 1st Embodiment of this invention.
- It is sectional drawing for demonstrating the manufacturing process of the LED module by 1st Embodiment of this invention.
- It is a top view for demonstrating the manufacturing process of the LED module by 1st Embodiment of this invention.
- FIG. 6 is an enlarged cross-sectional view of a lead frame in the vicinity of an LED element according to a second embodiment of the present invention. It is the figure which showed the result of the simulation at the time of using Cu for the 1st layer and 3rd layer which were performed in order to confirm the effect of 1st Embodiment of this invention. It is the figure which showed the result of the simulation at the time of using Cu for the 1st layer and 3rd layer which were performed in order to confirm the effect of 1st Embodiment of this invention.
- the LED module 100 is an example of the “light emitting module” in the present invention.
- the LED module 100 has one side (X1 side) connected to the Cu wiring 102a of the printed circuit board 102 via the solder 101a.
- the other side (X2 side) is connected to the Cu wiring 102b of the printed circuit board 102 via the solder 101b.
- a control unit not shown
- the LED module 100 is covered with a plate-like lead frame 1 divided into an X1 side and an X2 side, an LED element 2 fixed on one surface 1a on the X1 side of the lead frame 1, and the lead frame 1. And a plate-like base 3. Further, as shown in FIG. 2, the base 3 has an upper surface 3a (surface on the Z1 side), both side surfaces 3b in the longitudinal direction (X direction), and part of the lower surface 3c (surface on the Z2 side). The other surface 1b of the frame 1 is covered.
- the one surface 1 a of the lead frame 1 is a surface on the side where the LED elements 2 are arranged and the side (outside) facing the printed circuit board 102, and the other surface 1 b of the lead frame 1 is the upper surface of the base 3.
- the lead frame 1 is an example of the “light emitting element substrate” in the present invention
- the LED element 2 is an example of the “light emitting element” in the present invention
- the upper surface 3a, the side surface 3b, and the lower surface 3c are examples of the “surface of the base” in the present invention.
- the lead frame 1 includes a notch portion 10a formed on the upper surface 3a side (Z1 side) of the base 3 and on the X2 side from the central portion in the X direction. It is configured to be divided into an X1 side and an X2 side by a lower surface 3c side (Z2 side) of the table 3 and a notch portion 10b (see FIG. 2) formed in the central portion in the X direction and the periphery thereof. ing.
- the notches 10a and 10b are both formed to extend in the Y direction (see FIG. 1).
- the lead frame 1 is configured to cover a part of the base 3. Specifically, in the lead frame 1, the boundary between the upper surface 3 a of the base 3 and both side surfaces 3 b in the X direction and the boundary between the lower surface 3 c of the base 3 and both side surfaces 3 b in the X direction are the base 3. It is bent at a substantially right angle so as to follow. As a result, the lead frame 1 is bent along the vicinity of the end portion of the upper surface 3 a of the base 3, both side surfaces 3 b in the X direction, and part of the lower surface 3 c of the base 3.
- the lead frame 1 has a substantially uniform thickness t1 (see FIG. 3) of about 0.1 mm to about 1.5 mm.
- the thermal conductivity in the plate surface direction (direction orthogonal to the stacking direction) of the lead frame 1 is about 150 W / (m ⁇ K) or more, and the thermal conductivity in the plate thickness direction (stacking direction) of the lead frame 1.
- the rate is configured to be about 100 W / (m ⁇ K) or more.
- the linear expansion coefficient of the lead frame 1 is configured to be about 17 ⁇ 10 ⁇ 6 / K or less.
- the LED element 2 is configured to emit light mainly from the upper surface (the surface on the Z1 side) upward (Z1 direction).
- the LED element 2 is bonded to the one surface 1a on the X1 side of the lead frame 1 via an adhesive member 4 made of an insulating resin.
- a pair of electrodes (not shown) formed on the upper surface side of the LED element 2 are electrically connected to the X1 side and the X2 side of the lead frame 1 via Au wires 5a and 5b, respectively.
- the base 3 is made of white alumina (Al 2 O 3 ) having an insulating property and capable of reflecting light.
- the base 3 is also formed inside the notches 10 a and 10 b of the lead frame 1. Thereby, insulation between the X1 side and the X2 side of the lead frame 1 is ensured. Furthermore, the base 3 disposed inside the notch 10a can reflect light emitted from the LED element 2 to the notch 10a below (Z2 side) upward (Z1 side). Is possible.
- a reflector 6 is disposed on one surface 1 a of the lead frame 1 so as to surround the LED element 2.
- the reflector 6 is made of alumina (Al 2 O 3 ) and has an opening that increases from the lower side (Z2 side) to the upper side (Z1 side). Thereby, the reflector 6 is comprised so that the light irradiated to the side side from the LED element 2 can be reflected toward upper direction (Z1 direction).
- a sealing resin 7 made of a transparent silicon resin is disposed so as to cover the LED element 2 and the Au wires 5a and 5b.
- the base 3 and the reflector 6 are formed by firing under a high temperature condition of about 200 ° C. or more and about 400 ° C. or less. Further, the sealing resin 7 is formed by curing under a high temperature condition of about 200 ° C. or more and about 400 ° C. or less.
- the lead frame 1 includes a three-layer clad in which an outer Cu layer 11, an Fe layer 12, and an inner Cu layer 13 are roll-bonded to each other. It consists of a clad material having a structure. Both the outer Cu layer 11 and the inner Cu layer 13 are made of Cu having a purity of 99.9% or more, such as oxygen-free copper, tough pitch copper, and phosphorus deoxidized copper.
- the Fe layer 12 is made of Fe alloy containing pure Fe or at least one of Ni and Cr, and the total of Ni and Cr is 10% by mass or less.
- the outer Cu layer 11 is disposed on the one surface 1 a on the side (outer side) on which the LED element 2 is disposed, and the inner Cu layer 13 sandwiches the Fe layer 12 between the outer Cu layer 11. In this way, it is arranged on the other surface 1b on the base 3 side (inner side).
- the outer Cu layer 11, the Fe layer 12, and the inner Cu layer 13 are examples of the “first layer”, “second layer”, and “third layer” of the present invention, respectively.
- the thermal conductivity (about 80 W / (m ⁇ K)) of the Fe layer 12 is smaller than the thermal conductivity (about 400 W / (m ⁇ K)) of the outer Cu layer 11.
- the heat transferred from the LED element 2 to the outer Cu layer 11 of the lead frame 1 is more easily transferred through the outer Cu layer 11 itself than from the outer Cu layer 11 to the Fe layer 12. That is, the heat of the outer Cu layer 11 near the LED element 2 is separated from the LED element 2 along the plate surface direction, rather than being transmitted in the Z2 direction in the order of the Fe layer 12 and the inner Cu layer 13 along the plate thickness direction. It is easy to be transmitted to the outer Cu layer 11 at the position.
- the linear expansion coefficient (about 12 ⁇ 10 ⁇ 6 / K) of the Fe layer 12 is smaller than the linear expansion coefficients (about 17 ⁇ 10 ⁇ 6 / K) of the outer Cu layer 11 and the inner Cu layer 13. Further, Fe or Fe alloy constituting the Fe layer 12 has higher mechanical strength than Cu constituting the outer Cu layer 11 and the inner Cu layer 13.
- the 0.2% yield strength of the Fe layer 12 is about 400 MPa or more, and a 0.2% yield strength of about 0.2% yield or more at about 200 ° C. It is comprised so that it may have. That is, the Fe layer 12 is configured not to be annealed under a high temperature condition of about 200 ° C. or more and about 400 ° C. or less. Thereby, even after being placed under a high temperature condition of about 200 ° C. or higher and about 400 ° C. or lower, the mechanical strength of the entire lead frame 1 is suppressed from being lowered.
- the thickness t2 of the outer Cu layer 11 and the thickness t3 of the inner Cu layer 13 are configured to be substantially the same thickness.
- the one surface 1a on the outer Cu layer 11 side of the lead frame 1 has a kurtosis (Rku) as an index indicating the surface roughness of 10.5 or less over the entire surface, and arithmetic.
- the average roughness (Ra) is formed to be 0.15 ⁇ m or less.
- kurtosis is a kind of index indicating the surface roughness and indicating the sharpness of the uneven shape formed on the surface. Specifically, the kurtosis is obtained by dividing the fourth power of the height in the reference length by the fourth power of the root mean square height that means the standard deviation of the surface roughness. When the kurtosis is small, it means that the uneven shape of the surface is smooth, and when the kurtosis is large, it means that the uneven shape of the surface is sharply sharpened.
- the arithmetic average roughness (Ra) is a kind of index indicating the surface roughness, and is obtained by calculating the average of the absolute values of the height in the reference length.
- the arithmetic average roughness is small, it means that the difference in height of the surface irregularities is small (the undulation is small), and if the arithmetic average roughness is large, the difference in height of the irregularities on the surface Is large (the undulations are large).
- the one surface 1a of the lead frame 1 is formed so that the concavo-convex shape is gentle due to the small kurtosis, and the undulation of the concavo-convex shape is small due to the small arithmetic average roughness.
- a light reflection layer 14 (see FIG. 3) and a connection layer 15 (see FIG. 4) are formed on one surface 1a of the lead frame 1.
- the light reflecting layer 14 is formed on the one surface 1 a of the portion corresponding to the upper surface 3 a of the base 3 in the one surface 1 a and in a region surrounded by the reflector 6.
- the connection layer 15 is formed in a region where the solders 101a and 101b are disposed.
- the connection layer 15 is formed on the one surface 1a of the portion corresponding to the lower surface 3c of the base 3 in the one surface 1a and the portions corresponding to both side surfaces 3b of the base 3 in the one surface 1a. Is formed on the lower one surface 1a.
- the thickness t5 of the light reflecting layer 14 and the thickness t6 of the connection layer 15 are both about 0.5 ⁇ m or more and about 1.5 ⁇ m or less.
- the light reflecting layer 14 is an example of the “plating layer” in the present invention.
- the light reflection layer 14 is made of an Ag plating layer, and has a function of reflecting light irradiated downward (Z2 side) from the LED element 2 toward the upper side (Z1 side), and leads to the Au wires 5a and 5b. It is formed for easy connection with the frame 1.
- the connection layer 15 has a structure in which a Ni plating layer and an Au plating layer (not shown) are sequentially laminated from the lead frame 1 side. This connection layer 15 is formed in order to improve the wettability of the lead frame 1 with respect to the solders 101a and 101b.
- the light reflecting layer 14 and the connection layer 15 are both formed by plating.
- the outer Cu layer 11 made of Cu is disposed on the one surface 1a on the side (outer side) on which the LED element 2 is disposed, thereby comparing with Fe or Fe alloy. Since the outer Cu layer 11 made of Cu having excellent thermal conductivity is disposed on the LED element 2 side, the heat from the LED element 2 is separated from the LED element 2 from the portion of the outer Cu layer 11 near the LED element 2. It is possible to diffuse quickly toward the portion of the outer Cu layer 11 at a certain position.
- the heat of the outer Cu layer 11 can be quickly dissipated to an external heat dissipating member (printed circuit board 102) connected to the outer Cu layer 11 and the outside air, so that the heat dissipating performance near the LED element 2 is improved. Accumulation of heat in the frame 1 can be suppressed. As a result, it is possible to suppress the temperature of the LED element 2 from rising due to the heat accumulated in the lead frame 1, thereby suppressing the brightness of the LED element 2 from decreasing due to the temperature increase of the LED element 2. can do. Moreover, since it can suppress that the LED element 2 is exposed to abnormally high temperature for a long time, the lifetime of the LED element 2 can be achieved.
- the Fe or Fe alloy constituting the Fe layer 12 has a mechanical strength higher than that of the Cu constituting the outer Cu layer 11 and the inner Cu layer 13, and the linear expansion coefficient of the Fe layer 12. by (about 12 ⁇ 10 -6 / K) is smaller than the linear expansion coefficient of the outer Cu layer 11 and the inner Cu layer 13 (about 17 ⁇ 10 -6 / K), compared lead frame 1 and the Fe layer 12
- the outer Cu layer 11 and the Fe layer 12 having a smaller linear expansion coefficient than the outer Cu layer 11 and having a high mechanical strength under high temperature conditions, compared with a case where only Cu having a large linear expansion coefficient (Cu layer) is formed.
- the lead frame 1 Since the lead frame 1 has a multi-layer structure using the above, the thermal expansion of the lead frame 1 can be suppressed and the mechanical strength of the lead frame 1 can be improved. As a result, the lead frame 1 can be prevented from being deformed due to thermal expansion or external force, so that the LED element 2 disposed on the one surface 1a of the lead frame 1 also accompanies the deformation of the lead frame 1. Application of stress can be suppressed. As a result, it is possible to suppress a decrease in luminance of the LED element 2 due to stress applied to the LED element 2 and a shortening of the life of the LED element 2.
- the inner Cu layer 13 having the same thickness t3 as the outer Cu layer 11 and made of the same metal material (Cu) as the outer Cu layer 11 is used as the outer Cu layer 11.
- the Fe layer 12 is sandwiched between them and disposed on the other surface 1b on the base 3 side (inner side) so that the outer Cu layer 11 and the inner side are made of the same metal material (Cu) and have substantially the same thickness.
- the lead frame 1 is composed only of the outer Cu layer 11 and the Fe layer 12 by sandwiching the Fe layer 12 having a smaller linear expansion coefficient than the outer Cu layer 11 and the inner Cu layer 13 with the Cu layer 13, the lead It is possible to effectively suppress deformation of the frame 1 so as to warp either the outer Cu layer 11 side or the Fe layer 12 side.
- the lead frame 1 can be configured so as not to distinguish between the front and the back.
- the one surface 1a on the outer Cu layer 11 side of the lead frame 1 has a kurtosis (Rku) of 10.5 or less and an arithmetic average roughness (Ra) of 0.15 ⁇ m or less. It is formed as follows. Here, when the kurtosis of the one surface 1a is larger than 10.5 and a sharp portion is formed on the one surface 1a, or when the arithmetic average roughness of the one surface 1a is larger than 0.15 ⁇ m, the one surface 1a When the unevenness difference (undulation) is large (rough), the light reflection film 14 is broken when the light reflection film 14 is formed, and there is a high possibility that a plating defect will occur.
- Rku kurtosis
- Ra arithmetic average roughness
- the light irradiated downward (Z2 direction) from the LED element 2 is not sufficiently reflected by the one surface 1a of the lead frame 1, and as a result, The light quantity of LED module 100 will fall.
- the pointed portion of the one surface 1a on which the LED element 2 is disposed Since the undulation of the one surface 1a can be reduced, it is possible to form a high-quality light reflecting layer 14 and connection layer 15 having no defect on the one surface 1a. Thereby, since the light irradiated from the LED element 2 is fully reflected in the one surface 1a of the lead frame 1, it can suppress that the light quantity of the LED module 100 falls.
- the total thickness of the outer Cu layer 11 and the inner Cu layer 13 is about 30% or more of the thickness t1 of the lead frame 1, so that the thermal conductivity is larger than that of the Fe layer 12.
- the heat of the outer Cu layer 11 can be radiated more quickly to an external heat radiating member connected to the outer Cu layer 11 or to the outside air. It is preferable because heat can be effectively suppressed from being accumulated in the lead frame 1 in the vicinity of the LED element 2.
- the total thickness of the outer Cu layer 11 and the inner Cu layer 13 is about 80% or less of the thickness t1 of the lead frame 1, the thickness t4 of the Fe layer 12 can be sufficiently secured.
- the outer Cu layer 11 made of Cu that hardly reflects light is positioned, and the one surface 1a on which the LED element 2 is disposed. Since the light reflection layer 14 is formed thereon, the light from the LED element 2 can be reflected more.
- the thermal conductivity in the plate surface direction (direction orthogonal to the stacking direction) of the lead frame 1 is set to about 150 W / (m ⁇ K) or more, and the thickness direction of the lead frame 1 ( The heat conductivity in the stacking direction) is about 100 W / (mxK) or more, so that the heat from the LED element 2 is not only the outer Cu layer 11 but also the Fe layer 12 and the inner Cu positioned in the plate thickness direction. It can be sufficiently diffused toward the layer 13 and can also be sufficiently diffused toward the Fe layer 12 and the inner Cu layer 13 in the plate surface direction. Thereby, the heat in the vicinity of the LED element 2 can be diffused by the entire lead frame 1, so that the heat can be further prevented from being accumulated in the lead frame 1 in the vicinity of the LED element 2.
- the thermal expansion of the lead frame 1 can be sufficiently suppressed by setting the linear expansion coefficient of the lead frame 1 to about 17 ⁇ 10 ⁇ 6 / K or less.
- the resulting deformation of the lead frame 1 can be sufficiently suppressed. Thereby, it can suppress effectively that the stress accompanying a deformation
- the thermal expansion of the lead frame 1 can be further suppressed and the mechanical strength of the lead frame 1 is improved. be able to.
- the Fe layer 12 when the Fe layer 12 includes at least one of Ni and Cr, and the Fe layer 12 is composed of an Fe alloy in which the total of Ni and Cr is 10% by mass or less, the corrosion resistance of the Fe layer 12 can be improved, and the thermal conductivity of the Fe layer 12 can be suppressed from becoming excessively small.
- the lead frame 1 is bent along the vicinity of the end of the upper surface 3 a of the base 3, both side surfaces 3 b in the X direction, and a part of the lower surface 3 c of the base 3. Since the lead frame 1 can be disposed so as to cover the plate-like base 3, the surface area of the lead frame 1 can be secured larger than when the lead frame 1 is not bent. Thereby, the heat from the LED element 2 can be quickly diffused from the part of the outer Cu layer 11 in the vicinity of the LED element 2 toward the wide part of the outer Cu layer 11 away from the LED element 2 and wide. Since heat can be radiated to the outside air in a range, it is possible to further suppress heat from being accumulated in the lead frame 1 near the LED element 2.
- FIG. 1 a manufacturing process of the LED module 100 according to the first embodiment of the present invention will be described with reference to FIGS. 2, 3, and 5 to 7.
- FIG. 2 a manufacturing process of the LED module 100 according to the first embodiment of the present invention will be described with reference to FIGS. 2, 3, and 5 to 7.
- FIG. 2 a manufacturing process of the LED module 100 according to the first embodiment of the present invention will be described with reference to FIGS. 2, 3, and 5 to 7.
- a pair of Cu plates made of Cu having a predetermined width in the width direction (X direction) and extending in the rolling direction (Y direction) orthogonal to the X direction, and having substantially the same width as the Cu plate in the X direction.
- an Fe plate extending in the Y direction is prepared.
- the Cu plate is made of Cu having a purity of about 99.9% or more.
- the Fe plate is made of Fe alloy containing pure Fe or at least one of Ni and Cr and the total of Ni and Cr being 10% by mass or less. At this time, the Fe plate is prepared so that the thickness thereof is about 20% or more and about 70% or less of the total thickness of the pair of Cu plate and Fe plate.
- rollers 201a and 201b extending in the X direction.
- a roller 201 a having a smooth roller surface is used as the roller 201 a that contacts the one surface 1 a (outer Cu layer 11) of the lead frame 1.
- a roller 201a having a roller surface arithmetic average roughness (Ra) of about 0.05 ⁇ m or less is used.
- the kurtosis (Rku) of the one surface 1a of the lead frame 1 is adjusted to 10.5 or less
- the arithmetic average roughness (Ra) is adjusted to 0.15 ⁇ m or less.
- a lead frame material 200 made of a clad material having a three-layer clad structure in which the outer Cu layer 11, the Fe layer 12, and the inner Cu layer 13 are joined by diffusion annealing the pair of Cu plate and Fe plate. Is formed.
- the thickness t1 of the lead frame material 200 (lead frame 1) is about 0.1 mm to about 1.5 mm
- the reflector 200 is disposed on the one surface 1a of the portion corresponding to the upper surface 3a of the base 3 of the one surface 1a of the lead frame material 200 (lead frame 1) and the reflector.
- a light reflecting layer 14 made of an Ag plating layer is formed in a region surrounded by 6.
- Connection layer 15 in which a Ni plating layer and an Au plating layer (not shown) are sequentially stacked on one lower surface 1a of the portion corresponding to both side surfaces 3b of the base 3.
- the notch part 10a extended in a Y direction is formed in the lead frame material 200 by press work.
- the base 3 and the reflector 6 are formed on the lead frame material 200 by insert molding. Specifically, as shown in FIG. 6, a mixture of alumina (Al 2 O 3 ) and a binder is injected into the mold 202 with the lead frame material 200 disposed in the mold 202 having a predetermined shape. To do. And a binder is removed by baking on about 200 degreeC or more and about 400 degrees C or less high temperature conditions. Thereby, the base 3 and the reflector 6 made of alumina are formed so as to have a shape corresponding to the shape of the mold 202. At this time, since the Fe layer 12 is not annealed under a high temperature condition of about 200 ° C. or more and about 400 ° C. or less, the 0.2% yield strength of the Fe layer 12 is not less than 0.2% yield strength at about 200 ° C. It is maintained at 400 MPa or more. Thereby, it is suppressed that the mechanical strength of the whole lead frame 1 falls.
- the LED element 2 is mounted on the surface of the light reflecting layer 14 formed on the one surface 1 a of the lead frame 1.
- the lead frame 1 and the LED element 2 are bonded together by disposing an adhesive member 4 (see FIG. 2) made of an insulating resin between the light reflecting layer 14 and the LED element 2.
- a pair of electrodes (not shown) formed on the upper surface side of the LED element 2 are connected to one end of the Au wire 5a and one end of the Au wire 5b by ultrasonic welding.
- the X1 side and the X2 side of the one surface 1a of the lead frame 1 are connected to the other end of the Au wire 5a and the other end of the Au wire 5b by ultrasonic welding.
- the lead frame 1 and the Au wires 5a and 5b can be easily connected.
- a sealing resin 7 is disposed in a space formed by the reflector 6 and the lead frame 1 so as to cover the LED element 2 and the Au wires 5a and 5b. Then, the sealing resin 7 is cured under a high temperature condition of about 200 ° C. or more and about 400 ° C. or less. At this time, as described above, since the Fe layer 12 is not annealed under a high temperature condition of about 200 ° C. or higher and about 400 ° C. or lower, the 0.2% proof stress of the Fe layer 12 is 0.2% proof stress or higher at about 200 ° C. And at about 400 MPa or more. Thereby, it is suppressed that the mechanical strength of the whole lead frame 1 falls. Thereby, as shown in FIG. 7, the lead frame material 200 provided with a plurality of portions corresponding to the LED module 100 is formed.
- the lead frame material 200 is cut along the cutting lines 200a and 200b. Then, as shown in FIG. 2, the lead frame 1 positioned on the X1 side of the cutting line 200a is bent along the side surface 3b and the lower surface 3c on the X1 side of the base 3 on the X1 side, and the cutting line 200a.
- the lead frame 1 located on the X2 side of the base 3 is bent along the side surface 3b and the lower surface 3c on the X2 side of the base 3. Thereby, the notch part 10b extended in a Y direction is formed, and the some LED module 100 is formed.
- the LED module 100 is connected to the printed circuit board 102 on which the Cu wirings 102a and 102b are formed so that the solders 101a and 101b are positioned on the connection layer 15 formed on the one surface 1a of the lead frame 1.
- the 0.2% proof stress of the Fe layer 12 is configured to be about 400 MPa or more under a high temperature condition of about 200 ° C. or more and about 400 ° C. or less.
- the Fe layer 12 is heat-treated under a high temperature condition of about 200 ° C. or more and about 400 ° C. or less, after the manufacturing process formed by the base 3 and the reflector 6 and after the manufacturing process for curing the sealing resin 7. Since the 0.2% proof stress is maintained at about 400 MPa or more, the mechanical strength of the lead frame 1 can be prevented from being lowered. Thereby, it can suppress that manufacture of the LED module 100 becomes difficult resulting from it being easy to break the lead frame 1 with which mechanical strength fell at the time of handling.
- the outer layer 311 made of Ag or Al is arranged on one surface 301a of the lead frame 301, and the other surface 301b is made of Ag or Al.
- a case where the inner layer 313 is arranged will be described.
- the LED module 300 is an example of the “light emitting module” in the present invention
- the lead frame 301 is an example of the “light emitting element substrate” in the present invention.
- the outer layer 311 and the inner layer 313 are examples of the “first layer” and the “third layer” in the present invention, respectively.
- the lead frame 301 includes an outer layer 311 made of Ag or Al, an Fe layer 12, and an inner layer made of the same metal as the outer layer 311.
- 313 is made of a clad material (see FIG. 9) having a three-layer clad structure that is roll-bonded to each other.
- the inner layer 313 is disposed on the one surface 301a on the side (outer side) on which the LED element 2 is disposed, and the inner layer 313 is disposed on the other surface 301b on the base 3 side (inner side). Yes.
- the thickness t2 of the outer layer 311 and the thickness t3 of the inner layer 313 are configured to be substantially the same thickness.
- the thickness t2 of the outer layer 311 and the thickness t3 of the inner layer 313 are both about 15% or more and about 40% or less of the thickness t1 of the lead frame 301, and the total of the outer layer 311 and the inner layer 313.
- the thermal conductivity of the outer layer 311 and the inner layer 313 is about 430 W / (m ⁇ K). Further, when both the outer layer 311 and the inner layer 313 are made of Al, the thermal conductivity of the outer layer 311 and the inner layer 313 is about 240 W / (m ⁇ K). That is, the thermal conductivity of the outer layer 311 and the inner layer 313 (approximately 430 W / (m ⁇ K) (Ag) in both cases where the outer layer 311 and the inner layer 313 are both made of Ag and both are made of Al.
- both the outer layer 311 and the inner layer 313 are made of Ag, the coefficient of linear expansion of the outer layer 311 and the inner layer 313 is about 19 ⁇ 10 ⁇ 6 / K.
- the coefficient of linear expansion of the outer layer 311 and the inner layer 313 is about 23.5 ⁇ 10 ⁇ 6 / K.
- the linear expansion coefficients of the outer layer 311 and the inner layer 313 are larger than the linear expansion coefficient of the Fe layer 12 (about 12 ⁇ 10 ⁇ 6 / K).
- Fe or Fe alloy constituting the Fe layer 12 has higher mechanical strength than Ag or Al constituting the outer layer 311 and the inner layer 313.
- the outer layer 311 made of Ag or Al of the lead frame 301 has a property of easily reflecting light. Therefore, unlike the first embodiment, one surface of the lead frame 301 is provided. A light reflecting layer is not formed on 301a. That is, the LED element 2 is directly disposed on the one surface 301 a of the lead frame 301 via the adhesive member 4. Thereby, the manufacturing process for forming the light reflecting layer can be omitted.
- the one surface 301a of the outer layer 311 of the lead frame 301 has a kurtosis (Rku) as an index indicating the surface roughness of 10.5 or less and an arithmetic average roughness (Ra) of 0 over the entire surface. .15 ⁇ m or less.
- the other structure of 2nd Embodiment of this invention is the same as that of the said 1st Embodiment.
- the manufacturing process of the LED module 300 of the second embodiment is the same as that described above except that a pair of Ag plates or a pair of Al plates is used instead of the pair of Cu plates and a light reflecting layer is not formed. This is the same as in the first embodiment.
- the outer layer 311 made of Ag or Al is disposed on the one surface 301a that is the side (outer side) on which the LED element 2 is disposed, so that heat from the LED element 2 is generated. Since it can be rapidly diffused from the portion of the outer layer 311 near the LED element 2 toward the portion of the outer layer 311 far from the LED element 2, heat is accumulated in the lead frame 301 near the LED element 2. Can be suppressed. As a result, it is possible to suppress the temperature of the LED element 2 from rising due to the heat accumulated in the lead frame 301, and thus it is possible to suppress the brightness of the LED element 2 from decreasing due to the temperature increase of the LED element 2. In addition, the life of the LED element 2 can be extended.
- the Fe or Fe alloy constituting the Fe layer 12 has a mechanical strength greater than that of Ag or Al constituting the outer layer 311 and the inner layer 313, and the linear expansion coefficient of the Fe layer 12. (About 12 ⁇ 10 ⁇ 6 / K) from the linear expansion coefficients (about 19 ⁇ 10 ⁇ 6 / K (Ag) and about 23.5 ⁇ 10 ⁇ 6 / K (Al)) of the outer layer 311 and the inner layer 313. Since the lead frame 301 can be prevented from being deformed due to thermal expansion or external force, the LED element 2 disposed on the one surface 301a of the lead frame 301 is also deformed. It can suppress that the stress accompanying is applied. As a result, it is possible to suppress a decrease in luminance of the LED element 2 due to stress applied to the LED element 2 and a shortening of the life of the LED element 2.
- the inner layer 313 having the same thickness t3 as the outer layer 311 and made of the same metal material (Ag or Al) as the outer layer 311 is disposed between the outer layer 311 and the inner layer 313.
- the lead frame 301 is deformed so as to warp either the outer layer 311 side or the Fe layer 12 side by placing the Fe layer 12 on the other surface 301b on the base 3 side (inner side). Can be effectively suppressed. Thereby, it can suppress that the stress accompanying a deformation
- the entire surface of the one surface 301a of the outer layer 311 of the lead frame 301 has a kurtosis (Rku) of 10.5 or less and an arithmetic average roughness (Ra) of 0.15 ⁇ m.
- Rku kurtosis
- Ra arithmetic average roughness
- Examples 1-1 to 1-9 corresponding to the lead frame 1 of the first embodiment, an outer Cu layer 11, an Fe layer 12, and an inner Cu layer 13 are laminated in the plate thickness direction.
- the thickness t2 of the outer Cu layer 11 and the thickness t3 of the inner Cu layer 13 are the thickness t1 of the lead frame 1 (see FIG. 3). 3)), 5%, 10%, 15%, 20%, 25%, 30%, 35%, 40% and 45%.
- the ratio of the thickness occupied by Cu is 10%, 20%, 30%, 40%, 50%, 60%, 70%, 80%, respectively. And 90% modeling. Therefore, in the lead frames 1 of Examples 1-1 to 1-9, the thickness t4 (see FIG. 3) of the Fe layer 12 is 90%, 80%, 70%, and 60% of the thickness t1 of the lead frame 1, respectively. , 50%, 40%, 30%, 20% and 10%.
- Comparative Example 1-1 with respect to Examples 1-1 to 1-9, a lead frame made only of Fe (lead frame containing no Cu) was assumed.
- Comparative Example 1-2 a lead frame made only of Cu (a lead frame containing no Fe) was assumed.
- Examples 2-1 to 2-9 corresponding to the lead frame 301 of the second embodiment, an outer layer 311 made of Ag, an Fe layer 12 and an inner layer 313 made of Ag were laminated in the plate thickness direction.
- a lead frame 301 made of a clad material having a three-layer structure joined in a state is assumed.
- the thickness t2 of the outer layer 311 and the thickness t3 (see FIG. 9) of the inner layer 313 made of Ag are the thickness t1 of the lead frame 301 (see FIG. 9).
- the case of 5%, 10%, 15%, 20%, 25%, 30%, 35%, 40% and 45% of FIG. 9) was assumed.
- the ratio of the thickness occupied by Ag in the lead frames 301 of Examples 2-1 to 2-9 is 10%, 20%, 30%, 40%, 50%, 60%, 70%, and 80%, respectively. And 90% modeling.
- Comparative Example 2-1 with respect to Examples 2-1 to 2-9 a lead frame made only of Fe (lead frame containing no Ag) was assumed.
- the comparative example 2-1 is the same as the comparative example 1-1.
- Comparative Example 2-2 a lead frame made only of Ag (a lead frame containing no Fe) was assumed.
- Examples 3-1 to 3-10 corresponding to the lead frame 301 of the second embodiment, an outer layer 311 made of Al, an Fe layer 12 and an inner layer 313 made of Al were laminated in the thickness direction.
- a lead frame 301 made of a clad material having a three-layer structure joined in a state is assumed.
- the thickness t2 of the outer layer 311 and the thickness t3 (see FIG. 9) of the inner layer 313 made of Al are the thickness t1 ( 5%, 10%, 15%, 20%, 22.5%, 25%, 30%, 35%, 40%, and 45%.
- Comparative Example 3-1 compared with Examples 3-1 to 3-10, a lead frame made of only Fe (lead frame containing no Al) was assumed. Comparative Example 3-1 is the same as Comparative Examples 1-1 and 2-1. In addition, as Comparative Example 3-2, a lead frame made only of Al (lead frame containing no Fe) was assumed.
- the thermal conductivity in the plate surface direction is 150 W / (m ⁇ K).
- the thermal conductivity in the plate thickness direction was 100 W / (m ⁇ K) or more. From this result, it is considered that the heat in the vicinity of the LED element can be sufficiently diffused throughout the lead frame by setting the ratio of the thickness occupied by Cu to 30% or more.
- the ratio of the thickness occupied by Cu in the lead frame is 90% or less (Examples 1-1 to 1-9 and Comparative Example 1-1), the linear expansion coefficient should be less than 17 ⁇ 10 ⁇ 6 / K. I understood.
- the thermal expansion of the lead frame can be sufficiently suppressed by setting the ratio of the thickness occupied by Cu to 90% or less, so that the deformation of the lead frame due to the thermal expansion is sufficiently suppressed. It is considered possible to do.
- the thermal conductivity in the plate surface direction is 150 W / (m ⁇ K).
- the thermal conductivity in the plate thickness direction was 100 W / (m ⁇ K) or more. From this result, it is considered that the heat in the vicinity of the LED element can be sufficiently diffused throughout the lead frame by setting the ratio of the thickness occupied by Ag to 30% or more.
- the ratio of the thickness occupied by Ag in the lead frame is 80% or less (Examples 2-1 to 2-8 and Comparative Example 2-1), the linear expansion coefficient is 17 ⁇ 10 ⁇ 6 / K or less. I understood.
- the thermal expansion of the lead frame can be sufficiently suppressed by setting the ratio of the thickness occupied by Ag to 80% or less, so that the deformation of the lead frame due to the thermal expansion is sufficiently suppressed. It is considered possible to do.
- the thermal conductivity in the plate surface direction is 150 W / (m ⁇ K).
- the thermal conductivity in the plate thickness direction was 100 W / (m ⁇ K) or more. From this result, it is considered that the heat in the vicinity of the LED element can be sufficiently diffused throughout the lead frame by setting the ratio of the thickness occupied by Al to 45% or more.
- the thermal conductivity in the plate surface direction is less than 150 W / (m ⁇ K) (126.1 W / (m ⁇ K).
- the thermal conductivity in the thickness direction is less than 100 W / (m ⁇ K) (97.9 W / (m ⁇ K)) and the ratio of the thickness occupied by Al is 40% (Example 3- 4)
- the thermal conductivity in the plate surface direction is less than 150 W / (m ⁇ K) (142.1 W / (m ⁇ K))
- Al has a property close to Cu and Ag. It is considered that the heat in the vicinity of the LED element can be sufficiently diffused to the entire lead frame to some extent.
- the linear expansion coefficient is 17 ⁇ 10 ⁇ 6 / K or less.
- the thermal expansion of the lead frame can be sufficiently suppressed by setting the ratio of the thickness occupied by Al to 60% or less, so that the deformation of the lead frame due to the thermal expansion is sufficiently suppressed. It is considered possible to do.
- the ratio of the thickness of Al in the lead frame is 70% or more and 80% or less (Examples 3-8 and 3-9), the linear expansion coefficient is larger than 17 ⁇ 10 ⁇ 6 / K (Examples).
- 3-8 (17.1 ⁇ 10 ⁇ 6 / K) and Example 3-9 (18.6 ⁇ 10 ⁇ 6 / K) Al has properties close to that of Cu and Ag. It is considered that the thermal expansion of the lead frame can be suppressed.
- the roller 201a (see FIG. 5) that contacts one surface 1a when the lead frame (lead frame material) of Comparative Example 1-3 is manufactured, the arithmetic average roughness (Ra) of the roller surface is 0. It rolled using the roller 201a which has a value of 19 micrometers or more and 0.30 micrometers or less. That is, in Comparative Example 1-3, the roller 201a having a large arithmetic average roughness on the roller surface was used while the arithmetic average roughness on the roller surface was not constant.
- Example 1-10 rolling was performed using a roller 201a having an arithmetic average roughness of the roller surface of 0.05 ⁇ m. That is, in Example 1-10, the roller 201a having a smaller arithmetic average roughness on the roller surface than that of Comparative Example 1-3 was used.
- Example 1-11 rolling was performed using a roller 201a having an arithmetic average roughness of the roller surface of 0.025 ⁇ m. That is, in Example 1-11, the roller 201a having a smaller arithmetic average roughness on the roller surface was used compared to Comparative Example 1-3 and Example 1-10.
- Comparative Example 1-4 rolling was performed using a roller 201a having an arithmetic average roughness of the roller surface of 0.025 ⁇ m, and one surface 1a (see FIG. 5) of the lead frame after rolling was dry lapped. Polished.
- the surface roughness of the one surface 1a of the lead frame was measured using a predetermined measuring device. And the arithmetic mean roughness (Ra) in a rolling direction (Y direction) and the width direction (X direction) and kurtosis (Rku) were each calculated using the obtained measurement result.
- a plating solution is applied to one surface 1a on the side in contact with the roller 201a with respect to each of the lead frames of Example 1-10, Example 1-11, Comparative Example 1-3, and Comparative Example 1-4.
- a plating layer corresponding to the light reflection layer 14 made of an Ag plating layer was formed.
- the presence or absence of the defect of a plating layer was judged by observing the state of a plating layer.
- Example 1-10 Example 1-11 and Comparative Example 1-4 using a roller 201a having a roller surface arithmetic mean roughness (Ra) of 0.05 ⁇ m or less, the arithmetic mean roughness It was found that the thickness (Ra) can be 0.15 ⁇ m or less.
- Examples 1-10 and Example 1 except that the roller 201a having an arithmetic average roughness (Ra) of the roller surface of 0.025 ⁇ m or less is used and polishing is performed by dry lapping (Comparative Example 1-4). 11 and Comparative Example 1-3, it was found that kurtosis (Rku) could be 10.5 or less.
- Example 1-10 and 1-11 no defects in the plating layer were observed.
- the arithmetic average roughness (Ra) of the roller surface is 0.05 ⁇ m or less, which is sufficiently small, so that the lead frame 1 (the surface of the roller 201a is in contact)
- the one surface 1a of the lead frame material 200 is considered to have an arithmetic average roughness of 0.15 ⁇ m or less and a kurtosis of 10.5 or less.
- the one surface 1a can be formed so that the uneven shape is gentle and the undulations are small, and it is considered that no defect occurred in the plating layer formed on the one surface 1a.
- Comparative Examples 1-3 and 1-4 defects in the plating layer were observed. This is because, in Comparative Example 1-3, the arithmetic average roughness (Ra) of the roller surface is 0.19 ⁇ m or more and 0.30 ⁇ m or less, so that the surface of the roller 201a is in contact with the lead frame (lead frame material). On the other hand, it is considered that the unevenness of the concavo-convex shape of the one surface 1a is increased according to the surface of the roller 201a. As a result, it is considered that a defect occurred in the plating layer formed on the one surface 1a due to the uneven shape having large undulations.
- the arithmetic average roughness (Ra) of the roller surface is 0.19 ⁇ m or more and 0.30 ⁇ m or less, so that the surface of the roller 201a is in contact with the lead frame (lead frame material).
- the unevenness of the concavo-convex shape of the one surface 1a is increased according to the surface of the roller
- the arithmetic average roughness of the one surface 1a can be further reduced by rolling with the roller 201a and then polishing by dry lapping, but the uneven shape of the one surface 1a tends to be sharp. It is thought that it has become. As a result, it is considered that a defect occurred in the plating layer formed on the one surface 1a due to the sharp uneven shape.
- the lead frame 1 As a result, as in Examples 1-10 and 1-11, by rolling using the roller 201a having an arithmetic average roughness of the roller surface of 0.05 ⁇ m or less and not polishing by dry lapping, the lead frame 1 On the other hand, it was found that the arithmetic average roughness of the surface 1a can be 0.15 ⁇ m or less and the kurtosis can be 10.5 or less. Furthermore, by forming the one surface 1a having an arithmetic average roughness of 0.15 ⁇ m or less and a kurtosis of 10.5 or less, it is possible to form a high-quality plated layer having no defects on the one surface 1a. It turned out to be.
- the lead frame 1 is manufactured by the manufacturing method as in Examples 1-10 and 1-11, the light irradiated from the laser element 2 is sufficiently reflected on the one surface 1a of the lead frame 1. As a result, it is considered possible to suppress a decrease in the light amount of the LED module 100.
- the lead frame 1 with the Fe layer 12 made of Fe that does not decrease the 0.2% proof stress even under high temperature conditions of 200 ° C. or higher and 400 ° C. or lower, It has also been found that it is possible to suppress a decrease in the mechanical strength of the lead frame 1.
- the lead frame 1 (301) is formed near the end of the upper surface 3a of the base 3, the both side surfaces 3b in the X direction, and a part of the lower surface 3c of the base 3.
- the present invention is not limited to this.
- the lead frame 401 of the LED module 400 does not cover the lower surface 3 c of the base 3 and moves away from the base 3. It may be bent. Further, the lead frame may be disposed only on the upper surface of the base without being bent.
- the LED module 400 is an example of the “light emitting module” in the present invention
- the lead frame 401 is an example of the “light emitting element substrate” in the present invention.
- the present invention is not limited to this.
- the thick plate corresponding to the upper surface 3 a of the base 3 on which the LED element 2 is arranged in the lead frame 501 of the LED module 500 You may make the thickness of the part 501c larger than the thickness of another area
- the lead frame 501 in the thick plate portion 501c has a three-layer structure (see FIG. 3) of the outer Cu layer 11, the Fe layer 12, and the inner Cu layer 13.
- the lead frame 501 in the thin plate portion 501d may be made of the same material as that of the thick plate portion 501c and may have a three-layer structure of the outer Cu layer 11, the Fe layer 12, and the inner Cu layer 13. Further, the lead frame 501 in the thin plate portion 501d may be only the inner Cu layer 13 or may have a two-layer structure of the Fe layer 12 and the inner Cu layer 13.
- the LED module 500 is an example of the “light emitting module” in the present invention
- the lead frame 501 is an example of the “light emitting element substrate” in the present invention.
- the outer Cu layer 11 and the inner Cu layer 13 are made of Cu having a purity of 99.9% or more.
- the outer Cu layer 11 and the inner Cu layer 13 are made of Cu-2.
- C19400 (CDA standard) made of 30Fe-0.10Zn-0.03P, Cu-0.1Fe-0.03P, Cu-0.2Zr, and other Cu alloys having a Cu purity of 99.9% or less You may comprise as follows. This facilitates processing such as press processing on the lead frame, and further improves the mechanical strength of the lead frame under high temperature conditions.
- the outer layer 311 and the inner layer 313 are made of Ag or Al.
- the outer layer 311 and the inner layer 313 are Ag alloys containing elements other than Ag and Ag, or other than Al and Al. You may comprise so that it may consist of Al alloy containing these elements. This facilitates processing such as press processing on the lead frame, and further improves the mechanical strength of the lead frame under high temperature conditions.
- the outer Cu layer 11 (first layer) and the inner Cu layer 13 (third layer) are both made of Cu.
- the outer layer 311 (first layer) is shown.
- the combination of the first layer and the third layer may be Cu and Ag, Cu and Al, Ag and Cu, Ag and Al, Al and Cu, Al and Ag, respectively.
- Cu may be a Cu alloy
- Ag may be an Ag alloy
- Al may be an Al alloy.
- the 0.2% proof stress of the Fe layer 12 is about 400 MPa or more under a high temperature condition of about 200 ° C. or more and about 400 ° C. or less.
- the invention is not limited to this.
- the 0.2% yield strength of the Fe layer 12 may be about 250 MPa or more under a high temperature condition of about 200 ° C. or more and about 400 ° C. or less.
- the 0.2% proof stress of the Fe layer 12 is preferably about 400 MPa or more under a high temperature condition of about 200 ° C. or more and about 400 ° C. or less.
- the one surface 1a on the outer Cu layer 11 side of the lead frame 1 has a kurtosis (Rku) of 10.5 or less over the entire surface, and an arithmetic average roughness (Ra).
- Rku kurtosis
- Ra arithmetic average roughness
- the example formed so that it may become 0.15 micrometer or less was shown, this invention is not limited to this.
- at least the region where the light reflecting layer 14 is formed on one surface 1a of the lead frame 1 is formed so that the kurtosis is 10.5 or less and the arithmetic average roughness is 0.15 ⁇ m or less. May be.
- the light reflecting layer 14 made of the Ag plating layer is formed by contacting with the plating solution containing Ag is shown, but the present invention is not limited to this.
- the light reflecting layer 14 may be formed by applying an Ag paste on the one surface 1 a of the lead frame 1.
- the one surface 1a has a kurtosis of 10.5 or less and an arithmetic average roughness of 0.15 ⁇ m or less.
- the light reflecting layer 14 may be constituted by a plated layer of a metal material other than Ag such as an Al plated layer.
- the base 3 and the reflector 6 is an example made of alumina (Al 2 O 3), the present invention is not limited thereto.
- the lead frame 1 (301) is used in the LED module 100 (300) having the LED element 2 has been described.
- the present invention is not limited to this.
- the lead frame 1 (301) may be used for a laser element module that emits laser light.
- Lead frame (light emitting element substrate) 1a, 301a One surface 1b, 301b
Abstract
Description
まず、図1~図4を参照して、本発明の第1実施形態によるLEDモジュール100の構造について説明する。なお、LEDモジュール100は、本発明の「発光モジュール」の一例である。 (First embodiment)
First, the structure of the
次に、図8および図9を参照して、本発明の第2実施形態について説明する。この第2実施形態では、上記第1実施形態とは異なり、LEDモジュール300において、リードフレーム301の一方表面301aにAgまたはAlからなる外側層311を配置するとともに、他方表面301bにAgまたはAlからなる内側層313を配置した場合について説明する。なお、LEDモジュール300は、本発明の「発光モジュール」の一例であり、リードフレーム301は、本発明の「発光素子用基板」の一例である。また、外側層311および内側層313は、それぞれ、本発明の「第1層」および「第3層」の一例である。 (Second Embodiment)
Next, a second embodiment of the present invention will be described with reference to FIGS. In the second embodiment, unlike the first embodiment, in the
次に、図3、図5および図9~図18を参照して、本発明の効果を確認するために行った板面方向の熱伝導率、板厚方向の熱伝導率および線膨張係数のシミュレーションと、表面粗さの確認実験と、0.2%耐力の確認実験について説明する。 [Example]
Next, referring to FIG. 3, FIG. 5 and FIG. 9 to FIG. 18, the thermal conductivity in the plate surface direction, the thermal conductivity in the plate thickness direction, and the coefficient of linear expansion performed to confirm the effect of the present invention. Simulation, confirmation experiment of surface roughness, and confirmation experiment of 0.2% proof stress will be described.
以下に説明するシミュレーションでは、上記第1実施形態のリードフレーム1に対応する実施例1-1~1-9として、外側Cu層11、Fe層12および内側Cu層13が板厚方向に積層された状態で接合された、3層構造のクラッド材からなるリードフレーム1を想定した。ここで、実施例1-1~1-9のリードフレーム1として、それぞれ、外側Cu層11の厚みt2および内側Cu層13の厚みt3(図3参照)が、リードフレーム1の厚みt1(図3参照)の5%、10%、15%、20%、25%、30%、35%、40%および45%である場合を想定した。つまり、実施例1-1~1-9のリードフレーム1として、Cuが占める厚みの比率が、それぞれ、10%、20%、30%、40%、50%、60%、70%、80%および90%であるようなモデル化を行った。したがって、実施例1-1~1-9のリードフレーム1では、Fe層12の厚みt4(図3参照)は、それぞれ、リードフレーム1の厚みt1の90%、80%、70%、60%、50%、40%、30%、20%および10%になる。 (simulation)
In the simulation described below, as Examples 1-1 to 1-9 corresponding to the
以下に説明する表面粗さの確認実験では、上記第1実施形態に対応する実施例1-10および1-11のリードフレーム1を作製するとともに、実施例1-10および1-11に対する比較例として、比較例1-3および1-4のリードフレームを作製した。具体的には、実施例1-10、1-11、比較例1-3および1-4のリードフレームとして、外側Cu層11の厚みt2、Fe層12の厚みt4および内側Cu層13の厚みt3(図3参照)が、それぞれ、リードフレームの厚みt1(図3参照)の20%、60%および20%である板状のリードフレームを作製した。 (Surface roughness confirmation experiment)
In the surface roughness confirmation experiment described below, lead frames 1 of Examples 1-10 and 1-11 corresponding to the first embodiment are manufactured, and a comparative example with respect to Examples 1-10 and 1-11 As a result, lead frames of Comparative Examples 1-3 and 1-4 were produced. Specifically, as the lead frames of Examples 1-10 and 1-11 and Comparative Examples 1-3 and 1-4, the thickness t2 of the
以下に説明する0.2%耐力の確認実験では、25℃(室温)、200℃、300℃、400℃および600℃の温度条件下で、Cuからなる試験体およびFeからなる試験体に対して、それぞれ、引張試験を行った。その際、試験体(CuとFe)が通常状態から0.2%伸びた際の試験体に加えられている応力を測定することによって、0.2%耐力(降伏強度)を測定した。 (Confirmation test of 0.2% proof stress)
In the confirmation experiment of 0.2% proof stress described below, the specimen made of Cu and the specimen made of Fe were tested at 25 ° C. (room temperature), 200 ° C., 300 ° C., 400 ° C. and 600 ° C. Each was subjected to a tensile test. At that time, 0.2% proof stress (yield strength) was measured by measuring the stress applied to the test body when the test body (Cu and Fe) was extended 0.2% from the normal state.
1a、301a 一方表面
1b、301b 他方表面
2 LED素子(発光素子)
3 基台
3a 上面(基台の表面)
3b 側面(基台の表面)
3c 下面(基台の表面)
11 外側Cu層(第1層)
12 Fe層(第2層)
13 内側Cu層(第3層)
14 光反射層(メッキ層)
100、300、400、500 LEDモジュール(発光モジュール)
311 外側層(第1層)
313 内側層(第3層) 1, 301, 401, 501 Lead frame (light emitting element substrate)
1a, 301a One
3
3b Side (base surface)
3c Bottom surface (base surface)
11 Outer Cu layer (first layer)
12 Fe layer (second layer)
13 Inner Cu layer (third layer)
14 Light reflection layer (plating layer)
100, 300, 400, 500 LED module (light emitting module)
311 Outer layer (first layer)
313 Inner layer (third layer)
Claims (12)
- 発光素子(2)が配置される一方表面(1a)に配置され、Cu、Ag、Al、Cu合金、Ag合金またはAl合金のいずれか1つからなる第1層(11)と、
FeまたはFe合金からなる第2層(12)と、
前記第1層との間に前記第2層を挟み込むとともに、他方表面(1b)に配置され、Cu、Ag、Al、Cu合金、Ag合金またはAl合金のいずれか1つからなる第3層(13)とを備え、
前記一方表面は、表面粗さを示す指標としてのクルトシス(Rku)が10.5以下になるとともに、表面粗さを示す指標としての算術平均粗さ(Ra)が0.15μm以下になるように形成されている、発光素子用基板(1)。 A first layer (11) disposed on one surface (1a) on which the light emitting element (2) is disposed and made of any one of Cu, Ag, Al, Cu alloy, Ag alloy or Al alloy;
A second layer (12) made of Fe or Fe alloy;
The second layer is sandwiched between the first layer and the third layer which is disposed on the other surface (1b) and made of any one of Cu, Ag, Al, Cu alloy, Ag alloy or Al alloy ( 13)
The one surface has a kurtosis (Rku) as an index indicating the surface roughness of 10.5 or less and an arithmetic average roughness (Ra) as an index of the surface roughness of 0.15 μm or less. The formed light emitting element substrate (1). - 前記第3層は、前記第1層と同一の金属材料で構成している、請求項1に記載の発光素子用基板。 The light emitting element substrate according to claim 1, wherein the third layer is made of the same metal material as the first layer.
- 200℃以上400℃以下の温度条件下において、前記第2層の0.2%耐力は、250MPa以上であるように構成されている、請求項1に記載の発光素子用基板。 The light emitting element substrate according to claim 1, wherein the second layer has a 0.2% yield strength of 250 MPa or more under a temperature condition of 200 ° C or more and 400 ° C or less.
- 前記第1層は、CuまたはCu合金からなり、
前記一方表面上には、前記発光素子からの光を反射可能な光反射層を構成するメッキ層(14)が形成されている、請求項1に記載の発光素子用基板。 The first layer is made of Cu or Cu alloy,
The light emitting element substrate according to claim 1, wherein a plating layer (14) constituting a light reflecting layer capable of reflecting light from the light emitting element is formed on the one surface. - 前記第3層は、前記第1層と同一の金属材料からなり、
前記第1層と前記第3層とは、同一の厚みを有する、請求項1に記載の発光素子用基板。 The third layer is made of the same metal material as the first layer,
The light emitting element substrate according to claim 1, wherein the first layer and the third layer have the same thickness. - 前記第1層、前記第2層および前記第3層によって板状の基板本体が構成されており、
前記板状の基板本体は、板面方向の熱伝導率が150W/(m×K)以上になるとともに、板厚方向の熱伝導率が100W/(m×K)以上になるように構成されている、請求項1に記載の発光素子用基板。 A plate-shaped substrate body is constituted by the first layer, the second layer, and the third layer,
The plate-shaped substrate body has a thermal conductivity in the plate surface direction of 150 W / (m × K) or higher and a thermal conductivity in the plate thickness direction of 100 W / (m × K) or higher. The substrate for a light-emitting element according to claim 1. - 前記第1層、前記第2層および前記第3層によって板状の基板本体が構成されており、
前記板状の基板本体は、線膨張係数が17×10-6/K以下になるように構成されている、請求項1に記載の発光素子用基板。 A plate-shaped substrate body is constituted by the first layer, the second layer, and the third layer,
2. The light emitting element substrate according to claim 1, wherein the plate-like substrate body is configured to have a linear expansion coefficient of 17 × 10 −6 / K or less. - 前記第1層および前記第3層は、共にCuからなり、
前記第2層は、Feからなる、請求項1に記載の発光素子用基板。 The first layer and the third layer are both made of Cu,
The light emitting element substrate according to claim 1, wherein the second layer is made of Fe. - 前記第2層は、Fe合金からなり、
前記第2層を構成するFe合金は、NiおよびCrの少なくともいずれか一方を含有するとともに、NiとCrとの合計が10質量%以下であるFe合金からなる、請求項1に記載の発光素子用基板。 The second layer is made of an Fe alloy,
2. The light emitting device according to claim 1, wherein the Fe alloy constituting the second layer is made of an Fe alloy containing at least one of Ni and Cr and a total of Ni and Cr of 10% by mass or less. Substrate. - 前記第1層、前記第2層および前記第3層によって板状の基板本体が構成されており、
前記板状の基板本体は、前記他方表面側から前記板状の基板本体を支持する板状の基台の表面を覆うように折り曲げられている、請求項1に記載の発光素子用基板。 A plate-shaped substrate body is constituted by the first layer, the second layer, and the third layer,
The light emitting element substrate according to claim 1, wherein the plate-like substrate body is bent so as to cover a surface of a plate-like base supporting the plate-like substrate body from the other surface side. - 発光素子(2)と、
前記発光素子が配置される一方表面(1a)に配置され、Cu、Ag、Al、Cu合金、Ag合金またはAl合金のいずれか1つからなる第1層(11)と、FeまたはFe合金からなる第2層(12)と、前記第1層との間に前記第2層を挟み込むとともに、他方表面(1b)に配置され、Cu、Ag、Al、Cu合金、Ag合金またはAl合金のいずれか1つからなる第3層(13)とを含む発光素子用基板(1)とを備え、
前記発光素子用基板の前記一方表面は、表面粗さを示す指標としてのクルトシス(Rku)が10.5以下になるとともに、表面粗さを示す指標としての算術平均粗さ(Ra)が0.15μm以下になるように形成されている、発光モジュール(100)。 A light emitting element (2);
A first layer (11) disposed on one surface (1a) on which the light emitting element is disposed, and made of any one of Cu, Ag, Al, Cu alloy, Ag alloy or Al alloy; and Fe or Fe alloy The second layer is sandwiched between the second layer (12) and the first layer, and disposed on the other surface (1b), and any of Cu, Ag, Al, Cu alloy, Ag alloy, or Al alloy A light emitting element substrate (1) including a third layer (13) composed of one of the above,
The one surface of the substrate for a light emitting element has a kurtosis (Rku) as an index indicating the surface roughness of 10.5 or less and an arithmetic average roughness (Ra) as an index indicating the surface roughness of 0. A light emitting module (100) formed to be 15 μm or less. - 発光素子(2)が配置される一方表面(1a)に配置され、Cu、Ag、Al、Cu合金、Ag合金またはAl合金のいずれか1つからなる第1層(11)と、FeまたはFe合金からなる第2層(12)と、前記第1層との間に前記第2層を挟み込むとともに、他方表面(1b)に配置され、Cu、Ag、Al、Cu合金、Ag合金またはAl合金のいずれか1つからなる第3層(13)とを含み、前記一方表面が、表面粗さを示す指標としてのクルトシス(Rku)が10.5以下になるとともに、表面粗さを示す指標としての算術平均粗さ(Ra)が0.15μm以下になるように形成された発光素子用基板(1)を形成する工程と、
200℃以上400℃以下の温度条件下で熱処理を行う工程と、
前記発光素子用基板の前記一方表面上に前記発光素子を配置する工程とを備える、発光モジュール(100)の製造方法。 A first layer (11) arranged on one surface (1a) on which the light emitting element (2) is arranged and made of any one of Cu, Ag, Al, Cu alloy, Ag alloy or Al alloy, and Fe or Fe Cu, Ag, Al, Cu alloy, Ag alloy or Al alloy is disposed on the other surface (1b) while sandwiching the second layer between the second layer (12) made of an alloy and the first layer. A third layer (13) made of any one of the above, and the one surface has an kurtosis (Rku) as an index indicating the surface roughness of 10.5 or less and an index indicating the surface roughness A step of forming a light emitting element substrate (1) formed so that the arithmetic average roughness (Ra) is 0.15 μm or less;
Performing a heat treatment under a temperature condition of 200 ° C. or higher and 400 ° C. or lower;
A step of disposing the light emitting element on the one surface of the light emitting element substrate.
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Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2015111621A (en) * | 2013-12-06 | 2015-06-18 | 株式会社Neomaxマテリアル | Semiconductor element formation substrate, and method of manufacturing the same |
WO2018198982A1 (en) * | 2017-04-27 | 2018-11-01 | 京セラ株式会社 | Circuit board and light-emitting device provided with same |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001024228A (en) * | 1999-07-06 | 2001-01-26 | Nichia Chem Ind Ltd | Light emitting device |
JP2002280616A (en) * | 2001-03-16 | 2002-09-27 | Nichia Chem Ind Ltd | Package mold and light emitting device using the same |
JP2008127606A (en) * | 2006-11-17 | 2008-06-05 | Kobe Steel Ltd | High-strength copper alloy sheet having oxide film superior in adhesiveness |
JP2011187586A (en) * | 2010-03-05 | 2011-09-22 | Seiko Instruments Inc | Light emitting device and method of manufacturing the same |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0290663A (en) * | 1988-09-28 | 1990-03-30 | Hitachi Cable Ltd | Lead frame |
JPH06224346A (en) * | 1993-01-23 | 1994-08-12 | Toppan Printing Co Ltd | Etching method |
JPH1041423A (en) * | 1996-07-22 | 1998-02-13 | Sony Corp | Manufacture of semiconductor package |
JP4058933B2 (en) | 2001-10-26 | 2008-03-12 | 松下電工株式会社 | Manufacturing method of high thermal conductive solid substrate |
CN100505222C (en) * | 2004-11-19 | 2009-06-24 | 晶元光电股份有限公司 | Light-emitting diode radiating substrate and production thereof |
KR101088910B1 (en) * | 2008-05-29 | 2011-12-07 | 삼성엘이디 주식회사 | LED package and method of manufacturing the same |
TW201108377A (en) * | 2009-06-24 | 2011-03-01 | Furukawa Electric Co Ltd | Lead frame for optical semiconductor device, process for manufacturing lead frame for optical semiconductor device, and optical semiconductor device |
-
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Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001024228A (en) * | 1999-07-06 | 2001-01-26 | Nichia Chem Ind Ltd | Light emitting device |
JP2002280616A (en) * | 2001-03-16 | 2002-09-27 | Nichia Chem Ind Ltd | Package mold and light emitting device using the same |
JP2008127606A (en) * | 2006-11-17 | 2008-06-05 | Kobe Steel Ltd | High-strength copper alloy sheet having oxide film superior in adhesiveness |
JP2011187586A (en) * | 2010-03-05 | 2011-09-22 | Seiko Instruments Inc | Light emitting device and method of manufacturing the same |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2015111621A (en) * | 2013-12-06 | 2015-06-18 | 株式会社Neomaxマテリアル | Semiconductor element formation substrate, and method of manufacturing the same |
WO2018198982A1 (en) * | 2017-04-27 | 2018-11-01 | 京セラ株式会社 | Circuit board and light-emitting device provided with same |
JPWO2018198982A1 (en) * | 2017-04-27 | 2019-06-27 | 京セラ株式会社 | Circuit board and light emitting device provided with the same |
EP3618129A4 (en) * | 2017-04-27 | 2021-01-13 | KYOCERA Corporation | Circuit board and light-emitting device provided with same |
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