WO2013004054A1 - 液晶显示器、液晶显示器的阵列基板及修复断线的方法 - Google Patents

液晶显示器、液晶显示器的阵列基板及修复断线的方法 Download PDF

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WO2013004054A1
WO2013004054A1 PCT/CN2011/080179 CN2011080179W WO2013004054A1 WO 2013004054 A1 WO2013004054 A1 WO 2013004054A1 CN 2011080179 W CN2011080179 W CN 2011080179W WO 2013004054 A1 WO2013004054 A1 WO 2013004054A1
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WIPO (PCT)
Prior art keywords
line
repair
scan
liquid crystal
signal
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PCT/CN2011/080179
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English (en)
French (fr)
Inventor
文松贤
邓明锋
庄益壮
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深圳市华星光电技术有限公司
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Application filed by 深圳市华星光电技术有限公司 filed Critical 深圳市华星光电技术有限公司
Priority to US13/377,149 priority Critical patent/US9146409B2/en
Priority to DE112011105365.7T priority patent/DE112011105365B4/de
Publication of WO2013004054A1 publication Critical patent/WO2013004054A1/zh
Priority to US14/833,180 priority patent/US9759970B2/en

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    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/136259—Repairing; Defects
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/136259—Repairing; Defects
    • G02F1/136263—Line defects

Definitions

  • the present invention relates to the field of liquid crystal display, and more particularly to a liquid crystal display, an array substrate of a liquid crystal display, and a method for repairing disconnection.
  • TFT-LCD Thin Film Transistor-liquid crystal Display, thin film field effect transistor (liquid crystal display) mainly includes liquid crystal panel, timing controller and driver IC (Integrated Circuit, integrated circuit).
  • the liquid crystal panel is mainly composed of an array substrate and a color filter substrate which are packed together and a liquid crystal interposed therebetween.
  • a plurality of scanning lines for supplying a scanning signal to the display unit and signal lines for providing a data signal are formed on the array substrate.
  • the timing controller generates timing control signals required for driving the IC
  • the driving IC includes a data driving IC and a scan driving IC.
  • the data driving IC connects the source of each TFT through a signal line, controls the input voltage of each TFT source, and completes the input of the data signal;
  • the scan driving IC connects the gate of each TFT through the scan line to control the scanning of each row of TFTs.
  • the voltage determines the opening and closing of each row of TFT gates.
  • the scan lines and the data lines are formed on the array substrate in the array process.
  • the scan lines are horizontally and horizontally arranged on the array substrate, and the data lines are vertically arranged vertically.
  • the scanning line and the data line form a plurality of display units by crossing in the display area, and each display unit corresponds to one TFT, and the TFT can control the twist of the liquid crystal molecules in the corresponding area of the display unit through the TFT to achieve the purpose of displaying an image.
  • the scan line (including the self-wiring from the scan driver IC) is a major defect in the process.
  • the disconnection is mainly formed at the end of the array process. When the defect is detected, it needs to be corresponding. Repair.
  • the chemical vapor deposition repair is generally used for the bridge repair, but after the box forming process, the array substrate and the color mold substrate have been The box is a liquid crystal panel, and the bridge repair cannot be performed on the array substrate by chemical vapor deposition repair, and a large number of scan lines or self-wiring disconnection are still found in the lighting inspection after the boxing process or even the customer feedback. For this kind of situation, the current method of product scrapping is used, resulting in greater waste and increased production costs.
  • the main object of the present invention is to provide a liquid crystal display capable of repairing broken lines of a scanning line, an array substrate of a liquid crystal display, and a method for repairing disconnection, aiming at reducing production cost.
  • the present invention provides a liquid crystal display comprising an array substrate and a timing controller, the array substrate comprising a plurality of scan lines, the timing controller outputting a timing signal to control a scan signal to scan the scan lines line by line, and the liquid crystal display further include:
  • a detection line located on the array substrate, for connecting the n-th defect-free scan line and the repair chip before the disconnection, so that when the scan signal is scanned to the n-th defect-free scan line before the disconnection, the scan is performed Signal transmission to the repair chip;
  • a repair line is disposed on the array substrate for connecting the disconnection and the repair chip, so that the repair signal is transmitted to the disconnection position, and the disconnection is repaired.
  • the repair line includes a first repair line and a second repair line, and when the disconnection is two, the first repair line and the second repair line are respectively connected with two broken lines.
  • the detection line and the repair line are respectively connected to the repair chip by COF or COG.
  • the repair chip is integrated on a circuit board of the liquid crystal panel module.
  • the repair line and the broken line are laser welded.
  • the detection line and the scan line are laser welded.
  • the repair chip is soldered to a circuit board of the liquid crystal panel module.
  • the invention provides a method for repairing a broken line of a liquid crystal display, comprising the following steps:
  • the repair line and the broken line are welded.
  • the method further comprises:
  • An array substrate of a liquid crystal display comprising: a plurality of scan lines, wherein the timing controller output timing signal of the liquid crystal display controls the scan signal to scan the scan line line by line, wherein the array substrate further comprises:
  • a detection line located on the array substrate, for connecting the n-th defect-free scan line and the repair chip before the disconnection, so that when the scan signal is scanned to the n-th defect-free scan line before the disconnection, the scan is performed Signal transmission to the repair chip;
  • a repair line is disposed on the array substrate for connecting the disconnection and the repair chip, so that the repair signal is transmitted to the disconnection position, and the disconnection is repaired.
  • the present invention provides an array substrate of a liquid crystal display, comprising a plurality of scan lines, and a timing controller output timing signal of the liquid crystal display controls the scan signal to scan the scan line line by line, wherein the array substrate further comprises:
  • a detection line located on the array substrate, for connecting the n-th defect-free scan line and the repair chip before the disconnection, so that when the scan signal is scanned to the n-th defect-free scan line before the disconnection, the scan is performed Signal transmission to the repair chip;
  • a repair line is disposed on the array substrate for connecting the disconnection and the repair chip, so that the repair signal is transmitted to the disconnection position, and the disconnection is repaired.
  • the repair line includes a first repair line and a second repair line, and when the disconnection is two, the first repair line and the second repair line are respectively connected with two broken lines.
  • the detection line and the repair line are respectively connected to the repair chip by COF or COG.
  • the repair chip is integrated on a circuit board of the liquid crystal panel module.
  • the repair line and the broken line are laser welded.
  • the detection line and the scan line are laser welded.
  • the repair chip is soldered to a circuit board of the liquid crystal panel module.
  • the invention provides a liquid crystal display, an array substrate of a liquid crystal display and a method for repairing disconnection, which can repair the defective scan line disconnection detected by the liquid crystal display after the box forming process, thereby reducing the defect rate of the product and avoiding the defect. Larger waste reduces production costs.
  • FIG. 1 is a schematic structural view of an array substrate of a liquid crystal display according to a first embodiment of the present invention
  • FIG. 2 is a schematic structural view of an array substrate of a liquid crystal display according to a second embodiment of the present invention.
  • FIG. 3 is a flow chart showing a method for repairing a broken wire in a third embodiment of the present invention.
  • the technical solution of the embodiment of the present invention is to provide a detection line and a repair line on the array substrate, and the detection line is connected with a defect-free scan line, and the repair line is connected with the broken line, and the repair IC detects the line through the detection line. After the signal is scanned, the repair signal is output at an appropriate timing, and then the repair line is used to repair the disconnection.
  • FIG. 1 is a schematic structural view of a liquid crystal display according to a first embodiment of the present invention. As shown in FIG. 1, the liquid crystal display of this embodiment includes:
  • the array substrate 1 and the array substrate 1 are provided with a plurality of scanning lines and data lines (not shown in the data line diagram).
  • the scanning lines are horizontally and horizontally arranged on the array substrate 1, and the data lines are vertically aligned and scanned.
  • the line and the data line may form a plurality of display units by crossing (data lines spanning the scan lines but not electrically connected) in the display area, each display unit corresponding to one TFT, the gate thereof being connected to the horizontal scanning line, and the drain Connected to the data line in the vertical direction, and the source is connected to the pixel electrode.
  • the gates of all the TFTs are connected together, so the applied voltage is interlocked. If a sufficiently large positive voltage is applied to a certain scanning line, this scanning line is The TFTs are all turned on. At this time, the pixel electrodes on the scan line are connected to the vertical data lines, and the corresponding video signals are sent through the data lines to charge the pixel electrodes to an appropriate voltage. Then apply a large enough negative voltage to turn off the TFT until the signal is rewritten next time, during which the charge is stored on the liquid crystal capacitor. At this time, the next horizontal scanning line is activated and the corresponding video signal is sent. In this way, the video data of the entire picture is sequentially written, and the signal is rewritten from the first line.
  • the timing controller 2 is a center for controlling the operation timing of the entire display, and sets the horizontal scanning start with the timing of displaying the video screen of each frame, and converts the video signal input by the interface into data used by the data driving circuit.
  • the signal form is transmitted to the data drive IC (not shown) and matched with the horizontal scan to control the appropriate time for the data line drive.
  • the data driving IC receives the control of the timing controller 2, and stores the digital video signal of the high frequency input in the memory, and converts the digital video signal into a voltage to be output to the pixel electrode to drive the array substrate in conjunction with the opening of the specific scanning line.
  • the data line on 1.
  • the scan driver IC receives the control of the timing controller 2 to sequentially output appropriate turn-on voltages and turn-off voltages to specific scan lines to drive the scan lines of the TFT-LCD panel.
  • the number of scan lines of a high-resolution TFT-LCD panel is larger than the number of pins that can be driven by one scan driver IC, so several panels are needed in one panel.
  • a plurality of scanning lines are respectively connected to the scanning driving ICs 61, 62, 63 (the portions of the scanning lines which are not parallel to each other are also called self-wiring), and the scanning driving ICs 61, 62, 63 are mutually connected.
  • Serial connection will modularize the drive IC.
  • the scan start of the scan driver IC 61 is controlled by the timing control circuit, and the scan start of the scan drive IC 62 is based on the output pulse of the last stage shift register of the scan drive IC 61, so that the scans required for the entire panel can be combined in series. Voltage driven.
  • the detecting line 3 and the repairing line 5, the detecting line 3 and the repairing line 5 are disposed at the edge position of the array substrate 1, and the detecting line 3 and the repairing line 5 are vertically arranged vertically, overlapping with the scanning line but not electrically connected, and detecting Line 3 and repair line 5 can be formed in the array process, the same process as the scan line.
  • Repair IC4 when it is confirmed that the scan line is broken, the repair IC4 is soldered to the corresponding position of the module circuit board. At this time, the repair IC4 is connected to the timing controller 2 through the trace 7, and the IC4 is repaired. Pin (pin) 11, Pin12 through COF (Chip On Flex, soft film assembly) is connected to detection line 3 and repair line 5 respectively. Another common connection method is to directly bond to TFT glass substrate, ie COG (Chip On Glass, glass on chip package) way.
  • COG Chip On Glass, glass on chip package
  • the timing controller 2 transmits the timing signals to the scan driving ICs 61 to 63, it is synchronously transmitted to the repair IC 4, and the repair IC 4 calculates the time T1 required for the scan signals to scan the adjacent scan lines.
  • the repair IC4 can trigger and calculate the output repair signal when the scan line is broken, so that the scan signal of the scan line interrupt line portion is regained, so that the TFT switch of the corresponding portion of the disconnection line is turned on.
  • n-th defect-free scan line before the disconnection is determined as a trigger, wherein the n-th defect-free scan line before the disconnection is determined as a trigger device is set to a fixed value, and is written into the repair IC4, so that the repair IC4 is
  • intersection of the insulating line of the anth line and the detection line 3 by the laser laser technology, the intersection of the insulation of the a-th scan line and the repair line 5 is welded at the position shown in FIG. 1, and the laser will be broken and repaired.
  • the insulation intersection of 5, the intersection of the anth scan line and the detection line 3 is in this position to be metallized and welded together to form a via.
  • the repair IC4 is not limited to soldering on the liquid crystal display module circuit board, and can also be set at other positions, and only needs to be connected with the timing controller 2, the detection line 3 and the repair line 5.
  • the repair signal reaches the a-th scan line along the repair line 5, and the a-th scan line obtains a signal from the right side, so that the disconnected portion is repaired, and the timing controller 2 also synchronously controls the scan signal to scan from the left side to the first A scan line, the bilateral drive restores the a-th scan line to normal, so that the liquid crystal display is normally displayed.
  • FIG. 2 is a schematic structural view of a liquid crystal display according to a second embodiment of the present invention.
  • the liquid crystal display of this embodiment includes all the technical solutions of the array substrate 1, the timing controller 2, and the scan driving IC in the first embodiment.
  • the repair lines are two.
  • the detection line 3 and the first repair line 51 and the second repair line 52 are included.
  • the detecting line 3, the first repairing line 51, and the second repairing line 52 are disposed at the edge position of the array substrate 1, and are vertically arranged vertically, overlapping the scanning line but not electrically connected.
  • the detecting line 3 and the first repairing line 51 and the second repairing line 52 can be formed in the array process, and the same process as the scanning line is completed.
  • Repair IC4 when it is confirmed that the scan line is broken, the repair IC4 is soldered to the corresponding position of the module circuit board. At this time, the repair IC4 is connected to the timing controller 2 through the trace 7, and the pin of the IC4 is repaired. 11, Pin12, Pin13 through COF (chip on The method of flex and soft film is respectively connected to the detecting line 3, the first repairing line 51 and the second repairing line 52, and another common connection method is directly bonding on the TFT glass substrate, that is, COG (chip) On Glass, glass on chip package) way.
  • COG Chip
  • the timing controller 2 transmits the timing signal to the scan driver IC, it is synchronously transmitted to the repair IC 4, and the repair IC 4 calculates the time T1 required for the scan signal to scan the adjacent scan line.
  • the repair IC4 can trigger and calculate the output repair signal when the scan line is broken, so that the scan signal of the scan line interrupt line portion is regained, so that the TFT switch of the corresponding portion of the disconnection line is turned on.
  • the nth defect-free scan line before the disconnection 1 is used as a trigger, wherein the first few defect-free scan lines before the disconnection 1 are determined as a trigger device and set to a fixed value, and written into the repair IC4, so that the repair IC4 is repaired.
  • Output the repair signal at the appropriate timing to fix the disconnection 1, for example, n 2, 3, 4, 5, etc., and the bnth scan line before the bth scan line is used as a trigger.
  • the T1 time outputs a repair signal.
  • the intersection of the bnth scanning line and the detection line 3 is insulated by the laser laser technology, and the intersection of the bth scanning line and the first repairing line 51 is insulated, c
  • the intersection of the stripe scan line and the second repair line 52 is welded at the position shown in FIG. 2, the laser intersects the break line 1 and the first repair line 51, the break line 2 and the second repair line 52 are insulated, and the first The bn strip scan line and the detect line 3 are insulated at the location where they are metallized and fused together to form a via.
  • the repair IC4 is not limited to being soldered on the liquid crystal display module circuit board, and may be disposed at other positions, and only needs to be connected to the timing controller 2, the detection line 3, the first repair line 51, and the first repair line 52. can.
  • the repair signal reaches the b-th scan line along the first repair line 51, and the b-th scan line obtains a signal from the right side, so that the disconnected portion is repaired, and the timing controller 2 also synchronously controls the scan signal to scan from the left side.
  • the c-th scanning line obtains a signal from the right side, so that the broken portion thereof is repaired.
  • the timing controller 2 also synchronously controls the scanning signal to scan from the left side to the c-th scanning line, and the bilateral driving makes the c-th scanning line Return to normal, so that the LCD display is displayed normally.
  • the corresponding strip repairing line may be set, the repairing line is connected with the broken line, and the corresponding value is written in the repair IC4 to output the repair signal at an appropriate timing. to realise.
  • FIG. 3 is a flowchart of a method for repairing a broken line of a liquid crystal display according to a third embodiment of the present invention. The method is based on the structure of the liquid crystal display in the foregoing embodiments of FIG. 1 and FIG. As shown in FIG. 3, the method includes the following steps:
  • the repair IC When it is confirmed that the scan line is broken, the repair IC is soldered to the corresponding position of the module circuit board, and the repair IC is connected to the timing controller through the trace, and its pin
  • the pins are connected to the detection line and the repair line by means of COF (chip on flex).
  • COF chip on flex
  • Another common connection method is to directly bond to the TFT glass substrate, that is, COG (chip). On glass, the way the chip is packaged on the glass).
  • the timing controller 2 transmits the timing signal to the scan driver IC, it is synchronously transmitted to the repair IC, and the repair IC calculates the time T1 required for the scan signal to scan the adjacent scan line.
  • the repair IC can trigger and calculate the output repair signal when the scan line is broken, so that the scan signal of the scan line interrupt line portion is regained, so that the TFT switch corresponding to the broken line is opened.
  • the n-th defect-free scanning line before the disconnection is welded to the detecting line, the broken line and the repairing line at the overlapping intersection position by laser laser technology, and the laser is metallized and welded to form a path.
  • the repair IC is not limited to soldering on the LCD panel module circuit board, but can also be set in other independent positions, and only needs to be connected with the timing controller, the detection line and the repair line.
  • the array substrate in the liquid crystal display of the above embodiment is the array substrate proposed by the present invention, and details are not described herein.

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Abstract

一种液晶显示器、液晶显示器的阵列基板（1）及修复断线的方法，通过在阵列基板（1）上设置侦测线（3）和修复线（5），侦测线（3）与一无缺陷的扫描线连接，修复线（5）与断线连接，修复IC（4）在通过侦测线（3）侦测到扫描信号后在适当的时机输出修复信号，然后通过修复线（5）修复断线。该液晶显示器、液晶显示器的阵列基板（1）及修复断线的方法，可对液晶显示器在成盒工艺后检测出来的扫描线断线不良进行修复，降低了产品的不良率，避免了较大的浪费，降低了生产成本。

Description

液晶显示器、液晶显示器的阵列基板及修复断线的方法
技术领域
本发明涉及液晶显示领域，尤其涉及一种液晶显示器、液晶显示器的阵列基板及修复断线的方法。
背景技术
TFT-LCD（Thin Film Transistor-liquid crystal display，薄膜场效应晶体管-液晶显示器）主要包括液晶面板、时序控制器和驱动IC（Integrated Circuit，集成电路）。其中液晶面板主要由成盒在一起的阵列基板和彩膜基板及其夹设在其中的液晶组成。阵列基板上形成有多条向显示单元提供扫描信号的扫描线和提供数据信号的信号线。
时序控制器产生驱动IC所需的时序控制信号，驱动IC包括数据驱动IC和扫描驱动IC。数据驱动IC通过信号线连接每个TFT的源极，控制每个TFT源极的输入电压，完成数据信号的输入；扫描驱动IC通过扫描线连接每个TFT的栅极，控制每行TFT的扫描电压，决定每行TFT栅极的打开和关闭。
其中，扫描线和数据线在阵列制程中形成于阵列基板上。扫描线在阵列基板上水平横向排列，数据线垂直纵向排列。扫描线和数据线在显示区域内通过交叉形成若干个显示单元，每个显示单元对应一个TFT，通过TFT可控制显示单元对应区域内液晶分子的扭转从而达到显示图像的目的。
在实际的生产过程中，扫描线（包括从扫描驱动IC引出的自配线）断线不良是制程中主要的缺陷，断线不良主要形成于阵列制程末端，当检测出不良时，需要进行相应的修复。
对于在成盒工艺前检测出来的扫描线断线不良，由于此时还能在阵列基板上进行处理，一般采用化学气相沉积修复进行搭桥修复，但在成盒工艺后阵列基板与彩模基板已经成盒为液晶面板，不能采用化学气相沉积修复在阵列基板上进行搭桥修复，而在成盒工艺后的点灯检查甚至客户反馈时仍会发现大量扫描线或自配线断线不良。对于这一种情况，目前采用产品报废的方式处理，造成较大的浪费，提高了生产成本。
发明内容
本发明的主要目的在于提供一种能修复扫描线断线的液晶显示器、液晶显示器的阵列基板及修复断线的方法，旨在降低生产成本。
本发明提出一种液晶显示器，包括阵列基板和时序控制器，所述阵列基板包括多条扫描线，所述时序控制器输出时序信号控制扫描信号逐行扫描所述扫描线，所述液晶显示器还包括：
侦测线，位于所述阵列基板上，用于连接断线前第n条无缺陷扫描线与修复芯片，使得当扫描信号扫描至所述断线前第n条无缺陷扫描线时，将扫描信号传输至修复芯片；
修复芯片，与所述时序控制器连接，用于获得扫描信号扫描相邻扫描线时所需时间T1，并在当接受到所述扫描信号后，在时间T=n*T1后输出修复信号；
修复线，位于所述阵列基板上，用于连接断线与修复芯片，使得所述修复信号传送至断线位置，修复断线。
优选地，所述修复线包括第一修复线和第二修复线，用于当断线为两条时，第一修复线和第二修复线分别连接两条断线。
优选地，所述修复芯片还用于当断线为两条扫描线时，在时间T=n*T1输出修复信号后，在时间T=（n+m+1）*T1再输出修复信号，其中m为两条断线之间的扫描线条数。
优选地，所述侦测线和修复线通过COF或COG分别与修复芯片连接。
优选地，所述修复芯片集成在液晶面板模组的电路板上。
优选地，所述修复线与断线通过激光熔接。
优选地，所述侦测线与扫描线通过激光熔接。
优选地，所述修复芯片焊接在液晶面板模组的电路板上。
本发明提出一种液晶显示器修复断线的方法，包括以下步骤：
确定断线和断线前第n条无缺陷扫描线的位置；
将修复芯片焊接到液晶显示器上；
将侦测线与所述断线前第n条无缺陷扫描线熔接；
将修复线和所述断线熔接。
优选地，所述确定断线和断线前第n条无缺陷扫描线的位置之后还包括：
向修复芯片写入信息，使得驱动IC扫描至所述断线前第n条无缺陷扫描线时，在时间T=n*T1时输出修复信号，其中T1为修复芯片通过时序控制器获得的扫描信号在扫描相邻扫描线时所需时间。
一种液晶显示器的阵列基板，包括多条扫描线，液晶显示器的时序控制器输出时序信号控制扫描信号逐行扫描所述扫描线，其特征在于，所述阵列基板还包括：
侦测线，位于所述阵列基板上，用于连接断线前第n条无缺陷扫描线与修复芯片，使得当扫描信号扫描至所述断线前第n条无缺陷扫描线时，将扫描信号传输至修复芯片；
修复芯片，与液晶显示器的时序控制器连接，用于获得扫描信号扫描相邻扫描线时所需时间T1，并在当接受到所述扫描信号后，在时间T=n*T1后输出修复信号；
修复线，位于所述阵列基板上，用于连接断线与修复芯片，使得所述修复信号传送至断线位置，修复断线。
本发明提出一种液晶显示器的阵列基板，包括多条扫描线，液晶显示器的时序控制器输出时序信号控制扫描信号逐行扫描所述扫描线，其特征在于，所述阵列基板还包括：
侦测线，位于所述阵列基板上，用于连接断线前第n条无缺陷扫描线与修复芯片，使得当扫描信号扫描至所述断线前第n条无缺陷扫描线时，将扫描信号传输至修复芯片；
修复芯片，与液晶显示器的时序控制器连接，用于获得扫描信号扫描相邻扫描线时所需时间T1，并在当接受到所述扫描信号后，在时间T=n*T1后输出修复信号；
修复线，位于所述阵列基板上，用于连接断线与修复芯片，使得所述修复信号传送至断线位置，修复断线。
优选地，所述修复线包括第一修复线和第二修复线，用于当断线为两条时，第一修复线和第二修复线分别连接两条断线。
优选地，所述修复芯片还用于当断线为两条扫描线时，在时间T=n*T1输出修复信号后，在时间T=（n+m+1）*T1再输出修复信号，其中m为两条断线之间的扫描线条数。
优选地，所述侦测线和修复线通过COF或COG分别与修复芯片连接。
优选地，所述修复芯片集成在液晶面板模组的电路板上。
优选地，所述修复线与断线通过激光熔接。
优选地，所述侦测线与扫描线通过激光熔接。
优选地，所述修复芯片焊接在液晶面板模组的电路板上。
本发明提出的一种液晶显示器、液晶显示器的阵列基板及修复断线的方法，可对液晶显示器在成盒工艺后检测出来的扫描线断线不良进行修复，降低了产品的不良率，避免了较大的浪费，降低了生产成本。
附图说明
图1是本发明第一实施例中液晶显示器的阵列基板结构示意图；
图2是本发明第二实施例中液晶显示器的阵列基板结构示意图；
图3是本发明第三实施例中一种修复断线的方法流程示意图。
为了使本发明的技术方案更加清楚、明了，下面将结合附图作进一步详述。
具体实施方式
应当理解，此处所描述的具体实施例仅仅用以解释本发明，并不用于限定本发明。
本发明实施例的技术方案是通过在阵列基板上设置侦测线和修复线，侦测线与一无缺陷的扫描线连接，修复线与断线连接，修复IC在通过侦测线侦测到扫描信号后在适当的时机输出修复信号，然后通过修复线修复断线。
参照图1，图1是本发明第一实施例中液晶显示器的结构示意图。如图1所示，本实施例液晶显示器包括：
阵列基板1，阵列基板1上设置有多条扫描线和数据线（数据线图中未画出），在显示区域内，扫描线在阵列基板1上水平横向排列，数据线垂直纵向排列，扫描线和数据线可在显示区域内通过交叉（数据线跨越扫描线但未电性连接）形成若干个显示单元，每个显示单元对应一个TFT，其栅极连接至水平方向的扫描线，漏极连接至垂直方向的数据线，而源极则连接至像素电极。
在水平方向的同一条扫描线上，所有TFT的栅极都连接在一起，所以施加的电压是连动的，若在某一条扫描线上施加足够大的正电压，则这条扫描线上所以的TFT皆会被打开，此时该条扫描线上的像素电极，会与垂直方向的数据线连接，而经由数据线送入对应的视频信号，以将像素电极充电至适当的电压。接着施加足够大的负电压，关闭TFT，直到下次再重新写入信号，其间使得电荷保存在液晶电容上，此时再启动次一条水平扫描线，送入其对应的视频信号。如此依序将整个画面的视频数据写入，再重新自第一条重新写入信号。
时序控制器2，时序控制器2是控制整个显示的动作时序的中心，配合每帧视频画面显示的时机，设定水平扫描启动，并将由界面所输入的视频信号转换成数据驱动电路所用的数据信号形式，传送至数据驱动IC（图中未画出），并配合水平扫描，控制数据线驱动的适当时间。数据驱动IC接受时序控制器2的控制，将高频输入的数字视频信号储存在存储器内，配合特定的扫描线的开启，将数字视频信号转换成要输出至像素电极的电压，以驱动阵列基板1上的数据线。
扫描驱动IC，扫描驱动IC接受时序控制器2的控制，循序地对特定扫描线输出适当的开电压和关电压，以驱动TFT-LCD面板的扫描线。
其中，由于受扫描驱动IC引脚数目的限制，一个高分辨率的TFT-LCD面板的扫描线数目，会大于一个扫描驱动IC所能驱动的接脚数目，因此一个面板中需要用到数个扫描驱动IC。如图1所示，本实施例中，若干条扫描线分别与扫描驱动IC61、62、63连接（相互不平行的扫描线部分也叫自配线），扫描驱动IC61、62、63之间相互串接，将驱动IC模块化。扫描驱动IC61的扫描启动由时序控制电路控制，而扫描驱动IC62的扫描启动则根据扫描驱动IC61的最后一级移位暂存器输出脉冲，如此相串接便可组合出整个面板所需要的扫描电压驱动。
侦测线3和修复线5，侦测线3和修复线5设置在阵列基板1的边缘位置，侦测线3和修复线5垂直纵向排列，与扫描线重叠但未电性连接，侦测线3和修复线5可形成于阵列制程中，与扫描线同一工序完成。
修复IC4，当确认扫描线出现断线，修复IC4被焊接到模组电路板的对应位置，此时修复IC4通过走线7与时序控制器2连接，且修复IC4的 Pin（引脚） 11、Pin12通过COF（Chip On Flex，软膜构装）的方式分别与侦测线3和修复线5连接，另外一种常见的连接方式，是直接黏合在TFT玻璃基板上，即COG（Chip On Glass，玻璃上芯片封装）的方式。
当时序控制器2将时序信号传送给扫描驱动IC61~63时，同步传送给修复IC4，修复IC4计算出扫描信号扫描相邻扫描线时所需时间T1。修复IC4可在扫描线出现断线时，经过触发和计算输出修复信号，使得扫描线中断线部分的扫描信号重新获得，从而使断线对应部分的TFT开关被打开。
如图1所示，当第a条扫描线为断线时，断点位置右侧的部分扫描线由于没有扫描信号的传入，显示为断线。此时确定一条该断线前第n条无缺陷的扫描线作为触发，其中确定断线前第n条无缺陷的扫描线作为触发装置设置为固定值，并写入修复IC4，使得修复IC4在适当的时机输出修复信号，例如可设置n=2，3，4，5等，第a条扫描线前的第a-n条扫描线作为触发，当修复IC4被触发后，对应的会在T=n*T1时间输出修复信号。
通过激光镭射技术将第a-n条扫描线与侦测线3的绝缘相交处、第a条扫描线和修复线5的绝缘相交处在如图1所示位置熔接，激光将断线部分和修复线5的绝缘相交处、第a-n条扫描线和侦测线3的绝缘相交处在该位置使其金属化开而熔接在一起，使其形成通路。
其中修复IC4并不限于焊接在液晶显示器模组电路板上，也可设置在其他位置，只需满足与时序控制器2、侦测线3和修复线5连接即可。
当时序控制器2控制扫描信号扫描第a-n条扫描线时，扫描信号可沿侦测线3传送至修复IC4，修复IC4侦测到此信号被触发，在时间T=n*T1后输出修复信号，修复信号沿修复线5到达第a条扫描线，第a条扫描线从右侧得到信号，使其断线部分得到修复，此时时序控制器2也同步控制扫描信号从左侧扫描至第a条扫描线，双边驱动使第a条扫描线恢复正常，从而使液晶显示器正常显示。
参照图2，图2是本发明第二实施例中液晶显示器的结构示意图。本实施例液晶显示器包含了第一实施例中阵列基板1、时序控制器2以及扫描驱动IC的全部技术方案。本实施例与第一实施例不同之处在于，本实施例中，修复线为两条。具体的，本实施例中，包含侦测线3和第一修复线51及第二修复线52。侦测线3和第一修复线51、第二修复线52设置在阵列基板1的边缘位置，垂直纵向排列，与扫描线重叠但未电性连接。侦测线3和第一修复线51、第二修复线52可形成于阵列制程中，与扫描线同一工序完成。
修复IC4，当确认扫描线出现断线，修复IC4被焊接到模组电路板的对应位置，此时修复IC4通过走线7与时序控制器2连接，通过修复IC4的Pin 11、Pin12、Pin13通过COF（chip on flex，软膜构装）的方式分别与侦测线3、第一修复线51和第二修复线52连接，另外一种常见的连接方式，是直接黏合在TFT玻璃基板上，即COG（chip on glass，玻璃上芯片封装）的方式。
当时序控制器2将时序信号传送给扫描驱动IC时，同步传送给修复IC4，修复IC4计算出扫描信号扫描相邻扫描线时所需时间T1。修复IC4可在扫描线出现断线时，经过触发和计算输出修复信号，使得扫描线中断线部分的扫描信号重新获得，从而使断线对应部分的TFT开关被打开。
如图2所示，当第b条扫描线和第c条扫描线为断线时，断点位置右侧的部分扫描线由于没有扫描信号的传入，显示为断线1和断线2。此时确定一条断线1前第n条无缺陷的扫描线作为触发，其中确定断线1前第几条无缺陷的扫描线作为触发装置设置为固定值，并写入修复IC4，使得修复IC4在适当的时机输出修复信号修复断线1，例如可设置n=2，3，4，5等，第b条扫描线前的第b-n条扫描线作为触发，当修复IC4被触发后，对应的会在T=n*T1时间输出修复信号。
同时，计算出第b条扫描线和第c条扫描线之间扫描线条数m，并写入修复IC4，使当修复IC4被触发后，对应的会在T=（n+m+1）*T1时间输出修复信号。
当确认扫描线出现断线1和断线2后，通过激光镭射技术将第b-n条扫描线与侦测线3绝缘相交处、第b条扫描线和第一修复线51绝缘相交处、第c条扫描线和第二修复线52绝缘相交处在如图2所示位置熔接，激光将断线1和第一修复线51绝缘相交处、断线2和第二修复线52绝缘相交处、第b-n条扫描线和侦测线3绝缘相交处在该位置使其金属化开而熔接在一起，使其形成通路。
其中修复IC4并不限于焊接在液晶显示器模组电路板上，也可设置在其他位置，只需满足与时序控制器2、侦测线3、第一修复线51、第一修复线52连接即可。
当时序控制器2控制扫描信号扫描第b-n条扫描线时，扫描信号可沿侦测线3传送至修复IC4，修复IC4侦测到此信号被触发，在时间T=n*T1后输出修复信号，修复信号沿第一修复线51到达第b条扫描线，第b条扫描线从右侧得到信号，使其断线部分得到修复，此时时序控制器2也同步控制扫描信号从左侧扫描至第b条扫描线，双边驱动使第b条扫描线恢复正常；在时间T=（n+m+1）*T1后输出修复信号，修复信号沿第二修复线52到达第c条扫描线，第c条扫描线从右侧得到信号，使其断线部分得到修复，此时时序控制器2也同步控制扫描信号从左侧扫描至第c条扫描线，双边驱动使第c条扫描线恢复正常，从而使液晶显示器正常显示。
对于出现二条以上断线的情况，也可根据本发明之思想，设置对应条修复线，使修复线与断线连接，并在修复IC4中写入相应的值使其在适当的时机输出修复信号来实现。
参照图3，图3为本发明第三实施例提供的一种液晶显示器修复断线的方法流程图，该方法流程基于前述图1和图2实施例中液晶显示器的结构。如图3所示，该方法包括以下步骤：
S1：确定断线和断线前第n条无缺陷扫描线的位置；
通过向液晶显示器输入信号使其点亮，确定断线条数及其位置，然后确定一条该断线前第n条无缺陷的扫描线作为触发，其中确定断线前第几条无缺陷的扫描线作为触发装置设置为固定值，并写入修复IC，使得修复IC在适当的时机输出修复信号，例如可设置n=2，3，4，5等，当修复IC被触发后，对应的会在T=n*T1时间输出修复信号，如果断线条数为多条，还需计算出其他断线与第一断线之间的扫描线条数m，使得修复IC还在对应时间T=（n+m+1）*T1时输出一修复信号。
S2：将修复芯片焊接到液晶显示器上；
当确认扫描线出现断线，修复IC被焊接到模组电路板的对应位置，此时修复IC通过走线与时序控制器连接， 其Pin 引脚通过COF（chip on flex，软膜构装）的方式分别与侦测线和修复线连接，另外一种常见的连接方式是直接黏合在TFT玻璃基板上，即COG（chip on glass，玻璃上芯片封装）的方式。
当时序控制器2将时序信号传送给扫描驱动IC时，同步传送给修复IC，修复IC计算出扫描信号扫描相邻扫描线时所需时间T1。修复IC可在扫描线出现断线时，经过触发和计算输出修复信号，使得扫描线中断线部分的扫描信号重新获得，从而使断线对应部分的TFT开关被打开。
S3：将侦测线与所述断线前第n条无缺陷扫描线熔接；
S4：将修复线和所述断线熔接。
通过激光镭射技术将该断线前第n条无缺陷的扫描线与侦测线、断线和修复线在重叠交叉位置熔接，激光使其金属化开而熔接在一起，使其形成通路。
其中修复IC并不限于焊接在液晶面板模组电路板上，也可设置在其他独立位置，只需满足与时序控制器、侦测线和修复线连接即可。
当时序控制器控制扫描信号扫描该断线前第n条无缺陷的扫描线时，扫描信号可沿侦测线传送至修复IC，修复IC侦测到此信号被触发，在时间T=n*T1后输出修复信号，修复信号沿修复线到达断线所在扫描线，使其断线部分获得信号，此时时序控制器也同步控制扫描信号扫描至断线所在扫描线正常部分，双边驱动使断线所在扫描线恢复正常。如果断线条数为多条，修复IC还在对应时间T=（n+m+1）*T1时输出一修复信号，使得多条断线得到修复。 上述实施例液晶显示器中的阵列基板即为本发明提出的阵列基板，在此不作赘述。
以上所述仅为本发明的优选实施例，并非因此限制本发明的专利范围，凡是利用本发明说明书及附图内容所作的等效结构或流程变换，或直接或间接运用在其它相关的技术领域，均同理包括在本发明的专利保护范围内。

Claims (18)

  1. 一种液晶显示器，包括阵列基板和时序控制器，所述阵列基板包括多条扫描线，所述时序控制器输出时序信号控制扫描信号逐行扫描所述扫描线，其特征在于，所述液晶显示器还包括：
    侦测线，位于所述阵列基板上，用于连接断线前第n条无缺陷扫描线与修复芯片，使得当扫描信号扫描至所述断线前第n条无缺陷扫描线时，将扫描信号传输至修复芯片；
    修复芯片，与所述时序控制器连接，用于获得扫描信号扫描相邻扫描线时所需时间T1，并在当接受到所述扫描信号后，在时间T=n*T1后输出修复信号；
    修复线，位于所述阵列基板上，用于连接断线与修复芯片，使得所述修复信号传送至断线位置，修复断线。
  2. 根据权利要求1所述的液晶显示器，其特征在于，所述修复线包括第一修复线和第二修复线，用于当断线为两条时，第一修复线和第二修复线分别连接两条断线。
  3. 根据权利要求2所述的液晶显示器，其特征在于，所述修复芯片还用于当断线为两条扫描线时，在时间T=n*T1输出修复信号后，在时间T=（n+m+1）*T1再输出修复信号，其中m为两条断线之间的扫描线条数。
  4. 根据权利要求1或3所述的液晶显示器，其特征在于，所述侦测线和修复线通过COF或COG分别与修复芯片连接。
  5. 根据权利要求4所述的液晶显示器，其特征在于，所述修复芯片集成在液晶面板模组的电路板上。
  6. 根据权利要求5所述的液晶显示器，其特征在于，所述修复线与断线通过激光熔接。
  7. 根据权利要求6所述的液晶显示器，其特征在于，所述侦测线与扫描线通过激光熔接。
  8. 根据权利要求7所述的液晶显示器，其特征在于，所述修复芯片焊接在液晶面板模组的电路板上。
  9. 一种液晶显示器修复断线的方法，其特征在于，包括：
    确定断线和断线前第n条无缺陷扫描线的位置；
    将修复芯片焊接到液晶显示器上；
    将侦测线与所述断线前第n条无缺陷扫描线熔接；
    将修复线和所述断线熔接。
  10. 根据权利要求9所述的方法，其特征在于，所述确定断线和断线前第n条无缺陷扫描线的位置之后还包括：
    向修复芯片写入信息，使得驱动IC扫描至所述断线前第n条无缺陷扫描线时，在时间T=n*T1时输出修复信号，其中T1为修复芯片通过时序控制器获得的扫描信号在扫描相邻扫描线时所需时间。
  11. 一种液晶显示器的阵列基板，包括多条扫描线，液晶显示器的时序控制器输出时序信号控制扫描信号逐行扫描所述扫描线，其特征在于，所述阵列基板还包括：
    侦测线，位于所述阵列基板上，用于连接断线前第n条无缺陷扫描线与修复芯片，使得当扫描信号扫描至所述断线前第n条无缺陷扫描线时，将扫描信号传输至修复芯片；
    修复芯片，与液晶显示器的时序控制器连接，用于获得扫描信号扫描相邻扫描线时所需时间T1，并在当接受到所述扫描信号后，在时间T=n*T1后输出修复信号；
    修复线，位于所述阵列基板上，用于连接断线与修复芯片，使得所述修复信号传送至断线位置，修复断线。
  12. 根据权利要求11所述的阵列基板，其特征在于，所述修复线包括第一修复线和第二修复线，用于当断线为两条时，第一修复线和第二修复线分别连接两条断线。
  13. 根据权利要求12所述的阵列基板，其特征在于，所述修复芯片还用于当断线为两条扫描线时，在时间T=n*T1输出修复信号后，在时间T=（n+m+1）*T1再输出修复信号，其中m为两条断线之间的扫描线条数。
  14. 根据权利要求11或13所述的阵列基板，其特征在于，所述侦测线和修复线通过COF或COG分别与修复芯片连接。
  15. 根据权利要求14所述的阵列基板，其特征在于，所述修复芯片集成在液晶面板模组的电路板上。
  16. 根据权利要求15所述的阵列基板，其特征在于，所述修复线与断线通过激光熔接。
  17. 根据权利要求16所述的阵列基板，其特征在于，所述侦测线与扫描线通过激光熔接。
  18. 根据权利要求17所述的阵列基板，其特征在于，所述修复芯片焊接在液晶面板模组的电路板上。
PCT/CN2011/080179 2011-07-01 2011-09-26 液晶显示器、液晶显示器的阵列基板及修复断线的方法 WO2013004054A1 (zh)

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