WO2012167449A1 - 一种像素阵列的检测方法及检测装置 - Google Patents

一种像素阵列的检测方法及检测装置 Download PDF

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Publication number
WO2012167449A1
WO2012167449A1 PCT/CN2011/075907 CN2011075907W WO2012167449A1 WO 2012167449 A1 WO2012167449 A1 WO 2012167449A1 CN 2011075907 W CN2011075907 W CN 2011075907W WO 2012167449 A1 WO2012167449 A1 WO 2012167449A1
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Prior art keywords
pixel
brightness
module
ratio
pixel unit
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English (en)
French (fr)
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郑文达
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TCL China Star Optoelectronics Technology Co Ltd
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Shenzhen China Star Optoelectronics Technology Co Ltd
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Priority to US13/265,870 priority Critical patent/US20120310575A1/en
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    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/136254—Checking; Testing

Definitions

  • the present invention relates to a method and a device for detecting a liquid crystal panel, and more particularly to a method and a device for detecting a pixel array of a liquid crystal panel.
  • each stage needs to be tested to ensure the yield of the final product.
  • the substrate with the pixel array is fabricated, the substrate must detect each pixel electrode on the substrate through the array inspection device (pixel Pattern) Whether there is a defect.
  • a probe of the array inspection device when detecting a pixel electrode defect, first charges the pixel electrode of the pixel array, and then detects a brightness value of each pixel electrode, and then calculates a specific area. The average value of the brightness of the pixel electrode. The inspection device then calculates a ratio between the brightness value of each pixel electrode and the average value of the brightness, and compares the ratio with a brightness threshold originally set by the array inspection device. When the luminance ratio of one pixel electrode is smaller than the luminance threshold, the inspection device determines that the pixel electrode is defective.
  • the voltage input by the probe will gradually decay due to the impedance of the wire, that is, the voltage received by the pixel electrode at the output end of the wire will be less than the voltage at the input of the probe.
  • the array inspection device only sets a brightness threshold as a reference for defect determination, but the same brightness threshold is not fully applicable to detecting pixel defects under different voltages, often during the detection process. There is a misjudgment or a defect cannot be detected.
  • the invention provides a method for detecting a pixel array to solve the problem that the defect is misjudged or cannot be detected during the pixel defect detection process.
  • the main object of the present invention is to provide a method for detecting a pixel array, which can reduce defects by collecting a brightness table of the same pixel defect at different voltages to establish a comparison table of appropriate brightness thresholds. Misjudgment, which in turn increases the accuracy of the test.
  • the present invention provides a method for detecting a pixel array, comprising the following steps:
  • S10 charging a sample pixel region including the pixel unit and the normal pixel unit with different test voltages; establishing and storing a comparison table of brightness thresholds according to brightness values of the pixel units;
  • S20 Charging the pixel area to be tested, and selecting a corresponding brightness threshold from the comparison table according to the voltage value and the brightness value of the current pixel area to be tested to detect the pixel area to be tested.
  • the step S10 includes:
  • Step S11 selecting test voltages of different voltage values to charge a sample pixel region including the pixel unit and the normal pixel unit;
  • Step S12 detecting brightness of each pixel unit in the sample pixel region under different test voltages to obtain luminance values of the pixel unit and the normal pixel unit;
  • Step S13 calculating an average value of brightness of all pixel units in the sample pixel region under different test voltages
  • Step S14 Calculate a ratio of the brightness value of the pixel in the sample pixel region to the brightness average value, and then establish an appropriate brightness threshold according to the obtained ratio according to the obtained ratio, thereby establishing a comparison table of the brightness threshold and storing.
  • the step S20 includes:
  • Step S21 applying a voltage to the pixel array to be tested
  • Step S22 detecting a brightness value of each pixel unit
  • Step S23 calculating an average value of the brightness of the pixel unit in each pixel region
  • Step S24 calculating a ratio between the brightness of each pixel unit and the average value of the brightness
  • Step S25 detecting a voltage value corresponding to each pixel region to be tested
  • Step S26 the voltage value of each pixel area to be tested is searched for a brightness threshold corresponding to the voltage value in a comparison table stored by the storage module;
  • Step S27 Compare the magnitude between the ratio obtained in step S24 and the luminance threshold obtained in step S26.
  • the brightness threshold is greater than a ratio of a brightness value of the pixel unit to a brightness average.
  • the pixel unit corresponding to the ratio is a pixel unit.
  • the brightness threshold is less than a ratio of the brightness value of the pixel unit to the brightness average.
  • the pixel unit corresponding to the ratio is a pixel unit.
  • the invention further provides a method for detecting a pixel array, comprising the following steps:
  • Step S11 selecting test voltages of different voltage values to charge a sample pixel region including the pixel unit and the normal pixel unit, wherein the test voltage falls within a range of voltage values transmitted by the wires connecting the sample pixel regions;
  • Step S12 detecting brightness of each pixel unit in the sample pixel region under different test voltages to obtain luminance values of the pixel unit and the normal pixel unit;
  • Step S13 calculating an average value of brightness of all pixel units in the sample pixel region under different test voltages
  • Step S14 calculating a ratio of the brightness value of the pixel in the sample pixel region to the brightness average value, and establishing an appropriate brightness threshold according to the obtained ratio according to the obtained ratio, thereby establishing a comparison table of the brightness threshold and storing;
  • Step S21 applying a voltage to the pixel array to be tested
  • Step S22 detecting a brightness value of each pixel unit
  • Step S23 calculating an average value of the brightness of the pixel unit in each pixel region
  • Step S24 calculating a ratio between the brightness of each pixel unit and the average value of the brightness
  • Step S25 detecting a voltage value corresponding to each pixel region to be tested
  • Step S26 the voltage value of each pixel area to be tested is searched for a brightness threshold corresponding to the voltage value in a comparison table stored by the storage module;
  • Step S27 Compare the magnitude between the ratio obtained in step S24 and the luminance threshold obtained in step S26.
  • the brightness threshold is greater than a ratio of a brightness value of the pixel unit to a brightness average.
  • the pixel unit corresponding to the ratio is a pixel unit.
  • the brightness threshold is less than a ratio of the brightness value of the pixel unit to the brightness average.
  • the pixel unit corresponding to the ratio is a pixel unit.
  • the invention further provides a detecting device for a pixel array, comprising:
  • a charging module configured to apply a test voltage to a sample pixel region of the known pixel unit and the normal pixel unit, and store the test voltage value, the charging module is also used to apply to each pixel region to be tested of a pixel array a voltage
  • a first detecting module configured to detect a brightness value of each pixel unit of the sample pixel area after the test voltage is charged, where the first detecting module is also used to detect a pixel unit of each pixel area to be tested of the pixel array Brightness value;
  • a first calculating module connected to the first detecting module, configured to receive a brightness value of each pixel unit detected by the first detecting module, and calculate a pixel unit in the sample pixel area or each pixel area to be tested The average value of the brightness values;
  • a second computing module is connected to the charging module, the first detecting module, and the first computing module, and configured to receive the brightness value of the pixel unit detected by the first detecting module, and the calculated by the first calculating module
  • An average value of the luminance values of the pixel units in the sample pixel region and a test voltage value of the charging module, and calculating an average value of the luminance values of the pixel unit and the luminance values of the pixel units of the sample pixel region calculated by the first calculation module a ratio between the ratios and the test voltage values corresponding to the sample pixel regions are used to establish appropriate brightness thresholds at different test voltages, thereby establishing a brightness threshold comparison table;
  • a storage module connected to the second computing module, configured to store a brightness threshold comparison table established by the second computing module
  • a second detecting module is connected to the pixel array, and the second detecting module is configured to detect a voltage value applied by the charging module to each of the pixels to be tested;
  • a third calculation module is connected to the first detection module and the first calculation module, and the third calculation module is configured to receive a brightness value of a pixel unit in each pixel region to be detected detected by the first detection module, and Calculating, by the first calculating module, an average value of the brightness values of the pixel units in each pixel region to be tested, and calculating a ratio between the brightness value of each pixel unit and the average value;
  • a search module is connected to the second detecting module and the storage module, and the searching module is configured to receive the voltage value of each pixel region to be tested detected by the second detecting module, and according to the voltage value of each pixel region to be tested Searching, in the brightness threshold comparison table stored in the storage module, a brightness threshold corresponding to the voltage;
  • a comparison module is connected to the third calculation module and the search module, and the comparison module is configured to receive a ratio of pixel units and luminance average values in each pixel region to be tested calculated by the third calculation module, and receive The brightness threshold corresponding to each voltage searched by the module is searched, and the ratio between the ratio of the pixel unit and the brightness average value in each pixel region to be tested and the corresponding brightness threshold is compared, thereby determining whether each pixel unit is a pixel unit.
  • the brightness threshold calculated by the second calculating module is greater than a ratio of the brightness value of the ⁇ pixel to the brightness average value; the comparison module is configured to compare the ratio with the brightness threshold, if the ratio is less than the brightness threshold Then, the pixel unit corresponding to the ratio is a pixel unit.
  • the brightness threshold calculated by the second calculating module is smaller than the ratio of the brightness value of the ⁇ pixel to the brightness average value; the comparison module is configured to compare the ratio with the brightness threshold, if the ratio R is greater than the brightness For the threshold, the pixel unit corresponding to the ratio is a pixel unit.
  • the invention mainly provides a comparison table of brightness thresholds according to the brightness of the normal pixel unit and the ⁇ pixel unit of the next sample pixel region of different test voltages, thereby providing a reference for determining the appropriate pixel defects at different voltages, thereby reducing false positive defects. And increase the accuracy of the test.
  • the invention mainly provides a comparison table of brightness thresholds according to the brightness of the normal pixel unit and the ⁇ pixel unit of the next sample pixel region of different test voltages, thereby providing a reference for determining the appropriate pixel defects at different voltages, thereby reducing false positive defects. And increase the accuracy of the test.
  • Figure 1 is a schematic illustration of a substrate detected by a detecting device of a pixel array of the present invention.
  • FIG. 2 is a schematic structural view of a detecting device of a pixel array of the present invention.
  • FIG. 3 is a flow chart of a first embodiment of a method of detecting a pixel array of the present invention.
  • Figure 4 is a flow chart of step S10 of Figure 3.
  • FIG. 5 is a flow chart of step S20 of Figure 3.
  • Figure 6 is a comparison table of the first embodiment of the detecting method of the pixel array of the present invention.
  • Fig. 7 is a list of luminance values of pixel regions at an input voltage of 15V.
  • Fig. 8 is a list of luminance values of pixel regions at an input voltage of 12V.
  • Fig. 9 is a list of luminance values of pixel regions at an input voltage of 11V.
  • Figure 10 is a flow chart showing the establishment and storage of a brightness threshold comparison table for the second embodiment of the method for detecting a pixel array of the present invention.
  • FIG. 11 is a flow chart of detecting a pixel region to be tested according to a second embodiment of the method for detecting a pixel array of the present invention.
  • the invention is mainly applicable to an array inspection device for a liquid crystal panel process, and performs defect detection on a pixel array on a substrate.
  • FIG. 1 is a schematic diagram of a substrate detected by a detecting device of a pixel array of the present invention.
  • a pixel array 1 is formed on a substrate 2 , and the pixel array 1 includes a plurality of pixel regions 11 , and each pixel region 11 includes A number of pixel units 111.
  • FIG. 2 is a schematic structural diagram of a detecting apparatus 100 of a pixel array 1 of the present invention.
  • the detecting apparatus 100 includes a charging module 110 , a first detecting module 120 , a first calculating module 130 , a second detecting module 140 , and a second calculation.
  • the charging module 110 is configured to be electrically connected to the pixel array 1 to be detected, and apply a voltage to each pixel region 11 to be tested of the pixel array 1.
  • the charging module 110 is also configured to apply a test voltage to a sample pixel region of a known pixel unit and a normal pixel unit, and store the test voltage value, and the test voltage value is transmitted on a wire connected to the sample pixel region. The range of voltage values.
  • the first detecting module 120 is configured to detect the brightness value of the pixel unit 111 of each pixel region 11 to be detected of the pixel array 1 to be detected after being charged by the charging module 110.
  • the first detecting module 120 is also configured to detect a brightness value of each pixel unit of the sample pixel region after being charged by the test voltage.
  • the first calculating module 130 is connected to the first detecting module 120, and configured to receive the brightness value of each pixel unit detected by the first detecting module 120, and calculate an average value of the brightness values of the pixel units in each pixel area. .
  • the first calculating module 130 is configured to calculate an average value of the brightness values of the pixel units of the pixel area 11 to be tested and the sample pixel area.
  • the second detecting module 140 is connected to the pixel array 1 for detecting a voltage value applied by the charging module 110 to each of the pixel regions 11 to be tested.
  • the second calculation module 150 is connected to the charging module 110, the first detection module 120, and the first calculation module 130, and is configured to receive the brightness value of the pixel unit detected by the first detection module 120, and the first calculation module. 130 calculates an average value of the luminance values of the pixel units in each pixel region and a test voltage value of the charging module 110. The second calculation module 150 calculates a ratio between the luminance value of the pixel unit and the average value of the luminance values of the pixel units of the sample pixel region calculated by the first calculation module 130, and corresponds to the sample pixel region according to the ratio.
  • the test voltage value establishes an appropriate brightness threshold (threshold) under different test voltages, thereby establishing a brightness threshold comparison table (lookup) Table).
  • the brightness threshold is slightly larger than the ratio of the brightness value of the ⁇ pixel to the average value of the brightness; preferably, by applying the same test voltage to different sample pixel areas, a plurality of ⁇ are obtained.
  • the ratio of the luminance value of the pixel unit to the average luminance value is slightly larger than the maximum of the plurality of ratios as the luminance threshold.
  • the brightness threshold is slightly smaller than the ratio of the brightness value of the ⁇ pixel to the average value of the brightness; preferably, by applying the same test voltage to different sample pixel areas, multiple ⁇ pixels are obtained.
  • the ratio of the luminance value of the unit to the average luminance value is slightly smaller than the minimum of the plurality of ratios as the luminance threshold.
  • the storage module 160 is connected to the second calculation module 150 for storing a brightness threshold comparison table established by the second calculation module 150.
  • the third calculation module 170 is connected to the first detection module 120 and the first calculation module 130, and the third calculation module 170 is configured to receive the pixels in the pixel to be tested 11 detected by the first detection module 120.
  • the luminance value of the pixel unit 111 and the average value of the luminance values of the pixel units 111 in each of the pixel regions 11 to be measured calculated by the first calculation module 130, and the luminance values of the pixel units 111 in each of the pixel regions 11 to be tested are calculated.
  • the ratio R to the average.
  • the searching module 180 is connected to the second detecting module 140 and the storage module 160.
  • the searching module 180 receives the voltage values of the pixels to be tested 11 detected by the second detecting module 140, and searches for the voltage in the brightness threshold comparison table stored in the storage module 160 according to the voltage value of each pixel area 11 to be tested. Corresponding brightness threshold.
  • the comparison module 190 is connected to the third calculation module 170 and the search module 180, and is configured to receive the ratio R of the pixel unit 111 and the brightness average value in each pixel region 11 to be measured calculated by the third calculation module 170, and receive the search.
  • the brightness threshold corresponding to each voltage searched by the module 180 is compared, and the ratio between the ratio R of the pixel unit 111 and the brightness average value in each pixel region 11 to be tested and the corresponding brightness threshold is compared, thereby determining whether each pixel unit 111 is ⁇ Pixel unit.
  • the pixel unit whose ratio R is smaller than the brightness threshold is the ⁇ pixel unit; when there is a bright spot defect in the pixel array, the pixel unit whose ratio R is greater than the brightness threshold is the ⁇ pixel unit.
  • FIG. 3 is a flowchart of a first embodiment of a method for detecting a pixel array according to the present invention.
  • This embodiment is a defect in a pixel array.
  • the detection method includes the following steps:
  • Step S10 charging a sample pixel region including the pixel unit and the normal pixel unit with different test voltages; establishing and storing a comparison table of brightness thresholds according to the brightness values of the pixel units.
  • Step S20 charging the pixel area to be tested, and selecting a corresponding brightness threshold from the comparison table according to the voltage value and the brightness value of the pixel area to be tested to detect the pixel area to be tested.
  • step S10 includes the following steps:
  • Step S11 The charging module 110 selects different test voltages of different voltage values to charge the sample pixel region including the pixel unit and the normal pixel unit, wherein the test voltage falls on the voltage transmitted by the wire connecting the sample pixel region. Within the range of values.
  • the input voltage V1 of the input terminal of the wire connecting the array substrate of the sample pixel region and the output voltage V2 of the output terminal are first measured, wherein different outputs are obtained under the same input voltage V1 according to different array substrate sizes.
  • Voltage V2. The charging module 110 determines a selection range of the test voltage Vt according to the measured input voltage V1 and different output voltages V2.
  • the output voltage V2 of the minimum value is selected as the minimum value Vmin of the test voltage, that is, Vmin ⁇ Vt ⁇ V1, and a plurality of voltage values are selected between Vmin and V1 as the test voltage.
  • the selected number of the test voltage may be determined according to the size of the substrate or the difference between Vmin and V1, for example, the larger the size of the liquid crystal panel (that is, the greater the difference between Vmin and V1), then the test The number of voltages selected is greater.
  • Step S12 The brightness of each pixel unit in the sample pixel area is detected by the first detecting module 120 under different test voltages to obtain brightness values of the pixel unit and the normal pixel unit.
  • Step S13 The first calculation module 130 calculates the average value of the brightness of all the pixel units in the sample pixel region under different test voltages.
  • Step S14 The second calculation module 150 calculates a ratio of the luminance value of the pixel unit under the different test voltages in the sample pixel region to the luminance average value, and according to the test voltage value and the pixel applied to the sample pixel region.
  • the ratio of the brightness value of the cell to the average value of the brightness establishes an appropriate brightness threshold S (threshold) at different test voltages, thereby establishing a comparison table of brightness thresholds (lookup) Table).
  • the brightness threshold S is slightly larger than the ratio of the brightness value of the pixel unit to the brightness average.
  • FIG. 6 is a comparison table of a first embodiment of a method for detecting a pixel array according to the present invention, wherein a brightness threshold corresponding to a test voltage of 15V to 13V is 0.6; and a brightness threshold corresponding to a test voltage of 12V is 0.7; And the brightness threshold corresponding to the test voltage of 11V is 0.8.
  • the comparison table of the brightness thresholds is stored by the storage module 160.
  • step S20 includes the following steps:
  • Step S21 A voltage is applied by the charging module 110 to the pixel array 1 to be measured, so that the pixel units 111 of the respective pixel regions 11 to be tested of the pixel array 1 emit light.
  • Step S22 The luminance value L of each pixel unit 111 is detected by the first detecting module 120. As shown in FIG. 7, it is a list of luminance values of each pixel unit 111 of one of the pixel regions 11 to be tested detected by the first detecting module 120 at an input voltage of 15V.
  • Step S23 The average value LA of the luminances of the pixel units 111 in the respective pixel regions 11 to be tested is calculated by the first calculation module 130. As shown in FIG. 7 , the first calculation module 130 calculates an average brightness value LA of 80 according to the brightness value of each pixel unit 111 of the pixel area 11 to be tested.
  • Step S24 The ratio R between the luminance L of each pixel unit 111 and the luminance average value LA is calculated by the third calculation module 170.
  • Step S25 The voltage value V corresponding to each pixel area 11 to be tested is detected by the second detecting module 140.
  • Step S26 The brightness threshold S corresponding to the voltage value V is searched by the lookup module 180 according to the voltage value V of each pixel area 11 to be tested in the lookup table stored by the storage module 160.
  • Step S27 The comparison module 190 compares the magnitude between the ratio R obtained in step S24 and the threshold S obtained in step S26. If the ratio R is smaller than the brightness threshold S, the pixel unit corresponding to the ratio R is a pixel unit.
  • FIG. 7 to FIG. 9 are a list of luminance values of pixel regions at input voltages of 15V, 12V and 11V, respectively.
  • the lookup module 180 selects the threshold S as 0.6 as a reference for determining whether each pixel unit 111 in the pixel area 11 has a defect, corresponding to the look-up table of FIG. Similarly, in the pixel area 11 of the input voltage 11V shown in FIG.
  • FIG. 10 and FIG. 11 are flowcharts of a second embodiment of a method for detecting a pixel array according to the present invention.
  • This embodiment is a method for detecting a defect in a pixel array, and steps S31 to 33 in this embodiment.
  • step S41 to step S46 are the same as steps S11 to S13 and step S21 to step S26 of the first embodiment, and the difference between this embodiment and the first embodiment is that in step S34, the brightness threshold S is slightly A ratio smaller than a luminance value of the ⁇ pixel unit to a luminance average value, and more preferably, by applying the same test voltage to different sample pixel regions, a ratio of a luminance value to a luminance average value of the plurality of ⁇ pixel units is obtained, which is slightly smaller than The minimum of the plurality of ratios is taken as the brightness threshold S.
  • the comparison module 190 compares the size between the ratio R obtained in step S44 and the threshold S obtained in step S46. If the ratio R is greater than the threshold S, the pixel unit corresponding to the ratio R is a pixel.
  • the detection method of the conventional pixel array only sets a threshold value as a reference for defect determination, and causes a misjudgment in the detection process or a defect cannot be detected.
  • the present invention By establishing a comparison table, different brightness thresholds are selected as the benchmark for defect determination according to different voltages, thereby reducing false positive defects, increasing detection accuracy, reducing unnecessary maintenance time, and helping to increase production capacity.

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Abstract

一种像素阵列（1）的检测方法及检测装置，该方法包括步骤：先以不同的测试电压对包含瑕疵像素单元与正常像素单元的样本像素区域进行充电；根据不同测试电压下各像素单元的亮度值建立一亮度阈值对照表；在检测待测像素区域（11）时，对待测像素区域（11）充电，根据其电压值及亮度值自所述亮度阈值对照表中选用适合的亮度阈值，再根据此亮度阈值检测所述待测像素区域（11）的像素单元（111）是否具有缺陷。本发明能够减少缺陷的误判，进而增加检测的准确性。

Description

一种像素阵列的检测方法及检测装置 技术领域
本发明是有关于一种液晶面板的检测方法及检测装置，特别是有关于一种液晶面板的像素阵列的检测方法及检测装置。
 背景技术
在液晶面板制造过程中，各阶段都需要经过检测，以确保最终产品的良率。其中在制作设有像素阵列的基板时，基板必须通过阵列检查设备检测基板上的每个像素电极(pixel pattern)是否有缺陷(defect)。
现有技术中，在检测像素电极缺陷时，阵列检查设备的探针(probe)会先对像素阵列的像素电极充电，再对检测每一像素电极的亮度值，接着计算每一特定区域内的像素电极的亮度平均值。检查设备再计算每一像素电极亮度值与亮度平均值之间的比值，并将所述比值与所述阵列检查设备原先设定的亮度阈值进行比较。当一像素电极的亮度比值小于所述亮度阈值时，检查设备即判断此像素电极有缺陷。
然而，所述探针输入的电压会因为导线的阻抗而逐渐衰退(decay)，即位于导线输出端的像素电极所接收的电压将会小于探针输入端的电压。现有技术中，所述阵列检查设备仅设定一种亮度阈值做为缺陷判定的基准，但相同的亮度阈值并不完全适用在不同的电压下进行像素缺陷的检测，往往在检测过程中，有误判或是缺陷无法被检查出的情况发生。
故，有必要提供一种像素阵列的检测方法，以解决现有技术所存在的问题。
 技术问题
本发明提供一种像素阵列的检测方法，以解决在像素缺陷检测过程中缺陷误判或是无法被检查出的问题。
 技术解决方案
有鉴于现有技术的缺点，本发明的主要目的在于提供一种像素阵列的检测方法，其通过收集同一像素缺陷在不同电压下的亮度值来建置适当亮度阈值的对照表，可减少缺陷的误判，进而增加检测的准确性。
为达成本发明的前述目的，本发明提供一种像素阵列的检测方法，包含下列步骤：
S10：以不同测试电压对包含瑕疵像素单元与正常像素单元的样本像素区域进行充电；根据各像素单元的亮度值建立并存储一亮度阈值的对照表；以及
S20：对待测像素区域充电，并根据当前待测像素区域的电压值及亮度值自对照表中选定对应的亮度阈值以检测所述待测像素区域。
在本发明的一实施例中，所述步骤S10包括：
步骤S11：选取不同的电压值的测试电压来对包含有瑕疵像素单元与正常像素单元的样本像素区域进行充电；
步骤S12：检测不同测试电压下所述样本像素区域内的每个像素单元的亮度，以得到瑕疵像素单元以及正常像素单元的亮度值；
步骤S13：计算不同测试电压下所述样本像素区域内的所有像素单元的亮度平均值；以及
步骤S14：计算所述样本像素区域内的瑕疵像素的亮度值与前述亮度平均值的比值，再根据得到的比值建立不同测试电压下适当的亮度阈值，进而建立一亮度阈值的对照表并储存。
在本发明的一实施例中，所述步骤S20包括：
步骤S21：对待测的像素阵列施加电压；
步骤S22：检测各像素单元的亮度值；
步骤S23：计算各个像素区域内的像素单元的亮度的平均值；
步骤S24：计算各个像素单元的亮度与亮度平均值之间的比值；
步骤S25：检测各个待测像素区域对应的电压值；
步骤S26：各个待测像素区域的电压值在存储模块存储的对照表中查找该电压值对应的亮度阈值；以及
步骤S27：比较步骤S24得到的比值与步骤S26得到的亮度阈值之间的大小。
在本发明的一实施例中，所述亮度阈值大于瑕疵像素单元的亮度值与亮度平均值的比值。
在本发明的一实施例中，若比值小于亮度阈值，则该比值对应的像素单元为瑕疵像素单元。
在本发明的一实施例中，亮度阈值小于瑕疵像素单元的亮度值与亮度平均值的比值。
在本发明的一实施例中，若比值大于亮度阈值，则该比值对应的像素单元为瑕疵像素单元。
本发明另提供一种像素阵列的检测方法，包含下列步骤：
步骤S11：选取不同的电压值的测试电压来对包含有瑕疵像素单元与正常像素单元的样本像素区域进行充电，所述测试电压落在连接样本像素区域的导线所传输的电压值范围内；
步骤S12：检测不同测试电压下所述样本像素区域内的每个像素单元的亮度，以得到瑕疵像素单元以及正常像素单元的亮度值；
步骤S13：计算不同测试电压下所述样本像素区域内的所有像素单元的亮度平均值；
步骤S14：计算所述样本像素区域内的瑕疵像素的亮度值与前述亮度平均值的比值，再根据得到的比值建立不同测试电压下适当的亮度阈值，进而建立一亮度阈值的对照表并储存；
步骤S21：对待测的像素阵列施加电压；
步骤S22：检测各像素单元的亮度值；
步骤S23：计算各个像素区域内的像素单元的亮度的平均值；
步骤S24：计算各个像素单元的亮度与亮度平均值之间的比值；
步骤S25：检测各个待测像素区域对应的电压值；
步骤S26：各个待测像素区域的电压值在存储模块存储的对照表中查找该电压值对应的亮度阈值；以及
步骤S27：比较步骤S24得到的比值与步骤S26得到的亮度阈值之间的大小。
在本发明的一实施例中，所述亮度阈值大于瑕疵像素单元的亮度值与亮度平均值的比值。
在本发明的一实施例中，若比值小于亮度阈值，则该比值对应的像素单元为瑕疵像素单元。
在本发明的一实施例中，亮度阈值小于瑕疵像素单元的亮度值与亮度平均值的比值。
在本发明的一实施例中，若比值大于亮度阈值，则该比值对应的像素单元为瑕疵像素单元。
本发明另提供一种像素阵列的检测装置，包含：
一充电模块，用于向一已知存在瑕疵像素单元与正常像素单元的样本像素区域施加一测试电压并存储该测试电压值，该充电模块也用于向一像素阵列的各待测像素区域施加一电压；
一第一检测模块，用于检测以测试电压充电后的所述样本像素区域的各像素单元的亮度值，该第一检测模块也用于检测所述像素阵列的各待测像素区域的像素单元的亮度值；
一第一计算模块，与所述第一检测模块连接，用于接收第一检测模块检测得到的各像素单元的亮度值，并计算所述样本像素区域内或各待测像素区域的像素单元的亮度值的平均值；
一第二计算模块，与所述充电模块、第一检测模块及第一计算模块均连接，用于接收第一检测模块检测得到的瑕疵像素单元的亮度值、第一计算模块计算得到的所述样本像素区域内的像素单元的亮度值的平均值及充电模块的测试电压值，并计算瑕疵像素单元的亮度值与第一计算模块计算得到的该样本像素区域的像素单元的亮度值的平均值之间的比值，并根据该比值与该样本像素区域对应的测试电压值建立不同测试电压下适当的亮度阈值，进而建立一亮度阈值对照表；
一存储模块，与所述第二计算模块连接，用于存储第二计算模块建立的亮度阈值对照表；
一第二检测模块，与所述像素阵列连接，该第二检测模块用于检测所述充电模块施加于所述各待测像素区域的电压值；
一第三计算模块，与所述第一检测模块及所述第一计算模块连接，该第三计算模块用于接收第一检测模块检测得到的各待测像素区域内的像素单元的亮度值以及第一计算模块计算得到的各待测像素区域内的像素单元的亮度值的平均值，并计算各像素单元的亮度值与平均值之间的比值；
一查找模块，与所述第二检测模块及存储模块连接，该查找模块用于接收该第二检测模块检测得到的各待测像素区域的电压值，并根据各待测像素区域的电压值在该存储模块存储的亮度阈值对照表中查找该电压下对应的亮度阈值；及
一比较模块，与所述第三计算模块及所述查找模块连接，所述比较模块用于接收第三计算模块计算得到的各待测像素区域内的像素单元与亮度平均值的比值，及接收查找模块查找的各电压下对应的亮度阈值，并比较各待测像素区域内的像素单元与亮度平均值的比值与对应的亮度阈值之间的大小，进而判断各像素单元是否为瑕疵像素单元。
在本发明的一实施例中，所述第二计算模块计算的亮度阈值大于瑕疵像素的亮度值与亮度平均值的比值；所述比较模块用于比较比值与该亮度阈值，若比值小于亮度阈值，则该比值对应的像素单元为瑕疵像素单元。
在本发明的一实施例中，所述第二计算模块计算的亮度阈值小于瑕疵像素的亮度值与亮度平均值的比值；所述比较模块用于比较比值与该亮度阈值，若比值R大于亮度阈值，则该比值对应的像素单元为瑕疵像素单元。
本发明主要是根据不同测试电压下一样本像素区域的正常像素单元与瑕疵像素单元的亮度建立亮度阈值的对照表，藉此提供在不同电压下适当的像素缺陷判定的基准，可减少误判缺陷，而增加检测的准确度。
 有益效果
本发明主要是根据不同测试电压下一样本像素区域的正常像素单元与瑕疵像素单元的亮度建立亮度阈值的对照表，藉此提供在不同电压下适当的像素缺陷判定的基准，可减少误判缺陷，而增加检测的准确度。
附图说明
图1是一接受本发明像素阵列的检测装置检测的基板的示意图。
图2是本发明像素阵列的检测装置的结构示意图。
图3是本发明像素阵列的检测方法的第一实施例的流程图。
图4是图3中步骤S10的流程图。
图5是图3中步骤S20的流程图。
图6是本发明像素阵列的检测方法的第一实施例的对照表。
图7是输入电压15V下的像素区域的亮度值列表。
图8是输入电压12V下的像素区域的亮度值列表。
图9是输入电压11V下的像素区域的亮度值列表。
图10是本发明像素阵列的检测方法的第二实施例的建立并存储亮度阈值对照表的流程图。
图11是本发明像素阵列的检测方法的第二实施例的检测待测像素区域的流程图。
 本发明的最佳实施方式
为让本发明上述目的、特征及优点更明显易懂，下文特举本发明较佳实施例，并配合附图，作详细说明如下。再者，本发明所提到的方向用语，例如「上」、「下」、「前」、「后」、「左」、「右」、「内」、「外」、「侧面」等，仅是参考附加图式的方向。因此，使用的方向用语是用以说明及理解本发明，而非用以限制本发明。
本发明主要可应用于液晶面板制程的阵列检查设备，针对基板上的像素阵列进行缺陷的检测。
请参考图1，其为接受本发明像素阵列的检测装置检测的基板的示意图，其中基板2上形成有像素阵列1，所述像素阵列1包括若干个像素区域11，每一像素区域11则包括若干个像素单元111。
请参考图2，是本发明像素阵列1的检测装置100的结构示意图，所述检测装置100包括充电模块110、第一检测模块120、第一计算模块130、第二检测模块140、第二计算模块150、存储模块160、第三计算模块170、查找模块180及比较模块190。
所述充电模块110用于与所述待检测的像素阵列1电性连接，并向该像素阵列1的各待测像素区域11施加一电压。该充电模块110也用于向一已知存在瑕疵像素单元与正常像素单元的样本像素区域施加一测试电压并存储该测试电压值，该测试电压值落在连接所述样本像素区域的导线所传输的电压值范围内。
所述第一检测模块120用于检测由充电模块110充电后的待检测像素阵列1的各待测像素区域11的像素单元111的亮度值。该第一检测模块120也用于检测以测试电压充电后的所述样本像素区域的各像素单元的亮度值。
所述第一计算模块130与所述第一检测模块120连接，用于接收第一检测模块120检测得到的各像素单元的亮度值，并计算各像素区域内的像素单元的亮度值的平均值。该第一计算模块130用于计算所述待测像素区域11和所述样本像素区域的像素单元的亮度值的平均值。
所述第二检测模块140与所述像素阵列1连接，用于检测所述充电模块110施加于所述各待测像素区域11的电压值。
所述第二计算模块150与所述充电模块110、第一检测模块120及第一计算模块130均连接，用于接收第一检测模块120检测得到的瑕疵像素单元的亮度值、第一计算模块130计算得到的各像素区域内的像素单元的亮度值的平均值及充电模块110的测试电压值。该第二计算模块150计算瑕疵像素单元的亮度值与第一计算模块130计算得到的该样本像素区域的像素单元的亮度值的平均值之间的比值，并根据该比值与该样本像素区域对应的测试电压值建立不同测试电压下适当的亮度阈值(threshold)，进而建立一亮度阈值对照表(lookup table)。在样本像素区域的缺陷为暗点缺陷时，该亮度阈值略大于该瑕疵像素的亮度值与亮度平均值的比值；优选的，通过对不同样本像素区域施加相同的测试电压，得出多个瑕疵像素单元的亮度值与亮度平均值的比值，以稍大于多个比值中的最大值作为亮度阈值。在样本像素区域的缺陷为亮点缺陷时，该亮度阈值略小于该瑕疵像素的亮度值与亮度平均值的比值；优选的，通过对不同样本像素区域施加相同的测试电压，得出多个瑕疵像素单元的亮度值与亮度平均值的比值，以稍小于多个比值中的最小值作为亮度阈值。
所述存储模块160与所述第二计算模块150连接，用于存储所述第二计算模块150建立的亮度阈值对照表。
所述第三计算模块170与所述第一检测模块120及所述第一计算模块130连接，该第三计算模块170用于接收第一检测模块120检测得到的各待测像素区域11内的像素单元111的亮度值以及第一计算模块130计算得到的各待测像素区域11内的像素单元111的亮度值的平均值，并计算各待测像素区域11内的各像素单元111的亮度值与平均值之间的比值R。
所述查找模块180与所述第二检测模块140及存储模块160连接。所述查找模块180接收第二检测模块140检测得到的各待测像素区域11的电压值，并根据各待测像素区域11的电压值在存储模块160存储的亮度阈值对照表中查找该电压下对应的亮度阈值。
所述比较模块190与第三计算模块170及查找模块180连接，用于接收第三计算模块170计算得到的各待测像素区域11内的像素单元111与亮度平均值的比值R，以及接收查找模块180查找的各电压下对应的亮度阈值，并比较各待测像素区域11内的像素单元111与亮度平均值的比值R与对应的亮度阈值之间的大小，进而判断各像素单元111是否为瑕疵像素单元。当像素阵列中存在暗点缺陷时，比值R小于亮度阈值的像素单元即为瑕疵像素单元；当像素阵列中存在亮点缺陷时，比值R大于亮度阈值的像素单元即为瑕疵像素单元。
请参考图3并结合图1、图2、图4至图9，其中，图3为本发明像素阵列的检测方法第一实施例的流程图，本实施例为像素阵列中存在暗点的缺陷的检测方法，其包含有下列步骤：
步骤S10：以不同测试电压对包含瑕疵像素单元与正常像素单元的样本像素区域进行充电；根据各像素单元的亮度值建立并存储一亮度阈值的对照表。
步骤S20：对待测像素区域充电，并根据待测像素区域的电压值及亮度值自对照表中选定对应的亮度阈值以检测所述待测像素区域。
更详细地，如图4所示，步骤S10包括以下步骤：
步骤S11：由充电模块110选取不同的电压值的测试电压来对包含有瑕疵像素单元与正常像素单元的样本像素区域进行充电，其中所述测试电压落在连接样本像素区域的导线所传输的电压值范围内。更详细地，先测量连接所述样本像素区域所在阵列基板的导线的输入端的输入电压V1及输出端的输出电压V2，其中，根据不同的阵列基板尺寸，在相同输入电压V1下得出不同的输出电压V2。所述充电模块110根据所测得的输入电压V1以及不同输出电压V2确定测试电压Vt的选取范围。较佳的是选择最小值的输出电压V2做为测试电压的最小值Vmin，亦即Vmin≦Vt≦V1，再于Vmin与V1之间选取多个电压值做为测试电压。其中，所述测试电压的选取数量可根据基板的大小或Vmin与V1之间的差值大小来决定，例如液晶面板尺寸越大(亦即Vmin与V1之间的差值越大)，则测试电压的选取数量越多。
步骤S12：由第一检测模块120在不同测试电压下检测所述样本像素区域内的每个像素单元的亮度，以得到瑕疵像素单元以及正常像素单元的亮度值。
步骤S13：由第一计算模块130计算不同测试电压下所述样本像素区域内的所有像素单元的亮度平均值。
步骤S14：由第二计算模块150计算所述样本像素区域内的不同测试电压下瑕疵像素单元的亮度值与前述亮度平均值的比值，并根据施加到该样本像素区域的测试电压值及瑕疵像素单元的亮度值与亮度平均值的比值建立不同测试电压下适当的亮度阈值S(threshold)，进而建立一亮度阈值(threshold)的对照表(lookup table)。优选的，该亮度阈值S略大于瑕疵像素单元的亮度值与亮度平均值的比值。更优选的，通过对不同样本像素区域施加相同的测试电压，得出多个瑕疵像素单元的亮度值与亮度平均值的比值，以稍大于多个比值中的最大值作为亮度阈值S。参考图6所示，图6即是本发明像素阵列的检测方法的第一实施例的对照表，其中，对应测试电压15V~13V的亮度阈值为0.6；对应测试电压12V的亮度阈值为0.7；以及对应测试电压11V的亮度阈值为0.8。所述亮度阈值的对照表是由所述存储模块160存储。
更详细地，如图5所示，步骤S20包括以下步骤：
步骤S21：由充电模块110对待测的像素阵列1施加电压，使像素阵列1的各个待测像素区域11的像素单元111发光。
步骤S22：由第一检测模块120检测各像素单元111的亮度值L。如图7，其为第一检测模块120检测得到的其中一个待测像素区域11在输入电压15V下的各像素单元111的亮度值列表。
步骤S23：由第一计算模块130计算各个待测像素区域11内的像素单元111的亮度的平均值LA。如图7，该第一计算模块130根据该待测像素区域11的各个像素单元111的亮度值所计算的亮度平均值LA为80。
步骤S24：由第三计算模块170计算各个像素单元111的亮度L与亮度平均值LA之间的比值R。
步骤S25：由第二检测模块140检测各个待测像素区域11对应的电压值V。
步骤S26：由查找模块180根据各个待测像素区域11的电压值V在存储模块160存储的对照表中查找该电压值V对应的亮度阈值S。
步骤S27：由比较模块190比较步骤S24得到的比值R与步骤S26得到的阈值S之间的大小。若比值R小于亮度阈值S，则该比值R对应的像素单元为瑕疵像素单元。
请参考图7至图9所示，分别是输入电压15V、12V及11V下的像素区域的亮度值列表。以输入电压15V的像素区域11而言，对应图6的对照表，查找模块180选用阈值S为0.6做为判定所述像素区域11中每一像素单元111是否具有缺陷的基准。同理，以图9所示的输入电压11V的像素区域11而言，查找模块180则选用亮度阈值S为0.8，第一计算模块130计算像素单元111的亮度平均值LA为41.6875，当第三计算模块170计算出其中一像素单元111的亮度值L与亮度平均值LA的比值R为30/41.6875=0.7196，此像素单元111即可通过比较模块190被检测出为瑕疵像素单元。由于本发明在输入电压从15V下降至11V时，对应将亮度阈值S从0.6提升到0.8，以提高判定的基准，在输入电压变小而导致像素单元111之间亮度差距不大的情形下仍能判定每一像素单元111是否具有缺陷。
请参考图10及图11，其为本发明像素阵列的检测方法的第二实施例的流程图，本实施例为像素阵列中存在亮点的缺陷的检测方法，本实施例的步骤S31至步骤33及步骤S41至步骤S46与第一实施例的步骤S11至步骤S13及步骤S21至步骤S26对应相同，本实施例与第一实施例的不同之处在于：在步骤S34中，该亮度阈值S略小于瑕疵像素单元的亮度值与亮度平均值的比值，更优选的，通过对不同样本像素区域施加相同的测试电压，得出多个瑕疵像素单元的亮度值与亮度平均值的比值，以稍小于多个比值中的最小值作为亮度阈值S。在步骤S47中，比较模块190比较步骤S44得到的比值R与步骤S46得到的阈值S之间的大小，若比值R大于阈值S，则该比值R对应的像素单元为瑕疵像素。
由上述说明可知，相较于现有像素阵列的检测方法仅设定一种阈值做为缺陷判定的基准，而导致在检测过程中有误判或是缺陷无法被检查出的情况发生，本发明通过建立对照表的方式，对应不同电压选用不同的亮度阈值做为缺陷判定的基准，进而可减少误判缺陷，而增加检测的准确度，减少非必要的检修时间，有助于增加产能。
本发明已由上述相关实施例加以描述，然而上述实施例仅为实施本发明的范例。必需指出的是，已公开的实施例并未限制本发明的范围。相反地，包含于权利要求书的精神及范围的修改及均等设置均包括于本发明的范围内。
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Claims (15)

  1. 一种像素阵列的检测方法，其特征在于：所述像素阵列的检测方法包含下列步骤：
    S10：以不同测试电压对包含瑕疵像素单元与正常像素单元的样本像素区域进行充电；根据各像素单元的亮度值建立并存储一亮度阈值的对照表；以及
    S20：对待测像素区域充电，并根据待测像素区域的电压值及亮度值自对照表中选定对应的亮度阈值以检测所述待测像素区域。
  2. 如权利要求1所述的像素阵列的检测方法，其特征在于：所述步骤S10包括：
    步骤S11：选取不同的电压值的测试电压来对包含有瑕疵像素单元与正常像素单元的样本像素区域进行充电；
    步骤S12：检测不同测试电压下所述样本像素区域内的每个像素单元的亮度，以得到瑕疵像素单元以及正常像素单元的亮度值；
    步骤S13：计算不同测试电压下所述样本像素区域内的所有像素单元的亮度平均值；以及
    步骤S14：计算所述样本像素区域内的瑕疵像素的亮度值与前述亮度平均值的比值，再根据得到的比值建立不同测试电压下适当的亮度阈值，进而建立一亮度阈值的对照表并储存。
  3. 如权利要求2所述的像素阵列的检测方法，其特征在于：所述步骤S20包括：
    步骤S21：对待测的像素阵列施加电压；
    步骤S22：检测各像素单元的亮度值；
    步骤S23：计算各个像素区域内的像素单元的亮度的平均值；
    步骤S24：计算各个像素单元的亮度与亮度平均值之间的比值；
    步骤S25：检测各个待测像素区域对应的电压值；
    步骤S26：根据各个待测像素区域的电压值在存储模块存储的对照表中查找该电压值对应的亮度阈值；以及
    步骤S27：比较步骤S24得到的比值与步骤S26得到的亮度阈值之间的大小。
  4. 如权利要求3所述的像素阵列的检测方法，其特征在于：在步骤S14中所述亮度阈值大于瑕疵像素单元的亮度值与亮度平均值的比值。
  5. 如权利要求4所述的像素阵列的检测方法，其特征在于：在步骤S27中，若比值小于亮度阈值，则该比值对应的像素单元为瑕疵像素单元。
  6. 如权利要求3所述的像素阵列的检测方法，其特征在于：在步骤S14中所述亮度阈值小于瑕疵像素单元的亮度值与亮度平均值的比值。
  7. 如权利要求6所述的像素阵列的检测方法，其特征在于：在步骤S27中，若比值大于亮度阈值，则该比值对应的像素单元为瑕疵像素单元。
  8. 一种像素阵列的检测方法，其特征在于：所述像素阵列的检测方法包含下列步骤：
    步骤S11：选取不同的电压值的测试电压来对包含有瑕疵像素单元与正常像素单元的样本像素区域进行充电,所述测试电压落在连接样本像素区域的导线所传输的电压值范围内；
    步骤S12：检测不同测试电压下所述样本像素区域内的每个像素单元的亮度，以得到瑕疵像素单元以及正常像素单元的亮度值；
    步骤S13：计算不同测试电压下所述样本像素区域内的所有像素单元的亮度平均值；
    步骤S14：计算所述样本像素区域内的瑕疵像素的亮度值与前述亮度平均值的比值，再根据得到的比值建立不同测试电压下适当的亮度阈值，进而建立一亮度阈值的对照表并储存；
    步骤S21：对待测的像素阵列施加电压；
    步骤S22：检测各像素单元的亮度值；
    步骤S23：计算各个像素区域内的像素单元的亮度的平均值；
    步骤S24：计算各个像素单元的亮度与亮度平均值之间的比值；
    步骤S25：检测各个待测像素区域对应的电压值；
    步骤S26：根据各个待测像素区域的电压值在存储模块存储的对照表中查找该电压值对应的亮度阈值；以及
    步骤S27：比较步骤S24得到的比值与步骤S26得到的亮度阈值之间的大小。
  9. 如权利要求8所述的像素阵列的检测方法，其特征在于：在步骤S14中所述亮度阈值大于瑕疵像素单元的亮度值与亮度平均值的比值。
  10. 如权利要求9所述的像素阵列的检测方法，其特征在于：在步骤S27中，若比值小于亮度阈值，则该比值对应的像素单元为瑕疵像素单元。
  11. 如权利要求8所述的像素阵列的检测方法，其特征在于：在步骤S14中所述亮度阈值小于瑕疵像素单元的亮度值与亮度平均值的比值。
  12. 如权利要求11所述的像素阵列的检测方法，其特征在于：在步骤S27中，若比值大于亮度阈值，则该比值对应的像素单元为瑕疵像素单元。
  13. 一种像素阵列的检测装置，其特征在于：所述像素阵列的检测装置包括：
    一充电模块，用于向一已知存在瑕疵像素单元与正常像素单元的样本像素区域施加一测试电压并存储该测试电压值，该充电模块也用于向一像素阵列的各待测像素区域施加一电压；
    一第一检测模块，用于检测以测试电压充电后的所述样本像素区域的各像素单元的亮度值，该第一检测模块也用于检测所述像素阵列的各待测像素区域的像素单元的亮度值；
    一第一计算模块，与所述第一检测模块连接，用于接收第一检测模块检测得到的各像素单元的亮度值，并计算所述样本像素区域内或各待测像素区域的像素单元的亮度值的平均值；
    一第二计算模块，与所述充电模块、第一检测模块及第一计算模块均连接，用于接收第一检测模块检测得到的瑕疵像素单元的亮度值、第一计算模块计算得到的所述样本像素区域内的像素单元的亮度值的平均值及充电模块的测试电压值，并计算瑕疵像素单元的亮度值与第一计算模块计算得到的该样本像素区域的像素单元的亮度值的平均值之间的比值，并根据该比值与该样本像素区域对应的测试电压值建立不同测试电压下适当的亮度阈值，进而建立一亮度阈值对照表；
    一存储模块，与所述第二计算模块连接，用于存储第二计算模块建立的亮度阈值对照表；
    一第二检测模块，与所述像素阵列连接，该第二检测模块用于检测所述充电模块施加于所述各待测像素区域的电压值；
    一第三计算模块，与所述第一检测模块及所述第一计算模块连接，该第三计算模块用于接收第一检测模块检测得到的各待测像素区域内的像素单元的亮度值以及第一计算模块计算得到的各待测像素区域内的像素单元的亮度值的平均值，并计算各像素单元的亮度值与平均值之间的比值；
    一查找模块，与所述第二检测模块及存储模块连接，该查找模块用于接收该第二检测模块检测得到的各待测像素区域的电压值，并根据各待测像素区域的电压值在该存储模块存储的亮度阈值对照表中查找该电压下对应的亮度阈值；及
    一比较模块，与所述第三计算模块及所述查找模块连接，所述比较模块用于接收第三计算模块计算得到的各待测像素区域内的像素单元与亮度平均值的比值，及接收查找模块查找的各电压下对应的亮度阈值，并比较各待测像素区域内的像素单元与亮度平均值的比值与对应的亮度阈值之间的大小，进而判断各像素单元是否为瑕疵像素单元。
  14. 如权利要求13所述的像素阵列的检测装置，其特征在于：所述第二计算模块计算的亮度阈值大于瑕疵像素的亮度值与亮度平均值的比值；所述比较模块用于比较比值与该亮度阈值，若比值小于亮度阈值，则该比值对应的像素单元为瑕疵像素单元。
  15. 如权利要求13所述的像素阵列的检测装置，其特征在于：所述第二计算模块计算的亮度阈值小于瑕疵像素的亮度值与亮度平均值的比值；所述比较模块用于比较比值与该亮度阈值，若比值大于亮度阈值，则该比值对应的像素单元为瑕疵像素单元。
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