WO2012138064A3 - 다채널 pwm 파형 측정기 - Google Patents
다채널 pwm 파형 측정기 Download PDFInfo
- Publication number
- WO2012138064A3 WO2012138064A3 PCT/KR2012/001978 KR2012001978W WO2012138064A3 WO 2012138064 A3 WO2012138064 A3 WO 2012138064A3 KR 2012001978 W KR2012001978 W KR 2012001978W WO 2012138064 A3 WO2012138064 A3 WO 2012138064A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- servo drive
- pwm waveform
- outputting
- measuring device
- waveform measuring
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
- G01R29/023—Measuring pulse width
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Inverter Devices (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US14/009,779 US20140021938A1 (en) | 2011-04-06 | 2012-03-20 | Multi-channel pwm waveform measuring device |
JP2014503588A JP2014513288A (ja) | 2011-04-06 | 2012-03-20 | 多チャンネルpwm波形測定器 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2011-0031608 | 2011-04-06 | ||
KR1020110031608A KR101089846B1 (ko) | 2011-04-06 | 2011-04-06 | 다채널 pwm 파형 측정기 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2012138064A2 WO2012138064A2 (ko) | 2012-10-11 |
WO2012138064A3 true WO2012138064A3 (ko) | 2012-12-06 |
Family
ID=45505631
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/KR2012/001978 WO2012138064A2 (ko) | 2011-04-06 | 2012-03-20 | 다채널 pwm 파형 측정기 |
Country Status (4)
Country | Link |
---|---|
US (1) | US20140021938A1 (ko) |
JP (1) | JP2014513288A (ko) |
KR (1) | KR101089846B1 (ko) |
WO (1) | WO2012138064A2 (ko) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105283822B (zh) * | 2013-03-15 | 2018-11-30 | 狄夫斯高公司 | 探头通信模块和计算设备 |
RU178677U1 (ru) * | 2017-09-28 | 2018-04-17 | ФЕДЕРАЛЬНОЕ ГОСУДАРСТВЕННОЕ БЮДЖЕТНОЕ ОБРАЗОВАТЕЛЬНОЕ УЧРЕЖДЕНИЕ ВЫСШЕГО ОБРАЗОВАНИЯ "Брянский государственный технический университет" | Тестер ШИМ контроллеров |
CN112217705A (zh) * | 2020-09-18 | 2021-01-12 | 浙江伊控动力系统有限公司 | 数据传输电路、集成式逆变器和汽车 |
CN113300902B (zh) * | 2021-03-29 | 2022-05-20 | 明峰医疗系统股份有限公司 | 多通道脉冲宽度测量及数据传输处理方法 |
CN114878879B (zh) * | 2022-07-11 | 2022-09-30 | 天津普智芯网络测控技术有限公司 | 一种适用于不同通信端口的检测脉冲调制和使用方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20030069530A (ko) * | 2002-02-21 | 2003-08-27 | 한국과학기술원 | 적외선 펄스폭변조 구동방식을 이용한 위치 감지시스템 및방법 |
JP2006214834A (ja) * | 2005-02-02 | 2006-08-17 | Seiko Epson Corp | 検査プローブ、光学パネルの検査装置、光学パネルの検査方法 |
KR20080072044A (ko) * | 2005-11-10 | 2008-08-05 | 니혼 하츠쵸 가부시키가이샤 | 콘택트 유닛 및 검사시스템 |
KR20100095189A (ko) * | 2009-02-20 | 2010-08-30 | 마이크로 인스펙션 주식회사 | 터치패널의 검사장치 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6477476B1 (en) * | 1999-12-06 | 2002-11-05 | Koninklijke Philips Electronics N.V. | Periodic-signal analysis via correlation |
KR101539359B1 (ko) * | 2009-02-05 | 2015-07-27 | 삼성디스플레이 주식회사 | 광원 구동 방법, 이를 수행하기 위한 광원 장치 및 이 광원장치를 포함하는 표시 장치 |
CN101957410B (zh) * | 2010-09-03 | 2012-10-10 | 上海革缔电子科技有限公司 | 个人实验室系统集成装置 |
-
2011
- 2011-04-06 KR KR1020110031608A patent/KR101089846B1/ko not_active IP Right Cessation
-
2012
- 2012-03-20 WO PCT/KR2012/001978 patent/WO2012138064A2/ko active Application Filing
- 2012-03-20 JP JP2014503588A patent/JP2014513288A/ja active Pending
- 2012-03-20 US US14/009,779 patent/US20140021938A1/en not_active Abandoned
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20030069530A (ko) * | 2002-02-21 | 2003-08-27 | 한국과학기술원 | 적외선 펄스폭변조 구동방식을 이용한 위치 감지시스템 및방법 |
JP2006214834A (ja) * | 2005-02-02 | 2006-08-17 | Seiko Epson Corp | 検査プローブ、光学パネルの検査装置、光学パネルの検査方法 |
KR20080072044A (ko) * | 2005-11-10 | 2008-08-05 | 니혼 하츠쵸 가부시키가이샤 | 콘택트 유닛 및 검사시스템 |
KR20100095189A (ko) * | 2009-02-20 | 2010-08-30 | 마이크로 인스펙션 주식회사 | 터치패널의 검사장치 |
Also Published As
Publication number | Publication date |
---|---|
WO2012138064A2 (ko) | 2012-10-11 |
JP2014513288A (ja) | 2014-05-29 |
KR101089846B1 (ko) | 2011-12-05 |
US20140021938A1 (en) | 2014-01-23 |
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