WO2012111955A3 - 피반사체 수평측정장치 및 수평측정방법 - Google Patents
피반사체 수평측정장치 및 수평측정방법 Download PDFInfo
- Publication number
- WO2012111955A3 WO2012111955A3 PCT/KR2012/001097 KR2012001097W WO2012111955A3 WO 2012111955 A3 WO2012111955 A3 WO 2012111955A3 KR 2012001097 W KR2012001097 W KR 2012001097W WO 2012111955 A3 WO2012111955 A3 WO 2012111955A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- light
- optical module
- light source
- reflective plate
- optical
- Prior art date
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C9/00—Measuring inclination, e.g. by clinometers, by levels
- G01C9/02—Details
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
본 발명에서는 광원, 광원으로부터 출사되는 광을 광원으로 반사하는 반사판, 광원과 반사판 사이에 형성되는 광경로에 배치되는 제 1 광학모듈 및 제 2 광학모듈 및 광을 수광하는 수광부를 포함하고, 제 1 광학모듈은 광원으로부터 출사되는 광을 투과시켜 제 2 광학모듈로 입사시키고, 제 2 광학모듈을 투과하거나 또는 제 2 광학모듈에 의해 반사된 광을 수집하여 상기 수광부로 반사하고, 제 2 광학모듈은 반사판으로부터 반사된 광을 투과시켜 제 1 광학모듈로 입사하거나 또는 제 1 광학모듈을 투과한 광을 피반사체로 반사시킨 후 피반사체로부터 반사된 광을 수집하여 제 1 광학모듈로 반사하는 피반사체 수평측정장치가 제공된다.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2011-0013409 | 2011-02-15 | ||
KR1020110013409A KR101250007B1 (ko) | 2011-02-15 | 2011-02-15 | 피반사체 수평측정장치 및 수평측정방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2012111955A2 WO2012111955A2 (ko) | 2012-08-23 |
WO2012111955A3 true WO2012111955A3 (ko) | 2012-12-20 |
Family
ID=46673031
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/KR2012/001097 WO2012111955A2 (ko) | 2011-02-15 | 2012-02-14 | 피반사체 수평측정장치 및 수평측정방법 |
Country Status (2)
Country | Link |
---|---|
KR (1) | KR101250007B1 (ko) |
WO (1) | WO2012111955A2 (ko) |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05312731A (ja) * | 1992-05-07 | 1993-11-22 | Hitachi Ltd | 外観検査装置 |
JPH095059A (ja) * | 1995-06-20 | 1997-01-10 | Nikon Corp | 平面度測定装置 |
JPH0979831A (ja) * | 1995-09-13 | 1997-03-28 | Tokimec Inc | 路面撓み量測定装置及び方法 |
KR100584080B1 (ko) * | 2006-03-06 | 2006-05-29 | 주식회사 삼보기술단 | 레이저를 이용한 교량의 실시간 안전진단장치 및 방법 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06100450B2 (ja) * | 1987-02-09 | 1994-12-12 | 原田電子工業株式会社 | ひずみ測定装置 |
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2011
- 2011-02-15 KR KR1020110013409A patent/KR101250007B1/ko active IP Right Grant
-
2012
- 2012-02-14 WO PCT/KR2012/001097 patent/WO2012111955A2/ko active Application Filing
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05312731A (ja) * | 1992-05-07 | 1993-11-22 | Hitachi Ltd | 外観検査装置 |
JPH095059A (ja) * | 1995-06-20 | 1997-01-10 | Nikon Corp | 平面度測定装置 |
JPH0979831A (ja) * | 1995-09-13 | 1997-03-28 | Tokimec Inc | 路面撓み量測定装置及び方法 |
KR100584080B1 (ko) * | 2006-03-06 | 2006-05-29 | 주식회사 삼보기술단 | 레이저를 이용한 교량의 실시간 안전진단장치 및 방법 |
Also Published As
Publication number | Publication date |
---|---|
KR101250007B1 (ko) | 2013-04-03 |
WO2012111955A2 (ko) | 2012-08-23 |
KR20120093691A (ko) | 2012-08-23 |
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