WO2012111955A3 - 피반사체 수평측정장치 및 수평측정방법 - Google Patents

피반사체 수평측정장치 및 수평측정방법 Download PDF

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Publication number
WO2012111955A3
WO2012111955A3 PCT/KR2012/001097 KR2012001097W WO2012111955A3 WO 2012111955 A3 WO2012111955 A3 WO 2012111955A3 KR 2012001097 W KR2012001097 W KR 2012001097W WO 2012111955 A3 WO2012111955 A3 WO 2012111955A3
Authority
WO
WIPO (PCT)
Prior art keywords
light
optical module
light source
reflective plate
optical
Prior art date
Application number
PCT/KR2012/001097
Other languages
English (en)
French (fr)
Other versions
WO2012111955A2 (ko
Inventor
서봉민
이중의
Original Assignee
Seo Bong Min
Lee Jung Eui
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seo Bong Min, Lee Jung Eui filed Critical Seo Bong Min
Publication of WO2012111955A2 publication Critical patent/WO2012111955A2/ko
Publication of WO2012111955A3 publication Critical patent/WO2012111955A3/ko

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C9/00—Measuring inclination, e.g. by clinometers, by levels
    • G01C9/02—Details

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

본 발명에서는 광원, 광원으로부터 출사되는 광을 광원으로 반사하는 반사판, 광원과 반사판 사이에 형성되는 광경로에 배치되는 제 1 광학모듈 및 제 2 광학모듈 및 광을 수광하는 수광부를 포함하고, 제 1 광학모듈은 광원으로부터 출사되는 광을 투과시켜 제 2 광학모듈로 입사시키고, 제 2 광학모듈을 투과하거나 또는 제 2 광학모듈에 의해 반사된 광을 수집하여 상기 수광부로 반사하고, 제 2 광학모듈은 반사판으로부터 반사된 광을 투과시켜 제 1 광학모듈로 입사하거나 또는 제 1 광학모듈을 투과한 광을 피반사체로 반사시킨 후 피반사체로부터 반사된 광을 수집하여 제 1 광학모듈로 반사하는 피반사체 수평측정장치가 제공된다.
PCT/KR2012/001097 2011-02-15 2012-02-14 피반사체 수평측정장치 및 수평측정방법 WO2012111955A2 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2011-0013409 2011-02-15
KR1020110013409A KR101250007B1 (ko) 2011-02-15 2011-02-15 피반사체 수평측정장치 및 수평측정방법

Publications (2)

Publication Number Publication Date
WO2012111955A2 WO2012111955A2 (ko) 2012-08-23
WO2012111955A3 true WO2012111955A3 (ko) 2012-12-20

Family

ID=46673031

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2012/001097 WO2012111955A2 (ko) 2011-02-15 2012-02-14 피반사체 수평측정장치 및 수평측정방법

Country Status (2)

Country Link
KR (1) KR101250007B1 (ko)
WO (1) WO2012111955A2 (ko)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05312731A (ja) * 1992-05-07 1993-11-22 Hitachi Ltd 外観検査装置
JPH095059A (ja) * 1995-06-20 1997-01-10 Nikon Corp 平面度測定装置
JPH0979831A (ja) * 1995-09-13 1997-03-28 Tokimec Inc 路面撓み量測定装置及び方法
KR100584080B1 (ko) * 2006-03-06 2006-05-29 주식회사 삼보기술단 레이저를 이용한 교량의 실시간 안전진단장치 및 방법

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06100450B2 (ja) * 1987-02-09 1994-12-12 原田電子工業株式会社 ひずみ測定装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05312731A (ja) * 1992-05-07 1993-11-22 Hitachi Ltd 外観検査装置
JPH095059A (ja) * 1995-06-20 1997-01-10 Nikon Corp 平面度測定装置
JPH0979831A (ja) * 1995-09-13 1997-03-28 Tokimec Inc 路面撓み量測定装置及び方法
KR100584080B1 (ko) * 2006-03-06 2006-05-29 주식회사 삼보기술단 레이저를 이용한 교량의 실시간 안전진단장치 및 방법

Also Published As

Publication number Publication date
KR101250007B1 (ko) 2013-04-03
KR20120093691A (ko) 2012-08-23
WO2012111955A2 (ko) 2012-08-23

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