WO2012041687A1 - Procédé, moyen et système d'acquisition de paramètres de position - Google Patents

Procédé, moyen et système d'acquisition de paramètres de position Download PDF

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Publication number
WO2012041687A1
WO2012041687A1 PCT/EP2011/065742 EP2011065742W WO2012041687A1 WO 2012041687 A1 WO2012041687 A1 WO 2012041687A1 EP 2011065742 W EP2011065742 W EP 2011065742W WO 2012041687 A1 WO2012041687 A1 WO 2012041687A1
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WO
WIPO (PCT)
Prior art keywords
plane
imaging device
emitting
light beams
calculating
Prior art date
Application number
PCT/EP2011/065742
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English (en)
Inventor
Lei Ming Xu
Dan Yu
Original Assignee
Siemens Aktiengesellschaft
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Aktiengesellschaft filed Critical Siemens Aktiengesellschaft
Publication of WO2012041687A1 publication Critical patent/WO2012041687A1/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C11/00—Photogrammetry or videogrammetry, e.g. stereogrammetry; Photographic surveying
    • G01C11/04—Interpretation of pictures
    • G01C11/30—Interpretation of pictures by triangulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C3/00—Measuring distances in line of sight; Optical rangefinders
    • G01C3/02—Details
    • G01C3/06—Use of electric means to obtain final indication
    • G01C3/08—Use of electric radiation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/06—Systems determining position data of a target
    • G01S17/46—Indirect determination of position data
    • G—PHYSICS
    • G08—SIGNALLING
    • G08G—TRAFFIC CONTROL SYSTEMS
    • G08G1/00—Traffic control systems for road vehicles
    • G08G1/01—Detecting movement of traffic to be counted or controlled
    • G08G1/04—Detecting movement of traffic to be counted or controlled using optical or ultrasonic detectors
    • G—PHYSICS
    • G08—SIGNALLING
    • G08G—TRAFFIC CONTROL SYSTEMS
    • G08G5/00—Traffic control systems for aircraft, e.g. air-traffic control [ATC]
    • G08G5/06—Traffic control systems for aircraft, e.g. air-traffic control [ATC] for control when on the ground

Definitions

  • the present invention relates to the field of automatic measurement, and in particular to a technology for acquiring location parameters.
  • imaging devices are widely used in various scenarios. For example, automatic number identification, speed monitoring and traffic capacity monitoring all require the use of imaging devices.
  • the installation costs of infrastructures become a serious issue in traffic solutions based on images, and this issue is especially prominent in scenarios that are very sensitive to the installation parameters of the imaging devices.
  • the object of the present invention is to provide a method, means and system for acquiring location parameters so as to
  • a further object of the present invention is to provide a method for judging the rotation of an imaging device about a optical axis, emitting means, an imaging device and a system for acquiring location parameters.
  • the embodiments of the present invention provide the following technical solutions so as to solve the above technical problems.
  • a method for acquiring location parameters is provided by the embodiments of the present invention, said method
  • emitting by emitting means at least two light beams, with said light beams irradiating on a plane A to form light spots ;
  • calculating by calculating means the location parameters of an object to be measured according to said location.
  • the embodiments of the present invention further provide a method for judging the rotation of an imaging device about a optical axis, which method comprises:
  • emitting by emitting means at least two light beams, with said light beams irradiating on a plane A to form light spots, wherein said light beams meet the following
  • the calculating means determining said plane A by a plane formula according to the location of said images in said image plane and the location of the emitting points of said light beams, and calculating the rotation angle of said imaging device about its optical axis according to the formula for included angle between a line and a plane so as to judge whether or not said imaging device is rotated about its optical axis; wherein, the origin of said first coordination system is located at the light center of said imaging device, the z axis of said first coordinate system is located on the optical axis of said imaging device, the x axis of said first coordinate system is perpendicular to said z axis and located in the horizontal plane of said imaging device, and the y axis of said first coordinate system is perpendicular to the horizontal plane of said imaging device.
  • the embodiments of the present invention further provide emitting means for installation on an imaging device, with said emitting means comprising at least two light beam emitting members, and if a first coordinate system is taken as reference, then said at least two light beam emitting members meet the following conditions:
  • the z axis of said first coordinate system is located on the optical axis of said imaging device, the origin is located at the light center of said imaging device, the x axis is located in the horizontal plane of said imaging device and perpendicular to said z axis, and the y axis is perpendicular to the horizontal plane of said imaging device.
  • the embodiments of the present invention further provide an imaging device, which imaging device comprises:
  • a lens and an image plane for acquiring images of light spots formed by light beams on a plane A;
  • detecting means for detecting the location of the images of said light spots in said image plane
  • calculating means for calculating the location parameters of an object to be measured according to the location
  • the embodiments of the present invention further provide a system for acquiring location parameters, which system comprises:
  • emitting means for emitting at least two light beams, with said light beams forming light spots on a plane A;
  • imaging means for acquiring images of said light spots on an image plane
  • detecting means for detecting the location of the images acquired by said imaging means in the image plane; and calculating means for calculating the location parameters of an object to be measured according to the location
  • the location parameters of objects to be measured can be obtained by automatic measurements, thus avoiding the costs and errors involved in manual measurement, and improving the automation of the system.
  • Fig. la is a schematic flow chart of the procedure of a method for acquiring location parameters provided by the embodiments of the present invention.
  • Fig. lb is a schematic view of the installation of emitting means provided by the embodiments of the present invention.
  • Fig. lc is a schematic view of the installation of another emitting means provided by the embodiments of the present invention.
  • Fig. 2 is a schematic flow chart of the procedure of a method for judging the rotation of an imaging device about a optical axis, provided by the embodiments of the present invention
  • Fig. 3 is a schematic structural view of emitting means provided by the embodiments of the present invention.
  • Fig. 4 is a schematic structural view of an imaging device provided by the embodiments of the present invention.
  • Fig. 5 is a schematic structural view of a data
  • Fig. 6 is a schematic structural view of a system for acquiring location parameters, provided by the embodiments o the present invention.
  • a method and means for acquiring location parameters provided by the embodiments of the present invention, for example, can be applied in various ITS applications so as to automatically acquire the installation parameters of an imaging device, and can further configure the installation parameters automatically.
  • the embodiments of the present invention can be applied in various ITS applications so as to automatically acquire the installation parameters of an imaging device, and can further configure the installation parameters automatically.
  • the installation parameters of the imaging device in the ITS belong to one type of location parameter .
  • Fig. la is a schematic flow chart of the procedure of a method for acquiring location parameters, provided by the embodiments of the present invention.
  • an imaging device is used as the object to be measured, i.e. it is required to measure the installation parameters of the imaging device.
  • the method provided by this embodiment can further be applied in other measurement scenarios, for example, installing emitting means and imaging means together onto an object to be
  • the method provided by this embodiment comprises :
  • Step 101 the emitting means emits light beams.
  • the emitting means for example, is installed on the imaging device.
  • the emitting means for example, is installed on the imaging device.
  • this emitting means can be fixed on a
  • bracket, and this bracket can be flexibly installed on the imaging device, i.e. this bracket can be installed, removed or adjusted conveniently.
  • this emitting means can further be fixed on the imaging device directly .
  • the emitting means is fixed on the bracket, and thus it can be installed and removed flexibly, so that it can be used during the adjustment or installation of the imaging device, and after the adjustment or installation of the imaging device is completed this emitting means can be removed to be used for the adjustment and installation of other imaging devices which in turn saves costs.
  • the emitting means can be a laser emitter. Furthermore, this emitting means can emit light beams of specific color, i.e. light beams of specific wavelength, to meet various requirements. For example, this emitting means can emit red light beams, so that the light spots formed by the light beams irradiating on a surface have sufficiently remarkable difference from the surface, which is more advantageous for identifying the light spots.
  • this emitting means can emit yellow light beams, so that the light beams have stronger penetration power so as to form light spots on a surface irradiated by the light beams even in areas with a poor environment.
  • a laser emitter can be used to obtain clearer images and improve measurement accuracy, and it can also be used in situations where the distance between the imaging device and the irradiation plane is relatively long.
  • the irradiation plane of the light beams is the road surface of a street and can also be the surface of other objects, such as the surface of a building .
  • one emitting means when one emitting means can only emit one light beam, there are at least two emitting means; and when one emitting means can emit at least two light beams, there can be one or more emitting means and at least two light beams are emitted altogether.
  • one emitting means when one emitting means can only emit one light beam, there are at least two emitting means; and when one emitting means can emit at least two light beams, there can be one or more emitting means and at least two light beams are emitted altogether.
  • the situation where one emitting means only emits one light beam is taken for example to illustrate.
  • Step 102 the imaging means acquires an image of a light spot in an image plane.
  • the imaging means is an imaging device or it is considered to be integrated in an imaging device.
  • the imaging means acquires the image of the light spot on the image plane by imaging.
  • Step 103 the processing means detects the location of the images of the light spots in the image plane.
  • the imaging device can detect the location of the light spot in the image.
  • the imaging device can detect the location of the light spot by itself, i.e. integrating the processing means in the imaging device; and if the processing capability of the imaging device is poor, then the image of the imaging device can be processed by an external device to detect the location of the light spot, i.e. the processing means is provided outside the imaging device.
  • Step 104 the calculating means calculates the location parameters of an object to be measured according to the detected location of the image.
  • the location parameters are the installation parameters of this imaging device.
  • installation parameters can be obtained by completing
  • the calculating means is provided outside the imaging device; and if the processing capability of the imaging device is strong, then the particular calculations can be done by the imaging device itself to obtain the installation parameters, i.e. the calculating means is integrated in this imaging device.
  • emitting means can represent the emitting point of a light beam and that the emitting point is located in the lens plane of the imaging device, i.e. the plane passing through the light center and perpendicular to the optical axis.
  • the emitting point of the emitting means it is not required for the emitting point of the emitting means to be accurately located in the lens plane, and its projection location in the lens plane can be used as the location of the emitting point in the following
  • the installation parameters include height and angle.
  • the height for example, is the distance from the light center of the lens to the irradiation plane, and the angle, for example, is the
  • the angle can further include the rotation angle of the imaging device along the optical axis.
  • the above height and angle can be calculated from the
  • the calculation is relatively simple. Accordingly, in the following embodiments, the light beams being parallel to the imaging device is taken for example, and those skilled in the art can obtain a calculation method for the case that the light beams are not parallel to the optical axis of the imaging device according to the following examples.
  • Fig. lb the manner of calculation of installation parameters will be described in detail in the following.
  • three emitting means are installed around the imaging device by a bracket.
  • the origin which is represented by 0 in Fig. lb
  • z axis is along the optical axis direction
  • x axis is perpendicular to z axis and located on the horizontal plane of the imaging device
  • y axis is perpendicular to the horizontal plane of the imaging device.
  • the coordinates of the emitting point of the first emitting means A are (D, 0, 0)
  • the coordinates of the emitting point of the second emitting means B are (-D, 0, 0)
  • coordinates of the emitting point of the third emitting means C are (0, D, 0)
  • the light spots formed by the three emitting means on the irradiation plane are, respectively: the light spot produced by the first emitting means A is A' with the coordinates of A' being (xl, yl, zl), the light spot produced by the second emitting means B is B' with the coordinates of B' being (x2, y2, z2), and the light spot produced by the third emitting means C is C with the
  • the image of point A' is A'', with the coordinates of A'' being ( ⁇ ', yl ' , z' )
  • the image of point B' is B'', with coordinates of B'' being ( ⁇ 2', y2 ' , z' )
  • the image of point C is C" with the coordinates of C' being ( ⁇ 3', y3 ' , ⁇ ') ⁇
  • the intersection point of the optical axis and the irradiation plane is represented by D'
  • the intersection point of the optical axis and the image plane is represented by D' '
  • triangle formed by A'D'O and the triangle formed by ⁇ ' ⁇ ' ⁇ are similar triangles, the corresponding sides are
  • f is the focal length of the imaging device .
  • a (1/D) * (xl'+x2 ' ) / (x2 ' -xl ' )
  • b [1/ (D*y3 1 ) ] * [2*xl ' *x2 ' / (x2 ' - xl')-y3']
  • c (2/fD) *xl ' *x2 ' / (xl ' -x2 ' )
  • d l .
  • xl ' , x2 ' , and y3 ' are all known quantities.
  • the distance from the light center to the irradiation plane can be obtained by calculation according to the formula for distance from a point to a plane,
  • the included angle between the x axis and the irradiation plane can also be obtained by calculation
  • the above given calculation method is only an example, and the above height and angle can also be obtained by calculation according to the location of the light spots on the image plane by other calculation methods.
  • it is required to provide at least 3 emitting means, and of these emitting means, at least 3 emitting means cannot be located on the same straight line simultaneously, i.e. these 3 emitting means can form any geometrical shape other than a straight line. Also, these emitting means cannot be provided at the origin.
  • the x axis of the above coordinate system is parallel to the irradiation plane or the angle between the x axis of the above coordinate system and the irradiation plane can be ignored, it is required to provide at least 2 emitting means for the calculation of the above height and angle and there are at least 2 emitting means in these emitting means the y components of which are different.
  • the above at least 2 emitting means cannot be provided at the origin either.
  • emitting means P and Q are installed above and lateral to the imaging device respectively.
  • the coordinates of emitting means P are (D, 0, 0)
  • the coordinates of emitting means Q are (0, D, 0)
  • the corresponding light spots formed on irradiation plane M are P' (x4, y4, z4) and Q' (x5, y5, z5) respectively.
  • the images of light spots P' and Q' on the imaging plane are P'' ( ⁇ 4', y4 ' , z4') and Q'' ( ⁇ 5', y5 ' , z5') respectively.
  • irradiation plane M S ( 0, 0, f*D/x4' ) is also necessarily located on irradiation plane M.
  • the height is still calculated by the formula for distance from a point to a plane, and the
  • included angle between the optical axis and the irradiation plane M is still calculated by the formula for included angle between a line and a plane.
  • step 105 which performs subsequent processing according to the obtained installation parameters.
  • the ITS After the ITS learns the installation parameters, it can perform further subsequent processing, and there is variation in the subsequent process steps depending on different particular applications.
  • the ITS knows the size of the actual car number plate and can obtain the size of the car number plate in the image by calculation according to the installation
  • the method provided by this embodiment can be further used for judging whether or not there is a
  • the method provided by this embodiment is not limited to acquiring the installation parameters of the imaging device but can also be used for other measurement scenarios, and it requires this measurement scenario to include a member capable of imaging and light source. In specific scenarios, if the imaging can be performed on a member by other
  • the whole emitting means, imaging device, etc. can be viewed as a single measurement system to measure the location parameters of an object to be measured.
  • the distance from the object to be measured and the irradiation plane, the angle it makes with respect to the irradiation plane, and the rotation angle along the optical axis can be calculated according to the position relationship between the imaging device and the object to be measured.
  • the position relationship between the object to be measured and the imaging device generally will not change any more after the initial locations are
  • the irradiation plane in the above example may be a plane that is not totally flat, for example, a road surface may have irregular portions.
  • the installation parameters of the imaging device can be obtained automatically, which avoids the costs of manual acquisition, and at the same it is more accurate than the results obtained by manual
  • the embodiments of the present invention further provide a method for judging the rotation of an imaging device about a optical axis, which method comprises:
  • Step 201 the emitting means emits light beams.
  • one emitting means only emits one light beam, then the provision of at least 2 emitting means is needed.
  • the light beams emitted by the emitting means shine on an irradiation plane A and form light spots.
  • the emitting points thereof are all located at locations other than the origin and not on the same straight line, i.e. the emitting points of these at least 3 emitting means can form any geometrical shape other than a straight line, for example, form a triangle or
  • the light beams emitted by the emitting means are all parallel to the optical axis of the imaging device.
  • Step 202 the imaging device acquires images of the light spots in an image plane.
  • This step can refer to the exemplary embodiment shown in Fig. la, which will not be described here redundantly.
  • Step 203 the processing means detects the location of the above images in the image plane.
  • This step can refer to the embodiment shown in Fig. la, which will not be described here redundantly.
  • Step 204 the calculating means can judge the distances from the emitting means of the above parallel light beams to the light spots according to the location detected in step
  • step 203 proceeds to step 205, and if they are not equal, then proceed to step 206.
  • the location of the emitting means can be considered as the location of the emitting point of the light beam. If the coordinate system is set as in Fig. lb, then the distance from the emitting means to the light spot is the distance on the z axis.
  • step 204 can obtain the rotation angle of the imaging device along the optical axis by calculation according to the calculation method in the embodiment shown in Fig. lb, thus judging whether or not there is a rotation of the imaging device along the optical axis .
  • Step 205 it is determined that there is no rotation of the imaging device about the optical axis.
  • Step 206 it is determined that there is a rotation of the imaging device about the optical axis.
  • the embodiments of the present invention further provide emitting means, which emitting means is specially for installation on an imaging device and capable of being used for the acquisition of location
  • This means comprises: at least two light beam emitting members 301.
  • each light beam emitting member 301 emits at least one light beam.
  • this means can further comprise a bracket
  • each light beam emitting member 301 can be directly fixed on the imaging device or installed on the imaging device through the bracket 302.
  • this means includes 3 or more light beam emitting members, and the emitting points of these 3 or more light beam emitting members neither can be located at the origin nor can be located on the same straight line.
  • this means can include 2 or more light beam emitting members, and the emitting points of these 2 or more light beam emitting members cannot be located at the origin and the y components of their coordinates are different .
  • this means may only include 2 or more emitting means, and all the emitting points of these emitting means are not located at the origin and the y components of their coordinates are the same.
  • the light beam emitting members can emit light beams of specific color, i.e. light beams of specific wavelength, so as to enable the color of the light spot and that of the irradiation plane can be distinguished by the imaging device.
  • the light beam emitting member for example, is a laser emitter.
  • the position relationship of the light beam emitting member and the imaging device can enable the light beams emitted by the light beam emitting member to be parallel to the optical axis of the imaging device .
  • the location parameters of an imaging device or other objects to be measured can be obtained in conjunction with the imaging device, thus it can perform the subsequent operation or adjustment, and configuration, which avoids the inaccuracy and high costs of the acquisition with manual measurement .
  • the embodiments of the present invention provide an imaging device for acquiring location parameters.
  • This imaging device comprises:
  • detecting means 403 for detecting the location of images of light spots on the image plane 402.
  • this imaging device can further comprise calculating means 404 for calculating the location parameters of this imaging device or an object to be measured according to the location information detected by the detecting means 403. Particular calculation methods can refer to the
  • the calculating means 404 can include: a plane determining module 4041 for determining an irradiation plane according to the location of the emitting points of light beams and the image of the light spots in the image plane by way of a plane formula; and one of the
  • a distance module 4042 for calculating the distance from this imaging device to the irradiation plane according to the formula for distance from a point to a plane;
  • a first angle module 4043 for calculating the included angle between the optical axis of the imaging device and the irradiation plane according to the formula for included angle between a line and a plane;
  • a second angle module 4044 for calculating the rotation angle of this imaging device along its optical axis according to the formula for included angle between a line and a plane.
  • the location information detected by the detecting means 403 can be sent to an external calculating device, thus finally measuring the location parameters of the imaging device or the object to be measured .
  • the imaging device can further include emitting means provided by the embodiment as shown in Fig. 3.
  • the location parameters of the imaging device or the object to be measured can be obtained by calculation through the imaging device provided in this embodiment in conjunction with the emitting means provided by the embodiment shown in Fig. 3 via measuring the image of the light spot formed by the emitting means in the image device, thus avoiding the costs and errors of manual measurement.
  • the embodiments of the present invention provide a data processing means for acquiring location parameters, which data processing means comprises: a receiving module 501 for receiving the information from an imaging device; and a calculating module 502 for calculating the location parameters of the imaging device or an object to be measured according to the received information.
  • the information from the imaging device includes the location of the light spot on the image plane.
  • the specific calculation method of the calculating module 502 can refer to the methods provided by the examples shown in Figs, lb and lc.
  • the data processing means can further comprise a detecting module 503 for detecting the locations of the light spots in this image according to the image received by the receiving module 501; and hereby the
  • calculating module 502 is used for calculating the location parameters of the imaging device or the object to be measured according to the location information detected by the
  • the location information of the imaging device or the object to be measured can be obtained by calculation through the data processing means provided by this embodiment in conjunction with the emitting means and imaging device provided by the embodiments shown in Figs. 3 and 4 via measuring the imaging location of the light spot formed by the light beam emitted by the emitting means in the image plane of the imaging device, thus achieving the automatic acquisition of location information, which avoids the errors and costs of manual measurement.
  • Figs. 3, 4 and 5 can be combined with and referred to each other and the particular implementation can refer to the exemplary embodiments shown in Figs, la, lb, lc and Fig. 2.
  • a system for acquiring location parameters is provided by the embodiments of the present invention, this system comprising:
  • emitting means 601 for emitting at least 2 light beams.
  • the light beams emitted by the emitting means 601 irradiate on an irradiation plane and form light spots.
  • imaging means 602 for acquiring the images of the light spots on an image plane.
  • detecting means 603 for detecting the location of the images in the image plane acquired by the imaging means 602.
  • calculating means 604 for calculating the location parameters of an object to be measured according to the detected location.
  • the emitting means 601 for example, is a laser emitter and is capable of emitting light beams of specific color so as to enable the color of the light spots and that of the irradiation plane to be distinguished during the detection by the detecting means 603.
  • the emitting means can emit 2 or more light beams, and of these light beams, there are at least two light beams the emitting points of which are not located at the origin and the y components of whose coordinates are different.
  • the emitting means for example, needs to emit at least 3 light beams, and there are at least 3 light beams in these light beams the emitting points of which cannot be located at the origin and cannot be on the same straight line.
  • the light beams emitted by the emitting means 604 are preferably parallel to the optical axis of the imaging means 602.
  • the particular calculation method of the calculating means 604 can refer to the calculation method in the embodiments shown in Figs, la, lb, and lc.
  • calculating means 604 includes: a plane determining module 6041 for determining an irradiation plane according to the location of the emitting points of light beams and the image of the light spots in the image plane by way of a plane formula; and one of the following modules or any combination thereof :
  • a distance module 6042 for calculating the distance from an object to be measured to the irradiation plane according to the formula for distance from a point to a plane;
  • a first angle module 6043 for calculating the included angle between the optical axis of the imaging means 602 and the irradiation plane according to the formula for included angle between a line and a plane, and acquiring the included angle between the object to be measured and the irradiation plane according to the angle between the imaging means 602 and the object to be measured;
  • a second angle module 6044 for calculating the rotation angle of the imaging means 602 along its optical axis according to the formula for included angle between a line and a plane, and acquiring the rotation angle of the object to be measured along the optical axis of the imaging means 602 according to the angle between the imaging means 602 and the object to be measured.
  • the system for acquiring location parameters provided by this embodiment can also perform the method for judging the rotation angle provided by the embodiment shown in Fig . 2.
  • the location parameters of the imaging means in the system can be measured or the location parameters of an object to be measured can be measured.
  • the function of automatically obtaining location parameters can be achieved, which avoids the costs and errors of manual measurement.
  • this system is applied in the ITS, it can greatly improve the automation of the ITS and reduce the costs of ITS.

Abstract

La présente invention porte sur un procédé d'acquisition de paramètres de position, ledit procédé consistant : à émettre, par un moyen d'émission, au moins deux faisceaux de lumière, lesdits faisceaux de lumière étant incidents sur un plan A afin de former des points de lumière ; à acquérir, par un moyen d'imagerie, des images desdits points de lumière sur un plan d'image B ; à détecter, par un moyen de traitement, la position desdites images dans ledit plan d'image B et à calculer, par un moyen de calcul, les paramètres de position d'un objet à mesurer conformément à ladite position. La présente invention porte en outre sur un procédé d'évaluation de la rotation d'un dispositif d'imagerie autour d'un axe optique, sur un moyen d'émission, sur un dispositif d'imagerie et sur un système d'acquisition de paramètres de position. Au moyen de diverses solutions techniques décrites par la présente invention, une mesure automatique (c'est-à-dire une mesure automatique des paramètres de position d'un dispositif d'imagerie ou d'un objet à mesurer, y compris une hauteur, un angle et un angle de rotation de celui-ci) peut être obtenue. Par conséquent, la solution technique décrite par les modes de réalisation de la présente invention peut réduire les erreurs d'installation et, en même temps, peut également réduire les coûts d'installation, ce qui est avantageux pour développer des applications de trafic intelligentes.
PCT/EP2011/065742 2010-09-30 2011-09-12 Procédé, moyen et système d'acquisition de paramètres de position WO2012041687A1 (fr)

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CN2010105064247A CN102445148A (zh) 2010-09-30 2010-09-30 一种获取位置参数的方法、装置及系统
CN201010506424.7 2010-09-30

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CN103217143A (zh) * 2013-04-09 2013-07-24 上海电机学院 雷达装置及目标物体跟踪方法
CN103576724A (zh) * 2012-08-08 2014-02-12 联想(北京)有限公司 一种图像采集器、电子设备及光线调节方法
WO2014153430A1 (fr) * 2013-03-20 2014-09-25 Trimble Navigation Limited Navigation en intérieur grâce à la projection de plusieurs faisceaux laser
CN104535051A (zh) * 2014-12-01 2015-04-22 深圳先进技术研究院 一种投影机的安装定位方法及装置
CN106585546A (zh) * 2016-09-30 2017-04-26 张家港长安大学汽车工程研究院 一种汽车侧翻预警系统
US10643351B2 (en) 2013-03-20 2020-05-05 Trimble Inc. Indoor navigation via multi beam laser projection
CN112815842A (zh) * 2021-01-04 2021-05-18 福建汇川物联网技术科技股份有限公司 激光光斑落点标记、空间测量方法及测量系统
CN114814557A (zh) * 2022-05-24 2022-07-29 上海晶岳电子有限公司 一种静电枪及采用该静电枪进行静电放电测试的方法
CN115890028A (zh) * 2021-08-18 2023-04-04 深圳市创客工场科技有限公司 计算方法、激光加工设备及计算机可读存储介质

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WO2018180250A1 (fr) * 2017-03-28 2018-10-04 富士フイルム株式会社 Dispositif d'aide à la mesure, système d'endoscope et processeur
CN108828555B (zh) * 2017-05-18 2020-08-04 金钱猫科技股份有限公司 基于坐标变换的精确测量方法、系统及装置
CN109489552B (zh) * 2018-12-07 2021-06-25 深圳中广核工程设计有限公司 一种核反应堆稳压器视频检查装置的激光定位方法及系统
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CN103576724B (zh) * 2012-08-08 2016-08-10 联想(北京)有限公司 一种图像采集器、电子设备及光线调节方法
CN103576724A (zh) * 2012-08-08 2014-02-12 联想(北京)有限公司 一种图像采集器、电子设备及光线调节方法
CN103064085A (zh) * 2012-12-20 2013-04-24 深圳市华星光电技术有限公司 定位方法及定位装置
WO2014153430A1 (fr) * 2013-03-20 2014-09-25 Trimble Navigation Limited Navigation en intérieur grâce à la projection de plusieurs faisceaux laser
WO2014153429A1 (fr) * 2013-03-20 2014-09-25 Trimble Navigation Limited Système et procédé de navigation intérieure
US10165255B2 (en) 2013-03-20 2018-12-25 Trimble Inc. Indoor navigation via multi-beam laser projection
US10643351B2 (en) 2013-03-20 2020-05-05 Trimble Inc. Indoor navigation via multi beam laser projection
CN103217143A (zh) * 2013-04-09 2013-07-24 上海电机学院 雷达装置及目标物体跟踪方法
CN104535051A (zh) * 2014-12-01 2015-04-22 深圳先进技术研究院 一种投影机的安装定位方法及装置
CN106585546A (zh) * 2016-09-30 2017-04-26 张家港长安大学汽车工程研究院 一种汽车侧翻预警系统
CN106585546B (zh) * 2016-09-30 2019-03-22 张家港长安大学汽车工程研究院 一种汽车侧翻预警系统
CN112815842A (zh) * 2021-01-04 2021-05-18 福建汇川物联网技术科技股份有限公司 激光光斑落点标记、空间测量方法及测量系统
CN115890028A (zh) * 2021-08-18 2023-04-04 深圳市创客工场科技有限公司 计算方法、激光加工设备及计算机可读存储介质
CN114814557A (zh) * 2022-05-24 2022-07-29 上海晶岳电子有限公司 一种静电枪及采用该静电枪进行静电放电测试的方法

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