WO2012033341A3 - 초점 이탈 이미징을 이용한 미세 굴절계 - Google Patents

초점 이탈 이미징을 이용한 미세 굴절계 Download PDF

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Publication number
WO2012033341A3
WO2012033341A3 PCT/KR2011/006620 KR2011006620W WO2012033341A3 WO 2012033341 A3 WO2012033341 A3 WO 2012033341A3 KR 2011006620 W KR2011006620 W KR 2011006620W WO 2012033341 A3 WO2012033341 A3 WO 2012033341A3
Authority
WO
WIPO (PCT)
Prior art keywords
microrefractometer
target
light
defocusing
aperture
Prior art date
Application number
PCT/KR2011/006620
Other languages
English (en)
French (fr)
Other versions
WO2012033341A2 (ko
Inventor
윤상열
양성
Original Assignee
광주과학기술원
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 광주과학기술원 filed Critical 광주과학기술원
Priority to US13/703,805 priority Critical patent/US8649003B2/en
Publication of WO2012033341A2 publication Critical patent/WO2012033341A2/ko
Publication of WO2012033341A3 publication Critical patent/WO2012033341A3/ko

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/4133—Refractometers, e.g. differential
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

초점 이탈 이미징(defocusing imaging)을 이용한 미세 굴절계가 개시된다. 보다 상세하게는 본 발명은, 측정 대상 미세유체와 미리 굴절률을 알고 있는 기준유체가 포지셔닝되는 타겟과, 광원에서 방사되어 타겟을 통과한 광을 입사받는 대물 렌즈와, 대물 렌즈에 입사된 광의 광경로를 분기시키는 복수 개의 핀홀이 형성된 조리개 및 조리개를 통과한 광에 의해 굴절계의 이미지 평면상에 형성된 초점 이탈된 상을 촬상하기 위해 구비되는 카메라를 포함한다.
PCT/KR2011/006620 2010-09-08 2011-09-07 초점 이탈 이미징을 이용한 미세 굴절계 WO2012033341A2 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US13/703,805 US8649003B2 (en) 2010-09-08 2011-09-07 Microrefractometer using defocusing imaging

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2010-0087744 2010-09-08
KR1020100087744A KR101141099B1 (ko) 2010-09-08 2010-09-08 초점 이탈 이미징을 이용한 미세 굴절계

Publications (2)

Publication Number Publication Date
WO2012033341A2 WO2012033341A2 (ko) 2012-03-15
WO2012033341A3 true WO2012033341A3 (ko) 2012-05-03

Family

ID=45811077

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2011/006620 WO2012033341A2 (ko) 2010-09-08 2011-09-07 초점 이탈 이미징을 이용한 미세 굴절계

Country Status (3)

Country Link
US (1) US8649003B2 (ko)
KR (1) KR101141099B1 (ko)
WO (1) WO2012033341A2 (ko)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101159696B1 (ko) 2010-10-25 2012-06-25 광주과학기술원 다중 핀홀과 스팟 패턴 타겟을 이용한 굴절계
WO2014207809A1 (ja) * 2013-06-24 2014-12-31 株式会社島津製作所 屈折率測定装置
KR101712429B1 (ko) * 2015-09-24 2017-03-08 대한민국(관리부서 질병관리본부장) 표면-증강 라만 산란 기반의 탄저균 검출용 미세유체칩 및 이를 이용한 탄저균 검출 방법

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0518893A (ja) * 1991-07-12 1993-01-26 Matsushita Electric Ind Co Ltd 屈折率測定装置
JPH0718791B2 (ja) * 1989-11-30 1995-03-06 大塚電子株式会社 示差屈折率計
US20050062958A1 (en) * 2003-09-22 2005-03-24 Mitsuru Namiki Focus detecting unit, and refractive index measuring apparatus and non-contact thermometer using the same
US7365835B2 (en) * 2003-12-02 2008-04-29 California Institute Of Technology Dark-field laser-scattering microscope for analyzing single macromolecules

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4353649A (en) * 1979-07-06 1982-10-12 Tokyo Shibaura Denki Kabushiki Kaisha Apparatus for surface stress measurement of glass coating and transparent plastic product
US5309214A (en) * 1991-09-17 1994-05-03 Olympus Optical Co., Ltd. Method for measuring distributed dispersion of gradient-index optical elements and optical system to be used for carrying out the method
US5355211A (en) * 1993-04-02 1994-10-11 Leica Inc. Refractometer subassembly method and apparatus
JP2004150923A (ja) * 2002-10-30 2004-05-27 Atago:Kk 屈折計

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0718791B2 (ja) * 1989-11-30 1995-03-06 大塚電子株式会社 示差屈折率計
JPH0518893A (ja) * 1991-07-12 1993-01-26 Matsushita Electric Ind Co Ltd 屈折率測定装置
US20050062958A1 (en) * 2003-09-22 2005-03-24 Mitsuru Namiki Focus detecting unit, and refractive index measuring apparatus and non-contact thermometer using the same
US7365835B2 (en) * 2003-12-02 2008-04-29 California Institute Of Technology Dark-field laser-scattering microscope for analyzing single macromolecules

Also Published As

Publication number Publication date
WO2012033341A2 (ko) 2012-03-15
US20130208266A1 (en) 2013-08-15
KR101141099B1 (ko) 2012-05-02
KR20120025694A (ko) 2012-03-16
US8649003B2 (en) 2014-02-11

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