WO2011162417A1 - Dispositif de détection d'électrode défectueuse - Google Patents

Dispositif de détection d'électrode défectueuse Download PDF

Info

Publication number
WO2011162417A1
WO2011162417A1 PCT/JP2011/065130 JP2011065130W WO2011162417A1 WO 2011162417 A1 WO2011162417 A1 WO 2011162417A1 JP 2011065130 W JP2011065130 W JP 2011065130W WO 2011162417 A1 WO2011162417 A1 WO 2011162417A1
Authority
WO
WIPO (PCT)
Prior art keywords
light
infrared light
reflected light
welding
value
Prior art date
Application number
PCT/JP2011/065130
Other languages
English (en)
Japanese (ja)
Inventor
佳剛 川上
俊樹 野杁
Original Assignee
有限会社西原電子
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 有限会社西原電子 filed Critical 有限会社西原電子
Publication of WO2011162417A1 publication Critical patent/WO2011162417A1/fr

Links

Images

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00—Working by laser beam, e.g. welding, cutting or boring
    • B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
    • B23K26/03—Observing, e.g. monitoring, the workpiece
    • B23K26/032—Observing, e.g. monitoring, the workpiece using optical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

Definitions

  • the present invention relates to a battery, for example, a defective electrode detection device for detecting a welding defect of an aluminum alloy used for an electrode of a lithium ion battery.
  • lithium ion batteries are widely used as electric vehicle batteries that are attracting attention as one of the measures to prevent global warming.
  • Lithium-ion batteries are made of aluminum alloy for electrodes, in order to reduce the size and weight, make it easier to release ions, and two foil-like aluminum alloys are stacked and welded at appropriate locations. To manufacture. Laser welding is generally applied to welding in order to minimize the thermal effect on the peripheral parts.
  • in-vehicle batteries are different from general-purpose batteries used in home appliances, mobile phones, personal computers, etc., and are incomparable to general-purpose batteries due to vibration during driving and the temperature of the environment where the car is placed. Used in.
  • the aluminum alloy has high thermal conductivity and linear expansion coefficient, the welded portion and its peripheral portion are likely to be deformed by irradiation with laser light.
  • different welding quality conditions such as hole defects may occur due to the surface conditions of individual workpieces, for example, the occurrence of gaps and subtle differences in heat capacity at each joint location. It's easy to do. When distortion or a gap occurs in the workpiece, it causes a defect.
  • the inspection of the welding quality of the electrodes has been confirmed by visual inspection after welding, a destructive inspection such as a tensile test and measurement of a weld cross section.
  • the present invention has been made in the above background, and in the manufacturing process of an electrode used as an automobile battery or the like, the molten state of a workpiece to be welded is monitored in real time, and welding defects for all products are detected at an early stage. With the goal.
  • a defect electrode detection apparatus is an apparatus for detecting the presence or absence of defects in a molten state at a welded part of a work to be welded by laser light, wherein the work is a foil-like aluminum alloy.
  • a reflected light collecting unit that collects the reflected light scattered from the welding site, an infrared light collecting unit that collects the infrared light scattered from the welding site, and the reflected light collecting unit.
  • the reflected light sensor unit extracts reflected light of a predetermined wavelength from the collected light wave, converts the extracted light into an electrical signal, and sends the signal to the welding state determination processing unit, and the infrared light collecting unit collects the reflected light.
  • An infrared light sensor unit that extracts infrared light of a predetermined wavelength from the emitted light wave, converts the extracted light into an electrical signal, and sends the signal to a welding state determination processing unit; the reflected light and the infrared light Monitoring the time until the welded part is solidified with a signal based on A welding state determination processing unit, the welding state determination processing unit, a control / calculation unit that monitors detection intensity for each time of the reflected light and the infrared light, an output unit that outputs a calculation result, and a predetermined value Storage means for storing the threshold value, and first discriminating an abnormality in the peak value of the detection intensity for each reflected light time, and then discriminating an abnormality in the peak value of the detection intensity in each infrared light time It is characterized by that.
  • the defect electrode detecting device when the peak value of the detected intensity after the predetermined time T 1 elapses per the reflected light is the threshold value A than the predetermined, the detected intensity of infrared light When the peak value is greater than or equal to a predetermined threshold value B, it is determined as “a clear defect”, and when it is less than the threshold value B, it is determined as a “hidden defect”. Further, in the defect electrode detecting device according to claim 1 or claim 2, wherein the threshold time T 1 relating to the reflected light characterized in that it is a "2ms" later. The defect electrode detection apparatus according to claim 3, wherein a threshold value A of detection intensity related to the reflected light is “20”.
  • a threshold value B of the detection intensity related to the infrared light is "0.6".
  • the melting state determination processing unit is configured to detect infrared light when a peak value of detection intensity for the infrared light is equal to or greater than a predetermined threshold value B. when the difference between the fall time and the reflected light rise time is a predetermined value (absolute value) T less than 2 determines that the first abnormal pattern or the second failure pattern, the value (absolute value) T 2 or more In some cases, it is distinguished from the second abnormal pattern or the third abnormal pattern.
  • the defect electrode detection apparatus wherein the melting state determination processing unit is configured to detect infrared light when a peak value of detection intensity for the infrared light is equal to or greater than a predetermined threshold value B. fall time and a difference is less than a predetermined value (absolute value) T 2 of the reflected light rise time, the value difference between the infrared light rising time and the reflected light rise time is predetermined (absolute value) T 3 or more when determined that the first failure pattern, the value when the (absolute value) T less than 3, characterized in that to determine the second abnormal pattern.
  • the defect electrode detection apparatus wherein the melting state determination processing unit is configured to detect infrared light when a peak value of detection intensity for the infrared light is equal to or greater than a predetermined threshold value B.
  • a is the fall time and the difference of the reflected light rise time is a predetermined value (absolute value) T 2 or more, the value difference between the infrared light rising time and the reflected light rise time is predetermined (absolute value) T 3 or more when determined that the second failure pattern, the value when the (absolute value) T less than 3, characterized in that to determine the third abnormal pattern.
  • each of the light collecting portions is provided to be inclined with respect to a welding site.
  • the defect electrode detection apparatus according to claim 9 is characterized in that an inclination angle of each of the light collecting portions is 50 degrees.
  • the aluminum alloy used as the electrode of the lithium ion battery is made of a thin plate, if the workpiece is slightly distorted before or during welding when it is irradiated with laser light, the gap or the focus of the laser light will shift to the molten pool. Vigorous vibration (so-called “blow”) occurs.
  • this vibration energy does not affect the amount of heat, it is not detected by visible light that measures the amount of heat on the surface of the electrode work and infrared light that measures the amount of heat of the entire work. It is detected in the reflected light that measures the shape.
  • the appearance of electrode welding is the same as that of a good product, but since the penetration is shallow and an abnormality has occurred inside, for example, when used as an electrode of a lithium ion battery, due to vibration etc. It may cause leakage and cause an accident.
  • the present invention it is possible to inspect all of the hidden weld defects of the welding electrode which is not apparent in appearance but has an internal abnormality in-line, and 100% mechanically detect the workpiece weld defects in real time. it can. Therefore, defective electrodes can be eliminated, and hence defective products of, for example, lithium ion batteries can be eliminated, so that the reliability of product quality can be ensured.
  • welding defects can be detected upstream of the production line, loss can be suppressed, not only welding conditions but also the cause of defects up to the pretreatment stage can be analyzed instantaneously, and welding conditions can be quickly reset. Is possible.
  • (A) is a top view which shows embodiment of the defect electrode detection apparatus by this invention
  • (B) is the same front view.
  • determination process part of FIG. (A) is a conceptual diagram showing “vibration state of melted part”
  • (B) is a conceptual diagram showing “sputtering”
  • (C) is a conceptual diagram showing “perforation of upper plate”
  • (D) is “upper and lower plate holes”
  • (E) is a conceptual diagram when it is welded well
  • (F) is a conceptual diagram when it is not attached. It is a graph of the signal when the measurement signal of the welding workpiece
  • a visible light signal is shown. It is an image (drawing substitute photograph) when the measurement image of the welding workpiece obtained by the defective electrode detection apparatus according to the present invention is normal. It is a graph which shows the relationship between the visible light peak value as a comparative example, and a welding result. It is a graph which shows the relationship between a reflected light peak value and a welding result. It is a graph which shows the relationship between an infrared-light peak value and a welding result.
  • A is an explanatory diagram of the rise time of the reflected light with respect to the sputter waveform example
  • B is an explanatory diagram of the rise time and the fall time of the infrared light
  • C is a rise time of the reflected light with respect to the perforated waveform example
  • D is explanatory drawing of the rise time and fall time of the same infrared light. It is a graph showing the difference between the fall time of infrared light and the rise time of reflected light. It is a graph showing the difference between the rise time of infrared light and the rise time of reflected light.
  • FIG. 1 shows a schematic configuration diagram of a defective electrode detection apparatus 1.
  • the defective electrode detection device 1 includes a reflected light collecting unit 3, an infrared light collecting unit 5, a reflected light sensor unit 7, an infrared light sensor unit 9, and a welding state determination processing unit 11.
  • the infrared light sensor unit 9 includes an infrared light sensor unit 9a that detects infrared light of 1300 nm and an infrared light sensor unit 9b that detects infrared light of 1550 nm.
  • Reference numeral 13 denotes a laser beam emitting unit, which is suspended from the work 15 and irradiates the work 15 placed on a table (not shown) with laser light.
  • the work 15 is composed of an upper plate 15a and a lower plate 15b, and is placed on a table in a state where two foil-like aluminum alloys A3004 having a thickness of 0.1 mm are stacked.
  • the reflected light condensing unit 3 and the infrared light condensing unit 5 are each provided with an inclination angle ( ⁇ ) inclined by 50 degrees with respect to the surface of the work 15, and the condensing point is aligned with the laser light irradiation unit. .
  • the reflected light collecting unit 3 and the reflected light sensor unit 7 are connected by an optical fiber 17, and the infrared light collecting unit 5 and the infrared light sensor unit 9 are connected by optical fibers 19a and 19b. Connected.
  • the reflected light condensing unit 3 is provided with a condensing lens 4 a at the tip of a cylindrical cylinder 4 and condenses the reflected light scattered from the melting part 16 of the work 15.
  • the other end of the cylinder 4 is provided with another condenser lens 4b. Thereby, the reflected light obtained from the condensing point of the condensing lens 4a is sent to the condensing lens 4b as parallel light.
  • the reflected light sensor unit 7 includes a YAG laser light transmission filter 21, a visible light to infrared light photodiode 23, an amplifier 25, and an analog filter 27 connected in series. Extract wavelengths longer than infrared light.
  • the YAG laser light transmission filter 21 has a transmittance of 0% for light in the wavelength band of 400 nm to 900 nm and a transmittance for light of 900 nm or more is 90% or more, thereby cutting the visible light region.
  • the light generated with high intensity during laser light irradiation is mainly plasma light (visible light region) and laser scattered light (YAG light wavelength: 1064 nm), so if visible light is removed, only the laser light is detected. Can do.
  • the visible light to infrared light photodiode 23 has a sensitivity wavelength range of 320 nm to 1100 nm and is set to a maximum sensitivity wavelength of 960 nm, thereby extracting a wavelength of 1070 nm to 1090 nm, and the detected light is converted into an electric signal.
  • the measurement signal converted into the electrical signal is amplified by the amplifier 25, the noise component is cut by the analog filter 27, and sent to the molten state determination processing unit 11.
  • FIG. 3 shows the infrared light collecting unit 5.
  • the infrared light condensing unit 5 includes housings 29 and 30 each having a condensing lens.
  • a rectangular parallelepiped casing 31 is accommodated in the housing 29, and a condenser lens 33 and a condenser lens 35 are provided at both ends of the casing 31, respectively.
  • a rectangular parallelepiped housing 39 is provided in the housing 30 connected to the housing 29 via a filter 37.
  • a condensing lens 41 is provided at the front end of the casing 39, and a dichroic mirror 43 is provided at the other end with an inclination of 45 degrees.
  • the dichroic mirror 43 transmits visible light and reflects only light of 1300 nm to 1550 nm.
  • the infrared sensor unit 9 is connected to the housing 30. That is, as shown in FIG. 3, a housing 49 is provided orthogonal to the housing 30, and a rectangular parallelepiped casing 50 is provided in the housing 49. At both ends of the casing 50, an infrared light transmission filter 51 that transmits 1200 nm or more and an interference filter 55 that transmits only a wavelength of 1550 nm with a half-value width of 30 nm are provided, and a dichroic mirror 53 is inclined at 45 degrees in the middle. Provided. A condensing lens 57 condenses the light transmitted through the interference filter 55.
  • An infrared light photodiode 59, an amplifier 61, and an analog filter 63 are connected to each of the condensing lenses 57 in series, thereby forming an infrared light sensor unit 9b that detects infrared light of 1550 nm. .
  • the infrared light photodiode 59 has a sensitivity wavelength range of 900 nm to 1700 nm and is set to a maximum sensitivity wavelength of 1550 nm, whereby the detected light is converted into an electric signal.
  • the measurement signal converted into the electric signal is amplified by the amplifier 61, and then the noise component is cut by the analog filter 63 and sent to the molten state determination processing unit 11.
  • An interference filter 65 that transmits only a wavelength of 1300 nm with a half-value width of 30 nm is separately provided at a position orthogonal to the dichroic mirror 53.
  • a condensing lens 67 condenses the light transmitted through the interference filter 65.
  • An infrared light photodiode 69, an amplifier 71, and an analog filter 73 are connected in series with the condenser lens 67, thereby constituting an infrared light sensor unit 9 a that detects 1300 nm infrared light. .
  • the infrared light photodiode 69 has a sensitivity wavelength range of 900 nm to 1700 nm and is set to a maximum sensitivity wavelength of 1300 nm, whereby the detected light is converted into an electric signal.
  • the measurement signal converted into the electric signal is amplified by the amplifier 71, and then the noise component is cut by the analog filter 73 and sent to the molten state determination processing unit 11.
  • the focal length (f) of the condenser lens 4a of the condenser unit 3 is 70 mm, and the focal length (f) of the condenser lens 4b is 20 mm.
  • the focal length (f) of the condensing lens 33 of the infrared light condensing unit 5 is 300 mm
  • the focal length (f) of the condensing lens 35 is 150 mm
  • the focal length (f) of the condensing lens 41 is 60 mm.
  • the focal length (f) of the lens 57 was 30 mm
  • the focal length (f) of the condenser lens 67 was 30 mm.
  • FIG. 4 shows the welding state determination processing unit 11, which processes the detection intensity for each time for the signal based on the reflected light and infrared light transmitted.
  • the welding state determination processing unit 11 is connected to an A / D converter 75 that converts a signal based on the reflected light and infrared light transmitted to a digital signal, and the A / D converter 75 and a high-speed signal processor 79.
  • a field programmable gate array (FPGA) 77 that communicates with each other, a storage means 81 that is connected to the high-speed signal processor 79 and communicates with each other, and an alarm signal that is connected to the high-speed signal processor 79 and that is defective.
  • output means 83 for outputting.
  • the FPGA 77 is coupled with the A / D converter 75 to monitor the detected intensity of reflected light and infrared light for each time, and is coupled with the high-speed signal processor 79 to control and calculate data.
  • the storage means 81, the threshold value A threshold time for reflected light T 1 and the detection intensity is previously set and stored, also the threshold B of the detected intensity for the infrared light is previously set and stored.
  • the high-speed signal processor 79 calculates the difference T 2 between the infrared light fall time and the reflected light rise time, and the difference T 3 between the infrared light rise time and the reflected light rise time, which will be described in detail later.
  • the output means 83 emits an alarm sound when the threshold value A is exceeded or related to the threshold value B.
  • the laser beam is irradiated from the laser beam emitting unit 13 onto the required part of the workpiece 15, and the welding operation starts.
  • the reflected light scattered from the melting part 16 is converted into parallel light from the condensing point of the condensing lens 4 a and sent to the condensing lens 4 b and transmitted to the reflected light sensor unit 7 through the optical fiber 17.
  • the transmitted light is cut in the visible light region by the YAG laser light transmission filter 21, and a wavelength longer than the infrared light is extracted.
  • the extracted light is converted into an electrical signal by the visible light to infrared light photodiode 23, amplified, and then the signal from which the noise component has been cut by the analog filter 27 is sent to the welding state determination processing unit 11. It is done.
  • the infrared light scattered from the melting portion 16 becomes parallel light from the condensing point of the condensing lens 33 and is sent to the condensing lens 35 and is condensed again by the condensing lens 35, and then the filter 37.
  • the condenser lens 41 becomes a confocal point.
  • the light that has become parallel light by the condenser lens 41 is transmitted and removed by the dichroic mirror 43, and only the infrared light component of 1300 nm to 1550 nm is reflected in the direction of the infrared light sensor unit 9.
  • the reflected light is further attenuated by the infrared light transmission filter 51, the 1550 nm light component is transmitted by the dichroic mirror 53, and the 1300 nm light component is reflected.
  • the transmitted light of the former is transmitted by the interference filter 55 only at 1550 nm with a half-value width of 30 nm, and is condensed on the condensing lens 57, and is transmitted to the infrared light photodiode 59 as an electric signal. Is converted to This signal is further amplified by the amplifier 61, the noise component is cut by the analog filter 63, and transmitted to the welding state determination processing unit 11.
  • the infrared light sensor unit 9a the light reflected by the dichroic mirror 53 is transmitted by the interference filter 65 only at 1300 nm with a half-value width of 30 nm, and is condensed on the condensing lens 67, and the infrared light photodiode 69 is obtained. Is converted into an electrical signal. This signal is further amplified by the amplifier 71, the noise component is cut by the analog filter 73, and transmitted to the welding state determination processing unit 11.
  • FIG. 5 is a conceptual diagram of a welding defect.
  • 16a is a “melting part vibration state” in which the welding defect is visually invisible, but in FIG. 5B, 16b is a solution during welding.
  • “Spatter” in which a part of the spatter is scattered outside the melted portion 16
  • (C) 16c is "upper plate perforated” where only the upper plate 15a is overlaid
  • (D) 16d is overlaid.
  • Each of the upper plate 15a and the lower plate 15b indicates “upper and lower plate holes” in which holes are generated.
  • 2 indicates a laser beam.
  • “16 g” indicates the case where the welding is successfully performed in (E)
  • “16 e” indicates the case where the upper plate 15 a and the lower plate 15 b which are not welded are shown in (F).
  • the melted part vibration state 16a of (A) is characterized in that the surface is waved by the vibration of the melted part 16.
  • the melted part vibration state 16a in (A) is characterized in that the upper and lower plates 15a and 15b are welded.
  • FIGS. 6 to 9 Such weld defects in the melted part 16 are as shown in FIGS. 6 to 9 when viewed from waveform data, and as shown in FIGS. 10 to 13 as viewed from image data.
  • FIG. 6 shows the waveform data of the “molten portion vibration state”
  • FIG. 10 shows the image data.
  • FIG. 7 shows the waveform data of “spatter”
  • FIG. 11 shows the image data.
  • FIG. 8 shows the waveform data of “perforated upper plate”
  • FIG. 12 shows the image data.
  • FIG. 9 shows the waveform data of “upper and lower plate holes”, and
  • FIG. 13 shows the image data.
  • FIG. 14 shows waveform data in the case of good welding without welding defects
  • FIG. 15 shows the image data.
  • the X axis represents time (ms)
  • the Y axis represents detection intensity (voltage ⁇ predetermined coefficient).
  • the image data was taken with a high-speed video camera (manufactured by nc Corporation, maximum shooting speed: 200,000 f / s, shortest exposure time: 1 / 2,000,000 seconds) installed obliquely to the laser beam irradiation. .
  • Photographing is performed by using a high-power semiconductor laser with a wavelength of 940 nm for illumination through an interference filter that transmits a 962.5 nm band (half-value width 79 nm) in front of the lens, thereby suppressing halation due to laser reflected light and plume light, and a laser irradiation unit Was carried out so that it could be observed.
  • FIGS. 15 and 14 showing normal welding in the case of the image shown in FIG. 15, it is confirmed that the molten portion 16 is gradually formed immediately after the start of irradiation, and the diameter of the molten pool increases with time. Is done.
  • the detected intensity immediately after the start of irradiation is the highest at about 20, and after that, it changes at about 10 (FIG. 14 (A)). This is because immediately after the start of irradiation, since the reflectivity of the surface of the work 15 is high, strong laser reflected light can be obtained, but after that, the laser is absorbed inside the work 15 and the reflected laser light is reduced. As in the case of visible light, infrared light has a small detection intensity immediately after the start of irradiation, and gradually increases from around 3.8 ms, and a maximum detection intensity of about 0.25 is obtained at the end of irradiation (FIG. 14). (B)).
  • infrared light captures the heat input on the surface of the work 15, and the intensity increases as the surface temperature and the area of the melted part 16 increase due to laser absorption.
  • visible light has a low detection intensity immediately after the start of irradiation, and the waveform increases from around 4.2 ms, and saturates at a detection intensity of about 10 from around 8 ms to the end of irradiation (FIG. 14 ( C)).
  • the intensity tends to increase as the laser is absorbed by the work 15 in order to capture the plume accompanied by the metal vapor generated from the work 15 by the laser absorption of the visible light.
  • the reflected light waveform at this time is approximately the same as that during good welding from 0 ms to around 3.2 ms (see FIG. 14), but a detection intensity of 20 or more is detected around 3.2 ms to 5.3 ms. Attenuation occurs in the vicinity of about 5.3 ms to 5.8 ms, and a waveform having a detection intensity of about 20 is obtained again in the vicinity of about 5.8 ms to 8.4 ms. After that, it attenuates until the end of laser irradiation.
  • This waveform behavior corresponds to the vibration generation timing of the melting part 16 of the high-speed camera in FIG. Therefore, it can be said that the waveform of the measurement signal shown in FIG. 6, particularly the reflected light waveform, clearly captures the vibration phenomenon.
  • the infrared light waveform has almost the same shape as that during good welding, and there is almost no fluctuation in the waveform (FIGS. 6B and 14B).
  • the visible light waveform can be confirmed to increase or decrease in waveform shape almost in synchronization with the timing of the reflected light that captures the molten state vibration state, but the abnormal signal is small with a detection intensity of 10 or less, and it is difficult to distinguish from good welding ( FIG. 6 (C) and FIG. 14 (C)).
  • the reflected light captures the laser diffused light
  • the waveform change accompanying the increase in scattered light due to the fluctuation of the molten pool surface due to the vibration of the molten portion 16 can be clearly confirmed, whereas the visible light is This is because the increase and decrease of the plume is captured, so that it is not substantially affected by the minute vibration of the melting part 16, and the infrared light intensity is not detected because of the temperature and area change of the melting part 16.
  • the work 15 is a thin plate having a thickness of 0.1 mm, it is considered that the work 15 is easily distorted even under the same conditions, and vibration is caused by a slight shift of the gap and the laser focus.
  • FIG. 7 to FIG. 9 showing the welding abnormality and FIG. 14 showing the normal welding the presence or absence of the peak wave in any of reflected light, infrared light and visible light is remarkable on the waveform data. Differences are observed.
  • FIGS. 11 to 13 showing the welding abnormality and FIG. 15 showing the normal welding it is possible to confirm the presence of the welding defect from the appearance. Therefore, “sputter”, “upper plate hole”, and “upper and lower plate holes” that are “obvious defects” can be detected accurately and easily in real time.
  • the reflected light waveform is almost the same as that during good welding from the start of irradiation to around 7.5 ms, but a detected intensity of 60 or more is detected around 7.5 ms and attenuates around 8.8 ms (FIG. 7 ( A)).
  • the infrared light waveform is substantially the same as that during good welding from the start of irradiation to around 7.5 ms, but a detected intensity of 1.2 or more is detected around 7.5 ms and attenuates around 11.0 ms ( FIG. 7 (B)).
  • the visible light waveform is almost the same as that during good welding from the start of irradiation to around 7.5 ms, but a detected intensity of 40 or more is detected around 7.5 ms and attenuates around 9.5 ms (FIG. 7 ( C)).
  • the waveform behavior of reflected light, infrared light, and visible light corresponds to the timing of spatter generation by the high-speed camera, and therefore, welding defects (spatter) are discriminated based on the waveform of the measurement signal shown in FIG. Can do.
  • a waveform with a detection intensity of around 20 is obtained around 10.6 ms. This is because the laser 2 is reflected from the surface on the lower plate 15b side due to the occurrence of perforation, and the scattered object is detected (FIG. 8A).
  • the waveform of infrared light increases from around 3.2 ms, starts to increase more rapidly around 7.8 ms, and the detection intensity becomes 0.8 or more around 8.5 ms. After that, the detected intensity is attenuated to about 0.15 in the vicinity of 11.1 ms where the perforation of the upper plate 15a occurs.
  • the detected intensity is higher than that during good welding. This is because a gap is generated between the upper plate 15a and the lower plate 15b, so that only the upper plate 15a is heated, and heat tends to accumulate, and the plume emits light. It is thought that the strength has increased.
  • a waveform with a detection intensity of around 60 is obtained around 9.1 ms. Thereafter, the reflected light attenuates due to the occurrence of perforations, but a peak with a detection intensity of about 60 occurs around 10.8 ms. Further, a waveform with a detection intensity of about 40 is obtained again at around 13.1 ms where a hole is generated in the lower plate 15b (FIG. 9A). Infrared light has a waveform increasing from around 3.5 ms, and a detection intensity of 0.4 or more is obtained around 9.1 ms where perforation of the upper plate 15a occurs.
  • test conditions are the same as the implementation conditions described in the description of FIGS.
  • the number of test workpieces is 60 pieces.
  • devices having the same configuration as the reflected light collecting unit 3 and the reflected light sensor unit 7 used for collecting and detecting reflected light were used.
  • “ ⁇ ” indicates good welding
  • “ ⁇ ” indicates the molten state vibration state
  • “ ⁇ ” indicates spatter
  • “ ⁇ ” indicates the upper plate hole
  • “ ⁇ ” indicates the upper and lower plate holes.
  • FIG. 16 is a graph in which the peak value of visible light is plotted for each welding defect classified in FIG. 5 in order to evaluate the effectiveness of detection of the welding defect by visible light.
  • the peak values of “good welding” indicated by “ ⁇ ” and “vibration state of melted portion” indicated by “ ⁇ ” are distributed with a detected intensity of 30 or less from the middle stage to the latter stage of laser light irradiation.
  • “spatter” indicated by “x”, “perforated upper and lower plates” indicated by “ ⁇ ”, and “perforated upper plate” indicated by “ ⁇ ” are distributed with a detection intensity of about 20 to 100.
  • FIG. 17 is a graph in which the peak value of the reflected light is plotted for each welding defect classified in FIG. 5 in order to evaluate the detection effectiveness of the weld defect by the reflected light.
  • the reflected light shown in FIG. 17 there is a tendency that peak values are generated on all time axes regardless of the presence or absence of welding defects, and that a certain amount of time is required for melting the melted portion by laser light.
  • the earliest initial peak value can be adopted, and the initial peak value in this embodiment is “2.0” ms.
  • the peak value is detected at a detection intensity of less than “20”, “melting part vibration state” indicated by “ ⁇ ”, “spatter” indicated by “ ⁇ ”, “ ⁇ ”. Since the peaks of “upper and lower plate perforations” indicated by “ ⁇ ” and “upper plate perforation” indicated by “ ⁇ ” are all distributed at a detection intensity of about 20 to 100, the reflected light data in FIG. It can be used for discriminant evaluation.
  • FIG. 18 is a graph in which the peak value of infrared light is plotted for each welding defect classified in FIG. 5 in order to evaluate the effectiveness of detection of welding defects by infrared light.
  • “good welding” is dense with a detected intensity of “0.3” or less in the vicinity of about 12 ms to 15 ms, while the “molten vibration state” which is a welding abnormality is The detection intensity is concentrated below “0.6”, and “spatter”, “upper plate hole”, and “upper and lower plate holes” are concentrated above the detection intensity “0.8”. From these, the infrared light data in FIG. 18 can be used for discriminating evaluation of welding defects.
  • FIG. 19 is a graph in which the peak value of the acoustic signal is plotted for each welding defect classified in FIG. 5 in order to evaluate the detection effectiveness of the welding defect by the acoustic signal as a comparative example. This is because the acoustic change at the time of laser light irradiation is measured at an angle of 50 ° with respect to the irradiation surface and 100 mm from the laser irradiation part by using a super-directional microphone (AT815b type, manufactured by audio-technica, frequency characteristics: 50 to 20,000 Hz). The result was compared with the results of detection of welding defects by reflected light, visible light, and infrared light.
  • a super-directional microphone AT815b type, manufactured by audio-technica, frequency characteristics: 50 to 20,000 Hz
  • the light wave that can be used for discriminating a welding defect of a workpiece spot-welded with an aluminum alloy among the three light waves is two components of reflected light and infrared light, and visible light is used. You can't do it.
  • the order of reflected light and infrared light for discrimination of welding defects was examined. It is important to first determine whether or not there is an abnormality with respect to the peak value of the detection intensity of the reflected light according to FIGS. 6 to 9 described above, and then the abnormality is detected with respect to the peak value of the detection intensity of the infrared light. It is determined whether or not there is.
  • FIG. 20 is a flowchart of the algorithm employed under this assumption.
  • step 1 a peak value after 2 milliseconds (2 ms) from the start of irradiation of laser light with respect to reflected light is set as a detection target (S1, see FIG. 17).
  • the threshold time T 1 is best to two milliseconds (2 ms).
  • the detected intensity peak value of the reflected light is discriminated.
  • the detected intensity is less than “20” after “2 ms”, it is discriminated as “good welding” (S2a). That is, as shown in FIG. 17, in the case of “good welding”, the peak value is detected with a detection intensity of less than 20, and in this embodiment, it is optimal to set the detection intensity threshold A to “20”.
  • the detected intensity peak value of infrared light is discriminated, and when it is less than “0.6”, it is discriminated as a hidden defect (melted portion vibration state) (S3a).
  • the probability of appearance of “visible defects” increases, and this is determined at the initial stage of welding (S3b).
  • step 3b when “obvious defect” in step 3b is determined, the value (absolute value) of “infrared light fall time (ms) ⁇ reflected light rise time (ms)” is “0.8”. Whether it is less than or greater than is determined.
  • step 4a the value (absolute value) of “infrared light rise time (ms) ⁇ reflected light rise time (ms)” is determined (S4a).
  • the value of step 4a is “0.5” or more, it is determined as a “perforated defect” as the first abnormal pattern (S5a), and when it is less than “0.5”, “sputtering” as the second abnormal pattern. Or “perforated defect” (S5b).
  • step 3b when “0.8” or more in step 3b, the value (absolute value) of “infrared light rise time (ms) ⁇ reflected light rise time (ms)” is determined (S4b).
  • the value of step 4b is “0.5” or more, it is determined as either “spatter” or “perforated defect” as the second abnormal pattern (S5b), and when it is less than "0.5” It is determined as “spatter” as an abnormal pattern (S5c).
  • step 3a The basis for enabling discrimination of the hidden defect (melted portion vibration state) in step 3a (S3a) is shown in FIG. That is, as shown in FIG. 18, “good welding” is dense at a detection intensity of 0.3 or less in the vicinity of about 12 ms to 15 ms with respect to the detection intensity peak value of infrared light. It is based on the fact that the concentration is less than 0.6, and “spatter”, “upper plate hole”, and “upper and lower plate holes” are concentrated at a detection intensity of 0.8 or more. Therefore, in this embodiment, the infrared light detection intensity threshold B is optimally set to “0.6”.
  • FIG. 21A and FIG. 21B The basis for enabling discrimination by S5a to S5c is based on FIG. 21 to FIG.
  • FIG. 21A and FIG. 21B the behavior of the reflected light waveform and the infrared light waveform are similar when sputtering occurs, and the waveforms rise almost simultaneously.
  • FIGS. 21C and 21D when perforation occurs, the reflected light waveform tends to rise at the timing when the infrared light waveform falls.
  • “20” is used as the threshold value A for reflected light detection intensity and “0.6” is used as the threshold value B for infrared light detection intensity.
  • the time of reflected light detection intensity “20” or more is “reflected light rise time d”
  • the time of 1550 nm infrared light detection intensity “0.6” or more is “infrared light rise time e”.
  • the time less than “0.6” after the rise of infrared light is defined as “infrared light fall time f”.
  • the infrared light waveform represents the amount of heat of the melting part 16 and the fluctuation of the area of the melting part 16, and when the perforated 16c is generated, the melting part 16 is naturally lost, and the waveform is greatly lowered. That is, the infrared light waveform falls at the timing when the perforated 16c is generated (see FIG. 21D).
  • the reflected light waveform represents the fluctuation of the laser scattered light, and the laser beam 2 is absorbed by the melting part 16 when the melting part 16 is stable until immediately before the perforation 16c is generated.
  • the infrared light waveform represents the amount of heat of the melting part 16 and the fluctuation of the area of the melting part 16, and when the spatter 16b is scattered, there are a lot of scattered objects within the observation area of the infrared light sensor unit 9a instantaneously.
  • the scattered matter has substantially the same heat as that of the melted portion 16, and as a result, the amount of infrared light increases and the waveform greatly increases. That is, the infrared light waveform rises at the timing when the sputter 16b is generated (FIG. 21B).
  • the reflected light waveform a lot of scattered light is generated due to the abrupt behavior of the melting portion 16 when the sputter 16b is generated. Therefore, the reflected light also rises at the timing when the sputter 16b is generated (FIG. 21A). As described above, the infrared light rises and the reflected light tends to rise at the moment when the sputter 16b is generated.
  • the initial peak value is used for setting the detection intensity threshold value of the reflected light in order to easily catch a subtle intensity change due to the melted portion vibration state.
  • the light collecting portions 3 and 5 are obliquely arranged with respect to the work 15 and the reflected light and infrared light are measured from the oblique direction. Since the later scattered light can be caught more clearly, it is possible to discriminate subtle changes in intensity due to the melted portion vibration state.
  • the workpiece 15 is a workpiece obtained by spot welding a foil-like aluminum alloy, when irradiated with laser light, compared to a workpiece made of another material, even under irradiation under the same conditions, or before welding. There is a possibility that slight distortion occurs in the workpiece. As a result, gaps and laser beam defocusing occur between the upper and lower workpieces, and vigorous vibrations (“molten part vibration state”) occur in the molten pool. This intense vibration causes the reflected pool to scatter because the molten pool surface undulates, so that the intensity change at this time can be caught in the reflected beam. On the other hand, since the amount of heat of the molten part 16 is detected in the infrared light, unless the area of the molten pool changes significantly, it cannot be caught because it does not appear as a large waveform change.
  • the workpiece 15 according to the present invention is a workpiece obtained by spot welding a foil-like aluminum alloy, even a small gap greatly affects the welding strength. Therefore, although gap management is important, distortion or a gap during welding may easily occur in the work 15 due to laser light irradiation. If the workpiece 15 welded in such a state is used as an electrode, there is a risk of battery leakage due to insufficient welding, defects in electrical conductivity or operating voltage. In particular, if there is vibration or the like, the probability of generating the above-described defect increases.
  • the defect electrode detection device Since the defect electrode detection device according to the present invention is digitized including not only welding conditions but also welding phenomena and constructed an algorithm, it detects such welding defects such as minute distortions and gaps in real time as follows. can do. Therefore, it is effective for quality control of battery electrodes that require precision, and there is an effect that repair can be handled by early detection of welding defects. Specifically, it is as follows.
  • Welding defects can be 100% mechanically detected during welding by performing 100% inspection during the welding process. This eliminates the need for an inspection process downstream of the manufacturing process and contributes to cost reduction. I. Eliminating weld defects Because the investigation of the cause of weld defects is in-line inspection, it can be solved instantly. Moreover, since this elucidation is performed in an upstream process during laser welding, production loss is small. C. Line restoration Because it is possible to immediately investigate the cause of a welding defect, it is possible to quickly reset the conditions and remove the cause of the defect, thereby strengthening the quality control system.
  • the present invention is not limited to the embodiment described above.
  • the threshold value A regarding the detection intensity of the reflected light is not limited to “20”, and an appropriate threshold value can be adopted depending on the thickness, components, and the like of the aluminum alloy. This is shown in Table 3.
  • Table 3 shows data measured by changing only the threshold value of Step 1 (S1) in FIG. 20 and fixing other threshold values.
  • the numerical values of the sections where the vertical axis and the horizontal axis intersect are the evaluation items for the set threshold value.
  • the detection probability (%) is shown.
  • the threshold value B relating to the detection intensity of infrared light is not limited to “0.6”, and an appropriate threshold value can be adopted depending on the thickness, components, etc. of the aluminum alloy. This is shown in Table 4.
  • Table 4 shows data measured by changing only the threshold value of step 2 (S2b) in FIG. 20 and fixing other threshold values.
  • the numerical values of the sections intersected by the vertical axis and the horizontal axis are the evaluation items for the set threshold value.
  • the detection probability (%) is shown.
  • the aluminum alloy thickness can be appropriately adopted threshold by components like. This is shown in Tables 5 (1) and (2).
  • Table 5 (1), (2) is varied only thresholds T 1 in step 1 (S1) in FIG. 20, a data measured by fixing the other threshold, each section crossing the longitudinal axis and the horizontal axis
  • the numerical value of indicates the detection probability (%) of each evaluation item with respect to the set threshold.
  • the generation time of the reflected light peak value is “good welding”, “melted portion vibration state”, “spatter” when the threshold is set to “2.0” ms or more.
  • “Perforated” can be detected with a probability of “100%”, but if the threshold is set to “1.6” ms or less, the detection probability of “molten vibration state” will be “93%”, resulting in an error. This is not suitable because the probability of occurrence increases.
  • the threshold time T 2 of the infrared light as shown in Table 6, "good welding” Other than “0.8ms””melt unit vibration state", “sputter, either perforated” each "100%” Can be detected with a probability of.
  • the aluminum alloy thickness can be appropriately adopted threshold by components like.
  • the infrared light threshold time T 3 is “100%” for “good welding”, “melted portion vibration state”, and “sputtered or perforated” other than “0.5 ms”. Can be detected with a probability of.
  • the aluminum alloy thickness can be appropriately adopted threshold by components like.
  • the band of reflected light extracted as detection light in the wavelength range of 1070 nm to 1090 nm, the band of infrared light in the range of about 1300 nm ( ⁇ 15 nm), and the band of about 1550 nm ( ⁇ 15 nm) should be understood as examples. Yes, some width in front and back in the wavelength range is allowed.
  • the inclination of the light collecting portions 3 and 5 with respect to the work 15 is not limited to 50 degrees. In this case, if the tilt angle is larger than 50 degrees and stands up too much, the influence of the initial specular reflection of the reflected light becomes undesirably large, and if the tilt angle is smaller than 50 degrees, it is not desirable. There is a disadvantage that the detection intensity is weakened.
  • the apparatus and means constituting this can be selected as appropriate. It is.
  • the output unit may output any abnormal state.
  • the output unit may output an abnormal state on a screen, an input / output (IO) port, or other external output device.
  • the distance proximity or physical integrity of each of the above parts is not questioned. Absent.
  • the present invention can be used in the battery industry such as automobile batteries and other batteries.

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Plasma & Fusion (AREA)
  • Biochemistry (AREA)
  • Mechanical Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Laser Beam Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

Les défauts de soudure dans tous les types de produits peuvent être détectés tôt. Un dispositif de détection d'électrode défectueuse utilisé pour une pièce constituée d'un alliage d'aluminium stratifié comprend : une unité de collecte de lumière réfléchie servant à collecter la lumière réfléchie d'ondes lumineuse dispersées depuis une région de soudage ; une unité de collecte de lumière infrarouge servant à collecter la lumière infrarouge ; chaque unité-capteur destinée à extraire la lumière réfléchie et la lumière infrarouge ayant des longueurs d'onde prédéfinies des ondes lumineuses collectées dans chaque unité de collecte, à convertir les lumières extraites en signaux électriques et à transmettre les signaux électriques à une unité de traitement de détermination d'état de soudage (11) ; et l'unité de traitement de détermination d'état de soudage (11) destinée à contrôler chacun des signaux pendant le temps qui s'écoule avant la solidification de la région de soudage. L'unité de traitement de détermination d'état de soudage comprend un moyen de commande et de calcul destiné à contrôler les intensités détectées de la lumière réfléchie et de la lumière infrarouge sur une base par temps, un moyen de sortie et un moyen de mémorisation. Lorsque la valeur de crête de l'intensité détectée de la lumière réfléchie après qu'une durée prédéfinie de 2 ms s'est écoulée est une valeur seuil prédéfinie de 20 ou plus, l'unité de traitement de détermination d'état de soudage détermine une anomalie comme « défaut visible » si la valeur de crête de l'intensité détectée de la lumière infrarouge est une valeur seuil prédéfinie de 0,6 ou plus et comme « défaut invisible » si la valeur de crête de l'intensité détectée de la lumière infrarouge est inférieure à une valeur seuil de B.
PCT/JP2011/065130 2010-06-24 2011-06-24 Dispositif de détection d'électrode défectueuse WO2011162417A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2010-143580 2010-06-24
JP2010143580A JP5358775B2 (ja) 2010-06-24 2010-06-24 欠陥電極検出装置

Publications (1)

Publication Number Publication Date
WO2011162417A1 true WO2011162417A1 (fr) 2011-12-29

Family

ID=45371578

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2011/065130 WO2011162417A1 (fr) 2010-06-24 2011-06-24 Dispositif de détection d'électrode défectueuse

Country Status (2)

Country Link
JP (1) JP5358775B2 (fr)
WO (1) WO2011162417A1 (fr)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102013217039A1 (de) 2013-08-27 2015-03-05 Robert Bosch Gmbh Überwachung und Inspektion einer Batteriezelle mithilfe elektromagnetischer Wellen über transparente Bauteilkomponenten
CN110633682A (zh) * 2019-09-19 2019-12-31 合肥英睿系统技术有限公司 基于双光融合的红外图像的异常监测方法、装置、设备
WO2021214238A1 (fr) * 2020-04-23 2021-10-28 Precitec Gmbh & Co. Kg Procédé d'analyse d'un processus de soudage laser et système d'usinage laser
CN114769862A (zh) * 2022-03-28 2022-07-22 广州德擎光学科技有限公司 一种激光加工控制方法、装置和系统

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5971533B2 (ja) * 2012-05-15 2016-08-17 トヨタ自動車株式会社 溶接方法、溶接装置、及び電池の製造方法
KR101439758B1 (ko) * 2013-03-26 2014-09-16 주식회사 포스코 레이저 용접 결함 진단 장치 및 방법
US9863803B2 (en) 2015-03-10 2018-01-09 Technology Research Association For Future Additive Manufacturing Optical processing head having a plurality of optical fibers arranged to surround the light guide and 3D shaping apparatus

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003103386A (ja) * 2001-09-26 2003-04-08 Komatsu Ltd Ｙａｇレーザ溶接のモニタリング装置
JP2005223151A (ja) * 2004-02-05 2005-08-18 Taiyo Denki Kk デバイス端子溶接検査装置
JP2007098442A (ja) * 2005-10-05 2007-04-19 Toyota Motor Corp レーザ接合品質検査装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003103386A (ja) * 2001-09-26 2003-04-08 Komatsu Ltd Ｙａｇレーザ溶接のモニタリング装置
JP2005223151A (ja) * 2004-02-05 2005-08-18 Taiyo Denki Kk デバイス端子溶接検査装置
JP2007098442A (ja) * 2005-10-05 2007-04-19 Toyota Motor Corp レーザ接合品質検査装置

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102013217039A1 (de) 2013-08-27 2015-03-05 Robert Bosch Gmbh Überwachung und Inspektion einer Batteriezelle mithilfe elektromagnetischer Wellen über transparente Bauteilkomponenten
DE102013217039B4 (de) 2013-08-27 2021-12-02 Robert Bosch Gmbh Überwachung und Inspektion einer Batteriezelle mithilfe elektromagnetischer Wellen über transparente Bauteilkomponenten
CN110633682A (zh) * 2019-09-19 2019-12-31 合肥英睿系统技术有限公司 基于双光融合的红外图像的异常监测方法、装置、设备
CN110633682B (zh) * 2019-09-19 2022-07-12 合肥英睿系统技术有限公司 基于双光融合的红外图像的异常监测方法、装置、设备
WO2021214238A1 (fr) * 2020-04-23 2021-10-28 Precitec Gmbh & Co. Kg Procédé d'analyse d'un processus de soudage laser et système d'usinage laser
CN114769862A (zh) * 2022-03-28 2022-07-22 广州德擎光学科技有限公司 一种激光加工控制方法、装置和系统

Also Published As

Publication number Publication date
JP2012006036A (ja) 2012-01-12
JP5358775B2 (ja) 2013-12-04

Similar Documents

Publication Publication Date Title
JP5358775B2 (ja) 欠陥電極検出装置
JP3603843B2 (ja) レーザー溶接部の品質モニタリング方法およびその装置
CA2413930C (fr) Procede de detection et d'identification de defauts dans un cordon de soudure realise par faisceau laser
US9452544B2 (en) Method for monitoring cutting processing on a workpiece
US7863544B2 (en) Arrangement and method for the on-line monitoring of the quality of a laser process exerted on a workpiece
KR101240980B1 (ko) 레이저 용접 품질 검사 방법 및 장치
JP2000271768A (ja) Ｙａｇレーザ溶接部の品質モニタリング方法
JP2006247681A (ja) レーザ加工用モニタリング装置
JP3209097B2 (ja) レーザ溶接の品質検査方法およびその装置
JP2023514403A (ja) 加工物のレーザ溶接中に溶接された接続部を分析する方法
JP7390680B2 (ja) レーザ溶接品質検査の方法及びレーザ溶接品質検査装置
WO2018185973A1 (fr) Procédé et dispositif de surveillance de traitement au laser
JP3368427B2 (ja) レーザ加工状態計測装置
JP2007203322A (ja) 突合せ溶接部の良否検出方法および装置
De Keuster et al. Monitoring of high-power CO 2 laser cutting by means of an acoustic microphone and photodiodes
JP2017024046A (ja) レーザ溶接監視装置とレーザ溶接監視方法
JP5187121B2 (ja) レーザ加工装置およびレーザ加工方法
Beersiek On-line monitoring of keyhole instabilities during laser beam welding
JP4432282B2 (ja) レーザ溶接品質判定方法
CN115389528A (zh) 一种检测激光设备镜片状态的方法及装置
CN115476062A (zh) 一种激光外光路光束监控系统及方法
JP4793161B2 (ja) 突合せ溶接部の良否検査方法および装置
JP4210560B2 (ja) レーザ溶接モニタリング方法およびレーザ溶接モニタリング装置
Norman et al. Monitoring undercut, blowouts and root sagging during laser beam welding
JP2000061672A (ja) レーザ溶接の溶接状態検出方法

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 11798294

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 11798294

Country of ref document: EP

Kind code of ref document: A1