WO2011104881A1 - Procédé de rénovation de cellule solaire, procédé de fabrication de cellule solaire, cellule solaire fabriquée par ledit procédé de fabrication, dispositif de rénovation de cellule solaire, dispositif de fabrication et dispositif d'inspection de cellule solaire, et cellule solaire fabriquée par un procédé utilisant lesdits dispositifs - Google Patents

Procédé de rénovation de cellule solaire, procédé de fabrication de cellule solaire, cellule solaire fabriquée par ledit procédé de fabrication, dispositif de rénovation de cellule solaire, dispositif de fabrication et dispositif d'inspection de cellule solaire, et cellule solaire fabriquée par un procédé utilisant lesdits dispositifs Download PDF

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WO2011104881A1
WO2011104881A1 PCT/JP2010/053155 JP2010053155W WO2011104881A1 WO 2011104881 A1 WO2011104881 A1 WO 2011104881A1 JP 2010053155 W JP2010053155 W JP 2010053155W WO 2011104881 A1 WO2011104881 A1 WO 2011104881A1
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WIPO (PCT)
Prior art keywords
solar cell
solar
cell
voltage
leakage current
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PCT/JP2010/053155
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English (en)
Japanese (ja)
Inventor
岳生 相薗
英樹 岡島
Original Assignee
株式会社エヌエフ回路設計ブロック
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Priority to JP2012501609A priority Critical patent/JPWO2011104881A1/ja
Priority to PCT/JP2010/053155 priority patent/WO2011104881A1/fr
Publication of WO2011104881A1 publication Critical patent/WO2011104881A1/fr

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • H01L31/186—Particular post-treatment for the devices, e.g. annealing, impurity gettering, short-circuit elimination, recrystallisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
    • H01L31/042—PV modules or arrays of single PV cells
    • H01L31/0445—PV modules or arrays of single PV cells including thin film solar cells, e.g. single thin film a-Si, CIS or CdTe solar cells
    • H01L31/046—PV modules composed of a plurality of thin film solar cells deposited on the same substrate
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50—Manufacturing or production processes characterised by the final manufactured product

Definitions

  • the present invention relates to a method for repairing a solar cell that removes a short-circuited portion due to pinholes produced in the manufacturing process of the solar cell, a method for manufacturing a solar cell to which this repair method is applied, a solar cell manufactured by this manufacturing method, and a solar cell
  • the present invention relates to a repair device, a solar cell manufacturing device and an inspection device, and a solar cell using these devices in a manufacturing process.
  • a thin film type solar cell has, for example, a surface electrode (transparent), amorphous silicon (thin film silicon), and a back electrode made of metal laminated in order on a transparent substrate such as glass or plastic.
  • amorphous silicon has a p-type-i-type-n-type three-layer structure from the substrate side.
  • the transparent substrate side When light is irradiated from the transparent substrate side, the light passing through the transparent substrate and the surface electrode is amorphous silicon.
  • electricity is generated by generating electricity in the amorphous silicon.
  • amorphous silicon is positive on the p-type side and negative on the n-type side, and has diode characteristics.
  • defects such as pinholes may occur in the amorphous silicon when amorphous silicon is formed on the surface electrode in the manufacturing process. Then, when the back electrode is formed on the subsequent amorphous silicon, the electrode material may enter the pinhole, and a short-circuit portion (short) is generated between the front electrode and the back electrode at this portion.
  • the conversion efficiency of the thin film solar cell (the efficiency of converting the amount of light applied to the solar cell into electricity) may be reduced, and the performance of the thin film solar cell may be significantly degraded.
  • Patent Document 1 As a short-circuit part removal method for removing a short-circuit part of a thin-film solar cell, an application member having a plurality of point-like contact parts or an application having linear or planar contact parts as disclosed in Patent Document 1 There is known a method of removing a short-circuit portion by bringing a member into contact with an electrode of a solar battery cell to be subjected to short-circuit portion removal and applying a reverse voltage to the solar battery cell via these application members.
  • the distance between the position of the point contact portion and the position of the short-circuit portion can be reduced by greatly increasing the number of point contact portions of the application member.
  • the number of point-like contact portions increases, there is a problem that it takes a lot of time and labor to replace the point-like contact portions during maintenance.
  • it is necessary to allow a sufficient current to flow through all of the short-circuited portions at the same time which necessitates the use of a higher-power power supply device, which increases costs and increases the device.
  • the contact area of the linear or planar contact portion with respect to the electrode surface of the solar battery cell is increased, so that the electrode surface is damaged over a wide range. May reduce product value.
  • the solar cell 100 in recent thin-film solar cells, in order to increase the production yield, for example, as shown in FIG. 5B, the solar cell 100 is generally divided into a plurality (three in the illustrated example). is there. About division of a photovoltaic cell, it describes in patent documents 2, for example.
  • the same number of point-like contact portions may not be in contact with each of the divided solar cells. In some cases, the same reverse voltage cannot be applied.
  • FIG. 5B when the number of divisions of the solar battery cell 100 is “3”, if the number of point-like contact portions is “6”, two contact portions are obtained for each division cell.
  • the present invention has been made in view of the above circumstances, and a solar cell renovation method capable of efficiently performing a solar cell short-circuit removal process, a solar cell production method employing this refurbishment method, and this production method
  • An object of the present invention is to provide a solar cell manufactured by the above, a solar cell repair device, a solar cell manufacturing device, and an inspection device.
  • the invention according to claim 1 is a first step of applying a reverse voltage from a voltage applying means having a point-like contact portion that contacts a solar battery cell constituting the solar battery at one point, and the solar battery cell A second step of calculating a moving position of the voltage applying unit, and a third step of setting the position of the voltage applying unit with respect to the solar cell based on the moving position calculated in the second step. And a fourth step of measuring the leakage current flowing through the solar cell by applying the reverse voltage and ending the short-circuit removal process when the leakage current is less than or equal to a preset leakage current allowable value; It is characterized by comprising.
  • the number of the point-like contact portions that contact the solar battery cells at one point is the same as the number of the solar battery cells, or the A reverse voltage is applied by a probe unit having a number smaller than the number of solar cells, and the third step translates the probe unit along the longitudinal direction of the solar cells and It is characterized by moving it up and down.
  • the invention according to claim 3 is a first step of setting, as a parameter, a resistance value per unit length of the solar battery cells constituting the solar battery, and applying a reverse voltage to the solar battery cell based on the parameter.
  • a second step of calculating a moving position of the voltage applying means having a point-like contact portion to be applied, and setting the position of the voltage applying means with respect to the solar cell based on the moving position calculated in the second step A third step, a fourth step of applying a reverse voltage to the solar cell from the point-like contact portion of the voltage application means, and measuring a leakage current flowing through the solar cell by the application of the reverse voltage
  • a fifth step of ending the short-circuit removal process when the leakage current is equal to or less than a preset leakage current allowable value.
  • the first step further sets the number of divisions of solar cells as a parameter
  • the second step is set in the first step.
  • the moving position of the voltage applying means is calculated based on the parameter that has been set.
  • the invention according to claim 5 is the invention according to claim 3 or 4, wherein the second step is based on the parameter set in the first step (L / 2ND) ⁇ (1 / r) ⁇ ((V / A) -R) (Where N is the number of moving parts of the voltage application means and is an integer, L is the length of the solar battery cell, D is the number of divisions of the solar battery cell and is an integer, and r is the resistance value per unit length of the solar battery cell.
  • V is the maximum applied voltage of the solar battery cell
  • A is the limit current value of the solar battery cell
  • R is the parallel resistance value of the solar battery cell.
  • Invention of Claim 6 is the manufacturing method of the solar cell characterized by applying the repair method of the solar cell as described in any one of Claim 1 thru
  • Invention of Claim 7 is the manufacturing method of the solar cell characterized by applying the repair method of the solar cell of Claim 5 to the manufacturing process.
  • the invention according to claim 8 is a solar cell manufactured by the method for manufacturing a solar cell according to claim 6.
  • the invention according to claim 9 is a solar cell manufactured by the method for manufacturing a solar cell according to claim 7.
  • Invention of Claim 10 applies a reverse voltage to the photovoltaic cell which comprises a photovoltaic cell, the voltage application means which has a point-like contact part which contacts the said photovoltaic cell at one point, and the said photovoltaic cell
  • a moving position calculating means for calculating a moving position of the voltage applying means, and a position setting means for setting the position of the voltage applying means with respect to the solar cell based on the moving position calculated by the moving position calculating means.
  • a leakage current determination means for measuring a leakage current flowing through the solar cell by applying the reverse voltage and ending the process of removing the short circuit when the leakage current is equal to or less than a preset leakage current allowable value; It is characterized by comprising.
  • the invention according to claim 11 is the invention according to claim 10, wherein the voltage applying means comprises a probe unit having a plurality of point-like contact portions, and the probe unit is in contact with the solar battery cell at one point.
  • the number of point-like contact portions to be equal to or less than the number of the solar cells, and the position setting means translates the probe unit along the longitudinal direction of the solar cells, and On the other hand, it is characterized by having a moving mechanism for moving in the vertical direction.
  • Invention of Claim 12 has a parameter setting means which sets the resistance value per unit length of the photovoltaic cell which comprises a solar cell as a parameter, and the dotted
  • a voltage applying means ; a moving position calculating means for calculating a moving position of the voltage applying means relative to the solar cell based on the parameter; and the solar battery based on the moving position calculated by the moving position calculating means.
  • the position setting means for setting the position of the voltage application means with respect to the cell, and the leakage current flowing through the solar cell by the application of the reverse voltage was measured, and the leakage current was below a preset leakage current allowable value And a leakage current determination means for ending the process of removing the short-circuit portion.
  • the parameter setting means further sets the number of divided solar cells as a parameter
  • the moving position calculation means is set by the parameter setting means.
  • the moving position of the voltage applying means is calculated based on the parameter.
  • the movement position calculating means is based on the parameter set by the parameter setting means (L / 2ND) ⁇ (1 / r) ⁇ ((( V / A) -R) (Where N is the number of moving parts of the voltage application means and is an integer, L is the length of the solar cell, D is the number of cell divisions and is an integer, r is the resistance value per unit length of the solar cell, V Is the maximum applied voltage of the solar battery cell, A is the limit current value of the solar battery cell, and R is the parallel resistance value of the solar battery cell.)
  • N is the number of moving parts of the voltage applying means and is an integer
  • L is the length of the solar cell
  • D is the number of cell divisions and is an integer
  • r is the resistance value per unit length of the solar cell
  • V Is the maximum applied voltage of the solar battery cell
  • A is the limit current value of the solar battery cell
  • R is the parallel resistance value of the solar battery cell.
  • a fifteenth aspect of the invention is the invention according to the twelfth or thirteenth aspect, wherein the parameter setting means has an interface of display means and input means, displays parameters on the display means, and inputs the parameters. It is characterized by having.
  • the invention according to claim 16 is the invention according to claim 14, wherein the parameter setting means has an interface of display means and input means, and has a function of displaying parameters on the display means and inputting the parameters. It is characterized by that.
  • the invention described in claim 17 is a solar cell manufacturing apparatus in which the solar cell repair device according to any one of claims 10 to 13 and 16 is applied to a manufacturing process.
  • the invention described in claim 18 is a solar cell manufacturing apparatus characterized by applying the solar cell repairing device described in claim 14 to a manufacturing process.
  • the invention described in claim 19 is a solar cell manufacturing apparatus characterized by applying the solar cell repair device according to claim 15 to a manufacturing process.
  • the invention described in claim 20 is a solar cell inspection device to which the solar cell repair device according to any one of claims 10 to 13 and 16 is applied.
  • the invention described in claim 21 is a solar cell inspection device, to which the solar cell repair device described in claim 14 is applied.
  • the invention described in claim 22 is a solar cell inspection device, to which the solar cell repair device according to claim 15 is applied.
  • the invention according to claim 23 is a solar cell characterized by applying the device according to any one of claims 10 to 13 and 16 to a manufacturing process.
  • the invention according to claim 24 is a solar cell characterized by applying the apparatus according to claim 14 to a manufacturing process.
  • a twenty-fifth aspect of the invention is a solar cell, wherein the device according to the fifteenth aspect is applied to a manufacturing process.
  • the present invention it is possible to obtain the same effect as arranging a large number of point-like contact portions by one point-like contact portion per solar battery cell, so that periodic replacement of the point-like contact portions is performed easily and in a short time. This can reduce the cost required for maintenance.
  • the power supply device for applying reverse voltage can be a small-scale power supply, reducing costs and downsizing the device. .
  • the contact surface with the solar battery cell can be minimized, and the surface of the solar battery cell can be damaged. It is possible to ensure high quality.
  • the number of movements of the voltage application means can be set optimally for each solar cell from the resistance value per unit length of the solar cell set as a parameter and the number of cell divisions. Time can be shortened and productivity can be improved.
  • FIG. 1 is a diagram showing an example of a manufacturing process of a thin-film solar cell applied to the present invention.
  • FIG. 2 is a diagram showing a schematic configuration of a thin film solar cell and a probe pin.
  • FIG. 3 is a diagram showing a schematic configuration of a short-circuit repairing device according to an embodiment of the present invention.
  • FIG. 4 is a diagram illustrating an input example of parameters applied to the embodiment.
  • FIG. 5 is a diagram illustrating the division of solar cells applied to one embodiment.
  • FIG. 6 is a diagram for explaining the movement of the probe unit applied to the embodiment.
  • FIG. 7 is a flowchart for explaining the operation of the embodiment.
  • FIG. 8 is a diagram illustrating a stepwise reverse voltage applied to the short-circuit portion according to the embodiment.
  • FIG. 9 is a diagram for explaining the relationship between the leakage current flowing through the short-circuit portion and the allowable leakage current value according to the embodiment.
  • FIG. 10 is a diagram showing the best IV characteristics as a thin film solar cell.
  • FIG. 11 is a diagram showing IV characteristics before and after repair of a thin film solar cell.
  • FIG. 1 shows an example of a manufacturing process of a thin film solar cell applied to the present invention.
  • a surface electrode (transparent electrode) 102 is formed on a cleaned transparent substrate 101 such as glass or plastic (FIG. 1A), and this surface electrode 102 is patterned (FIG. 1B).
  • amorphous silicon (thin film silicon) 103 is formed on the patterned surface electrode 102 (FIG. 1C), and this amorphous silicon 103 is patterned (FIG. 1D).
  • a back electrode 104 made of a metal such as silver is formed on the patterned amorphous silicon 103 (FIG. 1E), and this back electrode 104 is patterned (FIG. 1F).
  • the thin film type solar cell 100 having a structure in which a plurality of solar cells 105 are arranged in parallel is obtained.
  • the solar cells 105 are connected in series with each other.
  • the thin film type solar cell 100 shown in FIG. 2 attaches
  • a step-like reverse voltage is applied to the solar battery cell 105, that is, a step-like voltage in the reverse direction with respect to the diode characteristics of the amorphous silicon 103 described above to apply Joule heat to the short-circuit portion.
  • This heat is used to oxidize the short-circuited portion to change it into an insulator or to burn out the short-circuited portion so as to recover the performance.
  • the IV characteristics are measured again, and the performance of the solar battery cell 105 is confirmed.
  • FIG. 11 (a) shows the measurement results of the IV characteristics of a plurality (four in the illustrated example) of the solar cells 105.
  • the solar cells 105 c1, Solar cells 105 (c3, c4) exhibiting IV characteristics which are inferior to c2) are mixed.
  • short circuit part removal is performed with respect to the several photovoltaic cell 105 using the step-like reverse voltage Va.
  • FIG. 11 (b) shows the measurement results of the IV characteristics of the plurality of solar cells 105 after the short-circuit removal is performed.
  • the solar cells 105 It can be confirmed that the IV characteristics of the other solar cells 105 (c3, c4) are close to c1, c2), and that performance recovery can be achieved by the short-circuit removal processing.
  • short-circuit portion removal in the present invention is performed by a leakage current. Since the pass / fail determination is performed, it is possible to omit one or both of the IV characteristic measurements.
  • the process proceeds to the final processing unit 107, where final processing such as assembly wiring and lamination is performed, and the thin film solar cell 100 is completed.
  • FIG. 3 shows a schematic configuration of a short-circuit repair device applied in the inspection device 106 of such a manufacturing process.
  • reference numeral 301 denotes an arithmetic processing unit that performs arithmetic processing.
  • a display / input unit 302, a measurement processing unit 303, and a conveyance control unit 304 are connected to the arithmetic processing unit 301.
  • the display / input unit 302 includes a parameter setting unit, and includes an interface between a display unit such as a liquid crystal display device and an input unit such as a keyboard, a mouse, and a touch panel.
  • the resistance value 401 per unit length of the solar cell 105 and the division number 402 of the solar cell 105 are displayed, and these parameters are input to the arithmetic processing unit 301. It has a function of displaying various display information from 301 on the display means.
  • the resistance value 401 per unit length is a numerical value obtained from the resistance value actually measured for the solar battery cell 105 and the actual length of the solar battery cell 105.
  • the division number 402 is set to “1” (no division) in the thin-film solar cell 100 having a structure in which a plurality of solar cells 105 are arranged side by side as shown in FIG.
  • the measurement processing unit 303 generates a reverse voltage according to a measurement instruction from the arithmetic processing unit 301, and this reverse voltage is a solar cell that is a short-circuit removal process target of the thin-film solar cell 100 via the probe unit 305 serving as a voltage application unit.
  • a current (leakage current) that flows through the solar cell 105 via the probe unit 305 is captured and output to the arithmetic processing unit 301.
  • the reverse voltage is generated as a stepped voltage based on a preset voltage application time and a voltage step value. Details of the reverse voltage will be described later.
  • the probe unit 305 has one probe pin 305 a, 305 b as a point contact portion per solar cell 105, and the tips of the probe pins 305 a, 305 b are connected to the thin film solar cell 100. It is possible to make point contact with each of the back electrode 104 surfaces of two adjacent solar cells 105 (the solar cells 105 are connected in series). More specifically, the probe unit 305 is composed of a probe unit having one probe pin 305a, 305b (11 in the illustrated example) per solar cell 105 as shown in FIG. These probe pins 305 a, 305 b... Are simultaneously point-contactable with the corresponding solar battery cells 105.
  • the conveyance control unit 304 includes a position setting unit, and can set the position of the probe unit 305 with respect to the solar battery cell 105 based on the control information of the arithmetic processing unit 301.
  • the transport control unit 304 translates the probe unit 305 along the longitudinal direction a of the solar battery cell 105 based on the control information of the arithmetic processing unit 301 as shown in FIG.
  • the tip of probe pin 305a, 305b is made to contact or space apart with respect to the back surface electrode 104 surface of the photovoltaic cell 105 by moving.
  • the transport control unit 304 moves the thin film solar cell 100 into the inspection device 106 based on the control information of the arithmetic processing unit 301 and moves it to a predetermined position, and the short-circuit removal process and the performance check are completed. After that, the thin film solar cell 100 is also carried out from the inspection device 106.
  • the arithmetic processing unit 301 includes a movement position calculation unit that calculates the movement position of the probe unit 305, a leak current allowable value calculation unit, a leak current determination unit, and the like. Based on the parameters set by the display / input unit 302, the movement position calculation unit calculates the number of movement points and the movement distance of the probe unit 305 with respect to the solar battery cell 105 using the following formulas (1) and (2).
  • the maximum applied voltage V, the limit current value A, and the parallel resistance value R are set for each specification of the thin-film solar cell 100.
  • the parallel resistance value 302c is determined by a leakage current around the pn junction of the thin film solar cell 100 or the like.
  • the leak current allowable value calculating means and the leak current determining means calculate the leak current allowable value using the reverse voltage generated by the probe unit 305 and the parallel resistance R, and the leak current taken in via the probe unit 305. And the leakage current allowable value are compared, and if it is determined that the leakage current is less than or equal to the leakage current allowable value, the short-circuit portion removal processing is terminated.
  • the resistance value 401 per unit length of the solar battery cell 105 and the division number 402 of the solar battery cell 105 are set.
  • the display unit displays the resistance value 401 per unit length and the parameters of the number of divisions 402 of the solar battery cells 105 (see FIG. 4), and calculates these parameters.
  • the resistance value 401 per unit length is a numerical value obtained from the resistance value actually measured for the solar battery cell 105 and the actual length of the solar battery cell 105.
  • the division number 402 is, for example, “1” when the solar cell 105 is not divided as shown in FIG. 2, and the solar cell 105 is divided into the divided cells 105a and 105b as shown in FIG. , 105c, the number of divisions is “3”.
  • step 701 the movement position of the probe unit 305 is calculated.
  • the number of moving points and the moving distance of the probe unit 305 with respect to the solar cell 105 are calculated by the above-described equations (1) and (2). .
  • the parallel resistance value R 100 m ⁇
  • step 702 the reverse voltage Va is initialized, and then the process proceeds to step 703, where the probe controller 305 is moved in the longitudinal direction a of the solar cell 105 by the movement distance X calculated in step 702 by the transport controller 304. Translate along. In step 704, the probe unit 305 is moved downward, and the tips of the probe pins 305a and 305b are brought into contact with the solar battery cell 105.
  • step 705 it is determined whether or not the maximum value Vam (see FIG. 8) of the reverse voltage Va applied to the solar battery cell 105 has been exceeded.
  • the reverse voltage Va has not been applied yet, it is determined No, and the process proceeds to step 706.
  • step 706 the reverse voltage Va is applied to the solar battery cell 105.
  • the reverse voltage Va has a stepped shape that increases by a voltage step value ⁇ Va every voltage application time ⁇ t.
  • the voltage application time ⁇ t and the voltage step value ⁇ Va those obtained by previously finding an optimal combination for the type and characteristics of the thin-film solar cell 100 using a method such as an experiment are used.
  • the reverse voltage Va is first applied for the voltage application time ⁇ t for the voltage step value ⁇ Va shown in FIG.
  • step 707 the leakage current Ia flowing through the short circuit portion of the solar power generation cell 105 is measured.
  • the leak current Ia is taken in via the probe unit 305.
  • step 708 it is determined whether the leakage current Ia detected via the probe unit 305 is equal to or less than the allowable leakage current value Io.
  • the leak current allowable value Io is calculated and set in the parallel resistance value R and the thin film solar cell 100 described above based on the reverse voltage Va.
  • the allowable leak current value Io is calculated for each reverse voltage Va increasing by the voltage step value ⁇ Va, and is set as stepwise allowable leak current values Io1, Io2,..., Ion as shown in FIG.
  • These leak current allowable values Io1, Io2,..., Ion are set to values slightly larger than the current value actually calculated by the parallel resistance value R and the reverse voltage Va.
  • step 709 it is determined whether the leak current Ia1 detected first via the probe unit 305 is equal to or smaller than the first leak current allowable value Io1 of the stepwise leak current allowable value Io.
  • the process proceeds to step 709.
  • step 709 the voltage step value ⁇ Va is increased by one step, and the process returns to step 705.
  • the reverse voltage Va applied to the solar battery cell 105 does not exceed the maximum value Vam, it is determined as No.
  • step 706 the next reverse voltage Va (the part indicated by b in FIG. 6) is applied for the voltage application time ⁇ t. Then, the leak current Ia2 detected at this time is compared with the leak current allowable value Io2 next to the stepwise leak current allowable value Io (steps 707 and 708).
  • step 710 the probe unit 305 is moved upward, and the tips of the probe pins 305 a and 305 b are separated from the solar battery cell 105.
  • step 705 wait until it is determined that the reverse voltage Va applied to the solar battery cell 105 exceeds the maximum value Vam, Proceed to step 711.
  • step 711 the probe unit 305 is once moved upward, and the tips of the probe pins 305 a and 305 b are separated from the solar battery cell 105.
  • step 712 it is determined whether or not the short-circuit removal processing has been completed at all moving positions on the solar battery cell 105.
  • the process returns to step 702 to initialize the reverse voltage Va, and then proceeds to step 703 to carry control.
  • the probe unit 305 is further translated by the unit 304 along the longitudinal direction a of the solar battery cell 105 by the movement distance X calculated in step 702.
  • step 704 the probe unit 305 is moved downward, the tips of the probe pins 305a and 305b are brought into contact with the surface of the solar battery cell 105, and thereafter, the same operation as described above is repeatedly executed.
  • step 711 the moving position of the probe unit 305 on the solar battery cell 105 does not remain, and the short-circuit portion removal process cannot be performed at the moving positions of all the probe units 305.
  • the data to that effect is stored in a storage unit (not shown), and the fact that the removal of the short-circuited portion of the solar power generation cell 105 has ended abnormally is displayed on the display means of the display / input unit 302, and the processing is terminated.
  • the resistance value per unit length of the solar battery cell 105 of the thin-film solar battery 100 is input as a parameter, and reversely passed through one probe pin 305a, 305b per one solar battery cell 105.
  • the moving position of the probe unit 305 to which the voltage is applied on the solar cell 105 is calculated, the probe unit 305 is moved to the calculated moving position, and the probe pins 305a and 305b are brought into contact with the solar cell 105, A reverse voltage is applied via the probe pins 305a and 305b to detect a leakage current, and when the leakage current becomes equal to or less than the allowable leakage current, the process for removing the short-circuit portion is terminated.
  • the point-like contact portion can obtain the same effect as that obtained by arranging a large number of point-like contact portions of the conventional application member with only one probe pin 305a, 305b for each solar cell 105. Therefore, the number of point-like contact parts can be greatly reduced, and the point-like contact parts can be replaced regularly and easily in a short time, thereby avoiding a decrease in productivity due to a production line stop. In addition, the cost required for maintenance can be reduced. In addition, the power supply for applying reverse voltage can be smaller than when using a large number of point-like contact parts or linear / planar contact parts. Can be achieved.
  • the point-like probe pins 305a and 305b are in point contact with the solar battery cell 105, the contact surface between the probe pins 305a and 305b and the solar battery cell 105 can be reduced, and the solar battery is manufactured. In the process, the electrode surface of the solar battery cell 105 is less likely to be damaged, and high quality of the solar battery can be ensured.
  • the optimal movement position of the probe unit 305 for the solar battery cell 105 that is, the number of movement points and the movement distance are obtained. Since the movement of the probe unit 305 is controlled, the number of movements of the probe unit 305 can be set to be optimal for each solar cell. As a result, the tact time can be shortened and the productivity can be improved.
  • this invention is not limited to the said embodiment, In the implementation stage, it can change variously in the range which does not change the summary.
  • the thin film solar cell has been described in the above-described embodiment, the present invention can also be applied to other solar cells such as a hybrid solar cell and a multijunction solar cell.
  • the above embodiments include inventions at various stages, and various inventions can be extracted by appropriately combining a plurality of disclosed constituent requirements. For example, even if some constituent requirements are deleted from all the constituent requirements shown in the embodiment, the problem described in the column of the problem to be solved by the invention can be solved, and is described in the column of the effect of the invention. If the above effect is obtained, a configuration from which this configuration requirement is deleted can be extracted as an invention.
  • SYMBOLS 100 Thin film type solar cell, 101 ... Transparent substrate, 102 ... Surface electrode 103 ... Amorphous silicon, 104 ... Back surface electrode 105 ... Solar cell, 106 ... Inspection apparatus, 107 ... Final processing part 301 ... Arithmetic processing part, 302 ... Display Input unit 302a ... Voltage application time 302b ... Voltage step value 302c ... Parallel resistance value 303 ... Measurement processing unit 304 ... Transport control unit 305 ... Probe unit 305a. 305b ... probe pin

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  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Sustainable Development (AREA)
  • Manufacturing & Machinery (AREA)
  • Sustainable Energy (AREA)
  • Photovoltaic Devices (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

La présente invention concerne un procédé de rénovation de cellule solaire qui peut éliminer efficacement une partie court-circuitée d'une cellule solaire ; un procédé de fabrication de cellules solaires appropriées pour ledit procédé de rénovation ; une cellule solaire fabriquée par ledit procédé de fabrication ; un dispositif de rénovation de cellule solaire ; un dispositif de fabrication et un dispositif d'inspection de cellule solaire, et une cellule solaire fabriquée par un procédé utilisant lesdits dispositifs. D'abord, la résistance par longueur unitaire d'une cellule solaire (105) dans un module de cellule à film mince (100) est entrée en tant que paramètre. Une unité sonde (305) est utilisée pour appliquer une tension inverse sur la cellule solaire (105) par l'intermédiaire d'aiguilles de sonde ponctuelle (305a et 305b). La position sur la cellule solaire (105) jusqu'à laquelle l'unité sonde (305) doit être déplacée est calculée, l'unité sonde (305) est déplacée jusqu'à ladite position, les aiguilles de sonde (305a et 305b) sont mises en contact avec la cellule solaire (105), une tension inverse est appliquée, et le courant de fuite résultant est détecté. Lorsque ledit courant de fuite est égal ou inférieur à un courant de fuite admissible, le procédé d'élimination de partie court-circuitée est terminé.
PCT/JP2010/053155 2010-02-26 2010-02-26 Procédé de rénovation de cellule solaire, procédé de fabrication de cellule solaire, cellule solaire fabriquée par ledit procédé de fabrication, dispositif de rénovation de cellule solaire, dispositif de fabrication et dispositif d'inspection de cellule solaire, et cellule solaire fabriquée par un procédé utilisant lesdits dispositifs WO2011104881A1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2012501609A JPWO2011104881A1 (ja) 2010-02-26 2010-02-26 太陽電池の改修方法、太陽電池の製造方法、この製造方法により製造された太陽電池、太陽電池の改修装置、太陽電池の製造装置及び検査装置、これらの装置を製造工程に用いた太陽電池
PCT/JP2010/053155 WO2011104881A1 (fr) 2010-02-26 2010-02-26 Procédé de rénovation de cellule solaire, procédé de fabrication de cellule solaire, cellule solaire fabriquée par ledit procédé de fabrication, dispositif de rénovation de cellule solaire, dispositif de fabrication et dispositif d'inspection de cellule solaire, et cellule solaire fabriquée par un procédé utilisant lesdits dispositifs

Applications Claiming Priority (1)

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PCT/JP2010/053155 WO2011104881A1 (fr) 2010-02-26 2010-02-26 Procédé de rénovation de cellule solaire, procédé de fabrication de cellule solaire, cellule solaire fabriquée par ledit procédé de fabrication, dispositif de rénovation de cellule solaire, dispositif de fabrication et dispositif d'inspection de cellule solaire, et cellule solaire fabriquée par un procédé utilisant lesdits dispositifs

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WO2011104881A1 true WO2011104881A1 (fr) 2011-09-01

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Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3143616B2 (ja) * 1999-08-12 2001-03-07 鐘淵化学工業株式会社 太陽電池の短絡部除去方法
JP3740618B2 (ja) * 1996-06-17 2006-02-01 株式会社カネカ 太陽電池の短絡部除去方法及び該短絡部除去装置
WO2009020073A1 (fr) * 2007-08-06 2009-02-12 Sharp Kabushiki Kaisha Procédé et appareil de fabrication d'un module de conversion photoélectrique en couches minces

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3740618B2 (ja) * 1996-06-17 2006-02-01 株式会社カネカ 太陽電池の短絡部除去方法及び該短絡部除去装置
JP3143616B2 (ja) * 1999-08-12 2001-03-07 鐘淵化学工業株式会社 太陽電池の短絡部除去方法
WO2009020073A1 (fr) * 2007-08-06 2009-02-12 Sharp Kabushiki Kaisha Procédé et appareil de fabrication d'un module de conversion photoélectrique en couches minces

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