WO2011036353A1 - Materiau photocatalytique ultra-poreux, procede de fabrication et utilisations - Google Patents
Materiau photocatalytique ultra-poreux, procede de fabrication et utilisations Download PDFInfo
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- WO2011036353A1 WO2011036353A1 PCT/FR2010/000634 FR2010000634W WO2011036353A1 WO 2011036353 A1 WO2011036353 A1 WO 2011036353A1 FR 2010000634 W FR2010000634 W FR 2010000634W WO 2011036353 A1 WO2011036353 A1 WO 2011036353A1
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- temperature
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- ultra
- composite material
- filler metal
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- 230000001699 photocatalysis Effects 0.000 title claims abstract description 58
- 239000000463 material Substances 0.000 title claims abstract description 55
- 238000000034 method Methods 0.000 title claims abstract description 35
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 16
- 229910052739 hydrogen Inorganic materials 0.000 claims abstract description 17
- 239000001257 hydrogen Substances 0.000 claims abstract description 17
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims abstract description 14
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 11
- 239000005348 self-cleaning glass Substances 0.000 claims abstract description 7
- 230000003197 catalytic effect Effects 0.000 claims abstract description 4
- 239000000446 fuel Substances 0.000 claims abstract description 4
- 239000012528 membrane Substances 0.000 claims abstract description 4
- 150000002431 hydrogen Chemical class 0.000 claims abstract description 3
- 239000002131 composite material Substances 0.000 claims description 38
- 239000000945 filler Substances 0.000 claims description 37
- 229910052751 metal Inorganic materials 0.000 claims description 37
- 239000002184 metal Substances 0.000 claims description 37
- 239000003870 refractory metal Substances 0.000 claims description 33
- 238000000137 annealing Methods 0.000 claims description 25
- 239000000758 substrate Substances 0.000 claims description 25
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims description 20
- 229910044991 metal oxide Inorganic materials 0.000 claims description 20
- 150000004706 metal oxides Chemical class 0.000 claims description 20
- 239000010936 titanium Substances 0.000 claims description 20
- 229910052719 titanium Inorganic materials 0.000 claims description 20
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 claims description 18
- 239000000243 solution Substances 0.000 claims description 17
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 claims description 16
- 230000001590 oxidative effect Effects 0.000 claims description 16
- 239000011148 porous material Substances 0.000 claims description 16
- 238000000151 deposition Methods 0.000 claims description 15
- 238000005530 etching Methods 0.000 claims description 14
- 230000003647 oxidation Effects 0.000 claims description 14
- 238000007254 oxidation reaction Methods 0.000 claims description 14
- 239000011521 glass Substances 0.000 claims description 13
- 239000000203 mixture Substances 0.000 claims description 13
- 229910052782 aluminium Inorganic materials 0.000 claims description 11
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 11
- 239000004065 semiconductor Substances 0.000 claims description 11
- 239000000126 substance Substances 0.000 claims description 11
- 239000012298 atmosphere Substances 0.000 claims description 10
- 230000008030 elimination Effects 0.000 claims description 9
- 238000003379 elimination reaction Methods 0.000 claims description 9
- 230000008569 process Effects 0.000 claims description 9
- 229910000147 aluminium phosphate Inorganic materials 0.000 claims description 8
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims description 8
- 239000010937 tungsten Substances 0.000 claims description 8
- 238000006056 electrooxidation reaction Methods 0.000 claims description 7
- 229910052721 tungsten Inorganic materials 0.000 claims description 7
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical group O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 claims description 5
- 238000004140 cleaning Methods 0.000 claims description 5
- 238000010438 heat treatment Methods 0.000 claims description 5
- 239000010955 niobium Substances 0.000 claims description 5
- 229910052758 niobium Inorganic materials 0.000 claims description 5
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 claims description 5
- MYMOFIZGZYHOMD-UHFFFAOYSA-N Dioxygen Chemical compound O=O MYMOFIZGZYHOMD-UHFFFAOYSA-N 0.000 claims description 4
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 claims description 4
- CDBYLPFSWZWCQE-UHFFFAOYSA-L Sodium Carbonate Chemical compound [Na+].[Na+].[O-]C([O-])=O CDBYLPFSWZWCQE-UHFFFAOYSA-L 0.000 claims description 4
- 239000002253 acid Substances 0.000 claims description 4
- 229910001882 dioxygen Inorganic materials 0.000 claims description 4
- 229910052710 silicon Inorganic materials 0.000 claims description 4
- 239000010703 silicon Substances 0.000 claims description 4
- 238000004544 sputter deposition Methods 0.000 claims description 4
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 claims description 3
- 229910052750 molybdenum Inorganic materials 0.000 claims description 3
- 239000011733 molybdenum Substances 0.000 claims description 3
- 229910000484 niobium oxide Inorganic materials 0.000 claims description 3
- URLJKFSTXLNXLG-UHFFFAOYSA-N niobium(5+);oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Nb+5].[Nb+5] URLJKFSTXLNXLG-UHFFFAOYSA-N 0.000 claims description 3
- 229920000642 polymer Polymers 0.000 claims description 3
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 claims description 3
- 229910001930 tungsten oxide Inorganic materials 0.000 claims description 3
- 239000003929 acidic solution Substances 0.000 claims description 2
- 230000002378 acidificating effect Effects 0.000 claims description 2
- 239000007864 aqueous solution Substances 0.000 claims description 2
- 239000003637 basic solution Substances 0.000 claims description 2
- 239000000919 ceramic Substances 0.000 claims description 2
- QGLKJKCYBOYXKC-UHFFFAOYSA-N nonaoxidotritungsten Chemical compound O=[W]1(=O)O[W](=O)(=O)O[W](=O)(=O)O1 QGLKJKCYBOYXKC-UHFFFAOYSA-N 0.000 claims description 2
- 239000010865 sewage Substances 0.000 claims description 2
- 229910000029 sodium carbonate Inorganic materials 0.000 claims description 2
- 238000009834 vaporization Methods 0.000 claims description 2
- 230000008016 vaporization Effects 0.000 claims description 2
- 238000009713 electroplating Methods 0.000 claims 1
- 239000002351 wastewater Substances 0.000 abstract description 2
- 239000011941 photocatalyst Substances 0.000 description 16
- 230000008021 deposition Effects 0.000 description 8
- 238000007146 photocatalysis Methods 0.000 description 7
- MUBZPKHOEPUJKR-UHFFFAOYSA-N Oxalic acid Chemical compound OC(=O)C(O)=O MUBZPKHOEPUJKR-UHFFFAOYSA-N 0.000 description 6
- 230000015572 biosynthetic process Effects 0.000 description 6
- 230000005540 biological transmission Effects 0.000 description 5
- 238000000386 microscopy Methods 0.000 description 5
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 4
- 238000010521 absorption reaction Methods 0.000 description 4
- 238000002048 anodisation reaction Methods 0.000 description 4
- 238000001179 sorption measurement Methods 0.000 description 4
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 3
- 239000002800 charge carrier Substances 0.000 description 3
- 150000002739 metals Chemical class 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 3
- 229910052760 oxygen Inorganic materials 0.000 description 3
- 239000001301 oxygen Substances 0.000 description 3
- 239000002243 precursor Substances 0.000 description 3
- 238000000926 separation method Methods 0.000 description 3
- 241000894007 species Species 0.000 description 3
- 241000894006 Bacteria Species 0.000 description 2
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 241000700605 Viruses Species 0.000 description 2
- 239000011260 aqueous acid Substances 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 239000011888 foil Substances 0.000 description 2
- 238000004770 highest occupied molecular orbital Methods 0.000 description 2
- 238000004768 lowest unoccupied molecular orbital Methods 0.000 description 2
- 235000006408 oxalic acid Nutrition 0.000 description 2
- 238000013032 photocatalytic reaction Methods 0.000 description 2
- 238000006722 reduction reaction Methods 0.000 description 2
- 239000012855 volatile organic compound Substances 0.000 description 2
- 241000238876 Acari Species 0.000 description 1
- 235000001674 Agaricus brunnescens Nutrition 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 241000195493 Cryptophyta Species 0.000 description 1
- 241001465754 Metazoa Species 0.000 description 1
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 1
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 1
- -1 Ti0 2 Chemical compound 0.000 description 1
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 1
- 239000013566 allergen Substances 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 239000003242 anti bacterial agent Substances 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 238000003486 chemical etching Methods 0.000 description 1
- 239000007795 chemical reaction product Substances 0.000 description 1
- 239000003153 chemical reaction reagent Substances 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 239000011651 chromium Substances 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 229910017052 cobalt Inorganic materials 0.000 description 1
- 239000010941 cobalt Substances 0.000 description 1
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000002425 crystallisation Methods 0.000 description 1
- 230000008025 crystallization Effects 0.000 description 1
- 230000006378 damage Effects 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 239000008367 deionised water Substances 0.000 description 1
- 229910021641 deionized water Inorganic materials 0.000 description 1
- 238000004332 deodorization Methods 0.000 description 1
- 238000003795 desorption Methods 0.000 description 1
- 239000003599 detergent Substances 0.000 description 1
- 238000011161 development Methods 0.000 description 1
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- 239000002019 doping agent Substances 0.000 description 1
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- 239000003792 electrolyte Substances 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 239000003344 environmental pollutant Substances 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 238000005816 glass manufacturing process Methods 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 238000011031 large-scale manufacturing process Methods 0.000 description 1
- 230000031700 light absorption Effects 0.000 description 1
- 238000001755 magnetron sputter deposition Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 230000005012 migration Effects 0.000 description 1
- 238000013508 migration Methods 0.000 description 1
- 229910000476 molybdenum oxide Inorganic materials 0.000 description 1
- 125000000896 monocarboxylic acid group Chemical group 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 229910017604 nitric acid Inorganic materials 0.000 description 1
- 235000019645 odor Nutrition 0.000 description 1
- 230000033116 oxidation-reduction process Effects 0.000 description 1
- PQQKPALAQIIWST-UHFFFAOYSA-N oxomolybdenum Chemical compound [Mo]=O PQQKPALAQIIWST-UHFFFAOYSA-N 0.000 description 1
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 1
- 231100000719 pollutant Toxicity 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 239000000047 product Substances 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000006479 redox reaction Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 229910052702 rhenium Inorganic materials 0.000 description 1
- WUAPFZMCVAUBPE-UHFFFAOYSA-N rhenium atom Chemical compound [Re] WUAPFZMCVAUBPE-UHFFFAOYSA-N 0.000 description 1
- 238000004621 scanning probe microscopy Methods 0.000 description 1
- 238000002791 soaking Methods 0.000 description 1
- 239000002689 soil Substances 0.000 description 1
- 238000003980 solgel method Methods 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
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- 229910052717 sulfur Inorganic materials 0.000 description 1
- 239000011593 sulfur Substances 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 230000001988 toxicity Effects 0.000 description 1
- 231100000419 toxicity Toxicity 0.000 description 1
- 229910052723 transition metal Inorganic materials 0.000 description 1
- 150000003624 transition metals Chemical class 0.000 description 1
- 238000009281 ultraviolet germicidal irradiation Methods 0.000 description 1
- 229910052720 vanadium Inorganic materials 0.000 description 1
- LEONUFNNVUYDNQ-UHFFFAOYSA-N vanadium atom Chemical compound [V] LEONUFNNVUYDNQ-UHFFFAOYSA-N 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
- 238000005303 weighing Methods 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J37/00—Processes, in general, for preparing catalysts; Processes, in general, for activation of catalysts
- B01J37/08—Heat treatment
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J35/00—Catalysts, in general, characterised by their form or physical properties
- B01J35/30—Catalysts, in general, characterised by their form or physical properties characterised by their physical properties
- B01J35/39—Photocatalytic properties
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J35/00—Catalysts, in general, characterised by their form or physical properties
- B01J35/60—Catalysts, in general, characterised by their form or physical properties characterised by their surface properties or porosity
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J35/00—Catalysts, in general, characterised by their form or physical properties
- B01J35/60—Catalysts, in general, characterised by their form or physical properties characterised by their surface properties or porosity
- B01J35/61—Surface area
- B01J35/617—500-1000 m2/g
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J35/00—Catalysts, in general, characterised by their form or physical properties
- B01J35/60—Catalysts, in general, characterised by their form or physical properties characterised by their surface properties or porosity
- B01J35/61—Surface area
- B01J35/618—Surface area more than 1000 m2/g
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J35/00—Catalysts, in general, characterised by their form or physical properties
- B01J35/60—Catalysts, in general, characterised by their form or physical properties characterised by their surface properties or porosity
- B01J35/64—Pore diameter
- B01J35/647—2-50 nm
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J37/00—Processes, in general, for preparing catalysts; Processes, in general, for activation of catalysts
- B01J37/0009—Use of binding agents; Moulding; Pressing; Powdering; Granulating; Addition of materials ameliorating the mechanical properties of the product catalyst
- B01J37/0018—Addition of a binding agent or of material, later completely removed among others as result of heat treatment, leaching or washing,(e.g. forming of pores; protective layer, desintegrating by heat)
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B13/00—Oxygen; Ozone; Oxides or hydroxides in general
- C01B13/02—Preparation of oxygen
- C01B13/0203—Preparation of oxygen from inorganic compounds
- C01B13/0207—Water
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B3/00—Hydrogen; Gaseous mixtures containing hydrogen; Separation of hydrogen from mixtures containing it; Purification of hydrogen
- C01B3/02—Production of hydrogen or of gaseous mixtures containing a substantial proportion of hydrogen
- C01B3/04—Production of hydrogen or of gaseous mixtures containing a substantial proportion of hydrogen by decomposition of inorganic compounds, e.g. ammonia
- C01B3/042—Decomposition of water
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J21/00—Catalysts comprising the elements, oxides, or hydroxides of magnesium, boron, aluminium, carbon, silicon, titanium, zirconium, or hafnium
- B01J21/06—Silicon, titanium, zirconium or hafnium; Oxides or hydroxides thereof
- B01J21/063—Titanium; Oxides or hydroxides thereof
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J23/00—Catalysts comprising metals or metal oxides or hydroxides, not provided for in group B01J21/00
- B01J23/16—Catalysts comprising metals or metal oxides or hydroxides, not provided for in group B01J21/00 of arsenic, antimony, bismuth, vanadium, niobium, tantalum, polonium, chromium, molybdenum, tungsten, manganese, technetium or rhenium
- B01J23/24—Chromium, molybdenum or tungsten
- B01J23/26—Chromium
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J23/00—Catalysts comprising metals or metal oxides or hydroxides, not provided for in group B01J21/00
- B01J23/16—Catalysts comprising metals or metal oxides or hydroxides, not provided for in group B01J21/00 of arsenic, antimony, bismuth, vanadium, niobium, tantalum, polonium, chromium, molybdenum, tungsten, manganese, technetium or rhenium
- B01J23/24—Chromium, molybdenum or tungsten
- B01J23/28—Molybdenum
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J23/00—Catalysts comprising metals or metal oxides or hydroxides, not provided for in group B01J21/00
- B01J23/16—Catalysts comprising metals or metal oxides or hydroxides, not provided for in group B01J21/00 of arsenic, antimony, bismuth, vanadium, niobium, tantalum, polonium, chromium, molybdenum, tungsten, manganese, technetium or rhenium
- B01J23/24—Chromium, molybdenum or tungsten
- B01J23/30—Tungsten
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
- Y02E60/30—Hydrogen technology
- Y02E60/36—Hydrogen production from non-carbon containing sources, e.g. by water electrolysis
Definitions
- the present invention relates to a process for producing ultra-porous photocatalytic materials, ultra-porous photocatalytic materials obtained by such a method, and their uses for producing hydrogen, treating sewage and polluted water, treating polluted air or their use as catalytic membranes in fuel cells.
- a final subject of the invention concerns articles chosen from hydrogen production devices, self-cleaning windows and anti-pollution walls.
- Photocatalysis is a natural electronic process induced by the absorption of UV radiation or visible on the surface of a substance, called photocatalyst.
- photocatalysts By using light energy, photocatalysts cause the formation of free radicals capable of decomposing by oxidation-reduction certain organic or inorganic substances present in the medium in which they are immersed.
- the main advantage of photocatalysis lies in the fact that the energy required for oxidation-reduction reactions is provided by direct absorption of light, rather than by thermal heating.
- the photocatalysts used are semiconductor materials having a forbidden band (optical gap), typically between 3 and 4 eV, corresponding to a light irradiation in the spectral region of the near UV.
- a forbidden band typically between 3 and 4 eV.
- the absorption of photons of energy greater than the optical gap leads to the formation of electron-hole pairs within the semiconductor, these charge carriers can then either recombine according to various mechanisms, or diffuse on the surface of the semiconductor.
- the photocatalytic reaction that occurs on the surface of a semiconductor material comprises several steps:
- the rate at which the photocatalysis reactions take place depends on the light intensity, the amount of photocatalyst (number and lifetime of charge carriers) and the duration of contact between the semiconductor and the materials present in the photocatalyst. environment in which they are immersed.
- the most commonly used photocatalysts are semiconductor wide gap based on oxides or sulfur, such as Ti0 2, ZnO, Ce0 2, Zr0 2, Sn0 2, CdS, ZnS, the most widely used being the photocatalyst titanium dioxide (TiO 2 ) due to its thermodynamic stability, its lack of toxicity and its low cost.
- the active oxygen from the photocatalytic reaction is able to decompose and destroy:
- VOCs volatile organic compounds
- allergens such as pollens and mites
- Photocatalysis is thus used in the field of water treatment, air and deodorization, but also as an antibacterial agent. Photocatalysis can also find applications in the medical field to fight against infected cells.
- the principle of photocatalysis is also used for the use of self-cleaning glass, this application being associated with a second property of the irradiated semiconductor: superhydrophily.
- a self-cleaning glass Due to its special microscopic coating, a self-cleaning glass has the ability to degrade organic soils and therefore stay clean longer than ordinary glass.
- the self-cleaning glass manufacturing process comprises a step of applying, on its outer face, a special photocatalytic layer based on titanium dioxide (TiO 2 ).
- TiO 2 titanium dioxide
- the self-cleaning function of these glasses is based on the combination of two properties of deposited microscopic layers: photocatalysis and superhydrophilia. Indeed, the hydrophilic properties of this glass make the water falling on the glass plate, washes the glass, instead of leaving it dirty as an ordinary glass. Instead of drop into drops on the glass, the water gradually forms a film which, by gravity, finally slide along the glass washing.
- the self-cleaning glasses allow a reduction of cleaning costs, but
- High porosity photocatalysts were prepared from composite materials made of titanium and aluminum, the deposited composite material being subjected to electrochemical anodization, the formed aluminum oxide being subsequently removed by etching a solution of strong acid H 3 PO 4 (5%) and CrO 3 (2%) at a temperature of 80 ° C., the use of concentrated acid baths being very difficult to handle (Phys Stat sol, No. 12, 3690- 3693 (2008)).
- the deposition and thermal annealing temperatures used in this process do not make it possible to achieve sufficient photocatalytic activity.
- the technical problem still to be solved with respect to this state of the art consists in the development of a photocatalyst having improved photocatalytic activity, excellent adhesion to the substrate and can be applied in thick layers.
- This photocatalyst must also be able to be implemented according to simple, economical methods and having a good industrial feasibility.
- the ultra-porous photocatalytic materials of the invention propose to remedy all these drawbacks, by satisfying the following needs and requirements: an excellent photocatalytic activity, the reactions they catalyze having yields that can be up to 10 times higher than those obtained with conventional photocatalysts,
- the photocatalytic materials of the invention must have the following characteristics:
- the first object of the invention is a method of manufacturing an ultra-porous photocatalytic material using a composite material consisting of at least one refractory metal and at least one non-refractory filler metal.
- the ultra-porous photocatalytic material obtained according to the process of the invention having pores whose walls have a very small thickness, is also an object of the present invention.
- the first subject of the present invention is a method of manufacturing an ultra-porous photocatalytic material comprising:
- a deposition step on a substrate at a temperature between 50 and 250 ° C, and preferably between 50 and 150 ° C, and even more preferably between 80 and 120 ° C, a composite material consisting of at least one refractory metal and at least one non-refractory filler metal,
- a subsequent step of removing the non-refractory filler metal said method also comprising a final thermal annealing step at a temperature greater than or equal to 600 ° C, and preferably greater than or equal to 650 ° C, and a oxidation step can be performed before or after the step of removing the non-refractory filler metal, or simultaneously with the final step of thermal annealing.
- the duration of the final thermal annealing step may be between 5 and 30 minutes, and preferably between 10 and 15 minutes.
- refractory metal is understood to mean a metal whose oxide is a semiconductor, and by non-refractory metal a metal whose oxide is an insulator. More specifically, the refractory metal oxide is an oxide for which the separation between the valence band and the conduction band (or forbidden band, also called optical gap) is greater than 2.5 eV, the following two conditions to be fulfilled:
- the top of the valence band is at a lower energy than the HOMO (Highest Occupied Molecular Orbital) level of the molecule to be dissociated, and
- the bottom of the conduction band is at an energy higher than the LUMO (Lowest Unoccupied Molecular Orbital) level of the molecule to be dissociated.
- LUMO Large Unoccupied Molecular Orbital
- the oxidation may be a thermal, chemical or electrochemical oxidation step.
- non-refractory filler metal is carried out by selective etching, so as not to alter the refractory metal.
- This step consists in bringing the substrate coated with the composite material into contact with an acidic or basic solution, preferably chosen from solutions of phosphoric acid (H 3 PO 4 ), sodium carbonate (NaCO 3 ), potassium hydroxide (KOH), and sodium hydroxide (NaOH).
- an acidic or basic solution preferably chosen from solutions of phosphoric acid (H 3 PO 4 ), sodium carbonate (NaCO 3 ), potassium hydroxide (KOH), and sodium hydroxide (NaOH).
- KOH potassium hydroxide
- NaOH sodium hydroxide
- the duration of the selective chemical etching step will depend on the thickness of the composite material to be etched. For layers having a thickness of between 2 and 5 ⁇ , the duration of the removal step will preferably be less than 2 minutes.
- the selective etching elimination step is considered complete once the non-refractory filler metal is present only in trace amounts in the composite material, i.e. rate by weight less than 1%. There is then a change in the surface appearance of the composite material (change of color of the material).
- the method of the invention may comprise the following steps:
- thermal annealing at a temperature greater than or equal to 600 ° C, and preferably greater than or equal to 650 ° C, this annealing step for recrystallizing the refractory metal oxides.
- the oxidation step (ii) is preferably an electrochemical oxidation step.
- the electrochemical oxidation step consists of an electrochemical anodization of the composite material, said material being first immersed in an aqueous solution of acid at a concentration of between 0.1 and 3 mol.L -1 , and preferably at a concentration of between 0.1 and 2 mol.L -1 .
- the aqueous acid solution used may be a solution of sulfuric acid (H 2 SO 4 ), or a solution of oxalic acid (HOOC-COOH), or a solution of phosphoric acid (H 3 PO 4 ), the phosphoric acid solution (H 3 PO 4 ) being the most preferred.
- the current density is then maintained for a period of between 1 and 60 minutes, depending on the desired oxide thickness.
- the electrochemical oxidation step may advantageously be carried out at a temperature of between 40 and 70 ° C.
- the method of the invention may comprise the following steps:
- the step (iii ') of oxidative chemical treatment or of heat treatment in an oxidizing atmosphere can be:
- a chemical oxidation step preferably carried out in an oxidizing bath based on H 2 SO 4 / H 2 O 2 or HCl / H 2 O 2 ,
- step (iii ') a thermal oxidation step, preferably conducted at a temperature between 400 and 500 ° C, the temperature of step (iii ') to be lower than the temperature of step (iv') of thermal annealing.
- the oxidizing atmosphere can be created by introducing molecular oxygen 0 2 at a pressure of between 100 mbar and 1 bar.
- the duration of step (iii ') is advantageously between 10 and 60 minutes, and preferably between 10 and 30 minutes.
- the method of the invention may comprise the following steps:
- step (ii ) elimination by selective etching of the non-refractory filler metal obtained in step (i '),
- the oxidizing atmosphere of step (iv ") can be created by introducing molecular oxygen O 2 at atmospheric pressure .
- the duration of step (iv") is advantageously between 10 and 60 minutes, and preferably between 15 and 30 minutes.
- the composite material used during the deposition step may comprise a refractory metal selected from titanium, tungsten, niobium, molybdenum, and mixtures thereof, and a non-refractory filler metal selected from aluminum. silicon, and their mixture, the non-refractory filler metal possibly being mixed with chromium, tantalum, vanadium or rhenium.
- the refractory metal mixtures may include the following pairs of metals: titanium / tungsten, titanium / niobium and tungsten / niobium.
- the composite material of the invention consists of a refractory metal selected from titanium or titanium / tungsten mixture, and aluminum as non-refractory filler metal.
- the atomic percentage of refractory metal in the composite material may be between 20 and 70%, and preferably between 40 and 60%. If this percentage is too low, a porous film with poor mechanical performance is obtained, and if it is too high, and the porous structure of the material is not formed (the non-refractory filler metal does not get damaged in the process). material). It should be noted that the higher the proportion of filler metal in the composite material, the greater the final porosity of the photocatalytic material will be. Thus, it is the proportion of the non-refractory filler metal that defines the final morphology of the photocatalyst.
- the substrate on which the composite material is deposited is preferably selected from glass, metal, preferably aluminum or titanium foils, polymers, ceramics and semiconductor materials.
- the polymers used must have a temperature withstand greater than or equal to 600 ° C .; it can in particular be silicones. It should be noted that in the case of electrochemical oxidation, the insulating substrates must first have been treated, for example by applying a layer of ITO (Indium Tin Oxide), so as to make them conductive.
- ITO Indium Tin Oxide
- the deposition step of the composite material is carried out at a temperature between 50 and 150 ° C, and even more preferably between 80 and 120 ° C.
- the deposition step is carried out by cathodic sputtering, thermal vaporization or electrolytic deposition.
- the diffusion between the refractory metal oxide and the non-refractory filler metal oxide is too low, the bonding coefficients of the two species being considered unitary. It then forms a diffusion barrier to the interface of the two oxide metals, which allows selective etching of non-refractory filler metals leading to extremely high porosity of photocatalytic materials.
- a deposition temperature that is too low, and in particular less than 50 ° C., leads to insufficient adhesion of the material to the substrate, whereas a too high temperature leads to pore sizes and to a thickness of the pore size that is too high. .
- Another subject of the present invention relates to an ultra-porous photocatalytic material based on at least one refractory metal oxide obtained by the method of the invention, said photocatalytic material comprising pores whose walls have a thickness less than or equal to 10 nm, and preferably between 1 and 7 nm.
- the average pore diameter is preferably between 10 and 60 nm.
- the pore diameter and the pore wall thickness are measured according to techniques well known to those skilled in the art, for example by scanning microscopy or transmission microscopy.
- the refractory metal oxide constituting the photocatalytic material of the invention comprises at least one refractory metal oxide selected from titanium oxide, tungsten oxide, niobium oxide, molybdenum oxide. , and their mixtures.
- the refractory metal oxide may also be a mixed oxide selected from titanium / tungsten, titanium / niobium and tungsten / niobium oxides.
- the composite material of the invention may also comprise a dopant selected from copper, iron, carbon and transition metals such as cobalt, nickel or zinc. These materials create electronic levels in the forbidden band of the refractory metal oxide, the photons of lower energy (less than 3 eV) can then be absorbed and participate in the formation of electron-hole pairs, necessary for the photocatalytic process. Thus, the doped material obtained can then absorb a larger part of the solar spectrum.
- a dopant selected from copper, iron, carbon and transition metals such as cobalt, nickel or zinc.
- the photocatalytic material of the invention advantageously has a porosity of between 50 and 95%.
- the specific surface area of said composite material may, in turn, be between 500 and 700 m 2 .cm "3, and preferably between 600 and 700 m 2. Cm" 3.
- the porosity and the specific surface area can be determined by BET or by weighing or absorption isotherm.
- the high porosity of the photocatalytic materials obtained can be explained by the absence of demixing between the refractory metal oxide and the non-refractory filler metal oxide, the selective etching of the non-refractory filler metal oxide leading to an ultra-porous material, the size of which pores is nanometric, and having a large specific surface.
- the thickness of the photocatalytic material of the invention may advantageously be greater than 2 ⁇ , preferably greater than 5 ⁇ m, and even more preferably between 8 and 100 ⁇ , without there being partial or total destruction of the oxide layer.
- Another subject of the invention concerns the various uses of the photocatalytic material of the invention. Its uses are as follows:
- the photocatalytic material of the invention can also be used as a catalytic membrane for fuel cells.
- the last subject of the present invention relates to the articles chosen from hydrogen production devices, self-cleaning glass panes and pollution control walls comprising at least one ultra-porous photocatalytic material as defined according to the invention.
- the invention also comprises other arrangements which will emerge from the additional description which follows, which relates to examples highlighting the excellent properties of the photocatalytic materials of the invention, as well as to FIG. 1 attached which illustrates a device for producing hydrogen comprising a layer of photocatalytic material according to the invention.
- Example 1 A hydrogen production cell noted (1) in Figure 1 comprising two glass walls noted (2) and (2 ') in Figure 1 was prepared.
- the cell (1) is divided into two compartments, separated from each other by the glass wall (2 ').
- the cathode noted (3) in Figure 1 and located between the glass walls (2) and (2 '), consists of a platinum wire, immersed in the electrolyte (acidulated water) noted ( 4) in FIG. 1.
- the compartment defined between the walls (2) and (2 ') is called the cathode compartment
- the compartment defined between the wall (2') and the substrate noted (5) in FIG. which plays the role of anode, is called anodic compartment.
- a layer of composite material, a precursor of the photocatalytic material noted (6) in FIG. 1, of 3 ⁇ m in thickness is deposited on the substrate (5), said substrate being here a silicon wafer (diameter 100 mm, thickness 500 ⁇ , resistivity in the range 10-20 ⁇ -cm), according to the following method:
- thermal annealing of the composite material at a temperature of 650 ° C. for 10 to 15 minutes.
- a photocatalytic material (6) which has the following properties:
- a current density of 10 mA.cm -2 and a 0.8 V voltage are applied.
- Hydrogen is produced in the cathode compartment, and oxygen is produced in the anode compartment.
- the quantity of hydrogen produced is measured by measuring the variation of the height of water present in a graduated cylinder filled with water, the hydrogen being brought into this test tube (not shown) via a tube noted (8) on the Figure 1 connected to the cathode compartment.
- the oxygen is removed from the anode compartment via the tube noted (9) in FIG. 1.
- 0.7 cm of hydrogen per cm 2 is obtained in 30 minutes. This quantity corresponds to a production of 28 L of hydrogen per hour and per square meter, that is to say at an energy yield close to 10%.
- a series of samples was made by sputter depositing on a titanium substrate, at a temperature of 300 ° C, a composite material comprising a 50% atomic percentage of titanium and an atomic percentage of aluminum of 50%.
- the thickness of the deposited film is 1 ⁇ .
- Another series of samples was made by sputter depositing also on a titanium substrate, at a temperature of 100 ° C., a film having the same thickness (1 ⁇ ) of a composite material having the same composition as above .
- a step of removing aluminum oxide A1 2 0 3 formed by selective etching by contacting with a solution of phosphoric acid dilute H3PO 4 (50% by volume, or about 7 mol.L -1 ), at a temperature of 50 ° C.
- the two sets of samples were then heat-annealed at 500 ° C and heat-annealed at 650 ° C for 20 minutes, respectively.
- the photocatalytic activity of the two series of samples was evaluated by measuring the photocurrent produced by a source of UV photons (approximately 15 mW.cm "2). All measurements were made at zero displacement (no external voltage source ).
- Annealing at a temperature of 650 ° C. thus increases the photocatalytic activity of the materials by 20%. This improvement is explained by a better crystallization of the samples, and by an increase in the anatase phase.
- a series of samples was made by cathodic sputtering on a titanium substrate, at a temperature of 300 ° C, a composite material comprising an atomic percentage of titanium of 50% and an atomic percentage of aluminum of 50%.
- the thickness of the deposited film is 1 ⁇ .
- Another series of samples was made by sputtering also on a titanium substrate, at a temperature of 100 ° C., a film having the same thickness (1 ⁇ m) of a composite material having the same composition as above. .
- the two sets of samples were then modified according to the same protocol, by soaking in a solution comprising 150 mL of 100% CH 3 COOH acetic acid, 30 mL of 65% nitric acid HN0 3 , 760 mL of 80% phosphoric acid H 3 PO 4 at 80% and 30 ml of water, the samples being held in this solution for 15 minutes at a temperature of 35 ° C ⁇ 5 ° C.
- Annealing at a temperature of 650 ° C. thus increases the photocatalytic activity of the samples by 20%.
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Abstract
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CA2775321A CA2775321A1 (fr) | 2009-09-25 | 2010-09-22 | Materiau photocatalytique ultra-poreux, procede de fabrication et utilisations |
EP10773646.4A EP2480331B1 (fr) | 2009-09-25 | 2010-09-22 | Materiau photocatalytique ultra-poreux, procede de fabrication et utilisations |
JP2012530303A JP5683594B2 (ja) | 2009-09-25 | 2010-09-22 | 超多孔性光触媒材料、その製造方法およびその使用 |
KR1020127010659A KR101814483B1 (ko) | 2009-09-25 | 2010-09-22 | 초다공성 광촉매 물질, 이의 제조 방법 및 이의 용도 |
US13/498,002 US9468920B2 (en) | 2009-09-25 | 2010-09-22 | Ultra-porous photocatalytic material, method for the manufacture and the uses thereof |
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WO2003092886A1 (fr) * | 2002-04-30 | 2003-11-13 | The Chinese University Of Hong Kong | Procede pour l'elaboration de films minces de tio2 mesoporeux a forte activite photocatalytique et antibacterienne |
JP2005222782A (ja) * | 2004-02-04 | 2005-08-18 | Bridgestone Corp | 多孔質薄膜の形成方法、並びに色素増感型太陽電池及び多孔質薄膜光触媒 |
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JP4184451B2 (ja) * | 1995-09-06 | 2008-11-19 | 中部電力株式会社 | チタニア系触媒の製造方法 |
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US6777091B2 (en) | 2000-03-22 | 2004-08-17 | Nippon Sheet Glass Co., Ltd. | Substrate with photocatalytic film and method for producing the same |
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JP2008142606A (ja) * | 2006-12-07 | 2008-06-26 | New Industry Research Organization | 光触媒用組成物、光触媒用材料およびその製造方法 |
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JP2005222782A (ja) * | 2004-02-04 | 2005-08-18 | Bridgestone Corp | 多孔質薄膜の形成方法、並びに色素増感型太陽電池及び多孔質薄膜光触媒 |
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FR2950543A1 (fr) | 2011-04-01 |
KR101814483B1 (ko) | 2018-01-04 |
KR20120130320A (ko) | 2012-11-30 |
JP5683594B2 (ja) | 2015-03-11 |
JP2013505820A (ja) | 2013-02-21 |
FR2950543B1 (fr) | 2011-12-16 |
US9468920B2 (en) | 2016-10-18 |
EP2480331B1 (fr) | 2018-10-10 |
US20120270722A1 (en) | 2012-10-25 |
CA2775321A1 (fr) | 2011-03-31 |
EP2480331A1 (fr) | 2012-08-01 |
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