WO2009134011A3 - 액정 표시 모듈 내의 반도체 칩과 액정 패널, 액정 표시 모듈, 및 이들의 연결 방법과 연결 확인 방법 - Google Patents

액정 표시 모듈 내의 반도체 칩과 액정 패널, 액정 표시 모듈, 및 이들의 연결 방법과 연결 확인 방법 Download PDF

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Publication number
WO2009134011A3
WO2009134011A3 PCT/KR2009/001548 KR2009001548W WO2009134011A3 WO 2009134011 A3 WO2009134011 A3 WO 2009134011A3 KR 2009001548 W KR2009001548 W KR 2009001548W WO 2009134011 A3 WO2009134011 A3 WO 2009134011A3
Authority
WO
WIPO (PCT)
Prior art keywords
lcd module
liquid crystal
crystal panel
semiconductor chip
confirming
Prior art date
Application number
PCT/KR2009/001548
Other languages
English (en)
French (fr)
Other versions
WO2009134011A2 (ko
Inventor
서정일
정용익
나준호
김대성
Original Assignee
(주)실리콘웍스
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by (주)실리콘웍스 filed Critical (주)실리콘웍스
Publication of WO2009134011A2 publication Critical patent/WO2009134011A2/ko
Publication of WO2009134011A3 publication Critical patent/WO2009134011A3/ko

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Classifications

    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333Constructional arrangements; Manufacturing methods
    • G02F1/1345Conductors connecting electrodes to cell terminals
    • G02F1/13452Conductors connecting driver circuitry and terminals of panels
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/66Testing of connections, e.g. of plugs or non-disconnectable joints
    • G01R31/68Testing of releasable connections, e.g. of terminals mounted on a printed circuit board
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306Details
    • G02F1/1309Repairing; Testing
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333Constructional arrangements; Manufacturing methods
    • G02F1/1345Conductors connecting electrodes to cell terminals
    • G02F1/13458Terminal pads
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/30Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
    • H01L22/32Additional lead-in metallisation on a device or substrate, e.g. additional pads or pad portions, lines in the scribe line, sacrificed conductors

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Manufacturing & Machinery (AREA)
  • Mathematical Physics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Liquid Crystal (AREA)
  • Wire Bonding (AREA)

Abstract

본 발명은 액정 표시 모듈 내의 반도체 칩과 액정 패널, 이들의 연결 방법 및 연결 확인 방법에 대하여 개시된다. 액정 표시 모듈은, 적어도 2개 이상의 제1 접착 검사용 패드들 및 제1 접착 검사용 패드들 사이에 연결되는 도전막을 포함하는 반도체 칩과, 제1 접착 검사용 패드들과 접착하는 제2 접착 검사용 패드들 및 제2 접착 검사용 패드들과 연결되는 유리 기판 라인들을 포함하는 액정 패널로 구성된다. 반도체 칩은 COG(Chip On the Glass) 타입 또는 COF(Chip On the Flim) 타입으로 액정 패널에 붙여진다.
PCT/KR2009/001548 2008-04-28 2009-03-26 액정 표시 모듈 내의 반도체 칩과 액정 패널, 액정 표시 모듈, 및 이들의 연결 방법과 연결 확인 방법 WO2009134011A2 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2008-0039271 2008-04-28
KR1020080039271A KR100952386B1 (ko) 2008-04-28 2008-04-28 액정 표시 모듈의 연결 방법

Publications (2)

Publication Number Publication Date
WO2009134011A2 WO2009134011A2 (ko) 2009-11-05
WO2009134011A3 true WO2009134011A3 (ko) 2010-01-14

Family

ID=41255516

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2009/001548 WO2009134011A2 (ko) 2008-04-28 2009-03-26 액정 표시 모듈 내의 반도체 칩과 액정 패널, 액정 표시 모듈, 및 이들의 연결 방법과 연결 확인 방법

Country Status (3)

Country Link
KR (1) KR100952386B1 (ko)
TW (1) TW200947645A (ko)
WO (1) WO2009134011A2 (ko)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110491318B (zh) * 2019-07-24 2020-11-24 武汉华星光电半导体显示技术有限公司 阵列基板
US11043159B2 (en) 2019-07-24 2021-06-22 Wuhan China Star Optoelectronics Semiconductor Display Technology Co., Ltd. Array substrate and display panel

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0682802A (ja) * 1992-08-31 1994-03-25 Hitachi Ltd 液晶表示装置
JP2002328628A (ja) * 2001-05-02 2002-11-15 Sharp Corp 表示用駆動装置、表示装置および表示装置の検査方法
KR20030053186A (ko) * 2001-12-22 2003-06-28 엘지.필립스 엘시디 주식회사 액정표시장치
KR20040057692A (ko) * 2002-12-26 2004-07-02 엘지.필립스 엘시디 주식회사 액정표시패널의 검사용 패드 구조

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003228079A (ja) 2002-02-04 2003-08-15 Seiko Instruments Inc 表示装置およびドライバic
KR20050029980A (ko) * 2003-09-24 2005-03-29 엘지.필립스 엘시디 주식회사 인쇄회로기판

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0682802A (ja) * 1992-08-31 1994-03-25 Hitachi Ltd 液晶表示装置
JP2002328628A (ja) * 2001-05-02 2002-11-15 Sharp Corp 表示用駆動装置、表示装置および表示装置の検査方法
KR20030053186A (ko) * 2001-12-22 2003-06-28 엘지.필립스 엘시디 주식회사 액정표시장치
KR20040057692A (ko) * 2002-12-26 2004-07-02 엘지.필립스 엘시디 주식회사 액정표시패널의 검사용 패드 구조

Also Published As

Publication number Publication date
KR100952386B1 (ko) 2010-04-14
WO2009134011A2 (ko) 2009-11-05
KR20090113514A (ko) 2009-11-02
TW200947645A (en) 2009-11-16

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