WO2009072544A1 - 電極構造及びその製造方法、回路基板、半導体モジュール - Google Patents
電極構造及びその製造方法、回路基板、半導体モジュール Download PDFInfo
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- WO2009072544A1 WO2009072544A1 PCT/JP2008/072019 JP2008072019W WO2009072544A1 WO 2009072544 A1 WO2009072544 A1 WO 2009072544A1 JP 2008072019 W JP2008072019 W JP 2008072019W WO 2009072544 A1 WO2009072544 A1 WO 2009072544A1
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- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
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- H01L2924/1025—Semiconducting materials
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- H01L2924/15786—Material with a principal constituent of the material being a non metallic, non metalloid inorganic material
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- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
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Abstract
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
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US12/746,056 US8710679B2 (en) | 2007-12-04 | 2008-12-04 | Electrode structure and its manufacturing method, and semiconductor module |
JP2009544701A JP5585080B2 (ja) | 2007-12-04 | 2008-12-04 | 電極構造及びその製造方法、回路基板、半導体モジュール |
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JP2007313535 | 2007-12-04 | ||
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WO2009072544A1 true WO2009072544A1 (ja) | 2009-06-11 |
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PCT/JP2008/072019 WO2009072544A1 (ja) | 2007-12-04 | 2008-12-04 | 電極構造及びその製造方法、回路基板、半導体モジュール |
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US (1) | US8710679B2 (ja) |
JP (1) | JP5585080B2 (ja) |
WO (1) | WO2009072544A1 (ja) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2012003315A2 (en) * | 2010-07-02 | 2012-01-05 | Texas Instruments Incorporated | Corrosion-resistant copper-to-aluminum bonds |
EP2410078A1 (en) * | 2010-07-20 | 2012-01-25 | TDK Corporation | Coating and electronic component |
JP2013127115A (ja) * | 2011-11-17 | 2013-06-27 | Tdk Corp | 被覆体及び電子部品 |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
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EP2535929A1 (en) * | 2011-06-14 | 2012-12-19 | Atotech Deutschland GmbH | Wire bondable surface for microelectronic devices |
US9548276B2 (en) * | 2012-04-18 | 2017-01-17 | Win Semiconductors Corp. | Structure of backside copper metallization for semiconductor devices and a fabrication method thereof |
EP2873752B1 (en) * | 2012-07-13 | 2020-05-20 | Toyo Kohan Co., Ltd. | Electroless gold plating method and gold-plate-coated material |
EP2740818B1 (en) * | 2012-12-05 | 2016-03-30 | ATOTECH Deutschland GmbH | Method for manufacture of wire bondable and solderable surfaces on noble metal electrodes |
US10321570B2 (en) * | 2013-04-04 | 2019-06-11 | Rohm Co., Ltd. | Composite chip component, circuit assembly and electronic apparatus |
CN103258747B (zh) * | 2013-05-16 | 2016-10-12 | 中国电子科技集团公司第四十一研究所 | 一种在金导体薄膜电路上进行铝丝键合的方法 |
US9343422B2 (en) * | 2014-03-31 | 2016-05-17 | Freescale Semiconductor, Inc. | Structure for aluminum pad metal under ball bond |
US10840008B2 (en) * | 2015-01-15 | 2020-11-17 | Murata Manufacturing Co., Ltd. | Electronic component and electronic component-mounted structure |
CN106558564B (zh) * | 2015-09-29 | 2019-08-27 | 稳懋半导体股份有限公司 | 半导体元件背面铜金属的改良结构 |
US20170100744A1 (en) * | 2015-10-12 | 2017-04-13 | Tyco Electronics Corporation | Electronic Component and Process of Producing Electronic Component |
EP3862463A4 (en) * | 2018-10-02 | 2022-06-01 | Japan Science and Technology Agency | HETEROEPTAXIAL STRUCTURE AND METHOD FOR PRODUCTION THEREOF, METAL LAMINATE PRODUCT CONTAINING HETEROEPTAXIAL STRUCTURE AND METHOD FOR PRODUCTION THEREOF, AND NANO-GAP ELECTRODE AND METHOD FOR PRODUCTION OF NANO-GAP ELECTRODE |
WO2021049235A1 (ja) * | 2019-09-13 | 2021-03-18 | 昭和電工株式会社 | 積層体およびその製造方法 |
JP7472770B2 (ja) * | 2020-12-15 | 2024-04-23 | トヨタ自動車株式会社 | 金属めっき皮膜の成膜装置及び成膜方法 |
Citations (3)
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JP2005072282A (ja) * | 2003-08-25 | 2005-03-17 | Kyocera Corp | 配線基板 |
JP2006196648A (ja) * | 2005-01-13 | 2006-07-27 | Hitachi Metals Ltd | 外部接合電極付き電子部品およびその製造方法 |
JP2006339609A (ja) * | 2005-06-06 | 2006-12-14 | Kyocer Slc Technologies Corp | 配線基板およびその製造方法 |
-
2008
- 2008-12-04 WO PCT/JP2008/072019 patent/WO2009072544A1/ja active Application Filing
- 2008-12-04 JP JP2009544701A patent/JP5585080B2/ja active Active
- 2008-12-04 US US12/746,056 patent/US8710679B2/en active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005072282A (ja) * | 2003-08-25 | 2005-03-17 | Kyocera Corp | 配線基板 |
JP2006196648A (ja) * | 2005-01-13 | 2006-07-27 | Hitachi Metals Ltd | 外部接合電極付き電子部品およびその製造方法 |
JP2006339609A (ja) * | 2005-06-06 | 2006-12-14 | Kyocer Slc Technologies Corp | 配線基板およびその製造方法 |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2012003315A2 (en) * | 2010-07-02 | 2012-01-05 | Texas Instruments Incorporated | Corrosion-resistant copper-to-aluminum bonds |
WO2012003315A3 (en) * | 2010-07-02 | 2012-04-12 | Texas Instruments Incorporated | Corrosion-resistant copper-to-aluminum bonds |
EP2410078A1 (en) * | 2010-07-20 | 2012-01-25 | TDK Corporation | Coating and electronic component |
US10392704B2 (en) | 2010-07-20 | 2019-08-27 | Tdk Corporation | Coating electronic component |
JP2013127115A (ja) * | 2011-11-17 | 2013-06-27 | Tdk Corp | 被覆体及び電子部品 |
Also Published As
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US20100258954A1 (en) | 2010-10-14 |
JPWO2009072544A1 (ja) | 2011-04-28 |
JP5585080B2 (ja) | 2014-09-10 |
US8710679B2 (en) | 2014-04-29 |
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