WO2009066650A1 - 変調コントラスト顕微鏡 - Google Patents

変調コントラスト顕微鏡 Download PDF

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Publication number
WO2009066650A1
WO2009066650A1 PCT/JP2008/070910 JP2008070910W WO2009066650A1 WO 2009066650 A1 WO2009066650 A1 WO 2009066650A1 JP 2008070910 W JP2008070910 W JP 2008070910W WO 2009066650 A1 WO2009066650 A1 WO 2009066650A1
Authority
WO
WIPO (PCT)
Prior art keywords
contrast microscope
modulation contrast
aperture
plane
modulator
Prior art date
Application number
PCT/JP2008/070910
Other languages
English (en)
French (fr)
Inventor
Kumiko Matsui
Original Assignee
Nikon Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikon Corporation filed Critical Nikon Corporation
Priority to CN200880123124.1A priority Critical patent/CN101910905B/zh
Priority to EP08851334.6A priority patent/EP2214045B1/en
Priority to US12/743,751 priority patent/US8599479B2/en
Priority to JP2009542550A priority patent/JP5338677B2/ja
Publication of WO2009066650A1 publication Critical patent/WO2009066650A1/ja
Priority to HK11104667.1A priority patent/HK1150666A1/xx

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/06Means for illuminating specimens
    • G02B21/08Condensers
    • G02B21/086Condensers for transillumination only
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/06Means for illuminating specimens
    • G02B21/08Condensers
    • G02B21/14Condensers affording illumination for phase-contrast observation
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/42Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
    • G02B27/46Systems using spatial filters

Abstract

 本発明は、ICSIにおいて精子の見え、特に尾の先端部のコントラストを向上し、ICSIの精子操作に良好な見えを提供できるようにする変調コントラスト顕微鏡に関する。 コンデンサレンズ26の前側焦点面あるいはその近傍に配置される部分開口24Aを有する開口部材24と、第1対物レンズ27の後側焦点面あるいはその共役面またはそれらの近傍であって、開口部材24と略共役な面に配置される変調器28とを備えており、変調器28において、部分開口24Aに対応する領域28Aの透過率T(%)は、1≦T≦8の条件を満たすことで、ICSIの精子操作に良好な見えを提供できるようにする。本発明は、変調コントラスト顕微鏡に適用できる。
PCT/JP2008/070910 2007-11-19 2008-11-18 変調コントラスト顕微鏡 WO2009066650A1 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
CN200880123124.1A CN101910905B (zh) 2007-11-19 2008-11-18 调节对比度显微镜
EP08851334.6A EP2214045B1 (en) 2007-11-19 2008-11-18 Modulation contrast microscope
US12/743,751 US8599479B2 (en) 2007-11-19 2008-11-18 Modulation contrast microscope
JP2009542550A JP5338677B2 (ja) 2007-11-19 2008-11-18 顕微授精用変調コントラスト顕微鏡および変調コントラスト顕微鏡
HK11104667.1A HK1150666A1 (en) 2007-11-19 2011-05-12 Modulation contrast microscope

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007299486 2007-11-19
JP2007-299486 2007-11-19

Publications (1)

Publication Number Publication Date
WO2009066650A1 true WO2009066650A1 (ja) 2009-05-28

Family

ID=40667472

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/070910 WO2009066650A1 (ja) 2007-11-19 2008-11-18 変調コントラスト顕微鏡

Country Status (6)

Country Link
US (1) US8599479B2 (ja)
EP (1) EP2214045B1 (ja)
JP (1) JP5338677B2 (ja)
CN (1) CN101910905B (ja)
HK (1) HK1150666A1 (ja)
WO (1) WO2009066650A1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017530417A (ja) * 2014-10-06 2017-10-12 ライカ マイクロシステムズ (シュヴァイツ) アクチエンゲゼルシャフトLeica Microsystems (Schweiz) AG 顕微鏡

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101910905B (zh) 2007-11-19 2013-09-25 株式会社尼康 调节对比度显微镜
ES2387491B1 (es) * 2011-02-28 2013-08-08 Universidad De Murcia Procedimiento y sistema para la obtención de imágenes cuantitativas en microscopía óptica de fase.
JPWO2012150689A1 (ja) * 2011-05-02 2014-07-28 オリンパス株式会社 顕微鏡、及び、顕微鏡を用いた顕微授精方法
DE102011052721A1 (de) * 2011-08-16 2013-02-21 Hseb Dresden Gmbh Messverfahren für Höhenprofile von Oberflächen
US9213174B2 (en) * 2012-11-01 2015-12-15 Olympus Corporation Microscope and controlling method
CN103529542A (zh) * 2013-10-24 2014-01-22 广州粤显光学仪器有限责任公司 偏振光调制相衬显微镜
CN106908627B (zh) * 2017-03-10 2019-10-01 中国科学院青海盐湖研究所 扫描极化力显微镜成像对比度的调控方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51128548A (en) 1974-06-05 1976-11-09 Hoffman Robert Variable contrast microscope
JPH0235408A (ja) * 1988-07-26 1990-02-06 Olympus Optical Co Ltd 顕微鏡
JP2001194592A (ja) * 2000-01-07 2001-07-19 Nikon Corp 位相物体観察装置
JP2003131139A (ja) 2001-10-24 2003-05-08 Olympus Optical Co Ltd 変調コントラスト顕微鏡

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4200354A (en) * 1974-09-05 1980-04-29 Robert Hoffman Microscopy systems with rectangular illumination particularly adapted for viewing transparent objects
JP2966026B2 (ja) * 1990-03-19 1999-10-25 オリンパス光学工業株式会社 顕微鏡
JP3708246B2 (ja) * 1996-09-19 2005-10-19 オリンパス株式会社 光制御部材を有する光学顕微鏡
JP4020714B2 (ja) * 2001-08-09 2007-12-12 オリンパス株式会社 顕微鏡
DE10245974A1 (de) 2002-10-02 2004-04-15 Leica Mikroskopie Und Systeme Gmbh Phasenschiebungs-Verfahren und Vorrichtung zur Realisierung von Phasenkontrast- bzw. Modulationskontrast-Beobachtung an Mikroskopen
DE10314750A1 (de) 2003-03-31 2004-11-04 Leica Microsystems Heidelberg Gmbh Rastermikroskop zur Detektion eines Objekts
CN101910905B (zh) 2007-11-19 2013-09-25 株式会社尼康 调节对比度显微镜

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51128548A (en) 1974-06-05 1976-11-09 Hoffman Robert Variable contrast microscope
JPH0235408A (ja) * 1988-07-26 1990-02-06 Olympus Optical Co Ltd 顕微鏡
JP2001194592A (ja) * 2000-01-07 2001-07-19 Nikon Corp 位相物体観察装置
JP2003131139A (ja) 2001-10-24 2003-05-08 Olympus Optical Co Ltd 変調コントラスト顕微鏡

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP2214045A4

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017530417A (ja) * 2014-10-06 2017-10-12 ライカ マイクロシステムズ (シュヴァイツ) アクチエンゲゼルシャフトLeica Microsystems (Schweiz) AG 顕微鏡

Also Published As

Publication number Publication date
EP2214045B1 (en) 2013-06-05
US20100284067A1 (en) 2010-11-11
CN101910905B (zh) 2013-09-25
JPWO2009066650A1 (ja) 2011-04-07
HK1150666A1 (en) 2012-01-06
US8599479B2 (en) 2013-12-03
CN101910905A (zh) 2010-12-08
JP5338677B2 (ja) 2013-11-13
EP2214045A4 (en) 2011-02-16
EP2214045A1 (en) 2010-08-04

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