WO2009066650A1 - 変調コントラスト顕微鏡 - Google Patents
変調コントラスト顕微鏡 Download PDFInfo
- Publication number
- WO2009066650A1 WO2009066650A1 PCT/JP2008/070910 JP2008070910W WO2009066650A1 WO 2009066650 A1 WO2009066650 A1 WO 2009066650A1 JP 2008070910 W JP2008070910 W JP 2008070910W WO 2009066650 A1 WO2009066650 A1 WO 2009066650A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- contrast microscope
- modulation contrast
- aperture
- plane
- modulator
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/06—Means for illuminating specimens
- G02B21/08—Condensers
- G02B21/086—Condensers for transillumination only
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/06—Means for illuminating specimens
- G02B21/08—Condensers
- G02B21/14—Condensers affording illumination for phase-contrast observation
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
- G02B27/46—Systems using spatial filters
Abstract
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN200880123124.1A CN101910905B (zh) | 2007-11-19 | 2008-11-18 | 调节对比度显微镜 |
EP08851334.6A EP2214045B1 (en) | 2007-11-19 | 2008-11-18 | Modulation contrast microscope |
US12/743,751 US8599479B2 (en) | 2007-11-19 | 2008-11-18 | Modulation contrast microscope |
JP2009542550A JP5338677B2 (ja) | 2007-11-19 | 2008-11-18 | 顕微授精用変調コントラスト顕微鏡および変調コントラスト顕微鏡 |
HK11104667.1A HK1150666A1 (en) | 2007-11-19 | 2011-05-12 | Modulation contrast microscope |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007299486 | 2007-11-19 | ||
JP2007-299486 | 2007-11-19 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2009066650A1 true WO2009066650A1 (ja) | 2009-05-28 |
Family
ID=40667472
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2008/070910 WO2009066650A1 (ja) | 2007-11-19 | 2008-11-18 | 変調コントラスト顕微鏡 |
Country Status (6)
Country | Link |
---|---|
US (1) | US8599479B2 (ja) |
EP (1) | EP2214045B1 (ja) |
JP (1) | JP5338677B2 (ja) |
CN (1) | CN101910905B (ja) |
HK (1) | HK1150666A1 (ja) |
WO (1) | WO2009066650A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2017530417A (ja) * | 2014-10-06 | 2017-10-12 | ライカ マイクロシステムズ (シュヴァイツ) アクチエンゲゼルシャフトLeica Microsystems (Schweiz) AG | 顕微鏡 |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101910905B (zh) | 2007-11-19 | 2013-09-25 | 株式会社尼康 | 调节对比度显微镜 |
ES2387491B1 (es) * | 2011-02-28 | 2013-08-08 | Universidad De Murcia | Procedimiento y sistema para la obtención de imágenes cuantitativas en microscopía óptica de fase. |
JPWO2012150689A1 (ja) * | 2011-05-02 | 2014-07-28 | オリンパス株式会社 | 顕微鏡、及び、顕微鏡を用いた顕微授精方法 |
DE102011052721A1 (de) * | 2011-08-16 | 2013-02-21 | Hseb Dresden Gmbh | Messverfahren für Höhenprofile von Oberflächen |
US9213174B2 (en) * | 2012-11-01 | 2015-12-15 | Olympus Corporation | Microscope and controlling method |
CN103529542A (zh) * | 2013-10-24 | 2014-01-22 | 广州粤显光学仪器有限责任公司 | 偏振光调制相衬显微镜 |
CN106908627B (zh) * | 2017-03-10 | 2019-10-01 | 中国科学院青海盐湖研究所 | 扫描极化力显微镜成像对比度的调控方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS51128548A (en) | 1974-06-05 | 1976-11-09 | Hoffman Robert | Variable contrast microscope |
JPH0235408A (ja) * | 1988-07-26 | 1990-02-06 | Olympus Optical Co Ltd | 顕微鏡 |
JP2001194592A (ja) * | 2000-01-07 | 2001-07-19 | Nikon Corp | 位相物体観察装置 |
JP2003131139A (ja) | 2001-10-24 | 2003-05-08 | Olympus Optical Co Ltd | 変調コントラスト顕微鏡 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4200354A (en) * | 1974-09-05 | 1980-04-29 | Robert Hoffman | Microscopy systems with rectangular illumination particularly adapted for viewing transparent objects |
JP2966026B2 (ja) * | 1990-03-19 | 1999-10-25 | オリンパス光学工業株式会社 | 顕微鏡 |
JP3708246B2 (ja) * | 1996-09-19 | 2005-10-19 | オリンパス株式会社 | 光制御部材を有する光学顕微鏡 |
JP4020714B2 (ja) * | 2001-08-09 | 2007-12-12 | オリンパス株式会社 | 顕微鏡 |
DE10245974A1 (de) | 2002-10-02 | 2004-04-15 | Leica Mikroskopie Und Systeme Gmbh | Phasenschiebungs-Verfahren und Vorrichtung zur Realisierung von Phasenkontrast- bzw. Modulationskontrast-Beobachtung an Mikroskopen |
DE10314750A1 (de) | 2003-03-31 | 2004-11-04 | Leica Microsystems Heidelberg Gmbh | Rastermikroskop zur Detektion eines Objekts |
CN101910905B (zh) | 2007-11-19 | 2013-09-25 | 株式会社尼康 | 调节对比度显微镜 |
-
2008
- 2008-11-18 CN CN200880123124.1A patent/CN101910905B/zh active Active
- 2008-11-18 US US12/743,751 patent/US8599479B2/en active Active
- 2008-11-18 JP JP2009542550A patent/JP5338677B2/ja active Active
- 2008-11-18 WO PCT/JP2008/070910 patent/WO2009066650A1/ja active Application Filing
- 2008-11-18 EP EP08851334.6A patent/EP2214045B1/en active Active
-
2011
- 2011-05-12 HK HK11104667.1A patent/HK1150666A1/xx not_active IP Right Cessation
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS51128548A (en) | 1974-06-05 | 1976-11-09 | Hoffman Robert | Variable contrast microscope |
JPH0235408A (ja) * | 1988-07-26 | 1990-02-06 | Olympus Optical Co Ltd | 顕微鏡 |
JP2001194592A (ja) * | 2000-01-07 | 2001-07-19 | Nikon Corp | 位相物体観察装置 |
JP2003131139A (ja) | 2001-10-24 | 2003-05-08 | Olympus Optical Co Ltd | 変調コントラスト顕微鏡 |
Non-Patent Citations (1)
Title |
---|
See also references of EP2214045A4 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2017530417A (ja) * | 2014-10-06 | 2017-10-12 | ライカ マイクロシステムズ (シュヴァイツ) アクチエンゲゼルシャフトLeica Microsystems (Schweiz) AG | 顕微鏡 |
Also Published As
Publication number | Publication date |
---|---|
EP2214045B1 (en) | 2013-06-05 |
US20100284067A1 (en) | 2010-11-11 |
CN101910905B (zh) | 2013-09-25 |
JPWO2009066650A1 (ja) | 2011-04-07 |
HK1150666A1 (en) | 2012-01-06 |
US8599479B2 (en) | 2013-12-03 |
CN101910905A (zh) | 2010-12-08 |
JP5338677B2 (ja) | 2013-11-13 |
EP2214045A4 (en) | 2011-02-16 |
EP2214045A1 (en) | 2010-08-04 |
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