WO2009057582A1 - 電気的接続体及びその製造方法 - Google Patents
電気的接続体及びその製造方法 Download PDFInfo
- Publication number
- WO2009057582A1 WO2009057582A1 PCT/JP2008/069514 JP2008069514W WO2009057582A1 WO 2009057582 A1 WO2009057582 A1 WO 2009057582A1 JP 2008069514 W JP2008069514 W JP 2008069514W WO 2009057582 A1 WO2009057582 A1 WO 2009057582A1
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- WIPO (PCT)
- Prior art keywords
- electrical connection
- connection body
- conductive film
- conductive particles
- fabricating
- Prior art date
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Abstract
異方性導電膜に含まれる導電性粒子の粒子径が小さい場合であっても、これを均一に潰すことが可能であり、良好な導通特性を得ることが可能な電気的接続体を提供する。 電気的接続体は、第1の電子部材である半導体素子1と第2の電子部材である配線基板3とが異方性導電膜5を介して電気的に接続されて構成される。いずれか一方の電子部材(ここでは半導体素子1)には、バンプ(突起電極)2が形成されており、バンプ2の頂部は、表面粗さRaが0.05μm以下の平坦面とされている。異方性導電膜5に含まれる導電性粒子6の平均粒径は、4μm以下である。
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KR1020097022670A KR101505214B1 (ko) | 2007-10-29 | 2008-10-28 | 전기적 접속체 및 그 제조 방법 |
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JP2007-279941 | 2007-10-29 | ||
JP2007279941A JP5622137B2 (ja) | 2007-10-29 | 2007-10-29 | 電気的接続体及びその製造方法 |
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KR (1) | KR101505214B1 (ja) |
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP3036762A4 (en) * | 2013-08-21 | 2017-03-22 | LG Electronics Inc. | Semiconductor device |
CN113611785A (zh) * | 2018-02-01 | 2021-11-05 | 新唐科技日本株式会社 | 半导体装置 |
TWI809284B (zh) * | 2015-01-13 | 2023-07-21 | 日商迪睿合股份有限公司 | 異向導電膜、連接構造體及連接構造體之製造方法 |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103180944A (zh) | 2010-10-25 | 2013-06-26 | 松下电器产业株式会社 | 电子元件的接合方式 |
TWI456674B (zh) * | 2012-01-03 | 2014-10-11 | Chipbond Technology Corp | 半導體封裝方法及其結構 |
JP6209313B2 (ja) | 2012-02-20 | 2017-10-04 | デクセリアルズ株式会社 | 異方性導電フィルム、接続構造体、接続構造体の製造方法及び接続方法 |
JP2015179831A (ja) * | 2014-02-27 | 2015-10-08 | デクセリアルズ株式会社 | 接続体、接続体の製造方法及び検査方法 |
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JP2005340326A (ja) * | 2004-05-25 | 2005-12-08 | Nippon Avionics Co Ltd | 電気部品の接続方法 |
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JPS56108892A (en) * | 1980-01-31 | 1981-08-28 | Electroplating Eng Of Japan Co | Plating solution with pure gold |
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JPH065609A (ja) * | 1992-06-17 | 1994-01-14 | Tanaka Kikinzoku Kogyo Kk | バンプ形成方法 |
CN1135611C (zh) * | 1999-01-27 | 2004-01-21 | 时至准钟表股份有限公司 | 使用各向异性导电粘接剂的半导体装置的安装方法 |
JP2001007137A (ja) * | 1999-06-24 | 2001-01-12 | Nec Corp | 半導体装置の製造方法 |
TW200638497A (en) * | 2005-04-19 | 2006-11-01 | Elan Microelectronics Corp | Bumping process and bump structure |
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- 2007-10-29 JP JP2007279941A patent/JP5622137B2/ja not_active Expired - Fee Related
-
2008
- 2008-10-28 WO PCT/JP2008/069514 patent/WO2009057582A1/ja active Application Filing
- 2008-10-28 KR KR1020097022670A patent/KR101505214B1/ko not_active IP Right Cessation
- 2008-10-29 TW TW097141683A patent/TWI443762B/zh not_active IP Right Cessation
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JP2000269269A (ja) * | 1999-03-15 | 2000-09-29 | Toshiba Corp | 半導体実装用基板と半導体装置および半導体装置の製造方法 |
JP2005340326A (ja) * | 2004-05-25 | 2005-12-08 | Nippon Avionics Co Ltd | 電気部品の接続方法 |
JP2005347452A (ja) * | 2004-06-02 | 2005-12-15 | Renesas Technology Corp | 半導体装置の製造方法 |
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Publication number | Priority date | Publication date | Assignee | Title |
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EP3036762A4 (en) * | 2013-08-21 | 2017-03-22 | LG Electronics Inc. | Semiconductor device |
TWI809284B (zh) * | 2015-01-13 | 2023-07-21 | 日商迪睿合股份有限公司 | 異向導電膜、連接構造體及連接構造體之製造方法 |
CN113611785A (zh) * | 2018-02-01 | 2021-11-05 | 新唐科技日本株式会社 | 半导体装置 |
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JP2009111043A (ja) | 2009-05-21 |
TWI443762B (zh) | 2014-07-01 |
KR20100077129A (ko) | 2010-07-07 |
JP5622137B2 (ja) | 2014-11-12 |
KR101505214B1 (ko) | 2015-03-23 |
TW200935531A (en) | 2009-08-16 |
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