WO2009054193A1 - 光スペクトラムアナライザ - Google Patents

光スペクトラムアナライザ Download PDF

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Publication number
WO2009054193A1
WO2009054193A1 PCT/JP2008/066064 JP2008066064W WO2009054193A1 WO 2009054193 A1 WO2009054193 A1 WO 2009054193A1 JP 2008066064 W JP2008066064 W JP 2008066064W WO 2009054193 A1 WO2009054193 A1 WO 2009054193A1
Authority
WO
WIPO (PCT)
Prior art keywords
light
optical spectrum
under test
device under
spectrum analyzer
Prior art date
Application number
PCT/JP2008/066064
Other languages
English (en)
French (fr)
Inventor
Kiyokazu Yamada
Hideaki Kobayashi
Original Assignee
Murata Manufacturing Co., Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Murata Manufacturing Co., Ltd. filed Critical Murata Manufacturing Co., Ltd.
Publication of WO2009054193A1 publication Critical patent/WO2009054193A1/ja

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G01M11/3172—Reflectometers detecting the back-scattered light in the frequency-domain, e.g. OFDR, FMCW, heterodyne detection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/333—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face using modulated input signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/335—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face using two or more input wavelengths

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  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optical Integrated Circuits (AREA)

Abstract

　光導波路と、弾性表面波を伝搬して光導波路を伝搬する光のモードを変換するＳＡＷ導波路と、該ＳＡＷ導波路を伝搬する弾性表面波を励振するＩＤＴと、を基板に設けてなり、広帯域光源からの光を入射し、出射光を被測定対象物（ＤＵＴ）に入射させる音響光学波長可変フィルタ（ＡＯＴＦ）を備え、この音響光学波長可変フィルタ（ＡＯＴＦ）と受光器とに間に被測定対象物（ＤＵＴ）を設け、音響光学波長可変フィルタ（ＡＯＴＦ）のＩＤＴに対する高周波信号と前記受光器の受光信号強度との関係を基に被測定対象物（ＤＵＴ）の光スペクトラムを求める。この構成により、被測定物体の透過光または反射光のスペクトラムを測定する低コストな光スペクトラムアナライザを得る。また、測定スピードを低下させることなく多チャンネルでの測定を可能とする。
PCT/JP2008/066064 2007-10-26 2008-09-05 光スペクトラムアナライザ WO2009054193A1 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007-279322 2007-10-26
JP2007279322 2007-10-26

Publications (1)

Publication Number Publication Date
WO2009054193A1 true WO2009054193A1 (ja) 2009-04-30

Family

ID=40579300

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/066064 WO2009054193A1 (ja) 2007-10-26 2008-09-05 光スペクトラムアナライザ

Country Status (1)

Country Link
WO (1) WO2009054193A1 (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014072845A1 (en) * 2012-11-09 2014-05-15 Koninklijke Philips N.V. Optical frequency domain reflectometry system with multiple fibers per detection chain
CN104991356A (zh) * 2015-07-24 2015-10-21 浙江大学 一种基于soi的mz型声光调制器
WO2018056208A1 (ja) * 2016-09-20 2018-03-29 長野計器株式会社 光波長測定装置

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0280935A (ja) * 1988-09-19 1990-03-22 Fujikura Ltd 単一モード光ファイバのカットオフ波長の測定法
JP2005030890A (ja) * 2003-07-11 2005-02-03 Toshiba Corp ファイバブラッググレーティング物理量計測方法および装置
JP2005164397A (ja) * 2003-12-02 2005-06-23 Hitachi Cable Ltd 波長計測装置及び波長算出方法
JP2005227130A (ja) * 2004-02-13 2005-08-25 Anritsu Corp 光スペクトラムアナライザおよびそれを用いたマルチチャンネル測定装置
JP2006138757A (ja) * 2004-11-12 2006-06-01 Showa Electric Wire & Cable Co Ltd 光ファイバ式多元センサシステム
WO2007083609A1 (ja) * 2006-01-17 2007-07-26 Murata Manufacturing Co., Ltd. 光スペクトラムアナライザ

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0280935A (ja) * 1988-09-19 1990-03-22 Fujikura Ltd 単一モード光ファイバのカットオフ波長の測定法
JP2005030890A (ja) * 2003-07-11 2005-02-03 Toshiba Corp ファイバブラッググレーティング物理量計測方法および装置
JP2005164397A (ja) * 2003-12-02 2005-06-23 Hitachi Cable Ltd 波長計測装置及び波長算出方法
JP2005227130A (ja) * 2004-02-13 2005-08-25 Anritsu Corp 光スペクトラムアナライザおよびそれを用いたマルチチャンネル測定装置
JP2006138757A (ja) * 2004-11-12 2006-06-01 Showa Electric Wire & Cable Co Ltd 光ファイバ式多元センサシステム
WO2007083609A1 (ja) * 2006-01-17 2007-07-26 Murata Manufacturing Co., Ltd. 光スペクトラムアナライザ

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
TANAKA S. ET AL.: "Onkyo Kogaku Soshi no Yugami Sensor eno Oyo", IEICE TECHNICAL REPORT, vol. 106, no. 482, 19 January 2007 (2007-01-19), pages 41 - 46 *

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014072845A1 (en) * 2012-11-09 2014-05-15 Koninklijke Philips N.V. Optical frequency domain reflectometry system with multiple fibers per detection chain
CN104991356A (zh) * 2015-07-24 2015-10-21 浙江大学 一种基于soi的mz型声光调制器
WO2018056208A1 (ja) * 2016-09-20 2018-03-29 長野計器株式会社 光波長測定装置

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