WO2009051081A1 - 鏡筒ベースユニットおよび顕微鏡 - Google Patents

鏡筒ベースユニットおよび顕微鏡 Download PDF

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Publication number
WO2009051081A1
WO2009051081A1 PCT/JP2008/068484 JP2008068484W WO2009051081A1 WO 2009051081 A1 WO2009051081 A1 WO 2009051081A1 JP 2008068484 W JP2008068484 W JP 2008068484W WO 2009051081 A1 WO2009051081 A1 WO 2009051081A1
Authority
WO
WIPO (PCT)
Prior art keywords
microscope
lens
base unit
barrel base
plane
Prior art date
Application number
PCT/JP2008/068484
Other languages
English (en)
French (fr)
Inventor
Masaaki Tamura
Original Assignee
Nikon Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikon Corporation filed Critical Nikon Corporation
Priority to JP2009538080A priority Critical patent/JP5370157B2/ja
Priority to EP08838991.1A priority patent/EP2202557B1/en
Publication of WO2009051081A1 publication Critical patent/WO2009051081A1/ja
Priority to US12/761,261 priority patent/US8300308B2/en

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/0088—Inverse microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/14—Condensers affording illumination for phase-contrast observation

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)

Abstract

本発明は、顕微鏡に位相差観察の機能を容易に追加できるようにする鏡筒ベースユニットおよび顕微鏡に関する。 鏡筒ベースユニット１２は、顕微鏡の本体に対して着脱可能であり、顕微鏡の本体に装着された状態において、顕微鏡の観察光学系において対物レンズの像側焦点面と共役な面である瞳共役面を含む。ターレット３２を中心軸６７を中心に回転させることにより、ターレット３２に設けられている位相板６４ａ乃至６４ｃを瞳共役面に挿入することができる。本発明は、例えば、位相差顕微鏡に適用できる。
PCT/JP2008/068484 2007-10-15 2008-10-10 鏡筒ベースユニットおよび顕微鏡 WO2009051081A1 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2009538080A JP5370157B2 (ja) 2007-10-15 2008-10-10 鏡筒ベースユニットおよび顕微鏡
EP08838991.1A EP2202557B1 (en) 2007-10-15 2008-10-10 A method of modifying an inverted microscope
US12/761,261 US8300308B2 (en) 2007-10-15 2010-04-15 Eyepiece base unit and microscope

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007-267353 2007-10-15
JP2007267353 2007-10-15

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US12/761,261 Continuation US8300308B2 (en) 2007-10-15 2010-04-15 Eyepiece base unit and microscope

Publications (1)

Publication Number Publication Date
WO2009051081A1 true WO2009051081A1 (ja) 2009-04-23

Family

ID=40567347

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/068484 WO2009051081A1 (ja) 2007-10-15 2008-10-10 鏡筒ベースユニットおよび顕微鏡

Country Status (4)

Country Link
US (1) US8300308B2 (ja)
EP (1) EP2202557B1 (ja)
JP (1) JP5370157B2 (ja)
WO (1) WO2009051081A1 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010175774A (ja) * 2009-01-29 2010-08-12 Nikon Corp 顕微鏡装置
JP2013512469A (ja) * 2009-12-01 2013-04-11 ライカ マイクロシステムス ツェーエムエス ゲーエムベーハー ラスタ顕微鏡用の位相フィルタ

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5543787A (en) * 1994-03-23 1996-08-06 International Business Machines Corporation Keyboard with translating sections
JP5829212B2 (ja) * 2010-08-25 2015-12-09 株式会社ニコン 顕微鏡光学系の製造方法
WO2012097191A2 (en) 2011-01-12 2012-07-19 Idea Machine Development Design & Production Ltd. Compact microscopy system and method
JP5738682B2 (ja) * 2011-06-02 2015-06-24 オリンパス株式会社 光軸調整装置
DE102012024737B4 (de) * 2012-12-18 2023-02-16 Carl Zeiss Microscopy Gmbh Verfahren zur Korrektur der Parzentrizität für Zoomsysteme
JP1552349S (ja) * 2015-09-24 2019-06-03
JP1552974S (ja) * 2015-10-13 2016-07-04
JP1552251S (ja) * 2015-10-13 2017-03-13
JP1571550S (ja) * 2015-10-13 2017-03-13
CN107907982A (zh) * 2017-12-20 2018-04-13 陈登民 亚克力显微镜

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60263918A (ja) * 1984-06-13 1985-12-27 Olympus Optical Co Ltd 倒立型顕微鏡
JPH0735986A (ja) * 1993-05-17 1995-02-07 Olympus Optical Co Ltd 倒立型及び正立型顕微鏡
JPH0815612A (ja) * 1994-07-01 1996-01-19 Olympus Optical Co Ltd 顕微鏡装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3938412A1 (de) * 1989-11-18 1991-05-23 Zeiss Carl Fa Mikroskop mit einem diagonal verlaufenden beobachtungsstrahlengang
JP3650392B2 (ja) 1993-05-17 2005-05-18 オリンパス株式会社 倒立顕微鏡
US5808791A (en) * 1994-07-01 1998-09-15 Olympus Optical Co., Ltd. Microscope apparatus
JPH11344675A (ja) * 1998-05-29 1999-12-14 Nikon Corp 倒立顕微鏡
JP5055568B2 (ja) * 2006-02-17 2012-10-24 株式会社ニコン 位相差顕微鏡

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60263918A (ja) * 1984-06-13 1985-12-27 Olympus Optical Co Ltd 倒立型顕微鏡
JPH0697304B2 (ja) 1984-06-13 1994-11-30 オリンパス光学工業株式会社 顕微鏡
JPH0735986A (ja) * 1993-05-17 1995-02-07 Olympus Optical Co Ltd 倒立型及び正立型顕微鏡
US5777783A (en) 1993-05-17 1998-07-07 Olympus Optical Co., Ltd. Microscope
JPH0815612A (ja) * 1994-07-01 1996-01-19 Olympus Optical Co Ltd 顕微鏡装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010175774A (ja) * 2009-01-29 2010-08-12 Nikon Corp 顕微鏡装置
JP2013512469A (ja) * 2009-12-01 2013-04-11 ライカ マイクロシステムス ツェーエムエス ゲーエムベーハー ラスタ顕微鏡用の位相フィルタ
US9250429B2 (en) 2009-12-01 2016-02-02 Leica Microsystems Cms Gmbh Phase filters for a scanning microscope

Also Published As

Publication number Publication date
US8300308B2 (en) 2012-10-30
EP2202557A4 (en) 2010-11-17
EP2202557A1 (en) 2010-06-30
JP5370157B2 (ja) 2013-12-18
US20100195199A1 (en) 2010-08-05
JPWO2009051081A1 (ja) 2011-03-03
EP2202557B1 (en) 2017-11-22

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