WO2009028035A1 - 開閉装置の予寿命診断方法及び装置 - Google Patents

開閉装置の予寿命診断方法及び装置 Download PDF

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Publication number
WO2009028035A1
WO2009028035A1 PCT/JP2007/066546 JP2007066546W WO2009028035A1 WO 2009028035 A1 WO2009028035 A1 WO 2009028035A1 JP 2007066546 W JP2007066546 W JP 2007066546W WO 2009028035 A1 WO2009028035 A1 WO 2009028035A1
Authority
WO
WIPO (PCT)
Prior art keywords
switchgear
deterioration
remaining lifetime
estimated
state
Prior art date
Application number
PCT/JP2007/066546
Other languages
English (en)
French (fr)
Inventor
Akihiko Maruyama
Original Assignee
Mitsubishi Electric Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corporation filed Critical Mitsubishi Electric Corporation
Priority to PCT/JP2007/066546 priority Critical patent/WO2009028035A1/ja
Publication of WO2009028035A1 publication Critical patent/WO2009028035A1/ja

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
    • G01R31/3271—Testing of circuit interrupters, switches or circuit-breakers of high voltage or medium voltage devices
    • G01R31/3272—Apparatus, systems or circuits therefor
    • G01R31/3274—Details related to measuring, e.g. sensing, displaying or computing; Measuring of variables related to the contact pieces, e.g. wear, position or resistance
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/0227—Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions
    • G05B23/0232—Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions based on qualitative trend analysis, e.g. system evolution
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0283—Predictive maintenance, e.g. involving the monitoring of a system and, based on the monitoring results, taking decisions on the maintenance schedule of the monitored system; Estimating remaining useful life [RUL]

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • Theoretical Computer Science (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)

Abstract

　計測された開閉装置の劣化状態を示す状態量の履歴データに基づいて、経過時間、動作回数、不動作時間を夫々軸として状態量を配列した３つの系列データを作成し、夫々の系列データ毎に開閉装置の劣化傾向を判定して予寿命の推定値を算出し、これらの推定値のうち最小の推定値を開閉装置の予寿命として推定するとともに劣化要因推定するようにした開閉装置の劣化診断方法及び装置であり、複合的な要因によって劣化が進行する開閉装置の駆動機構部の劣化傾向、及び、予寿命を正確に推定する。
PCT/JP2007/066546 2007-08-27 2007-08-27 開閉装置の予寿命診断方法及び装置 WO2009028035A1 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/066546 WO2009028035A1 (ja) 2007-08-27 2007-08-27 開閉装置の予寿命診断方法及び装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/066546 WO2009028035A1 (ja) 2007-08-27 2007-08-27 開閉装置の予寿命診断方法及び装置

Publications (1)

Publication Number Publication Date
WO2009028035A1 true WO2009028035A1 (ja) 2009-03-05

Family

ID=40386779

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/066546 WO2009028035A1 (ja) 2007-08-27 2007-08-27 開閉装置の予寿命診断方法及び装置

Country Status (1)

Country Link
WO (1) WO2009028035A1 (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7233482B2 (en) 2000-12-06 2007-06-19 Cap-Xx Limited Energy storage device
CN103323226A (zh) * 2013-06-21 2013-09-25 国家电网公司 高压断路器操动机构负荷指数预测装置及方法
JP2020038172A (ja) * 2018-09-05 2020-03-12 富士電機株式会社 機械診断装置及び機械診断プログラム

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11250777A (ja) * 1998-03-02 1999-09-17 Mitsubishi Electric Corp 開閉機器動作診断装置
JP2002149230A (ja) * 2000-11-13 2002-05-24 Nissin Electric Co Ltd 機器応動監視方法
JP2004192441A (ja) * 2002-12-12 2004-07-08 Hitachi Ltd 機器診断システム

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11250777A (ja) * 1998-03-02 1999-09-17 Mitsubishi Electric Corp 開閉機器動作診断装置
JP2002149230A (ja) * 2000-11-13 2002-05-24 Nissin Electric Co Ltd 機器応動監視方法
JP2004192441A (ja) * 2002-12-12 2004-07-08 Hitachi Ltd 機器診断システム

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7233482B2 (en) 2000-12-06 2007-06-19 Cap-Xx Limited Energy storage device
CN103323226A (zh) * 2013-06-21 2013-09-25 国家电网公司 高压断路器操动机构负荷指数预测装置及方法
CN103323226B (zh) * 2013-06-21 2016-01-20 国家电网公司 高压断路器操动机构负荷指数预测方法
JP2020038172A (ja) * 2018-09-05 2020-03-12 富士電機株式会社 機械診断装置及び機械診断プログラム
JP7222204B2 (ja) 2018-09-05 2023-02-15 富士電機株式会社 機械診断装置及び機械診断プログラム

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