WO2009027459A3 - Sonnensensor zur erfassung der einfallsrichtung und der intensität von sonnenstrahlung - Google Patents

Sonnensensor zur erfassung der einfallsrichtung und der intensität von sonnenstrahlung Download PDF

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Publication number
WO2009027459A3
WO2009027459A3 PCT/EP2008/061293 EP2008061293W WO2009027459A3 WO 2009027459 A3 WO2009027459 A3 WO 2009027459A3 EP 2008061293 W EP2008061293 W EP 2008061293W WO 2009027459 A3 WO2009027459 A3 WO 2009027459A3
Authority
WO
WIPO (PCT)
Prior art keywords
solar
sensor
solar radiation
incidence
radiation
Prior art date
Application number
PCT/EP2008/061293
Other languages
English (en)
French (fr)
Other versions
WO2009027459A2 (de
Inventor
Otto Knittel
Bernd Stich
Ralph Trapp
Dirk Nagel
Original Assignee
Behr Hella Thermocontrol Gmbh
Otto Knittel
Bernd Stich
Ralph Trapp
Dirk Nagel
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Behr Hella Thermocontrol Gmbh, Otto Knittel, Bernd Stich, Ralph Trapp, Dirk Nagel filed Critical Behr Hella Thermocontrol Gmbh
Priority to EP08803319A priority Critical patent/EP2181313A2/de
Priority to US12/674,370 priority patent/US8785858B2/en
Priority to JP2010522369A priority patent/JP2010537214A/ja
Publication of WO2009027459A2 publication Critical patent/WO2009027459A2/de
Publication of WO2009027459A3 publication Critical patent/WO2009027459A3/de

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/02016—Circuit arrangements of general character for the devices
    • H01L31/02019—Circuit arrangements of general character for the devices for devices characterised by at least one potential jump barrier or surface barrier
    • H01L31/02024—Position sensitive and lateral effect photodetectors; Quadrant photodiodes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4228—Photometry, e.g. photographic exposure meter using electric radiation detectors arrangements with two or more detectors, e.g. for sensitivity compensation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S3/00—Direction-finders for determining the direction from which infrasonic, sonic, ultrasonic, or electromagnetic waves, or particle emission, not having a directional significance, are being received
    • G01S3/78—Direction-finders for determining the direction from which infrasonic, sonic, ultrasonic, or electromagnetic waves, or particle emission, not having a directional significance, are being received using electromagnetic waves other than radio waves
    • G01S3/781—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S3/00—Direction-finders for determining the direction from which infrasonic, sonic, ultrasonic, or electromagnetic waves, or particle emission, not having a directional significance, are being received
    • G01S3/78—Direction-finders for determining the direction from which infrasonic, sonic, ultrasonic, or electromagnetic waves, or particle emission, not having a directional significance, are being received using electromagnetic waves other than radio waves
    • G01S3/782—Systems for determining direction or deviation from predetermined direction
    • G01S3/783—Systems for determining direction or deviation from predetermined direction using amplitude comparison of signals derived from static detectors or detector systems
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/0203—Containers; Encapsulations, e.g. encapsulation of photodiodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/0232—Optical elements or arrangements associated with the device
    • H01L31/02325—Optical elements or arrangements associated with the device the optical elements not being integrated nor being directly associated with the device
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J2001/4266—Photometry, e.g. photographic exposure meter using electric radiation detectors for measuring solar light
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481—Disposition
    • H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181—Encapsulation

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Power Engineering (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Air-Conditioning For Vehicles (AREA)
  • Photovoltaic Devices (AREA)

Abstract

Der Sonnensensor zur Erfassung der Einfallsrichtung und der Intensität von Sonnenstrahlung ist versehen mit einem Gehäuse (12) aus einem für zumindest einen Teil der Sonnenstrahlung durchlässigen Kunststoffmaterials, wobei das Gehäuse (12) eine gewölbte Sonnenstrahlungseinfallsseite (14) aufweist und das Gehäuse (12) optisch als Linse wirkt sowie eine durch seine Linsencharakteristik definierte interne Brennpunktebene (26) aufweist, und mindestens zwei Fotosensoren (16), die in dem Kunststoffmaterial des Gehäuses (12) eingebettet sind. Die Fotosensoren (16) weisen jeweils eine zumindest für den Teil der Sonnenstrahlung, für den das Kunststoffmaterial durchlässig ist, sensitive Sensorflächen (18) auf und die Sensorflächen (18) der Fotosensoren (16) sind von der Sonnenstrahlungseinfallsseite (14) aus betrachtet vor oder hinter der Brennpunktebene (26) im wesentlichen parallel zu dieser angeordnet. Die Einfallsrichtung der Sonnenstrahlung ist anhand der Intensitäten der von den Sensorflächen (18) der Fotosensoren (16) empfangenen Sonnenstrahlung ermittelbar.
PCT/EP2008/061293 2007-08-29 2008-08-28 Sonnensensor zur erfassung der einfallsrichtung und der intensität von sonnenstrahlung WO2009027459A2 (de)

Priority Applications (3)

Application Number Priority Date Filing Date Title
EP08803319A EP2181313A2 (de) 2007-08-29 2008-08-28 Sonnensensor zur erfassung der einfallsrichtung und der intensität von sonnenstrahlung
US12/674,370 US8785858B2 (en) 2007-08-29 2008-08-28 Solar sensor for the detection of the direction of incidence and the intensity of solar radiation
JP2010522369A JP2010537214A (ja) 2007-08-29 2008-08-28 太陽輻射の入射方向及び強度を検出するための太陽センサ

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102007041002.8 2007-08-29
DE102007041002 2007-08-29

Publications (2)

Publication Number Publication Date
WO2009027459A2 WO2009027459A2 (de) 2009-03-05
WO2009027459A3 true WO2009027459A3 (de) 2009-05-28

Family

ID=40377492

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2008/061293 WO2009027459A2 (de) 2007-08-29 2008-08-28 Sonnensensor zur erfassung der einfallsrichtung und der intensität von sonnenstrahlung

Country Status (5)

Country Link
US (1) US8785858B2 (de)
EP (1) EP2181313A2 (de)
JP (1) JP2010537214A (de)
KR (1) KR20100049677A (de)
WO (1) WO2009027459A2 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE202009001069U1 (de) * 2009-01-28 2009-04-09 Visteon Global Technologies Inc., Van Buren Sensor zur Ermittlung der Temperatur im Innenraum eines Kraftfahrzeugs, Klimabedienteil für eine Kfz-Klimanlage und Vorrichtung zur Ermittlung der Temperatur in einem Kfz
RU2469282C1 (ru) * 2011-06-02 2012-12-10 Учреждение Российской академии наук Институт мониторинга климатических и экологических систем Сибирского отделения Российской академии наук (ИМКЭС СО РАН) Актинометрический приемник болометрического типа
DE102015221970A1 (de) 2015-11-09 2017-05-11 Bayerische Motoren Werke Aktiengesellschaft Projektionsvorrichtung für ein Kraftfahrzeug
DE102018001181B3 (de) 2018-02-15 2019-07-11 Azur Space Solar Power Gmbh Sonnenstandssensor
EP3537118B1 (de) * 2018-03-08 2024-04-03 MEAS France Strahlungssensor, fahrzeugsensoranordnung und montageverfahren

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58192366A (ja) * 1982-05-07 1983-11-09 Hitachi Ltd 受光素子内蔵集積回路装置
EP0492352A2 (de) * 1990-12-24 1992-07-01 Hella KG Hueck & Co. Sonnensensor für Innenraumtemperaturregeleinrichtungen in Kraftfahrzeugen
JPH04231808A (ja) * 1990-12-28 1992-08-20 Sharp Corp 傾き角検出器
JPH06160182A (ja) * 1992-11-16 1994-06-07 Matsushita Electric Ind Co Ltd 自動車用空調装置の日射センサ
JPH09311070A (ja) * 1996-05-23 1997-12-02 Matsushita Electric Ind Co Ltd 車輌用日射センサ
DE19913955A1 (de) * 1998-03-27 1999-11-04 Denso Corp Optischer Sensor mit geregelter Richtwirkung
JP2002296107A (ja) * 2001-03-30 2002-10-09 Stanley Electric Co Ltd 日照センサ
KR20040005307A (ko) * 2002-07-09 2004-01-16 주식회사 오토전자 차량용 광센서

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06201459A (ja) * 1992-11-09 1994-07-19 Omron Corp 日射センサー
JPH07103818A (ja) * 1993-09-30 1995-04-21 Matsushita Electric Works Ltd 方向検出方法及びその検出方法を使用した方向検出装置
US5400964A (en) * 1993-11-29 1995-03-28 Delco Electronics Corporation Infra-red comfort sensor
FR2726080B1 (fr) * 1994-10-25 1997-01-10 Electricfil Capteur optoelectronique pour mesurer l'intensite et la direction d'incidence d'un faisceau lumineux
JPH09243354A (ja) * 1996-03-12 1997-09-19 N K K Plant Kensetsu Kk 太陽位置検出センサー
US6521882B1 (en) 1998-03-27 2003-02-18 Denso Corporation Optical sensor with directivity controlled
DE10102353B4 (de) 2001-01-19 2007-11-15 Siemens Ag LED-Signalmodul
DE10312311A1 (de) 2003-03-19 2004-10-21 Behr-Hella Thermocontrol Gmbh Vorrichtung zum Erfassen des Standes einer Lichtquelle, Verfahren zum Abgleichen der Vorrichtung und Verfahren zum Erfassen des Standes einer Lichtquelle
DE102004053958B3 (de) 2004-11-09 2005-09-01 Behr Hella Thermocontrol Gmbh Vorrichtung zur Erfassung von elektromagnetischer Strahlung, insbesondere Sonnenlicht, zur Verwendung bei einem Fahrzeug
US7718948B2 (en) * 2006-12-04 2010-05-18 Palo Alto Research Center Incorporated Monitoring light pulses

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58192366A (ja) * 1982-05-07 1983-11-09 Hitachi Ltd 受光素子内蔵集積回路装置
EP0492352A2 (de) * 1990-12-24 1992-07-01 Hella KG Hueck & Co. Sonnensensor für Innenraumtemperaturregeleinrichtungen in Kraftfahrzeugen
JPH04231808A (ja) * 1990-12-28 1992-08-20 Sharp Corp 傾き角検出器
JPH06160182A (ja) * 1992-11-16 1994-06-07 Matsushita Electric Ind Co Ltd 自動車用空調装置の日射センサ
JPH09311070A (ja) * 1996-05-23 1997-12-02 Matsushita Electric Ind Co Ltd 車輌用日射センサ
DE19913955A1 (de) * 1998-03-27 1999-11-04 Denso Corp Optischer Sensor mit geregelter Richtwirkung
JP2002296107A (ja) * 2001-03-30 2002-10-09 Stanley Electric Co Ltd 日照センサ
KR20040005307A (ko) * 2002-07-09 2004-01-16 주식회사 오토전자 차량용 광센서

Also Published As

Publication number Publication date
JP2010537214A (ja) 2010-12-02
KR20100049677A (ko) 2010-05-12
EP2181313A2 (de) 2010-05-05
US20110240862A1 (en) 2011-10-06
WO2009027459A2 (de) 2009-03-05
US8785858B2 (en) 2014-07-22

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