WO2009013926A1 - 回転体の計測装置 - Google Patents

回転体の計測装置 Download PDF

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Publication number
WO2009013926A1
WO2009013926A1 PCT/JP2008/058918 JP2008058918W WO2009013926A1 WO 2009013926 A1 WO2009013926 A1 WO 2009013926A1 JP 2008058918 W JP2008058918 W JP 2008058918W WO 2009013926 A1 WO2009013926 A1 WO 2009013926A1
Authority
WO
WIPO (PCT)
Prior art keywords
rotary body
blinking light
optical system
half mirror
measuring device
Prior art date
Application number
PCT/JP2008/058918
Other languages
English (en)
French (fr)
Inventor
Kou Yamagishi
Original Assignee
Kou Yamagishi
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kou Yamagishi filed Critical Kou Yamagishi
Publication of WO2009013926A1 publication Critical patent/WO2009013926A1/ja
Priority to US12/667,427 priority Critical patent/US20100283846A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C19/00—Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

簡易な装置で回転中の回転体の所要位置を必要な方向から適切に観測、計測できるようにした、優れた回転体の計測装置を提供するために、先端に対物レンズ（１）を有し中間に光導出入部たるハーフミラー（２）を有する光学系（ＯＰ）と、この光学系（ＯＰ）の基端側に光学的に接続される画像取得手段たるカメラ（３）と、ハーフミラー（２）に明滅光（Ｘ）を導入すべく設けられる明滅光源（４）とを具備し、明滅光源（４）からの明滅光（Ｘ）をハーフミラー（２）を介して光学系（ＯＰ）の先端側より導出し、これを計測対象である回転中の回転体（Ｒ）に対し空隙を介して照射した後、反射した明滅光（Ｘ´）を光学系（ＯＰ）の対物レンズ（１）及びハーフミラー（２）を介してカメラ（３）に計測可能な状態で取り込み、仮想停止状態で回転体（Ｒ）の計測を行い得るように構成した。
PCT/JP2008/058918 2007-07-26 2008-05-15 回転体の計測装置 WO2009013926A1 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US12/667,427 US20100283846A1 (en) 2007-07-26 2009-05-15 Rotary body measuring device

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007-194421 2007-07-26
JP2007194421A JP4750082B2 (ja) 2007-07-26 2007-07-26 回転体の計測装置

Publications (1)

Publication Number Publication Date
WO2009013926A1 true WO2009013926A1 (ja) 2009-01-29

Family

ID=40281186

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/058918 WO2009013926A1 (ja) 2007-07-26 2008-05-15 回転体の計測装置

Country Status (3)

Country Link
US (1) US20100283846A1 (ja)
JP (1) JP4750082B2 (ja)
WO (1) WO2009013926A1 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107941715A (zh) * 2017-12-28 2018-04-20 中国科学院西安光学精密机械研究所 一种基于水下探测的全海深高强度耐压光谱分析装置
CN107941715B (zh) * 2017-12-28 2024-05-31 中国科学院西安光学精密机械研究所 一种基于水下探测的全海深高强度耐压光谱分析装置

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5415162B2 (ja) * 2009-06-23 2014-02-12 昭和電工株式会社 円筒体の表面検査装置
US20110317909A1 (en) * 2010-06-29 2011-12-29 General Electric Company Tool wear quantification system and method
JP2012093243A (ja) * 2010-10-27 2012-05-17 Toyama Prefecture 工具位置測定装置
CN103630537A (zh) * 2012-08-20 2014-03-12 北京中电科电子装备有限公司 一种划片机刀具状态检测装置、方法及划片机
IT201700062327A1 (it) * 2017-06-07 2018-12-07 Balance Systems Srl Procedimento e dispositivo di monitoraggio per utensile
WO2020090844A1 (ja) * 2018-10-30 2020-05-07 東芝機械株式会社 工具形状測定装置および工具形状測定方法

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS589148U (ja) * 1981-07-08 1983-01-21 株式会社早島 濾過・濾液透析型人工腎臓
JPS6357108A (ja) * 1986-08-27 1988-03-11 Toshiba Corp ドリル折損検出装置
JPH04297810A (ja) * 1991-03-27 1992-10-21 Mitsubishi Materials Corp 光学検査装置
JPH0954046A (ja) * 1995-08-17 1997-02-25 Kobe Steel Ltd 圧延ロールの光学式表面観察装置
JPH1034496A (ja) * 1996-07-22 1998-02-10 Ricoh Co Ltd マシニングセンタ
JPH11114781A (ja) * 1997-10-13 1999-04-27 Agency Of Ind Science & Technol 湿式切削における工具切刃のモニタリング装置
JP2000340625A (ja) * 1999-05-28 2000-12-08 Mitsubishi Electric Corp パターン検査装置，パターン検査装置の制御方法及びパターン検査装置用撮像器

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS588148U (ja) * 1981-07-08 1983-01-19 株式会社東芝 回転体検査装置
JP2000199924A (ja) * 1999-01-07 2000-07-18 Asahi Optical Co Ltd 一眼レフカメラのファインダ光学系
JP2002189264A (ja) * 2000-12-20 2002-07-05 Fuji Photo Film Co Ltd 放射線画像情報読取装置および読取ユニット
JP3966775B2 (ja) * 2002-06-28 2007-08-29 株式会社ニデック 屈折力測定装置
JP4708970B2 (ja) * 2005-11-16 2011-06-22 キヤノン株式会社 焦点検出装置及び当該焦点検出装置を有する撮像装置
US7420691B2 (en) * 2005-12-22 2008-09-02 Matsushita Electric Industrial Co., Ltd. Method and apparatus for measuring interfacial positions, method and apparatus for measuring layer thickness, and method and apparatus for manufacturing optical discs

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS589148U (ja) * 1981-07-08 1983-01-21 株式会社早島 濾過・濾液透析型人工腎臓
JPS6357108A (ja) * 1986-08-27 1988-03-11 Toshiba Corp ドリル折損検出装置
JPH04297810A (ja) * 1991-03-27 1992-10-21 Mitsubishi Materials Corp 光学検査装置
JPH0954046A (ja) * 1995-08-17 1997-02-25 Kobe Steel Ltd 圧延ロールの光学式表面観察装置
JPH1034496A (ja) * 1996-07-22 1998-02-10 Ricoh Co Ltd マシニングセンタ
JPH11114781A (ja) * 1997-10-13 1999-04-27 Agency Of Ind Science & Technol 湿式切削における工具切刃のモニタリング装置
JP2000340625A (ja) * 1999-05-28 2000-12-08 Mitsubishi Electric Corp パターン検査装置，パターン検査装置の制御方法及びパターン検査装置用撮像器

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107941715A (zh) * 2017-12-28 2018-04-20 中国科学院西安光学精密机械研究所 一种基于水下探测的全海深高强度耐压光谱分析装置
CN107941715B (zh) * 2017-12-28 2024-05-31 中国科学院西安光学精密机械研究所 一种基于水下探测的全海深高强度耐压光谱分析装置

Also Published As

Publication number Publication date
US20100283846A1 (en) 2010-11-11
JP2009031091A (ja) 2009-02-12
JP4750082B2 (ja) 2011-08-17

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