WO2008156080A1 - 質量分析用プレートとそれを用いた薄層クロマトグラフィ－質量分析方法及び装置 - Google Patents

質量分析用プレートとそれを用いた薄層クロマトグラフィ－質量分析方法及び装置 Download PDF

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Publication number
WO2008156080A1
WO2008156080A1 PCT/JP2008/061041 JP2008061041W WO2008156080A1 WO 2008156080 A1 WO2008156080 A1 WO 2008156080A1 JP 2008061041 W JP2008061041 W JP 2008061041W WO 2008156080 A1 WO2008156080 A1 WO 2008156080A1
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WO
WIPO (PCT)
Prior art keywords
mass spectrometry
plate
thin layer
layer chromatography
component
Prior art date
Application number
PCT/JP2008/061041
Other languages
English (en)
French (fr)
Inventor
Yoshiteru Ohashi
Yuji Mishima
Takayuki Hasegawa
Yoshiro Shiokawa
Harumi Maruyama
Original Assignee
Tsurui Chemical Co., Ltd.
Canon Anelva Technix Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tsurui Chemical Co., Ltd., Canon Anelva Technix Corporation filed Critical Tsurui Chemical Co., Ltd.
Publication of WO2008156080A1 publication Critical patent/WO2008156080A1/ja

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/90—Plate chromatography, e.g. thin layer or paper chromatography
    • G01N30/92—Construction of the plate

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Sampling And Sample Adjustment (AREA)

Abstract

　有機化合物の合成や創薬分野に制限されず、環境、食品、工業品、その他における被測定成分の同定、定量分析を、複雑なインターフェースを必要とせず、且つ濃度の低い被測定成分にも適用して、簡単に、低コストで行うことを可能とする質量分析用プレートとそれを用いた薄層クロマトグラフィ－質量分析方法及び装置の提供を課題とする。 　薄層クロマトグラフィ用プレート上で分離された被測定成分を該薄層クロマトグラフィ用プレートから転写させて質量分析に供するための質量分析用プレート３０であって、プレート基板３１上に被測定成分を担持するための固定相３２として、吸着活性のない担体を積層してある。
PCT/JP2008/061041 2007-06-18 2008-06-17 質量分析用プレートとそれを用いた薄層クロマトグラフィ－質量分析方法及び装置 WO2008156080A1 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007159672A JP2010190573A (ja) 2007-06-18 2007-06-18 質量分析用プレートとそれを用いた薄層クロマトグラフィ−質量分析方法及び装置
JP2007-159672 2007-06-18

Publications (1)

Publication Number Publication Date
WO2008156080A1 true WO2008156080A1 (ja) 2008-12-24

Family

ID=40156239

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/061041 WO2008156080A1 (ja) 2007-06-18 2008-06-17 質量分析用プレートとそれを用いた薄層クロマトグラフィ－質量分析方法及び装置

Country Status (2)

Country Link
JP (1) JP2010190573A (ja)
WO (1) WO2008156080A1 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010038354A1 (ja) * 2008-09-30 2010-04-08 キヤノンアネルバ株式会社 質量分析装置及び質量分析方法
EP2803995A4 (en) * 2012-01-11 2015-10-14 Daicel Corp CHROMATOGRAPHIC ENVIRONMENT

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5663725B2 (ja) * 2010-09-03 2015-02-04 学校法人日本大学 質量分析装置用試料導入装置
JP5773409B2 (ja) * 2011-02-25 2015-09-02 学校法人神奈川大学 質量分析機器用試料イオン化装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63318061A (ja) * 1987-06-19 1988-12-26 Shimadzu Corp 固体クロマトグラフィ質量分析方法
JPH07209252A (ja) * 1994-01-26 1995-08-11 Canon Inc 薄層クロマトグラフ質量分析計による混合物の分離・定性分析方法及び薄層クロマトグラフ質量分析装置
JP2005274545A (ja) * 2004-03-26 2005-10-06 Citizen Watch Co Ltd 微量成分の濃度測定方法および濃度測定装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63318061A (ja) * 1987-06-19 1988-12-26 Shimadzu Corp 固体クロマトグラフィ質量分析方法
JPH07209252A (ja) * 1994-01-26 1995-08-11 Canon Inc 薄層クロマトグラフ質量分析計による混合物の分離・定性分析方法及び薄層クロマトグラフ質量分析装置
JP2005274545A (ja) * 2004-03-26 2005-10-06 Citizen Watch Co Ltd 微量成分の濃度測定方法および濃度測定装置

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
MISHIMA Y. ET AL.: "Hakuso Chromatograph - Ion Fuchaku Shitsuryo Bunsekiho o Mochiita Teiryo Bunseki no Kokoromi", DAI 68 KAI ABSTRACTS OF THE SYMPOSIUM OF THE JAPAN SOCIETY FOR ANALYTICAL CHEMISTRY, vol. 150, 5 May 2007 (2007-05-05), pages 1048 *

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010038354A1 (ja) * 2008-09-30 2010-04-08 キヤノンアネルバ株式会社 質量分析装置及び質量分析方法
US8324568B2 (en) 2008-09-30 2012-12-04 Canon Anelva Corporation Mass spectrometer and mass spectrometry method
EP2803995A4 (en) * 2012-01-11 2015-10-14 Daicel Corp CHROMATOGRAPHIC ENVIRONMENT
US9726649B2 (en) 2012-01-11 2017-08-08 Daicel Corporation Chromatographic medium

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JP2010190573A (ja) 2010-09-02

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