WO2008149574A1 - 液晶装置の点欠陥修正用ドリル、液晶装置の製造方法 - Google Patents

液晶装置の点欠陥修正用ドリル、液晶装置の製造方法 Download PDF

Info

Publication number
WO2008149574A1
WO2008149574A1 PCT/JP2008/051639 JP2008051639W WO2008149574A1 WO 2008149574 A1 WO2008149574 A1 WO 2008149574A1 JP 2008051639 W JP2008051639 W JP 2008051639W WO 2008149574 A1 WO2008149574 A1 WO 2008149574A1
Authority
WO
WIPO (PCT)
Prior art keywords
liquid crystal
crystal device
point defect
drill
repairing
Prior art date
Application number
PCT/JP2008/051639
Other languages
English (en)
French (fr)
Inventor
Masaki Ikeda
Original Assignee
Sharp Kabushiki Kaisha
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Kabushiki Kaisha filed Critical Sharp Kabushiki Kaisha
Priority to US12/602,968 priority Critical patent/US8384873B2/en
Priority to CN2008800166762A priority patent/CN101681032B/zh
Publication of WO2008149574A1 publication Critical patent/WO2008149574A1/ja

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306Details
    • G02F1/1309Repairing; Testing
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1303Apparatus specially adapted to the manufacture of LCDs
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F2201/00Constructional arrangements not provided for in groups G02F1/00 - G02F7/00
    • G02F2201/50Protective arrangements
    • G02F2201/506Repairing, e.g. with redundant arrangement against defective part
    • G02F2201/508Pseudo repairing, e.g. a defective part is brought into a condition in which it does not disturb the functioning of the device

Abstract

本発明の液晶装置10の点欠陥修正用ドリル(40)は、液晶装置(10)の点欠陥を修正するために、当該液晶装置(10)が備えるガラス基板(11)を切削するためのドリル(40)であって、その先端角(PA)が130°~180°とされてなることを特徴とする。このような液晶装置の点欠陥修正用ドリルによると、その先端角が130°~180°とされていることにより、遮光可能な角度範囲を十分な大きさで確保することができ、その結果、光の廻りこみによる異物への光の到達を抑制することができる。 そのため、当該異物に起因する点欠陥を一層確実に修正(すなわち遮光)することが可能となる。
PCT/JP2008/051639 2007-06-04 2008-02-01 液晶装置の点欠陥修正用ドリル、液晶装置の製造方法 WO2008149574A1 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
US12/602,968 US8384873B2 (en) 2007-06-04 2008-02-01 Drill for repairing point defect in liquid crystal device and method of manufacturing liquid crystal device
CN2008800166762A CN101681032B (zh) 2007-06-04 2008-02-01 液晶装置的点缺陷修正用钻头、液晶装置的制造方法

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007148328 2007-06-04
JP2007-148328 2007-06-04

Publications (1)

Publication Number Publication Date
WO2008149574A1 true WO2008149574A1 (ja) 2008-12-11

Family

ID=40093403

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/051639 WO2008149574A1 (ja) 2007-06-04 2008-02-01 液晶装置の点欠陥修正用ドリル、液晶装置の製造方法

Country Status (3)

Country Link
US (1) US8384873B2 (ja)
CN (1) CN101681032B (ja)
WO (1) WO2008149574A1 (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4777472B1 (ja) * 2010-08-24 2011-09-21 株式会社イクス 無研磨ガラスを用いた表示パネルのための画像補正データ生成システム、画像補正データ生成方法及び画像補正データ生成プログラム

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006016463A1 (ja) * 2004-08-09 2006-02-16 Sharp Kabushiki Kaisha 液晶表示装置、及びその製造方法
JP2006055941A (ja) * 2004-08-19 2006-03-02 Osg Corp 鋳抜き穴加工用ドリル
JP2007007809A (ja) * 2005-07-01 2007-01-18 Osg Corp 低加工硬化超硬ドリル

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4215634B2 (ja) 2003-12-24 2009-01-28 シャープ株式会社 液晶表示装置およびその製造方法
JP2006055965A (ja) * 2004-08-23 2006-03-02 Osg Corp 低加工硬化超硬ドリル
KR101135381B1 (ko) * 2005-12-20 2012-04-17 엘지디스플레이 주식회사 평판 디스플레이 패널의 리페어 방법

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006016463A1 (ja) * 2004-08-09 2006-02-16 Sharp Kabushiki Kaisha 液晶表示装置、及びその製造方法
JP2006055941A (ja) * 2004-08-19 2006-03-02 Osg Corp 鋳抜き穴加工用ドリル
JP2007007809A (ja) * 2005-07-01 2007-01-18 Osg Corp 低加工硬化超硬ドリル

Also Published As

Publication number Publication date
US8384873B2 (en) 2013-02-26
CN101681032B (zh) 2012-02-29
CN101681032A (zh) 2010-03-24
US20100178831A1 (en) 2010-07-15

Similar Documents

Publication Publication Date Title
TWI372244B (en) Method for characterizing defects in a transparent substrate
WO2009126910A3 (en) Laser scribe inspection methods and systems
EP2264446A4 (en) Periodic defect detecting device and method for the same
WO2010110847A3 (en) Compositions and methods for removing organic substances
DE102005061305B8 (de) Vorrichtung zum Ansteuern eines Flüssigkristalldisplays sowie Ansteuerungsverfahren unter Verwendung derselben
WO2009143376A3 (en) Ionic liquids and methods for using the same
EP1850120A4 (en) DEVICE AND METHOD FOR DETECTING DEFECT AT THE END SURFACE OF A GLASS SHEET
WO2009114281A3 (en) Smoothing a metallic substrate for a solar cell
EP2146202A4 (en) Method and apparatus for detecting uneven surface defect
WO2009107955A3 (en) Solar cell and method for manufacturing the same
WO2008024517A3 (en) Method and apparatus for managing volatile organic content in polyolefin
GB0623870D0 (en) Substrate for gate-in-panel (gip) type liquid crystal display device and method for manufacturing the same
WO2008030360A3 (en) Method for vehicle repair estimate and scheduling
WO2008051393A3 (en) Removing residues from substrate processing components
EP2237109A3 (en) Method for inspecting and judging photomask blank or intermediate thereof
TWI365175B (en) Method and device for vibration assistant scribing process on a substrate
FR2933887B1 (fr) Procede de reparation ou de reprise d'un disque de turbomachine et disque de turbomachine repare ou repris
WO2007081505A3 (en) Nanoscale discotic liquid crystalline porphyrins
EP1995631A4 (en) OPTICAL COMPONENT AND METHOD FOR THE PRODUCTION THEREOF
EP2359123B8 (de) Verfahren und vorrichtung zur qualitätssicherung von zumindest partiell lichtdurchlässigen hohlkörpern
HK1199145A1 (en) Patterned wafer defect inspection system and method
EP2219443A4 (en) METHOD AND COMPOSITION FOR DECONTAMINATING SURFACES IN CONTACT WITH WATER
WO2010080602A3 (en) Flow-through substrates and methods for making and using them
WO2008149574A1 (ja) 液晶装置の点欠陥修正用ドリル、液晶装置の製造方法
DK2177621T3 (da) Fremgangsmåder til modulering af celleoverfladereceptorer til forebyggelse eller reduktion af inflammation

Legal Events

Date Code Title Description
WWE Wipo information: entry into national phase

Ref document number: 200880016676.2

Country of ref document: CN

121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 08704348

Country of ref document: EP

Kind code of ref document: A1

WWE Wipo information: entry into national phase

Ref document number: 12602968

Country of ref document: US

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 08704348

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: JP