WO2008149574A1 - 液晶装置の点欠陥修正用ドリル、液晶装置の製造方法 - Google Patents
液晶装置の点欠陥修正用ドリル、液晶装置の製造方法 Download PDFInfo
- Publication number
- WO2008149574A1 WO2008149574A1 PCT/JP2008/051639 JP2008051639W WO2008149574A1 WO 2008149574 A1 WO2008149574 A1 WO 2008149574A1 JP 2008051639 W JP2008051639 W JP 2008051639W WO 2008149574 A1 WO2008149574 A1 WO 2008149574A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- liquid crystal
- crystal device
- point defect
- drill
- repairing
- Prior art date
Links
- 230000007547 defect Effects 0.000 title abstract 5
- 239000004973 liquid crystal related substance Substances 0.000 title abstract 4
- 238000004519 manufacturing process Methods 0.000 title 1
- 239000000126 substance Substances 0.000 abstract 2
- 239000011521 glass Substances 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1303—Apparatus specially adapted to the manufacture of LCDs
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F2201/00—Constructional arrangements not provided for in groups G02F1/00 - G02F7/00
- G02F2201/50—Protective arrangements
- G02F2201/506—Repairing, e.g. with redundant arrangement against defective part
- G02F2201/508—Pseudo repairing, e.g. a defective part is brought into a condition in which it does not disturb the functioning of the device
Abstract
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US12/602,968 US8384873B2 (en) | 2007-06-04 | 2008-02-01 | Drill for repairing point defect in liquid crystal device and method of manufacturing liquid crystal device |
CN2008800166762A CN101681032B (zh) | 2007-06-04 | 2008-02-01 | 液晶装置的点缺陷修正用钻头、液晶装置的制造方法 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007148328 | 2007-06-04 | ||
JP2007-148328 | 2007-06-04 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2008149574A1 true WO2008149574A1 (ja) | 2008-12-11 |
Family
ID=40093403
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2008/051639 WO2008149574A1 (ja) | 2007-06-04 | 2008-02-01 | 液晶装置の点欠陥修正用ドリル、液晶装置の製造方法 |
Country Status (3)
Country | Link |
---|---|
US (1) | US8384873B2 (ja) |
CN (1) | CN101681032B (ja) |
WO (1) | WO2008149574A1 (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4777472B1 (ja) * | 2010-08-24 | 2011-09-21 | 株式会社イクス | 無研磨ガラスを用いた表示パネルのための画像補正データ生成システム、画像補正データ生成方法及び画像補正データ生成プログラム |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2006016463A1 (ja) * | 2004-08-09 | 2006-02-16 | Sharp Kabushiki Kaisha | 液晶表示装置、及びその製造方法 |
JP2006055941A (ja) * | 2004-08-19 | 2006-03-02 | Osg Corp | 鋳抜き穴加工用ドリル |
JP2007007809A (ja) * | 2005-07-01 | 2007-01-18 | Osg Corp | 低加工硬化超硬ドリル |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4215634B2 (ja) | 2003-12-24 | 2009-01-28 | シャープ株式会社 | 液晶表示装置およびその製造方法 |
JP2006055965A (ja) * | 2004-08-23 | 2006-03-02 | Osg Corp | 低加工硬化超硬ドリル |
KR101135381B1 (ko) * | 2005-12-20 | 2012-04-17 | 엘지디스플레이 주식회사 | 평판 디스플레이 패널의 리페어 방법 |
-
2008
- 2008-02-01 WO PCT/JP2008/051639 patent/WO2008149574A1/ja active Application Filing
- 2008-02-01 US US12/602,968 patent/US8384873B2/en not_active Expired - Fee Related
- 2008-02-01 CN CN2008800166762A patent/CN101681032B/zh not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2006016463A1 (ja) * | 2004-08-09 | 2006-02-16 | Sharp Kabushiki Kaisha | 液晶表示装置、及びその製造方法 |
JP2006055941A (ja) * | 2004-08-19 | 2006-03-02 | Osg Corp | 鋳抜き穴加工用ドリル |
JP2007007809A (ja) * | 2005-07-01 | 2007-01-18 | Osg Corp | 低加工硬化超硬ドリル |
Also Published As
Publication number | Publication date |
---|---|
US8384873B2 (en) | 2013-02-26 |
CN101681032B (zh) | 2012-02-29 |
CN101681032A (zh) | 2010-03-24 |
US20100178831A1 (en) | 2010-07-15 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TWI372244B (en) | Method for characterizing defects in a transparent substrate | |
WO2009126910A3 (en) | Laser scribe inspection methods and systems | |
EP2264446A4 (en) | Periodic defect detecting device and method for the same | |
WO2010110847A3 (en) | Compositions and methods for removing organic substances | |
DE102005061305B8 (de) | Vorrichtung zum Ansteuern eines Flüssigkristalldisplays sowie Ansteuerungsverfahren unter Verwendung derselben | |
WO2009143376A3 (en) | Ionic liquids and methods for using the same | |
EP1850120A4 (en) | DEVICE AND METHOD FOR DETECTING DEFECT AT THE END SURFACE OF A GLASS SHEET | |
WO2009114281A3 (en) | Smoothing a metallic substrate for a solar cell | |
EP2146202A4 (en) | Method and apparatus for detecting uneven surface defect | |
WO2009107955A3 (en) | Solar cell and method for manufacturing the same | |
WO2008024517A3 (en) | Method and apparatus for managing volatile organic content in polyolefin | |
GB0623870D0 (en) | Substrate for gate-in-panel (gip) type liquid crystal display device and method for manufacturing the same | |
WO2008030360A3 (en) | Method for vehicle repair estimate and scheduling | |
WO2008051393A3 (en) | Removing residues from substrate processing components | |
EP2237109A3 (en) | Method for inspecting and judging photomask blank or intermediate thereof | |
TWI365175B (en) | Method and device for vibration assistant scribing process on a substrate | |
FR2933887B1 (fr) | Procede de reparation ou de reprise d'un disque de turbomachine et disque de turbomachine repare ou repris | |
WO2007081505A3 (en) | Nanoscale discotic liquid crystalline porphyrins | |
EP1995631A4 (en) | OPTICAL COMPONENT AND METHOD FOR THE PRODUCTION THEREOF | |
EP2359123B8 (de) | Verfahren und vorrichtung zur qualitätssicherung von zumindest partiell lichtdurchlässigen hohlkörpern | |
HK1199145A1 (en) | Patterned wafer defect inspection system and method | |
EP2219443A4 (en) | METHOD AND COMPOSITION FOR DECONTAMINATING SURFACES IN CONTACT WITH WATER | |
WO2010080602A3 (en) | Flow-through substrates and methods for making and using them | |
WO2008149574A1 (ja) | 液晶装置の点欠陥修正用ドリル、液晶装置の製造方法 | |
DK2177621T3 (da) | Fremgangsmåder til modulering af celleoverfladereceptorer til forebyggelse eller reduktion af inflammation |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
WWE | Wipo information: entry into national phase |
Ref document number: 200880016676.2 Country of ref document: CN |
|
121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 08704348 Country of ref document: EP Kind code of ref document: A1 |
|
WWE | Wipo information: entry into national phase |
Ref document number: 12602968 Country of ref document: US |
|
NENP | Non-entry into the national phase |
Ref country code: DE |
|
122 | Ep: pct application non-entry in european phase |
Ref document number: 08704348 Country of ref document: EP Kind code of ref document: A1 |
|
NENP | Non-entry into the national phase |
Ref country code: JP |