WO2008143211A1 - 表示装置 - Google Patents
表示装置 Download PDFInfo
- Publication number
- WO2008143211A1 WO2008143211A1 PCT/JP2008/059124 JP2008059124W WO2008143211A1 WO 2008143211 A1 WO2008143211 A1 WO 2008143211A1 JP 2008059124 W JP2008059124 W JP 2008059124W WO 2008143211 A1 WO2008143211 A1 WO 2008143211A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- display device
- pin photodiode
- light
- light shield
- nvoc
- Prior art date
Links
- 230000000903 blocking effect Effects 0.000 abstract 1
- 238000006243 chemical reaction Methods 0.000 abstract 1
- 239000004020 conductor Substances 0.000 abstract 1
- 239000011521 glass Substances 0.000 abstract 1
- 230000001939 inductive effect Effects 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0216—Coatings
- H01L31/02161—Coatings for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/02162—Coatings for devices characterised by at least one potential jump barrier or surface barrier for filtering or shielding light, e.g. multicolour filters for photodetectors
- H01L31/02164—Coatings for devices characterised by at least one potential jump barrier or surface barrier for filtering or shielding light, e.g. multicolour filters for photodetectors for shielding light, e.g. light blocking layers, cold shields for infrared detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/4204—Photometry, e.g. photographic exposure meter using electric radiation detectors with determination of ambient light
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136209—Light shielding layers, e.g. black matrix, incorporated in the active matrix substrate, e.g. structurally associated with the switching element
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J2001/0276—Protection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/78606—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device
- H01L29/78633—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device with a light shield
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/02016—Circuit arrangements of general character for the devices
- H01L31/02019—Circuit arrangements of general character for the devices for devices characterised by at least one potential jump barrier or surface barrier
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0352—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions
- H01L31/035272—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions characterised by at least one potential jump barrier or surface barrier
- H01L31/035281—Shape of the body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by at least one potential-jump barrier or surface barrier, e.g. phototransistors
- H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
- H01L31/112—Devices sensitive to infrared, visible or ultraviolet radiation characterised by field-effect operation, e.g. junction field-effect phototransistor
Abstract
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP08752944.2A EP2149914B1 (en) | 2007-05-18 | 2008-05-19 | Display device |
CN2008800046563A CN101611499B (zh) | 2007-05-18 | 2008-05-19 | 显示装置 |
US12/526,887 US8368676B2 (en) | 2007-05-18 | 2008-05-19 | Display device with light shield |
JP2009515224A JP5225985B2 (ja) | 2007-05-18 | 2008-05-19 | 表示装置 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007133506 | 2007-05-18 | ||
JP2007-133506 | 2007-05-18 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2008143211A1 true WO2008143211A1 (ja) | 2008-11-27 |
Family
ID=40031909
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2008/059124 WO2008143211A1 (ja) | 2007-05-18 | 2008-05-19 | 表示装置 |
Country Status (5)
Country | Link |
---|---|
US (1) | US8368676B2 (ja) |
EP (1) | EP2149914B1 (ja) |
JP (1) | JP5225985B2 (ja) |
CN (1) | CN101611499B (ja) |
WO (1) | WO2008143211A1 (ja) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2010032632A1 (ja) * | 2008-09-19 | 2010-03-25 | 株式会社 東芝 | 光検出素子、光検出装置、及び、光検出機能付き表示装置 |
JP2010232264A (ja) * | 2009-03-26 | 2010-10-14 | Toshiba Corp | 光検出装置及び表示装置 |
KR20110002812A (ko) * | 2009-07-02 | 2011-01-10 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 터치 패널 및 그 구동 방법 |
CN105095800A (zh) * | 2014-05-08 | 2015-11-25 | 中芯国际集成电路制造(上海)有限公司 | 光检测器 |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2448869A (en) * | 2007-04-20 | 2008-11-05 | Sharp Kk | Stray light compensation in ambient light sensor |
KR100958028B1 (ko) * | 2008-02-13 | 2010-05-17 | 삼성모바일디스플레이주식회사 | 광센서 및 그를 이용한 평판표시장치 |
DE102011119661B4 (de) | 2011-11-29 | 2013-08-01 | Austriamicrosystems Ag | Modulschaltung, Anzeigemodul und Verfahren zum Bereitstellen eines Ausgangssignals |
US9823117B2 (en) | 2012-05-08 | 2017-11-21 | Nokia Technologies Oy | Ambient light detection and data processing |
CN103207490B (zh) * | 2013-03-28 | 2015-10-14 | 北京京东方光电科技有限公司 | 一种阵列基板及其制造方法和显示装置 |
KR102151206B1 (ko) * | 2014-07-07 | 2020-09-03 | 삼성디스플레이 주식회사 | 이동 단말기 및 그 제어방법 |
GB2529567B (en) * | 2015-09-22 | 2016-11-23 | X-Fab Semiconductor Foundries Ag | Light shield for light sensitive elements |
US11114497B2 (en) * | 2017-07-18 | 2021-09-07 | Boe Technology Group Co., Ltd. | Sensor, array substrate containing sensor, display panel containing array substrate |
CN110504275B (zh) | 2018-05-17 | 2021-11-12 | 京东方科技集团股份有限公司 | 阵列基板及其制作方法、显示面板和显示装置 |
CN109887965B (zh) * | 2019-02-20 | 2022-01-21 | 京东方科技集团股份有限公司 | 显示模组及其制造方法、显示装置 |
KR102652033B1 (ko) * | 2019-08-07 | 2024-03-26 | 엘지디스플레이 주식회사 | 유기 발광 표시 장치 |
CN113299674B (zh) * | 2021-05-08 | 2022-09-09 | 武汉华星光电技术有限公司 | 阵列基板 |
CN114122175A (zh) * | 2021-11-26 | 2022-03-01 | 阳光电源股份有限公司 | 一种光伏系统和光伏组件 |
Citations (9)
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JPS63207183A (ja) | 1987-02-24 | 1988-08-26 | Sony Corp | フオトセンサ |
JPS649655A (en) * | 1987-07-01 | 1989-01-12 | Nec Corp | Photodetector built-in type semiconductor integrated circuit |
JPH07335932A (ja) * | 1994-06-10 | 1995-12-22 | Sony Corp | 光学装置 |
JP2003273361A (ja) * | 2002-03-15 | 2003-09-26 | Sharp Corp | 半導体装置およびその製造方法 |
JP2004054281A (ja) * | 2003-08-28 | 2004-02-19 | Seiko Epson Corp | 電気光学装置及び電子機器 |
JP2004119719A (ja) | 2002-09-26 | 2004-04-15 | Toshiba Matsushita Display Technology Co Ltd | 光センサ用ダイオード、これを用いた画像入力回路、および画像入力回路の駆動方法 |
JP2006003857A (ja) * | 2003-08-25 | 2006-01-05 | Toshiba Matsushita Display Technology Co Ltd | 表示装置および光電変換素子 |
WO2006104204A1 (ja) | 2005-03-29 | 2006-10-05 | Sharp Kabushiki Kaisha | 表示装置およびこれを備えた電子機器 |
WO2006117956A1 (ja) * | 2005-04-28 | 2006-11-09 | Sharp Kabushiki Kaisha | 液晶表示装置 |
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-
2008
- 2008-05-19 US US12/526,887 patent/US8368676B2/en not_active Expired - Fee Related
- 2008-05-19 WO PCT/JP2008/059124 patent/WO2008143211A1/ja active Application Filing
- 2008-05-19 EP EP08752944.2A patent/EP2149914B1/en not_active Not-in-force
- 2008-05-19 CN CN2008800046563A patent/CN101611499B/zh not_active Expired - Fee Related
- 2008-05-19 JP JP2009515224A patent/JP5225985B2/ja not_active Expired - Fee Related
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63207183A (ja) | 1987-02-24 | 1988-08-26 | Sony Corp | フオトセンサ |
JPS649655A (en) * | 1987-07-01 | 1989-01-12 | Nec Corp | Photodetector built-in type semiconductor integrated circuit |
JPH07335932A (ja) * | 1994-06-10 | 1995-12-22 | Sony Corp | 光学装置 |
JP2003273361A (ja) * | 2002-03-15 | 2003-09-26 | Sharp Corp | 半導体装置およびその製造方法 |
JP2004119719A (ja) | 2002-09-26 | 2004-04-15 | Toshiba Matsushita Display Technology Co Ltd | 光センサ用ダイオード、これを用いた画像入力回路、および画像入力回路の駆動方法 |
JP2006003857A (ja) * | 2003-08-25 | 2006-01-05 | Toshiba Matsushita Display Technology Co Ltd | 表示装置および光電変換素子 |
JP2004054281A (ja) * | 2003-08-28 | 2004-02-19 | Seiko Epson Corp | 電気光学装置及び電子機器 |
WO2006104204A1 (ja) | 2005-03-29 | 2006-10-05 | Sharp Kabushiki Kaisha | 表示装置およびこれを備えた電子機器 |
WO2006117956A1 (ja) * | 2005-04-28 | 2006-11-09 | Sharp Kabushiki Kaisha | 液晶表示装置 |
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Title |
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See also references of EP2149914A4 |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2010032632A1 (ja) * | 2008-09-19 | 2010-03-25 | 株式会社 東芝 | 光検出素子、光検出装置、及び、光検出機能付き表示装置 |
JP2010232264A (ja) * | 2009-03-26 | 2010-10-14 | Toshiba Corp | 光検出装置及び表示装置 |
KR20110002812A (ko) * | 2009-07-02 | 2011-01-10 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 터치 패널 및 그 구동 방법 |
KR101703510B1 (ko) | 2009-07-02 | 2017-02-07 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 터치 패널 및 그 구동 방법 |
CN105095800A (zh) * | 2014-05-08 | 2015-11-25 | 中芯国际集成电路制造(上海)有限公司 | 光检测器 |
CN105095800B (zh) * | 2014-05-08 | 2018-07-20 | 中芯国际集成电路制造(上海)有限公司 | 光检测器 |
Also Published As
Publication number | Publication date |
---|---|
CN101611499A (zh) | 2009-12-23 |
EP2149914A1 (en) | 2010-02-03 |
US20100110096A1 (en) | 2010-05-06 |
JPWO2008143211A1 (ja) | 2010-08-05 |
JP5225985B2 (ja) | 2013-07-03 |
US8368676B2 (en) | 2013-02-05 |
EP2149914A4 (en) | 2011-04-20 |
EP2149914B1 (en) | 2013-07-10 |
CN101611499B (zh) | 2011-06-22 |
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