WO2008136101A1 - ナノ粒子計測方法および装置 - Google Patents
ナノ粒子計測方法および装置 Download PDFInfo
- Publication number
- WO2008136101A1 WO2008136101A1 PCT/JP2007/058920 JP2007058920W WO2008136101A1 WO 2008136101 A1 WO2008136101 A1 WO 2008136101A1 JP 2007058920 W JP2007058920 W JP 2007058920W WO 2008136101 A1 WO2008136101 A1 WO 2008136101A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- diffraction grating
- particle group
- electric field
- diffraction
- time
- Prior art date
Links
- 238000000034 method Methods 0.000 title abstract 2
- 239000002105 nanoparticle Substances 0.000 title 1
- 239000002245 particle Substances 0.000 abstract 7
- 230000005684 electric field Effects 0.000 abstract 3
- 230000008033 biological extinction Effects 0.000 abstract 2
- 238000005259 measurement Methods 0.000 abstract 2
- 238000001514 detection method Methods 0.000 abstract 1
- 238000009792 diffusion process Methods 0.000 abstract 1
- 230000004907 flux Effects 0.000 abstract 1
- 230000001678 irradiating effect Effects 0.000 abstract 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means
- G01N15/0211—Investigating a scatter or diffraction pattern
- G01N2015/0216—Investigating a scatter or diffraction pattern from fluctuations of diffraction pattern
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Dispersion Chemistry (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
媒体中に粒子群を移動可能に分散させた試料をセル中に収容した状態で、そのセル中に空間周期を有する電界分布を形成することにより、媒体中で粒子群を泳動させて当該粒子群の密度分布による回折格子を生成させ、その回折格子に対して平行光束を照射することによって生じる回折光を検出する。電界の印加による回折格子の生成と、その電界の印加の停止もしくは変調による回折格子の消滅を複数回にわたって繰り返し行い、各回の回折格子の消滅過程での回折光の時間変化の計測結果の加算平均化結果を用いて、粒子群の拡散係数を求め、粒子径を算出する。各回の回折光の検出出力が弱くても、S/Nの高い計測を可能とし、粒子群の粒子径を正確に求めることを可能とする。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009512833A JPWO2008136101A1 (ja) | 2007-04-25 | 2007-04-25 | ナノ粒子計測方法および装置 |
PCT/JP2007/058920 WO2008136101A1 (ja) | 2007-04-25 | 2007-04-25 | ナノ粒子計測方法および装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2007/058920 WO2008136101A1 (ja) | 2007-04-25 | 2007-04-25 | ナノ粒子計測方法および装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2008136101A1 true WO2008136101A1 (ja) | 2008-11-13 |
Family
ID=39943224
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2007/058920 WO2008136101A1 (ja) | 2007-04-25 | 2007-04-25 | ナノ粒子計測方法および装置 |
Country Status (2)
Country | Link |
---|---|
JP (1) | JPWO2008136101A1 (ja) |
WO (1) | WO2008136101A1 (ja) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103499521A (zh) * | 2013-09-06 | 2014-01-08 | 清华大学 | 纳米颗粒关键几何特征量的测量方法 |
CN105092426A (zh) * | 2015-07-24 | 2015-11-25 | 清华大学 | 纳米颗粒90度散射光谱的测量方法 |
CN105092432A (zh) * | 2015-06-05 | 2015-11-25 | 清华大学 | 金属纳米颗粒粒径的测量系统 |
CN115619808A (zh) * | 2022-10-31 | 2023-01-17 | 南京航空航天大学 | 一种电极片贴附方法与系统 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004085528A (ja) * | 2002-07-05 | 2004-03-18 | Kansai Tlo Kk | 拡散定数変化による蛋白質の会合検出方法及び装置 |
JP2007057338A (ja) * | 2005-08-24 | 2007-03-08 | Shimadzu Corp | 光学的計測装置 |
JP2007057293A (ja) * | 2005-08-23 | 2007-03-08 | Shimadzu Corp | 粒子測定装置 |
-
2007
- 2007-04-25 WO PCT/JP2007/058920 patent/WO2008136101A1/ja active Application Filing
- 2007-04-25 JP JP2009512833A patent/JPWO2008136101A1/ja active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004085528A (ja) * | 2002-07-05 | 2004-03-18 | Kansai Tlo Kk | 拡散定数変化による蛋白質の会合検出方法及び装置 |
JP2007057293A (ja) * | 2005-08-23 | 2007-03-08 | Shimadzu Corp | 粒子測定装置 |
JP2007057338A (ja) * | 2005-08-24 | 2007-03-08 | Shimadzu Corp | 光学的計測装置 |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103499521A (zh) * | 2013-09-06 | 2014-01-08 | 清华大学 | 纳米颗粒关键几何特征量的测量方法 |
CN103499521B (zh) * | 2013-09-06 | 2015-10-21 | 清华大学 | 纳米颗粒关键几何特征量的测量方法 |
CN105092432A (zh) * | 2015-06-05 | 2015-11-25 | 清华大学 | 金属纳米颗粒粒径的测量系统 |
CN105092432B (zh) * | 2015-06-05 | 2018-06-15 | 清华大学 | 金属纳米颗粒粒径的测量系统 |
CN105092426A (zh) * | 2015-07-24 | 2015-11-25 | 清华大学 | 纳米颗粒90度散射光谱的测量方法 |
CN115619808A (zh) * | 2022-10-31 | 2023-01-17 | 南京航空航天大学 | 一种电极片贴附方法与系统 |
CN115619808B (zh) * | 2022-10-31 | 2023-12-01 | 南京航空航天大学 | 一种电极片贴附方法与系统 |
Also Published As
Publication number | Publication date |
---|---|
JPWO2008136101A1 (ja) | 2010-07-29 |
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