WO2008136101A1 - ナノ粒子計測方法および装置 - Google Patents

ナノ粒子計測方法および装置 Download PDF

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Publication number
WO2008136101A1
WO2008136101A1 PCT/JP2007/058920 JP2007058920W WO2008136101A1 WO 2008136101 A1 WO2008136101 A1 WO 2008136101A1 JP 2007058920 W JP2007058920 W JP 2007058920W WO 2008136101 A1 WO2008136101 A1 WO 2008136101A1
Authority
WO
WIPO (PCT)
Prior art keywords
diffraction grating
particle group
electric field
diffraction
time
Prior art date
Application number
PCT/JP2007/058920
Other languages
English (en)
French (fr)
Inventor
Yukihisa Wada
Naoji Moriya
Shinichiro Totoki
Original Assignee
Shimadzu Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corporation filed Critical Shimadzu Corporation
Priority to JP2009512833A priority Critical patent/JPWO2008136101A1/ja
Priority to PCT/JP2007/058920 priority patent/WO2008136101A1/ja
Publication of WO2008136101A1 publication Critical patent/WO2008136101A1/ja

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G01N15/0211—Investigating a scatter or diffraction pattern
    • G01N2015/0216—Investigating a scatter or diffraction pattern from fluctuations of diffraction pattern

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Dispersion Chemistry (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

媒体中に粒子群を移動可能に分散させた試料をセル中に収容した状態で、そのセル中に空間周期を有する電界分布を形成することにより、媒体中で粒子群を泳動させて当該粒子群の密度分布による回折格子を生成させ、その回折格子に対して平行光束を照射することによって生じる回折光を検出する。電界の印加による回折格子の生成と、その電界の印加の停止もしくは変調による回折格子の消滅を複数回にわたって繰り返し行い、各回の回折格子の消滅過程での回折光の時間変化の計測結果の加算平均化結果を用いて、粒子群の拡散係数を求め、粒子径を算出する。各回の回折光の検出出力が弱くても、Ｓ／Ｎの高い計測を可能とし、粒子群の粒子径を正確に求めることを可能とする。
PCT/JP2007/058920 2007-04-25 2007-04-25 ナノ粒子計測方法および装置 WO2008136101A1 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2009512833A JPWO2008136101A1 (ja) 2007-04-25 2007-04-25 ナノ粒子計測方法および装置
PCT/JP2007/058920 WO2008136101A1 (ja) 2007-04-25 2007-04-25 ナノ粒子計測方法および装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/058920 WO2008136101A1 (ja) 2007-04-25 2007-04-25 ナノ粒子計測方法および装置

Publications (1)

Publication Number Publication Date
WO2008136101A1 true WO2008136101A1 (ja) 2008-11-13

Family

ID=39943224

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/058920 WO2008136101A1 (ja) 2007-04-25 2007-04-25 ナノ粒子計測方法および装置

Country Status (2)

Country Link
JP (1) JPWO2008136101A1 (ja)
WO (1) WO2008136101A1 (ja)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103499521A (zh) * 2013-09-06 2014-01-08 清华大学 纳米颗粒关键几何特征量的测量方法
CN105092426A (zh) * 2015-07-24 2015-11-25 清华大学 纳米颗粒90度散射光谱的测量方法
CN105092432A (zh) * 2015-06-05 2015-11-25 清华大学 金属纳米颗粒粒径的测量系统
CN115619808A (zh) * 2022-10-31 2023-01-17 南京航空航天大学 一种电极片贴附方法与系统

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004085528A (ja) * 2002-07-05 2004-03-18 Kansai Tlo Kk 拡散定数変化による蛋白質の会合検出方法及び装置
JP2007057338A (ja) * 2005-08-24 2007-03-08 Shimadzu Corp 光学的計測装置
JP2007057293A (ja) * 2005-08-23 2007-03-08 Shimadzu Corp 粒子測定装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004085528A (ja) * 2002-07-05 2004-03-18 Kansai Tlo Kk 拡散定数変化による蛋白質の会合検出方法及び装置
JP2007057293A (ja) * 2005-08-23 2007-03-08 Shimadzu Corp 粒子測定装置
JP2007057338A (ja) * 2005-08-24 2007-03-08 Shimadzu Corp 光学的計測装置

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103499521A (zh) * 2013-09-06 2014-01-08 清华大学 纳米颗粒关键几何特征量的测量方法
CN103499521B (zh) * 2013-09-06 2015-10-21 清华大学 纳米颗粒关键几何特征量的测量方法
CN105092432A (zh) * 2015-06-05 2015-11-25 清华大学 金属纳米颗粒粒径的测量系统
CN105092432B (zh) * 2015-06-05 2018-06-15 清华大学 金属纳米颗粒粒径的测量系统
CN105092426A (zh) * 2015-07-24 2015-11-25 清华大学 纳米颗粒90度散射光谱的测量方法
CN115619808A (zh) * 2022-10-31 2023-01-17 南京航空航天大学 一种电极片贴附方法与系统
CN115619808B (zh) * 2022-10-31 2023-12-01 南京航空航天大学 一种电极片贴附方法与系统

Also Published As

Publication number Publication date
JPWO2008136101A1 (ja) 2010-07-29

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