WO2008117405A1 - 接続装置及び方法、並びに、試験装置及び方法 - Google Patents

接続装置及び方法、並びに、試験装置及び方法 Download PDF

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Publication number
WO2008117405A1
WO2008117405A1 PCT/JP2007/056269 JP2007056269W WO2008117405A1 WO 2008117405 A1 WO2008117405 A1 WO 2008117405A1 JP 2007056269 W JP2007056269 W JP 2007056269W WO 2008117405 A1 WO2008117405 A1 WO 2008117405A1
Authority
WO
WIPO (PCT)
Prior art keywords
gap
connection device
contacts
thickness
state
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2007/056269
Other languages
English (en)
French (fr)
Inventor
Toshihiro Ishizuka
Takeo Ogawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to PCT/JP2007/056269 priority Critical patent/WO2008117405A1/ja
Publication of WO2008117405A1 publication Critical patent/WO2008117405A1/ja
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/70—Coupling devices
    • H01R12/71—Coupling devices for rigid printing circuits or like structures
    • H01R12/712—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit
    • H01R12/716—Coupling device provided on the PCB
    • H01R12/718—Contact members provided on the PCB without an insulating housing
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/70—Coupling devices
    • H01R12/82—Coupling devices connected with low or zero insertion force
    • H01R12/85—Coupling devices connected with low or zero insertion force contact pressure producing means, contacts activated after insertion of printed circuits or like structures
    • H01R12/89—Coupling devices connected with low or zero insertion force contact pressure producing means, contacts activated after insertion of printed circuits or like structures acting manually by moving connector housing parts linearly, e.g. slider
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2201/00—Connectors or connections adapted for particular applications
    • H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)

Abstract

　配線板（１）のプラグ状コネクタ端子（２）が挿入される開口部（１２６ａ）を有する接触子（１２６）と、開口部（１２６ａ）の最も狭い部分の間隔（Ｗｂ）をコネクタ端子（２）の対応する方向の厚さ（Ｗａ）よりも大きくした状態と、開口部（１２６ａ）の間隔（Ｗｂ）をコネクタ端子（２）の厚さ（Ｗａ）よりも狭くした状態との間で変化するように前記接触子（１２６）を変形させる押圧部品（１３０）とを有することを特徴とする接続装置（１１０）を提供する。
PCT/JP2007/056269 2007-03-26 2007-03-26 接続装置及び方法、並びに、試験装置及び方法 Ceased WO2008117405A1 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/056269 WO2008117405A1 (ja) 2007-03-26 2007-03-26 接続装置及び方法、並びに、試験装置及び方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/056269 WO2008117405A1 (ja) 2007-03-26 2007-03-26 接続装置及び方法、並びに、試験装置及び方法

Publications (1)

Publication Number Publication Date
WO2008117405A1 true WO2008117405A1 (ja) 2008-10-02

Family

ID=39788148

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/056269 Ceased WO2008117405A1 (ja) 2007-03-26 2007-03-26 接続装置及び方法、並びに、試験装置及び方法

Country Status (1)

Country Link
WO (1) WO2008117405A1 (ja)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013004382A (ja) * 2011-06-17 2013-01-07 Yokowo Co Ltd コネクタ及び中継コネクタ装置
WO2014054674A1 (ja) * 2012-10-03 2014-04-10 矢崎総業株式会社 コネクタ
JP2018190712A (ja) * 2017-04-27 2018-11-29 デルフィ・インターナショナル・オペレーションズ・ルクセンブルク・エス・アー・エール・エル 安全システムのためのコネクタアセンブリ
WO2019170353A1 (de) * 2018-03-09 2019-09-12 Phoenix Contact E-Mobility Gmbh Vorrichtung zum prüfen eines übergangswiderstands einer elektromechanischen verbindung und ladevorrichtung für ein elektrofahrzeug
EP3813203A1 (de) * 2019-10-25 2021-04-28 Schleuniger AG Kabelprüfvorrichtung
FR3129035A1 (fr) * 2021-11-10 2023-05-12 A.Raymond Et Cie Dispositif de connexion

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0564774U (ja) * 1992-02-05 1993-08-27 シャープ株式会社 電気測定器の電気接続部
JPH07229940A (ja) * 1994-02-18 1995-08-29 Fuji Electric Co Ltd 電気抵抗測定治具
JPH08273761A (ja) * 1995-03-31 1996-10-18 Nec Corp コネクタ

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0564774U (ja) * 1992-02-05 1993-08-27 シャープ株式会社 電気測定器の電気接続部
JPH07229940A (ja) * 1994-02-18 1995-08-29 Fuji Electric Co Ltd 電気抵抗測定治具
JPH08273761A (ja) * 1995-03-31 1996-10-18 Nec Corp コネクタ

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013004382A (ja) * 2011-06-17 2013-01-07 Yokowo Co Ltd コネクタ及び中継コネクタ装置
WO2014054674A1 (ja) * 2012-10-03 2014-04-10 矢崎総業株式会社 コネクタ
CN104685726A (zh) * 2012-10-03 2015-06-03 矢崎总业株式会社 连接器
JP2018190712A (ja) * 2017-04-27 2018-11-29 デルフィ・インターナショナル・オペレーションズ・ルクセンブルク・エス・アー・エール・エル 安全システムのためのコネクタアセンブリ
JP7027242B2 (ja) 2017-04-27 2022-03-01 アプティブ・テクノロジーズ・リミテッド 安全システムのためのコネクタアセンブリ
WO2019170353A1 (de) * 2018-03-09 2019-09-12 Phoenix Contact E-Mobility Gmbh Vorrichtung zum prüfen eines übergangswiderstands einer elektromechanischen verbindung und ladevorrichtung für ein elektrofahrzeug
EP3813203A1 (de) * 2019-10-25 2021-04-28 Schleuniger AG Kabelprüfvorrichtung
FR3129035A1 (fr) * 2021-11-10 2023-05-12 A.Raymond Et Cie Dispositif de connexion
WO2023083544A1 (fr) * 2021-11-10 2023-05-19 A. Raymond Et Cie Dispositif de connexion

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