WO2008111135A1 - デバイス間接続試験回路生成方法、生成装置、および生成プログラム - Google Patents
デバイス間接続試験回路生成方法、生成装置、および生成プログラム Download PDFInfo
- Publication number
- WO2008111135A1 WO2008111135A1 PCT/JP2007/000230 JP2007000230W WO2008111135A1 WO 2008111135 A1 WO2008111135 A1 WO 2008111135A1 JP 2007000230 W JP2007000230 W JP 2007000230W WO 2008111135 A1 WO2008111135 A1 WO 2008111135A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- test
- test circuit
- creation
- devices
- connection
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31707—Test strategies
Abstract
単純な試験パターンデータを使用することができ、基板毎にカスタマイズする必要がない試験回路の生成を可能とし、試験の準備工程を大幅に短縮する。 複数のデバイスのうちで相互に配線接続されるデバイスを示す接続関係と、その接続関係のそれぞれに対応する接続配線の本数と、試験結果を出力するデバイスとを示すデータの入力を受け取り、出力デバイスの出力端子側から接続相手先デバイスを順次探索し、試験ルート上に試験回路モジュールを埋め込んで接続試験回路を生成する。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2007/000230 WO2008111135A1 (ja) | 2007-03-15 | 2007-03-15 | デバイス間接続試験回路生成方法、生成装置、および生成プログラム |
JP2009503778A JP5099119B2 (ja) | 2007-03-15 | 2007-03-15 | デバイス間接続試験回路生成方法、生成装置、および生成プログラム |
US12/538,460 US7984343B2 (en) | 2007-03-15 | 2009-08-10 | Inter-device connection test circuit generating method, generation apparatus, and its storage medium |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2007/000230 WO2008111135A1 (ja) | 2007-03-15 | 2007-03-15 | デバイス間接続試験回路生成方法、生成装置、および生成プログラム |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US12/538,460 Continuation US7984343B2 (en) | 2007-03-15 | 2009-08-10 | Inter-device connection test circuit generating method, generation apparatus, and its storage medium |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2008111135A1 true WO2008111135A1 (ja) | 2008-09-18 |
Family
ID=39759086
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2007/000230 WO2008111135A1 (ja) | 2007-03-15 | 2007-03-15 | デバイス間接続試験回路生成方法、生成装置、および生成プログラム |
Country Status (3)
Country | Link |
---|---|
US (1) | US7984343B2 (ja) |
JP (1) | JP5099119B2 (ja) |
WO (1) | WO2008111135A1 (ja) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105425088B (zh) * | 2014-09-22 | 2018-08-28 | 神讯电脑(昆山)有限公司 | 基座的同轴通路测试装置 |
US9495496B2 (en) * | 2014-12-18 | 2016-11-15 | International Business Machines Corporation | Non-invasive insertion of logic functions into a register-transfer level (‘RTL’) design |
GB2581861B (en) * | 2018-09-14 | 2022-10-05 | Sino Ic Tech Co Ltd | IC Test Information Management System Based on Industrial Internet |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07174821A (ja) * | 1993-12-20 | 1995-07-14 | Toshiba Corp | バウンダリスキャンセルおよびテスト回路の検証方法 |
JPH1123667A (ja) * | 1997-07-03 | 1999-01-29 | Mitsubishi Electric Corp | 回路装置の試験方法 |
JPH1144741A (ja) * | 1997-07-25 | 1999-02-16 | Fujitsu Ltd | プログラマブルロジックデバイス及びその試験方法並びに試験用データ作成方法 |
JP2005283205A (ja) * | 2004-03-29 | 2005-10-13 | Nec Electronics Corp | システム・イン・パッケージ及びその検証方法 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6347387B1 (en) * | 1998-10-09 | 2002-02-12 | Agere Systems Guardian Corp. | Test circuits for testing inter-device FPGA links including a shift register configured from FPGA elements to form a shift block through said inter-device FPGA links |
US6678645B1 (en) * | 1999-10-28 | 2004-01-13 | Advantest Corp. | Method and apparatus for SoC design validation |
JP4219655B2 (ja) * | 2002-11-01 | 2009-02-04 | 富士通株式会社 | デバイス間結線チェック方法 |
US7225416B1 (en) * | 2004-06-15 | 2007-05-29 | Altera Corporation | Methods and apparatus for automatic test component generation and inclusion into simulation testbench |
-
2007
- 2007-03-15 JP JP2009503778A patent/JP5099119B2/ja not_active Expired - Fee Related
- 2007-03-15 WO PCT/JP2007/000230 patent/WO2008111135A1/ja active Application Filing
-
2009
- 2009-08-10 US US12/538,460 patent/US7984343B2/en not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07174821A (ja) * | 1993-12-20 | 1995-07-14 | Toshiba Corp | バウンダリスキャンセルおよびテスト回路の検証方法 |
JPH1123667A (ja) * | 1997-07-03 | 1999-01-29 | Mitsubishi Electric Corp | 回路装置の試験方法 |
JPH1144741A (ja) * | 1997-07-25 | 1999-02-16 | Fujitsu Ltd | プログラマブルロジックデバイス及びその試験方法並びに試験用データ作成方法 |
JP2005283205A (ja) * | 2004-03-29 | 2005-10-13 | Nec Electronics Corp | システム・イン・パッケージ及びその検証方法 |
Also Published As
Publication number | Publication date |
---|---|
US7984343B2 (en) | 2011-07-19 |
JP5099119B2 (ja) | 2012-12-12 |
US20090295403A1 (en) | 2009-12-03 |
JPWO2008111135A1 (ja) | 2010-06-24 |
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