WO2008087948A1 - ランダムエラー分布評価方法及びその評価装置 - Google Patents
ランダムエラー分布評価方法及びその評価装置 Download PDFInfo
- Publication number
- WO2008087948A1 WO2008087948A1 PCT/JP2008/050378 JP2008050378W WO2008087948A1 WO 2008087948 A1 WO2008087948 A1 WO 2008087948A1 JP 2008050378 W JP2008050378 W JP 2008050378W WO 2008087948 A1 WO2008087948 A1 WO 2008087948A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- measurement
- random error
- poisson distribution
- error distribution
- digital signal
- Prior art date
Links
- 238000011156 evaluation Methods 0.000 title 2
- 238000005259 measurement Methods 0.000 abstract 8
- 230000008878 coupling Effects 0.000 abstract 1
- 238000010168 coupling process Methods 0.000 abstract 1
- 238000005859 coupling reaction Methods 0.000 abstract 1
- 238000005315 distribution function Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L1/00—Arrangements for detecting or preventing errors in the information received
- H04L1/0078—Avoidance of errors by organising the transmitted data in a format specifically designed to deal with errors, e.g. location
- H04L1/0084—Formats for payload data
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L1/00—Arrangements for detecting or preventing errors in the information received
- H04L1/20—Arrangements for detecting or preventing errors in the information received using signal quality detector
Landscapes
- Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- Signal Processing (AREA)
- Quality & Reliability (AREA)
- Complex Calculations (AREA)
- Tests Of Electronic Circuits (AREA)
- Monitoring And Testing Of Transmission In General (AREA)
- Error Detection And Correction (AREA)
- Detection And Prevention Of Errors In Transmission (AREA)
Abstract
デジタル信号aのエラー分布のポアソン分布に対する適合度を定量的に判定する。
所定の誤り率Eを有しエラーのデータがランダムであるデジタル信号aを、誤り率に基づいて定められたデータ数Naからなる測定単位10に区分けし、この測定単位を予め定められたサンプル数n分だけ取り込んで、各測定単位に含まれるエラー数を測定値kとして測定する。そして、各測定値k1~kmの発生度数fを算出し、測定値を変数とするポアソン分布関数を算出し、このポアソン分布と各測定値の発生度数の分布との間の結合度を、カイ2乗適合検定手法を用いて判定する。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008554042A JP4797070B2 (ja) | 2007-01-15 | 2008-01-15 | ランダムエラー分布評価方法及びその評価装置 |
US12/501,647 US7987395B2 (en) | 2007-01-15 | 2009-07-13 | Evaluation method of random error distribution and evaluation apparatus thereof |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007006053 | 2007-01-15 | ||
JP2007-006053 | 2007-01-15 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US12/501,647 Continuation US7987395B2 (en) | 2007-01-15 | 2009-07-13 | Evaluation method of random error distribution and evaluation apparatus thereof |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2008087948A1 true WO2008087948A1 (ja) | 2008-07-24 |
Family
ID=39635952
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2008/050378 WO2008087948A1 (ja) | 2007-01-15 | 2008-01-15 | ランダムエラー分布評価方法及びその評価装置 |
Country Status (3)
Country | Link |
---|---|
US (1) | US7987395B2 (ja) |
JP (1) | JP4797070B2 (ja) |
WO (1) | WO2008087948A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2009063948A1 (ja) * | 2007-11-15 | 2009-05-22 | Anritsu Corporation | M系列発生回路及びその提供方法並びにm系列発生回路を用いるランダムエラー発生装置 |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013089804A (ja) * | 2011-10-19 | 2013-05-13 | Renesas Electronics Corp | 半導体装置のスクリーニング装置、半導体装置のスクリーニング方法及びプログラム |
JP6835677B2 (ja) * | 2017-07-07 | 2021-02-24 | 株式会社日立製作所 | データ処理方法、データ処理装置、及びデータ処理プログラム |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63290423A (ja) * | 1987-05-22 | 1988-11-28 | Sony Corp | エラ−発生器 |
JP2002330192A (ja) * | 2001-02-28 | 2002-11-15 | Tektronix Inc | 試験信号発生装置及び方法並びにポアソン分布エラー信号発生器及び発生方法 |
JP2006011492A (ja) * | 2004-06-21 | 2006-01-12 | Fuji Xerox Co Ltd | 分布適合度検定装置、消耗品補給タイミング判定装置、画像形成装置、分布適合度検定方法及びプログラム |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7003708B1 (en) * | 2002-02-21 | 2006-02-21 | Ciena Corporation | Method and apparatus for generating bit errors with a poisson error distribution |
-
2008
- 2008-01-15 JP JP2008554042A patent/JP4797070B2/ja active Active
- 2008-01-15 WO PCT/JP2008/050378 patent/WO2008087948A1/ja active Application Filing
-
2009
- 2009-07-13 US US12/501,647 patent/US7987395B2/en active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63290423A (ja) * | 1987-05-22 | 1988-11-28 | Sony Corp | エラ−発生器 |
JP2002330192A (ja) * | 2001-02-28 | 2002-11-15 | Tektronix Inc | 試験信号発生装置及び方法並びにポアソン分布エラー信号発生器及び発生方法 |
JP2006011492A (ja) * | 2004-06-21 | 2006-01-12 | Fuji Xerox Co Ltd | 分布適合度検定装置、消耗品補給タイミング判定装置、画像形成装置、分布適合度検定方法及びプログラム |
Non-Patent Citations (1)
Title |
---|
KURODA M. AND FURUIE T.: "Poisson Error Hasseiki no Seino Hosho Gijutsu - FEC Noryoku ni yoru Seino Hyoka -", WHITE PAPER, March 2007 (2007-03-01), pages 1 - 17, Retrieved from the Internet <URL:http://www.anritsu.co.jp/products/pdf/MP1591A-FEC_JR1100_01.pdf> * |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2009063948A1 (ja) * | 2007-11-15 | 2009-05-22 | Anritsu Corporation | M系列発生回路及びその提供方法並びにm系列発生回路を用いるランダムエラー発生装置 |
US8433740B2 (en) | 2007-11-15 | 2013-04-30 | Anritsu Corporation | M-sequence generator, providing method thereof, and random error generating device in which M-sequence generator is used |
Also Published As
Publication number | Publication date |
---|---|
US20090282299A1 (en) | 2009-11-12 |
JPWO2008087948A1 (ja) | 2010-05-06 |
US7987395B2 (en) | 2011-07-26 |
JP4797070B2 (ja) | 2011-10-19 |
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