WO2008069176A1 - アクチュエータ - Google Patents
アクチュエータ Download PDFInfo
- Publication number
- WO2008069176A1 WO2008069176A1 PCT/JP2007/073329 JP2007073329W WO2008069176A1 WO 2008069176 A1 WO2008069176 A1 WO 2008069176A1 JP 2007073329 W JP2007073329 W JP 2007073329W WO 2008069176 A1 WO2008069176 A1 WO 2008069176A1
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- WIPO (PCT)
- Prior art keywords
- movable part
- movable
- conductive
- etching
- backing
- Prior art date
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Classifications
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
- G02B26/0816—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
- G02B26/0833—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements the reflecting element being a micromechanical device, e.g. a MEMS mirror, DMD
- G02B26/0841—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements the reflecting element being a micromechanical device, e.g. a MEMS mirror, DMD the reflecting element being moved or deformed by electrostatic means
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B3/00—Devices comprising flexible or deformable elements, e.g. comprising elastic tongues or membranes
- B81B3/0064—Constitution or structural means for improving or controlling the physical properties of a device
- B81B3/0067—Mechanical properties
- B81B3/007—For controlling stiffness, e.g. ribs
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02N—ELECTRIC MACHINES NOT OTHERWISE PROVIDED FOR
- H02N1/00—Electrostatic generators or motors using a solid moving electrostatic charge carrier
- H02N1/002—Electrostatic motors
- H02N1/006—Electrostatic motors of the gap-closing type
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2201/00—Specific applications of microelectromechanical systems
- B81B2201/03—Microengines and actuators
- B81B2201/033—Comb drives
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2201/00—Specific applications of microelectromechanical systems
- B81B2201/04—Optical MEMS
- B81B2201/042—Micromirrors, not used as optical switches
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2203/00—Basic microelectromechanical structures
- B81B2203/01—Suspended structures, i.e. structures allowing a movement
- B81B2203/0136—Comb structures
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2203/00—Basic microelectromechanical structures
- B81B2203/05—Type of movement
- B81B2203/058—Rotation out of a plane parallel to the substrate
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2207/00—Microstructural systems or auxiliary parts thereof
- B81B2207/07—Interconnects
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N1/00—Scanning, transmission or reproduction of documents or the like, e.g. facsimile transmission; Details thereof
- H04N1/04—Scanning arrangements, i.e. arrangements for the displacement of active reading or reproducing elements relative to the original or reproducing medium, or vice versa
- H04N1/113—Scanning arrangements, i.e. arrangements for the displacement of active reading or reproducing elements relative to the original or reproducing medium, or vice versa using oscillating or rotating mirrors
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N2201/00—Indexing scheme relating to scanning, transmission or reproduction of documents or the like, and to details thereof
- H04N2201/0077—Types of the still picture apparatus
- H04N2201/0082—Image hardcopy reproducer
Definitions
- the present invention relates to an actuator that is a micromechanical structure to which micromachining technology is applied.
- the invention relates to an optical scanning device used in a laser printer or the like, a reading device such as a barcode reader, a laser projector, or the like. It is done.
- the mirror portion is supported by two hinges provided on the same straight line.
- An electrode is provided at a position facing the mirror portion. Due to the electrostatic attractive force generated between the mirror part and the electrode, the mirror part reciprocally vibrates about the two hinges as a torsional rotation axis.
- Such a vibrating mirror element is simpler in structure than a mirror element that rotates a polygon mirror with a motor, and can be formed in a batch in a semiconductor process. . Further, since the oscillating mirror element has a single reflecting surface, there is no variation in accuracy like a polygon mirror having a plurality of surfaces. In addition, since the operation of the vibrating mirror element is a back-and-forth vibration, it can cope with higher speeds.
- Patent Document 1 discloses a uniaxial rotation type mirror element
- Non-Patent Document 1 and Patent Documents 2 and 3 disclose a biaxial rotation type mirror element.
- the movable part of the uniaxially rotating mirror element is a mirror part supported by a hinge.
- the mirror part and the fixed part are separated by a separation groove, and the mirror part is driven by an electrostatic attraction generated by applying a driving voltage to the mirror part.
- the intermediate frame supports the mirror part via a hinge
- the fixed part supports the intermediate frame via a further hinge.
- FIG. 13 is a perspective view showing a biaxially rotating resonance mirror element 51.
- the resonant mirror element 51 supports a first movable part 55 having a mirror surface and the first movable part 55.
- a second movable part 56 and a fixed part 63 that supports the second movable part 56 are provided.
- the resonant mirror element 51 further includes an X hinge 61 and a Y hinge 57.
- the second movable part 56 connects and supports the first movable part 55 via the Y hinge 57.
- the first movable portion 55 can rotate around the Y hinge 57 with respect to the second movable portion 56, with the axis passing through the Y hinge 57 extending in the Y direction in FIG.
- the fixed part 63 connects and supports the second movable part 56 via the X hinge 61.
- the second movable portion 56 is rotatable around the X hinge 61 with respect to the fixed portion 63, with an axis passing through the X hinge 61 extending in the X direction in FIG.
- the first movable portion 55 includes an X comb-shaped electrode 55 a that generates a driving force for displacing the first movable portion 55 relative to the second movable portion 56 on the outer peripheral portion thereof.
- the second movable portion 56 includes a Y comb-shaped electrode 64a that generates a driving force for displacing the second movable portion 56 relative to the fixed portion 63 on its outer peripheral portion.
- an X comb electrode 55b is formed on the inner periphery of the second movable portion 56 so as to face the X comb electrode 55a with a gap therebetween.
- a Y comb electrode 64b is formed so as to face the Y comb electrode 64a with a gap therebetween.
- the first movable portion 55 is supported so as to be rotatable around the Y hinge 57 with respect to the second movable portion 56, and the second movable portion 56 rotates around the X hinge 61 with respect to the fixed portion 63.
- a biaxial rotating type resonant mirror element 51 is realized.
- the second movable portion 56 includes a first conductive portion 56a for supplying a voltage to the first movable portion 55, and a second conductive portion 56b to which another voltage is supplied.
- the first conductive portion 56a and the second conductive portion 56b are divided and electrically insulated from each other by the separation groove 66 formed between the first conductive portion 56a and the second conductive portion 56b. As a result, the drive voltage can be applied independently to each of the first movable portion 55 and the second movable portion 56.
- FIG. 14 is a view showing a cross section of the resonant mirror element 51. This cross-sectional view corresponds to the GG cross section of FIG.
- the first conductive portion 56a and the second conductive portion 56a are joined by bonding the first conductive portion 56a and the second conductive portion 56b by embedding polysilicon after depositing an insulating layer in the separation groove 66.
- the conductive portion 56b is not divided. As a result, the first conductive portion 56a and the second conductive portion 56b are displaced together as the second movable portion 56.
- FIG. 15 is a plan view showing an electrically separated state of the resonant mirror element 51.
- FIG. X pad to 70 The applied voltage Vx becomes the voltage of the first movable part 55, and the ground pad 72 is connected to the ground level (G)
- Vx a potential difference of Vx is generated between the first movable part 55 and the second movable part 56.
- the voltage Vy applied to the Y pad 71 becomes the voltage of the fixed portion 63, and a potential difference of Vy is generated between the fixed portion 63 and the second movable portion 56.
- Patent Document 1 Japanese Patent Publication No. 2004-239987
- Patent Document 2 JP 2004-13099 A
- Patent Document 3 Japanese Unexamined Patent Publication No. 2006-115683
- Non-Patent Document 1 "AN ELECTROSTATICALLY EXCITED 2D—MICRO—S CANNING—MIRROR WITH AN IN -PLANE CONFIGURATION OF THE DRIVING ELECTRODES” (MEMS2000. Proceedings Piscat away, NJ: IEEE, 2000)
- the present invention has been made in view of the above problems, and provides a highly reliable actuator that can be easily formed by a simple manufacturing process. Means for solving the problem
- the actuator according to the present invention includes a movable part and a fixed part that supports the movable part, and the movable part is supplied with a first conductive part to which a first voltage is supplied and a second voltage.
- the movable part includes a first movable part and a second movable part that supports the first movable part, and the fixed part supports the second movable part.
- the second movable part includes the first and second conductive parts, and supplies the first voltage to the first movable part via the first conductive part.
- the second movable part further includes a comb-shaped electrode formed on the second conductive part and the backing part.
- the thickness of the backing portion is smaller than the thickness of the fixed portion.
- the first movable portion includes a mirror portion that reflects light
- the backing portion is formed from a surface opposite to a surface on which the mirror portion of the actuator is provided.
- the first conductive part and the second conductive part are fixed.
- the first and second movable parts are formed by etching the first silicon layer of an SOI wafer in which the first and second silicon layers are joined via an insulating layer.
- the backing portion is formed by etching the second silicon layer.
- the first conductive part and the second conductive part are separated by a groove formed between the first conductive part and the second conductive part of the second movable part. It is electrically isolated.
- a dummy groove is formed at a point-symmetrical position with respect to the groove of the second movable part.
- the first movable part includes the first and second comb electrodes that generate a driving force that displaces the first movable part relative to the second movable part.
- the first comb electrode extends in a direction perpendicular to the rotation axis of the first movable part, and the second comb electrode extends in a direction parallel to the rotation axis of the first movable part.
- the second movable part is A third comb electrode and a fourth comb electrode that generate a driving force for displacing the second movable portion relative to the fixed portion; and the third comb electrode rotates the second movable portion.
- the fourth comb electrode extends in a direction parallel to the rotation axis of the second movable part.
- An image projection apparatus includes the above-described actuator, a light source that emits a light beam, an optical system that guides the light beam to the actuator, and a driving unit that drives the actuator.
- the first and second movable parts are formed by etching the first silicon layer of the SOI wafer in which the first and second silicon layers are bonded via the insulating layer.
- Forming the backing portion by etching the second silicon layer; electrically connecting a predetermined portion formed from the first silicon layer of the second movable portion and the backing portion; And a step.
- the step of forming the backing portion includes a step of etching the second silicon layer using a mask used when etching the first silicon layer.
- the backing portion fixes the first conductive portion and the second conductive portion to each other in an electrically insulated state, and the second conductive portion and the backing portion are electrically connected. Yes.
- the first conductive portion and the second conductive portion can be reliably fixed.
- the manufacturing process of the actuator can be simplified, and an inexpensive actuator can be provided.
- the lining portion is not in an electrically floating state, charging of the lining portion can be prevented and stable driving force can be obtained.
- the movable part includes a first movable part and a second movable part that supports the first movable part, thereby obtaining a biaxial pivoting type actuator.
- the backing portion includes a comb-shaped electrode.
- the area where the comb-shaped electrodes face each other in a state where the movable part is rotating can be increased, and a stable driving force can be obtained.
- the thickness of the backing portion is smaller than the thickness of the fixed portion. to this In addition, the weight of the movable part is reduced, and the force S that secures a large angle at which the movable part can be rotated is reduced.
- the dummy groove is formed at a point-symmetrical position with respect to the groove of the second movable part, it is possible to suppress an uneven weight balance of the second movable part. .
- the first movable part includes a comb-shaped electrode extending in a direction parallel to the rotation axis of the first movable part, and the second movable part is a rotation of the second movable part.
- a comb-shaped electrode extending in a direction parallel to the moving axis is provided.
- an image projection apparatus of the present invention includes the above-described actuator. Since the actuator according to the present invention has high drive sensitivity, an image projection apparatus with low power consumption can be realized.
- the backing portion is formed by etching the second silicon layer using a mask used when the first silicon layer is etched. This prevents misalignment of the comb electrode between the first silicon layer and the second silicon layer, so that the gap between adjacent comb electrodes is equal! /, Vertical comb electrode A structure can be realized.
- FIG. 1 is a perspective view showing a resonant mirror element according to an embodiment of the present invention.
- FIG. 2 is a lower perspective view showing a resonant mirror element according to an embodiment of the present invention.
- FIG. 3 is a plan view showing a resonant mirror element according to an embodiment of the present invention.
- FIG. 4 is a plan view showing an electrically separated state of the resonant mirror element according to the embodiment of the present invention.
- FIG. 5 is a perspective view showing the operation of the resonant mirror element according to the embodiment of the present invention.
- FIG. 6A is a cross-sectional view showing a manufacturing process of the resonant mirror element according to the embodiment of the present invention.
- FIG. 6B is a cross-sectional view showing a manufacturing process of the resonant mirror element according to the embodiment of the present invention.
- FIG. 6C is a cross-sectional view showing a manufacturing process of the resonant mirror element according to the embodiment of the present invention.
- FIG. 6D is a cross-sectional view showing a manufacturing process of the resonant mirror element according to the embodiment of the present invention.
- 6E A sectional view showing a manufacturing process of the resonant mirror element according to the embodiment of the present invention.
- 6F A sectional view showing a manufacturing process of the resonant mirror element according to the embodiment of the present invention.
- FIG. 6G is a cross-sectional view showing a manufacturing process of the resonant mirror element according to the embodiment of the present invention.
- 6H] is a cross-sectional view showing a manufacturing process of the resonant mirror element according to the embodiment of the present invention.
- FIG. 61] A sectional view showing a manufacturing process of the resonant mirror element according to the embodiment of the present invention.
- 6J] is a cross-sectional view showing a manufacturing process of the resonant mirror element according to the embodiment of the present invention.
- 6K] is a cross-sectional view showing a manufacturing process of the resonant mirror element according to the embodiment of the present invention.
- 6L] is a cross-sectional view showing a manufacturing process of the resonant mirror element according to the embodiment of the present invention.
- 6M] is a cross-sectional view showing a manufacturing process of the resonant mirror element according to the embodiment of the present invention.
- 6N] is a cross-sectional view showing a manufacturing process of the resonant mirror element according to the embodiment of the present invention.
- FIG. 60] A sectional view showing a manufacturing process of the resonant mirror element according to the embodiment of the present invention.
- 6P] A sectional view showing a manufacturing process of the resonant mirror element according to the embodiment of the present invention.
- 6Q] is a cross-sectional view showing a manufacturing process of the resonant mirror element according to the embodiment of the present invention.
- FIG. 7A is a diagram showing a connection portion of a resonant mirror element and its peripheral portion according to an embodiment of the present invention.
- FIG. 7B is a diagram showing a connection portion of a resonant mirror element according to an embodiment of the present invention and its peripheral portion.
- 7C A diagram showing a connecting portion of the resonant mirror element according to the embodiment of the present invention and its peripheral portion.
- 7D A diagram showing a connecting portion of the resonant mirror element according to the embodiment of the present invention and its peripheral portion. It is a figure which shows the connection part and its peripheral part of the resonant mirror element by embodiment of this invention
- FIG. 8A is a diagram showing a connecting portion of a resonant mirror element according to an embodiment of the present invention and its peripheral portion.
- FIG. 8B is a diagram showing a connecting portion of a resonant mirror element according to an embodiment of the present invention and its peripheral portion.
- FIG. 8C] is a diagram showing the connecting portion of the resonant mirror element according to the embodiment of the present invention and its peripheral portion.
- 8D] is a diagram showing the connecting portion of the resonant mirror element according to the embodiment of the present invention and its peripheral portion.
- FIG. 3 is a cross-sectional view showing the facing area of comb electrodes of a resonant mirror element according to an embodiment of the present invention.
- FIG. 10 is a cross-sectional view showing the facing area of the auxiliary comb electrodes of the resonant mirror element according to the embodiment of the present invention.
- FIG. 12 is a diagram showing an image projection apparatus provided with a resonant mirror element according to an embodiment of the present invention.
- FIG. 13 is a perspective view showing a two-axis rotating type resonant mirror element.
- FIG. 15 is a plan view showing an electrically separated state of a biaxially rotating resonant mirror element.
- FIG. 1 is a perspective view showing a resonant mirror element 1 which is an activator of the present embodiment.
- the resonant mirror element 1 is manufactured, for example, by processing a so-called SOI (Silicon On Insulator) wafer in which a silicon layer is joined via an insulating layer 2 made of silicon oxide (SiO 2).
- SOI Silicon On Insulator
- the first silicon layer is doped with n-type impurities such as phosphorus (P) and arsenic (As) and p-type impurities such as boron (B) to make it conductive.
- Called Device Layer 3 The second silicon layer is a thick part constituting the wafer body and is referred to as a handle layer 4.
- the device layer 3 is patterned by etching, which will be described later.
- a first movable part 5 and a second movable part 6 are formed.
- the first movable part 5 and the second movable part 6 are collectively referred to as a movable part.
- the resonant mirror element 1 includes a first movable part 5 having a mirror surface 25, a second movable part 6 that supports the first movable part 5, and a fixed part 13 that supports the second movable part 6. .
- the resonant mirror element 1 further includes an X hinge 11 and a Y hinge 8.
- the second movable part 6 connects and supports the first movable part 5 via the Y hinge 8.
- the first movable part 5 can rotate around the Y hinge 8 relative to the second movable part 6 with the axis passing through the Y hinge 8 extending in the Y direction in FIG.
- the fixed portion 13 supports the second movable portion 6 by connecting it via the X hinge 11.
- the second movable portion 6 can rotate around the X hinge 11 with respect to the fixed portion 13 with the axis passing through the X hinge 11 extending in the X direction in FIG.
- the resonant mirror element 1 has such a gimbal structure.
- the second movable part 6 is an intermediate frame located between the fixed part 13 that is an outer frame part and the first movable part 5 at the center.
- the first movable part 5 includes an X comb-shaped electrode 9a and an X auxiliary comb-shaped electrode 10a that generate a driving force that displaces the first movable part 5 relative to the second movable part 6.
- X comb The mold electrode 9 a extends in a direction perpendicular to the rotation axis of the first movable part 5.
- the X auxiliary comb-shaped electrode 10 a extends in a direction parallel to the rotation axis of the first movable part 5.
- the X auxiliary comb-shaped electrode 10a is formed at the edge where the Y hinge 8 of the first movable part 5 is connected, and the X comb electrode 9a is connected to the Y hinge 8 of the first movable part 5! / It ’s formed on the edge! / Since the X auxiliary comb electrode 10a is formed in parallel with the Y hinge 8 and not more than the same length, the X auxiliary comb electrode 10a does not increase the chip size.
- the second movable part 6 has a Y comb electrode 11a and a Y auxiliary comb electrode 12a that generate a driving force for displacing the second movable part 6 relative to the fixed part 13 on the outer periphery thereof.
- the Y comb electrode 11 a extends in a direction perpendicular to the rotation axis of the second movable part 6.
- the Y auxiliary comb-shaped electrode 12 a extends in a direction parallel to the rotation axis of the second movable part 6.
- the Y auxiliary comb-shaped electrode 12a is formed on the edge where the X hinge 11 of the second movable part 6 is connected, and the Y comb-shaped electrode 11a is connected to the X hinge 11 of the second movable part 6! / It ’s formed on the edge! / Since the Y auxiliary comb-shaped electrode 12a is formed in parallel with the X hinge 11 and not more than the same length, the Y auxiliary comb-shaped electrode 12a does not increase the chip size.
- the inner peripheral portion of the second movable portion 6 has an X comb electrode 9b facing the X comb electrode 9a with a gap therebetween, and an X auxiliary comb electrode 10a and a gap.
- X auxiliary comb-shaped electrodes 10b facing each other so as to be spaced apart are formed.
- the Y comb electrode 1 lb facing the Y comb electrode 1 la with a gap therebetween, and the Y auxiliary comb electrode 12a with a gap therebetween A pair of Y auxiliary comb-shaped electrodes 12b facing each other are formed. The effect of the auxiliary comb electrode will be described later.
- the first movable part 5 is supported so as to be rotatable around the Y hinge 8 with respect to the second movable part 6, and the second movable part 6 is rotated around the X hinge 11 with respect to the fixed part 13.
- a biaxial rotating type resonant mirror element 1 is realized.
- FIG. 6Q is a diagram corresponding to the AA cross section of the resonant mirror element 1 shown in FIG.
- the second movable part 6 includes a first conductive part 6a for supplying a first voltage to the first movable part 5, and a second conductive part 6b for supplying a second voltage.
- the first conductive portion is formed by the separation groove 16 formed between the first conductive portion 6a and the second conductive portion 6b.
- the part 6a and the second conductive part 6b are divided and electrically insulated from each other. Thereby, it is possible to independently apply a drive voltage to each of the first movable part 5 and the second movable part 6.
- FIG. 2 is a lower perspective view showing the resonant mirror element 1.
- FIG. 2 shows a cutaway view of some of the constituent elements of the resonant mirror element 1.
- the resonant mirror element 1 further includes a backing portion 17 that fixes the first conductive portion 6a and the second conductive portion 6b (FIG. 1) to each other in an electrically insulated state.
- the backing portion 17 fixes the first conductive portion 6a and the second conductive portion 6b from the surface (lower surface) opposite to the surface (upper surface) on which the mirror surface 25 of the resonant mirror element 1 is provided.
- the thickness of the backing portion 17 is thinner than the thickness of the fixed portion 13.
- the handle layer 4 is removed at the lower part of the first and second movable parts 5 and 6, so that the first and second movable parts 5 and 6 can rotate. It has become.
- the handle layer 4 is partially left as the backing part 17.
- the remaining handle layer 4 and the insulating layer 2 at the same position form a backing portion 17.
- the thickness of the backing portion 17 is formed to be thinner than the thickness of the fixed portion 13, thereby realizing the weight reduction of the second movable portion 6! /.
- FIG. 3 is a plan view showing the position of the backing portion 17 in the resonant mirror element 1.
- the hatched portion shown in FIG. 3 is the backing portion 17, and the separation groove 16 is formed in a region where the backing portion 17 exists. Therefore, even if the first conductive portion 6a and the second conductive portion 6b are separated by the separation groove 16, the first conductive portion 6a and the second conductive portion 6b (FIG. 1) are displaced together. As in the conventional example, a process of embedding and bonding another material in the separation groove 16 is not necessary.
- the insulating layer 2, the device layer 3, and the node layer 4 have a wafer structure that is firmly bonded in advance, the second movable part 6 formed from the device layer 3, the insulating layer 2 and the node layer 4 are formed.
- the strength of the layer 4 and the strength of the bond with the formed backing 17 are sufficiently reliable.
- the separation groove 16 that forms the first conductive portion 6a that is a connection portion that connects the X pad 18 and the first movable portion 5 is in a position that is biased with respect to the rotation axis.
- the weight balance of the second movable part 6 will be biased, and there will be no need for vertical movement of the second movable part 6 when resonance driven. Resonance may be induced. Therefore, a dummy groove 20 is formed at a point-symmetrical position with respect to the separation groove 16 on the second movable part 6 with respect to the center of the second movable part 6.
- dummy grooves 20 are formed at positions that are symmetric with respect to the separation groove 16 on the second movable portion 6 with respect to the X rotation axis and at positions that are symmetric with respect to the Y rotation axis. Has been. By forming the dummy groove 20 at a position symmetrical to the separation groove 16, a deviation in weight balance can be suppressed.
- FIG. 4 is a plan view showing an electrically separated state of the resonant mirror element 1.
- the separation groove 16 is formed in the second movable portion 6 and is electrically divided into two regions.
- One region is a region from the X pad 18 to the first movable portion 5 via the X hinge 11, the first conductive portion 6 a, and the Y hinge 8.
- the other region is a region from the ground pad 21 to the second movable part 6 via the X hinge 11.
- the second conductive part 6 b and the backing part 17 are electrically connected via the connection part 23 provided in the dummy groove 20.
- the voltage Vx applied to the X pad 18 becomes the voltage of the first movable part 5, and when the ground pad 21 is set to the ground level (GND), the first movable part 5 and the second movable part 6 A potential difference of Vx occurs between
- the voltage Vy applied to the Y pad 22 becomes the voltage of the fixed portion 13, and a potential difference of Vy is generated between the fixed portion 13 and the second movable portion 6.
- the first movable portion 5 and the second movable portion 6 resonate at the respective resonance frequencies.
- the rotation of the first movable part 5 around the X axis and the rotation around the Y axis can be controlled independently.
- FIG. 5 is a perspective view showing an operating state of the resonant mirror element 1.
- the first movable part 5 rotates around the Y hinge 8 with respect to the second movable part 6, and the second movable part 6 and the first movable part 5 together with the fixed part 13 around the X hinge 11 To turn.
- the laser beam reflected by the first movable unit 5 is two-dimensionally scanned in the XY directions.
- Figures 6A to 6Q show resonant mirror elements
- FIG. 2 is a diagram showing a manufacturing process 1, and these cross-sectional views correspond to the AA cross section of FIG. 1.
- an SOI wafer 30 is prepared.
- the thickness of device layer 3 is the first movable part 5
- the thickness of the second movable part 6 is determined in consideration of the resonance frequency of each movable part, the vibration amplitude and rigidity with respect to the drive voltage.
- the device layer 3 is 50 m
- the insulating layer 2 is 2 111
- the handle layer 4 is 300 ⁇ m.
- the device layer 3 and the handle layer 4 are doped with an n-type impurity such as P or As or a p-type impurity such as B so as to have conductivity.
- an impurity doping process for providing conductivity is not necessary.
- a device layer is formed by CVD (Chemical Vapor Deposition).
- An oxide layer 31 is formed on the surface, a liquid photoresist is formed by spin coating, and a resist pattern 32 is formed through exposure and development.
- a photoresist for example, AZP4210 and AZ1500 (manufactured by Clariant Japan) can be used.
- the subsequent resist pattern is also formed through such a photoresist film formation and subsequent exposure 'phenomenon.
- oxide layer 31 is etched with BHF (buffered hydrofluoric acid) using resist pattern 32 as a mask.
- BHF buffered hydrofluoric acid
- Al aluminum
- A1 layer 33 a liquid photoresist is spun.
- a film is formed by coating, and after exposure and development, a resist pattern 34 is formed.
- A1 layer 33 is etched using an aluminum etching solution such as a mixed acid aluminum solution.
- the resist pattern 34 is removed, and the oxide layer 31 is deeply etched to the device layer 3 by Deep—RIE (Deep Reactive Ion Etching) using the A1 layer 33 as a mask. . .
- Deep—RIE Deep Reactive Ion Etching
- protective layer 35 is formed on the surface of A1 layer 33 by spin coating using a liquid photoresist.
- An oxide is deposited on the surface of the handle layer 4 by CVD to form an oxide layer 36, a liquid photoresist is formed by spin coating, and a resist pattern 37 is formed through exposure and development.
- oxide layer 36 is formed by BHF using resist pattern 37 as a mask.
- resist pattern 37 is removed, and oxide layer 36 and handle layer are removed.
- A1 is deposited on the surface of 4 by vacuum evaporation to form an A1 layer 38, a liquid photoresist is formed by spin coating, and a resist pattern 39 is formed through exposure and development.
- A1 layer 38 is etched using an aluminum etching solution such as a mixed acid aluminum solution using resist pattern 39 as a mask.
- the protective layer 35 and the resist pattern 39 are removed.
- the silicon of the device layer 3 is penetrated to the insulating layer 2 by Deep-RIE.
- Deep-RIE etching with SF6 gas and side wall protection with C4F8 gas are performed as a Bosch process that performs etching and side wall protection alternately. This condition can also be adopted for deep RIE for subsequent silicon layers.
- the silicon oxide of the insulating layer 2 is etched through to the handle layer 4 by Deep-RIE.
- silicon of handle layer 4 is etched by Deep-RIE using A1 layer 33 as a mask. This etching is performed from the insulating layer 2 side of the handle layer 4 to the length of the backing portion 17 (for example, a thickness of 50 am).
- A1 layer 33 is removed with an aluminum etching solution, and silicon of device layer 3 is penetrating etched to insulating layer 2 by Deep-RIE using oxide layer 31 as a mask.
- the shapes of the movable parts such as the mirror part 5, the second movable part 6, the comb-shaped electrode, the hinge, the separation groove 16, and the connection part 23 (FIG. 4) are formed.
- a part of the opening of the mask of the oxide layer 31 coincides with the opening of the mask of the A1 layer 33.
- silicon of handle layer 4 is etched by deep-RIE using A1 layer 38 as a mask.
- etching is performed from the surface of the handle layer 4 to the depth of the thickness of the backing portion 17 (FIG. 2).
- the etching depth was 260 m.
- the A1 layer 38 is removed with an aluminum etching solution.
- the silicon of the handle layer 4 is etched by Deep-RIE until it reaches the insulating layer 2. As a result, the backing portion 17 and the outer frame portion 13 (FIG. 1) are formed.
- the etching depth shown in FIG. 60 is set in consideration of this over-etching.
- the thickness of the backing part 17 is designed in consideration of the required strength, the resonance frequency of the movable part, the required amplitude with respect to the drive voltage, and the like. Here, the thickness was 50 111.
- exposed insulating layer 2, oxide film patterns 31 and 36 (FIG. 6P) are removed, and the movable part is released.
- Aluminum, gold or silver is vacuum deposited on the surface of the first movable part 5 as the reflective film 40.
- the thickness of the reflective film 40 is, for example, 50 nm, and the material is appropriately selected depending on the wavelength of light used and the required reflectance.
- the etching is performed using the aluminum layer 33 used when the comb-shaped electrode of the device layer 3 is formed by etching as a mask. .
- the comb electrode of the backing portion 17 and the handle layer 4 can be formed at the same position as the comb electrode of the device layer 3 without complicating the process. Since the displacement of the comb electrode can be prevented between the device layer 3 and the handle layer 4, a vertical comb electrode structure in which the gap between adjacent comb electrodes is equal can be realized.
- Etching is also performed in the diameter direction of the SOI wafer 30 simultaneously with the etching in the thickness direction of 6A).
- the etching of the SOI wafer 30 in the diameter direction is called side etching.
- FIG. 7A is an enlarged view of the connection portion 23 and its peripheral portion of the resonant mirror element 1 shown in FIG. 7B to 7E are views corresponding to the BB cross section of the connecting portion 23 and its peripheral portion shown in FIG. 7A.
- the opening is etched first.
- FIG. 7D side etching starts, and when the side etching proceeds further, as shown in FIG. 7E, the insulating layer 2 fixing the second conductive portion 6b and the handle layer 4 in the connection portion 23 is completely removed. Removed.
- the insulating layer 2 between the second conductive portion 6b and the backing portion 17 in the connection portion 23 is removed.
- the second conductive portion 6b and the backing portion 17 in the connection portion 23 can be electrically connected.
- the electrical connection between the second conductive portion 6b and the backing portion 17 will be described with reference to FIGS. 8A to 8D.
- FIG. 8A is an enlarged view showing the connection portion 23 of the resonant mirror element 1 and its peripheral portion.
- FIG. 8B and 8C are diagrams corresponding to the CC cross section of the connecting portion 23 and its peripheral portion shown in FIG. 8A, and FIG. 8D is a diagram corresponding to the DD cross section.
- the insulating layer 2 shown in FIG. 8B is etched, as shown in FIG. 8C, the insulating layer 2 fixing the second conductive portion 6b and the handle layer 4 in the connecting portion 23 is completely removed.
- the region of the second conductive portion 6b other than the connection portion 23, the Y hinge anchor 7 (Fig. 1), the insulating layer 2 that fixes the first conductive portion 6a and the handle layer 4 are completely etched by side etching. The etching conditions are set so that it will not be removed! /.
- the second conductive portion 6b and the backing portion 17 in the connection portion 23 are electrically connected by a sticking (sticking phenomenon).
- a sticking sticking phenomenon
- the insulating layer 2 and the oxide film patterns 31 and 36 shown in FIG. 6Q are removed by a wet etching process using HF (hydrofluoric acid) or BHF (buffered hydrofluoric acid). (HF or BHF)
- HF or BHF hydrogen fluoric acid
- the removal of the insulating layer 2 and the oxide film patterns 31 and 36 shown in FIG. 6Q may be performed by a dry etching process, or a sticking may be generated (via a gap).
- a voltage is applied to the ground pad 21 (FIG. 4) to cause a pull-in phenomenon (the second conductive portion 6b collides with the backing portion 17 due to a potential difference between the second conductive portion 6b and the backing portion 17. Phenomenon).
- the sticking occurs, and the second conductive portion 6b and the backing portion 17 are connected.
- the connecting portion 23 has an opening structure.
- connection portion 23 it is also possible to apply a conductor in the connection portion 23 and connect the second conductive portion 6b and the backing portion 17 to each other.
- the fine wiring drawing device is a device using nano-imprinting technology that finely prints ink containing fine conductors in the same manner as ink-jet ink application in printing technology. In this case, it is preferable to set etching conditions so that the insulating layer 2 in the connection portion 23 is not completely removed by side etching so that the ink containing the fine conductor does not spread outside the connection portion 23.
- connection portion 23 For example, using a dispenser that applies an adhesive or a small amount of liquid, it is also possible to apply the conductor in the connecting portion 23 and connect the second conductive portion 6b and the backing portion 17 to each other. . In this case as well, it is preferable to set etching conditions so that the insulating layer 2 in the connection portion 23 is not completely removed by side etching so that the conductor does not spread outside the connection portion 23.
- the function of the auxiliary comb electrode will be described.
- the relationship between the driving force F and displacement X of an electrostatic actuator is determined by the capacitance C and voltage V between the electrodes.
- the capacitance C is determined by the facing area S of the electrodes facing each other with a gap g. If the dielectric constant is ⁇ , the capacitance C is
- FIG. 9 is a cross-sectional view showing the facing area of the comb-shaped electrode of the resonant mirror element 1.
- the cross-sectional view shown in FIG. 9 corresponds to the EE cross section of the top view shown on the upper side.
- FIG. 10 is a cross-sectional view showing the facing area of the auxiliary comb electrode of the resonant mirror element 1.
- the cross-sectional view shown in Fig. 10 corresponds to the FF cross section of the top view shown on the upper side.
- FIG. 11 is a drawing showing the change in the facing area between the electrodes of the resonant mirror element 1 and the capacitance.
- Smain is 0 within the range where the comb electrodes overlap each other. Indicates a non-zero value, 0 outside that.
- C ( ⁇ ) is 0 within the range where the comb electrodes overlap each other. Indicates a non-zero value, 0 outside that.
- Sside has a smaller peak value due to the smaller number of comb teeth, but it is placed close to the rotation center, so it overlaps in a wider rotation angle range than the main comb electrode. Wide angle range with non-zero values. Therefore, their total Smain + Sside will have a non-zero value over the entire rotation range.
- C ( ⁇ ) total also increases in the region with a large rotation angle compared to C ( ⁇ ) main.
- the auxiliary comb electrode has an effect of increasing the capacitance in a region having a large rotation angle as compared with the case where only the main comb electrode is used. When the capacitance is increased by the auxiliary comb electrode, the driving force is increased accordingly.
- the capacitance change is also applied to a large rotation angle that eliminates the overlap of the main comb electrode. It can be detected reliably. As a result, the rotational angle of the mirror section is feed-knocked into the drive signal, and the resonance drive can be performed more reliably.
- FIG. 12 is a diagram showing an image projection apparatus 100 including the above-described resonant mirror element 1.
- the image projection apparatus 100 includes a resonant mirror element 1, a light source 151, a collimating lens 152, a dichroic prism 153, a control unit 156, a laser modulation circuit 157, and a drive unit 158.
- the collimating lens 152 and the dichroic prism 153 are optical systems that guide the light beam emitted from the light source 151 to the resonant mirror element 1.
- Control unit 156 controls the operations of laser modulation circuit 157 and drive unit 158 in accordance with image signal 155 input to image projection apparatus 100.
- the drive unit 158 includes the resonant mirror element 1 To drive.
- the laser modulation circuit 157 generates a modulation signal corresponding to the image signal 155, and the three light sources 151 emit red (R), green (G), and blue (B) light beams 159 according to the modulation signals. To do.
- the light beam 159 becomes a substantially parallel light beam by the collimating lens 152, is combined by the dichroic prism 153, and enters the resonant mirror element 1.
- the light beam 159 incident on and reflected from the resonant mirror element 1 is scanned two-dimensionally by the resonant mirror element 1, is emitted from the opening 154, and displays an image in the projection region 160.
- the present invention is particularly useful in the technical field of changing the traveling direction of light using a mirror element.
- it is useful for optical scanning devices used in laser printers, reading devices such as barcode readers, and laser projectors.
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Mechanical Engineering (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Mechanical Light Control Or Optical Switches (AREA)
- Micromachines (AREA)
- Mechanical Optical Scanning Systems (AREA)
Abstract
Description
Claims
Priority Applications (3)
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CN200780028059XA CN101495904B (zh) | 2006-12-05 | 2007-12-03 | 促动器 |
JP2008548276A JPWO2008069176A1 (ja) | 2006-12-05 | 2007-12-03 | アクチュエータ |
US12/447,503 US7923894B2 (en) | 2006-12-05 | 2007-12-03 | Actuator, image projection apparatus and production method for actuator |
Applications Claiming Priority (2)
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JP2006-327741 | 2006-12-05 | ||
JP2006327741 | 2006-12-05 |
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WO2008069176A1 true WO2008069176A1 (ja) | 2008-06-12 |
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PCT/JP2007/073329 WO2008069176A1 (ja) | 2006-12-05 | 2007-12-03 | アクチュエータ |
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US (1) | US7923894B2 (ja) |
JP (1) | JPWO2008069176A1 (ja) |
CN (1) | CN101495904B (ja) |
WO (1) | WO2008069176A1 (ja) |
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JP2011166633A (ja) * | 2010-02-14 | 2011-08-25 | Canon Inc | 電気機械変換装置及びその作製方法 |
JP2014035509A (ja) * | 2012-08-10 | 2014-02-24 | Nippon Telegr & Teleph Corp <Ntt> | マイクロミラー素子およびミラーアレイ |
JP2017513446A (ja) * | 2014-04-04 | 2017-05-25 | エムイーエムエス スタート,エルエルシー | 光電子デバイスを動作させるアクチュエータ |
JP2017109304A (ja) * | 2015-12-15 | 2017-06-22 | 株式会社村田製作所 | 微小電気機械デバイスおよびその製造方法 |
KR20180114801A (ko) * | 2017-04-11 | 2018-10-19 | 엘지이노텍 주식회사 | 액체 렌즈 제어 회로 및 액체 렌즈 모듈 |
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US7872395B2 (en) * | 2005-09-21 | 2011-01-18 | Panasonic Corporation | Actuator with symmetric positioning |
CN101495904B (zh) * | 2006-12-05 | 2011-04-20 | 松下电器产业株式会社 | 促动器 |
US7997742B2 (en) * | 2008-03-25 | 2011-08-16 | Microvision, Inc. | Capacitive comb feedback for high speed scan mirror |
WO2011128188A2 (de) * | 2010-04-13 | 2011-10-20 | Ihp Gmbh - Innovations For High Performance Microelectronics / Leibniz-Institut Für Innovative Mikroelektronik | Mikroelektronisches bauelement |
CN102311090B (zh) * | 2010-07-02 | 2014-04-30 | 先进微系统科技股份有限公司 | 二维梳形致动器及其制造方法 |
US20140126034A1 (en) * | 2012-11-07 | 2014-05-08 | Canon Kabushiki Kaisha | Variable shape mirror and method of manufacturing the same |
US9621775B2 (en) * | 2014-05-06 | 2017-04-11 | Mems Drive, Inc. | Electrical bar latching for low stiffness flexure MEMS actuator |
US10071903B2 (en) | 2014-05-06 | 2018-09-11 | Mems Drive, Inc. | Low stiffness flexure |
CN107991769B (zh) * | 2018-01-12 | 2020-07-10 | 凝辉(天津)科技有限责任公司 | 二维扫描器件 |
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JP2014035509A (ja) * | 2012-08-10 | 2014-02-24 | Nippon Telegr & Teleph Corp <Ntt> | マイクロミラー素子およびミラーアレイ |
JP2017513446A (ja) * | 2014-04-04 | 2017-05-25 | エムイーエムエス スタート,エルエルシー | 光電子デバイスを動作させるアクチュエータ |
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Also Published As
Publication number | Publication date |
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CN101495904B (zh) | 2011-04-20 |
JPWO2008069176A1 (ja) | 2010-03-18 |
US20100067078A1 (en) | 2010-03-18 |
US7923894B2 (en) | 2011-04-12 |
CN101495904A (zh) | 2009-07-29 |
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